DE69310763D1 - Dampfabscheidungsverfahren - Google Patents
DampfabscheidungsverfahrenInfo
- Publication number
- DE69310763D1 DE69310763D1 DE69310763T DE69310763T DE69310763D1 DE 69310763 D1 DE69310763 D1 DE 69310763D1 DE 69310763 T DE69310763 T DE 69310763T DE 69310763 T DE69310763 T DE 69310763T DE 69310763 D1 DE69310763 D1 DE 69310763D1
- Authority
- DE
- Germany
- Prior art keywords
- compound
- deposit
- residue
- integrated circuits
- vapor deposition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005019 vapor deposition process Methods 0.000 title 1
- 238000004519 manufacturing process Methods 0.000 abstract 3
- 238000000034 method Methods 0.000 abstract 3
- 150000001875 compounds Chemical class 0.000 abstract 2
- 238000000151 deposition Methods 0.000 abstract 1
- 238000010894 electron beam technology Methods 0.000 abstract 1
- 150000002902 organometallic compounds Chemical class 0.000 abstract 1
- 239000002245 particle Substances 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/28—Manufacture of electrodes on semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/268
- H01L21/283—Deposition of conductive or insulating materials for electrodes conducting electric current
-
- C—CHEMISTRY; METALLURGY
- C07—ORGANIC CHEMISTRY
- C07F—ACYCLIC, CARBOCYCLIC OR HETEROCYCLIC COMPOUNDS CONTAINING ELEMENTS OTHER THAN CARBON, HYDROGEN, HALOGEN, OXYGEN, NITROGEN, SULFUR, SELENIUM OR TELLURIUM
- C07F1/00—Compounds containing elements of Groups 1 or 11 of the Periodic Table
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/06—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material
- C23C16/18—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of metallic material from metallo-organic compounds
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F1/00—Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
- G03F1/68—Preparation processes not covered by groups G03F1/20 - G03F1/50
- G03F1/76—Patterning of masks by imaging
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/0042—Photosensitive materials with inorganic or organometallic light-sensitive compounds not otherwise provided for, e.g. inorganic resists
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/2041—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means
- G03F7/2043—Exposure; Apparatus therefor in the presence of a fluid, e.g. immersion; using fluid cooling means with the production of a chemical active agent from a fluid, e.g. an etching agent; with meterial deposition from the fluid phase, e.g. contamination resists
Landscapes
- Chemical & Material Sciences (AREA)
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- General Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Computer Hardware Design (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Manufacturing & Machinery (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Power Engineering (AREA)
- Physical Vapour Deposition (AREA)
- Organic Low-Molecular-Weight Compounds And Preparation Thereof (AREA)
- Drying Of Semiconductors (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Chemically Coating (AREA)
- Chemical Vapour Deposition (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
GB929224233A GB9224233D0 (en) | 1992-11-19 | 1992-11-19 | Photomask |
GB939306446A GB9306446D0 (en) | 1993-03-27 | 1993-03-27 | Photomask |
GB939317750A GB9317750D0 (en) | 1993-08-26 | 1993-08-26 | Photomask |
PCT/GB1993/002391 WO1994011787A1 (en) | 1992-11-19 | 1993-11-19 | Method of deposition |
Publications (2)
Publication Number | Publication Date |
---|---|
DE69310763D1 true DE69310763D1 (de) | 1997-06-19 |
DE69310763T2 DE69310763T2 (de) | 1997-12-11 |
Family
ID=27266467
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE69310763T Expired - Fee Related DE69310763T2 (de) | 1992-11-19 | 1993-11-19 | Dampfabscheidungsverfahren |
Country Status (9)
Country | Link |
---|---|
US (2) | US5821017A (de) |
EP (1) | EP0670055B1 (de) |
JP (1) | JP3416134B2 (de) |
AT (1) | ATE153147T1 (de) |
AU (1) | AU5531294A (de) |
CA (1) | CA2149645A1 (de) |
DE (1) | DE69310763T2 (de) |
SG (1) | SG65569A1 (de) |
WO (1) | WO1994011787A1 (de) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3540047B2 (ja) * | 1995-03-31 | 2004-07-07 | 株式会社島津製作所 | 微細パターン作成方法 |
DE19618447A1 (de) | 1996-05-08 | 1997-11-20 | Studiengesellschaft Kohle Mbh | Lithographisches Verfahren zur Erzeugung von Nanostrukturen auf Oberflächen |
RU2129320C1 (ru) * | 1998-05-22 | 1999-04-20 | Гурович Борис Аронович | Способ формирования проводящей структуры |
DE19934089A1 (de) * | 1999-07-19 | 2001-01-25 | Univ Schiller Jena | Verfahren zur Erzeugung elektrisch leitender Bereiche in mehrkomponentigen Materialien |
US7067346B2 (en) * | 2000-06-06 | 2006-06-27 | Simon Foster University | Titanium carboxylate films for use in semiconductor processing |
JP2004512672A (ja) | 2000-06-06 | 2004-04-22 | イーケーシー テクノロジー,インコーポレイティド | 電子材料製造法 |
US7074640B2 (en) | 2000-06-06 | 2006-07-11 | Simon Fraser University | Method of making barrier layers |
US7427529B2 (en) * | 2000-06-06 | 2008-09-23 | Simon Fraser University | Deposition of permanent polymer structures for OLED fabrication |
US6786978B2 (en) * | 2000-08-03 | 2004-09-07 | Texas Instruments Incorporated | Mass production of cross-section TEM samples by focused ion beam deposition and anisotropic etching |
GB0103495D0 (en) * | 2001-02-13 | 2001-03-28 | Univ Dundee | Methods of preparing organmetallic compounds and novel organmetallic dimers |
US6777036B2 (en) | 2001-06-06 | 2004-08-17 | Simon Fraser University | Method for the deposition of materials from mesomorphous films |
US20050103272A1 (en) * | 2002-02-25 | 2005-05-19 | Leo Elektronenmikroskopie Gmbh | Material processing system and method |
KR100878236B1 (ko) * | 2002-06-12 | 2009-01-13 | 삼성전자주식회사 | 금속 패턴의 형성 방법 및 이를 이용한 박막 트랜지스터기판의 제조 방법 |
CN1317424C (zh) * | 2003-11-25 | 2007-05-23 | 中国科学院化学研究所 | 微波辅助镀金的制备方法 |
US7294449B1 (en) | 2003-12-31 | 2007-11-13 | Kovio, Inc. | Radiation patternable functional materials, methods of their use, and structures formed therefrom |
FR2894691B1 (fr) * | 2005-12-13 | 2008-01-18 | Commissariat Energie Atomique | Procede de fabrication de masque lithographique en reflexion et masque issu du procede |
EP2326744B1 (de) | 2008-08-07 | 2022-06-01 | Pryog, LLC | Metallzusammensetzungen und verfahren zu ihrer herstellung |
US8965159B1 (en) | 2013-11-07 | 2015-02-24 | International Business Machines Corporation | Implementing twisted pair waveguide for electronic substrates |
KR102352740B1 (ko) | 2015-04-30 | 2022-01-18 | 삼성디스플레이 주식회사 | 마스크의 제조 방법 및 표시 장치의 제조 방법 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4444801A (en) * | 1981-01-14 | 1984-04-24 | Hitachi, Ltd. | Method and apparatus for correcting transparent defects on a photomask |
US4714627A (en) * | 1984-11-29 | 1987-12-22 | Ontario Development Corp. | Method of gold deposition using volatile organogold complexes |
US5230970A (en) * | 1985-05-20 | 1993-07-27 | At&T Bell Laboratories | Method of forming metal regions |
US4869930A (en) * | 1987-07-10 | 1989-09-26 | International Business Machines Corporation | Method for preparing substrates for deposition of metal seed from an organometallic vapor for subsequent electroless metallization |
US4888204A (en) * | 1988-09-12 | 1989-12-19 | Hughes Aircraft Company | Photochemical deposition of high purity gold films |
US5104481A (en) * | 1988-09-28 | 1992-04-14 | Lasa Industries, Inc. | Method for fabricating laser generated I.C. masks |
DE3841643C2 (de) * | 1988-12-10 | 1999-07-01 | Merck Patent Gmbh | Metallorganische Verbindungen und deren Verwendung |
US5169579A (en) * | 1989-12-04 | 1992-12-08 | Board Of Regents, The University Of Texas System | Catalyst and plasma assisted nucleation and renucleation of gas phase selective laser deposition |
US5104684A (en) * | 1990-05-25 | 1992-04-14 | Massachusetts Institute Of Technology | Ion beam induced deposition of metals |
JPH0799791B2 (ja) * | 1992-04-15 | 1995-10-25 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 透明基板上の回路ライン接続方法 |
-
1993
- 1993-11-19 AU AU55312/94A patent/AU5531294A/en not_active Abandoned
- 1993-11-19 WO PCT/GB1993/002391 patent/WO1994011787A1/en active IP Right Grant
- 1993-11-19 CA CA002149645A patent/CA2149645A1/en not_active Abandoned
- 1993-11-19 JP JP51189694A patent/JP3416134B2/ja not_active Expired - Fee Related
- 1993-11-19 SG SG1996004794A patent/SG65569A1/en unknown
- 1993-11-19 US US08/436,394 patent/US5821017A/en not_active Expired - Lifetime
- 1993-11-19 DE DE69310763T patent/DE69310763T2/de not_active Expired - Fee Related
- 1993-11-19 EP EP94900242A patent/EP0670055B1/de not_active Expired - Lifetime
- 1993-11-19 AT AT94900242T patent/ATE153147T1/de not_active IP Right Cessation
-
1998
- 1998-10-13 US US09/170,346 patent/US6071676A/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
EP0670055B1 (de) | 1997-05-14 |
EP0670055A1 (de) | 1995-09-06 |
WO1994011787A1 (en) | 1994-05-26 |
DE69310763T2 (de) | 1997-12-11 |
JP3416134B2 (ja) | 2003-06-16 |
US6071676A (en) | 2000-06-06 |
CA2149645A1 (en) | 1994-05-26 |
US5821017A (en) | 1998-10-13 |
ATE153147T1 (de) | 1997-05-15 |
SG65569A1 (en) | 1999-06-22 |
JPH08507870A (ja) | 1996-08-20 |
AU5531294A (en) | 1994-06-08 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8339 | Ceased/non-payment of the annual fee |