DE69934978D1 - Ausrichtungsvorrichtung und benutzung dieser vorrichtung in einem halbleiterherstellungsapparat - Google Patents
Ausrichtungsvorrichtung und benutzung dieser vorrichtung in einem halbleiterherstellungsapparatInfo
- Publication number
- DE69934978D1 DE69934978D1 DE69934978T DE69934978T DE69934978D1 DE 69934978 D1 DE69934978 D1 DE 69934978D1 DE 69934978 T DE69934978 T DE 69934978T DE 69934978 T DE69934978 T DE 69934978T DE 69934978 D1 DE69934978 D1 DE 69934978D1
- Authority
- DE
- Germany
- Prior art keywords
- manufacturing apparatus
- semiconductor manufacturing
- alignment
- alignment device
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67775—Docking arrangements
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
- H01L21/682—Mask-wafer alignment
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/136—Associated with semiconductor wafer handling including wafer orienting means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/137—Associated with semiconductor wafer handling including means for charging or discharging wafer cassette
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/139—Associated with semiconductor wafer handling including wafer charging or discharging means for vacuum chamber
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/14—Wafer cassette transporting
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S414/00—Material or article handling
- Y10S414/135—Associated with semiconductor wafer handling
- Y10S414/141—Associated with semiconductor wafer handling includes means for gripping wafer
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10857998A JP3661138B2 (ja) | 1998-04-04 | 1998-04-04 | アライメント高速処理機構 |
JP10857998 | 1998-04-04 | ||
PCT/JP1999/001766 WO1999052143A1 (fr) | 1998-04-04 | 1999-04-02 | Mecanisme d'alignement et dispositif de traitement de semi-conducteurs utilisant ce mecanisme |
Publications (3)
Publication Number | Publication Date |
---|---|
DE69934978D1 true DE69934978D1 (de) | 2007-03-15 |
DE69934978T2 DE69934978T2 (de) | 2007-05-24 |
DE69934978T8 DE69934978T8 (de) | 2007-09-06 |
Family
ID=14488401
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69934978T Expired - Fee Related DE69934978T8 (de) | 1998-04-04 | 1999-04-02 | Ausrichtungsvorrichtung und benutzung dieser vorrichtung in einem halbleiterherstellungsapparat |
Country Status (6)
Country | Link |
---|---|
US (1) | US6702865B1 (de) |
EP (1) | EP1079429B1 (de) |
JP (1) | JP3661138B2 (de) |
KR (1) | KR100581418B1 (de) |
DE (1) | DE69934978T8 (de) |
WO (1) | WO1999052143A1 (de) |
Families Citing this family (18)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5259907B2 (ja) * | 2000-09-01 | 2013-08-07 | クロッシング オートメーション インコーポレイテッド | 加工ツール、加工物を位置合わせする方法、及び加工物を次々に加工する方法 |
JP4820008B2 (ja) * | 2001-01-12 | 2011-11-24 | 東京エレクトロン株式会社 | 被処理体の搬送システム及び被処理体の搬送方法 |
JP4820006B2 (ja) * | 2001-01-12 | 2011-11-24 | 東京エレクトロン株式会社 | 被処理体の搬送システム及び被処理体の搬送方法 |
JP4820007B2 (ja) * | 2001-01-12 | 2011-11-24 | 東京エレクトロン株式会社 | 被処理体の搬送方法 |
JP2003037146A (ja) * | 2001-07-24 | 2003-02-07 | Asm Japan Kk | バッファ機構を有する半導体製造装置及び方法 |
US6778258B2 (en) * | 2001-10-19 | 2004-08-17 | Asml Holding N.V. | Wafer handling system for use in lithography patterning |
JP4121413B2 (ja) * | 2003-03-31 | 2008-07-23 | 株式会社神戸製鋼所 | 板状被処理品の高圧処理装置 |
DE10348821B3 (de) * | 2003-10-13 | 2004-12-16 | HAP Handhabungs-, Automatisierungs- und Präzisionstechnik GmbH | Vorrichtung zum Transportieren und Ausrichten von scheibenförmigen Elementen |
EP1696255A1 (de) * | 2003-12-17 | 2006-08-30 | Nokia Corporation | Automatische fokussierungseinrichtung |
JP4523513B2 (ja) * | 2005-08-05 | 2010-08-11 | 東京エレクトロン株式会社 | 基板受け渡し装置、基板受け渡し方法及び記憶媒体 |
US7828504B2 (en) * | 2006-05-12 | 2010-11-09 | Axcellis Technologies, Inc. | Combination load lock for handling workpieces |
JP5295259B2 (ja) * | 2008-10-22 | 2013-09-18 | 川崎重工業株式会社 | プリアライナー装置 |
WO2011017060A2 (en) | 2009-08-07 | 2011-02-10 | Applied Materials, Inc. | Dual temperature heater |
CN102918640B (zh) * | 2010-05-27 | 2015-11-25 | 松下知识产权经营株式会社 | 等离子体处理装置 |
KR101534647B1 (ko) * | 2013-12-13 | 2015-07-09 | 주식회사 에스에프에이 | 기판 이송 장치 |
CN104409406B (zh) * | 2014-12-05 | 2018-02-06 | 无锡先导智能装备股份有限公司 | 一种焊带搬运装置 |
EP3082155B1 (de) * | 2015-04-14 | 2023-08-30 | Ebara Corporation | Substratverarbeitungsvorrichtung und substratverarbeitungsverfahren |
KR102193865B1 (ko) * | 2018-08-13 | 2020-12-22 | 세메스 주식회사 | 기판처리장치 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5110249A (en) * | 1986-10-23 | 1992-05-05 | Innotec Group, Inc. | Transport system for inline vacuum processing |
US5202716A (en) * | 1988-02-12 | 1993-04-13 | Tokyo Electron Limited | Resist process system |
JP2628335B2 (ja) * | 1988-03-31 | 1997-07-09 | テル・バリアン株式会社 | マルチチャンバ型cvd装置 |
JP2931820B2 (ja) | 1991-11-05 | 1999-08-09 | 東京エレクトロン株式会社 | 板状体の処理装置及び搬送装置 |
JPH05166917A (ja) * | 1991-12-18 | 1993-07-02 | Kawasaki Steel Corp | バッファ・カセット |
JP3130630B2 (ja) * | 1992-02-13 | 2001-01-31 | 東京エレクトロン株式会社 | 処理装置 |
JPH06105744B2 (ja) * | 1993-01-20 | 1994-12-21 | 東京エレクトロン株式会社 | ウエハ移載装置及びプローブ装置 |
US5474410A (en) * | 1993-03-14 | 1995-12-12 | Tel-Varian Limited | Multi-chamber system provided with carrier units |
US5643366A (en) * | 1994-01-31 | 1997-07-01 | Applied Materials, Inc. | Wafer handling within a vacuum chamber using vacuum |
JPH07297258A (ja) * | 1994-04-26 | 1995-11-10 | Tokyo Electron Ltd | 板状体の搬送装置 |
JP3350234B2 (ja) * | 1994-06-06 | 2002-11-25 | 東京エレクトロン株式会社 | 被処理体のバッファ装置、これを用いた処理装置及びその搬送方法 |
JPH08306767A (ja) * | 1995-05-09 | 1996-11-22 | Nikon Corp | 基板の位置決め装置 |
JPH0940112A (ja) * | 1995-07-26 | 1997-02-10 | Metsukusu:Kk | 薄型基板搬送装置 |
-
1998
- 1998-04-04 JP JP10857998A patent/JP3661138B2/ja not_active Expired - Fee Related
-
1999
- 1999-04-02 EP EP99910835A patent/EP1079429B1/de not_active Expired - Lifetime
- 1999-04-02 KR KR1020007011002A patent/KR100581418B1/ko not_active IP Right Cessation
- 1999-04-02 WO PCT/JP1999/001766 patent/WO1999052143A1/ja active IP Right Grant
- 1999-04-02 US US09/647,659 patent/US6702865B1/en not_active Expired - Fee Related
- 1999-04-02 DE DE69934978T patent/DE69934978T8/de not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
KR100581418B1 (ko) | 2006-05-17 |
EP1079429B1 (de) | 2007-01-24 |
DE69934978T2 (de) | 2007-05-24 |
JPH11288988A (ja) | 1999-10-19 |
JP3661138B2 (ja) | 2005-06-15 |
EP1079429A4 (de) | 2005-06-29 |
KR20010042421A (ko) | 2001-05-25 |
WO1999052143A1 (fr) | 1999-10-14 |
DE69934978T8 (de) | 2007-09-06 |
US6702865B1 (en) | 2004-03-09 |
EP1079429A1 (de) | 2001-02-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE69934978T8 (de) | Ausrichtungsvorrichtung und benutzung dieser vorrichtung in einem halbleiterherstellungsapparat | |
DE69522514D1 (de) | Halbleiteranordnung und Herstellungsverfahren | |
DE69526539D1 (de) | Halbleiteranordnung und Herstellungsverfahren | |
DE69527330D1 (de) | Halbleiteranordnung und Herstellungsverfahren | |
DE69525795D1 (de) | Halbleiteranordnung und Herstellungsverfahren | |
DE60128768D1 (de) | Polierverfahren und vorrichtung | |
DE59601335D1 (de) | Halbleiterbauelement und Herstellverfahren | |
DE69430511D1 (de) | Halbleiteranordnung und Herstellungverfahren | |
DE10196595T1 (de) | Vorrichtung und Halbleiter-Prüfvorrichtung | |
DE69820226T2 (de) | Elektrooptische vorrichtung und elektronisches gerät | |
DE69413602D1 (de) | Halbleiteranordnung und Herstellungsverfahren | |
KR960009107A (ko) | 반도체장치와 그 제조방법 | |
KR960015900A (ko) | 반도체 장치 및 그 제조방법 | |
DE60002510D1 (de) | Mischionenleiter und mit demselben verwendente Vorrichtung | |
DE69422130T2 (de) | Osteometrie und osteometrische vorrichtung | |
DE69931725D1 (de) | Magnetophoretische Anzeigevorrichtung und Herstellungsverfahren dafür | |
DE69829919D1 (de) | Polierverfahren und Vorrichtung | |
DE69834919D1 (de) | Oberflächeninspektionsverfahren und vorrichtung | |
DE69232311D1 (de) | Herstellungsverfahren von integrierten Vorrichtungen und so hergestellte integrierte Vorrichtung | |
KR960012313A (ko) | 반도체 장치 및 그 제조방법 | |
DE69929163D1 (de) | Elektronische vorrichtung mit azimutmesser und azimutmessverfahren in dieser elektronischen vorrichtung | |
DE60135500D1 (de) | Ringspaltreaktor und verfahren durchgeführt in einem ringspaltreaktor | |
DE69420944T2 (de) | Halbleitervorrichtung und herstellungsverfahren | |
GB2326721B (en) | Measuring-pattern for width of wire in semiconductor device and method for measuring width of wire using the same | |
GB9907854D0 (en) | Semiconductor device manufacturing apparatus and semiconductor device manufacturing method |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8381 | Inventor (new situation) |
Inventor name: OZAWA, MASAHITO, KITAKOMA-GUN, YAMANASHI 408-0, JP Inventor name: NARUSHIMA, MASAKI, YAMANASHI 406-0853, JP |
|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |