DE69112111T2 - Optisches Mikroskop mit variabler Vergrösserung. - Google Patents

Optisches Mikroskop mit variabler Vergrösserung.

Info

Publication number
DE69112111T2
DE69112111T2 DE69112111T DE69112111T DE69112111T2 DE 69112111 T2 DE69112111 T2 DE 69112111T2 DE 69112111 T DE69112111 T DE 69112111T DE 69112111 T DE69112111 T DE 69112111T DE 69112111 T2 DE69112111 T2 DE 69112111T2
Authority
DE
Germany
Prior art keywords
optical microscope
variable magnification
magnification
variable
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE69112111T
Other languages
English (en)
Other versions
DE69112111D1 (de
Inventor
Jitsunari Kojima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Optical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Optical Co Ltd filed Critical Olympus Optical Co Ltd
Application granted granted Critical
Publication of DE69112111D1 publication Critical patent/DE69112111D1/de
Publication of DE69112111T2 publication Critical patent/DE69112111T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/26Stages; Adjusting means therefor
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/24Base structure
    • G02B21/248Base structure objective (or ocular) turrets
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B7/00Mountings, adjusting means, or light-tight connections, for optical elements
    • G02B7/02Mountings, adjusting means, or light-tight connections, for optical elements for lenses
    • G02B7/14Mountings, adjusting means, or light-tight connections, for optical elements for lenses adapted to interchange lenses
    • G02B7/16Rotatable turrets
DE69112111T 1990-04-16 1991-04-16 Optisches Mikroskop mit variabler Vergrösserung. Expired - Lifetime DE69112111T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2097722A JP2925647B2 (ja) 1990-04-16 1990-04-16 顕微鏡変倍装置

Publications (2)

Publication Number Publication Date
DE69112111D1 DE69112111D1 (de) 1995-09-21
DE69112111T2 true DE69112111T2 (de) 1996-01-18

Family

ID=14199786

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69112111T Expired - Lifetime DE69112111T2 (de) 1990-04-16 1991-04-16 Optisches Mikroskop mit variabler Vergrösserung.

Country Status (4)

Country Link
US (1) US5276550A (de)
EP (1) EP0453239B1 (de)
JP (1) JP2925647B2 (de)
DE (1) DE69112111T2 (de)

Cited By (5)

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Publication number Priority date Publication date Assignee Title
WO1999049348A1 (de) * 1998-03-23 1999-09-30 Leica Microsystems Wetzlar Gmbh Verfahren zur video-mikroskopie
DE10225193A1 (de) * 2002-06-06 2004-01-08 Leica Microsystems (Schweiz) Ag Verfahren zur Kalibrierung eines Stereomikroskops sowie kalibrierbares Stereomikroskop
DE19637756B4 (de) * 1995-09-15 2010-02-25 Accumed Inc., Chicago Multifunktionale Steuereinheit für ein Mikroskop
EP2345920B1 (de) 2008-10-02 2019-01-16 Nikon Corporation Mikroskopsystem und verfahren zur betrachtungskontrolle
EP4067965A1 (de) * 2021-03-31 2022-10-05 PreciPoint GmbH Verfahren zur bereitstellung eines zusammengesetzten bildes unter verwendung eines digitalmikroskops, digitalmikroskopsystem und programm zur bereitstellung eines zusammengesetzten bildes unter verwendung eines digitalmikroskops

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EP0732640A3 (de) * 1992-04-30 1996-12-04 Becton Dickinson Co Verfahren und Vorrichtung zur Steuerung von Koordinatenverschiebungen einer Plattform
JP3306972B2 (ja) * 1993-02-26 2002-07-24 キヤノン株式会社 位置検出装置及びそれを用いた半導体素子の製造方法
US5587833A (en) * 1993-07-09 1996-12-24 Compucyte Corporation Computerized microscope specimen encoder
CA2166464C (en) * 1993-07-09 2002-01-01 Louis A. Kamentsky Computerized microscope specimen encoder
DE9321266U1 (de) * 1993-12-24 1996-11-28 Zeiss Carl Jena Gmbh Optisches System mit variablem Abbildungsmaßstab
DE29522307U1 (de) * 1994-03-24 2002-01-31 Koninkl Philips Electronics Nv Operationsmikroskop
CH689703A5 (de) * 1994-05-18 1999-08-31 Zeiss Carl Fa Photomikroskop.
JP3351115B2 (ja) * 1994-08-05 2002-11-25 株式会社ニコン 顕微鏡の回転レボルバ制御装置
JP3406987B2 (ja) * 1995-01-30 2003-05-19 株式会社ニコン 電動式顕微鏡
DE69530367T2 (de) * 1995-03-06 2004-02-19 Perkin-Elmer Ltd., Beaconsfield Kontrolle eines Mikroskopprobenträgers
JP3656918B2 (ja) * 1995-06-12 2005-06-08 オリンパス株式会社 電動レボルバ制御装置
US6091842A (en) * 1996-10-25 2000-07-18 Accumed International, Inc. Cytological specimen analysis system with slide mapping and generation of viewing path information
US5930732A (en) * 1995-09-15 1999-07-27 Accumed International, Inc. System for simplifying the implementation of specified functions
US6118581A (en) * 1995-09-15 2000-09-12 Accumed International, Inc. Multifunctional control unit for a microscope
US5818637A (en) * 1996-02-26 1998-10-06 Hoover; Rex A. Computerized video microscopy system
EP0819963B1 (de) * 1996-07-16 2003-09-17 Perkin-Elmer Limited Kontrolle eines Infrarotmikroskops
DE69631475T2 (de) * 1996-07-16 2005-01-13 Perkin-Elmer Ltd., Beaconsfield Kontrolle einer Mikroskopblende
US6272235B1 (en) * 1997-03-03 2001-08-07 Bacus Research Laboratories, Inc. Method and apparatus for creating a virtual microscope slide
JPH1096848A (ja) * 1996-09-20 1998-04-14 Olympus Optical Co Ltd 自動焦点検出装置
DE69841245D1 (de) * 1997-03-03 2009-11-26 Olympus America Inc Verfahren und Vorrichtung zur Erzeugung eines virtuellen Objektträgers für ein Mikroskop
US6323995B1 (en) * 1998-03-17 2001-11-27 Olympus Optical Co., Ltd. Optical element switching device and optical microscope loaded with the device
JP3863993B2 (ja) * 1998-03-18 2006-12-27 オリンパス株式会社 顕微鏡
US6847729B1 (en) 1999-04-21 2005-01-25 Fairfield Imaging Limited Microscopy
US6400395B1 (en) * 1999-09-08 2002-06-04 Rex A. Hoover Computerized video microscopy system
US20020051287A1 (en) * 2000-07-25 2002-05-02 Olympus Optical Co., Ltd. Imaging apparatus for microscope
JP2002090633A (ja) * 2000-09-19 2002-03-27 Olympus Optical Co Ltd 顕微鏡
JP4700794B2 (ja) * 2000-09-21 2011-06-15 オリンパス株式会社 光学顕微鏡装置
JP2002148526A (ja) * 2000-11-06 2002-05-22 Nikon Corp 顕微鏡装置
JP4733845B2 (ja) * 2001-03-05 2011-07-27 オリンパス株式会社 画像取得装置
GB2398196B (en) 2003-02-05 2005-06-01 Fairfield Imaging Ltd Microscope system and method
DE10324238A1 (de) * 2003-05-28 2004-12-16 Carl Zeiss Meditec Ag Verfahren und Anordnung zur Feststellung der eingestellten Vergrößerungsstufe bei opthalmologischen Geräten, insbesondere Spaltlampen
CN100340891C (zh) * 2003-06-05 2007-10-03 北京普利生仪器有限公司 光学自动显微镜
US7756357B2 (en) * 2003-07-01 2010-07-13 Olympus Corporation Microscope system for obtaining high and low magnification images
JP2005114859A (ja) * 2003-10-03 2005-04-28 Nikon Corp 顕微鏡
JP2005266083A (ja) * 2004-03-17 2005-09-29 Olympus Corp 観察装置及び観察方法
JP4838004B2 (ja) * 2005-04-08 2011-12-14 オリンパス株式会社 顕微鏡、顕微鏡の制御方法、及びプログラム
JP2007034050A (ja) * 2005-07-28 2007-02-08 Olympus Corp 観察装置及びその制御方法
US20070236489A1 (en) * 2006-01-30 2007-10-11 Jung Edward K Positional display elements
JP4996304B2 (ja) * 2007-03-28 2012-08-08 オリンパス株式会社 走査型顕微鏡とその調節方法
JP4979464B2 (ja) * 2007-05-31 2012-07-18 オリンパス株式会社 顕微鏡装置、該制御プログラム、及び該制御方法
US8264768B2 (en) * 2007-06-07 2012-09-11 Olympus Corporation Microscope system
WO2010035414A1 (ja) 2008-09-26 2010-04-01 オリンパス株式会社 顕微鏡システム、該制御プログラムが格納された記憶媒体、及び該制御方法
WO2010038845A1 (ja) * 2008-10-02 2010-04-08 株式会社ニコン 顕微鏡システム
JP5368821B2 (ja) * 2009-02-13 2013-12-18 キヤノン株式会社 カメラ制御装置、カメラ制御方法及びプログラム
DE102009012707A1 (de) * 2009-03-11 2010-09-16 Carl Zeiss Microlmaging Gmbh Mikroskop mit mehreren optischen Systemen im Abbildungsstrahlengang
EP2246725A3 (de) * 2009-04-30 2011-01-26 Olympus Corporation Mikroskop mit unbeweglicher Bildgebungseinrichtung und beweglichem Objektiv
JP5467011B2 (ja) * 2010-07-27 2014-04-09 オリンパス株式会社 顕微鏡システム
CN101975987B (zh) * 2010-09-27 2012-11-07 江苏大学 基于便携桥搭结构的显微镜自动控制台
JP2014002190A (ja) * 2012-06-15 2014-01-09 Dainippon Printing Co Ltd コンピュータ装置及びプログラム
JP6278601B2 (ja) * 2013-02-15 2018-02-14 オリンパス株式会社 顕微鏡システム及びプログラム
JP5639251B2 (ja) * 2013-11-22 2014-12-10 オリンパス株式会社 顕微鏡システム
JP5639250B2 (ja) * 2013-11-22 2014-12-10 オリンパス株式会社 顕微鏡システム
JP5639252B2 (ja) * 2013-11-22 2014-12-10 オリンパス株式会社 顕微鏡システム

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Publication number Priority date Publication date Assignee Title
GB2061856A (en) * 1979-10-30 1981-05-20 Metal Box Co Ltd Apparatus and method for combining articles delivered in rows into a single output file
JPS59172617A (ja) * 1983-03-22 1984-09-29 Olympus Optical Co Ltd 自動制御式照明光学系を備えた顕微鏡
JPS59177508A (ja) * 1983-03-29 1984-10-08 Olympus Optical Co Ltd 自動焦点装置を備えた顕微鏡
JPS59177507A (ja) * 1983-03-29 1984-10-08 Olympus Optical Co Ltd 自動焦点装置を備えた顕微鏡
JPS608816A (ja) * 1983-06-29 1985-01-17 Olympus Optical Co Ltd 自動ステ−ジ間欠移動装置を備えた顕微鏡
JPS60118827A (ja) * 1983-11-30 1985-06-26 Konishiroku Photo Ind Co Ltd カメラの防塵プレ−ト製作方法
JPH0644278B2 (ja) * 1984-03-27 1994-06-08 株式会社ニレコ 画像解析による組織自動定量測定方法およびその装置
US4685140A (en) * 1984-06-26 1987-08-04 Kera Corporation Keratograph autoscanner system
US4725720A (en) * 1985-05-27 1988-02-16 Mitutoyo Manufacturing Co., Ltd. Microscope with auto focus and light adjusting means
JPS6232244A (ja) * 1985-06-28 1987-02-12 Nippon Denso Co Ltd デイ−ゼルエンジンの制御装置
JPS63167313A (ja) * 1986-12-27 1988-07-11 Hitachi Ltd 自動焦点制御方法
JPS6453157A (en) * 1987-08-24 1989-03-01 Shiseido Co Ltd Method and instrument for measuring characteristic of cutaneous cell
US4755874A (en) * 1987-08-31 1988-07-05 Kla Instruments Corporation Emission microscopy system
JPH0245734A (ja) * 1988-08-05 1990-02-15 Mitsubishi Heavy Ind Ltd 自動組織解析処理装置
US5033103A (en) * 1988-12-09 1991-07-16 The United States Of America As Represented By The Secretary Of The Air Force Model of the lateral inhibition, energy normalization, and noise suppression processes in the retina
DE69021608T2 (de) * 1989-03-20 1996-05-02 Olympus Optical Co Mikroskop.

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE19637756B4 (de) * 1995-09-15 2010-02-25 Accumed Inc., Chicago Multifunktionale Steuereinheit für ein Mikroskop
WO1999049348A1 (de) * 1998-03-23 1999-09-30 Leica Microsystems Wetzlar Gmbh Verfahren zur video-mikroskopie
DE10225193A1 (de) * 2002-06-06 2004-01-08 Leica Microsystems (Schweiz) Ag Verfahren zur Kalibrierung eines Stereomikroskops sowie kalibrierbares Stereomikroskop
DE10225193B4 (de) * 2002-06-06 2004-08-12 Leica Microsystems (Schweiz) Ag Verfahren zur Kalibrierung der Vergrößerung eines Mikroskops sowie kalibrierbares Mikroskop
EP2345920B1 (de) 2008-10-02 2019-01-16 Nikon Corporation Mikroskopsystem und verfahren zur betrachtungskontrolle
EP4067965A1 (de) * 2021-03-31 2022-10-05 PreciPoint GmbH Verfahren zur bereitstellung eines zusammengesetzten bildes unter verwendung eines digitalmikroskops, digitalmikroskopsystem und programm zur bereitstellung eines zusammengesetzten bildes unter verwendung eines digitalmikroskops
WO2022207731A1 (en) * 2021-03-31 2022-10-06 Precipoint Gmbh Method of providing an assembled image using a digital microscope, digital microscope system, and program for providing an assembled image using a digital microscope

Also Published As

Publication number Publication date
EP0453239A1 (de) 1991-10-23
DE69112111D1 (de) 1995-09-21
JP2925647B2 (ja) 1999-07-28
EP0453239B1 (de) 1995-08-16
US5276550A (en) 1994-01-04
JPH03296011A (ja) 1991-12-26

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