DE69105530D1 - Halbleiterscheibe. - Google Patents

Halbleiterscheibe.

Info

Publication number
DE69105530D1
DE69105530D1 DE69105530T DE69105530T DE69105530D1 DE 69105530 D1 DE69105530 D1 DE 69105530D1 DE 69105530 T DE69105530 T DE 69105530T DE 69105530 T DE69105530 T DE 69105530T DE 69105530 D1 DE69105530 D1 DE 69105530D1
Authority
DE
Germany
Prior art keywords
semiconductor wafer
wafer
semiconductor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69105530T
Other languages
English (en)
Other versions
DE69105530T2 (de
Inventor
Aiichiro Sakumoto
Michihiro Kawakami
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Toshiba Electronic Device Solutions Corp
Original Assignee
Toshiba Corp
Toshiba Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp, Toshiba Microelectronics Corp filed Critical Toshiba Corp
Publication of DE69105530D1 publication Critical patent/DE69105530D1/de
Application granted granted Critical
Publication of DE69105530T2 publication Critical patent/DE69105530T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
    • H01L22/32—Additional lead-in metallisation on a device or substrate, e.g. additional pads or pad portions, lines in the scribe line, sacrificed conductors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test

Landscapes

  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Dicing (AREA)
DE69105530T 1990-01-19 1991-01-16 Halbleiterscheibe. Expired - Fee Related DE69105530T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP958290A JPH0758725B2 (ja) 1990-01-19 1990-01-19 半導体ウェハ

Publications (2)

Publication Number Publication Date
DE69105530D1 true DE69105530D1 (de) 1995-01-19
DE69105530T2 DE69105530T2 (de) 1995-05-04

Family

ID=11724307

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69105530T Expired - Fee Related DE69105530T2 (de) 1990-01-19 1991-01-16 Halbleiterscheibe.

Country Status (4)

Country Link
EP (1) EP0438127B1 (de)
JP (1) JPH0758725B2 (de)
KR (1) KR940010641B1 (de)
DE (1) DE69105530T2 (de)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0678904A1 (de) * 1994-04-12 1995-10-25 Lsi Logic Corporation Wafer-Schneidverfahren durch Mehrfachschnitte
JPH07302773A (ja) * 1994-05-06 1995-11-14 Texas Instr Japan Ltd 半導体ウエハ及び半導体装置
EP0767492A3 (de) * 1995-10-02 1998-09-09 Altera Corporation Testsystem integrierter Schaltungen
US6020758A (en) * 1996-03-11 2000-02-01 Altera Corporation Partially reconfigurable programmable logic device
JPH09252034A (ja) * 1996-03-18 1997-09-22 Mitsubishi Electric Corp 半導体ウエハ，半導体装置及び半導体装置の製造方法
JP2001135597A (ja) * 1999-08-26 2001-05-18 Fujitsu Ltd 半導体装置の製造方法
ATE334479T1 (de) * 2000-07-21 2006-08-15 Koninkl Philips Electronics Nv VERFAHREN ZUR HERSTELLUNG INTEGRIERTER SCHALTUNGEN MIT VERBESSERTEN LEITERBAHNEN IN SOGENANNTER ßSÄGEBÜGELß-FORM
JP4631572B2 (ja) * 2005-07-14 2011-02-16 セイコーエプソン株式会社 液滴吐出ヘッド
JP2013187402A (ja) 2012-03-08 2013-09-19 Mitsubishi Electric Corp 半導体ウェハ及びその検査方法

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3849872A (en) * 1972-10-24 1974-11-26 Ibm Contacting integrated circuit chip terminal through the wafer kerf
JPH0530361Y2 (de) * 1988-02-23 1993-08-03
JPH01276735A (ja) * 1988-04-28 1989-11-07 Fuji Electric Co Ltd 集積回路素子ウエハ

Also Published As

Publication number Publication date
EP0438127A2 (de) 1991-07-24
EP0438127B1 (de) 1994-12-07
KR910015039A (ko) 1991-08-31
EP0438127A3 (en) 1992-03-04
DE69105530T2 (de) 1995-05-04
JPH03214638A (ja) 1991-09-19
KR940010641B1 (ko) 1994-10-24
JPH0758725B2 (ja) 1995-06-21

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee