DE3876228D1 - Feldeffektanordnung mit supraleitendem kanal. - Google Patents

Feldeffektanordnung mit supraleitendem kanal.

Info

Publication number
DE3876228D1
DE3876228D1 DE8888100512T DE3876228T DE3876228D1 DE 3876228 D1 DE3876228 D1 DE 3876228D1 DE 8888100512 T DE8888100512 T DE 8888100512T DE 3876228 T DE3876228 T DE 3876228T DE 3876228 D1 DE3876228 D1 DE 3876228D1
Authority
DE
Germany
Prior art keywords
channel
supral
field effect
conducting channel
depleted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE8888100512T
Other languages
English (en)
Other versions
DE3876228T2 (de
Inventor
Praveen Chaudhari
Carl Alexander Mueller
Hans Peter Wolf
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of DE3876228D1 publication Critical patent/DE3876228D1/de
Publication of DE3876228T2 publication Critical patent/DE3876228T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10N60/00—Superconducting devices
    • H10N60/20—Permanent superconducting devices
    • H10N60/205—Permanent superconducting devices having three or more electrodes, e.g. transistor-like structures 
    • H10N60/207—Field effect devices
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/70—High TC, above 30 k, superconducting device, article, or structured stock
    • Y10S505/701—Coated or thin film device, i.e. active or passive
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/775—High tc, above 30 k, superconducting material
    • Y10S505/776—Containing transition metal oxide with rare earth or alkaline earth
    • Y10S505/779—Other rare earth, i.e. Sc,Y,Ce,Pr,Nd,Pm,Sm,Eu,Gd,Tb,Dy,Ho,Er,Tm,Yb,Lu and alkaline earth, i.e. Ca,Sr,Ba,Ra
    • Y10S505/78—Yttrium and barium-, e.g. YBa2Cu307
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S505/00—Superconductor technology: apparatus, material, process
    • Y10S505/825—Apparatus per se, device per se, or process of making or operating same
    • Y10S505/873—Active solid-state device

Landscapes

  • Superconductor Devices And Manufacturing Methods Thereof (AREA)
DE8888100512T 1988-01-15 1988-01-15 Feldeffektanordnung mit supraleitendem kanal. Expired - Fee Related DE3876228T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP88100512A EP0324044B1 (de) 1988-01-15 1988-01-15 Feldeffektanordnung mit supraleitendem Kanal

Publications (2)

Publication Number Publication Date
DE3876228D1 true DE3876228D1 (de) 1993-01-07
DE3876228T2 DE3876228T2 (de) 1993-06-03

Family

ID=8198647

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8888100512T Expired - Fee Related DE3876228T2 (de) 1988-01-15 1988-01-15 Feldeffektanordnung mit supraleitendem kanal.

Country Status (6)

Country Link
US (1) US5401714A (de)
EP (1) EP0324044B1 (de)
JP (1) JPH0624258B2 (de)
BR (1) BR8900147A (de)
CA (1) CA1315015C (de)
DE (1) DE3876228T2 (de)

Families Citing this family (37)

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Publication number Priority date Publication date Assignee Title
JP2862137B2 (ja) * 1988-08-11 1999-02-24 古河電気工業株式会社 超電導トランジスタ
JPH0262082A (ja) * 1988-08-29 1990-03-01 Fujitsu Ltd 超伝導トランジスタ
US6774463B1 (en) 1990-02-01 2004-08-10 International Business Machines Corporation Superconductor gate semiconductor channel field effect transistor
JP2616130B2 (ja) * 1990-04-16 1997-06-04 日本電気株式会社 超伝導素子の製造方法
EP0475838B1 (de) * 1990-09-10 1996-03-06 Sumitomo Electric Industries, Ltd. Supraleitende Einrichtung mit einer reduzierten Dicke der supraleitenden Schicht und Methode zu deren Herstellung
CA2051778C (en) * 1990-09-19 1997-05-06 Takao Nakamura Method for manufacturing superconducting device having a reduced thickness of oxide superconducting layer and superconducting device manufactured thereby
CA2052380C (en) * 1990-09-27 1998-04-14 Takao Nakamura Superconducting device having an extremely thin superconducting channel formed of oxide superconductor material and method for manufacturing the same
DE69119022T2 (de) * 1990-10-08 1996-10-31 Sumitomo Electric Industries Supraleitende Einrichtung mit ultradünnem Kanal aus oxydisch supraleitendem Material und Verfahren zu deren Herstellung
DE69109054T3 (de) * 1990-10-29 2002-05-02 Sumitomo Electric Industries, Ltd. Supraleitende Einrichtung mit extrem kurzer supraleitender Kanallänge aus oxydisch supraleitendem Material und Verfahren zu deren Herstellung.
CA2054470C (en) * 1990-10-30 1997-07-01 Takao Nakamura Method for manufacturing superconducting device having a reduced thickness of oxide superconducting layer and superconducting device manufactured thereby
EP0484251B1 (de) * 1990-10-31 1996-03-20 Sumitomo Electric Industries, Ltd. Aus extrem dünnem supraleitendem Oxydfilm gebildete supraleitende Einrichtung mit extrem kurzem Kanal und Verfahren zu dessen Herstellung
JP2738144B2 (ja) * 1990-10-31 1998-04-08 住友電気工業株式会社 超電導素子および作製方法
CA2054795C (en) * 1990-11-01 1996-08-06 Hiroshi Inada Superconducting device having an extremely thin superconducting channel formed of oxide superconductor material and method for manufacturing the same
SG46182A1 (en) * 1991-01-07 1998-02-20 Ibm Superconducting field-effect transistors with inverted misfet structure and method for making the same
FR2674374A1 (fr) * 1991-03-22 1992-09-25 Bull Sa Transistor supraconducteur a effet de champ et procede de fabrication d'une structure multicouche telle que celle utilisee dans le transistor.
EP0523275B1 (de) * 1991-07-19 1996-02-28 International Business Machines Corporation Verbesserter supraleitender Feldeffekt-Transistor mit inverser MISFET-Struktur und Verfahren zu dessen Herstellung
EP0523279A1 (de) * 1991-07-19 1993-01-20 International Business Machines Corporation Elektrische Feldeffekteinrichtungen mit supraleitendem Kanal
EP0534811B1 (de) * 1991-08-28 1996-05-08 Sumitomo Electric Industries, Ltd. Verfahren zur Herstellung von supraleitenden Schichten aus supraleitendem Oxyd in denen nicht-supraleitende Gebiete vorkommen und Verfahren zur Herstellung eines Bauelements welches solche Schichten enthält
EP0533568A1 (de) * 1991-09-17 1993-03-24 Sumitomo Electric Industries, Ltd. Supraleitende dünne Schicht, hergestellt aus supraleitendem Oxyd, Bauelement und Herstellungsverfahren
JP3446204B2 (ja) * 1991-11-13 2003-09-16 セイコーエプソン株式会社 超伝導素子
US5399546A (en) * 1991-11-30 1995-03-21 Sumitomo Electric Industries, Ltd. Superconducting device having an extremely thin superconducting channel formed of oxide superconductor material
CA2084983C (en) * 1991-12-10 1996-11-12 Takao Nakamura Superconducting device having an extremely thin superconducting channel formed of oxide superconductor material and method for manufacturing the same
JPH05251776A (ja) * 1991-12-13 1993-09-28 Sumitomo Electric Ind Ltd 超電導素子およびその作製方法
US5274249A (en) * 1991-12-20 1993-12-28 University Of Maryland Superconducting field effect devices with thin channel layer
US5552374A (en) * 1992-04-09 1996-09-03 Sumitomo Electric Industries, Ltd. Oxide superconducting a transistor in crank-shaped configuration
JPH05291637A (ja) * 1992-04-09 1993-11-05 Sumitomo Electric Ind Ltd 超電導電界効果型素子
US5828079A (en) * 1992-06-29 1998-10-27 Matsushita Electric Industrial Co., Ltd. Field-effect type superconducting device including bi-base oxide compound containing copper
JPH06112538A (ja) * 1992-09-30 1994-04-22 Fuji Electric Co Ltd 超電導素子
JPH08227743A (ja) * 1995-02-20 1996-09-03 Sumitomo Electric Ind Ltd 酸化物超電導体用金属電極
US6066560A (en) * 1998-05-05 2000-05-23 Lsi Logic Corporation Non-linear circuit elements on integrated circuits
IL143649A0 (en) * 1999-02-17 2002-04-21 Ibm Microelectronic device for storing information and method thereof
US6333543B1 (en) 1999-03-16 2001-12-25 International Business Machines Corporation Field-effect transistor with a buried mott material oxide channel
US6403454B1 (en) * 1999-10-29 2002-06-11 Agere Systems Guardian Corp. Silicon semiconductor devices with δ-doped layers
US7838875B1 (en) 2003-01-22 2010-11-23 Tsang Dean Z Metal transistor device
US7120805B2 (en) * 2003-04-11 2006-10-10 Dell Products L.P. Draining residual charge from a voltage plane
US20080135827A1 (en) * 2006-09-25 2008-06-12 Stmicroelectronics Crolles 2 Sas MIM transistor
KR20110090393A (ko) * 2010-02-03 2011-08-10 삼성전자주식회사 저항 변화 물질을 이용한 반도체 소자 및 그 구동 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4589001A (en) * 1980-07-09 1986-05-13 Agency Of Industrial Science & Technology Quasiparticle injection control type superconducting device
JPS60177691A (ja) * 1984-02-23 1985-09-11 Mitsubishi Electric Corp 超伝導多端子素子
CA1229426A (en) * 1984-04-19 1987-11-17 Yutaka Harada Superconducting device
JPS63289879A (ja) * 1987-05-21 1988-11-28 Seiko Epson Corp 超半導体電界効果トランジスタ
JPS63308975A (ja) * 1987-06-11 1988-12-16 Toshiba Corp 電流制御素子
JPS6474773A (en) * 1987-09-17 1989-03-20 Fujitsu Ltd Insulated-gate field-effect device

Also Published As

Publication number Publication date
EP0324044B1 (de) 1992-11-25
JPH0624258B2 (ja) 1994-03-30
BR8900147A (pt) 1989-09-12
DE3876228T2 (de) 1993-06-03
JPH01207982A (ja) 1989-08-21
CA1315015C (en) 1993-03-23
US5401714A (en) 1995-03-28
EP0324044A1 (de) 1989-07-19

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee