DE60232569D1 - Widerstandsmessschaltung - Google Patents

Widerstandsmessschaltung

Info

Publication number
DE60232569D1
DE60232569D1 DE60232569T DE60232569T DE60232569D1 DE 60232569 D1 DE60232569 D1 DE 60232569D1 DE 60232569 T DE60232569 T DE 60232569T DE 60232569 T DE60232569 T DE 60232569T DE 60232569 D1 DE60232569 D1 DE 60232569D1
Authority
DE
Germany
Prior art keywords
measuring circuit
resistance measuring
resistance
circuit
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60232569T
Other languages
English (en)
Inventor
Lutz Bierl
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Texas Instruments Deutschland GmbH
Original Assignee
Texas Instruments Deutschland GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Texas Instruments Deutschland GmbH filed Critical Texas Instruments Deutschland GmbH
Application granted granted Critical
Publication of DE60232569D1 publication Critical patent/DE60232569D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
DE60232569T 2001-07-17 2002-07-15 Widerstandsmessschaltung Expired - Lifetime DE60232569D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10134635A DE10134635C1 (de) 2001-07-17 2001-07-17 Widerstandsmessschaltung

Publications (1)

Publication Number Publication Date
DE60232569D1 true DE60232569D1 (de) 2009-07-23

Family

ID=7692017

Family Applications (2)

Application Number Title Priority Date Filing Date
DE10134635A Expired - Fee Related DE10134635C1 (de) 2001-07-17 2001-07-17 Widerstandsmessschaltung
DE60232569T Expired - Lifetime DE60232569D1 (de) 2001-07-17 2002-07-15 Widerstandsmessschaltung

Family Applications Before (1)

Application Number Title Priority Date Filing Date
DE10134635A Expired - Fee Related DE10134635C1 (de) 2001-07-17 2001-07-17 Widerstandsmessschaltung

Country Status (3)

Country Link
US (1) US6816796B2 (de)
EP (1) EP1279964B1 (de)
DE (2) DE10134635C1 (de)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE10134635C1 (de) * 2001-07-17 2003-01-16 Texas Instruments Deutschland Widerstandsmessschaltung
GB2411481B (en) * 2004-02-27 2007-11-14 Ultra Electronics Ltd Signal measurement and processing method and apparatus
US7548819B2 (en) 2004-02-27 2009-06-16 Ultra Electronics Limited Signal measurement and processing method and apparatus
DE102004028681B4 (de) * 2004-06-14 2007-12-27 Dieter Peter Verfahren und Vorrichtung zur Bestimmung des Verhältnisses zweier Widerstände
EP1719990B1 (de) * 2005-05-06 2013-11-06 Acam-messelectronic GmbH Verfahren und Vorrichtung zur Temperaturkompensation einer Messbrücke
DE102006030774A1 (de) * 2006-06-30 2008-02-21 Endress + Hauser Conducta Gesellschaft für Mess- und Regeltechnik mbH + Co. KG Verfahren zur Bestimmung des Bürdenwiderstandes für einen Messumformer
US7764533B2 (en) * 2007-09-18 2010-07-27 International Business Machines Corporation Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition
US7602632B2 (en) * 2007-09-18 2009-10-13 International Business Machines Corporation Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition
US7602631B2 (en) * 2007-09-18 2009-10-13 International Business Machines Corporation Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition
US7567473B2 (en) 2007-09-18 2009-07-28 International Business Machines Corporation Multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition
DE202008009859U1 (de) 2007-12-21 2009-03-05 Berthold Technologies Gmbh & Co. Kg Vorrichtung zur wahlweisen Messung von insbesondere Lumineszenz- und/oder Fluoreszenzstrahlung
DE102008042765A1 (de) * 2008-10-13 2010-04-15 Robert Bosch Gmbh Vorrichtung und Verfahren zum Messen eines Widerstandswerts
JP5244653B2 (ja) * 2009-03-03 2013-07-24 日立オートモティブシステムズ株式会社 電力変換装置
US8116126B2 (en) * 2009-08-17 2012-02-14 International Business Machines Corporation Measurement method for reading multi-level memory cell utilizing measurement time delay as the characteristic parameter for level definition
US8837198B2 (en) 2012-10-01 2014-09-16 International Business Machines Corporation Multi-bit resistance measurement
US8638598B1 (en) 2012-10-01 2014-01-28 International Business Machines Corporation Multi-bit resistance measurement
US9208733B2 (en) * 2012-08-31 2015-12-08 Apple Inc. Systems and methods for monitoring LCD display panel resistance
US9201549B2 (en) * 2012-08-31 2015-12-01 Apple Inc. Systems and methods for monitoring LCD display panel resistance
CN103499743B (zh) * 2013-09-29 2016-06-08 湖北工业大学 一种高精度测量电阻电容的系统及电路
KR102210985B1 (ko) * 2014-01-14 2021-02-03 삼성디스플레이 주식회사 구동집적회로, 이를 포함하는 표시장치 및 결합저항 측정 방법
JP6624819B2 (ja) * 2015-06-18 2019-12-25 ヤマシンフィルタ株式会社 リターンフィルタ
CN109188095B (zh) * 2018-10-11 2024-05-17 深圳和而泰智能控制股份有限公司 一种电阻测量电路、方法及环境参数测量装置
DE102020004075A1 (de) 2020-07-07 2022-01-13 Diehl Metering Gmbh Widerstandsmessschaltung, Messeinrichtung und Widerstandsmessverfahren

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3642861A1 (de) * 1986-12-16 1988-06-30 Diehl Gmbh & Co Schaltungsanordnung
GB2267967B (en) * 1992-06-17 1996-02-28 Status Instr Limited Apparatus for temperature measurement
DE4420998C2 (de) * 1994-06-17 1999-03-25 Diehl Stiftung & Co Schaltungseinrichtung zum genauen Messen eines elektrischen Widerstandes
DE19546304A1 (de) * 1995-12-12 1997-06-19 Ingenieurgesellschaft Tempelwa Schaltungsanordnung zur Temperaturmessung
DE10134635C1 (de) * 2001-07-17 2003-01-16 Texas Instruments Deutschland Widerstandsmessschaltung
US6597183B1 (en) * 2001-12-28 2003-07-22 Texas Instruments Incorporated Resistance measurement system

Also Published As

Publication number Publication date
EP1279964B1 (de) 2009-06-10
US20030023394A1 (en) 2003-01-30
EP1279964A1 (de) 2003-01-29
US6816796B2 (en) 2004-11-09
DE10134635C1 (de) 2003-01-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition