CN109844182A - 在金属基材上沉积锡层的方法和使用所述方法包含镍/磷合金底层和所述锡层的结构的用途 - Google Patents
在金属基材上沉积锡层的方法和使用所述方法包含镍/磷合金底层和所述锡层的结构的用途 Download PDFInfo
- Publication number
- CN109844182A CN109844182A CN201780065970.1A CN201780065970A CN109844182A CN 109844182 A CN109844182 A CN 109844182A CN 201780065970 A CN201780065970 A CN 201780065970A CN 109844182 A CN109844182 A CN 109844182A
- Authority
- CN
- China
- Prior art keywords
- tin
- nickel
- whisker
- pulse
- tin layers
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C19/00—Alloys based on nickel or cobalt
- C22C19/03—Alloys based on nickel or cobalt based on nickel
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/18—Electroplating using modulated, pulsed or reversing current
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C18/00—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
- C23C18/16—Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
- C23C18/1601—Process or apparatus
- C23C18/1633—Process of electroless plating
- C23C18/1646—Characteristics of the product obtained
- C23C18/165—Multilayered product
- C23C18/1653—Two or more layers with at least one layer obtained by electroless plating and one layer obtained by electroplating
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
- C25D5/12—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/10—Electroplating with more than one layer of the same or of different metals
- C25D5/12—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium
- C25D5/14—Electroplating with more than one layer of the same or of different metals at least one layer being of nickel or chromium two or more layers being of nickel or chromium, e.g. duplex or triplex layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/34—Pretreatment of metallic surfaces to be electroplated
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/605—Surface topography of the layers, e.g. rough, dendritic or nodular layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D5/00—Electroplating characterised by the process; Pretreatment or after-treatment of workpieces
- C25D5/60—Electroplating characterised by the structure or texture of the layers
- C25D5/615—Microstructure of the layers, e.g. mixed structure
- C25D5/617—Crystalline layers
-
- C—CHEMISTRY; METALLURGY
- C25—ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
- C25D—PROCESSES FOR THE ELECTROLYTIC OR ELECTROPHORETIC PRODUCTION OF COATINGS; ELECTROFORMING; APPARATUS THEREFOR
- C25D7/00—Electroplating characterised by the article coated
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups H01L21/18 - H01L21/326 or H10D48/04 - H10D48/07
- H01L21/4814—Conductive parts
- H01L21/4821—Flat leads, e.g. lead frames with or without insulating supports
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Mechanical Engineering (AREA)
- General Chemical & Material Sciences (AREA)
- Electroplating Methods And Accessories (AREA)
- Rolls And Other Rotary Bodies (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP16195351.8 | 2016-10-24 | ||
| EP16195351 | 2016-10-24 | ||
| PCT/EP2017/077156 WO2018077874A1 (en) | 2016-10-24 | 2017-10-24 | A method of depositing a tin layer on a metal substrate and a use of a structure comprising a nickel/phosphorous alloy underlayer and said tin layer with said method |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109844182A true CN109844182A (zh) | 2019-06-04 |
Family
ID=57211308
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201780065970.1A Pending CN109844182A (zh) | 2016-10-24 | 2017-10-24 | 在金属基材上沉积锡层的方法和使用所述方法包含镍/磷合金底层和所述锡层的结构的用途 |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20190271093A1 (enExample) |
| EP (1) | EP3529398B1 (enExample) |
| JP (1) | JP6990240B2 (enExample) |
| KR (1) | KR102404045B1 (enExample) |
| CN (1) | CN109844182A (enExample) |
| MY (1) | MY192687A (enExample) |
| SG (1) | SG11201902595UA (enExample) |
| WO (1) | WO2018077874A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7121881B2 (ja) | 2017-08-08 | 2022-08-19 | 三菱マテリアル株式会社 | 銀皮膜付端子材及び銀皮膜付端子 |
| WO2020173950A1 (en) * | 2019-02-25 | 2020-09-03 | Tata Steel Ijmuiden B.V. | Method for electrolytically depositing a chromium oxide layer |
| US11306409B2 (en) | 2019-05-23 | 2022-04-19 | Ag-Nano System Llc | Method to enable electroplating of golden silver nanoparticles |
| US12410525B2 (en) * | 2020-12-17 | 2025-09-09 | Macdermid, Incorporated | Multilayer corrosion system |
| JP2023075905A (ja) * | 2021-11-19 | 2023-05-31 | 千住金属工業株式会社 | 金属体の形成方法および金属体、ならびにその金属体を備える嵌合型接続端子 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020185716A1 (en) * | 2001-05-11 | 2002-12-12 | Abys Joseph Anthony | Metal article coated with multilayer finish inhibiting whisker growth |
| CN1407141A (zh) * | 2001-03-16 | 2003-04-02 | 希普雷公司 | 镀锡 |
| JP2005109373A (ja) * | 2003-10-02 | 2005-04-21 | Fuji Electric Device Technology Co Ltd | 半導体装置 |
| JP2006307328A (ja) * | 2005-03-28 | 2006-11-09 | Sony Corp | 無鉛Snベースめっき膜及びその製造方法、並びに接続部品の接点構造 |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS58221291A (ja) * | 1982-06-16 | 1983-12-22 | Furukawa Electric Co Ltd:The | 電気接続用銀被覆銅材料 |
| JPH0790675A (ja) * | 1993-09-21 | 1995-04-04 | Murata Mfg Co Ltd | 電子部品の製造方法 |
| US5750017A (en) * | 1996-08-21 | 1998-05-12 | Lucent Technologies Inc. | Tin electroplating process |
| US6361823B1 (en) | 1999-12-03 | 2002-03-26 | Atotech Deutschland Gmbh | Process for whisker-free aqueous electroless tin plating |
| DE10132478C1 (de) * | 2001-07-03 | 2003-04-30 | Atotech Deutschland Gmbh | Verfahren zum Abscheiden einer Metallschicht sowie Verfahren zum Regenerieren einer Metallionen in einer hohen Oxidationsstufe enthaltenden Lösung |
| TW200712254A (en) | 2005-06-24 | 2007-04-01 | Technic | Silver barrier layers to minimize whisker growth tin electrodeposits |
| JP2007284762A (ja) | 2006-04-18 | 2007-11-01 | Sumitomo Metal Mining Co Ltd | スズめっき皮膜の形成方法および半導体装置 |
| JP4847898B2 (ja) * | 2007-03-07 | 2011-12-28 | 日立電線株式会社 | 配線用導体およびその製造方法 |
| ES2574561T3 (es) | 2007-07-10 | 2016-06-20 | Atotech Deutschland Gmbh | Solución y proceso para incrementar la capacidad de soldadura y la resistencia a la corrosión de la superficie de un metal o de una aleación metálica |
| JP5086485B1 (ja) | 2011-09-20 | 2012-11-28 | Jx日鉱日石金属株式会社 | 電子部品用金属材料及びその製造方法 |
-
2017
- 2017-10-24 SG SG11201902595UA patent/SG11201902595UA/en unknown
- 2017-10-24 US US16/344,031 patent/US20190271093A1/en not_active Abandoned
- 2017-10-24 KR KR1020197014365A patent/KR102404045B1/ko active Active
- 2017-10-24 WO PCT/EP2017/077156 patent/WO2018077874A1/en not_active Ceased
- 2017-10-24 EP EP17787197.7A patent/EP3529398B1/en not_active Not-in-force
- 2017-10-24 JP JP2019521768A patent/JP6990240B2/ja not_active Expired - Fee Related
- 2017-10-24 CN CN201780065970.1A patent/CN109844182A/zh active Pending
- 2017-10-24 MY MYPI2019001970A patent/MY192687A/en unknown
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1407141A (zh) * | 2001-03-16 | 2003-04-02 | 希普雷公司 | 镀锡 |
| US20020185716A1 (en) * | 2001-05-11 | 2002-12-12 | Abys Joseph Anthony | Metal article coated with multilayer finish inhibiting whisker growth |
| JP2005109373A (ja) * | 2003-10-02 | 2005-04-21 | Fuji Electric Device Technology Co Ltd | 半導体装置 |
| JP2006307328A (ja) * | 2005-03-28 | 2006-11-09 | Sony Corp | 無鉛Snベースめっき膜及びその製造方法、並びに接続部品の接点構造 |
Also Published As
| Publication number | Publication date |
|---|---|
| MY192687A (en) | 2022-09-01 |
| KR20190070958A (ko) | 2019-06-21 |
| WO2018077874A1 (en) | 2018-05-03 |
| US20190271093A1 (en) | 2019-09-05 |
| EP3529398A1 (en) | 2019-08-28 |
| JP6990240B2 (ja) | 2022-01-12 |
| EP3529398B1 (en) | 2022-10-19 |
| JP2019533088A (ja) | 2019-11-14 |
| SG11201902595UA (en) | 2019-05-30 |
| KR102404045B1 (ko) | 2022-05-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20190604 |
|
| RJ01 | Rejection of invention patent application after publication |