DE3319984A1 - Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet - Google Patents

Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet

Info

Publication number
DE3319984A1
DE3319984A1 DE19833319984 DE3319984A DE3319984A1 DE 3319984 A1 DE3319984 A1 DE 3319984A1 DE 19833319984 DE19833319984 DE 19833319984 DE 3319984 A DE3319984 A DE 3319984A DE 3319984 A1 DE3319984 A1 DE 3319984A1
Authority
DE
Germany
Prior art keywords
ray
ray radiation
shutter
guide channel
automatic correction
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
DE19833319984
Other languages
German (de)
English (en)
Inventor
Toshiyuki Tokyo Koga
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seiko Instruments Inc
Original Assignee
Daini Seikosha Co Ltd Tokyo
Seiko Instruments Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Daini Seikosha Co Ltd Tokyo, Seiko Instruments Inc filed Critical Daini Seikosha Co Ltd Tokyo
Publication of DE3319984A1 publication Critical patent/DE3319984A1/de
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
DE19833319984 1982-06-03 1983-06-01 Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet Withdrawn DE3319984A1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8282382U JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置

Publications (1)

Publication Number Publication Date
DE3319984A1 true DE3319984A1 (de) 1983-12-08

Family

ID=13785118

Family Applications (1)

Application Number Title Priority Date Filing Date
DE19833319984 Withdrawn DE3319984A1 (de) 1982-06-03 1983-06-01 Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet

Country Status (6)

Country Link
JP (1) JPS58184655U (cs)
DE (1) DE3319984A1 (cs)
FR (1) FR2528266B1 (cs)
GB (1) GB2121168B (cs)
HK (1) HK73390A (cs)
NL (1) NL8301987A (cs)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4928293A (en) * 1987-09-23 1990-05-22 Behncke Hans H Apparatus for stabilization of X-ray fluorescence layer thickness measuring instruments for stabilization SNF process thereof
JPH0744967Y2 (ja) * 1988-11-17 1995-10-11 セイコー電子工業株式会社 蛍光ｘ線膜厚計
FR2721789A1 (fr) * 1994-06-24 1995-12-29 Ge Medical Syst Sa Appareil d'irradiation comprenant des moyens de mesure de l'exposition.
EP0781992B1 (en) * 1995-12-21 2006-06-07 Horiba, Ltd. Fluorescence X-ray analyzer
JP5839284B2 (ja) * 2012-05-01 2016-01-06 アースニクス株式会社 γ線反射型計測装置

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2844704A1 (de) * 1977-10-17 1979-04-26 Bausch & Lomb Verfahren und vorrichtung fuer eine roentgenanalyse von materialproben
EP0014580A1 (en) * 1979-02-09 1980-08-20 Martin Marietta Corporation Element analysis unit
DE3137186A1 (de) * 1980-09-22 1982-05-06 Kabushiki Kaisha Daini Seikosha, Tokyo Roentgenfluoreszenz-messeinrichtung

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2844704A1 (de) * 1977-10-17 1979-04-26 Bausch & Lomb Verfahren und vorrichtung fuer eine roentgenanalyse von materialproben
EP0014580A1 (en) * 1979-02-09 1980-08-20 Martin Marietta Corporation Element analysis unit
DE3137186A1 (de) * 1980-09-22 1982-05-06 Kabushiki Kaisha Daini Seikosha, Tokyo Roentgenfluoreszenz-messeinrichtung

Also Published As

Publication number Publication date
GB2121168B (en) 1986-02-19
JPH0328400Y2 (cs) 1991-06-18
NL8301987A (nl) 1984-01-02
GB2121168A (en) 1983-12-14
JPS58184655U (ja) 1983-12-08
FR2528266A1 (fr) 1983-12-09
HK73390A (en) 1990-09-21
GB8315135D0 (en) 1983-07-06
FR2528266B1 (fr) 1988-07-08

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Legal Events

Date Code Title Description
8127 New person/name/address of the applicant

Owner name: SEIKO INSTRUMENTS AND ELECTRONICS LTD., TOKIO, JP

8110 Request for examination paragraph 44
8120 Willingness to grant licences paragraph 23
8130 Withdrawal