CN109935256A - 半导体存储装置 - Google Patents
半导体存储装置 Download PDFInfo
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- CN109935256A CN109935256A CN201810846136.2A CN201810846136A CN109935256A CN 109935256 A CN109935256 A CN 109935256A CN 201810846136 A CN201810846136 A CN 201810846136A CN 109935256 A CN109935256 A CN 109935256A
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/10—Programming or data input circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/08—Address circuits; Decoders; Word-line control circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
- H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
- H01L29/10—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
- H01L29/1025—Channel region of field-effect devices
- H01L29/1029—Channel region of field-effect devices of field-effect transistors
- H01L29/1033—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure
- H01L29/1037—Channel region of field-effect devices of field-effect transistors with insulated gate, e.g. characterised by the length, the width, the geometric contour or the doping structure and non-planar channel
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0466—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells with charge storage in an insulating layer, e.g. metal-nitride-oxide-silicon [MNOS], silicon-oxide-nitride-oxide-silicon [SONOS]
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
- G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
- G11C16/3436—Arrangements for verifying correct programming or erasure
- G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
- G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B43/00—EEPROM devices comprising charge-trapping gate insulators
- H10B43/20—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels
- H10B43/23—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels
- H10B43/27—EEPROM devices comprising charge-trapping gate insulators characterised by three-dimensional arrangements, e.g. with cells on different height levels with source and drain on different levels, e.g. with sloping channels the channels comprising vertical portions, e.g. U-shaped channels
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Ceramic Engineering (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
- Non-Volatile Memory (AREA)
Abstract
Description
Claims (20)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017242858A JP2019109952A (ja) | 2017-12-19 | 2017-12-19 | 半導体記憶装置 |
JP2017-242858 | 2017-12-19 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN109935256A true CN109935256A (zh) | 2019-06-25 |
CN109935256B CN109935256B (zh) | 2023-02-03 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201810846136.2A Active CN109935256B (zh) | 2017-12-19 | 2018-07-27 | 半导体存储装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US10431311B2 (zh) |
JP (1) | JP2019109952A (zh) |
CN (1) | CN109935256B (zh) |
TW (1) | TWI682392B (zh) |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112310090A (zh) * | 2019-07-26 | 2021-02-02 | 铠侠股份有限公司 | 半导体存储装置及其制造方法 |
CN113496740A (zh) * | 2020-03-18 | 2021-10-12 | 铠侠股份有限公司 | 半导体存储装置 |
JP2022535372A (ja) * | 2019-10-23 | 2022-08-08 | 長江存儲科技有限責任公司 | メモリデバイスをプログラムする方法および関連するメモリデバイス |
JP2022539717A (ja) * | 2019-10-22 | 2022-09-13 | 長江存儲科技有限責任公司 | 不揮発性メモリデバイスおよび制御方法 |
JP2022542347A (ja) * | 2020-02-10 | 2022-10-03 | 長江存儲科技有限責任公司 | 複数の部分を含み、プログラム妨害を低減するために使用されるメモリ、およびそのプログラム方法 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR102593706B1 (ko) * | 2018-07-12 | 2023-10-25 | 삼성전자주식회사 | 부분적으로 확대된 채널 홀을 갖는 반도체 소자 |
JP2020047848A (ja) * | 2018-09-20 | 2020-03-26 | キオクシア株式会社 | 半導体メモリ |
KR20210001134A (ko) * | 2019-06-27 | 2021-01-06 | 에스케이하이닉스 주식회사 | 메모리 장치 및 그 동작 방법 |
US11200952B2 (en) * | 2019-07-22 | 2021-12-14 | Samsung Electronics Co., Ltd. | Non-volatile memory device |
JP7181419B2 (ja) * | 2019-10-31 | 2022-11-30 | 長江存儲科技有限責任公司 | 不揮発性メモリデバイスおよび制御方法 |
CN112634965B (zh) * | 2019-11-13 | 2022-11-04 | 长江存储科技有限责任公司 | 执行编程操作的方法及相关的存储器件 |
KR20240050458A (ko) * | 2019-12-09 | 2024-04-18 | 양쯔 메모리 테크놀로지스 씨오., 엘티디. | 메모리 디바이스의 프로그램 교란을 감소시키는 방법 및 이를 이용한 메모리 디바이스 |
US11107540B1 (en) * | 2020-02-14 | 2021-08-31 | Sandisk Technologies Llc | Program disturb improvements in multi-tier memory devices including improved non-data conductive gate implementation |
CN112771616B (zh) * | 2021-01-04 | 2023-12-26 | 长江存储科技有限责任公司 | 具有降低的阈值电压偏移的三维存储器器件编程 |
WO2022141618A1 (en) | 2021-01-04 | 2022-07-07 | Yangtze Memory Technologies Co., Ltd. | Three-dimensional memory device programming with reduced disturbance |
JP2023040926A (ja) * | 2021-09-10 | 2023-03-23 | キオクシア株式会社 | 半導体記憶装置 |
KR20230098971A (ko) * | 2021-12-27 | 2023-07-04 | 삼성전자주식회사 | 비휘발성 메모리 장치 및 비휘발성 메모리 장치의 프로그램 방법 |
Citations (4)
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JP2013161487A (ja) * | 2012-02-01 | 2013-08-19 | Toshiba Corp | 不揮発性半導体記憶装置 |
TW201351418A (zh) * | 2012-06-06 | 2013-12-16 | Toshiba Kk | 半導體儲存裝置、其控制器及進行其中之資料運算之方法 |
CN104916319A (zh) * | 2014-03-14 | 2015-09-16 | 株式会社东芝 | 半导体存储装置 |
CN106486165A (zh) * | 2015-08-27 | 2017-03-08 | 株式会社东芝 | 半导体存储装置 |
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JP5142692B2 (ja) | 2007-12-11 | 2013-02-13 | 株式会社東芝 | 不揮発性半導体記憶装置 |
JP2009238874A (ja) | 2008-03-26 | 2009-10-15 | Toshiba Corp | 半導体メモリ及びその製造方法 |
JP2009266944A (ja) | 2008-04-23 | 2009-11-12 | Toshiba Corp | 三次元積層不揮発性半導体メモリ |
JP5283960B2 (ja) | 2008-04-23 | 2013-09-04 | 株式会社東芝 | 三次元積層不揮発性半導体メモリ |
JP2010199235A (ja) | 2009-02-24 | 2010-09-09 | Toshiba Corp | 不揮発性半導体記憶装置 |
JP2012069205A (ja) | 2010-09-22 | 2012-04-05 | Toshiba Corp | 不揮発性半導体記憶装置 |
JP2012119013A (ja) * | 2010-11-29 | 2012-06-21 | Toshiba Corp | 不揮発性半導体記憶装置 |
US8988937B2 (en) * | 2012-10-24 | 2015-03-24 | Sandisk Technologies Inc. | Pre-charge during programming for 3D memory using gate-induced drain leakage |
KR102083506B1 (ko) * | 2013-05-10 | 2020-03-02 | 삼성전자주식회사 | 더미 워드 라인을 갖는 3차원 플래시 메모리 장치 및 그것을 포함하는 데이터 저장 장치 |
JP2014225310A (ja) | 2013-05-16 | 2014-12-04 | 株式会社東芝 | 不揮発性半導体記憶装置 |
JP2015195070A (ja) * | 2014-03-31 | 2015-11-05 | 株式会社東芝 | 不揮発性半導体記憶装置 |
JP2017152066A (ja) | 2016-02-23 | 2017-08-31 | 東芝メモリ株式会社 | 不揮発性半導体記憶装置及びメモリシステム |
JP6581019B2 (ja) * | 2016-03-02 | 2019-09-25 | 東芝メモリ株式会社 | 半導体記憶装置 |
US10297323B2 (en) * | 2017-10-06 | 2019-05-21 | Sandisk Technologies Llc | Reducing disturbs with delayed ramp up of dummy word line after pre-charge during programming |
-
2017
- 2017-12-19 JP JP2017242858A patent/JP2019109952A/ja active Pending
-
2018
- 2018-07-09 TW TW107123660A patent/TWI682392B/zh active
- 2018-07-27 CN CN201810846136.2A patent/CN109935256B/zh active Active
- 2018-08-07 US US16/056,804 patent/US10431311B2/en active Active
Patent Citations (4)
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JP2013161487A (ja) * | 2012-02-01 | 2013-08-19 | Toshiba Corp | 不揮発性半導体記憶装置 |
TW201351418A (zh) * | 2012-06-06 | 2013-12-16 | Toshiba Kk | 半導體儲存裝置、其控制器及進行其中之資料運算之方法 |
CN104916319A (zh) * | 2014-03-14 | 2015-09-16 | 株式会社东芝 | 半导体存储装置 |
CN106486165A (zh) * | 2015-08-27 | 2017-03-08 | 株式会社东芝 | 半导体存储装置 |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112310090A (zh) * | 2019-07-26 | 2021-02-02 | 铠侠股份有限公司 | 半导体存储装置及其制造方法 |
CN112310090B (zh) * | 2019-07-26 | 2024-03-08 | 铠侠股份有限公司 | 半导体存储装置及其制造方法 |
JP2022539717A (ja) * | 2019-10-22 | 2022-09-13 | 長江存儲科技有限責任公司 | 不揮発性メモリデバイスおよび制御方法 |
US11501822B2 (en) | 2019-10-22 | 2022-11-15 | Yangtze Memory Technologies Co., Ltd. | Non-volatile memory device and control method |
US11862230B2 (en) | 2019-10-22 | 2024-01-02 | Yangtze Memory Technologies Co., Ltd. | Non-volatile memory device and control method |
JP2022535372A (ja) * | 2019-10-23 | 2022-08-08 | 長江存儲科技有限責任公司 | メモリデバイスをプログラムする方法および関連するメモリデバイス |
JP7278426B2 (ja) | 2019-10-23 | 2023-05-19 | 長江存儲科技有限責任公司 | メモリデバイスをプログラムする方法および関連するメモリデバイス |
JP2022542347A (ja) * | 2020-02-10 | 2022-10-03 | 長江存儲科技有限責任公司 | 複数の部分を含み、プログラム妨害を低減するために使用されるメモリ、およびそのプログラム方法 |
US11875862B2 (en) | 2020-02-10 | 2024-01-16 | Yangtze Memory Technologies Co., Ltd. | Memory including a plurality of portions and used for reducing program disturbance and program method thereof |
CN113496740A (zh) * | 2020-03-18 | 2021-10-12 | 铠侠股份有限公司 | 半导体存储装置 |
CN113496740B (zh) * | 2020-03-18 | 2023-10-20 | 铠侠股份有限公司 | 半导体存储装置 |
Also Published As
Publication number | Publication date |
---|---|
US20190189218A1 (en) | 2019-06-20 |
TW201928972A (zh) | 2019-07-16 |
JP2019109952A (ja) | 2019-07-04 |
TWI682392B (zh) | 2020-01-11 |
CN109935256B (zh) | 2023-02-03 |
US10431311B2 (en) | 2019-10-01 |
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