CN104051295B - 真空处理装置及其运转方法 - Google Patents
真空处理装置及其运转方法 Download PDFInfo
- Publication number
- CN104051295B CN104051295B CN201410044844.6A CN201410044844A CN104051295B CN 104051295 B CN104051295 B CN 104051295B CN 201410044844 A CN201410044844 A CN 201410044844A CN 104051295 B CN104051295 B CN 104051295B
- Authority
- CN
- China
- Prior art keywords
- vacuum
- vacuum transfer
- chamber
- processing
- container
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67184—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the presence of more than one transfer chamber
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67196—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the transfer chamber
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2013-051971 | 2013-03-14 | ||
| JP2013051971A JP6120621B2 (ja) | 2013-03-14 | 2013-03-14 | 真空処理装置及びその運転方法 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN104051295A CN104051295A (zh) | 2014-09-17 |
| CN104051295B true CN104051295B (zh) | 2017-05-10 |
Family
ID=51503975
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410044844.6A Active CN104051295B (zh) | 2013-03-14 | 2014-02-07 | 真空处理装置及其运转方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US9748124B2 (enExample) |
| JP (1) | JP6120621B2 (enExample) |
| KR (1) | KR101590533B1 (enExample) |
| CN (1) | CN104051295B (enExample) |
| TW (1) | TWI555115B (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6718755B2 (ja) * | 2016-06-22 | 2020-07-08 | 株式会社日立ハイテク | 真空処理装置およびその運転方法 |
| KR20240017095A (ko) * | 2016-06-30 | 2024-02-06 | 가부시키가이샤 코쿠사이 엘렉트릭 | 기판 처리 장치, 반도체 장치의 제조 방법 및 기록 매체 |
| JP6902379B2 (ja) | 2017-03-31 | 2021-07-14 | 東京エレクトロン株式会社 | 処理システム |
| JP7115879B2 (ja) * | 2018-03-23 | 2022-08-09 | 株式会社日立ハイテク | 真空処理装置の運転方法 |
| CN110544660B (zh) * | 2018-08-02 | 2022-08-16 | 北京北方华创微电子装备有限公司 | 模块化晶圆传输系统和半导体设备 |
| US10483142B1 (en) * | 2018-09-14 | 2019-11-19 | Lam Research Corporation | Vacuum robot positioning system with reduced sensitivity to chamber pressure |
| CN113728422B (zh) | 2020-03-24 | 2024-01-09 | 株式会社日立高新技术 | 真空处理装置 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102347256A (zh) * | 2010-07-27 | 2012-02-08 | 株式会社日立高新技术 | 真空处理装置 |
| JP2012074496A (ja) * | 2010-09-28 | 2012-04-12 | Hitachi High-Technologies Corp | 真空処理装置 |
| CN102569016A (zh) * | 2010-12-28 | 2012-07-11 | 株式会社日立高新技术 | 真空处理装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2000150618A (ja) * | 1998-11-17 | 2000-05-30 | Tokyo Electron Ltd | 真空処理システム |
| JP2003045947A (ja) * | 2001-07-27 | 2003-02-14 | Canon Inc | 基板処理装置及び露光装置 |
| JP2003059999A (ja) * | 2001-08-14 | 2003-02-28 | Tokyo Electron Ltd | 処理システム |
| KR101050275B1 (ko) * | 2002-05-21 | 2011-07-19 | 에이에스엠 아메리카, 인코포레이티드 | 반도체 프로세싱 도구 내 챔버 간의 상호 오염 감소 방법 |
| US8029226B2 (en) * | 2003-11-10 | 2011-10-04 | Brooks Automation, Inc. | Semiconductor manufacturing systems |
| US10086511B2 (en) * | 2003-11-10 | 2018-10-02 | Brooks Automation, Inc. | Semiconductor manufacturing systems |
| JP2007258347A (ja) * | 2006-03-22 | 2007-10-04 | Nitto Koki Kk | 化合物半導体の製造方法及び化合物半導体の製造装置 |
| KR100847888B1 (ko) * | 2006-12-12 | 2008-07-23 | 세메스 주식회사 | 반도체 소자 제조 장치 |
| JP4825689B2 (ja) * | 2007-01-12 | 2011-11-30 | 株式会社日立ハイテクノロジーズ | 真空処理装置 |
| JP2009062604A (ja) * | 2007-09-10 | 2009-03-26 | Tokyo Electron Ltd | 真空処理システムおよび基板搬送方法 |
| JP5295808B2 (ja) * | 2009-02-09 | 2013-09-18 | 東京エレクトロン株式会社 | パーティクル付着防止方法及び被処理基板の搬送方法 |
| TW201123340A (en) * | 2009-11-12 | 2011-07-01 | Hitachi High Tech Corp | Vacuum processing system and vacuum processing method of semiconductor processing substrate |
-
2013
- 2013-03-14 JP JP2013051971A patent/JP6120621B2/ja active Active
-
2014
- 2014-01-17 TW TW103101817A patent/TWI555115B/zh active
- 2014-01-28 KR KR1020140010133A patent/KR101590533B1/ko active Active
- 2014-02-07 CN CN201410044844.6A patent/CN104051295B/zh active Active
- 2014-02-19 US US14/183,645 patent/US9748124B2/en active Active
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102347256A (zh) * | 2010-07-27 | 2012-02-08 | 株式会社日立高新技术 | 真空处理装置 |
| JP2012074496A (ja) * | 2010-09-28 | 2012-04-12 | Hitachi High-Technologies Corp | 真空処理装置 |
| CN102569016A (zh) * | 2010-12-28 | 2012-07-11 | 株式会社日立高新技术 | 真空处理装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI555115B (zh) | 2016-10-21 |
| KR101590533B1 (ko) | 2016-02-01 |
| CN104051295A (zh) | 2014-09-17 |
| JP6120621B2 (ja) | 2017-04-26 |
| US20140271049A1 (en) | 2014-09-18 |
| US9748124B2 (en) | 2017-08-29 |
| KR20140113324A (ko) | 2014-09-24 |
| JP2014179431A (ja) | 2014-09-25 |
| TW201448095A (zh) | 2014-12-16 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104051295B (zh) | 真空处理装置及其运转方法 | |
| JP5785712B2 (ja) | 真空処理装置 | |
| KR101220790B1 (ko) | 진공 처리 장치, 진공 처리 장치의 운전 방법 및 기억 매체 | |
| KR101155534B1 (ko) | 진공처리장치 | |
| TWI408766B (zh) | Vacuum processing device | |
| KR20190036476A (ko) | 기판 처리 장치, 기판 처리 방법 및 컴퓨터 기억 매체 | |
| JP2011124565A (ja) | 半導体被処理基板の真空処理システム及び半導体被処理基板の真空処理方法 | |
| KR20140041820A (ko) | 진공처리장치 | |
| CN108428654B (zh) | 基板处理系统和基板输送方法 | |
| JP5710194B2 (ja) | 真空処理装置 | |
| JP6718755B2 (ja) | 真空処理装置およびその運転方法 | |
| JP5892828B2 (ja) | 真空処理装置 | |
| JP2004071784A (ja) | 基板のクリーン搬送装置および当該装置に対する基板のローディング方法 | |
| JP2767142B2 (ja) | 真空処理装置用ユニット | |
| TWI695448B (zh) | 真空處理裝置的運轉方法 | |
| JP7307241B1 (ja) | 基板自動搬送装置 | |
| WO2014041656A1 (ja) | 真空処理装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |