DE102004040414B4 - Verfahren zur Herstellung eines Verdrahtungssubstrats eines Halbleiterbauteils mit Außenkontaktanschlussflecken für Außenkontakte - Google Patents
Verfahren zur Herstellung eines Verdrahtungssubstrats eines Halbleiterbauteils mit Außenkontaktanschlussflecken für Außenkontakte Download PDFInfo
- Publication number
- DE102004040414B4 DE102004040414B4 DE102004040414A DE102004040414A DE102004040414B4 DE 102004040414 B4 DE102004040414 B4 DE 102004040414B4 DE 102004040414 A DE102004040414 A DE 102004040414A DE 102004040414 A DE102004040414 A DE 102004040414A DE 102004040414 B4 DE102004040414 B4 DE 102004040414B4
- Authority
- DE
- Germany
- Prior art keywords
- base plate
- contact pads
- rubber
- wiring substrate
- external contact
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/0271—Arrangements for reducing stress or warp in rigid printed circuit boards, e.g. caused by loads, vibrations or differences in thermal expansion
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W42/00—Arrangements for protection of devices
- H10W42/121—Arrangements for protection of devices protecting against mechanical damage
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
- H05K1/112—Pads for surface mounting, e.g. lay-out directly combined with via connections
- H05K1/114—Pad being close to via, but not surrounding the via
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0104—Properties and characteristics in general
- H05K2201/0133—Elastomeric or compliant polymer
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0183—Dielectric layers
- H05K2201/0187—Dielectric layers with regions of different dielectrics in the same layer, e.g. in a printed capacitor for locally changing the dielectric properties
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0335—Layered conductors or foils
- H05K2201/0355—Metal foils
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09009—Substrate related
- H05K2201/091—Locally and permanently deformed areas including dielectric material
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2203/00—Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
- H05K2203/02—Details related to mechanical or acoustic processing, e.g. drilling, punching, cutting, using ultrasound
- H05K2203/0278—Flat pressure, e.g. for connecting terminals with anisotropic conductive adhesive
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/60—Insulating or insulated package substrates; Interposers; Redistribution layers
- H10W70/62—Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
- H10W70/65—Shapes or dispositions of interconnections
- H10W70/654—Top-view layouts
- H10W70/655—Fan-out layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/536—Shapes of wire connectors the connected ends being ball-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/50—Bond wires
- H10W72/531—Shapes of wire connectors
- H10W72/5363—Shapes of wire connectors the connected ends being wedge-shaped
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/851—Dispositions of multiple connectors or interconnections
- H10W72/874—On different surfaces
- H10W72/884—Die-attach connectors and bond wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/921—Structures or relative sizes of bond pads
- H10W72/923—Bond pads having multiple stacked layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/9415—Dispositions of bond pads relative to the surface, e.g. recessed, protruding
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/90—Bond pads, in general
- H10W72/941—Dispositions of bond pads
- H10W72/942—Dispositions of bond pads relative to underlying supporting features, e.g. bond pads, RDLs or vias
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/724—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/731—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors
- H10W90/734—Package configurations characterised by the relative positions of pads or connectors relative to package parts of die-attach connectors between a chip and a stacked insulating package substrate, interposer or RDL
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/751—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
- H10W90/754—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Wire Bonding (AREA)
- Structures For Mounting Electric Components On Printed Circuit Boards (AREA)
Priority Applications (7)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004040414A DE102004040414B4 (de) | 2004-08-19 | 2004-08-19 | Verfahren zur Herstellung eines Verdrahtungssubstrats eines Halbleiterbauteils mit Außenkontaktanschlussflecken für Außenkontakte |
| PCT/DE2005/001278 WO2006017998A2 (de) | 2004-08-19 | 2005-07-20 | Verdrahtungssubstrat eines halbleiterbauteils mit aussenkontaktanschlussflecken für aussenkontakte und verfahren zur herstellung desselben |
| EP05770056.9A EP1779428B1 (de) | 2004-08-19 | 2005-07-20 | Verfahren zur herstellung eines verdrahtungssubstrats eines halbleiterbauteils mit aussenkontaktanschlussflecken für aussenkontakte |
| JP2007526192A JP5059607B2 (ja) | 2004-08-19 | 2005-07-20 | 外部接触部の外部接触パッドを含んだ半導体部品の配線基板、および、その製造方法 |
| KR1020077006299A KR100889840B1 (ko) | 2004-08-19 | 2005-07-20 | 외부 콘택용 외부 콘택 패드를 포함하는 반도체 구성요소의 와이어링 기판의 제조 방법 |
| CNB2005800351647A CN100530625C (zh) | 2004-08-19 | 2005-07-20 | 包含外部接触垫片的半导体部件的布线衬底及其制造方法 |
| US11/676,869 US7638418B2 (en) | 2004-08-19 | 2007-02-20 | Wiring substrate of a semiconductor component comprising rubber-elastic pads embedded in said wiring substrate and method for producing the same |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004040414A DE102004040414B4 (de) | 2004-08-19 | 2004-08-19 | Verfahren zur Herstellung eines Verdrahtungssubstrats eines Halbleiterbauteils mit Außenkontaktanschlussflecken für Außenkontakte |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE102004040414A1 DE102004040414A1 (de) | 2006-03-02 |
| DE102004040414B4 true DE102004040414B4 (de) | 2006-08-31 |
Family
ID=35745461
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE102004040414A Expired - Fee Related DE102004040414B4 (de) | 2004-08-19 | 2004-08-19 | Verfahren zur Herstellung eines Verdrahtungssubstrats eines Halbleiterbauteils mit Außenkontaktanschlussflecken für Außenkontakte |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US7638418B2 (https=) |
| EP (1) | EP1779428B1 (https=) |
| JP (1) | JP5059607B2 (https=) |
| KR (1) | KR100889840B1 (https=) |
| CN (1) | CN100530625C (https=) |
| DE (1) | DE102004040414B4 (https=) |
| WO (1) | WO2006017998A2 (https=) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8895358B2 (en) * | 2009-09-11 | 2014-11-25 | Stats Chippac, Ltd. | Semiconductor device and method of forming cavity in PCB containing encapsulant or dummy die having CTE similar to CTE of large array WLCSP |
| US9960130B2 (en) | 2015-02-06 | 2018-05-01 | UTAC Headquarters Pte. Ltd. | Reliable interconnect |
| KR102902631B1 (ko) | 2021-01-29 | 2025-12-22 | 삼성전자주식회사 | 포스트를 포함하는 반도체 패키지 |
| EP4334974A1 (en) * | 2021-05-06 | 2024-03-13 | Qualcomm Technologies, Inc. | High-power die heat sink with vertical heat path |
| US11929299B2 (en) | 2021-05-06 | 2024-03-12 | Qualcomm Incorporated | High-power die heat sink with vertical heat path |
| US11948853B2 (en) | 2021-05-06 | 2024-04-02 | QUALCOMM Technologies Incorporated | High-power die heat sink |
| CN114980492A (zh) * | 2022-06-28 | 2022-08-30 | 昆山国显光电有限公司 | 线路板组件、显示屏及电子设备 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5759047A (en) * | 1996-05-24 | 1998-06-02 | International Business Machines Corporation | Flexible circuitized interposer with apertured member and method for making same |
| US20020025587A1 (en) * | 2000-06-27 | 2002-02-28 | Seiko Epson Corporation | Semiconductor device and method for manufacturing the same |
| US20020030288A1 (en) * | 1998-03-23 | 2002-03-14 | Seiko Epson Corporation | Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument |
| US6399896B1 (en) * | 2000-03-15 | 2002-06-04 | International Business Machines Corporation | Circuit package having low modulus, conformal mounting pads |
Family Cites Families (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6433948A (en) * | 1987-07-29 | 1989-02-03 | Hitachi Chemical Co Ltd | Wiring board for mounting semiconductor element |
| US5716218A (en) * | 1991-06-04 | 1998-02-10 | Micron Technology, Inc. | Process for manufacturing an interconnect for testing a semiconductor die |
| JPH0846084A (ja) * | 1994-08-02 | 1996-02-16 | Shinko Electric Ind Co Ltd | 表面実装型半導体パッケージ及びその製造方法並びに半導体装置 |
| US6020220A (en) | 1996-07-09 | 2000-02-01 | Tessera, Inc. | Compliant semiconductor chip assemblies and methods of making same |
| US6417029B1 (en) | 1996-12-12 | 2002-07-09 | Tessera, Inc. | Compliant package with conductive elastomeric posts |
| US5900674A (en) * | 1996-12-23 | 1999-05-04 | General Electric Company | Interface structures for electronic devices |
| JPH10270496A (ja) * | 1997-03-27 | 1998-10-09 | Hitachi Ltd | 電子装置、情報処理装置、半導体装置並びに半導体チップの実装方法 |
| JP2001094227A (ja) * | 1999-09-20 | 2001-04-06 | Shinko Electric Ind Co Ltd | 半導体チップ実装用の配線基板と該基板を用いた半導体チップの実装方法 |
| JP2001217514A (ja) * | 2000-02-03 | 2001-08-10 | Denso Corp | 多層配線基板 |
| US6555908B1 (en) * | 2000-02-10 | 2003-04-29 | Epic Technologies, Inc. | Compliant, solderable input/output bump structures |
| US6358836B1 (en) * | 2000-06-16 | 2002-03-19 | Industrial Technology Research Institute | Wafer level package incorporating elastomeric pads in dummy plugs |
| US6417019B1 (en) * | 2001-04-04 | 2002-07-09 | Lumileds Lighting, U.S., Llc | Phosphor converted light emitting diode |
| JP4105409B2 (ja) * | 2001-06-22 | 2008-06-25 | 株式会社ルネサステクノロジ | マルチチップモジュールの製造方法 |
| DE10134011B4 (de) * | 2001-07-12 | 2007-08-16 | Infineon Technologies Ag | Trägersubstrat, das zur Kontaktierung mit einer integrierten Schaltung vorgesehen ist |
| JP3891838B2 (ja) * | 2001-12-26 | 2007-03-14 | 株式会社ルネサステクノロジ | 半導体装置およびその製造方法 |
| JP2003198068A (ja) * | 2001-12-27 | 2003-07-11 | Nec Corp | プリント基板、半導体装置、およびプリント基板と部品との電気的接続構造 |
| JP2003264256A (ja) * | 2002-03-08 | 2003-09-19 | Hitachi Ltd | 半導体装置 |
| JP3952375B2 (ja) * | 2002-03-25 | 2007-08-01 | 富士通株式会社 | チップ実装体、チップ実装体の製造方法、及び、電子機器 |
| JP2003318322A (ja) * | 2002-04-25 | 2003-11-07 | Matsushita Electric Ind Co Ltd | インターポーザ基板およびその製造方法、ならびに半導体装置およびその製造方法 |
| JP2004128364A (ja) * | 2002-10-07 | 2004-04-22 | Renesas Technology Corp | 半導体パッケージおよび半導体パッケージの実装構造体 |
| JP3905032B2 (ja) * | 2002-12-20 | 2007-04-18 | シャープ株式会社 | 半導体装置、および、その製造方法 |
| KR20040069513A (ko) * | 2003-01-29 | 2004-08-06 | 삼성전자주식회사 | 신뢰성 높은 볼 그리드 어레이 패키지와 그 제조 방법 |
-
2004
- 2004-08-19 DE DE102004040414A patent/DE102004040414B4/de not_active Expired - Fee Related
-
2005
- 2005-07-20 JP JP2007526192A patent/JP5059607B2/ja not_active Expired - Fee Related
- 2005-07-20 WO PCT/DE2005/001278 patent/WO2006017998A2/de not_active Ceased
- 2005-07-20 KR KR1020077006299A patent/KR100889840B1/ko not_active Expired - Fee Related
- 2005-07-20 CN CNB2005800351647A patent/CN100530625C/zh not_active Expired - Fee Related
- 2005-07-20 EP EP05770056.9A patent/EP1779428B1/de not_active Expired - Lifetime
-
2007
- 2007-02-20 US US11/676,869 patent/US7638418B2/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5759047A (en) * | 1996-05-24 | 1998-06-02 | International Business Machines Corporation | Flexible circuitized interposer with apertured member and method for making same |
| US20020030288A1 (en) * | 1998-03-23 | 2002-03-14 | Seiko Epson Corporation | Semiconductor device and method of manufacturing the same, circuit board, and electronic instrument |
| US6399896B1 (en) * | 2000-03-15 | 2002-06-04 | International Business Machines Corporation | Circuit package having low modulus, conformal mounting pads |
| US20020025587A1 (en) * | 2000-06-27 | 2002-02-28 | Seiko Epson Corporation | Semiconductor device and method for manufacturing the same |
Also Published As
| Publication number | Publication date |
|---|---|
| JP5059607B2 (ja) | 2012-10-24 |
| US7638418B2 (en) | 2009-12-29 |
| CN100530625C (zh) | 2009-08-19 |
| CN101048866A (zh) | 2007-10-03 |
| US20070194459A1 (en) | 2007-08-23 |
| DE102004040414A1 (de) | 2006-03-02 |
| EP1779428B1 (de) | 2015-05-27 |
| KR20070042580A (ko) | 2007-04-23 |
| JP2008510309A (ja) | 2008-04-03 |
| KR100889840B1 (ko) | 2009-03-20 |
| WO2006017998A2 (de) | 2006-02-23 |
| EP1779428A2 (de) | 2007-05-02 |
| WO2006017998A3 (de) | 2006-08-03 |
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