DE69023961D1 - Bit- und Block-Löschen einer elektrisch löschbaren und programmierbaren Nur-Lese-Speicheranordnung. - Google Patents

Bit- und Block-Löschen einer elektrisch löschbaren und programmierbaren Nur-Lese-Speicheranordnung.

Info

Publication number
DE69023961D1
DE69023961D1 DE69023961T DE69023961T DE69023961D1 DE 69023961 D1 DE69023961 D1 DE 69023961D1 DE 69023961 T DE69023961 T DE 69023961T DE 69023961 T DE69023961 T DE 69023961T DE 69023961 D1 DE69023961 D1 DE 69023961D1
Authority
DE
Germany
Prior art keywords
bit
memory array
programmable read
electrically erasable
block erase
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69023961T
Other languages
English (en)
Other versions
DE69023961T2 (de
Inventor
Manzur Gill
Arrigo Iano D
Sung-Wei Lin
David Mcelroy
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Inc
Original Assignee
Texas Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Inc filed Critical Texas Instruments Inc
Application granted granted Critical
Publication of DE69023961D1 publication Critical patent/DE69023961D1/de
Publication of DE69023961T2 publication Critical patent/DE69023961T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B41/00—Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/14—Circuits for erasing electrically, e.g. erase voltage switching circuits
    • G11C16/16—Circuits for erasing electrically, e.g. erase voltage switching circuits for erasing blocks, e.g. arrays, words, groups
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/788—Field effect transistors with field effect produced by an insulated gate with floating gate
    • H01L29/7881—Programmable transistors with only two possible levels of programmation
    • H01L29/7883—Programmable transistors with only two possible levels of programmation charging by tunnelling of carriers, e.g. Fowler-Nordheim tunnelling
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B69/00—Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
  • Read Only Memory (AREA)
DE69023961T 1989-06-30 1990-05-23 Bit- und Block-Löschen einer elektrisch löschbaren und programmierbaren Nur-Lese-Speicheranordnung. Expired - Fee Related DE69023961T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US07/374,113 US5047981A (en) 1988-07-15 1989-06-30 Bit and block erasing of an electrically erasable and programmable read-only memory array

Publications (2)

Publication Number Publication Date
DE69023961D1 true DE69023961D1 (de) 1996-01-18
DE69023961T2 DE69023961T2 (de) 1996-04-25

Family

ID=23475342

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69023961T Expired - Fee Related DE69023961T2 (de) 1989-06-30 1990-05-23 Bit- und Block-Löschen einer elektrisch löschbaren und programmierbaren Nur-Lese-Speicheranordnung.

Country Status (4)

Country Link
US (1) US5047981A (de)
EP (1) EP0405140B1 (de)
JP (1) JPH0380498A (de)
DE (1) DE69023961T2 (de)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100204721B1 (ko) * 1989-08-18 1999-06-15 가나이 쓰도무 메모리블럭으로 분활된 메모리셀 어레이를 갖는 전기적 소거 가능한 반도체 불휘발성 기억장치
JP2624864B2 (ja) * 1990-02-28 1997-06-25 株式会社東芝 不揮発性半導体メモリ
JP3099887B2 (ja) * 1990-04-12 2000-10-16 株式会社東芝 不揮発性半導体記憶装置
US5122985A (en) * 1990-04-16 1992-06-16 Giovani Santin Circuit and method for erasing eeprom memory arrays to prevent over-erased cells
US5313432A (en) * 1990-05-23 1994-05-17 Texas Instruments Incorporated Segmented, multiple-decoder memory array and method for programming a memory array
US5187683A (en) * 1990-08-31 1993-02-16 Texas Instruments Incorporated Method for programming EEPROM memory arrays
JPH04123471A (ja) 1990-09-14 1992-04-23 Oki Electric Ind Co Ltd 半導体記憶装置のデータ書込みおよび消去方法
US5258949A (en) * 1990-12-03 1993-11-02 Motorola, Inc. Nonvolatile memory with enhanced carrier generation and method for programming the same
JPH04255996A (ja) * 1991-02-08 1992-09-10 Mitsubishi Electric Corp 不揮発性半導体記憶装置
JP3026869B2 (ja) * 1991-10-31 2000-03-27 ローム株式会社 半導体不揮発性記憶装置の製造方法
EP0961290B1 (de) * 1991-12-09 2001-11-14 Fujitsu Limited Flash-Speicher mit besserer Löschbarkeit und dessen Schaltung
EP1032034A1 (de) * 1992-01-22 2000-08-30 Macronix International Co., Ltd. Verfahren zur Speicherbauelementherstellung
US5388069A (en) * 1992-03-19 1995-02-07 Fujitsu Limited Nonvolatile semiconductor memory device for preventing erroneous operation caused by over-erase phenomenon
JP3216230B2 (ja) * 1992-04-24 2001-10-09 新日本製鐵株式会社 不揮発性半導体メモリセルの書き換え方式
JP3075544B2 (ja) * 1992-04-30 2000-08-14 ローム株式会社 不揮発性メモリの使用方法
JP3199882B2 (ja) * 1993-01-13 2001-08-20 株式会社東芝 不揮発性半導体記憶装置
KR960000616B1 (ko) * 1993-01-13 1996-01-10 삼성전자주식회사 불휘발성 반도체 메모리 장치
US5692194A (en) * 1993-05-24 1997-11-25 Hughes Aircraft Company Sequential information integration service for automatically transferring a most recent data entity between a plurality of program modules and a storage in a computer
JP2839819B2 (ja) 1993-05-28 1998-12-16 株式会社東芝 不揮発性半導体記憶装置
US5467307A (en) * 1993-10-12 1995-11-14 Texas Instruments Incorporated Memory array utilizing low voltage Fowler-Nordheim Flash EEPROM cell
KR100193101B1 (ko) * 1994-07-22 1999-06-15 모리시다 요이치 비휘발성 반도체 기억장치 및 그 구동방법
JP3584494B2 (ja) * 1994-07-25 2004-11-04 ソニー株式会社 半導体不揮発性記憶装置
JP3204848B2 (ja) * 1994-08-09 2001-09-04 株式会社東芝 レベル変換回路及びこのレベル変換回路を用いてレベル変換されたデータを出力する方法
KR0135234B1 (ko) * 1994-08-09 1998-04-22 김주용 비휘발성 기억소자 제조방법
DE69429264T2 (de) * 1994-09-27 2002-06-13 St Microelectronics Srl Byte-löschbares EEPROM, das mit einem mit einer einzigen Stromversorgung versehenen Flash-EPROM-System kompatibel ist
KR0172271B1 (ko) * 1995-04-25 1999-02-01 김주용 플래쉬 이이피롬 셀의 제조방법
US5706228A (en) * 1996-02-20 1998-01-06 Motorola, Inc. Method for operating a memory array
US5673224A (en) * 1996-02-23 1997-09-30 Micron Quantum Devices, Inc. Segmented non-volatile memory array with multiple sources with improved word line control circuitry
US5796657A (en) * 1996-03-29 1998-08-18 Aplus Integrated Circuits, Inc. Flash memory with flexible erasing size from multi-byte to multi-block
JP2977023B2 (ja) * 1996-09-30 1999-11-10 日本電気株式会社 不揮発性半導体記憶装置及びその製造方法
US5953251A (en) * 1998-12-18 1999-09-14 Motorola, Inc. Programming method for nonvolatile memories
JP3920501B2 (ja) * 1999-04-02 2007-05-30 株式会社東芝 不揮発性半導体記憶装置及びそのデータ消去制御方法
US6160739A (en) * 1999-04-16 2000-12-12 Sandisk Corporation Non-volatile memories with improved endurance and extended lifetime
US6101130A (en) * 1999-06-29 2000-08-08 Motorola Inc. Semiconductor device memory cell and method for selectively erasing the same
US6141255A (en) * 1999-09-02 2000-10-31 Advanced Micro Devices, Inc. 1 transistor cell for EEPROM application
US6624024B1 (en) * 2002-08-29 2003-09-23 Micron Technology, Inc. Method and apparatus for a flash memory device comprising a source local interconnect
CN109852544B (zh) * 2019-03-29 2023-07-14 欧阳东方 细胞分离用微流控芯片及其在肿瘤细胞分离中的应用、细胞分离鉴定方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1494833A (en) * 1974-10-11 1977-12-14 Plessey Co Ltd Content addressable memories
US4115914A (en) * 1976-03-26 1978-09-26 Hughes Aircraft Company Electrically erasable non-volatile semiconductor memory
US4112509A (en) * 1976-12-27 1978-09-05 Texas Instruments Incorporated Electrically alterable floating gate semiconductor memory device
US4130890A (en) * 1977-06-08 1978-12-19 Itt Industries, Inc. Integrated DDC memory with bitwise erase
US4328565A (en) * 1980-04-07 1982-05-04 Eliyahou Harari Non-volatile eprom with increased efficiency
US4377857A (en) * 1980-11-18 1983-03-22 Fairchild Camera & Instrument Electrically erasable programmable read-only memory
DE3138947A1 (de) * 1981-09-30 1983-04-21 Siemens AG, 1000 Berlin und 8000 München Speicherzelle mit einem doppel-gate feldeffekttransistor und verfahren zu ihrem betrieb
US4451905A (en) * 1981-12-28 1984-05-29 Hughes Aircraft Company Electrically erasable programmable read-only memory cell having a single transistor
US4783766A (en) * 1986-05-30 1988-11-08 Seeq Technology, Inc. Block electrically erasable EEPROM
US4924437A (en) * 1987-12-09 1990-05-08 Texas Instruments Incorporated Erasable programmable memory including buried diffusion source/drain lines and erase lines
US4949309A (en) * 1988-05-11 1990-08-14 Catalyst Semiconductor, Inc. EEPROM utilizing single transistor per cell capable of both byte erase and flash erase

Also Published As

Publication number Publication date
US5047981A (en) 1991-09-10
DE69023961T2 (de) 1996-04-25
EP0405140A1 (de) 1991-01-02
EP0405140B1 (de) 1995-12-06
JPH0380498A (ja) 1991-04-05

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee