DE102014117356B4 - Thermoanalysator - Google Patents

Thermoanalysator Download PDF

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Publication number
DE102014117356B4
DE102014117356B4 DE102014117356.2A DE102014117356A DE102014117356B4 DE 102014117356 B4 DE102014117356 B4 DE 102014117356B4 DE 102014117356 A DE102014117356 A DE 102014117356A DE 102014117356 B4 DE102014117356 B4 DE 102014117356B4
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Germany
Prior art keywords
sample
furnace tube
opening
furnace
heating furnace
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DE102014117356.2A
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German (de)
English (en)
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DE102014117356A1 (de
Inventor
c/o Hit. High-Tech Scien. Corp. Nishimura Shinya
c/o Hit. High-Tech Scien. Corp. Yamada Kentaro
c/o Hit. High-Tech Scien. Corp. Nagasawa Kanji
c/o Hit. High-Tech Scien. Corp. Takasawa Ryoji
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Hitachi High Tech Analysis Corp Jp
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Hitachi High Tech Science Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N5/00—Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
DE102014117356.2A 2013-12-04 2014-11-26 Thermoanalysator Active DE102014117356B4 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013251101A JP6061836B2 (ja) 2013-12-04 2013-12-04 熱重量測定装置
JP2013-251101 2013-12-04

Publications (2)

Publication Number Publication Date
DE102014117356A1 DE102014117356A1 (de) 2015-06-25
DE102014117356B4 true DE102014117356B4 (de) 2021-12-09

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ID=53265108

Family Applications (1)

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DE102014117356.2A Active DE102014117356B4 (de) 2013-12-04 2014-11-26 Thermoanalysator

Country Status (5)

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US (1) US10088402B2 (enExample)
JP (1) JP6061836B2 (enExample)
CN (1) CN104698025B (enExample)
DE (1) DE102014117356B4 (enExample)
TW (1) TWI592656B (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6548912B2 (ja) * 2015-03-02 2019-07-24 株式会社日立ハイテクサイエンス 熱分析装置
JP6606710B2 (ja) * 2015-08-26 2019-11-20 株式会社リガク 熱分析装置
CN105527312B (zh) * 2016-01-04 2019-04-23 中国科学院过程工程研究所 一种用于生物质灰熔融特性的分析方法
CN105769028A (zh) * 2016-03-24 2016-07-20 深圳市锐谷科技有限公司 一种集多种功能于一体的多功能干身机
JP6706522B2 (ja) * 2016-03-25 2020-06-10 株式会社日立ハイテクサイエンス 試料容器及び熱分析装置
EP3545288A1 (en) * 2016-11-22 2019-10-02 TA Instruments-Waters LLC Direct thermal injection thermal analysis
CN108225969B (zh) * 2018-01-25 2020-01-24 华北水利水电大学 一种黄河泥沙监测清理车
JP7236728B2 (ja) * 2019-03-11 2023-03-10 株式会社日立ハイテクサイエンス 熱分析装置
CN110470559A (zh) * 2019-05-15 2019-11-19 华北电力大学（保定） 一种固体高温高压化学反应动力学参数获取方法与装置
JP7365278B2 (ja) * 2019-06-19 2023-10-19 株式会社日立ハイテクサイエンス 熱分析装置
DE102020114535A1 (de) * 2019-06-19 2020-12-24 Hitachi High-Tech Science Corporation Thermoanalysegerät
JP6792040B1 (ja) * 2019-09-25 2020-11-25 ネッチ ゲレーテバウ ゲーエムベーハー 熱分析装置、試料ホルダ組立体及び熱分析方法
JP7407020B2 (ja) 2020-03-04 2023-12-28 株式会社日立ハイテクサイエンス 熱分析装置の制御部、及び熱分析装置
CN111239182A (zh) * 2020-03-06 2020-06-05 3M材料技术(合肥)有限公司 隔热性能测试设备以及隔热性能测试方法
JP7407051B2 (ja) 2020-03-12 2023-12-28 株式会社日立ハイテクサイエンス 熱分析装置
JP2023137314A (ja) 2022-03-18 2023-09-29 株式会社日立ハイテクサイエンス 偏光画像取得装置
JP2024052449A (ja) 2022-10-01 2024-04-11 株式会社日立ハイテクサイエンス 偏光画像取得装置及び熱分析装置
US12215970B1 (en) 2024-05-30 2025-02-04 King Saud University System for measuring angle of repose of high temperature granular material

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3469455A (en) 1966-04-12 1969-09-30 Chyo Balance Corp Apparatus for measuring changes in the weight of a sample
JPS59142696U (ja) 1983-03-11 1984-09-22 真空理工株式会社 加熱炉用補助光源装置
JPH07146262A (ja) 1993-07-22 1995-06-06 Sumitomo Chem Co Ltd 熱分析装置
JPH08327573A (ja) 1995-05-31 1996-12-13 Shimadzu Corp 熱分析装置
JPH11326249A (ja) 1998-05-18 1999-11-26 Seiko Instruments Inc 熱分析装置
JP2001183319A (ja) 1999-12-27 2001-07-06 Shimadzu Corp 熱分析装置
US20070201533A1 (en) 2006-02-28 2007-08-30 Toshitada Takeuchi Thermal analysis apparatus
JP2011053077A (ja) 2009-09-01 2011-03-17 Sii Nanotechnology Inc 熱分析装置
JP2013185834A (ja) 2012-03-06 2013-09-19 Hitachi High-Tech Science Corp 熱分析装置
JP2013251101A (ja) 2012-05-31 2013-12-12 Tatsuta Electric Wire & Cable Co Ltd 高周波電流用電線

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3373598A (en) * 1964-11-12 1968-03-19 Du Pont Thermal gravimetric analyzer
US5601364A (en) * 1994-06-14 1997-02-11 Georgia Tech Research Corporation Method and apparatus for measuring thermal warpage
JP3084472B2 (ja) * 1994-11-21 2000-09-04 セイコーインスツルメンツ株式会社 湿度制御式熱分析装置
US5876118A (en) * 1995-12-08 1999-03-02 The Perkin-Elmer Corporation Calorimeter having rapid cooling of a heating vessel therein
JPH09229884A (ja) * 1996-02-21 1997-09-05 Shimadzu Corp 熱分析装置
JP3370581B2 (ja) * 1997-11-28 2003-01-27 セイコーインスツルメンツ株式会社 高速熱分析装置
AUPR228900A0 (en) * 2000-12-22 2001-01-25 Bhp Innovation Pty Ltd Method for determining sticking and flow properties of particulate solids
JP5709160B2 (ja) * 2010-03-29 2015-04-30 株式会社日立ハイテクサイエンス 熱分析装置
JP6168571B2 (ja) * 2013-08-14 2017-07-26 株式会社リガク 試料分析方法とその装置
JP6212416B2 (ja) * 2014-03-13 2017-10-11 株式会社日立ハイテクサイエンス 熱分析装置用撮像装置、及びそれを備えた熱分析装置
JP6246113B2 (ja) * 2014-03-14 2017-12-13 株式会社日立ハイテクサイエンス 熱分析装置
EP2942612A1 (en) * 2014-05-06 2015-11-11 Mettler-Toledo AG Temperature Modulated Thermogravimetric Analysis

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3469455A (en) 1966-04-12 1969-09-30 Chyo Balance Corp Apparatus for measuring changes in the weight of a sample
JPS59142696U (ja) 1983-03-11 1984-09-22 真空理工株式会社 加熱炉用補助光源装置
JPH07146262A (ja) 1993-07-22 1995-06-06 Sumitomo Chem Co Ltd 熱分析装置
JPH08327573A (ja) 1995-05-31 1996-12-13 Shimadzu Corp 熱分析装置
JPH11326249A (ja) 1998-05-18 1999-11-26 Seiko Instruments Inc 熱分析装置
JP2001183319A (ja) 1999-12-27 2001-07-06 Shimadzu Corp 熱分析装置
US20070201533A1 (en) 2006-02-28 2007-08-30 Toshitada Takeuchi Thermal analysis apparatus
JP2007232479A (ja) 2006-02-28 2007-09-13 Sii Nanotechnology Inc 熱分析装置
JP2011053077A (ja) 2009-09-01 2011-03-17 Sii Nanotechnology Inc 熱分析装置
US8359180B2 (en) 2009-09-01 2013-01-22 Sii Nanotechnology Inc. Thermal analysis apparatus
JP2013185834A (ja) 2012-03-06 2013-09-19 Hitachi High-Tech Science Corp 熱分析装置
US9033574B2 (en) 2012-03-06 2015-05-19 Hitachi High-Tech Science Corporation Thermal analyzer
JP2013251101A (ja) 2012-05-31 2013-12-12 Tatsuta Electric Wire & Cable Co Ltd 高周波電流用電線

Also Published As

Publication number Publication date
DE102014117356A1 (de) 2015-06-25
TWI592656B (zh) 2017-07-21
JP6061836B2 (ja) 2017-01-18
CN104698025A (zh) 2015-06-10
US10088402B2 (en) 2018-10-02
TW201522955A (zh) 2015-06-16
CN104698025B (zh) 2019-04-23
US20150153292A1 (en) 2015-06-04
JP2015108540A (ja) 2015-06-11

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Owner name: HITACHI HIGH-TECH ANALYSIS CORPORATION, JP

Free format text: FORMER OWNER: HITACHI HIGH-TECH SCIENCE CORPORATION, TOKYO, JP