CN110233121B - 接合装置 - Google Patents
接合装置 Download PDFInfo
- Publication number
- CN110233121B CN110233121B CN201910163642.6A CN201910163642A CN110233121B CN 110233121 B CN110233121 B CN 110233121B CN 201910163642 A CN201910163642 A CN 201910163642A CN 110233121 B CN110233121 B CN 110233121B
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- Prior art keywords
- chip
- bonding
- cleaning
- unit
- substrate
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- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Wire Bonding (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018040056A JP7129793B2 (ja) | 2018-03-06 | 2018-03-06 | 接合装置 |
| JP2018-040056 | 2018-03-06 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110233121A CN110233121A (zh) | 2019-09-13 |
| CN110233121B true CN110233121B (zh) | 2023-04-07 |
Family
ID=67843465
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910163642.6A Expired - Fee Related CN110233121B (zh) | 2018-03-06 | 2019-03-05 | 接合装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US11145618B2 (enExample) |
| JP (1) | JP7129793B2 (enExample) |
| CN (1) | CN110233121B (enExample) |
| TW (1) | TWI727271B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11205633B2 (en) * | 2019-01-09 | 2021-12-21 | Kulicke And Soffa Industries, Inc. | Methods of bonding of semiconductor elements to substrates, and related bonding systems |
| TWI797461B (zh) * | 2019-07-26 | 2023-04-01 | 日商新川股份有限公司 | 封裝裝置 |
| US11935771B2 (en) * | 2021-02-17 | 2024-03-19 | Applied Materials, Inc. | Modular mainframe layout for supporting multiple semiconductor process modules or chambers |
| US11935770B2 (en) | 2021-02-17 | 2024-03-19 | Applied Materials, Inc. | Modular mainframe layout for supporting multiple semiconductor process modules or chambers |
| JP2023068932A (ja) * | 2021-11-04 | 2023-05-18 | 信越ポリマー株式会社 | 粘着性保持治具の洗浄方法 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1685491A (zh) * | 2002-09-26 | 2005-10-19 | 东丽工程株式会社 | 接合装置 |
| JP2006086418A (ja) * | 2004-09-17 | 2006-03-30 | Matsushita Electric Ind Co Ltd | ボンディング装置及び方法、並びに電子部品洗浄装置 |
| JP2006310442A (ja) * | 2005-04-27 | 2006-11-09 | Matsushita Electric Ind Co Ltd | ボンディング装置及び方法 |
| CN1938845A (zh) * | 2004-03-26 | 2007-03-28 | 富士胶片株式会社 | 接合衬底的装置及方法 |
| CN101447400A (zh) * | 2007-11-30 | 2009-06-03 | 台湾积体电路制造股份有限公司 | 芯片-晶圆接合装置及接合的方法 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW353137B (en) * | 1996-03-28 | 1999-02-21 | Matsushita Electric Industrial Co Ltd | Manufacturing apparatus with cleaning mechanism and cleaning method |
| JP2002252251A (ja) * | 2001-02-22 | 2002-09-06 | Sony Corp | 半導体チップの実装装置及び実装方法 |
| CN101542705B (zh) | 2006-11-28 | 2011-10-12 | 松下电器产业株式会社 | 电子部件安装结构体及其制造方法 |
| JP4896899B2 (ja) | 2007-01-31 | 2012-03-14 | 東京エレクトロン株式会社 | 基板処理装置およびパーティクル付着防止方法 |
| JP5478565B2 (ja) * | 2011-07-15 | 2014-04-23 | 東京エレクトロン株式会社 | 接合システム |
| JP6337400B2 (ja) | 2012-04-24 | 2018-06-06 | 須賀 唯知 | チップオンウエハ接合方法及び接合装置並びにチップとウエハとを含む構造体 |
| TW201515160A (zh) * | 2013-08-14 | 2015-04-16 | 豪銳恩科技私人有限公司 | 接合複數個半導體晶片到基板之設備與方法 |
| JP6367672B2 (ja) * | 2014-09-29 | 2018-08-01 | ファスフォードテクノロジ株式会社 | 半導体若しくは電子部品実装装置及び半導体若しくは電子部品実装方法 |
| JP6573289B2 (ja) * | 2016-01-06 | 2019-09-11 | ヤマハモーターロボティクスホールディングス株式会社 | 電子部品実装装置 |
| JP6389988B2 (ja) * | 2016-06-14 | 2018-09-19 | 株式会社新川 | 異物除去装置 |
-
2018
- 2018-03-06 JP JP2018040056A patent/JP7129793B2/ja active Active
-
2019
- 2019-02-27 TW TW108106928A patent/TWI727271B/zh not_active IP Right Cessation
- 2019-03-05 CN CN201910163642.6A patent/CN110233121B/zh not_active Expired - Fee Related
- 2019-03-06 US US16/294,167 patent/US11145618B2/en not_active Expired - Fee Related
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1685491A (zh) * | 2002-09-26 | 2005-10-19 | 东丽工程株式会社 | 接合装置 |
| CN1938845A (zh) * | 2004-03-26 | 2007-03-28 | 富士胶片株式会社 | 接合衬底的装置及方法 |
| JP2006086418A (ja) * | 2004-09-17 | 2006-03-30 | Matsushita Electric Ind Co Ltd | ボンディング装置及び方法、並びに電子部品洗浄装置 |
| JP2006310442A (ja) * | 2005-04-27 | 2006-11-09 | Matsushita Electric Ind Co Ltd | ボンディング装置及び方法 |
| CN101447400A (zh) * | 2007-11-30 | 2009-06-03 | 台湾积体电路制造股份有限公司 | 芯片-晶圆接合装置及接合的方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI727271B (zh) | 2021-05-11 |
| TW201939629A (zh) | 2019-10-01 |
| CN110233121A (zh) | 2019-09-13 |
| JP2019153761A (ja) | 2019-09-12 |
| JP7129793B2 (ja) | 2022-09-02 |
| US11145618B2 (en) | 2021-10-12 |
| US20190279956A1 (en) | 2019-09-12 |
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