DE3587481D1 - Schaltungssubstrat mit hoher waermeleitfaehigkeit. - Google Patents
Schaltungssubstrat mit hoher waermeleitfaehigkeit.Info
- Publication number
- DE3587481D1 DE3587481D1 DE8585102159T DE3587481T DE3587481D1 DE 3587481 D1 DE3587481 D1 DE 3587481D1 DE 8585102159 T DE8585102159 T DE 8585102159T DE 3587481 T DE3587481 T DE 3587481T DE 3587481 D1 DE3587481 D1 DE 3587481D1
- Authority
- DE
- Germany
- Prior art keywords
- high heat
- circuit substrate
- heat conductivity
- conductivity
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/009—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone characterised by the material treated
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/50—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements with inorganic materials
- C04B41/51—Metallising, e.g. infiltration of sintered ceramic preforms with molten metal
- C04B41/5111—Ag, Au, Pd, Pt or Cu
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/45—Coating or impregnating, e.g. injection in masonry, partial coating of green or fired ceramics, organic coating compositions for adhering together two concrete elements
- C04B41/52—Multiple coating or impregnating multiple coating or impregnating with the same composition or with compositions only differing in the concentration of the constituents, is classified as single coating or impregnation
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/85—Coating or impregnation with inorganic materials
- C04B41/88—Metals
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B41/00—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone
- C04B41/80—After-treatment of mortars, concrete, artificial stone or ceramics; Treatment of natural stone of only ceramics
- C04B41/81—Coating or impregnation
- C04B41/89—Coating or impregnation for obtaining at least two superposed coatings having different compositions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/12—Mountings, e.g. non-detachable insulating substrates
- H01L23/14—Mountings, e.g. non-detachable insulating substrates characterised by the material or its electrical properties
- H01L23/15—Ceramic or glass substrates
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/34—Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
- H01L23/36—Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
- H01L23/373—Cooling facilitated by selection of materials for the device or materials for thermal expansion adaptation, e.g. carbon
- H01L23/3731—Ceramic materials or glass
-
- C—CHEMISTRY; METALLURGY
- C04—CEMENTS; CONCRETE; ARTIFICIAL STONE; CERAMICS; REFRACTORIES
- C04B—LIME, MAGNESIA; SLAG; CEMENTS; COMPOSITIONS THEREOF, e.g. MORTARS, CONCRETE OR LIKE BUILDING MATERIALS; ARTIFICIAL STONE; CERAMICS; REFRACTORIES; TREATMENT OF NATURAL STONE
- C04B2111/00—Mortars, concrete or artificial stone or mixtures to prepare them, characterised by specific function, property or use
- C04B2111/00474—Uses not provided for elsewhere in C04B2111/00
- C04B2111/00844—Uses not provided for elsewhere in C04B2111/00 for electronic applications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0306—Inorganic insulating substrates, e.g. ceramic, glass
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S428/00—Stock material or miscellaneous articles
- Y10S428/901—Printed circuit
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24917—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including metal layer
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
- Y10T428/24926—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.] including ceramic, glass, porcelain or quartz layer
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Ceramic Engineering (AREA)
- Materials Engineering (AREA)
- Organic Chemistry (AREA)
- Structural Engineering (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- Parts Printed On Printed Circuit Boards (AREA)
- Ceramic Products (AREA)
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3416584A JPS60178688A (ja) | 1984-02-27 | 1984-02-27 | 高熱伝導性回路基板 |
JP3416384A JPS60178687A (ja) | 1984-02-27 | 1984-02-27 | 高熱伝導性回路基板 |
JP59204101A JPH0691304B2 (ja) | 1984-10-01 | 1984-10-01 | 高熱伝導性回路基板 |
JP23947184A JPS61119094A (ja) | 1984-11-15 | 1984-11-15 | 高熱伝導性回路基板の製造方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
DE3587481D1 true DE3587481D1 (de) | 1993-09-02 |
DE3587481T2 DE3587481T2 (de) | 1993-12-16 |
Family
ID=27459898
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
DE85102159T Expired - Fee Related DE3587481T2 (de) | 1984-02-27 | 1985-02-27 | Schaltungssubstrat mit hoher Wärmeleitfähigkeit. |
Country Status (3)
Country | Link |
---|---|
US (1) | US4659611A (de) |
EP (1) | EP0153737B1 (de) |
DE (1) | DE3587481T2 (de) |
Families Citing this family (74)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5165983A (en) * | 1984-09-30 | 1992-11-24 | Kabushiki Kaisha Toshiba | Method for production of aluminum nitride ceramic plate |
DE3627317A1 (de) * | 1985-08-13 | 1987-02-19 | Tokuyama Soda Kk | Sinterbare aluminiumnitridzusammensetzung, sinterkoerper aus dieser zusammensetzung und verfahren zu seiner herstellung |
JPS6265991A (ja) * | 1985-09-13 | 1987-03-25 | 株式会社東芝 | 高熱伝導性セラミツクス基板 |
JPS6273799A (ja) * | 1985-09-27 | 1987-04-04 | 日本電気株式会社 | 多層セラミツク配線基板 |
US5314850A (en) * | 1985-10-31 | 1994-05-24 | Kyocera Corporation | Aluminum nitride sintered body and production thereof |
JPS62197379A (ja) * | 1986-02-20 | 1987-09-01 | 株式会社東芝 | 窒化アルミニウム基板 |
US4770953A (en) * | 1986-02-20 | 1988-09-13 | Kabushiki Kaisha Toshiba | Aluminum nitride sintered body having conductive metallized layer |
JPS62207789A (ja) * | 1986-03-08 | 1987-09-12 | 日本特殊陶業株式会社 | 窒化アルミニウム製基材の表面構造及びその製造法 |
JPH0680873B2 (ja) * | 1986-07-11 | 1994-10-12 | 株式会社東芝 | 回路基板 |
KR940000729B1 (ko) * | 1986-08-13 | 1994-01-28 | 히다찌 긴조꾸 가부시끼가이샤 | 질화 알루미늄 소결체 및 그 반도체 기판 |
DE3630066C1 (de) * | 1986-09-04 | 1988-02-04 | Heraeus Gmbh W C | Verfahren zur Herstellung von gesinterten metallisierten Aluminiumnitrid-Keramikkoerpern |
JPH0641390B2 (ja) * | 1986-10-31 | 1994-06-01 | 住友電気工業株式会社 | 高熱伝導性窒化アルミニウム焼結体とその製造方法 |
DE3641873C1 (de) * | 1986-12-08 | 1987-08-20 | Sachs Ersa Kg | Loetspitze |
US5352482A (en) * | 1987-01-22 | 1994-10-04 | Ngk Spark Plug Co., Ltd. | Process for making a high heat-conductive, thick film multi-layered circuit board |
DE3707214A1 (de) * | 1987-03-06 | 1988-09-15 | Hoechst Ag | Beschichtete kunststoffolie und daraus hergestelltes kunststofflaminat |
US4883704A (en) * | 1987-03-30 | 1989-11-28 | Kabushiki Kaisha Toshiba | Circuit substrate comprising nitride type ceramics, method for preparing it, and metallizing composition for use in it |
US4778778A (en) * | 1987-06-03 | 1988-10-18 | Keramont Advanced Ceramic Products Corporation | Process for the production of sintered aluminum nitrides |
EP0301529B1 (de) * | 1987-07-29 | 1992-05-13 | MITSUI TOATSU CHEMICALS, Inc. | Verfahren zur Gewinnung von Aluminiumnitrid und daraus hergestelltes Sinterprodukt |
JPH0676790B2 (ja) * | 1987-07-30 | 1994-09-28 | 株式会社東芝 | イグナイタ |
US5089172A (en) * | 1987-08-31 | 1992-02-18 | Ferro Corporation | Thick film conductor compositions for use with an aluminum nitride substrate |
JPH0193438A (ja) * | 1987-08-31 | 1989-04-12 | Ferro Corp | 窒化アルミニウム基材と共に使用する厚いフイルムペースト組成物 |
US5298330A (en) * | 1987-08-31 | 1994-03-29 | Ferro Corporation | Thick film paste compositions for use with an aluminum nitride substrate |
US5017434A (en) * | 1988-01-27 | 1991-05-21 | Enloe Jack H | Electronic package comprising aluminum nitride and aluminum nitride-borosilicate glass composite |
US5073526A (en) * | 1988-01-27 | 1991-12-17 | W. R. Grace & Co.-Conn. | Electronic package comprising aluminum nitride and aluminum nitride-borosilicate glass composite |
DE68923980T2 (de) * | 1988-02-01 | 1996-04-11 | Mitsubishi Materials Corp | Substrat zum Herstellen einer Dickschichtschaltung. |
IL89599A0 (en) * | 1988-03-15 | 1989-09-10 | Dow Chemical Co | Armor |
US4939022A (en) * | 1988-04-04 | 1990-07-03 | Delco Electronics Corporation | Electrical conductors |
US5264388A (en) * | 1988-05-16 | 1993-11-23 | Sumitomo Electric Industries, Inc. | Sintered body of aluminum nitride |
GB2222721B (en) * | 1988-08-23 | 1993-07-28 | Nobuo Mikoshiba | Cooling semiconductor devices |
US5258218A (en) * | 1988-09-13 | 1993-11-02 | Kabushiki Kaisha Toshiba | Aluminum nitride substrate and method for producing same |
DE68904846T2 (de) * | 1988-09-13 | 1993-05-27 | Toshiba Kawasaki Kk | Aluminiumnitrid-substrate. |
US5272009A (en) * | 1988-10-21 | 1993-12-21 | Battelle Memorial Institute | Laminate material and its use as heat-sink |
JP2952303B2 (ja) * | 1988-11-15 | 1999-09-27 | 旭テクノグラス株式会社 | 複合型回路装置 |
US5346751A (en) * | 1988-12-19 | 1994-09-13 | W. R. Grace & Co.-Conn. | Electronic package using closed pore composites |
EP0381242B1 (de) * | 1989-02-03 | 1992-05-27 | Mitsubishi Materials Corporation | Substrat zur Herstellung eines Dickschichtschaltkreises |
JP2774560B2 (ja) * | 1989-03-31 | 1998-07-09 | 株式会社東芝 | 窒化アルミニウムメタライズ基板 |
EP0399265B1 (de) * | 1989-05-22 | 1995-01-18 | Mitsubishi Materials Corporation | Substrat, verwendbar bei der Herstellung einer Dickschichtschaltung |
US4908116A (en) * | 1989-06-01 | 1990-03-13 | The Board Of Trustees At The Leland Stanford Junior University | Capillary electrophoretic device employing structure permitting electrical contact through ionic movement |
US5041700A (en) * | 1989-09-27 | 1991-08-20 | Kabushiki Kaisha Toshiba | Circuit board including an aluminum nitride substrate and a multilayered metal oxynitride structure |
JPH03257071A (ja) * | 1989-11-30 | 1991-11-15 | Toshiba Corp | 遮光性窒化アルミニウム焼結体及びその製造方法 |
US5830570A (en) * | 1989-12-19 | 1998-11-03 | Kyocera Corporation | Aluminum nitride substrate and process for preparation thereof |
JPH0461293A (ja) * | 1990-06-29 | 1992-02-27 | Toshiba Corp | 回路基板及びその製造方法 |
US5418002A (en) * | 1990-12-24 | 1995-05-23 | Harris Corporation | Direct bonding of copper to aluminum nitride substrates |
US6207288B1 (en) * | 1991-02-05 | 2001-03-27 | Cts Corporation | Copper ink for aluminum nitride |
US5158912A (en) * | 1991-04-09 | 1992-10-27 | Digital Equipment Corporation | Integral heatsink semiconductor package |
US5165986A (en) * | 1991-06-05 | 1992-11-24 | Ferro Corporation | Copper conductive composition for use on aluminum nitride substrate |
US5306389A (en) * | 1991-09-04 | 1994-04-26 | Osram Sylvania Inc. | Method of protecting aluminum nitride circuit substrates during electroless plating using a surface oxidation treatment |
US5217589A (en) * | 1991-10-03 | 1993-06-08 | Motorola, Inc. | Method of adherent metal coating for aluminum nitride surfaces |
US5402032A (en) * | 1992-10-29 | 1995-03-28 | Litton Systems, Inc. | Traveling wave tube with plate for bonding thermally-mismatched elements |
JPH06206772A (ja) * | 1992-11-18 | 1994-07-26 | Toshiba Corp | 窒化アルミニウム焼結体およびセラミック回路基板 |
US5466488A (en) * | 1993-02-08 | 1995-11-14 | Mitsubishi Materials Corporation | Method of making glazed AlN substrate with an Al2 O3 -SiO2 interfacial layer |
US6696103B1 (en) * | 1993-03-19 | 2004-02-24 | Sumitomo Electric Industries, Ltd. | Aluminium nitride ceramics and method for preparing the same |
JPH07109573A (ja) * | 1993-10-12 | 1995-04-25 | Semiconductor Energy Lab Co Ltd | ガラス基板および加熱処理方法 |
US5773377A (en) * | 1993-12-22 | 1998-06-30 | Crystalline Materials Corporation | Low temperature sintered, resistive aluminum nitride ceramics |
US5541145A (en) * | 1993-12-22 | 1996-07-30 | The Carborundum Company/Ibm Corporation | Low temperature sintering route for aluminum nitride ceramics |
US5424261A (en) * | 1993-12-22 | 1995-06-13 | The Carborundum Company | Low temperature sintering route for aluminum nitride ceramics |
US5626943A (en) * | 1994-06-02 | 1997-05-06 | The Carborundum Company | Ultra-smooth ceramic substrates and magnetic data storage media prepared therefrom |
KR100248035B1 (ko) * | 1994-09-29 | 2000-03-15 | 니시무로 타이죠 | 반도체 패키지 |
EP0999589B2 (de) * | 1995-03-20 | 2013-11-13 | Kabushiki Kaisha Toshiba | Schaltungssubstrat aus Siliziumnitrid |
JP3927250B2 (ja) * | 1995-08-16 | 2007-06-06 | イー・アイ・デュポン・ドウ・ヌムール・アンド・カンパニー | 窒化アルミニウム基板用厚膜導体ペースト組成物 |
JPH09260543A (ja) * | 1996-03-22 | 1997-10-03 | Toshiba Corp | 窒化アルミニウム配線基板およびその製造方法 |
JP4161423B2 (ja) | 1997-10-30 | 2008-10-08 | 住友電気工業株式会社 | 窒化アルミニウム焼結体及びそのメタライズ基板 |
DE60037069T2 (de) * | 1999-05-28 | 2008-09-11 | Denki Kagaku Kogyo K.K. | Schaltung mit Substrat |
US6343647B2 (en) * | 2000-01-11 | 2002-02-05 | Thermax International, Ll.C. | Thermal joint and method of use |
US6444297B1 (en) * | 2000-07-19 | 2002-09-03 | Electro Technik Industries, Inc. | Method of producing a thick film metallization on an aluminum nitride substrate |
US6607836B2 (en) * | 2000-10-23 | 2003-08-19 | Ngk Insulators, Ltd. | Material of low volume resistivity, an aluminum nitride sintered body and a member used for the production of semiconductors |
JP4243943B2 (ja) | 2002-04-22 | 2009-03-25 | 日本碍子株式会社 | 窒化アルミニウム材料および半導体製造用部材 |
US20080131673A1 (en) * | 2005-12-13 | 2008-06-05 | Yasuyuki Yamamoto | Method for Producing Metallized Ceramic Substrate |
US20070231590A1 (en) * | 2006-03-31 | 2007-10-04 | Stellar Industries Corp. | Method of Bonding Metals to Ceramics |
JP2008245668A (ja) * | 2007-03-29 | 2008-10-16 | Fujinon Corp | 電子内視鏡の撮像装置、および電子内視鏡 |
EP2155628A2 (de) * | 2007-04-24 | 2010-02-24 | CeramTec AG | Bauteil mit einem metallisierten keramikkörper |
ES2744454T3 (es) | 2013-10-31 | 2020-02-25 | Hisamitsu Pharmaceutical Co | Composición de adyuvante |
CN111484333A (zh) * | 2019-01-28 | 2020-08-04 | 华中科技大学 | 一种兼具高热导率和高强度的氮化铝陶瓷及其制备方法 |
US20220238261A1 (en) * | 2019-06-10 | 2022-07-28 | Ferro Corporation | High Adhesion Resistive Composition |
Family Cites Families (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3607613A (en) * | 1968-05-27 | 1971-09-21 | Sylvania Electric Prod | Electrically conductive refractory bodies |
US3922475A (en) * | 1970-06-22 | 1975-11-25 | Rockwell International Corp | Process for producing nitride films |
US4072771A (en) * | 1975-11-28 | 1978-02-07 | Bala Electronics Corporation | Copper thick film conductor |
US4070518A (en) * | 1976-10-15 | 1978-01-24 | E. I. Du Pont De Nemours And Company | Copper metallizations |
US4273822A (en) * | 1977-07-18 | 1981-06-16 | Rca Corporation | Glazing paste for bonding a metal layer to a ceramic substrate |
US4219448A (en) * | 1978-06-08 | 1980-08-26 | Bernd Ross | Screenable contact structure and method for semiconductor devices |
US4457861A (en) * | 1979-12-13 | 1984-07-03 | Additive Technology Corporation | Method, materials and apparatus for manufacturing printed circuits |
JPS57181356A (en) * | 1981-04-30 | 1982-11-08 | Hitachi Ltd | Sintered aluminum nitride body with high heat conductivity |
JPS5855377A (ja) * | 1981-09-28 | 1983-04-01 | 株式会社東芝 | 窒化アルミニウム焼結体の製造方法 |
US4539298A (en) * | 1981-11-25 | 1985-09-03 | Tokyo Shibaura Denki Kabushiki Kaisha | Highly heat-conductive ceramic material |
DE3248103C1 (de) * | 1982-12-24 | 1987-11-12 | W.C. Heraeus Gmbh, 6450 Hanau | Tiegel zum Ziehen von Einkristallen |
JPS59229843A (ja) * | 1983-06-13 | 1984-12-24 | Toshiba Corp | 半導体装置 |
US4478785A (en) * | 1983-08-01 | 1984-10-23 | General Electric Company | Process of pressureless sintering to produce dense, high thermal conductivity aluminum nitride ceramic body |
-
1985
- 1985-02-27 US US06/706,280 patent/US4659611A/en not_active Expired - Lifetime
- 1985-02-27 DE DE85102159T patent/DE3587481T2/de not_active Expired - Fee Related
- 1985-02-27 EP EP85102159A patent/EP0153737B1/de not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
EP0153737B1 (de) | 1993-07-28 |
DE3587481T2 (de) | 1993-12-16 |
EP0153737A2 (de) | 1985-09-04 |
US4659611A (en) | 1987-04-21 |
EP0153737A3 (en) | 1987-04-15 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
DE3587481D1 (de) | Schaltungssubstrat mit hoher waermeleitfaehigkeit. | |
DE3585364D1 (de) | Halbleitervorrichtungen mit hoher durchbruchspannung. | |
DE69108185T2 (de) | Adsorbent mit hoher Wärmeleitfähigkeit. | |
DE3586532D1 (de) | Mehrschichtleiterplatte mit hoher dichte. | |
DE3485694D1 (de) | Aluminiumnitrid-keramikkoerper mit hoher waermeleitfaehigkeit. | |
DE3582480D1 (de) | Halbleitermodulzusammenbau hoher dichte. | |
DE3669017D1 (de) | Leistungshalbleitermodul mit keramiksubstrat. | |
DE3485523D1 (de) | Aluminiumnitrid-sinterkeramikkoerper mit hoher waermeleitfaehigkeit. | |
DE68923894D1 (de) | Halbleitersubstrat mit dielektrischer Isolierung. | |
DE3786363D1 (de) | Halbleiteranordnungen mit hoher beweglichkeit. | |
DE3577498D1 (de) | Elektronische hochtemperaturzellen mit festelektrolyt. | |
DE3688518D1 (de) | Halbleiteranordnungen mit leitfaehigkeitsmodulation. | |
DE3682119D1 (de) | Komplementaere ic-struktur mit hoher steilheit. | |
DE3579846D1 (de) | Mechanischer mikrowellenschalter mit hoher geschwindigkeit. | |
DE3669431D1 (de) | Gedruckte schaltungsplatte mit hoher dichte. | |
DE3280202D1 (de) | Heterouebergang-halbleitereinrichtung mit hoher elektronenbeweglichkeit. | |
DE3762016D1 (de) | Halbleiteranordnung mit hoher durchbruchsspannung. | |
DE3578602D1 (de) | Vielfachstrukturen fuer transistoren mit hoher elektronenbeweglichkeit ohne invertierte heterouebergaenge. | |
DE3687389T2 (de) | Hoch thermisch leitendes keramiksubstrat. | |
DE3582811D1 (de) | E/a-datenschaltung mit hoher integrationsdichte fuer dram. | |
DE3577949D1 (de) | Halbleiterbauelement mit hoher durchschlagspannung. | |
DE3680265D1 (de) | Halbleiterschaltungsanordnung. | |
DE3583497D1 (de) | Strahlungsgeraet mit hoher intensitaet. | |
DE3483171D1 (de) | Thermischer widerstand von halbleiteranordnungen. | |
DE3586810D1 (de) | Halbleiterschaltung. |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
8364 | No opposition during term of opposition | ||
8320 | Willingness to grant licences declared (paragraph 23) | ||
8339 | Ceased/non-payment of the annual fee |