CN109863594B - 具有颗粒粗糙化表面的封装半导体装置 - Google Patents
具有颗粒粗糙化表面的封装半导体装置 Download PDFInfo
- Publication number
- CN109863594B CN109863594B CN201780065757.0A CN201780065757A CN109863594B CN 109863594 B CN109863594 B CN 109863594B CN 201780065757 A CN201780065757 A CN 201780065757A CN 109863594 B CN109863594 B CN 109863594B
- Authority
- CN
- China
- Prior art keywords
- semiconductor device
- packaged semiconductor
- particles
- lead frame
- polymer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/456—Materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/411—Chip-supporting parts, e.g. die pads
- H10W70/417—Bonding materials between chips and die pads
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/456—Materials
- H10W70/457—Materials of metallic layers on leadframes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/456—Materials
- H10W70/458—Materials of insulating layers on leadframes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/464—Additional interconnections in combination with leadframes
- H10W70/465—Bumps or wires
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
- H10W74/10—Encapsulations, e.g. protective coatings characterised by their shape or disposition
- H10W74/111—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
- H10W74/127—Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed characterised by arrangements for sealing or adhesion
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/811—Multiple chips on leadframes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W70/00—Package substrates; Interposers; Redistribution layers [RDL]
- H10W70/40—Leadframes
- H10W70/421—Shapes or dispositions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01221—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition
- H10W72/01223—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps using local deposition in liquid form, e.g. by dispensing droplets or by screen printing
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/01—Manufacture or treatment
- H10W72/012—Manufacture or treatment of bump connectors, dummy bumps or thermal bumps
- H10W72/01261—Chemical or physical modification, e.g. by sintering or anodisation
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07231—Techniques
- H10W72/07236—Soldering or alloying
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
- H10W72/07252—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in structures or sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/071—Connecting or disconnecting
- H10W72/072—Connecting or disconnecting of bump connectors
- H10W72/07251—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting
- H10W72/07253—Connecting or disconnecting of bump connectors characterised by changes in properties of the bump connectors during connecting changes in shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/222—Multilayered bumps, e.g. a coating on top and side surfaces of a bump core
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/224—Bumps having multiple side-by-side cores
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/221—Structures or relative sizes
- H10W72/225—Bumps having a filler embedded in a matrix
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/231—Shapes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/231—Shapes
- H10W72/234—Cross-sectional shape, i.e. in side view
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/241—Dispositions, e.g. layouts
- H10W72/245—Dispositions, e.g. layouts of outermost layers of multilayered bumps, e.g. bump coating being only on a part of a bump core
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/252—Materials comprising solid metals or solid metalloids, e.g. PbSn, Ag or Cu
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/253—Materials not comprising solid metals or solid metalloids, e.g. polymers or ceramics
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/251—Materials
- H10W72/255—Materials of outermost layers of multilayered bumps, e.g. material of a coating
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W72/00—Interconnections or connectors in packages
- H10W72/20—Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
- H10W72/281—Auxiliary members
- H10W72/287—Flow barriers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W74/00—Encapsulations, e.g. protective coatings
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W90/00—Package configurations
- H10W90/701—Package configurations characterised by the relative positions of pads or connectors relative to package parts
- H10W90/721—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors
- H10W90/726—Package configurations characterised by the relative positions of pads or connectors relative to package parts of bump connectors between a chip and a stacked lead frame, conducting package substrate or heat sink
Landscapes
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
- Wire Bonding (AREA)
- Lead Frames For Integrated Circuits (AREA)
- Die Bonding (AREA)
Applications Claiming Priority (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662440950P | 2016-12-30 | 2016-12-30 | |
| US62/440,950 | 2016-12-30 | ||
| US15/842,608 | 2017-12-14 | ||
| US15/842,608 US10186478B2 (en) | 2016-12-30 | 2017-12-14 | Packaged semiconductor device with a particle roughened surface |
| PCT/US2017/068761 WO2018126038A1 (en) | 2016-12-30 | 2017-12-28 | Packaged semiconductor device with a particle roughened surface |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN109863594A CN109863594A (zh) | 2019-06-07 |
| CN109863594B true CN109863594B (zh) | 2022-06-03 |
Family
ID=62710747
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201780065757.0A Active CN109863594B (zh) | 2016-12-30 | 2017-12-28 | 具有颗粒粗糙化表面的封装半导体装置 |
Country Status (4)
| Country | Link |
|---|---|
| US (3) | US10186478B2 (https=) |
| JP (1) | JP7206198B2 (https=) |
| CN (1) | CN109863594B (https=) |
| WO (1) | WO2018126038A1 (https=) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10186478B2 (en) * | 2016-12-30 | 2019-01-22 | Texas Instruments Incorporated | Packaged semiconductor device with a particle roughened surface |
| US12237249B2 (en) * | 2018-10-30 | 2025-02-25 | Texas Instruments Incorporated | Substrates with solder barriers on leads |
| JP7353794B2 (ja) | 2019-05-13 | 2023-10-02 | ローム株式会社 | 半導体装置、その製造方法、及びモジュール |
| US11264314B2 (en) | 2019-09-27 | 2022-03-01 | International Business Machines Corporation | Interconnection with side connection to substrate |
| US11004819B2 (en) * | 2019-09-27 | 2021-05-11 | International Business Machines Corporation | Prevention of bridging between solder joints |
| WO2021065907A1 (ja) * | 2019-10-03 | 2021-04-08 | ローム株式会社 | 半導体装置、電子部品および電子部品の製造方法 |
| JP7408885B2 (ja) * | 2020-01-30 | 2024-01-09 | 長華科技股▲ふん▼有限公司 | リードフレーム |
| US11235404B2 (en) * | 2020-03-21 | 2022-02-01 | International Business Machines Corporation | Personalized copper block for selective solder removal |
| JP7607438B2 (ja) * | 2020-11-13 | 2024-12-27 | ローム株式会社 | 半導体装置 |
| US11735529B2 (en) | 2021-05-21 | 2023-08-22 | International Business Machines Corporation | Side pad anchored by next adjacent via |
| CN116995054B (zh) * | 2023-07-13 | 2025-04-01 | 日月新半导体(昆山)有限公司 | 集成电路封装产品以及集成电路封装方法 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102339809A (zh) * | 2011-11-04 | 2012-02-01 | 北京工业大学 | 一种多圈引脚排列四边扁平无引脚封装及制造方法 |
| CN103383921A (zh) * | 2012-05-03 | 2013-11-06 | 英飞凌科技股份有限公司 | 半导体封装件及其形成方法 |
| CN205376495U (zh) * | 2015-06-29 | 2016-07-06 | 意法半导体公司 | 半导体器件 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06204362A (ja) * | 1993-01-05 | 1994-07-22 | Nec Corp | 半導体装置 |
| JP2953424B2 (ja) * | 1997-03-31 | 1999-09-27 | 日本電気株式会社 | フェイスダウンボンディング用リードフレーム |
| JPH11289040A (ja) * | 1998-02-09 | 1999-10-19 | Shinko Electric Ind Co Ltd | リードフレーム及びこれを用いた半導体装置 |
| SG87769A1 (en) | 1998-09-29 | 2002-04-16 | Texas Instr Singapore Pte Ltd | Direct attachment of semiconductor chip to organic substrate |
| JP4351327B2 (ja) | 1999-05-20 | 2009-10-28 | 大日本印刷株式会社 | リードフレーム部材とそれを用いた樹脂封止型半導体装置およびリードフレーム部材の製造方法 |
| KR100583494B1 (ko) * | 2000-03-25 | 2006-05-24 | 앰코 테크놀로지 코리아 주식회사 | 반도체패키지 |
| JP2002170838A (ja) * | 2000-11-30 | 2002-06-14 | Shinkawa Ltd | 半導体装置およびその製造方法 |
| DE10148120B4 (de) * | 2001-09-28 | 2007-02-01 | Infineon Technologies Ag | Elektronische Bauteile mit Halbleiterchips und ein Systemträger mit Bauteilpositionen sowie Verfahren zur Herstellung eines Systemträgers |
| US7645640B2 (en) * | 2004-11-15 | 2010-01-12 | Stats Chippac Ltd. | Integrated circuit package system with leadframe substrate |
| US8067823B2 (en) * | 2004-11-15 | 2011-11-29 | Stats Chippac, Ltd. | Chip scale package having flip chip interconnect on die paddle |
| US7443015B2 (en) * | 2005-05-05 | 2008-10-28 | Stats Chippac Ltd. | Integrated circuit package system with downset lead |
| US7382059B2 (en) * | 2005-11-18 | 2008-06-03 | Semiconductor Components Industries, L.L.C. | Semiconductor package structure and method of manufacture |
| JP5247626B2 (ja) * | 2008-08-22 | 2013-07-24 | 住友化学株式会社 | リードフレーム、樹脂パッケージ、半導体装置及び樹脂パッケージの製造方法 |
| JP2010135723A (ja) | 2008-10-29 | 2010-06-17 | Panasonic Corp | 半導体装置 |
| JP5156658B2 (ja) | 2009-01-30 | 2013-03-06 | 株式会社日立製作所 | Lsi用電子部材 |
| US8044495B2 (en) * | 2009-06-22 | 2011-10-25 | Texas Instruments Incorporated | Metallic leadframes having laser-treated surfaces for improved adhesion to polymeric compounds |
| RU2438845C1 (ru) | 2010-07-01 | 2012-01-10 | Открытое акционерное общество "Авангард" | Припойная паста |
| CN103563099A (zh) | 2011-06-01 | 2014-02-05 | 皇家飞利浦有限公司 | 键合到支撑衬底的发光器件 |
| JP5842109B2 (ja) | 2012-02-23 | 2016-01-13 | パナソニックIpマネジメント株式会社 | 樹脂封止型半導体装置及びその製造方法 |
| TWI460837B (zh) | 2012-06-19 | 2014-11-11 | 頎邦科技股份有限公司 | 半導體封裝結構及其導線架 |
| CN104425287A (zh) | 2013-08-19 | 2015-03-18 | 讯芯电子科技(中山)有限公司 | 封装结构及制造方法 |
| US20160068387A1 (en) * | 2014-09-09 | 2016-03-10 | Texas Instruments Incorporated | Semiconductor cavity package using photosensitive resin |
| US9502337B2 (en) | 2014-10-31 | 2016-11-22 | Nantong Fujitsu Microelectronics Co., Ltd. | Flip-chip on leadframe semiconductor packaging structure and fabrication method thereof |
| US10186478B2 (en) * | 2016-12-30 | 2019-01-22 | Texas Instruments Incorporated | Packaged semiconductor device with a particle roughened surface |
-
2017
- 2017-12-14 US US15/842,608 patent/US10186478B2/en active Active
- 2017-12-28 JP JP2019536063A patent/JP7206198B2/ja active Active
- 2017-12-28 CN CN201780065757.0A patent/CN109863594B/zh active Active
- 2017-12-28 WO PCT/US2017/068761 patent/WO2018126038A1/en not_active Ceased
-
2019
- 2019-01-18 US US16/252,412 patent/US10475729B2/en active Active
- 2019-11-12 US US16/681,221 patent/US11062982B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102339809A (zh) * | 2011-11-04 | 2012-02-01 | 北京工业大学 | 一种多圈引脚排列四边扁平无引脚封装及制造方法 |
| CN103383921A (zh) * | 2012-05-03 | 2013-11-06 | 英飞凌科技股份有限公司 | 半导体封装件及其形成方法 |
| CN205376495U (zh) * | 2015-06-29 | 2016-07-06 | 意法半导体公司 | 半导体器件 |
Also Published As
| Publication number | Publication date |
|---|---|
| US20190157195A1 (en) | 2019-05-23 |
| US20200083149A1 (en) | 2020-03-12 |
| US11062982B2 (en) | 2021-07-13 |
| JP2020504451A (ja) | 2020-02-06 |
| CN109863594A (zh) | 2019-06-07 |
| US10475729B2 (en) | 2019-11-12 |
| JP7206198B2 (ja) | 2023-01-17 |
| WO2018126038A1 (en) | 2018-07-05 |
| US20180190577A1 (en) | 2018-07-05 |
| US10186478B2 (en) | 2019-01-22 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109863594B (zh) | 具有颗粒粗糙化表面的封装半导体装置 | |
| US11437333B2 (en) | Packaged semiconductor device with a reflow wall | |
| US8569082B2 (en) | Semiconductor package with a mold material encapsulating a chip and a portion of a lead frame | |
| US10692829B2 (en) | Method of forming a solder bump structure | |
| US20210005537A1 (en) | Sintered Metal Flip Chip Joints | |
| US8763242B2 (en) | Semiconductor device and method of manufacturing the same | |
| US9570381B2 (en) | Semiconductor packages and related manufacturing methods | |
| KR20080020069A (ko) | 반도체 패키지 및 그 제조방법 | |
| US20170053854A1 (en) | Packaged Device with Additive Substrate Surface Modification | |
| US20140284779A1 (en) | Semiconductor device having reinforced wire bonds to metal terminals | |
| TWI736072B (zh) | 封裝結構與其形成方法 | |
| JP2005244035A (ja) | 半導体装置の実装方法、並びに半導体装置 | |
| JP5642473B2 (ja) | Bga半導体パッケージおよびその製造方法 | |
| US20130048351A1 (en) | Electronic package structure and method for manufacturing same | |
| CN112930588B (zh) | 半导体装置与烧结纳米粒子的连接 | |
| CN109994433B (zh) | 半导体装置封装 | |
| US20140091465A1 (en) | Leadframe having sloped metal terminals for wirebonding | |
| TWI628756B (zh) | 封裝結構及其製作方法 | |
| JP2008177367A (ja) | 半導体装置の製造方法 | |
| JP2008021712A (ja) | 半導体モジュールならびにその製造方法 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |