CN114729800B - 表面检查装置及形状矫正装置以及表面检查方法及形状矫正方法 - Google Patents
表面检查装置及形状矫正装置以及表面检查方法及形状矫正方法 Download PDFInfo
- Publication number
- CN114729800B CN114729800B CN202080077780.3A CN202080077780A CN114729800B CN 114729800 B CN114729800 B CN 114729800B CN 202080077780 A CN202080077780 A CN 202080077780A CN 114729800 B CN114729800 B CN 114729800B
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- shape
- predetermined
- surface inspection
- deformation amount
- point
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
- G01B5/30—Measuring arrangements characterised by the use of mechanical techniques for measuring the deformation in a solid, e.g. mechanical strain gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
- G01B11/306—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces for measuring evenness
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/16—Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2019-216161 | 2019-11-29 | ||
| JP2019216161A JP7257942B2 (ja) | 2019-11-29 | 2019-11-29 | 表面検査装置および形状矯正装置、並びに表面検査方法および形状矯正方法 |
| PCT/JP2020/043332 WO2021106767A1 (ja) | 2019-11-29 | 2020-11-20 | 表面検査装置および形状矯正装置、並びに表面検査方法および形状矯正方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN114729800A CN114729800A (zh) | 2022-07-08 |
| CN114729800B true CN114729800B (zh) | 2024-01-09 |
Family
ID=76088751
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202080077780.3A Active CN114729800B (zh) | 2019-11-29 | 2020-11-20 | 表面检查装置及形状矫正装置以及表面检查方法及形状矫正方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12215971B2 (https=) |
| JP (1) | JP7257942B2 (https=) |
| CN (1) | CN114729800B (https=) |
| WO (1) | WO2021106767A1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7618472B2 (ja) * | 2020-03-31 | 2025-01-21 | 株式会社ユーシン精機 | 金型及びアタッチメントの法線ベクトルの推定方法及びシステム |
| WO2023050395A1 (zh) * | 2021-09-30 | 2023-04-06 | 富鼎电子科技(嘉善)有限公司 | 金属产品整形方法及电子装置 |
| JP7849275B2 (ja) * | 2022-11-09 | 2026-04-21 | 株式会社日立製作所 | 生産計画ロジック分析方法および生産計画ロジック分析装置 |
| CN119687766B (zh) * | 2024-12-31 | 2026-02-10 | 江西飞尚科技有限公司 | 一种测量光电挠度仪的测试工装及其测量方法 |
Citations (6)
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|---|---|---|---|---|
| US4995716A (en) * | 1989-03-09 | 1991-02-26 | Par Technology Corporation | Method and apparatus for obtaining the topography of an object |
| JPH0914931A (ja) * | 1995-06-27 | 1997-01-17 | Matsushita Electric Works Ltd | 光学式変位測定装置 |
| JP2000008946A (ja) * | 1998-06-23 | 2000-01-11 | Toyota Motor Corp | 内燃機関のピストン |
| CN1609552A (zh) * | 2003-10-20 | 2005-04-27 | 株式会社三丰 | 工件曲面的测量方法及其程序和介质 |
| CN1752744A (zh) * | 2004-09-21 | 2006-03-29 | 日本特殊陶业株式会社 | 配线基板的检查方法、制造方法和检查装置 |
| CN104024793A (zh) * | 2011-10-24 | 2014-09-03 | 株式会社日立制作所 | 形状检查方法及其装置 |
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|---|---|---|---|---|
| US5046852A (en) * | 1988-09-16 | 1991-09-10 | The Boeing Company | Method and apparatus for bending an elongate workpiece |
| JPH04176543A (ja) | 1990-11-08 | 1992-06-24 | Fanuc Ltd | デジタイジング制御装置 |
| JP3344649B2 (ja) * | 1998-08-19 | 2002-11-11 | 理化学研究所 | 自由曲面の形状誤差評価方法 |
| WO2001088471A1 (de) * | 2000-05-16 | 2001-11-22 | Steinbichler Optotechnik Gmbh | Verfahren und vorrichtung zum bestimmen der 3d-form eines objektes |
| EP2192380A3 (de) * | 2004-05-26 | 2010-06-23 | Werth Messtechnik GmbH | Verfahren zum Messen eines Objektes mit einem Koordinatenmessgerät sowie Koordinatenmessgerät |
| JP4615951B2 (ja) * | 2004-09-30 | 2011-01-19 | 株式会社日立製作所 | 形状モデル作成方法、および構造最適化システム |
| DE102007021809A1 (de) * | 2007-04-20 | 2008-10-23 | Werth Messtechnik Gmbh | Verfahren und Vorrichtung zum dimensionellen Messen mit Koordinatenmessgeräten |
| WO2009130169A1 (de) * | 2008-04-22 | 2009-10-29 | Leica Geosystems Ag | Messverfahren für eine gliederarm-koordinatenmessmaschine |
| JP4968600B1 (ja) * | 2011-01-13 | 2012-07-04 | 株式会社東京精密 | 真円度測定装置及びその心ずれ量補正方法 |
| ES2769304T3 (es) * | 2012-04-05 | 2020-06-25 | Fidia Spa | Dispositivo para corrección de errores para máquinas CNC |
| JP6124570B2 (ja) * | 2012-11-30 | 2017-05-10 | 株式会社ミツトヨ | Xyz直交測定装置 |
| JP5747180B2 (ja) | 2012-12-06 | 2015-07-08 | パナソニックIpマネジメント株式会社 | 形状測定方法および形状測定装置 |
| JP2014126381A (ja) | 2012-12-25 | 2014-07-07 | Nikon Corp | 形状測定装置、構造物製造システム、形状測定方法、構造物製造方法、及び形状測定プログラム |
| JP2014169947A (ja) * | 2013-03-05 | 2014-09-18 | Hitachi Ltd | 形状検査方法およびその装置 |
| JP5923054B2 (ja) * | 2013-04-08 | 2016-05-24 | 株式会社神戸製鋼所 | 形状検査装置 |
| CN106030237A (zh) * | 2013-12-06 | 2016-10-12 | 沃思测量技术股份有限公司 | 用于测量工件的装置和方法 |
| JP2015141139A (ja) * | 2014-01-29 | 2015-08-03 | 株式会社ミツトヨ | 手動測定装置 |
| EP2916099B1 (en) * | 2014-03-07 | 2020-09-30 | Hexagon Technology Center GmbH | Articulated arm coordinate measuring machine |
| EP2930462B1 (en) * | 2014-04-08 | 2017-09-13 | Hexagon Technology Center GmbH | Method for generating information about a sensor chain of a coordinate measuring machine (CMM) |
| JP6316663B2 (ja) * | 2014-05-30 | 2018-04-25 | 株式会社キーエンス | 座標測定装置 |
| DE102015205738A1 (de) * | 2015-03-30 | 2016-10-06 | Carl Zeiss Industrielle Messtechnik Gmbh | Bewegungsmesssystem einer Maschine und Verfahren zum Betreiben des Bewegungsmesssystems |
| EP3104118B1 (en) * | 2015-06-12 | 2019-02-27 | Hexagon Technology Center GmbH | Method to control a drive mechanism of an automated machine having a camera |
| EP3315896B1 (en) * | 2015-08-27 | 2020-03-04 | Tokyo Seimitsu Co., Ltd. | Surface shape measuring device and method |
| DE102016100308A1 (de) * | 2016-01-11 | 2017-07-13 | Datron Ag | Verfahren zur Bestimmung von einer Referenzkoordinate eines Werkstücks und Bearbeitungsmaschine |
| EP3203179B1 (en) * | 2016-02-05 | 2019-04-03 | Hexagon Technology Center GmbH | Measuring machine based on a delta robot assembly |
| JP6691837B2 (ja) * | 2016-06-27 | 2020-05-13 | 株式会社キーエンス | 測定装置 |
| JP7183790B2 (ja) * | 2016-09-14 | 2022-12-06 | 日本電気株式会社 | システムの分析支援装置、システムの分析支援方法及びプログラム |
| JP2018072202A (ja) * | 2016-10-31 | 2018-05-10 | 株式会社東京精密 | 形状測定装置及び形状測定方法 |
| DE102016124549B4 (de) * | 2016-12-15 | 2019-11-07 | Carl Zeiss Industrielle Messtechnik Gmbh | Messsystem |
| WO2019075165A1 (en) * | 2017-10-11 | 2019-04-18 | Board Of Regents, The University Of Texas System | METHOD AND SYSTEM FOR OPTICALLY DETECTING AND CHARACTERIZING DEFECTS IN SEMICONDUCTORS |
| JP2019113329A (ja) * | 2017-12-21 | 2019-07-11 | 株式会社ニューフレアテクノロジー | 変位計測装置及び電子ビーム検査装置 |
| JP7143567B2 (ja) * | 2018-09-14 | 2022-09-29 | 株式会社島津テクノリサーチ | 材料試験機および放射線ct装置 |
| WO2020157973A1 (ja) * | 2019-02-01 | 2020-08-06 | 日本電気株式会社 | 画像処理装置 |
| US11150189B1 (en) * | 2019-09-03 | 2021-10-19 | Innolux Corporation | Methods of manufacturing a light source carrier and an electronic device, and a light source qualification method |
| DE102020111509B4 (de) * | 2020-04-28 | 2023-04-20 | Carl Zeiss Industrielle Messtechnik Gmbh | Koordinatenmessgerät sowie Verfahren zum Messen von Koordinaten eines Werkstücks |
-
2019
- 2019-11-29 JP JP2019216161A patent/JP7257942B2/ja active Active
-
2020
- 2020-11-20 US US17/778,331 patent/US12215971B2/en active Active
- 2020-11-20 WO PCT/JP2020/043332 patent/WO2021106767A1/ja not_active Ceased
- 2020-11-20 CN CN202080077780.3A patent/CN114729800B/zh active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4995716A (en) * | 1989-03-09 | 1991-02-26 | Par Technology Corporation | Method and apparatus for obtaining the topography of an object |
| JPH0914931A (ja) * | 1995-06-27 | 1997-01-17 | Matsushita Electric Works Ltd | 光学式変位測定装置 |
| JP2000008946A (ja) * | 1998-06-23 | 2000-01-11 | Toyota Motor Corp | 内燃機関のピストン |
| CN1609552A (zh) * | 2003-10-20 | 2005-04-27 | 株式会社三丰 | 工件曲面的测量方法及其程序和介质 |
| CN1752744A (zh) * | 2004-09-21 | 2006-03-29 | 日本特殊陶业株式会社 | 配线基板的检查方法、制造方法和检查装置 |
| CN104024793A (zh) * | 2011-10-24 | 2014-09-03 | 株式会社日立制作所 | 形状检查方法及其装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7257942B2 (ja) | 2023-04-14 |
| US20220390222A1 (en) | 2022-12-08 |
| WO2021106767A1 (ja) | 2021-06-03 |
| CN114729800A (zh) | 2022-07-08 |
| US12215971B2 (en) | 2025-02-04 |
| JP2021085807A (ja) | 2021-06-03 |
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