DE3177183D1 - Halbleiterspeichergeraet. - Google Patents

Halbleiterspeichergeraet.

Info

Publication number
DE3177183D1
DE3177183D1 DE8181306047T DE3177183T DE3177183D1 DE 3177183 D1 DE3177183 D1 DE 3177183D1 DE 8181306047 T DE8181306047 T DE 8181306047T DE 3177183 T DE3177183 T DE 3177183T DE 3177183 D1 DE3177183 D1 DE 3177183D1
Authority
DE
Germany
Prior art keywords
storage device
semiconductor storage
semiconductor
storage
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE8181306047T
Other languages
English (en)
Inventor
Takeo Tatematsu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Application granted granted Critical
Publication of DE3177183D1 publication Critical patent/DE3177183D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/18—Address generation devices; Devices for accessing memories, e.g. details of addressing circuits
    • G11C29/30—Accessing single arrays
    • G11C29/34—Accessing multiple bits simultaneously
DE8181306047T 1980-12-23 1981-12-22 Halbleiterspeichergeraet. Expired - Lifetime DE3177183D1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55182292A JPS57105897A (en) 1980-12-23 1980-12-23 Semiconductor storage device

Publications (1)

Publication Number Publication Date
DE3177183D1 true DE3177183D1 (de) 1990-06-21

Family

ID=16115725

Family Applications (1)

Application Number Title Priority Date Filing Date
DE8181306047T Expired - Lifetime DE3177183D1 (de) 1980-12-23 1981-12-22 Halbleiterspeichergeraet.

Country Status (5)

Country Link
US (1) US4464750A (de)
EP (1) EP0055129B1 (de)
JP (1) JPS57105897A (de)
DE (1) DE3177183D1 (de)
IE (1) IE56146B1 (de)

Families Citing this family (55)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59175095A (ja) * 1983-03-22 1984-10-03 Mitsubishi Electric Corp 半導体メモリ
JPS59175093A (ja) * 1983-03-22 1984-10-03 Mitsubishi Electric Corp 半導体メモリ
JPS59175094A (ja) * 1983-03-22 1984-10-03 Mitsubishi Electric Corp 半導体メモリ
EP0126785B1 (de) * 1983-05-25 1989-03-08 Ibm Deutschland Gmbh Prüf- und Diagnoseeinrichtung für Digitalrechner
JPS6015899A (ja) * 1983-07-08 1985-01-26 Hitachi Micro Comput Eng Ltd 記憶装置
JPS60115099A (ja) * 1983-11-25 1985-06-21 Fujitsu Ltd 半導体記憶装置
JPS60205895A (ja) * 1984-03-30 1985-10-17 Fujitsu Ltd 半導体記憶装置
JPS60261148A (ja) * 1984-06-07 1985-12-24 Mitsubishi Electric Corp 半導体装置
US4670878A (en) * 1984-08-14 1987-06-02 Texas Instruments Incorporated Column shift circuitry for high speed testing of semiconductor memory devices
JPH0687360B2 (ja) * 1984-08-22 1994-11-02 株式会社日立製作所 半導体記憶装置
JPS6159699A (ja) * 1984-08-30 1986-03-27 Mitsubishi Electric Corp 半導体記憶装置
JPH0612640B2 (ja) * 1984-08-30 1994-02-16 三菱電機株式会社 半導体記憶装置
EP0186051B1 (de) * 1984-12-28 1991-07-17 Siemens Aktiengesellschaft Integrierter Halbleiterspeicher
JP2508629B2 (ja) * 1985-02-28 1996-06-19 日本電気株式会社 半導体メモリ
US4814646A (en) * 1985-03-22 1989-03-21 Monolithic Memories, Inc. Programmable logic array using emitter-coupled logic
US4669082A (en) * 1985-05-09 1987-05-26 Halliburton Company Method of testing and addressing a magnetic core memory
US4686456A (en) * 1985-06-18 1987-08-11 Kabushiki Kaisha Toshiba Memory test circuit
EP0214508B1 (de) * 1985-09-11 1991-09-25 Siemens Aktiengesellschaft Integrierter Halbleiterspeicher
JP2513623B2 (ja) * 1986-02-28 1996-07-03 株式会社東芝 スタティック型メモリ
DE3773773D1 (de) * 1986-06-25 1991-11-21 Nec Corp Pruefschaltung fuer eine speichereinrichtung mit willkuerlichem zugriff.
US5293598A (en) * 1986-07-30 1994-03-08 Mitsubishi Denki Kabushiki Kaisha Random access memory with a plurality of amplifier groups
JPS6337894A (ja) * 1986-07-30 1988-02-18 Mitsubishi Electric Corp ランダムアクセスメモリ
JPH0828115B2 (ja) * 1986-11-10 1996-03-21 日本電気株式会社 半導体メモリ装置
JP2523586B2 (ja) * 1987-02-27 1996-08-14 株式会社日立製作所 半導体記憶装置
US4801869A (en) * 1987-04-27 1989-01-31 International Business Machines Corporation Semiconductor defect monitor for diagnosing processing-induced defects
US4782486A (en) * 1987-05-14 1988-11-01 Digital Equipment Corporation Self-testing memory
JPH01175056A (ja) * 1987-12-28 1989-07-11 Toshiba Corp プログラム転送方式
US5051995A (en) * 1988-03-14 1991-09-24 Mitsubishi Denki Kabushiki Kaisha Semiconductor memory device having a test mode setting circuit
US5287511A (en) * 1988-07-11 1994-02-15 Star Semiconductor Corporation Architectures and methods for dividing processing tasks into tasks for a programmable real time signal processor and tasks for a decision making microprocessor interfacing therewith
US5263143A (en) * 1988-07-11 1993-11-16 Star Semiconductor Corporation Real time probe device for internals of signal processor
JPH0271707U (de) * 1988-11-21 1990-05-31
KR910005306B1 (ko) * 1988-12-31 1991-07-24 삼성전자 주식회사 고밀도 메모리의 테스트를 위한 병렬리드회로
JP2780354B2 (ja) * 1989-07-04 1998-07-30 富士通株式会社 半導体メモリ装置
JP2717712B2 (ja) * 1989-08-18 1998-02-25 三菱電機株式会社 半導体記憶装置
JPH0752597B2 (ja) * 1989-10-30 1995-06-05 三菱電機株式会社 半導体メモリ装置
JP2838425B2 (ja) * 1990-01-08 1998-12-16 三菱電機株式会社 半導体記憶装置
JPH04212799A (ja) * 1990-01-31 1992-08-04 Nec Ic Microcomput Syst Ltd テスト回路内蔵半導体メモリ
US5301155A (en) * 1990-03-20 1994-04-05 Mitsubishi Denki Kabushiki Kaisha Multiblock semiconduction storage device including simultaneous operation of a plurality of block defect determination circuits
GB2243466A (en) * 1990-03-31 1991-10-30 Motorola Gmbh Memory error detection
EP0527866B1 (de) * 1990-05-10 1994-04-13 Siemens Aktiengesellschaft Integrierter halbleiterspeicher mit paralleltestmöglichkeit und redundanzverfahren
US5675544A (en) * 1990-06-25 1997-10-07 Texas Instruments Incorporated Method and apparatus for parallel testing of memory circuits
JP2647546B2 (ja) * 1990-10-11 1997-08-27 シャープ株式会社 半導体記憶装置のテスト方法
US5457696A (en) * 1991-08-08 1995-10-10 Matsushita Electric Industrial Co., Ltd. Semiconductor memory having internal test circuit
US5751728A (en) * 1991-11-12 1998-05-12 Nec Corporation Semiconductor memory IC testing device
JPH0684396A (ja) * 1992-04-27 1994-03-25 Nec Corp 半導体記憶装置
JPH06275100A (ja) * 1993-03-19 1994-09-30 Fujitsu Ltd 半導体記憶装置
US6037123A (en) 1995-09-15 2000-03-14 Microcide Pharmaceuticals, Inc. Methods of screening for compounds active on Staphylococcus aureus target genes
US6009026A (en) * 1997-07-28 1999-12-28 International Business Machines Corporation Compressed input/output test mode
USRE40172E1 (en) * 1998-05-25 2008-03-25 Hynix Semiconductor, Inc. Multi-bank testing apparatus for a synchronous dram
US6757209B2 (en) * 2001-03-30 2004-06-29 Intel Corporation Memory cell structural test
JP2002324393A (ja) * 2001-04-25 2002-11-08 Mitsubishi Electric Corp 半導体記憶装置
JP2002367400A (ja) * 2001-06-08 2002-12-20 Mitsubishi Electric Corp 半導体集積回路装置
JP4627644B2 (ja) * 2004-08-30 2011-02-09 Ｏｋｉセミコンダクタ株式会社 メモリテスト回路
DE102004052594B3 (de) * 2004-10-29 2006-05-04 Infineon Technologies Ag Integrierter Halbleiterspeicher
JP6115226B2 (ja) * 2012-03-22 2017-04-19 株式会社リコー 制御装置、画像形成装置及び判定方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2246023B1 (de) * 1973-09-05 1976-10-01 Honeywell Bull Soc Ind
US3995215A (en) * 1974-06-26 1976-11-30 International Business Machines Corporation Test technique for semiconductor memory array
JPS51147924A (en) * 1975-06-13 1976-12-18 Fujitsu Ltd Memory unit
US4055754A (en) * 1975-12-22 1977-10-25 Chesley Gilman D Memory device and method of testing the same
JPS5622278A (en) * 1979-07-27 1981-03-02 Fujitsu Ltd Decoder selection system
US4334307A (en) * 1979-12-28 1982-06-08 Honeywell Information Systems Inc. Data processing system with self testing and configuration mapping capability
US4281398A (en) * 1980-02-12 1981-07-28 Mostek Corporation Block redundancy for memory array

Also Published As

Publication number Publication date
EP0055129A2 (de) 1982-06-30
IE813035L (en) 1982-06-23
EP0055129A3 (en) 1984-07-04
IE56146B1 (en) 1991-05-08
JPS6322000B2 (de) 1988-05-10
JPS57105897A (en) 1982-07-01
US4464750A (en) 1984-08-07
EP0055129B1 (de) 1990-05-16

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition