DE60219990D1 - Speichertest-Schaltung - Google Patents

Speichertest-Schaltung

Info

Publication number
DE60219990D1
DE60219990D1 DE60219990T DE60219990T DE60219990D1 DE 60219990 D1 DE60219990 D1 DE 60219990D1 DE 60219990 T DE60219990 T DE 60219990T DE 60219990 T DE60219990 T DE 60219990T DE 60219990 D1 DE60219990 D1 DE 60219990D1
Authority
DE
Germany
Prior art keywords
test circuit
memory test
memory
circuit
test
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60219990T
Other languages
English (en)
Other versions
DE60219990T2 (de
Inventor
Alan S Krech
Stephen D Jordan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Application granted granted Critical
Publication of DE60219990D1 publication Critical patent/DE60219990D1/de
Publication of DE60219990T2 publication Critical patent/DE60219990T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/24—Marginal checking or other specified testing methods not covered by G06F11/26, e.g. race tests
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
DE60219990T 2001-04-25 2002-03-22 Speichertest-Schaltung Expired - Fee Related DE60219990T2 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/842,433 US6574764B2 (en) 2001-04-25 2001-04-25 Algorithmically programmable memory tester with history FIFO's that aid in error analysis and recovery
US842433 2004-05-11

Publications (2)

Publication Number Publication Date
DE60219990D1 true DE60219990D1 (de) 2007-06-21
DE60219990T2 DE60219990T2 (de) 2008-01-17

Family

ID=25287279

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60219990T Expired - Fee Related DE60219990T2 (de) 2001-04-25 2002-03-22 Speichertest-Schaltung

Country Status (6)

Country Link
US (1) US6574764B2 (de)
EP (2) EP1253600B1 (de)
JP (1) JP4194799B2 (de)
KR (1) KR100920277B1 (de)
DE (1) DE60219990T2 (de)
TW (1) TW583680B (de)

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6763490B1 (en) * 2000-09-25 2004-07-13 Agilent Technologies, Inc. Method and apparatus for coordinating program execution in a site controller with pattern execution in a tester
US20030088810A1 (en) * 2001-11-02 2003-05-08 Sun Microsystems, Inc. Methods and apparatus for determining software component sizes associated with errors
US7117410B2 (en) * 2002-12-20 2006-10-03 Teradyne, Inc. Distributed failure analysis memory for automatic test equipment
WO2004079428A1 (ja) * 2003-03-03 2004-09-16 Nikon Corporation 顕微鏡デジタル画像取得システム
US7039545B2 (en) * 2004-04-19 2006-05-02 Agilent Technologies, Inc. Apparatus, system and/or method for converting a serial test to a parallel test
US20050285612A1 (en) * 2004-06-23 2005-12-29 From Thirty Incorporated Apparatus for measuring DC parameters in a wafer burn-in system
JP2006275986A (ja) * 2005-03-30 2006-10-12 Advantest Corp 診断プログラム、切替プログラム、試験装置、および診断方法
US7528622B2 (en) 2005-07-06 2009-05-05 Optimal Test Ltd. Methods for slow test time detection of an integrated circuit during parallel testing
DE102005048872A1 (de) * 2005-10-12 2007-04-26 Mühlbauer Ag Testkopfeinrichtung
US7536662B2 (en) * 2006-06-27 2009-05-19 Atrenta, Inc. Method for recognizing and verifying FIFO structures in integrated circuit designs
US8099583B2 (en) * 2006-08-23 2012-01-17 Axis Semiconductor, Inc. Method of and apparatus and architecture for real time signal processing by switch-controlled programmable processor configuring and flexible pipeline and parallel processing
US20090112548A1 (en) * 2007-10-30 2009-04-30 Conner George W A method for testing in a reconfigurable tester
US20090113245A1 (en) * 2007-10-30 2009-04-30 Teradyne, Inc. Protocol aware digital channel apparatus
US7792656B2 (en) * 2007-12-19 2010-09-07 Advantest Corporation Test apparatus
US8181003B2 (en) * 2008-05-29 2012-05-15 Axis Semiconductor, Inc. Instruction set design, control and communication in programmable microprocessor cores and the like
US8078833B2 (en) * 2008-05-29 2011-12-13 Axis Semiconductor, Inc. Microprocessor with highly configurable pipeline and executional unit internal hierarchal structures, optimizable for different types of computational functions
US8458536B2 (en) * 2008-07-17 2013-06-04 Marvell World Trade Ltd. Data recovery in solid state memory devices
US8527677B1 (en) 2010-06-25 2013-09-03 Altera Corporation Serial communications links with bonded first-in-first-out buffer circuitry
CN103163448B (zh) * 2011-12-16 2016-01-27 中国科学院微电子研究所 对现场可编程门阵列中查找表延迟故障进行检测的方法
US10268572B2 (en) * 2017-08-03 2019-04-23 Fujitsu Limited Interactive software program repair
US10565036B1 (en) 2019-02-14 2020-02-18 Axis Semiconductor, Inc. Method of synchronizing host and coprocessor operations via FIFO communication
CN116705137B (zh) * 2023-05-08 2024-04-02 深圳市晶存科技有限公司 固态硬盘的测试模式切换方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5062109A (en) * 1988-09-02 1991-10-29 Advantest Corporation Memory tester
US5067129A (en) * 1989-08-16 1991-11-19 International Business Machines Corp. Service processor tester
JP3700797B2 (ja) * 1996-08-09 2005-09-28 株式会社アドバンテスト メモリ試験装置
US5930735A (en) * 1997-04-30 1999-07-27 Credence Systems Corporation Integrated circuit tester including at least one quasi-autonomous test instrument
US6067648A (en) * 1998-03-02 2000-05-23 Tanisys Technology, Inc. Programmable pulse generator
EP0992907B1 (de) * 1998-10-06 2005-09-28 Texas Instruments Inc. Verwaltung eines FIFO zur Abalufverfolgung
US6233678B1 (en) * 1998-11-05 2001-05-15 Hewlett-Packard Company Method and apparatus for profiling of non-instrumented programs and dynamic processing of profile data
KR100308621B1 (ko) * 1998-11-19 2001-12-17 윤종용 반도체 메모리 장치를 위한 프로그램 가능한 내장 자기 테스트 시스템
US6320812B1 (en) * 2000-09-20 2001-11-20 Agilent Technologies, Inc. Error catch RAM for memory tester has SDRAM memory sets configurable for size and speed

Also Published As

Publication number Publication date
EP1253600A2 (de) 2002-10-30
DE60219990T2 (de) 2008-01-17
EP1253600B1 (de) 2007-05-09
EP1253600A3 (de) 2004-04-21
JP2003007089A (ja) 2003-01-10
KR100920277B1 (ko) 2009-10-08
TW583680B (en) 2004-04-11
US20020162046A1 (en) 2002-10-31
KR20020082791A (ko) 2002-10-31
EP1701359A1 (de) 2006-09-13
JP4194799B2 (ja) 2008-12-10
US6574764B2 (en) 2003-06-03

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Legal Events

Date Code Title Description
8327 Change in the person/name/address of the patent owner

Owner name: AGILENT TECHNOLOGIES, INC. (N.D.GES.D. STAATES, US

8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee