CN102787353B - 单晶炉非接触式硅棒晶线测量方法 - Google Patents
单晶炉非接触式硅棒晶线测量方法 Download PDFInfo
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CN109112614A (zh) * | 2017-06-23 | 2019-01-01 | 上海新昇半导体科技有限公司 | 晶棒的测试方法以及晶棒生长装置 |
CN111218714B (zh) * | 2018-11-26 | 2021-06-08 | 隆基绿能科技股份有限公司 | 一种断线测量方法、设备及存储介质 |
CN112444516B (zh) * | 2019-08-13 | 2022-03-11 | 隆基绿能科技股份有限公司 | 一种硅棒的晶线生长状态检测方法、装置及设备 |
EP3800282A4 (en) * | 2018-11-26 | 2022-04-06 | Longi Green Energy Technology Co., Ltd. | METHOD, EQUIPMENT AND DEVICE FOR DETECTING THE CRYSTAL GROWING STATE FOR SILICON ROD |
CN116071285A (zh) * | 2021-10-29 | 2023-05-05 | 隆基绿能科技股份有限公司 | 放肩断线检测方法、装置、存储介质及电子设备 |
CN114369868B (zh) * | 2022-01-12 | 2022-11-18 | 苏州天准科技股份有限公司 | 晶棒断线监测方法、存储介质、终端和拉晶设备 |
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CN1268194A (zh) * | 1997-07-17 | 2000-09-27 | Memc电子材料有限公司 | 控制硅单晶生长的方法与系统 |
CN101008103A (zh) * | 2006-12-28 | 2007-08-01 | 西安理工大学 | 基于霍夫变换的直拉单晶硅棒直径的测量方法 |
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JP4221917B2 (ja) * | 2001-06-27 | 2009-02-12 | 株式会社Sumco | 結晶形状測定装置および結晶形状測定方法およびプログラムおよび記録媒体 |
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CN1268194A (zh) * | 1997-07-17 | 2000-09-27 | Memc电子材料有限公司 | 控制硅单晶生长的方法与系统 |
CN101008103A (zh) * | 2006-12-28 | 2007-08-01 | 西安理工大学 | 基于霍夫变换的直拉单晶硅棒直径的测量方法 |
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Address after: 100015 No. 1 East Jiuxianqiao Road, Beijing, Chaoyang District Patentee after: North China Science and technology group Limited by Share Ltd. Address before: 100015 Jiuxianqiao Chaoyang District, East Beijing Road, building M2, floor 1, No. 2 Patentee before: BEIJING SEVENSTAR ELECTRONIC Co.,Ltd. |
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Effective date of registration: 20171208 Address after: Room 401, No. 401, No. 8, Wenchang Avenue, Beijing Beijing economic and Technological Development Zone, 100015 Patentee after: BEIJNG NAURA VACUUM TECHNOLOGY CO.,LTD. Address before: 100015 No. 1 East Jiuxianqiao Road, Beijing, Chaoyang District Patentee before: North China Science and technology group Limited by Share Ltd. |