NL8301987A - Correctie-inrichting voor roentgenstralen. - Google Patents

Correctie-inrichting voor roentgenstralen. Download PDF

Info

Publication number
NL8301987A
NL8301987A NL8301987A NL8301987A NL8301987A NL 8301987 A NL8301987 A NL 8301987A NL 8301987 A NL8301987 A NL 8301987A NL 8301987 A NL8301987 A NL 8301987A NL 8301987 A NL8301987 A NL 8301987A
Authority
NL
Netherlands
Prior art keywords
ray
rays
shutter
correction
detector
Prior art date
Application number
NL8301987A
Other languages
English (en)
Dutch (nl)
Original Assignee
Seiko Instr & Electronics
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seiko Instr & Electronics filed Critical Seiko Instr & Electronics
Publication of NL8301987A publication Critical patent/NL8301987A/nl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Engineering & Computer Science (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
NL8301987A 1982-06-03 1983-06-03 Correctie-inrichting voor roentgenstralen. NL8301987A (nl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP8282382U JPS58184655U (ja) 1982-06-03 1982-06-03 Ｘ線自動較正装置
JP8282382 1982-06-03

Publications (1)

Publication Number Publication Date
NL8301987A true NL8301987A (nl) 1984-01-02

Family

ID=13785118

Family Applications (1)

Application Number Title Priority Date Filing Date
NL8301987A NL8301987A (nl) 1982-06-03 1983-06-03 Correctie-inrichting voor roentgenstralen.

Country Status (6)

Country Link
JP (1) JPS58184655U (cs)
DE (1) DE3319984A1 (cs)
FR (1) FR2528266B1 (cs)
GB (1) GB2121168B (cs)
HK (1) HK73390A (cs)
NL (1) NL8301987A (cs)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4928293A (en) * 1987-09-23 1990-05-22 Behncke Hans H Apparatus for stabilization of X-ray fluorescence layer thickness measuring instruments for stabilization SNF process thereof
JPH0744967Y2 (ja) * 1988-11-17 1995-10-11 セイコー電子工業株式会社 蛍光ｘ線膜厚計
FR2721789A1 (fr) * 1994-06-24 1995-12-29 Ge Medical Syst Sa Appareil d'irradiation comprenant des moyens de mesure de l'exposition.
EP0781992B1 (en) * 1995-12-21 2006-06-07 Horiba, Ltd. Fluorescence X-ray analyzer
JP5839284B2 (ja) * 2012-05-01 2016-01-06 アースニクス株式会社 γ線反射型計測装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB1285885A (en) * 1968-11-07 1972-08-16 Atomic Energy Authority Uk Improvements in or relating to nephelometers
US4134012A (en) * 1977-10-17 1979-01-09 Bausch & Lomb, Inc. X-ray analytical system
AU528079B2 (en) * 1979-02-09 1983-04-14 Martin Marietta Corp. Element analysis unit
JPS5758300U (cs) * 1980-09-22 1982-04-06

Also Published As

Publication number Publication date
GB2121168B (en) 1986-02-19
JPH0328400Y2 (cs) 1991-06-18
GB2121168A (en) 1983-12-14
JPS58184655U (ja) 1983-12-08
FR2528266A1 (fr) 1983-12-09
HK73390A (en) 1990-09-21
GB8315135D0 (en) 1983-07-06
FR2528266B1 (fr) 1988-07-08
DE3319984A1 (de) 1983-12-08

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Legal Events

Date Code Title Description
A85 Still pending on 85-01-01
BA A request for search or an international-type search has been filed
BB A search report has been drawn up
BC A request for examination has been filed
BV The patent application has lapsed