CN115916420A - 旋涂装置 - Google Patents
旋涂装置 Download PDFInfo
- Publication number
- CN115916420A CN115916420A CN202080102432.7A CN202080102432A CN115916420A CN 115916420 A CN115916420 A CN 115916420A CN 202080102432 A CN202080102432 A CN 202080102432A CN 115916420 A CN115916420 A CN 115916420A
- Authority
- CN
- China
- Prior art keywords
- spin coating
- film
- thickness
- film thickness
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/02—Apparatus for spreading or distributing liquids or other fluent materials already applied to a surface ; Controlling means therefor; Control of the thickness of a coating by spreading or distributing liquids or other fluent materials already applied to the coated surface
- B05C11/08—Spreading liquid or other fluent material by manipulating the work, e.g. tilting
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C—APPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05C11/00—Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
- B05C11/10—Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
- B05C11/1002—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves
- B05C11/1005—Means for controlling supply, i.e. flow or pressure, of liquid or other fluent material to the applying apparatus, e.g. valves responsive to condition of liquid or other fluent material already applied to the surface, e.g. coating thickness, weight or pattern
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/40—Distributing applied liquids or other fluent materials by members moving relatively to surface
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/04—Apparatus for manufacture or treatment
- H10P72/0448—Apparatus for applying a liquid, a resin, an ink or the like
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P72/00—Handling or holding of wafers, substrates or devices during manufacture or treatment thereof
- H10P72/06—Apparatus for monitoring, sorting, marking, testing or measuring
- H10P72/0604—Process monitoring, e.g. flow or thickness monitoring
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/002—Processes for applying liquids or other fluent materials the substrate being rotated
- B05D1/005—Spin coating
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P74/00—Testing or measuring during manufacture or treatment of wafers, substrates or devices
- H10P74/20—Testing or measuring during manufacture or treatment of wafers, substrates or devices characterised by the properties tested or measured, e.g. structural or electrical properties
- H10P74/203—Structural properties, e.g. testing or measuring thicknesses, line widths, warpage, bond strengths or physical defects
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Coating Apparatus (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2020/025336 WO2021260943A1 (ja) | 2020-06-26 | 2020-06-26 | スピンコーティング装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115916420A true CN115916420A (zh) | 2023-04-04 |
Family
ID=79282127
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202080102432.7A Pending CN115916420A (zh) | 2020-06-26 | 2020-06-26 | 旋涂装置 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20230266669A1 (https=) |
| EP (1) | EP4173725A4 (https=) |
| JP (1) | JPWO2021260943A1 (https=) |
| KR (1) | KR20230025525A (https=) |
| CN (1) | CN115916420A (https=) |
| WO (1) | WO2021260943A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117637545B (zh) * | 2023-11-30 | 2024-08-23 | 重庆大学 | 一种实验室用半自动化钙钛矿太阳能电池制备方法及其制备系统 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02142113A (ja) * | 1988-11-22 | 1990-05-31 | Kawasaki Steel Corp | レジスト塗布装置 |
| JPH02229577A (ja) * | 1989-03-02 | 1990-09-12 | Mitsubishi Electric Corp | 塗布装置 |
| JPH08236430A (ja) * | 1995-02-27 | 1996-09-13 | Risotetsuku Japan Kk | 膜厚制御方法および装置 |
| JP2000005687A (ja) * | 1998-04-20 | 2000-01-11 | Tokyo Electron Ltd | 塗布膜形成装置及びその方法並びにパタ―ン形成方法 |
| CN1680045A (zh) * | 2004-01-26 | 2005-10-12 | 新Sti科技株式会社 | 单张涂膜形成装置及单张涂膜形成方法 |
Family Cites Families (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01278021A (ja) * | 1988-04-29 | 1989-11-08 | Nec Corp | レジストの塗布装置 |
| JPH0265225A (ja) * | 1988-08-31 | 1990-03-05 | General Signal Japan Kk | フォトレジストの塗布方法 |
| JPH02233176A (ja) * | 1989-03-06 | 1990-09-14 | Mitsubishi Electric Corp | 塗布装置 |
| JPH10328614A (ja) * | 1997-05-30 | 1998-12-15 | Mitsubishi Chem Corp | 着色レジストの塗布方法 |
| JP2006030070A (ja) * | 2004-07-20 | 2006-02-02 | Opto One Kk | 膜厚検査装置 |
| JP2006231262A (ja) | 2005-02-28 | 2006-09-07 | Fuji Photo Film Co Ltd | スピンコート製膜法 |
| JP4748192B2 (ja) | 2008-08-07 | 2011-08-17 | 東京エレクトロン株式会社 | 塗布装置、塗布方法、塗布、現像装置及び記憶媒体 |
| JP2012256780A (ja) | 2011-06-10 | 2012-12-27 | Fuji Electric Co Ltd | スピンコート法によるレジスト塗布方法 |
| JP5796555B2 (ja) | 2012-07-13 | 2015-10-21 | トヨタ自動車株式会社 | スピンコート装置 |
| JP6454121B2 (ja) | 2014-10-07 | 2019-01-16 | 積水化学工業株式会社 | スピンコート用シャーレ |
| JP2018202318A (ja) | 2017-06-02 | 2018-12-27 | キヤノン株式会社 | スピンコータ装置、スピンコート方法、ドライフィルムレジストの製造方法および液体吐出ヘッドの製造方法 |
-
2020
- 2020-06-26 CN CN202080102432.7A patent/CN115916420A/zh active Pending
- 2020-06-26 WO PCT/JP2020/025336 patent/WO2021260943A1/ja not_active Ceased
- 2020-06-26 JP JP2022532225A patent/JPWO2021260943A1/ja active Pending
- 2020-06-26 KR KR1020237002125A patent/KR20230025525A/ko not_active Ceased
- 2020-06-26 US US18/012,942 patent/US20230266669A1/en not_active Abandoned
- 2020-06-26 EP EP20942288.0A patent/EP4173725A4/en not_active Withdrawn
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH02142113A (ja) * | 1988-11-22 | 1990-05-31 | Kawasaki Steel Corp | レジスト塗布装置 |
| JPH02229577A (ja) * | 1989-03-02 | 1990-09-12 | Mitsubishi Electric Corp | 塗布装置 |
| JPH08236430A (ja) * | 1995-02-27 | 1996-09-13 | Risotetsuku Japan Kk | 膜厚制御方法および装置 |
| JP2000005687A (ja) * | 1998-04-20 | 2000-01-11 | Tokyo Electron Ltd | 塗布膜形成装置及びその方法並びにパタ―ン形成方法 |
| CN1680045A (zh) * | 2004-01-26 | 2005-10-12 | 新Sti科技株式会社 | 单张涂膜形成装置及单张涂膜形成方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2021260943A1 (https=) | 2021-12-30 |
| KR20230025525A (ko) | 2023-02-21 |
| US20230266669A1 (en) | 2023-08-24 |
| EP4173725A4 (en) | 2024-04-24 |
| EP4173725A1 (en) | 2023-05-03 |
| WO2021260943A1 (ja) | 2021-12-30 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR20020095453A (ko) | 균일한 두께를 위한 도포장치와 막두께 제어방법 | |
| US8747608B2 (en) | Plasma processing apparatus | |
| JP6522915B2 (ja) | 基板上の液体成分の測定方法および基板処理装置 | |
| US5409538A (en) | Controlling method of forming thin film, system for said controlling method, exposure method and system for said exposure method | |
| CN105181135B (zh) | 一种适用于纺织品高光谱图像采集及数码测色的光照系统和使用方法 | |
| JP2018091836A (ja) | 半導体処理システム内の光信号の校正のためのシステムおよび方法 | |
| KR20000011356A (ko) | 가열장치,가열장치의평가법및패턴형성방법 | |
| US5618461A (en) | Reflectance method for accurate process calibration in semiconductor wafer heat treatment | |
| TW202205470A (zh) | 基板處理監控 | |
| CN115916420A (zh) | 旋涂装置 | |
| CN109585338A (zh) | 衬底处理方法及衬底处理设备 | |
| JP2020118698A (ja) | 基板上の液体成分の測定方法および基板処理装置 | |
| JP2010138463A (ja) | 光学薄膜製造方法 | |
| KR101547318B1 (ko) | 기판 처리 장치 및 처리 방법과 이를 이용한 레이저 열처리 장치 및 레이저 열처리 방법 | |
| JPWO2015004755A1 (ja) | 光学式膜厚計,薄膜形成装置及び膜厚測定方法 | |
| TW202400986A (zh) | 成膜控制裝置、成膜裝置及成膜方法 | |
| JP4943716B2 (ja) | プラズマ処理装置 | |
| JP3960633B2 (ja) | 膜厚制御方法および装置 | |
| US20190030550A1 (en) | Substrate processing apparatus and substrate processing method | |
| JP2006128572A (ja) | 露光条件補正方法、基板処理装置およびコンピュータプログラム | |
| JPWO2021260943A5 (https=) | ||
| JP7854282B2 (ja) | 制御パラメータ設定方法、基板処理装置、及び記憶媒体 | |
| JPH08338709A (ja) | 薄膜の厚さ測定方法および測定装置ならびに光学フィルターの製造方法 | |
| JP3878745B2 (ja) | 半導体製造条件設定方法、、半導体製造条件設定装置、この装置を用いた半導体製造装置、及び条件設定方法 | |
| JPH10206238A (ja) | 塗膜焼き付け温度の測定方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination |