DE69803932D1 - Verfahren und anlage zur steuerung der züchtung eines siliziumkristalls - Google Patents
Verfahren und anlage zur steuerung der züchtung eines siliziumkristallsInfo
- Publication number
- DE69803932D1 DE69803932D1 DE69803932T DE69803932T DE69803932D1 DE 69803932 D1 DE69803932 D1 DE 69803932D1 DE 69803932 T DE69803932 T DE 69803932T DE 69803932 T DE69803932 T DE 69803932T DE 69803932 D1 DE69803932 D1 DE 69803932D1
- Authority
- DE
- Germany
- Prior art keywords
- breeding
- controlling
- silicon crystal
- silicon
- crystal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
- C30B15/26—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal using television detectors; using photo or X-ray detectors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1004—Apparatus with means for measuring, testing, or sensing
- Y10T117/1008—Apparatus with means for measuring, testing, or sensing with responsive control means
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US08/896,177 US5846318A (en) | 1997-07-17 | 1997-07-17 | Method and system for controlling growth of a silicon crystal |
PCT/US1998/014208 WO1999004066A1 (en) | 1997-07-17 | 1998-07-08 | Method and system for controlling growth of a silicon crystal |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69803932D1 true DE69803932D1 (de) | 2002-03-28 |
DE69803932T2 DE69803932T2 (de) | 2002-11-28 |
Family
ID=25405756
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69803932T Expired - Lifetime DE69803932T2 (de) | 1997-07-17 | 1998-07-08 | Verfahren und anlage zur steuerung der züchtung eines siliziumkristalls |
Country Status (9)
Country | Link |
---|---|
US (1) | US5846318A (de) |
EP (1) | EP1002144B1 (de) |
JP (1) | JP4253117B2 (de) |
KR (1) | KR100491392B1 (de) |
CN (1) | CN1202290C (de) |
DE (1) | DE69803932T2 (de) |
MY (1) | MY118719A (de) |
TW (1) | TWI223679B (de) |
WO (1) | WO1999004066A1 (de) |
Families Citing this family (46)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6137893A (en) | 1996-10-07 | 2000-10-24 | Cognex Corporation | Machine vision calibration targets and methods of determining their location and orientation in an image |
DE19817709B4 (de) * | 1998-04-21 | 2011-03-17 | Crystal Growing Systems Gmbh | Verfahren für die Überwachung einer Schmelze für die Herstellung von Kristallen |
EP0903428A3 (de) * | 1997-09-03 | 2000-07-19 | Leybold Systems GmbH | Einrichtung und Verfahren für die Bestimmung von Durchmessern eines Kristalls |
US5968263A (en) * | 1998-04-01 | 1999-10-19 | Memc Electronic Materials, Inc. | Open-loop method and system for controlling growth of semiconductor crystal |
US6171391B1 (en) | 1998-10-14 | 2001-01-09 | Memc Electronic Materials, Inc. | Method and system for controlling growth of a silicon crystal |
US6589332B1 (en) | 1998-11-03 | 2003-07-08 | Memc Electronic Materials, Inc. | Method and system for measuring polycrystalline chunk size and distribution in the charge of a Czochralski process |
US6284040B1 (en) * | 1999-01-13 | 2001-09-04 | Memc Electronic Materials, Inc. | Process of stacking and melting polycrystalline silicon for high quality single crystal production |
US6776840B1 (en) | 1999-03-22 | 2004-08-17 | Memc Electronic Materials, Inc. | Method and apparatus for controlling diameter of a silicon crystal in a locked seed lift growth process |
US6241818B1 (en) | 1999-04-07 | 2001-06-05 | Memc Electronic Materials, Inc. | Method and system of controlling taper growth in a semiconductor crystal growth process |
US6203611B1 (en) | 1999-10-19 | 2001-03-20 | Memc Electronic Materials, Inc. | Method of controlling growth of a semiconductor crystal to automatically transition from taper growth to target diameter growth |
US6570663B1 (en) | 2000-07-07 | 2003-05-27 | Seh America, Inc. | Calibration method and device for visual measuring systems |
WO2002010486A1 (fr) * | 2000-07-28 | 2002-02-07 | Shin-Etsu Handotai Co., Ltd. | Procede pour detecter la derniere phase de fusion d'un silicium polycristallin, procede de reglage de la temperature de contact du cristal germe avec la matiere en fusion, et appareil de production d'un silicium monocristallin |
US6454851B1 (en) * | 2000-11-09 | 2002-09-24 | Memc Electronic Materials, Inc. | Method for preparing molten silicon melt from polycrystalline silicon charge |
DE10110635A1 (de) * | 2001-03-06 | 2002-09-19 | Cgs Crystal Growing Systems Gm | Verfahren zum automatischen Steuern einer Kristallziehanlage und Kristallziehanlage zur Durchführung dieses Verfahrens |
US7227983B1 (en) * | 2002-05-30 | 2007-06-05 | The Regents Of The University Of California | Automated macromolecular crystal detection system and method |
US6960254B2 (en) * | 2003-07-21 | 2005-11-01 | Memc Electronic Materials, Inc. | Method to monitor and control the crystal cooling or quenching rate by measuring crystal surface temperature |
US20060005761A1 (en) * | 2004-06-07 | 2006-01-12 | Memc Electronic Materials, Inc. | Method and apparatus for growing silicon crystal by controlling melt-solid interface shape as a function of axial length |
JP4815766B2 (ja) * | 2004-08-03 | 2011-11-16 | 株式会社Sumco | シリコン単結晶製造装置及び製造方法 |
US7291221B2 (en) * | 2004-12-30 | 2007-11-06 | Memc Electronic Materials, Inc. | Electromagnetic pumping of liquid silicon in a crystal growing process |
US7223304B2 (en) * | 2004-12-30 | 2007-05-29 | Memc Electronic Materials, Inc. | Controlling melt-solid interface shape of a growing silicon crystal using a variable magnetic field |
JP4918897B2 (ja) * | 2007-08-29 | 2012-04-18 | 株式会社Sumco | シリコン単結晶引上方法 |
US7758696B2 (en) * | 2007-09-27 | 2010-07-20 | Bp Corporation North America Inc | Methods and systems for monitoring a solid-liquid interface |
EP2248932A4 (de) * | 2008-02-18 | 2011-05-11 | Sumco Corp | Verfahren für siliciumeinkristallzüchtung |
US7573587B1 (en) * | 2008-08-25 | 2009-08-11 | Memc Electronic Materials, Inc. | Method and device for continuously measuring silicon island elevation |
TW201232691A (en) * | 2011-01-28 | 2012-08-01 | Premtek Int Inc | Equipment and operation method for enhancing throughput of wafer rapid thermal processing |
CN103649380A (zh) * | 2011-03-15 | 2014-03-19 | Gtat公司 | 用于晶体生长装置的自动检视系统 |
CN102134740A (zh) * | 2011-04-22 | 2011-07-27 | 无锡市惠德晶体控制设备有限公司 | 硅单晶炉摄像头安装支架 |
CN102787353B (zh) * | 2012-08-15 | 2015-04-01 | 北京七星华创电子股份有限公司 | 单晶炉非接触式硅棒晶线测量方法 |
CN102995111B (zh) * | 2012-11-07 | 2015-05-27 | 北京七星华创电子股份有限公司 | 单晶炉非接触式硅料液面位置测量方法及装置 |
JP6342912B2 (ja) * | 2012-11-08 | 2018-06-13 | ディーディーエム システムズ, インコーポレイテッド | 金属構成要素の加法的製造および修復 |
CN103489184B (zh) * | 2013-09-11 | 2017-01-11 | 西安理工大学 | 基于高阶奇异值分解的硅料熔化进程监测方法 |
EP2886519B1 (de) * | 2013-12-18 | 2016-05-25 | Heraeus Quarzglas GmbH & Co. KG | Vertikal-tiegelziehverfahren zur herstellung eines glaskörpers mit hohem kieselsäuregehalt |
KR101775057B1 (ko) * | 2015-09-07 | 2017-09-05 | 한국생산기술연구원 | 용융로의 아일랜드 위치검출 장치 및 방법 |
KR101841550B1 (ko) * | 2015-12-23 | 2018-03-23 | 에스케이실트론 주식회사 | 실리콘 단결정 잉곳의 성장 장치 및 성장 방법 |
RU2652640C1 (ru) * | 2016-12-20 | 2018-04-28 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Тверской государственный университет" | Способ измерения температуры локальных участков поверхности расплава в тигле при выращивании методом Чохральского монокристаллов веществ с температурой плавления выше 6500С |
KR101895131B1 (ko) * | 2016-12-28 | 2018-10-18 | 경북대학교 산학협력단 | 단결정 성장로의 잉곳 직경 측정 방법 |
JP7082550B2 (ja) * | 2018-09-20 | 2022-06-08 | グローバルウェーハズ・ジャパン株式会社 | シリコン単結晶の製造方法 |
JP6935790B2 (ja) * | 2018-10-15 | 2021-09-15 | 株式会社Sumco | 石英るつぼ内周面の評価方法及び石英るつぼ内周面の評価装置 |
CN112488980A (zh) * | 2019-08-20 | 2021-03-12 | 隆基绿能科技股份有限公司 | 一种熔料状态检测方法、装置及设备 |
EP3800282A4 (de) * | 2018-11-26 | 2022-04-06 | Longi Green Energy Technology Co., Ltd. | Verfahren, einrichtung und vorrichtung zur detektion des kristallzüchtungszustands für siliciumstab |
KR102147461B1 (ko) * | 2019-01-17 | 2020-08-24 | 에스케이실트론 주식회사 | 단결정 잉곳 성장 장치 |
CN111429508B (zh) * | 2020-03-19 | 2021-08-31 | 亚洲硅业(青海)股份有限公司 | 硅芯炉控制系统及方法 |
CN114481303A (zh) * | 2022-01-12 | 2022-05-13 | 苏州天准科技股份有限公司 | 一种拉晶状态监测装置及拉晶设备 |
CN116732604A (zh) * | 2022-06-01 | 2023-09-12 | 四川晶科能源有限公司 | 一种单晶拉晶方法以及单晶拉晶设备 |
CN117385459A (zh) * | 2023-10-23 | 2024-01-12 | 保定景欣电气有限公司 | 一种晶体生长过程中结晶检测方法及装置 |
CN117824889A (zh) * | 2024-03-04 | 2024-04-05 | 杭州中为光电技术有限公司 | 硅棒内力检测系统、检测方法及截断方法 |
Family Cites Families (23)
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US3718757A (en) * | 1970-12-29 | 1973-02-27 | Ibm | Temperature monitoring |
US3740563A (en) * | 1971-06-25 | 1973-06-19 | Monsanto Co | Electroptical system and method for sensing and controlling the diameter and melt level of pulled crystals |
US4350557A (en) * | 1974-06-14 | 1982-09-21 | Ferrofluidics Corporation | Method for circumferential dimension measuring and control in crystal rod pulling |
JPS6153190A (ja) * | 1984-08-17 | 1986-03-17 | インタ−ナショナル ビジネス マシ−ンズ コ−ポレ−ション | 結晶ブ−ル成長方法 |
US4710258A (en) * | 1984-11-30 | 1987-12-01 | General Signal Corporation | System for controlling the diameter of a crystal in a crystal growing furnace |
JPS63239181A (ja) * | 1987-03-26 | 1988-10-05 | Kyushu Denshi Kinzoku Kk | Cz炉内の結晶直径測定方法 |
JPS63256594A (ja) * | 1987-04-13 | 1988-10-24 | Kyushu Denshi Kinzoku Kk | Cz炉内の結晶直径計測方法 |
JPS6483595A (en) * | 1987-09-25 | 1989-03-29 | Shinetsu Handotai Kk | Device for measuring crystal diameter |
JPH03112885A (ja) * | 1989-09-26 | 1991-05-14 | Kawasaki Steel Corp | 単結晶引き上げ時の結晶ダイの検知方法 |
JPH0774117B2 (ja) * | 1989-10-20 | 1995-08-09 | 信越半導体株式会社 | ヒータの温度パターン作成方法及びこの温度パターンを用いたSi単結晶育成制御装置 |
JPH06102590B2 (ja) * | 1990-02-28 | 1994-12-14 | 信越半導体株式会社 | Cz法による単結晶ネック部育成自動制御方法 |
JP2601930B2 (ja) * | 1990-03-29 | 1997-04-23 | 信越半導体株式会社 | 単結晶ネツク部直径制御方法及び装置 |
JPH0663824B2 (ja) * | 1990-04-29 | 1994-08-22 | 信越半導体株式会社 | 湯面振動測定方法及び装置 |
JPH0726817B2 (ja) * | 1990-07-28 | 1995-03-29 | 信越半導体株式会社 | 結晶径測定装置 |
JPH0717475B2 (ja) * | 1991-02-14 | 1995-03-01 | 信越半導体株式会社 | 単結晶ネック部育成自動制御方法 |
JPH04300283A (ja) * | 1991-03-27 | 1992-10-23 | Osaka Titanium Co Ltd | Cz法における液面レベル測定法 |
US5178720A (en) * | 1991-08-14 | 1993-01-12 | Memc Electronic Materials, Inc. | Method for controlling oxygen content of silicon crystals using a combination of cusp magnetic field and crystal and crucible rotation rates |
DE4231162C2 (de) * | 1992-09-17 | 1996-03-14 | Wacker Siltronic Halbleitermat | Verfahren zur Regelung der Schmelzenhöhe während des Ziehens von Einkristallen |
JP2538748B2 (ja) * | 1992-11-27 | 1996-10-02 | 信越半導体株式会社 | 結晶径測定装置 |
JP2880092B2 (ja) * | 1995-03-27 | 1999-04-05 | 新日本製鐵株式会社 | 単結晶製造方法 |
US5653799A (en) * | 1995-06-02 | 1997-08-05 | Memc Electronic Materials, Inc. | Method for controlling growth of a silicon crystal |
US5588993A (en) * | 1995-07-25 | 1996-12-31 | Memc Electronic Materials, Inc. | Method for preparing molten silicon melt from polycrystalline silicon charge |
JPH09110582A (ja) * | 1995-10-11 | 1997-04-28 | Kokusai Chodendo Sangyo Gijutsu Kenkyu Center | 結晶製造装置 |
-
1997
- 1997-07-17 US US08/896,177 patent/US5846318A/en not_active Expired - Lifetime
-
1998
- 1998-07-08 EP EP98935581A patent/EP1002144B1/de not_active Expired - Lifetime
- 1998-07-08 KR KR10-2000-7000395A patent/KR100491392B1/ko not_active IP Right Cessation
- 1998-07-08 JP JP2000503267A patent/JP4253117B2/ja not_active Expired - Fee Related
- 1998-07-08 DE DE69803932T patent/DE69803932T2/de not_active Expired - Lifetime
- 1998-07-08 WO PCT/US1998/014208 patent/WO1999004066A1/en active IP Right Grant
- 1998-07-08 CN CNB988084562A patent/CN1202290C/zh not_active Expired - Fee Related
- 1998-07-16 MY MYPI98003250A patent/MY118719A/en unknown
- 1998-07-16 TW TW087111594A patent/TWI223679B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
KR20010021831A (ko) | 2001-03-15 |
JP2001510141A (ja) | 2001-07-31 |
KR100491392B1 (ko) | 2005-05-24 |
DE69803932T2 (de) | 2002-11-28 |
MY118719A (en) | 2005-01-31 |
EP1002144A1 (de) | 2000-05-24 |
TWI223679B (en) | 2004-11-11 |
JP4253117B2 (ja) | 2009-04-08 |
CN1268194A (zh) | 2000-09-27 |
US5846318A (en) | 1998-12-08 |
EP1002144B1 (de) | 2002-02-20 |
WO1999004066A1 (en) | 1999-01-28 |
CN1202290C (zh) | 2005-05-18 |
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