CN107346083A - 显示装置 - Google Patents
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- CN107346083A CN107346083A CN201710267224.2A CN201710267224A CN107346083A CN 107346083 A CN107346083 A CN 107346083A CN 201710267224 A CN201710267224 A CN 201710267224A CN 107346083 A CN107346083 A CN 107346083A
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- tft
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- 239000000758 substrate Substances 0.000 claims abstract description 42
- 239000004973 liquid crystal related substance Substances 0.000 claims description 27
- 229910021420 polycrystalline silicon Inorganic materials 0.000 claims description 24
- 239000004065 semiconductor Substances 0.000 claims description 19
- 229920005591 polysilicon Polymers 0.000 claims description 17
- 239000010410 layer Substances 0.000 description 37
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 31
- 239000010408 film Substances 0.000 description 27
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 15
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 11
- 150000002500 ions Chemical class 0.000 description 10
- 239000011229 interlayer Substances 0.000 description 9
- 239000011787 zinc oxide Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 8
- 229910004205 SiNX Inorganic materials 0.000 description 7
- 239000003990 capacitor Substances 0.000 description 7
- 230000002093 peripheral effect Effects 0.000 description 7
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 210000002469 basement membrane Anatomy 0.000 description 6
- 239000000203 mixture Substances 0.000 description 6
- 238000002161 passivation Methods 0.000 description 6
- 229910052698 phosphorus Inorganic materials 0.000 description 6
- 239000011574 phosphorus Substances 0.000 description 6
- 229910052814 silicon oxide Inorganic materials 0.000 description 6
- 229910021417 amorphous silicon Inorganic materials 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 4
- 229910052796 boron Inorganic materials 0.000 description 4
- 238000004140 cleaning Methods 0.000 description 4
- 229910052738 indium Inorganic materials 0.000 description 4
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 description 3
- 229910052733 gallium Inorganic materials 0.000 description 3
- 239000011521 glass Substances 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000011159 matrix material Substances 0.000 description 3
- 239000011241 protective layer Substances 0.000 description 3
- 229910000838 Al alloy Inorganic materials 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 2
- 230000001070 adhesive effect Effects 0.000 description 2
- NJWNEWQMQCGRDO-UHFFFAOYSA-N indium zinc Chemical compound [Zn].[In] NJWNEWQMQCGRDO-UHFFFAOYSA-N 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 description 1
- 229910001182 Mo alloy Inorganic materials 0.000 description 1
- 229910004349 Ti-Al Inorganic materials 0.000 description 1
- 229910004692 Ti—Al Inorganic materials 0.000 description 1
- 229910001080 W alloy Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- -1 Zinc Oxide Nitride Chemical class 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 239000011737 fluorine Substances 0.000 description 1
- 229910001195 gallium oxide Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- RHZWSUVWRRXEJF-UHFFFAOYSA-N indium tin Chemical compound [In].[Sn] RHZWSUVWRRXEJF-UHFFFAOYSA-N 0.000 description 1
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000005224 laser annealing Methods 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 150000002927 oxygen compounds Chemical class 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 239000002994 raw material Substances 0.000 description 1
- 230000027756 respiratory electron transport chain Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
- 239000011701 zinc Substances 0.000 description 1
- YVTHLONGBIQYBO-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) Chemical compound [O--].[Zn++].[In+3] YVTHLONGBIQYBO-UHFFFAOYSA-N 0.000 description 1
- TYHJXGDMRRJCRY-UHFFFAOYSA-N zinc indium(3+) oxygen(2-) tin(4+) Chemical compound [O-2].[Zn+2].[Sn+4].[In+3] TYHJXGDMRRJCRY-UHFFFAOYSA-N 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
- H01L29/76—Unipolar devices, e.g. field effect transistors
- H01L29/772—Field effect transistors
- H01L29/78—Field effect transistors with field effect produced by an insulated gate
- H01L29/786—Thin film transistors, i.e. transistors with a channel being at least partly a thin film
- H01L29/7869—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate
- H01L29/78693—Thin film transistors, i.e. transistors with a channel being at least partly a thin film having a semiconductor body comprising an oxide semiconductor material, e.g. zinc oxide, copper aluminium oxide, cadmium stannate the semiconducting oxide being amorphous
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/1288—Multistep manufacturing methods employing particular masking sequences or specially adapted masks, e.g. half-tone mask
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136227—Through-hole connection of the pixel electrode to the active element through an insulation layer
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
- H01L27/1225—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer with semiconductor materials not belonging to the group IV of the periodic table, e.g. InGaZnO
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
- H01L27/1229—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer with different crystal properties within a device or between different devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1222—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer
- H01L27/1233—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or crystalline structure of the active layer with different thicknesses of the active layer in different devices
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1251—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs comprising TFTs having a different architecture, e.g. top- and bottom gate TFTs
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
- H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
- H01L27/1259—Multistep manufacturing methods
- H01L27/127—Multistep manufacturing methods with a particular formation, treatment or patterning of the active layer specially adapted to the circuit arrangement
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/121—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements
- H10K59/1213—Active-matrix OLED [AMOLED] displays characterised by the geometry or disposition of pixel elements the pixel elements being TFTs
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/131—Interconnections, e.g. wiring lines or terminals
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2201/00—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00
- G02F2201/12—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode
- G02F2201/123—Constructional arrangements not provided for in groups G02F1/00 - G02F7/00 electrode pixel
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Abstract
本发明涉及显示装置。本发明的技术课题为可以在同一基板内形成LTPS TFT和TAOS TFT。其为包含具有形成有像素的显示区域的基板的显示装置,其特征在于,所述像素包含使用了TAOS的第一TFT,在所述第一TFT的漏极上形成有第一LTPS(112),在所述第一TFT的源极上形成有第二LTPS(113),所述第一LTPS(112)经由在覆盖所述第一TFT的绝缘膜(105)中形成的第一通孔(108)而与第一电极(106)连接,所述第二LTPS(113)经由在覆盖所述第二TFT的绝缘膜中形成的第二通孔(108)而与第二电极(107)连接。
Description
技术领域
本发明涉及显示装置,涉及使用混合式(hybrid)结构(其利用使用Poly-Si(多晶硅)的TFT和使用氧化物半导体的TFT这两者)的显示装置。
背景技术
对于液晶显示装置而言,其构成为:具有TFT基板、与TFT基板相对地配置的对置基板,并在TFT基板与对置基板之间夹持液晶,所述TFT基板中具有像素电极及薄膜晶体管(TFT)等的像素以矩阵状形成。并且,按每个像素来控制基于液晶分子的光的透过率,从而形成图像。
由于LTPS(Low Temperature Poly-Si:低温多晶硅)迁移率高,因此适合作为驱动电路用TFT。另一方面,氧化物半导体的OFF电阻高,若将其用于TFT,则能够减小OFF电流。
为了将利用LTPS的TFT和利用氧化物半导体的TFT形成于同一基板上,存在各种需要克服的问题。专利文献1中记载了用于将利用LTPS的TFT和使用了氧化物半导体的TFT形成于同一基板上的构成。专利文献1中,记载了将掺杂了的LTPS用作氧化物半导体的栅极的构成。
现有技术文献
专利文献
专利文献1:WO2015/194419
发明内容
发明要解决的问题
关于作为像素的开关而使用的TFT,需要漏电流小。利用透明氧化物半导体的TFT能够减小漏电流。以下,将透明氧化物半导体称为TAOS(Transparent Amorphous OxideSemiconductor,透明无定形氧化物半导体)。TAOS包括IGZO(Indium Gallium Zinc Oxide:氧化铟镓锌)、ITZO(Indium Tin Zinc Oxide:氧化铟锡锌)、ZnON(Zinc Oxide Nitride:氮氧化锌)、IZO(Indium Zinc Oxide:氧化铟锌)、IGO(Indium Gallium Oxide:氧化铟镓)、ZnO(Zinc Oxide:氧化锌)等。但是,TAOS的载流子的迁移率小,因此有时难以用使用了TAOS的TFT来形成内置于显示装置内的驱动电路。以下,TAOS也用于指使用了TAOS的TFT的意思。
另一方面,由LTPS形成的TFT的迁移率大,因此能够通过使用了LTPS的TFT来形成驱动电路。以下,LTPS也用于指使用了LTPS的TFT的意思。但是,在将LTPS用作像素中的开关TFT的情况下,LTPS的漏电流大,因此,通常将2个LTPS串联使用。
因此,若作为显示区域中的像素的开关元件而使用TAOS、而在周边驱动电路的TFT中使用LTPS,则是合理的。但是,对于LTPS和TAOS而言,由于材料的性质不同,因此对于将其形成于同一基板上而言,存在问题。即,在LTPS上形成源电极和漏电极时,为了除去表面氧化物,需要用氢氟酸(HF)清洗LTPS,但由于TAOS因氢氟酸(HF)而溶解,因此不能使用同一工序。
本发明通过解决如上所述的问题,从而能够实现将利用LTPS的TFT与利用TAOS的TFT形成于同一基板上。
用于解决问题的手段
本发明克服上述问题,具体手段如下所述。
(1)一种显示装置,其包含具有形成有像素的显示区域的基板,所述显示装置的特征在于,所述像素包含使用了氧化物半导体的第一TFT,在所述第一TFT的漏极上形成有第一多晶硅,在所述第一TFT的源极上形成有第二多晶硅,所述第一多晶硅经由在覆盖所述第一TFT的绝缘膜中形成的第一通孔而与第一电极连接,所述第二多晶硅经由在覆盖所述第一TFT的绝缘膜中形成的第二通孔而与第二电极连接。
(2)(1)所述的显示装置,其特征在于,所述基板在所述显示区域的外侧包含驱动电路,所述驱动电路包含利用多晶硅的第二TFT。
(3)(1)所述的显示装置,其特征在于,所述第一多晶硅与所述氧化物半导体形成pn结,或所述第二多晶硅与所述氧化物半导体形成pn结。
附图说明
图1:为液晶显示装置的俯视图。
图2:为图1的A-A剖面图。
图3:为示出根据本发明的TFT结构的剖面图。
图4:为示出在基板上形成了基膜和a-Si的状态的剖面图。
图5:为示出利用激光将a-Si转化为Poly-Si后的状态的剖面图。
图6:为示出对Poly-Si层进行构图后的状态的剖面图。
图7:为示出对P(磷)进行离子注入的状态的剖面图。
图8:为示出形成TAOS后的状态的剖面图。
图9:为示出形成栅极绝缘膜、并在其上形成了栅电极的状态的剖面图。
图10:为示出对P(磷)进行离子注入的状态的剖面图。
图11:为示出对B(硼)进行离子注入的状态的剖面图。
图12:为示出形成了层间绝缘膜的状态的剖面图。
图13:为根据本发明的TFT的俯视图。
图14:为根据实施例2的TFT的剖面图。
图15:为示出对B(硼)进行离子注入的状态的剖面图。
图16:为示出形成了层间绝缘膜的状态的剖面图。
图17:为液晶显示装置的剖面图。
图18:为示出将本发明应用于液晶显示装置的其他方案的剖面图。
图19:为有机EL显示装置的俯视图。
图20:为图19的B-B剖面图。
图21:为有机EL显示装置的剖面图。
1…液晶显示装置,2…有机EL显示装置,10…显示区域,20…周边电路区域,50…抗蚀剂,100…TFT基板,101…基膜,102…LTPS半导体层,103…栅极绝缘膜,104…栅电极,105…层间绝缘膜,106…漏电极,107…源电极,108…通孔,109…有机钝化膜,110…TAOS层,111…沟道层,112…LTPS漏极,113…LTPS源极,115…a-Si半导体,120…TFT阵列层,121…公共电极,122…电容绝缘膜,123…像素电极,124…取向膜,130…下偏振片,140…通孔,150…端子部,160…柔性布线基板,200…对置基板,201…彩色滤光片,202…黑矩阵,203…保护膜,210…显示元件层,211…反射电极,212…下部电极,213…有机EL层,214…上部电极,215…保护层,216…粘接材料,220…防反射用偏振片,230…上偏振片,300…液晶层,301…液晶分子,400…背光源,500…液晶显示面板,1021…LTPS沟道层,1022…LD层
具体实施方式
以下,基于实施例详细说明本发明的内容。
实施例1
图1为本发明所应用的液晶显示装置的俯视图。图2为图1的A-A剖面图。图1及图2中,TFT基板100与对置基板200相对地形成,在TFT基板100与对置基板200之间夹持液晶。在TFT基板100之下粘贴下偏振片130,在对置基板200的上侧粘贴有上偏振片230。将TFT基板100、对置基板200、下偏振片130、上偏振片230的组合称为液晶显示面板500。
TFT基板100形成得比对置基板200更大,TFT基板100的成为单片的部分作为端子部150,且连接用于向液晶显示装置供给来自外部的信号、电力的柔性布线基板130。液晶显示面板500由于自身不发光,因此在背面上配置背光源400。
关于液晶显示装置,如图1所示,能够分为显示区域10和周边区域20。显示区域中,大量的像素形成为矩阵状,各像素具有开关TFT。周边区域中,形成有用于驱动扫描线、影像信号线等的驱动电路。
关于像素中使用的TFT,由于需要漏电流小,因此使用TAOS,由于周边驱动电路中使用的TFT需要迁移率大,因此使用LTPS,这样做是合理的。在LTPS工序中,当将LTPS与漏电极或者源电极连接时,需要在覆盖LTPS的绝缘膜中形成通孔,且为了除去通孔中的LTPS的表面氧化物,需要进行氢氟酸(HF)清洗。
但是,若将相同的工艺应用于使用了TAOS的TFT,则TAOS溶解于氢氟酸(HF),不能形成TFT。因而,为了在同一基板上形成利用LTPS的TFT和利用TAOS的TFT,必须解决上述问题。图3为示出解决上述问题的本发明的构成的图。图4至图12为用于实现图3的构成的工艺。
图3中,在同一基板100上形成利用LTPS的TFT和利用TAOS的TFT。利用LTPS的TFT用于周边驱动电路。利用LTPS的TFT包含p-MOS和n-MOS。另一方面,利用TAOS的TFT用作显示区域的像素的开关。
本发明的特征在于利用TAOS的TFT的结构。即,为了连接像素电极或者影像信号线,需要在TFT之上形成的层间绝缘膜105内形成通孔108。在本发明中,在由TAOS110形成的TFT中,在上述通孔108中连接的材料不是TAOS110、而是LTPS112或者LTPS113。由此,在对通孔进行氢氟酸(HF)清洗时,氢氟酸(HF)也不会与TAOS接触,因此利用TAOS的TFT不会被氢氟酸(HF)破坏。
通过图4至图12说明用于实现图3所示的本发明的构成的工艺。在图4中,在由玻璃形成的TFT基板100之上,由SiNx(SiNx有时为SiN)及SiOx(SiOx有时为SiO2)形成基膜101。基膜101用于防止来自玻璃基板的杂质对构成TFT的半导体层造成污染。SiNx例如为50nm,SiOx例如为300nm。基膜101之上形成无定形(非晶)硅:a-Si115。SiNx、SiOx、a-Si通过CVD而连续形成。a-Si以厚度50nm左右被形成。之后,如图5所示,通过照射准分子激光,从而将a-Si115转化为LTPS102。
之后,如图6所示,通过光刻法形成LTPS的岛。关于TFT,形成利用LTPS的p-MOS TFT(以下,记作p-MOS LTPS)、利用LTPS的n-MOS TFT(以下,记作n-MOS LTPS),利用TAOS的n-MOS TFT(以下,记作n-MOS TAOS)这3种TFT。本发明由于将LTPS用于TAOS TFT的漏电极及源电极,因此在LTPS的构图中,还同时形成n-MOS TAOS的漏电极、源电极。
之后,在p-MOS LTPS整体和n-MOS TAOS的沟道部中形成抗蚀剂50,通过离子注入而掺杂P(磷),将由抗蚀剂被覆以外的部分转化为n+。由此,形成n-MOS LTPS及n-MOS TAOS的漏极及源极。
之后,如图8所示,在n-MOS TAOS TFT部分形成TAOS110。TAOS例如在10nm~100nm的范围内形成。作为TAOS的材料,可举出例如IGZO、ITZO、ZnON、IZO、IGO、ZnO等。之后,如图9所示,形成栅极绝缘膜103。栅极绝缘膜103是以TEOS(四乙氧基硅烷)为原料通过CVD而形成的SiOx(SiO2)。在栅极绝缘膜103之上形成栅电极104。
之后,如图10所示,通过以栅电极104为掩模通过离子注入而掺杂P(磷)。由此,以n-形成p-MOS LTPS的漏极及源极。n-MOS LTPS的漏极及源极转化为n+。另外,在n-MOS LTPS中,由抗蚀剂50覆盖、但未被栅电极104覆盖的部分成为n-。该层形成于沟道1021的两侧。上述层被称为LDD1022(Light Doped Drain:漏极轻掺杂),且缓和沟道与源极或者漏极的电场强度,并防止该部分中的绝缘破坏。在图10的n-MOS TAOS中,未被栅电极104覆盖的部分的TAOS通过P(磷)掺杂而成为n-TAOS,从而被赋予导电性。
之后,如图11所示,用抗蚀剂50覆盖n-MOS LTPS及n-MOS TAOS,以栅电极104为掩模通过离子注入而向p-MOS LTPS掺杂B(硼)。由此,将p-MOS的漏极及源极转化为p+,从而赋予充分的导电性。
之后,将抗蚀剂50剥离,如图12所示,覆盖各TFT从而形成层间绝缘膜105。层间绝缘膜105为通过CVD用SiNx而形成。
回到图3,之后,在层间绝缘膜105中形成通孔108。在该通孔中形成漏电极106和源电极107。漏电极106与例如影像信号线连接,源电极107与例如像素电极连接。漏电极106及源电极107由例如Ti-Al合金-Ti的三层形成。Ti是用于防止由Al合金产生的突丘(hillock)等。有时代替Ti而使用Mo、或者W的合金。
形成通孔108后,在形成漏电极106及源电极107前,为了除去LTPS的表面氧化膜而进行氢氟酸(HF)清洗。这里,由于TAOS溶解于氢氟酸(HF),因此以往未能并行形成LTPS的TFT和TAOS的TFT。与此相对,本发明中,在TAOS TFT的漏极及源极中分别形成LTPS112及LTPS113,且使通孔与该部分对应,因此漏极及源极不会由于氢氟酸(HF)而溶解。
如上所述,根据本发明,由于能够在同一基板上并行形成利用LTPS的TFT和利用TAOS的TFT,因此能够同时形成适于像素区域的TFT、适于驱动电路的TFT。
图13为与图3对应的各TFT的俯视图。在图13中,自左侧起为p-MOS LTPS、n-MOSLTPS、n-MOS TAOS。在n-MOS TAOS中,由于在通孔的部分中形成有LTPS,因此能够通过与p-MOS LTPS、n-MOS LTPS相同的工艺来形成通孔。
实施例2
图14为示出本发明的实施例2的剖面图。图14与图13不同之处在于,图14的n-MOSTAOS中的漏电极112的部分。构成n-MOS TAOS的漏极的LTPS112为p+,与此相对,TAOS110的部分成为n-。因而,在TAOS与构成漏极的LTPS之间,形成利用pn结的二极管。
通过该二极管,能够防止漏电流。在液晶显示装置的像素区域中,TFT的源极和漏极定期交换。因而,在影像信号为+时与为-时中的任一者中,均能阻止漏电流。也就是说,通过pn结能够使漏电流减半。
另一方面,关于有机EL显示装置,不存在影像信号的极性交换。因而,在图14的n-MOS TAOS的漏极或者源极中的任意一者中均形成pn结,从而能够大幅降低漏电流。
图15及图16为用于实现图14的结构的工艺的例子。在本实施例中,在玻璃基板100之上形成基膜101和a-Si115(图4),通过激光退火将a-Si转化为Poly-Si,形成TAOS,在栅极绝缘膜103之上形成栅电极104、进行离子注入P(磷),至此与实施例1中的图4至图10相同。
图15为这样的图,向n-MOS LTPS和n-MOS TAOS覆盖抗蚀剂50,向p-MOS LTPS的漏极和源极离子注入B(硼)。图15与实施例1的图11所不同的方面在于:构成n-MOS TAOS的漏极的LTPS112的部分不用抗蚀剂覆盖,通过离子注入而使LTPS漏极112成为p+。由此,在LTPS漏极112与TAOS110之间形成pn结。
之后,如图16所示,覆盖各TFT而形成层间绝缘膜105。之后,在层间绝缘膜105中形成通孔108,对通孔108进行氢氟酸(HF)清洗,形成漏电极106和源电极107,这与实施例1相同。本实施例中,形成通孔108的部分中,由于在n-MOS TAOS中也成为LTPS,因此在通孔108中,TAOS110不会溶解。
在以上说明中,在n-MOS TAOS中,在LTPS漏极112侧形成了pn结,但相反,也可在LTPS源极113侧形成pn结。如上所述,根据本实施例,能够形成漏电流小、且可靠性高的TAOSTFT。
实施例3
图17为示出将实施例1及2所说明的利用n-MOS TAOS的TFT应用于显示区域的情况下的剖面图。图17中,在TFT基板100之上形成TFT阵列层120。TFT阵列层120具有图3或者图14中示出的TAOS TFT的层结构,在其上形成有有机钝化膜。
图17为IPS方式的液晶显示装置的情况,且TFT阵列层120之上以平面状形成有公共电极121。覆盖公共电极121而形成电容绝缘膜122,在其上形成有像素电极123。像素电极123为梳齿状或者条纹状。覆盖像素电极123而形成有用于将液晶分子301初期取向的取向膜。
若在像素电极123与公共电极121之间施加影像信号,则如箭头所示,产生电力线,使液晶分子301旋转从而控制液晶层300的透过率,从而形成图像。
图17中,夹持液晶层300而配置对置基板200。在对置基板200上形成彩色滤光片201和黑矩阵202。覆盖彩色滤光片201和黑矩阵202而形成保护膜(over coat film)20,在其之上形成用于使液晶分子301初期取向的取向膜124。
图18为图17的TFT阵列层120的其他例子。图18中,作为像素的开关TFT,使用了LTPS TFT与TAOS TFT串联连接而成的TFT。图18中,左侧为LTPS TFT,右侧为TAOS TFT。
图18中,覆盖TFT而形成有机钝化膜109。有机钝化膜109之上以平面状形成公共电极121,覆盖它们而形成有电容绝缘膜122。电容绝缘膜122之上以梳齿状或者条纹状形成有像素电极123。
图18中,像素电极123经由在有机钝化膜109及电容绝缘膜122中形成的通孔140而与从TAOS TFT延伸的源电极107连接。根据本发明,对于LTPS TFT和TAOS TFT而言,能够使用共通的工艺,因此根据目的,如图18所示,能够进行LTPS TFT与TAOS TFT的各种组合。
液晶显示装置中,若向像素电极123写入影像信号的话,则通过像素电极123和公共电极121与电容绝缘膜122而形成的保持电容,而在1帧之间保持电压。此时,若TFT的漏电流大的话,则像素电极123的电压发生变化,发生闪烁等,从而不能形成良好的图像。通过使用本发明的TAOS TFT,能够获得漏电流小、具有良好的图像的液晶显示装置。
实施例4
实施例1及2中说明的LTPS TFT与TAOS TFT的组合也能够应用于有机EL显示装置。图19为有机EL显示装置2的俯视图。图19中,形成有显示区域10和周边电路区域20。显示区域10中形成有有机EL驱动TFT、开关TFT。对于开关TFT而言,优选为漏电流小的TAOS TFT。周边驱动电路通过TFT形成,但主要使用LTPS TFT。
图19中,覆盖显示区域10而粘贴有防反射用偏振片220。有机EL显示装置中由于形成有反射电极,因此为了抑制外部光反射,而使用偏振片220。在显示区域20以外的部分形成端子部150,端子部150连接用于向有机EL显示装置供给电源、信号的柔性布线基板160。
图20为图19的B-B剖面图。图20中,TFT基板100上形成有包含有机EL层的显示元件层210。显示元件层210与图19的显示区域10相对应地形成。有机EL材料由于通过水分而分解,因此为了防止水分从外部侵入,覆盖显示元件层210而通过SiNx等来形成保护层215。在保护层215之上粘贴有偏振片220。另外,在显示元件层215以外的部分上形成端子部150,端子部150连接柔性布线基板160。
图21为有机EL显示装置的显示区域的剖面图。图21中,在TFT基板100之上形成有TFT阵列层120。TFT阵列层120包含图3或者图14中所示的TAOS TFT的层结构,且在其上形成有有机钝化膜109。
图21中,在TFT阵列层120之上通过Al合金等而形成反射电极211,在其上通过ITO等而形成下部电极212。在下部电极212之上,形成有有机EL层213。有机EL层213由例如电子注入层、电子传输层、发光层、空穴传输层,空穴注入层等形成。在有机EL层213之上形成作为阴极的上部电极214。关于上部电极214,除了由作为透明导电膜的IZO(Indium ZincOxide)、ITO(Indium Tin Oxide)等而形成之外,有时也通过银等金属的薄膜而形成。覆盖上部电极213而通过SiNx等形成保护膜215,在保护膜215上通过粘接材料216而粘接用于防止反射的偏振片220。
TFT阵列层上形成有驱动TFT、开关TFT等各种TFT,通过使用本发明,能够通过共通的工艺形成LTPS TFT和TAOS TFT,因此能够使用LTPS TFT与TAOS TFT的各种组合,能够获得图像品质优异、且能够减小功耗的有机EL显示装置。
关于实施例1及2所说明的本发明中的利用LTPS的TFT,以n-MOS TFT与p-MOS TFT的对(pair)的形式进行了说明,但不限定于此,从制品规格的要求、制造工艺的要求等考虑,可以为n-MOS或者p-MOS的中的任一者的TFT。
另外,在以上说明中,以将TAOS TFT用于显示区域、将LTPS TFT用于周边驱动电路的形式进行了说明,但根据制品规格,也可以向周边电路添加TAOS TFT,向显示区域添加LTPS TFT。
另外,关于实施例1及2所说明的、本发明中的利用TAOS的TFT,以n-MOS的形式进行了说明,但不限于此,也能够设为p-MOS的TAOS。任一种情况下,通过在漏极或者源极中使用LTPS,均能够使TAOS的TFT的制造工艺与LTPS TFT的情况下的制造工艺共通。
Claims (16)
1.一种显示装置,其包含具有显示区域的基板,所述显示区域中形成有像素,所述显示装置的特征在于,
所述像素包含使用了氧化物半导体的第一TFT,
在所述第一TFT的漏极上形成有第一多晶硅,
在所述第一TFT的源极上形成有第二多晶硅,
所述第一多晶硅经由在覆盖所述第一TFT的绝缘膜中形成的第一通孔而与第一电极连接,
所述第二多晶硅经由在覆盖所述第一TFT的绝缘膜中形成的第二通孔而与第二电极连接。
2.根据权利要求1所述的显示装置,其特征在于,所述基板在所述显示区域的外侧包含驱动电路,所述驱动电路包含利用多晶硅的第二TFT。
3.根据权利要求1所述的显示装置,其特征在于,所述第一TFT为n-MOS TFT。
4.根据权利要求2所述的显示装置,其特征在于,所述第二TFT包含n-MOS TFT和p-MOSTFT。
5.根据权利要求1所述的显示装置,其特征在于,所述显示区域进一步具有第二TFT。
6.根据权利要求2所述的显示装置,其特征在于,所述驱动电路进一步包含第一TFT。
7.根据权利要求1至6中任一项所述的显示装置,其特征在于,所述显示装置为液晶显示装置。
8.根据权利要求1至6中任一项所述的显示装置,其特征在于,所述显示装置为有机EL显示装置。
9.一种显示装置,其包含具有显示区域的基板,所述显示区域中形成有像素,所述显示装置的特征在于,
所述像素包含使用了氧化物半导体的第一TFT,
在所述第一TFT的漏极上形成有第一多晶硅,
在所述第一TFT的源极上形成有第二多晶硅,
所述第一多晶硅经由在覆盖所述第一TFT的绝缘膜中形成的第一通孔而与第一电极连接,
所述第二多晶硅经由在覆盖所述第一TFT的绝缘膜中形成的第二通孔而与第二电极连接,
所述第一LTPS与所述氧化物半导体形成pn结,或
所述第二LTPS与所述氧化物半导体形成pn结。
10.根据权利要求9所述的显示装置,其特征在于,所述基板在所述显示区域的外侧包含驱动电路,所述驱动电路包含利用多晶硅形成的第二TFT。
11.根据权利要求9所述的显示装置,其特征在于,所述第一TFT为n-MOS TFT。
12.根据权利要求10所述的显示装置,其特征在于,所述第二TFT包含n-MOS TFT和p-MOS TFT。
13.根据权利要求9所述的显示装置,其特征在于,所述显示区域进一步具有第二TFT。
14.根据权利要求10所述的显示装置,其特征在于,所述驱动电路进一步包含第一TFT。
15.根据权利要求9至14中任一项所述的显示装置,其特征在于,所述显示装置为液晶显示装置。
16.根据权利要求9至14中任一项所述的显示装置,其特征在于,所述显示装置为有机EL显示装置。
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CN110620120B (zh) * | 2019-09-25 | 2022-07-29 | 福州京东方光电科技有限公司 | 阵列基板及其制作方法、显示装置 |
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