DE60210900D1 - Prüfschaltung und integrierte Halbleiterschaltung zur Durchführung der Überprüfung von Knotenverbindungen - Google Patents
Prüfschaltung und integrierte Halbleiterschaltung zur Durchführung der Überprüfung von KnotenverbindungenInfo
- Publication number
- DE60210900D1 DE60210900D1 DE60210900T DE60210900T DE60210900D1 DE 60210900 D1 DE60210900 D1 DE 60210900D1 DE 60210900 T DE60210900 T DE 60210900T DE 60210900 T DE60210900 T DE 60210900T DE 60210900 D1 DE60210900 D1 DE 60210900D1
- Authority
- DE
- Germany
- Prior art keywords
- check
- semiconductor integrated
- integrated circuit
- node connections
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31712—Input or output aspects
- G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3185—Reconfiguring for testing, e.g. LSSD, partitioning
- G01R31/318533—Reconfiguring for testing, e.g. LSSD, partitioning using scanning techniques, e.g. LSSD, Boundary Scan, JTAG
- G01R31/318572—Input/Output interfaces
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2001269216 | 2001-09-05 | ||
JP2001269216A JP3955196B2 (ja) | 2001-09-05 | 2001-09-05 | 試験回路および半導体集積回路装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE60210900D1 true DE60210900D1 (de) | 2006-06-01 |
DE60210900T2 DE60210900T2 (de) | 2006-08-31 |
Family
ID=19095075
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60222481T Expired - Lifetime DE60222481T2 (de) | 2001-09-05 | 2002-02-27 | Prüfschaltung und integrierte Halbleiterschaltung zur Durchführung der Überprüfung von Knotenverbindungen |
DE60210900T Expired - Lifetime DE60210900T2 (de) | 2001-09-05 | 2002-02-27 | Prüfschaltung und integrierte Halbleiterschaltung zur Durchführung der Überprüfung von Knotenverbindungen |
Family Applications Before (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE60222481T Expired - Lifetime DE60222481T2 (de) | 2001-09-05 | 2002-02-27 | Prüfschaltung und integrierte Halbleiterschaltung zur Durchführung der Überprüfung von Knotenverbindungen |
Country Status (4)
Country | Link |
---|---|
US (1) | US6931344B2 (de) |
EP (2) | EP1612573B1 (de) |
JP (1) | JP3955196B2 (de) |
DE (2) | DE60222481T2 (de) |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE10109558C1 (de) * | 2001-02-28 | 2003-01-30 | Siemens Ag | Empfängerseitige Zusatzschaltung für den Boundary Scan bei der Datenübertragung mit differentiellen Signalen |
US6653957B1 (en) * | 2002-10-08 | 2003-11-25 | Agilent Technologies, Inc. | SERDES cooperates with the boundary scan test technique |
JP4388903B2 (ja) | 2005-02-09 | 2009-12-24 | 富士通マイクロエレクトロニクス株式会社 | Jtag試験方式 |
US7913141B2 (en) * | 2006-08-16 | 2011-03-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | Power gating in integrated circuits for leakage reduction |
CN100487473C (zh) * | 2006-08-17 | 2009-05-13 | 华为技术有限公司 | 边界扫描系统及方法 |
CN101796630A (zh) * | 2007-09-10 | 2010-08-04 | 富士通株式会社 | 集成电路以及噪声测量方法 |
US7958479B2 (en) * | 2007-12-04 | 2011-06-07 | Alcatel-Lucent Usa Inc. | Method and apparatus for describing and testing a system-on-chip |
US7962885B2 (en) * | 2007-12-04 | 2011-06-14 | Alcatel-Lucent Usa Inc. | Method and apparatus for describing components adapted for dynamically modifying a scan path for system-on-chip testing |
US7949915B2 (en) * | 2007-12-04 | 2011-05-24 | Alcatel-Lucent Usa Inc. | Method and apparatus for describing parallel access to a system-on-chip |
US7958417B2 (en) * | 2008-01-30 | 2011-06-07 | Alcatel-Lucent Usa Inc. | Apparatus and method for isolating portions of a scan path of a system-on-chip |
US7954022B2 (en) * | 2008-01-30 | 2011-05-31 | Alcatel-Lucent Usa Inc. | Apparatus and method for controlling dynamic modification of a scan path |
US7728604B1 (en) * | 2008-02-11 | 2010-06-01 | Xilinx, Inc. | Testing differential signal standards using device under test's built in resistors |
US8026726B2 (en) | 2009-01-23 | 2011-09-27 | Silicon Image, Inc. | Fault testing for interconnections |
CN103913700B (zh) * | 2014-04-18 | 2017-04-05 | 电子科技大学 | 一种红外焦平面读出电路的检测电路 |
JP2016045123A (ja) * | 2014-08-25 | 2016-04-04 | 株式会社メガチップス | テスト回路 |
CN105976785B (zh) * | 2016-07-21 | 2018-12-28 | 武汉华星光电技术有限公司 | Goa电路及液晶显示面板 |
CN112882452A (zh) * | 2019-11-29 | 2021-06-01 | 英业达科技有限公司 | 边界扫描测试控制器的功能验证系统及其方法 |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4698830A (en) | 1986-04-10 | 1987-10-06 | International Business Machines Corporation | Shift register latch arrangement for enhanced testability in differential cascode voltage switch circuit |
US4855669A (en) * | 1987-10-07 | 1989-08-08 | Xilinx, Inc. | System for scan testing of logic circuit networks |
US6304987B1 (en) * | 1995-06-07 | 2001-10-16 | Texas Instruments Incorporated | Integrated test circuit |
US5287386A (en) | 1991-03-27 | 1994-02-15 | Thinking Machines Corporation | Differential driver/receiver circuit |
US5299136A (en) | 1991-06-05 | 1994-03-29 | International Business Machines Corp. | Fully testable DCVS circuits with single-track global wiring |
JPH06249919A (ja) * | 1993-03-01 | 1994-09-09 | Fujitsu Ltd | 半導体集積回路装置の端子間接続試験方法 |
US5598541A (en) * | 1994-10-24 | 1997-01-28 | Lsi Logic Corporation | Node loop port communication interface super core for fibre channel |
US5706297A (en) * | 1995-08-24 | 1998-01-06 | Unisys Corporation | System for adapting maintenance operations to JTAG and non-JTAG modules |
US6000051A (en) * | 1997-10-10 | 1999-12-07 | Logic Vision, Inc. | Method and apparatus for high-speed interconnect testing |
KR100574119B1 (ko) * | 1998-02-02 | 2006-04-25 | 코닌클리즈케 필립스 일렉트로닉스 엔.브이. | 전자 회로와, 제 1 및 제 2 전자 회로간의 상호접속부들을 테스트하는 방법 |
US6349398B1 (en) * | 1999-01-26 | 2002-02-19 | Silicon Graphics, Inc. | Method and apparatus for partial-scan built-in self test logic |
US6578180B2 (en) * | 2000-11-30 | 2003-06-10 | International Business Machines Corporation | Method and system for testing interconnected integrated circuits |
US6629297B2 (en) * | 2000-12-14 | 2003-09-30 | Tharas Systems Inc. | Tracing the change of state of a signal in a functional verification system |
-
2001
- 2001-09-05 JP JP2001269216A patent/JP3955196B2/ja not_active Expired - Fee Related
-
2002
- 2002-02-26 US US10/082,055 patent/US6931344B2/en not_active Expired - Lifetime
- 2002-02-27 DE DE60222481T patent/DE60222481T2/de not_active Expired - Lifetime
- 2002-02-27 DE DE60210900T patent/DE60210900T2/de not_active Expired - Lifetime
- 2002-02-27 EP EP05015882A patent/EP1612573B1/de not_active Expired - Lifetime
- 2002-02-27 EP EP02251352A patent/EP1308736B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP1612573B1 (de) | 2007-09-12 |
EP1612573A2 (de) | 2006-01-04 |
DE60210900T2 (de) | 2006-08-31 |
JP2003078020A (ja) | 2003-03-14 |
US6931344B2 (en) | 2005-08-16 |
EP1308736A2 (de) | 2003-05-07 |
JP3955196B2 (ja) | 2007-08-08 |
DE60222481D1 (de) | 2007-10-25 |
US20030046015A1 (en) | 2003-03-06 |
EP1612573A3 (de) | 2006-03-01 |
EP1308736A3 (de) | 2004-01-14 |
EP1308736B1 (de) | 2006-04-26 |
DE60222481T2 (de) | 2008-01-10 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8328 | Change in the person/name/address of the agent |
Representative=s name: SEEGER SEEGER LINDNER PARTNERSCHAFT PATENTANWAELTE |