DE68921780D1 - In ein Halbleiterspeichergerät eingebaute Redundanzschaltung. - Google Patents

In ein Halbleiterspeichergerät eingebaute Redundanzschaltung.

Info

Publication number
DE68921780D1
DE68921780D1 DE68921780T DE68921780T DE68921780D1 DE 68921780 D1 DE68921780 D1 DE 68921780D1 DE 68921780 T DE68921780 T DE 68921780T DE 68921780 T DE68921780 T DE 68921780T DE 68921780 D1 DE68921780 D1 DE 68921780D1
Authority
DE
Germany
Prior art keywords
memory device
semiconductor memory
circuit built
redundancy circuit
redundancy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE68921780T
Other languages
English (en)
Other versions
DE68921780T2 (de
Inventor
Takahiko C O Nec Corporat Urai
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Electronics Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Publication of DE68921780D1 publication Critical patent/DE68921780D1/de
Application granted granted Critical
Publication of DE68921780T2 publication Critical patent/DE68921780T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/52—Protection of memory contents; Detection of errors in memory contents
DE68921780T 1988-04-12 1989-04-11 In ein Halbleiterspeichergerät eingebaute Redundanzschaltung. Expired - Fee Related DE68921780T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63090519A JP2785936B2 (ja) 1988-04-12 1988-04-12 冗長回路のテスト方法

Publications (2)

Publication Number Publication Date
DE68921780D1 true DE68921780D1 (de) 1995-04-27
DE68921780T2 DE68921780T2 (de) 1995-11-23

Family

ID=14000699

Family Applications (1)

Application Number Title Priority Date Filing Date
DE68921780T Expired - Fee Related DE68921780T2 (de) 1988-04-12 1989-04-11 In ein Halbleiterspeichergerät eingebaute Redundanzschaltung.

Country Status (4)

Country Link
US (1) US5018104A (de)
EP (1) EP0337384B1 (de)
JP (1) JP2785936B2 (de)
DE (1) DE68921780T2 (de)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0335498A (ja) * 1989-06-30 1991-02-15 Mitsubishi Electric Corp 半導体記憶装置
JP3021771B2 (ja) * 1991-04-27 2000-03-15 日本電気株式会社 冗長回路
US5251169A (en) * 1991-05-06 1993-10-05 Lattice Semiconductor Corporation Non-volatile erasable and programmable interconnect cell
US5325333A (en) * 1991-12-27 1994-06-28 Nec Corporation Semiconductor memory device
US5502333A (en) * 1994-03-30 1996-03-26 International Business Machines Corporation Semiconductor stack structures and fabrication/sparing methods utilizing programmable spare circuit
JPH1116387A (ja) * 1997-06-26 1999-01-22 Mitsubishi Electric Corp 冗長回路
US6535034B1 (en) 1997-07-30 2003-03-18 Programmable Silicon Solutions High performance integrated circuit devices adaptable to use lower supply voltages with smaller device geometries
US5841694A (en) * 1997-07-30 1998-11-24 Programmable Silicon Solutions High performance programmable interconnect
KR19990053744A (ko) * 1997-12-24 1999-07-15 김영환 반도체 소자의 게이트전극 형성방법
JPH11231967A (ja) 1998-02-17 1999-08-27 Nec Corp クロック出力回路
JP3625383B2 (ja) * 1998-08-25 2005-03-02 シャープ株式会社 不揮発性半導体メモリ装置
JP4600792B2 (ja) 2000-07-13 2010-12-15 エルピーダメモリ株式会社 半導体装置
TWI591959B (zh) * 2016-03-18 2017-07-11 立積電子股份有限公司 主動電路

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4535259A (en) * 1982-06-18 1985-08-13 Seeq Technology, Inc. Sense amplifier for use with a semiconductor memory array
JPS593795A (ja) * 1982-06-30 1984-01-10 Fujitsu Ltd 半導体記憶装置
US4556975A (en) * 1983-02-07 1985-12-03 Westinghouse Electric Corp. Programmable redundancy circuit
US4567580A (en) * 1983-06-29 1986-01-28 Fairchild Camera & Instrument Corporation Redundancy roll call technique
JP2530610B2 (ja) * 1986-02-27 1996-09-04 富士通株式会社 半導体記憶装置
JPS62222500A (ja) * 1986-03-20 1987-09-30 Fujitsu Ltd 半導体記憶装置

Also Published As

Publication number Publication date
US5018104A (en) 1991-05-21
JPH01261845A (ja) 1989-10-18
DE68921780T2 (de) 1995-11-23
EP0337384A3 (de) 1991-07-17
EP0337384B1 (de) 1995-03-22
JP2785936B2 (ja) 1998-08-13
EP0337384A2 (de) 1989-10-18

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8327 Change in the person/name/address of the patent owner

Owner name: NEC ELECTRONICS CORP., KAWASAKI, KANAGAWA, JP

8339 Ceased/non-payment of the annual fee