JPS58184655U - Ｘ線自動較正装置 - Google Patents
Ｘ線自動較正装置Info
- Publication number
- JPS58184655U JPS58184655U JP8282382U JP8282382U JPS58184655U JP S58184655 U JPS58184655 U JP S58184655U JP 8282382 U JP8282382 U JP 8282382U JP 8282382 U JP8282382 U JP 8282382U JP S58184655 U JPS58184655 U JP S58184655U
- Authority
- JP
- Japan
- Prior art keywords
- ray
- shutter
- rays
- guide hole
- tube
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
-
- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
- G21K1/02—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diaphragms, collimators
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05G—X-RAY TECHNIQUE
- H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
- H05G1/08—Electrical details
- H05G1/26—Measuring, controlling or protecting
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/07—Investigating materials by wave or particle radiation secondary emission
- G01N2223/076—X-ray fluorescence
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- General Engineering & Computer Science (AREA)
- Engineering & Computer Science (AREA)
- Toxicology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Biochemistry (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
- Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
め要約のデータは記録されません。
Description
第１図は従来用いられていたＸ線自動較正装置の構成図
、第２図はこの考案による一実施例の断面図、第３図は
第２図の９０°回転方向から見た′図、第４図は、この
考案による構成図を示す。 ２１はＸ線管、２２は較正用基準板、２３は案内孔、２
７は案内孔である。 ゛
、第２図はこの考案による一実施例の断面図、第３図は
第２図の９０°回転方向から見た′図、第４図は、この
考案による構成図を示す。 ２１はＸ線管、２２は較正用基準板、２３は案内孔、２
７は案内孔である。 ゛
Claims (1)
- Ｘ線管と、このＸ線管から放射されるＸ線束を絞るため
のコリメータと、前記Ｘ線を開閉するシャッターと、比
例計数管などのＸ線検出器と、波高弁別器と、スケーラ
−タイマーと、Ｘ線強度および波高値の変動を較正する
手段を備えたＸ線装置において、シャッターが閉じてい
るとき自動的にＸ線強度および波高値の変動を較正する
よう、シャッター内に前記Ｘ線管と対向して設けられた
較正用基準板と、前ＺＸ線管からのＸ線を前記較正用基
準板に照射させるため設けられたシャッター内の第１案
内孔と、前記較正用基準板からのケイ光Ｘ線を前記Ｘ線
検出器に入射させるため前記 −第１案内孔と連通し
てシャッターに設けられた第２案内孔を有することを特
徴とするＸ線自動較正装置。
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8282382U JPS58184655U (ja) | 1982-06-03 | 1982-06-03 | Ｘ線自動較正装置 |
| FR8308504A FR2528266B1 (fr) | 1982-06-03 | 1983-05-24 | Dispositif de correction automatique de rayons x |
| DE19833319984 DE3319984A1 (de) | 1982-06-03 | 1983-06-01 | Automatische korrektureinrichtung fuer ein roentgenstrahl-fluoreszenz-analysegeraet |
| GB8315135A GB2121168B (en) | 1982-06-03 | 1983-06-02 | X-ray device |
| NL8301987A NL8301987A (nl) | 1982-06-03 | 1983-06-03 | Correctie-inrichting voor roentgenstralen. |
| US06/780,966 US4962517A (en) | 1982-06-03 | 1985-09-25 | Automatic X-ray correction device |
| HK73390A HK73390A (en) | 1982-06-03 | 1990-09-13 | X-ray device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8282382U JPS58184655U (ja) | 1982-06-03 | 1982-06-03 | Ｘ線自動較正装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS58184655U true JPS58184655U (ja) | 1983-12-08 |
| JPH0328400Y2 JPH0328400Y2 (ja) | 1991-06-18 |
Family
ID=13785118
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP8282382U Granted JPS58184655U (ja) | 1982-06-03 | 1982-06-03 | Ｘ線自動較正装置 |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS58184655U (ja) |
| DE (1) | DE3319984A1 (ja) |
| FR (1) | FR2528266B1 (ja) |
| GB (1) | GB2121168B (ja) |
| HK (1) | HK73390A (ja) |
| NL (1) | NL8301987A (ja) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013231693A (ja) * | 2012-05-01 | 2013-11-14 | Earthnics Corp | γ線反射型計測装置 |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3731973A1 (de) * | 1987-09-23 | 1989-04-13 | Helmut Fischer Gmbh & Co | Vorrichtung zur stabilisierung fuer roentgenfluoreszenzschichtdicken-messgeraete und verfahren hierzu |
| JPH0744967Y2 (ja) * | 1988-11-17 | 1995-10-11 | セイコー電子工業株式会社 | 蛍光ｘ線膜厚計 |
| FR2721789A1 (fr) * | 1994-06-24 | 1995-12-29 | Ge Medical Syst Sa | Appareil d'irradiation comprenant des moyens de mesure de l'exposition. |
| EP0781992B1 (en) * | 1995-12-21 | 2006-06-07 | Horiba, Ltd. | Fluorescence X-ray analyzer |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1285885A (en) * | 1968-11-07 | 1972-08-16 | Atomic Energy Authority Uk | Improvements in or relating to nephelometers |
| US4134012A (en) * | 1977-10-17 | 1979-01-09 | Bausch & Lomb, Inc. | X-ray analytical system |
| AU528079B2 (en) * | 1979-02-09 | 1983-04-14 | Martin Marietta Corp. | Element analysis unit |
| JPS5758300U (ja) * | 1980-09-22 | 1982-04-06 |
-
1982
- 1982-06-03 JP JP8282382U patent/JPS58184655U/ja active Granted
-
1983
- 1983-05-24 FR FR8308504A patent/FR2528266B1/fr not_active Expired
- 1983-06-01 DE DE19833319984 patent/DE3319984A1/de not_active Withdrawn
- 1983-06-02 GB GB8315135A patent/GB2121168B/en not_active Expired
- 1983-06-03 NL NL8301987A patent/NL8301987A/nl not_active Application Discontinuation
-
1990
- 1990-09-13 HK HK73390A patent/HK73390A/xx unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2013231693A (ja) * | 2012-05-01 | 2013-11-14 | Earthnics Corp | γ線反射型計測装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0328400Y2 (ja) | 1991-06-18 |
| GB2121168A (en) | 1983-12-14 |
| GB2121168B (en) | 1986-02-19 |
| HK73390A (en) | 1990-09-21 |
| NL8301987A (nl) | 1984-01-02 |
| FR2528266B1 (fr) | 1988-07-08 |
| GB8315135D0 (en) | 1983-07-06 |
| FR2528266A1 (fr) | 1983-12-09 |
| DE3319984A1 (de) | 1983-12-08 |
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