CN1189929C - 电子元件安装体及其制造方法和使用它的电子设备 - Google Patents
电子元件安装体及其制造方法和使用它的电子设备 Download PDFInfo
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- CN1189929C CN1189929C CNB981226612A CN98122661A CN1189929C CN 1189929 C CN1189929 C CN 1189929C CN B981226612 A CNB981226612 A CN B981226612A CN 98122661 A CN98122661 A CN 98122661A CN 1189929 C CN1189929 C CN 1189929C
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- substrate
- element mounting
- electronic element
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Abstract
本发明揭示一种电子元件安装体及其制造方法和使用它的电子设备,包括对在基板(1)上形成的导电图形(4)的连接面(4a)进行粗化,并用导电粘接剂(8)将半导体集成电路元件(7)的突起电极(7a)连接到这种被粗化后的连接面(4a)上。其中,用玻璃膜覆盖所述基板中除导电图形连接面以外的部分,所述玻璃膜的表面是粗面,所述玻璃膜的表面和所述电子元件底面之间用封装树脂封装。从而,能防止在电子元件安装体中基板的导电图形的连接面和电子元件的电极的连接不良。
Description
技术领域
本发明涉及在基板上安装电子元件的电子元件安装体和使用它的电子设备以及电子元件安装体的制造方法。
背景技术
在以往的这种电子元件安装体中,在基板上安装电子元件前,要对设置在这种基板上的导电图形进行导通检查。然后,将电子元件安装在用导通检查通过的作为合格品的基板上。
但是,虽然是使用导通检查后的基板的安装体,但在安装体的最终检查工序中常常发生导通不良。其原因由下述的现象容易理解。即导通检查是利用使导电橡胶与导电图形的连接面接触的方法进行。这时,在连接面上残存一部分导电橡胶。用于这种检查的导电橡胶,作为整体来说具有高的导电,但在前述的连接面上的导电橡胶的残存物则导电极低,或者几乎没有导电。其结果,在连接面上连接电子元件的电极时,因这种残存物介于两者之间,所以会产生电接触不良。此外,因基板与电子元件的连接强度不够,也会发生导通不良。
发明内容
本发明的目的在于防止这种电接触不良。
为达到这种目的,本发明的电子元件安装体,包括至少在1个面上设置导电图形的基板和安装在设置这种导电图形的面上的电子元件,
这种电子元件在所述基板侧具有电极,
与这种电极相对的导电图形的连接面是粗面,
利用导电粘接剂将电子元件的电极连接到这种被粗化后的连接面上。
本发明的电子设备具有将这种本发明的电子元件安装体安装在其它的基板上的结构。
本发明的电子元件安装体的制造方法,包括下述工序:
至少在基板的1个面上形成导电图形的工序,
至少对所述导电图形的连接面进行粗化的工序,
用导电粘接剂将电子元件的电极连接到所述粗化的连接面上的工序。
在本发明中,由于利用导电图形的连接面的粗化,因在去除附着在连接面上的导电不良物质的同时,也增大连接面的表面积,所以电子元件的电极与连接面的电气连接稳定。此外,因由于粗化,进一步更大地发挥导电粘接剂的粘接效果,所以也增强了电子元件的电极与导电图形的连接面的机械连接强度。
本发明第一方面的电子元件安装体,其特征在于,包括至少在1个面上设置导电图形的基板和安装在设置所述导电图形的面上的电子元件,
所述电子元件在所述基板侧具有电极,
与所述电极相对的所述导电图形的连接面是粗面,
利用导电粘接剂将所述电极连接到所述连接面上,
用玻璃膜覆盖所述基板中除导电图形连接面以外的部分,所述玻璃膜的表面是粗面,所述玻璃膜的表面和所述电子元件底面之间用封装树脂封装。
本发明第二方面的电子设备,其特征在于,包括具有至少在1个面上设置导电图形的第一基板和安装在设置所述导电图形的面上的电子元件的电子元件安装体,和安装所述电子元件安装体的第二基板,
所述电子元件在所述第一基板侧具有电极,
与所述电极相对的所述导电图形的连接面是粗面,
利用导电粘接剂将所述电极连接到所述连接面上,
用玻璃膜覆盖所述第一基板中除导电图形连接面以外的部分,所述玻璃膜的表面是粗面,所述玻璃膜的表面和所述电子元件底面之间用封装树脂封装。
本发明第三方面的电子元件安装体的制造方法,其特征在于,包括:
至少在基板的1个面上形成导电图形的工序,
用玻璃膜覆盖所述基板中除导电图形连接面以外部分的工序,
对所述导电图形至少是连接面部分和所述玻璃膜表面进行粗化的工序,
用导电粘接剂将电子元件的电极连接到所述连接面上的工序,以及
所述电极连接工序后,将封装树脂注入所述电子元件和所述基板之间的工序。
附图说明
图1表示本发明一实施形态的电子元件的安装体的立体图。
图2表示本发明一实施形态的电子元件的安装体的平面图。
图3表示本发明一实施形态的电子元件的安装体的关键部分剖视图。
图4表示形成导电图形后的基板的平面图。
图5表示形成绝缘玻璃膜和外层涂敷膜后的基板的平面图。
图6是表示穿孔的分布状态的基板的后视图。
图7表示说明喷砂处理前导电图形状态的典型的部分立体图。
图8表示说明喷砂处理后导电图形状态的典型的部分立体图。
图9表示图8所示的导电图形的剖视图。
图10是表示喷砂处理后的外层涂敷膜的粗状态的剖视图。
图11是表示喷砂处理后的外层涂敷膜的粗状态的剖视图。
图12是表示喷砂处理后的基板表面的粗状态的剖视图。
图13是表示喷砂处理后的基板表面的粗状态的剖视图。
图14是制造工序图。
图15是说明粗化工序的平面图。
图16是说明粗化工序的平面图。
图17是说明粗化工序的侧面图。
图18是说明利用超声波的清洗工序的典型的剖视图。
具体实施方式
下面,参照附图对本发明的实施形态进行说明。
本发明的电子元件安装体,包括至少在1个面上设置导电图形的基板和安装在设置这种导电图形的面上的电子元件,这种电子元件在基板侧具有电极,与这种电极相对的导电图形的连接面被粗化,利用导电粘接剂将电子元件的电极连接到这种被粗化后的连接面上。
本发明的电子元件安装体的1个实施形态,是用具有突起电极的半导体集成电路元件(下面称为IC)作为电子元件。虽然设置在这种IC的下面的突起电极是极小的,但由于连接面的粗化,能使得连接面积扩大和导电粘接剂的粘接效果增大,IC的突起电极能够牢固地与接触面连接。此外,因连接面被粗化,所以在IC安装时,突起电极不会在接触面上横向滑动,由此也能改善IC安装的可靠性。此外,粗面的程度从与导电粘接剂的相容性来看,以粗面的凹部的深度(波峰与谷底的距离)在15μm以下为佳。
在本发明的安装体中,用厚膜印刷图形构成导电图形,并且连接面最好具有利用喷砂造成的粗面。利用喷砂使连接面粗化,因容易控制研磨粉的材料、粒径、及对导电图形的冲击速度等,所以能容易地形成所要的粗面。而且,因用厚膜印刷图形形成导电图形,所以不会由于这种研磨而导致。在连接面上开孔而减少连接面积。当然,即使在厚膜印刷时连接面的一部分、例如中央部分成为凸起的状态,但是利用这种喷砂。其凸起部分会被压下,所以整体上接近于平面。因此,更容易将电子元件的电极连接到这种连接面上。此外,利用厚膜印刷形成的连接面的边缘,以具有向外突出的形状为佳。因由于这种形状扩大了连接面的面积,所以进一步提高了使用导电粘接剂连接的连接强度。
另外,最好由厚膜印刷图形构成导电图形,并且连接面具有利用干式腐蚀的粗面。借助于调整干式腐蚀的功率输出,能容易使连接面成为所要的粗面。
用具有粗表面的玻璃膜覆盖导电图形的连接面以外的部分为佳。因在基板上用玻璃膜覆盖连接面以外的部分,所以导电图形相对于基板的强度增大,难以发生剥离。此外,接近的导电图形之间也难以发生短路。此外,因玻璃膜的表面也被粗化,所以在安装电子元件后用封装树脂覆盖在基板上时,因封装树脂进入到玻璃膜的粗面部分并且能具有粘接效果,所以提高了树脂的封装强度。此外,树脂还通过由玻璃膜粗化形成的毛细管路径进入电子元件的下面,所以封装树脂起着将电子元件连接到基板上的粘接剂的作用,进一步提高了连接强度。
最好在基板未形成玻璃膜的部分上配置具有粗表面的位置检测标记。在用光学的方法进行位置检测的场合,因位置检测标记的表面被粗化,所以这种表面的反射变少,提高了位置检测精度。
最好在没有形成导电图形的基板背面设置连接电极,通过在基板上形成的通孔将这种金属电极与表面的导电图形连接。这种情况下,因在基板的背面上设置连接电极,所以容易与其它的大的基板等进行连接。也就是说,因将电子元件安装在基板的表面侧,所以在表面侧设置连接电极,则地方受到很大限制。但是,如果是在背面侧,则能在例如容易连接的边缘部分上方便地形成连接电极。借助于在背面侧设置覆盖连接电极以外的玻璃膜,则难于发生基板的热变形,容易与前述的大基板连接。
最好在基板的没有被导电图形覆盖的部分为粗面。在用玻璃膜或封装树脂覆盖导电图形的连接面以外的部分时,如果基板被粗化,则极大地提高了对于这些基板的粘接强度。而且,借助于在导电图形的连接面粗化时同时进行这种基板粗化,则不需要其它的工序,操作性良好。
最好在电子元件和基板之间用封装树脂封装。利用封装树脂能更加牢固地将电子文件安装并固定在基板上。此外,利用基板表面的粗化,封装树脂的粘接效果增大,粘接力变得更强。
最好利用喷砂粗化基板的边缘表面是令人满意的。利用这种粗化,因在基板边缘面上不会残存裂缝,所以在以后的工序中能抑制基板断裂的发生。也就是说,借助于对形成分割槽后的大的基板进行分割,制作基板。这种场合,在被分割的基板的边缘形成很多裂缝,如果在基板的边缘上形成裂缝,则在以后的制造工序中会从这种裂缝发生基板的断裂。因此,借助于用喷砂除去裂缝,能抑制断裂的发生。
本发明的电子设备具有将本发明的在第一基板上安装电子元件的前述安装体安装在第二基板上的结构。因使用本发明的将电子元件牢固地安装在第一基板上的安装体,所以能实现可靠性好的电子设备。特别是,在安装体上安装的电子元件是包含IC的混合集成电路组成的功能电路的场合,因能用小的体积实现功能电路,所以也能进一步使电子设备小型化。
本发明的电子元件安装体的制造方法,包括至少在基板的1个面上形成导电图形的工序,至少对所述导电图形的连接面进行粗化的工序,用导电粘接剂将电子元件的电极连接到所述连接面上的工序。
本发明的电子元件安装体的的制造方法的1个实施形态,是在形成导电图形后,使导通检查用的导电橡胶体与这种导电图形的连接面接触进行导电图形的导通检查,然后,对连接面进行粗化。这种场合,因在粗化时除去导通检查时附着在连接面上的导电橡胶体的残存物,所以电极与接触面之间具有良好的电接触及机械接触的状态。
在本发明的安装体的制造方法中,最好利用厚膜印刷形成导电图形,利用喷砂使导电图形的连接面粗化。借助于利用喷砂法,能容易地进行粗化程度的控制,并能容易地得到所要的粗面。此外,最好利用干式腐蚀粗化连接面。这种场合,也能利用输出调整,容易地形成所要的粗面。
最好设置用玻璃膜覆盖连接面以外的部分的工序,并用与连接面粗化的同一工序粗化玻璃膜的表面。此外,还最好用与连接面粗化的同一工序粗化设置导电图形后的基板的面。此外,还最好用与形成导电图形的同一工序在基板的表面上形成位置检测标记,用与连接面粗化的同一工序粗化这种位置检测标记的表面。这样,借助于用与连接面粗化的同一工序进行所要的面粗化,能改善操作性。
最好在将电子元件的电极连接到导电图形的连接面上后,在电子元件和基板之间注入封装树脂。这种场合,因基板表面粗化,所以利用封装树脂能更牢固地将电子元件固定在基板上。
最好用与连接面粗化粗化同一工序进行边缘表面的粗化。利用这种边缘面的粗化,能抑制基板边缘的裂缝发生。
在本发明的制造方法中,借助于沿着分割用的槽分割具有这种分割用槽的大的基板,也可以制作基板。这种场合,能容易得到多个基板。
粗化工序最好采用这样的方法,即将多个基板集中沿直线配置在底板上形成基板集合体,用引导构件对这种基板集合体的长度方向的两侧部进行位置限制,在这样的的状态下,从喷嘴向基板喷吹研磨粉。采用这种方法能同时地进行多个基板的粗化。
另外,最好用粘贴带将所述基板粘贴在底板上,在这样的状态下,从喷嘴向所述基板喷吹研磨粉,采用这样的方法进行粗化。在这种方法中,不会因从喷嘴喷吹出的研磨粉而使基板在底板上摇动,其结果,能可靠地进行基板的导电图形的连接部和基板边缘部的粗化。此外,借助于粘贴带的宽度比基板的宽度小,因基板的边缘部为粘贴带的非连接面,所以利用来自喷嘴喷吹的研磨粉,这种边缘部更加容易地进行粗化。此外,在这种粗化后,从基板的粘贴带的非连接面部分能容易地从底板上取下基板。此外,借助于在长条状的粘贴带的长度方向上隔开规定的间隔粘贴多个基板,能同时进行多个基板的粗化,能进一步改善操作效率。而且,因在各基板之间隔开规定的间隔,所以各基板都能可靠地进行边缘部的粗化。
最好粘贴带的外径比基板的外径小,通过这种粘贴带将基板粘贴在底板上并进行粗化。由此,因基板的整个边缘形成粘贴带的非连接面,所以利用来自喷嘴喷吹的研磨粉,基板的整个边缘部分容易进行粗化。
最好隔开规定的间隔在底板上配置多个基板,在这种状态下从喷嘴将研磨粉喷吹到基板上并进行粗化。借助于的喷嘴扫描动作,大致均匀地粗化各基板。此外,因能够对于各基板从喷嘴喷吹足够的研磨粉,所以不稳定状态的导电图形在这种粗化时被除去,能事先避免以后出现的不良情况。此外,在这种方法中,最好对底板将喷嘴进行矩形波状扫描。这种场合,能用小的喷嘴进行更加均匀的基板的粗化。此外,借助于多次扫描喷嘴,能充分而且均匀地进行基板的粗化。此外,最好使喷嘴的第一次扫描轨迹与第二次扫描轨迹不同。由此,即使从喷嘴喷出的研磨粉的喷吹图形产生不均匀,也能更加容易地对配置在底板上的多个基板进行均匀的粗化。
在扫描喷嘴进行粗化的方法中,最好将喷嘴进行矩形波状往返扫描。利用这种往返扫描,能用小的喷嘴更加均匀地粗化配置在底板上的多个基板。此外,在这种往返扫描中,借助于喷嘴的扫描轨迹和回扫轨迹不同,即使从喷嘴喷出的图形产生不均匀也能进行均匀的基板的粗化。
在用喷嘴进行粗化工序中,最好使用具有比基板的宽度大的开口宽度的喷嘴。这种场合,因喷嘴的宽度比基板宽度大,所以能一次进行全面的粗化,并能得到更加均匀的粗面。此外,在利用喷嘴对底板上进行扫描后,最好使底板转动,再次利用喷嘴对底板上进行扫描。采用这种方法,则能改变扫描方向,再进行与已粗化的情况相同的粗化,能进行更加均匀的粗化。在其转动角度大致为90度的场合,因底板上的各基板能成为从相互正交的2个方向进行粗化的状态,所以能进行更加均匀的粗化。
在用喷嘴进行粗化工序中,最好在从喷嘴将直径大的研磨粉喷吹到基板上并进行粗化后,再将比这种大直径的研磨粉的直径小的研磨粉喷吹到基板上并进行粗化。这种情况下,借助于从喷嘴将大直径研磨粉喷吹到基板上,基板面进行粗化程度更严重,能事先分隔开不完全的导电图形,能事先防止以后出现的不良情况。然后再用直径小的研磨粉进行粗化,所以不会妨碍向基板上安装电子元件。
在用喷嘴进行粗化工序中,最好使底板反转并在其下面一侧配置基板,从设置在这种基板的下方的喷嘴向上面的基板喷吹研磨粉。这种情况下,因粗化后的研磨粉和研磨屑落在下方而难于残存在基板上,所以难于发生由于残存研磨粉屑而发生的连接面和电子元件的电极的连接不良。此外,即使例如研磨粉残存,但因其数量小,所以以后的这些残存物的除去工序也非常简单。
在用喷嘴进行粗化工序中,最好在利用研磨粉喷吹的粗化后,在基板的粗面部分喷吹气体。利用气体的喷吹,能喷吹掉基板上残存的研磨粉和研磨屑,能抑制基板上的残存物导致的连接不良。
在用喷嘴进行粗化工序中,最好在粗化后,在不含有氧的液体中对基板进行超声波清洗。因利用超声波清洗从基板上去除研磨粉和研磨屑,所以能防止由于这些残存物导致的连接不良。而且,因用不含有氧的液体进行超声波清洗,所以也不会发生由于连接面的氧化导致的连接不良。此外,作为在超声波清洗中使用的液体,最好是乙醇。借助于使用乙醇,不会产生导电图形的连接面的氧化,而且清洗后容易干燥。
在超声波清洗工序中,最好用直立的状态将多个所述基板装在容器内,每个容器将基板浸在液体中。利用这种方法,能一次进行多块基板的清洗,而且因基板是直立设置的,所以研磨粉和研磨屑落在基板下方,能得到高的清洗效果。此外,在这种清洗中,最好在容器内设置各基板的安放空间,并将基板安放在各安放空间内并能自由摇动。由此,因在超声波清洗时基板摇动,所以能进一步提高清洗效果。
在超声波清洗工序中,最好在从液体中取出基板后,向基板喷吹含氧量少的气体。利用喷吹这种气体,不仅能加速基板的干燥,而且能有效地去除再次附着在基板上的研磨粉和研磨屑。此外,因使用的气体含氧量少,所以能防止发生因连接面氧化导致的导通不良。此外,最好喷吹气体后的基板在与空气隔离的气氛中保管。由此,能防止保管中的导电图形连接面的氧化,并能防止后续工序中与电子元件的电极的连接不良。
下面,参照附图对本发明的理想的实施例进行说明。
实施例
图1-图3所示的电子元件安装体是通过下述的工序制作的。首先,如图3所示,准备好铝制基板1,在铝制基板1的必要的地方设有多个穿通孔2(图4及图6),并在这些穿通孔2内充填AgPd等的导电物质3(图14的工序A)。
接着,利用厚膜印刷分别在基板1的背面形成与导电物质3导通的圆形的导电图形4(图3)及在基板1的表面形成与导电物质3导通的线状的导电图形4(图3、图4)(图14的工序B)。导电图形4由AgPd糊剂或者Ag糊剂形成。此外,用与导电图形4同一的工序在基板1的对角线部分的两个地方也印刷形成位置检测标记9。然后,进行导电图形4的烧结(图14的工序C)。
接着,在基板1的表面的边缘上印刷框状的绝缘玻璃膜5(图3、图5),在内侧中心部分印刷四边形的绝缘玻璃膜5(图5),此外,在基板1的背面的大致整个面除去导电图形4的部分上印刷绝缘玻璃膜5(图3)(图14的工序D)。此外,绝缘玻璃膜5由晶化玻璃组成。借助于形成这种绝缘玻璃膜5,能防止湿气注入基板1,并能防止导电图形4发生移动。然后,用850℃对绝缘玻璃膜5进行烧结(图14的工序E)。
接着,为了进一步提高耐湿性,利用印刷形成由非晶化玻璃构成的外层涂敷膜6(图1-图3、图5)(图14的工序F)。并且,用600℃对外层涂敷膜6进行烧结(图14的工序G)。如图5所示,利用前述的工序,形成在表面在表面断续露出框状的导电图形4的连接面4a的基板1。
接着,分别将导电橡胶板(未图示)与这种基板1的表面接触,将导通检查用电极(未图示)与背面的圆形的导电图形4接触,进行导通检查(图14的工序H)。如图5所示,为了与后述的电子元件的电极连接,在基板1的表面上相隔很窄的间隔配置多个靠近很近的连接面4a。因此,分别将导通检查用电极与各自的连接面4a接触是非常困难的操作。因此,一方面在表面压住导电橡胶板并短路全部连接面4a,而另一方面,如图3所示,在背面设置通过导电物质3与连接面4a接近的圆形的导电图形4。如图6所示,这种圆形的导电图形4分散在基板1的整个面上,并且在相邻之间设置充分的距离。因此,能容易使导通检查用电极接触。借助于确认背面的两个导电图形间的导通状态,进行表面的连接面4a与背面的圆形的导电图形4之间的导通检查。在这种导通检查结束后,取下基板1的表面的导电橡胶板和背面的导通检查用电极。
接着,在基板1的表面上进行喷吹粒径5-7μm的SiC粉体的喷砂处理(图14的工序I)。这种处理具有后述的作用和效果。也就是说,在后道工序中在导通检查时压住的导电橡胶板的一部分附着在与作为电子元件的一例使用的IC7的突起电极7a连接的连接面4a上。因这种附着物基本上没有导电,所以在连接IC7时,在连接面4a和突起电极7a之间会产生导通不良。因此,必须去除附着物。如图8和图9所示,利用喷砂处理,粗化图7所示的喷砂处理前的导电图形4。这时,除去附着在连接面4a上的附着物,其结果,不会产生前述连接面4a和突起电极7a之间的导通不良。
这种粗化具有提高连接面4a和IC7的连接强度的效果。特别是,虽然IC7下面的突起电极7a极小,但因与其对应的导电图形4的连接面4a被粗化,所以利用由于粗化的连接面积的扩大和导电粘接剂8具有的粘接效果,突起电极7a牢固地连接到连接面4a。此外,因连接面4a被粗化,所以在IC7安装时,这种突起电极a也不会在连接面4a上横向滑动,由此,也能提高安装的可靠性。此外,连接面4a的粗面的情况从与导电粘接剂8的相容性来看,粗面的凹部的深度(波峰和谷底间的距离)在15μm以下为佳。导电粘接剂8的合适的膜厚为15μm。因此,在粗面的凹部的深度比15μm深的场合,因粘接剂8进入到凹部,所以有时突起电极7a和连接面4a连接强度不够。
利用厚膜印刷图形形成本实施形态的导电图形4。因此,借助于控制喷砂的研磨粉的材料、粒径、及对导电图形4的冲击速度等,能容易地将连接面4a做成所要的粗面。而且,不会有由于研磨使连接面4成为开孔状态、导致连接面积减少的问题,由此,如图9所示,即使在印刷时连接面4a的一部分、例如中央部分成为凸起的状态,利用喷砂也能使中央部分压下,并且整体上接近于平面。因此,IC7的突起电极与连接面4a容易连接。另外,如图9所示,如果在这种接近平面后进一步喷砂,则连接面4a的边缘就成为向外突出的形状。其结果,能使得连接面4a的面积扩大并提高与使用导电粘接剂8的突起电极7a的连接强度。
此外,如果仅仅是使厚膜印刷形成的连接面4a粗化,也可以利用干式腐蚀粗化该连接面4a。
利用喷砂处理,除了连接面4a,还能够对图3和图5所示的露出的导电图形4的表面、外层涂敷膜6的表面、配置连接面4a的基板1的露出部分和用与导电图形4同一工序形成的位置检测标记9进行粗化。借助于粗化这种位置检测标记9的表面,在IC7安装时进行基板1的光学式的位置检测的场合,这种位置检测标记9表面的反射减少。因此,能提高位置检测的精度,其结果,能准确地将IC7安装在基板1上。
在连接面4a上印刷导电粘接剂8后使突起电极7a与连接面4a接触,进行IC7的安装(图14的工序J)。然后,用50-120℃的温度使导电粘接剂干燥(图14的工序K)。
接着,在基板1和IC7之间注入图3所示的封装树脂10(图14的工序L)。并且,用120-150℃的温度使这种封装树脂硬化(图14的工序M)。在注入封装树脂时,利用喷砂处理如图10和图11所示粗化位于IC7下方的外层涂敷膜6(图5)的表面。利用这种粗化,具有帮助封装树脂10注入的毛细管现象,封装树脂10容易地注入IC7和基板1之间。注入的封装树脂10在接着的硬化工序中由于外层涂敷膜6的表面的粗化具有的粘接效果,将IC7牢固地连接在外层涂敷膜6上。此外,如图12和图13所示,利用喷砂使IC7外面的基板1的表面也进行粗化,利用粘接效果也能提高封装树脂10对于边缘部分的连接强度。
如前所述,在IC7的安装和利用封装树脂10的封装结束后,将如图3所示的焊料11涂敷在形成于基板1背面的圆形导电图形4的表面(图14的工序N)。最后,使检查用端子(未图示)与这种焊料11接触,进行安装体的检查(图14的工序0)。
下面,参照附图15-图16对喷砂工序进行说明。
首先,如图15所示,在金属制或者陶瓷制的底板12上用长条的两面粘接粘贴带13粘贴多个基板1。然后,如图16所示,在粘贴带13的长度方向上从喷嘴14向基板1喷吹研磨粉进行粗化。这样,借助于在底板12上粘贴基板1,基板1不会因从喷嘴14喷吹出的研磨粉,而在底板12上摇动。因此,能可靠地进行基板1上的导电图形4的连接面4a和基板1的边缘部的粗化。
图15及图16所示的各基板1,是将形成分割用槽的大基板1沿该槽分割而成。这样,利用大基板的分割能简单地制作多个基板1。但是,在用这种方法制作的基板1中,在分割时在其边缘部分常常发生裂缝。如果在边缘部分发生裂缝,则在后道制造工序中因在基板1上从这种裂缝发生断裂,所以在本实施形态中,利用来自喷嘴14喷吹的研磨粉,事先去除这种裂缝,由此能防止基板1发生断裂。此外,借助于与连接面4a的粗化同一工序进行这种基板1的边缘表面的粗化,能提高操作效率。
如图16所示,喷嘴14对底板12是进行矩形波状扫描。利用这种扫描方法,对于在底板12上多个配置的基板1,能用小的喷嘴14进行大致均匀的粗化。借助于使喷嘴14多次往返扫描,能进行更加均匀的粗化。借助于使喷嘴14的第一次扫描轨迹和第二次扫描轨迹不同,即使例如从喷嘴14吹出的研磨粉的吹出图形产生不均匀,对于配置在底板12上的多个基板1,也能进行均匀的粗化。
如图15所示,因两面粘接粘贴带13的宽度比各基板1的宽度小,所以在基板1的边缘部中,一对边1a成为非粘接面。因此,利用从喷嘴14喷吹的研磨粉,这种一对边1a的部分能容易地进行粗化。此外,在这种粗化后,从基板1的非连接面即边1a部分能容易地从底板12上取下基板1。在图15中,虽然可见在边1a之间,第1列的基板1和第2列的基板1、第2列的基板1和第3列的基板1、第3列的基板1和第4列的基板1分别连接,但是实际上在这些相邻的基板1的边1a之间,形成来自喷嘴14的研磨粉足以能通过的间隙。因此,能充分地进行各列的基板1的边1a部分的粗化。此外,为了有效地进行基板1的另外一对边1b部分的粗化。也可以在长条的两面粘接粘贴带13的长度方向上隔开规定的间隔,粘贴多个基板1。借助于在各基板1的边1b之间隔开的规定间隔,来自喷嘴14的研磨粉也能充分地到达边1b部分上,对于各基板都能可靠地进行边1b部分的粗化。
此外,即使这样在各基板1的边缘的边1a、1b部分之间设置间隙,因边1b的中央部分用两面粘接带连接在底板12上,所以这部分的粗化不会充分地进行。这种场合,也可以使粘贴带13的外径比基板1的外径小,通过这种粘贴带13将各基板1粘贴在底板12上。因此,在基板1的整个边缘(边1a、边1b)形成粘贴带13的非粘接面,利用从喷嘴14吹出的研磨粉能容易地粗化基板1的全部边缘部。
接着,对基板的粗化方法的其它理想的实施形态进行说明。其中之一的方法是,对底板12扫描喷嘴14后,使底板12大致转动90度,再次进行喷嘴14的扫描。借助于使底板12转动,例如基板1能从一个方向(X方向)和另外的方向(Y方向)进行粗化,得到相同的粗面状态,得到更加均匀的粗面。
喷嘴14的开口宽度比基板1的宽度大为佳。这种情况下,利用从喷嘴14吹出的研磨粉,因对于各基板每一次都遍及整个表面进行粗化,所以能得到更加均匀的粗面。
在从喷嘴14将大直径的研磨粉对基板1喷吹后,再将直径比这种大直径的研磨粉小的研磨粉对基板1喷吹为佳。这种情况下,借助于将大直径研磨粉对基板1喷吹,能够使基板1表面更粗化,或者事先断开不完全的导电图形4,能防止发生以后出现的不良情况。而且,借助于其后用小直径的研磨粉进行细粗化,在不会妨碍对基板1的电子元件的安装。
此外,在前述说明中,虽然对在底板12上用两面粘接粘贴带13粘贴基板1的情况进行了说明,但也可以如后所述,将各基板1固定在底板12上。也就是说,在底板12上直线配置多个基板1,形成基板集合体,并用引导构件对这种基板集合体的长度方向的两侧部进行位置限制。并且,在这种位置限制的状态下,从喷嘴14向基板1喷吹研磨粉,由此同时地进行多块基板1的粗化。
如图17所示,也可以从基板1的下方进行来自喷嘴14的研磨粉的喷吹。即如图17所示,使底板12反转并在其下面侧配置基板1,从设置在这种基板1的下方的喷嘴14向上方的基板1喷吹研磨粉。这种场合,粗化后的研磨粉和研磨屑落在下方,难于残存在基板1上。其结果,这些研磨粉和研磨屑不会残存在基板1上,能抑制由于这些残存物而发生的连接面4a和突起电极7a的连接不良情况。
最好在利用从喷嘴向基板1喷吹研磨粉的粗化后,向基板1的粗面部分喷吹含氧少的气体。借助于用这种气体从基板1上吹走粗化后的研磨粉和研磨屑,能抑制由于这些残存物而发生的连接面4a和突起电极7a的连接不良情况。
如图18所示,最好在利用喷砂处理的基板1的粗化后,用超声波来清洗基板1。在水槽15的底面下安装超声波振子16。在水槽15内设置网孔状的容器17,在这种容器17的各存放单元17a内存放有基板1,且能自由摇动。在水槽15中装满不含氧的液体、例如乙醇。这样,借助于超声波清净,能从基板1上除去研磨粉和研磨屑。而且,因用不含氧的液体进行超声波清洗,所以能抑制导电图形4的连接面4a的氧化,并能抑制由于这种氧化而发生与IC7的突起电极7a的连接不良。在使用乙醇的场合,因乙醇富于挥发性,所以清洗后容易干燥。
如图18所示,如果在容器17内直立多个基板1的状态下进行超声波清洗,则一次能进行多块基板1的清洗。而且,因基板1被直立设置,所以研磨粉和研磨屑就落在基板1的下方,能得到高的清洗效果。因在容器17的各存放空间17a存放的基板1能自由摇动,所以在超声波清洗时摇动基板1能进一步提高清洗效果。
最好再对清洗后的基板1喷吹含氧量少的气体。由此能快速地干燥基板1,并能抑制连接面4a的氧化。此外,基板1干燥后,最好在与空气隔离的气氛中保管基板1。这样,能防止保管中的连接面4a的较大的氧化,能防止后道工序中与IC7的突起电极7a的连接不良。
本发明不限于前述的实施形态,当然可以是种种的变形。例如在前述实施形态中,虽然示出了安装的半导体元件是半导体集成电路元件的情况,但电子元件也可以是由含有半导体集成电路元件的混合集成电路组成的电路元件等。因此,本发明的实质精神和范围内存在的变形例都包含在全部权利要求的范围之内。
Claims (40)
1一种电子元件安装体,其特征在于,包括至少在1个面上设置导电图形的基板和安装在设置所述导电图形的面上的电子元件,
所述电子元件在所述基板侧具有电极,
与所述电极相对的所述导电图形的连接面是粗面,
利用导电粘接剂将所述电极连接到所述连接面上,
用玻璃膜覆盖所述基板中除导电图形连接面以外的部分,所述玻璃膜的表面是粗面,所述玻璃膜的表面和所述电子元件底面之间用封装树脂封装。
2如权利要求1所述的电子元件安装体,其特征在于,
所述电子元件由半导体集成电路元件组成,
所述电极由突起电极组成。
3如权利要求1所述的电子元件安装体,其特征在于,
所述导电图形由厚膜印刷图形组成,
所述连接面是经过喷砂的粗面。
4如权利要求3所述的电子元件安装体,其特征在于,
所述连接面的边缘是向外突出的形状。
5如权利要求1所述的电子元件安装体,其特征在于,
所述导电图形由厚膜印刷图形组成,
所述连接面是经过干式腐蚀的粗面。
6如权利要求1所述的电子元件安装体,其特征在于,
在所述基板未形成所述玻璃膜的部分上配置位置检测标记,
所述位置检测标记的表面是粗面。
7如权利要求1所述的电子元件安装体,其特征在于,
在与设置所述导电图形的面的不同的所述基板的另一面上设置连接电极,通过在所述基板上形成的通孔,将所述连接电极连接到所述导电图形上,用玻璃膜覆盖所述另一面的所述连接电极以外的部分。
8如权利要求1所述的电子元件安装体,其特征在于,
所述基板的边缘面是经过喷砂的粗面。
9一种电子设备,其特征在于,包括具有至少在1个面上设置导电图形的第一基板和安装在设置所述导电图形的面上的电子元件的电子元件安装体,和安装所述电子元件安装体的第二基板,
所述电子元件在所述第一基板侧具有电极,
与所述电极相对的所述导电图形的连接面是粗面,
利用导电粘接剂将所述电极连接到所述连接面上,
用玻璃膜覆盖所述第一基板中除导电图形连接面以外的部分,所述玻璃膜的表面是粗面,所述玻璃膜的表面和所述电子元件底面之间用封装树脂封装。
10一种电子元件安装体的制造方法,其特征在于,包括:
至少在基板的1个面上形成导电图形的工序,
用玻璃膜覆盖所述基板中除导电图形连接面以外部分的工序,
对所述导电图形至少是连接面部分和所述玻璃膜表面进行粗化的工序,
用导电粘接剂将电子元件的电极连接到所述连接面上的工序,以及
所述电极连接工序后,将封装树脂注入所述电子元件和所述基板之间的工序。
11如权利要求10所述的电子元件安装体制造方法,其特征在于,还包括使导通检查用的导电橡胶体与所述导电图形的连接面接触进行所述导电图形的导通检查的工序,
所述导通检查工序在所述粗化工序前进行。
12如权利要求10所述的电子元件安装体制造方法,其特征在于,
利用厚膜印刷,形成所述导电图形,
利用喷砂,对所述连接面进行粗化。
13如权利要求10所述的电子元件安装体制造方法,其特征在于,
利用厚膜印刷,形成所述导电图形,
利用干式腐蚀法,对所述连接面进行粗化。
14如权利要求10所述的电子元件安装体制造方法,其特征在于,
用粗化所述连接面的同一工序,对设置所述导电图形的所述基板的面进行粗化。
15如权利要求10所述的电子元件安装体制造方法,其特征在于,
在所述基板的表面上形成位置检测标记,
用粗化所述连接面的同一工序,对所述位置检测标记的表面进行粗化。
16如权利要求10所述的电子元件安装体制造方法,其特征在于,
用粗化所述连接面的同一工序,对所述基板的边缘面进行粗化。
17如权利要求16所述的电子元件安装体制造方法,其特征在于,
在大的基板上形成分割用的槽,用所述槽进行分割,形成所述基板。
18如权利要求17所述的电子元件安装体制造方法,其特征在于,
在底板上直线配置所述多个基板形成基板集合体,
借助于在用引导构件对所述基板集合体的长度方向的两侧部进行位置限制的状态从喷嘴向所述基板喷吹研磨粉,进行粗化工序。
19如权利要求17所述的电子元件安装体制造方法,其特征在于,
借助于在用粘贴带将所述基板粘贴在底板上的状态从喷嘴向所述基板喷吹研磨粉,进行粗化工序。
20如权利要求19所述的电子元件安装体制造方法,其特征在于,
所述粘贴带的宽度比所述基板的宽度小。
21如权利要求20所述的电子元件安装体制造方法,其特征在于,
所述粘贴带是长条形状,在所述粘贴带的长度方向上隔开规定的间隔,粘贴多个所述基板。
22如权利要求19所述的电子元件安装体制造方法,其特征在于,
所述粘贴带的外径比所述基板的外径小。
23如权利要求19所述的电子元件安装体制造方法,其特征在于,
隔开规定的间隔,粘贴多个所述基板,用扫描的喷嘴进行粗化工序。
24如权利要求23所述的电子元件安装体制造方法,其特征在于,
使所述喷嘴在所述底板上按矩形波形状扫描。
25如权利要求24所述的电子元件安装体制造方法,其特征在于,
使所述喷嘴扫描多次。
26如权利要求25所述的电子元件安装体制造方法,其特征在于,
所述喷嘴的第1次扫描轨迹与第2次扫描轨迹不同。
27如权利要求24所述的电子元件安装体制造方法,其特征在于,
使所述喷嘴重复扫描。
28如权利要求27所述的电子元件安装体制造方法,其特征在于,
所述喷嘴的扫描轨迹与回扫轨迹不同。
29如权利要求18所述的电子元件安装体制造方法,其特征在于,
所述喷嘴的开口宽度比所述基板的宽度大。
30如权利要求18所述的电子元件安装体制造方法,其特征在于,
使所述喷嘴在所述底板上扫描后,旋转所述底板,并再次使所述喷嘴在所述底板上扫描。
31如权利要求30所述的电子元件安装体制造方法,其特征在于,
所述底板的旋转角度为90度。
32如权利要求18所述的电子元件安装体制造方法,其特征在于,
在由所述喷嘴将直径大的研磨粉向所述基板喷吹进行粗化后,将比大直径研磨粉的直径小的研磨粉向所述基板喷吹进行粗化。
33如权利要求18所述的电子元件安装体制造方法,其特征在于,
使所述底板反转并将所述基板配置在其下面一侧,从设置在所述基板的下方的所述喷嘴,将研磨粉向上方的所述基板喷吹。
34如权利要求18所述的电子元件安装体制造方法,其特征在于,还包括
在进行所述粗化工序后,将气体向所述基板的粗面部分喷吹的工序。
35如权利要求16所述的电子元件安装体制造方法,其特征在于,
在所述基板的粗化后,在不含有氧的液体中对所述基板进行超声波清洗。
36如权利要求35所述的电子元件安装体制造方法,其特征在于,
所述液体是乙醇。
37如权利要求36所述的电子元件安装体制造方法,其特征在于,
以直立的状态将多个所述基板放置在容器内,每个容器将所述基板浸在所述液体中。
38如权利要求37所述的电子元件安装体制造方法,其特征在于,
在所述容器中对于每个所述基板设置放置空间,并将所述基板放置在各放置空间中,且能自由摇动。
39如权利要求35所述的电子元件安装体制造方法,其特征在于,
在从所述液体取出所述基板后,将含氧量少的气体向所述基板喷吹。
40如权利要求39所述的电子元件安装体制造方法,其特征在于,
在与空气隔离的气氛中保管喷吹所述气体后的基板。
Applications Claiming Priority (6)
Application Number | Priority Date | Filing Date | Title |
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JP316767/97 | 1997-11-18 | ||
JP31676797 | 1997-11-18 | ||
JP316767/1997 | 1997-11-18 | ||
JP083365/1998 | 1998-03-30 | ||
JP10083365A JPH11214450A (ja) | 1997-11-18 | 1998-03-30 | 電子部品実装体とそれを用いた電子機器と電子部品実装体の製造方法 |
JP083365/98 | 1998-03-30 |
Publications (2)
Publication Number | Publication Date |
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CN1219100A CN1219100A (zh) | 1999-06-09 |
CN1189929C true CN1189929C (zh) | 2005-02-16 |
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CNB981226612A Expired - Fee Related CN1189929C (zh) | 1997-11-18 | 1998-11-18 | 电子元件安装体及其制造方法和使用它的电子设备 |
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US (1) | US6792677B1 (zh) |
EP (1) | EP0917191A3 (zh) |
JP (1) | JPH11214450A (zh) |
KR (1) | KR100325566B1 (zh) |
CN (1) | CN1189929C (zh) |
TW (1) | TW410532B (zh) |
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JP3339838B2 (ja) | 1999-06-07 | 2002-10-28 | ローム株式会社 | 半導体装置およびその製造方法 |
US7059512B2 (en) * | 2002-11-06 | 2006-06-13 | Ricoh Company, Ltd. | Solder alloy material layer composition, electroconductive and adhesive composition, flux material layer composition, solder ball transferring sheet, bump and bump forming process, and semiconductor device |
US20050048680A1 (en) * | 2003-08-29 | 2005-03-03 | Texas Instruments Incorporated | Printing one or more electrically conductive bonding lines to provide electrical conductivity in a circuit |
JP4427374B2 (ja) * | 2004-04-05 | 2010-03-03 | アルプス電気株式会社 | プリント配線基板およびこの製造方法 |
DE102004036905A1 (de) * | 2004-07-29 | 2006-03-23 | Infineon Technologies Ag | Vertikales Leistungshalbleiterbauteil mit einem Halbleiterchip und Verfahren zur Herstellung desselben |
JP4729963B2 (ja) * | 2005-04-15 | 2011-07-20 | パナソニック株式会社 | 電子部品接続用突起電極とそれを用いた電子部品実装体およびそれらの製造方法 |
KR100722647B1 (ko) | 2005-06-25 | 2007-05-28 | 삼성전기주식회사 | 몰딩된 전자부품 패키지를 내장한 기판의 제조방법 |
US7691675B2 (en) * | 2005-10-24 | 2010-04-06 | Hewlett-Packard Development Company, L.P. | Encapsulating electrical connections |
JP2013539908A (ja) * | 2010-09-13 | 2013-10-28 | ピーエスティ・センサーズ・(プロプライエタリー)・リミテッド | ディスクリート電子部品の組立およびパッケージング方法 |
JP5864954B2 (ja) * | 2011-08-26 | 2016-02-17 | 新光電気工業株式会社 | 基材 |
JP2013232483A (ja) * | 2012-04-27 | 2013-11-14 | Koito Mfg Co Ltd | 回路基板及び回路基板の製造方法 |
JP6194423B2 (ja) * | 2013-09-27 | 2017-09-06 | エルジー・ケム・リミテッド | 固体酸化物燃料電池の燃料極支持体の製造方法 |
CN104655561A (zh) * | 2014-12-31 | 2015-05-27 | 东莞美维电路有限公司 | 金手指镀层剥离检测方法 |
CN107263972A (zh) | 2016-04-08 | 2017-10-20 | 优尔材料工业(深圳)有限公司 | 无机非金属与塑料的复合体及其制备方法 |
DE102016224909B4 (de) * | 2016-12-14 | 2024-08-14 | Vitesco Technologies Germany Gmbh | Verfahren zur Herstellung einer Leiterplatte mit porösen oder rauen Zinnoberflächen |
JP2018116037A (ja) * | 2017-01-13 | 2018-07-26 | 株式会社エンプラス | マーカ搭載用ユニットおよびその製造方法 |
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US3762040A (en) * | 1971-10-06 | 1973-10-02 | Western Electric Co | Method of forming circuit crossovers |
DE3608010A1 (de) * | 1986-03-11 | 1987-09-17 | Philips Patentverwaltung | Verfahren zum herstellen einer elektrisch leitenden klebverbindung |
US4767049A (en) * | 1986-05-19 | 1988-08-30 | Olin Corporation | Special surfaces for wire bonding |
JPH01166956A (ja) * | 1987-12-24 | 1989-06-30 | Shin Kobe Electric Mach Co Ltd | 金属ベース金属箔張積層板の製造法 |
US4937653A (en) * | 1988-07-21 | 1990-06-26 | American Telephone And Telegraph Company | Semiconductor integrated circuit chip-to-chip interconnection scheme |
JPH02308597A (ja) * | 1989-05-24 | 1990-12-21 | Asahi Chem Ind Co Ltd | 精細回路を有するセラミック基板の製法 |
JPH0318826A (ja) * | 1989-06-15 | 1991-01-28 | Matsushita Electric Ind Co Ltd | 液晶表示素子 |
GB2265224B (en) * | 1992-03-20 | 1996-04-10 | Centalic Tech Dev Ltd | Testing apparatus |
US5816478A (en) * | 1995-06-05 | 1998-10-06 | Motorola, Inc. | Fluxless flip-chip bond and a method for making |
DE19622684A1 (de) * | 1996-06-05 | 1997-12-11 | Siemens Ag | Verfahren zur Herstellung mechanisch fester Klebstoffverbindungen zwischen Oberflächen |
JPH10112479A (ja) * | 1996-10-07 | 1998-04-28 | Fuji Xerox Co Ltd | 基板の接続方法 |
-
1998
- 1998-03-30 JP JP10083365A patent/JPH11214450A/ja active Pending
- 1998-10-20 TW TW087117312A patent/TW410532B/zh not_active IP Right Cessation
- 1998-11-17 EP EP98121864A patent/EP0917191A3/en not_active Withdrawn
- 1998-11-18 KR KR1019980049365A patent/KR100325566B1/ko not_active IP Right Cessation
- 1998-11-18 CN CNB981226612A patent/CN1189929C/zh not_active Expired - Fee Related
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US6792677B1 (en) | 2004-09-21 |
CN1219100A (zh) | 1999-06-09 |
JPH11214450A (ja) | 1999-08-06 |
KR19990045360A (ko) | 1999-06-25 |
KR100325566B1 (ko) | 2002-04-17 |
EP0917191A2 (en) | 1999-05-19 |
TW410532B (en) | 2000-11-01 |
EP0917191A3 (en) | 2000-05-24 |
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