DE69224716T2 - Elektrisch löschbare und programmierbare Nur-Lese-Speicher mit Source- und Drain-Bereichen entlang Seitenwänden einer Grabenstruktur - Google Patents

Elektrisch löschbare und programmierbare Nur-Lese-Speicher mit Source- und Drain-Bereichen entlang Seitenwänden einer Grabenstruktur

Info

Publication number
DE69224716T2
DE69224716T2 DE69224716T DE69224716T DE69224716T2 DE 69224716 T2 DE69224716 T2 DE 69224716T2 DE 69224716 T DE69224716 T DE 69224716T DE 69224716 T DE69224716 T DE 69224716T DE 69224716 T2 DE69224716 T2 DE 69224716T2
Authority
DE
Germany
Prior art keywords
memory
source
side walls
drain regions
programmable read
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69224716T
Other languages
English (en)
Other versions
DE69224716D1 (de
Inventor
Manjin Jerome Kim
Jein-Chen Young
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips Electronics NV
Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips Electronics NV, Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of DE69224716D1 publication Critical patent/DE69224716D1/de
Application granted granted Critical
Publication of DE69224716T2 publication Critical patent/DE69224716T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices
DE69224716T 1991-12-19 1992-12-15 Elektrisch löschbare und programmierbare Nur-Lese-Speicher mit Source- und Drain-Bereichen entlang Seitenwänden einer Grabenstruktur Expired - Fee Related DE69224716T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/810,250 US5278438A (en) 1991-12-19 1991-12-19 Electrically erasable and programmable read-only memory with source and drain regions along sidewalls of a trench structure

Publications (2)

Publication Number Publication Date
DE69224716D1 DE69224716D1 (de) 1998-04-16
DE69224716T2 true DE69224716T2 (de) 1998-09-17

Family

ID=25203389

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69224716T Expired - Fee Related DE69224716T2 (de) 1991-12-19 1992-12-15 Elektrisch löschbare und programmierbare Nur-Lese-Speicher mit Source- und Drain-Bereichen entlang Seitenwänden einer Grabenstruktur

Country Status (5)

Country Link
US (1) US5278438A (de)
EP (1) EP0547711B1 (de)
JP (1) JPH05275713A (de)
DE (1) DE69224716T2 (de)
TW (1) TW230832B (de)

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DE10214126A1 (de) * 2002-03-28 2003-10-23 Infineon Technologies Ag Herstellungsverfahren für eine Mehrzahl von ungefähr gleich hohen und gleich beabstandeten Gatestapeln auf einem Halbleitersubstrat

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US5849621A (en) * 1996-06-19 1998-12-15 Advanced Micro Devices, Inc. Method and structure for isolating semiconductor devices after transistor formation
US6060358A (en) * 1997-10-21 2000-05-09 International Business Machines Corporation Damascene NVRAM cell and method of manufacture
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US5981341A (en) * 1997-12-05 1999-11-09 Advanced Micro Devices Sidewall spacer for protecting tunnel oxide during isolation trench formation in self-aligned flash memory core
US5960284A (en) * 1997-12-05 1999-09-28 Taiwan Semiconductor Manufacturing Company, Ltd. Method for forming vertical channel flash memory cell and device manufactured thereby
US6555867B1 (en) * 1997-12-16 2003-04-29 Advanced Micro Devices, Inc. Flash memory gate coupling using HSG polysilicon
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WO1999049517A1 (de) * 1998-03-24 1999-09-30 Siemens Aktiengesellschaft Speicherzellenanordnung und verfahren zu ihrer herstellung
US6225659B1 (en) * 1998-03-30 2001-05-01 Advanced Micro Devices, Inc. Trenched gate semiconductor device and method for low power applications
US6242302B1 (en) * 1998-09-03 2001-06-05 Micron Technology, Inc. Semiconductor processing methods of forming contact openings, methods of forming electrical connections and interconnections, and integrated circuitry
US6330181B1 (en) 1998-09-29 2001-12-11 Texas Instruments Incorporated Method of forming a gate device with raised channel
US6423596B1 (en) 1998-09-29 2002-07-23 Texas Instruments Incorporated Method for two-sided fabrication of a memory array
KR100543637B1 (ko) * 1998-12-29 2006-03-28 주식회사 하이닉스반도체 플래쉬 메모리 소자의 제조 방법
JP3147108B2 (ja) * 1999-01-20 2001-03-19 日本電気株式会社 半導体記憶装置の製造方法
US6316806B1 (en) * 1999-03-31 2001-11-13 Fairfield Semiconductor Corporation Trench transistor with a self-aligned source
TW427018B (en) * 1999-04-07 2001-03-21 United Microelectronics Corp Manufacturing method of flash memory cell
US6177317B1 (en) * 1999-04-14 2001-01-23 Macronix International Co., Ltd. Method of making nonvolatile memory devices having reduced resistance diffusion regions
US6300179B1 (en) * 1999-09-24 2001-10-09 Texas Instruments Incorporated Gate device with access channel formed in discrete post and method
JP2001189439A (ja) * 2000-01-05 2001-07-10 Mitsubishi Electric Corp 不揮発性半導体記憶装置の製造方法及び不揮発性半導体記憶装置
DE10131705B4 (de) 2001-06-29 2010-03-18 Atmel Automotive Gmbh Verfahren zur Herstellung eines DMOS-Transistors
DE10131704A1 (de) * 2001-06-29 2003-01-16 Atmel Germany Gmbh Verfahren zur Dotierung eines Halbleiterkörpers
DE10131707B4 (de) 2001-06-29 2009-12-03 Atmel Automotive Gmbh Verfahren zur Herstellung eines DMOS-Transistors und dessen Verwendung zur Herstellung einer integrierten Schaltung
DE10131706B4 (de) 2001-06-29 2005-10-06 Atmel Germany Gmbh Verfahren zur Herstellung eines DMOS-Transistors
US6566200B2 (en) * 2001-07-03 2003-05-20 Texas Instruments Incorporated Flash memory array structure and method of forming
JP2003174106A (ja) * 2001-12-07 2003-06-20 Fujitsu Ltd 半導体装置及びその製造方法
KR100414735B1 (ko) * 2001-12-10 2004-01-13 주식회사 하이닉스반도체 반도체소자 및 그 형성 방법
DE10200678B4 (de) * 2002-01-10 2006-05-11 Infineon Technologies Ag Verfahren zum Bearbeiten eines Substrats zum Ausbilden einer Struktur
US6830975B2 (en) * 2002-01-31 2004-12-14 Micron Technology, Inc. Method of forming field effect transistor comprising at least one of a conductive metal or metal compound in electrical connection with transistor gate semiconductor material
KR100462175B1 (ko) * 2002-02-08 2004-12-16 삼성전자주식회사 부유게이트를 갖는 비휘발성 메모리 소자의 셀 및 그제조방법
JP3967193B2 (ja) * 2002-05-21 2007-08-29 スパンション エルエルシー 不揮発性半導体記憶装置及びその製造方法
DE10226964A1 (de) * 2002-06-17 2004-01-08 Infineon Technologies Ag Verfahren zur Herstellung einer NROM-Speicherzellenanordnung
US7019353B2 (en) * 2002-07-26 2006-03-28 Micron Technology, Inc. Three dimensional flash cell
US6756303B1 (en) * 2002-07-31 2004-06-29 Advanced Micro Devices, Inc. Diffusion barrier and method for its production
CN1745473B (zh) * 2003-01-30 2010-04-14 因芬尼昂技术股份公司 统一信道程序闪存位线制造方法
US7078349B2 (en) * 2003-07-31 2006-07-18 Taiwan Semiconductor Manufacturing Co., Ltd. Method to form self-aligned floating gate to diffusion structures in flash
DE10345347A1 (de) 2003-09-19 2005-04-14 Atmel Germany Gmbh Verfahren zur Herstellung eines DMOS-Transistors mit lateralem Driftregionen-Dotierstoffprofil
US8236646B2 (en) * 2003-11-06 2012-08-07 Globalfoundries Singapore Pte. Ltd. Non-volatile memory manufacturing method using STI trench implantation
US7049652B2 (en) * 2003-12-10 2006-05-23 Sandisk Corporation Pillar cell flash memory technology
WO2005065179A2 (en) * 2003-12-19 2005-07-21 Third Dimension (3D) Semiconductor, Inc. Method of manufacturing a superjunction device
US7262089B2 (en) 2004-03-11 2007-08-28 Micron Technology, Inc. Methods of forming semiconductor structures
US7256112B2 (en) * 2005-01-20 2007-08-14 Chartered Semiconductor Manufacturing, Ltd Laser activation of implanted contact plug for memory bitline fabrication
US7923373B2 (en) 2007-06-04 2011-04-12 Micron Technology, Inc. Pitch multiplication using self-assembling materials
US8012830B2 (en) 2007-08-08 2011-09-06 Spansion Llc ORO and ORPRO with bit line trench to suppress transport program disturb
FR3012672B1 (fr) 2013-10-31 2017-04-14 Stmicroelectronics Rousset Cellule memoire comprenant des grilles de controle horizontale et verticale non auto-alignees
FR3017746B1 (fr) * 2014-02-18 2016-05-27 Stmicroelectronics Rousset Cellule memoire verticale ayant un implant drain-source flottant non auto-aligne
EP4297548A1 (de) * 2022-06-16 2023-12-27 STMicroelectronics Crolles 2 SAS Verfahren zur herstellung elektronischer bauelemente

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10214126A1 (de) * 2002-03-28 2003-10-23 Infineon Technologies Ag Herstellungsverfahren für eine Mehrzahl von ungefähr gleich hohen und gleich beabstandeten Gatestapeln auf einem Halbleitersubstrat
US7129155B2 (en) 2002-03-28 2006-10-31 Infineon Technologies Ag Process for producing a plurality of gate stacks which are approximately the same height and equidistant on a semiconductor substrate

Also Published As

Publication number Publication date
EP0547711A2 (de) 1993-06-23
DE69224716D1 (de) 1998-04-16
US5278438A (en) 1994-01-11
EP0547711A3 (en) 1993-11-10
TW230832B (de) 1994-09-21
EP0547711B1 (de) 1998-03-11
JPH05275713A (ja) 1993-10-22

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: KONINKLIJKE PHILIPS ELECTRONICS N.V., EINDHOVEN, N

8320 Willingness to grant licences declared (paragraph 23)
8339 Ceased/non-payment of the annual fee