CN102428651A - 宽带隙半导体功率结型场效应晶体管的高温栅极驱动器及包括该栅极驱动器的集成电路 - Google Patents
宽带隙半导体功率结型场效应晶体管的高温栅极驱动器及包括该栅极驱动器的集成电路 Download PDFInfo
- Publication number
- CN102428651A CN102428651A CN2010800198830A CN201080019883A CN102428651A CN 102428651 A CN102428651 A CN 102428651A CN 2010800198830 A CN2010800198830 A CN 2010800198830A CN 201080019883 A CN201080019883 A CN 201080019883A CN 102428651 A CN102428651 A CN 102428651A
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- CN
- China
- Prior art keywords
- jfet
- electrically coupled
- terminal
- drain electrode
- gate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title abstract description 6
- 229910010271 silicon carbide Inorganic materials 0.000 claims abstract description 38
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 claims abstract description 37
- 230000005669 field effect Effects 0.000 claims abstract description 7
- 239000003990 capacitor Substances 0.000 claims description 16
- GOLXNESZZPUPJE-UHFFFAOYSA-N spiromesifen Chemical compound CC1=CC(C)=CC(C)=C1C(C(O1)=O)=C(OC(=O)CC(C)(C)C)C11CCCC1 GOLXNESZZPUPJE-UHFFFAOYSA-N 0.000 claims description 7
- 230000007935 neutral effect Effects 0.000 claims description 4
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 10
- 230000004048 modification Effects 0.000 description 6
- 238000012986 modification Methods 0.000 description 6
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000295 complement effect Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- 230000008878 coupling Effects 0.000 description 1
- 238000010168 coupling process Methods 0.000 description 1
- 238000005859 coupling reaction Methods 0.000 description 1
- 230000008676 import Effects 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 230000013011 mating Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
- H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/04—Modifications for accelerating switching
- H03K17/041—Modifications for accelerating switching without feedback from the output circuit to the control circuit
- H03K17/0412—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit
- H03K17/04123—Modifications for accelerating switching without feedback from the output circuit to the control circuit by measures taken in the control circuit in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
- H03K2017/6875—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors using self-conductive, depletion FETs
Landscapes
- Junction Field-Effect Transistors (AREA)
- Electronic Switches (AREA)
- Logic Circuits (AREA)
Abstract
Description
Claims (22)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US12/437,173 US7969226B2 (en) | 2009-05-07 | 2009-05-07 | High temperature gate drivers for wide bandgap semiconductor power JFETs and integrated circuits including the same |
US12/437,173 | 2009-05-07 | ||
PCT/US2010/033982 WO2010129837A2 (en) | 2009-05-07 | 2010-05-07 | High temperature gate drivers for wide bandgap semiconductor power jfets and integrated circuits including the same |
Publications (2)
Publication Number | Publication Date |
---|---|
CN102428651A true CN102428651A (zh) | 2012-04-25 |
CN102428651B CN102428651B (zh) | 2015-02-18 |
Family
ID=43050891
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201080019883.0A Expired - Fee Related CN102428651B (zh) | 2009-05-07 | 2010-05-07 | 宽带隙半导体功率结型场效应晶体管的高温栅极驱动器及包括该栅极驱动器的集成电路 |
Country Status (9)
Country | Link |
---|---|
US (2) | US7969226B2 (zh) |
EP (1) | EP2427964A4 (zh) |
JP (1) | JP5433827B2 (zh) |
KR (1) | KR20120026517A (zh) |
CN (1) | CN102428651B (zh) |
AU (1) | AU2010245759A1 (zh) |
CA (1) | CA2759195A1 (zh) |
NZ (1) | NZ596258A (zh) |
WO (1) | WO2010129837A2 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103384147A (zh) * | 2012-05-03 | 2013-11-06 | 阿尔斯通运输股份有限公司 | 包括具有高开关速度的电子元件的设备 |
CN108336987A (zh) * | 2017-01-03 | 2018-07-27 | 通用电气公司 | 用于栅极驱动电路的系统和方法 |
Families Citing this family (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7969226B2 (en) * | 2009-05-07 | 2011-06-28 | Semisouth Laboratories, Inc. | High temperature gate drivers for wide bandgap semiconductor power JFETs and integrated circuits including the same |
KR101863199B1 (ko) * | 2011-02-10 | 2018-07-02 | 삼성디스플레이 주식회사 | 인버터 및 이를 이용한 주사 구동부 |
SG11201401015PA (en) * | 2011-09-30 | 2014-04-28 | Soitec Silicon On Insulator | Pseudo-inverter circuit with multiple independent gate transistors |
EP2987240A4 (en) * | 2013-04-17 | 2016-12-21 | Otis Elevator Co | DRIVE UNIT WITH GALLIUM NITRIDE SWITCHES |
US9246476B2 (en) * | 2013-05-10 | 2016-01-26 | Semiconductor Energy Laboratory Co., Ltd. | Driver circuit |
JP6558359B2 (ja) * | 2014-02-24 | 2019-08-14 | パナソニック株式会社 | 半導体装置 |
US9401677B2 (en) * | 2014-08-20 | 2016-07-26 | Short Circuit Technologies Llc | Split transformer based digitally controlled oscillator and DC-coupled buffer circuit therefor |
US9722595B2 (en) | 2015-12-29 | 2017-08-01 | General Electric Company | Ultra high performance silicon carbide gate drivers |
WO2017190652A1 (en) | 2016-05-04 | 2017-11-09 | The Hong Kong University Of Science And Technology | Power device with integrated gate driver |
JP6713647B2 (ja) * | 2016-05-10 | 2020-06-24 | 国立大学法人広島大学 | 炭化珪素半導体装置 |
US10068529B2 (en) * | 2016-11-07 | 2018-09-04 | International Business Machines Corporation | Active matrix OLED display with normally-on thin-film transistors |
US11218145B2 (en) | 2017-08-30 | 2022-01-04 | University Of Houston System | High temperature gate driver for silicon carbide metal-oxide-semiconductor field-effect transistor |
FR3084801B1 (fr) | 2018-08-06 | 2020-08-28 | Commissariat Energie Atomique | Circuit de commande de bras d'onduleur |
KR102105945B1 (ko) * | 2018-12-10 | 2020-04-29 | 포항공과대학교 산학협력단 | 의사 상보성 로직 네트워크 |
US11101796B2 (en) * | 2020-01-06 | 2021-08-24 | Diodes Incorporated | Gate drive apparatus and control method |
CN113078888B (zh) * | 2020-01-06 | 2024-04-19 | 达尔科技股份有限公司 | 栅极驱动设备和控制方法 |
US11437911B2 (en) | 2020-12-22 | 2022-09-06 | Power Integrations, Inc. | Variable drive strength in response to a power converter operating condition |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH06132309A (ja) * | 1992-10-15 | 1994-05-13 | Ricoh Co Ltd | 電界効果トランジスタおよびその製造方法 |
EP0448047B1 (en) * | 1990-03-19 | 1995-02-01 | Kabushiki Kaisha Toshiba | Field effect transistor circuit |
US20050258458A1 (en) * | 2004-05-18 | 2005-11-24 | Hung-I Wang | JFET driver circuit and JFET driving method |
CN101237189A (zh) * | 2007-01-31 | 2008-08-06 | 力博特公司 | 正激变换器 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
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JPS5211199B1 (zh) | 1970-05-27 | 1977-03-29 | ||
US3775693A (en) | 1971-11-29 | 1973-11-27 | Moskek Co | Mosfet logic inverter for integrated circuits |
JPS5198938A (zh) | 1975-02-26 | 1976-08-31 | ||
US4096398A (en) * | 1977-02-23 | 1978-06-20 | National Semiconductor Corporation | MOS output buffer circuit with feedback |
US4417162A (en) | 1979-01-11 | 1983-11-22 | Bell Telephone Laboratories, Incorporated | Tri-state logic buffer circuit |
JPS57196627A (en) * | 1981-05-29 | 1982-12-02 | Hitachi Ltd | Electronic circuit device |
JP2709604B2 (ja) | 1988-06-29 | 1998-02-04 | 大日本製薬株式会社 | マイコプラズマ汚染の防止または除去 |
DE3835119A1 (de) * | 1988-10-14 | 1990-04-19 | Siemens Ag | Leistungsverstaerkerschaltung fuer integrierte digitalschaltungen |
JP3418993B2 (ja) * | 1991-02-26 | 2003-06-23 | 日本電気株式会社 | 半導体集積回路 |
JPH1098367A (ja) * | 1996-09-25 | 1998-04-14 | Nec Corp | 半導体論理回路 |
US7330055B2 (en) * | 2004-10-26 | 2008-02-12 | Qortek, Inc. | Circuit with high power density applicability |
US7592841B2 (en) | 2006-05-11 | 2009-09-22 | Dsm Solutions, Inc. | Circuit configurations having four terminal JFET devices |
JP4990034B2 (ja) | 2006-10-03 | 2012-08-01 | 三菱電機株式会社 | シフトレジスタ回路およびそれを備える画像表示装置 |
US7969226B2 (en) * | 2009-05-07 | 2011-06-28 | Semisouth Laboratories, Inc. | High temperature gate drivers for wide bandgap semiconductor power JFETs and integrated circuits including the same |
-
2009
- 2009-05-07 US US12/437,173 patent/US7969226B2/en not_active Expired - Fee Related
-
2010
- 2010-05-07 AU AU2010245759A patent/AU2010245759A1/en not_active Abandoned
- 2010-05-07 JP JP2012509996A patent/JP5433827B2/ja not_active Expired - Fee Related
- 2010-05-07 EP EP10772865.1A patent/EP2427964A4/en not_active Withdrawn
- 2010-05-07 NZ NZ596258A patent/NZ596258A/xx not_active IP Right Cessation
- 2010-05-07 WO PCT/US2010/033982 patent/WO2010129837A2/en active Application Filing
- 2010-05-07 KR KR1020117028269A patent/KR20120026517A/ko not_active Application Discontinuation
- 2010-05-07 CN CN201080019883.0A patent/CN102428651B/zh not_active Expired - Fee Related
- 2010-05-07 CA CA2759195A patent/CA2759195A1/en not_active Abandoned
-
2011
- 2011-05-11 US US13/105,543 patent/US8466735B2/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP0448047B1 (en) * | 1990-03-19 | 1995-02-01 | Kabushiki Kaisha Toshiba | Field effect transistor circuit |
JPH06132309A (ja) * | 1992-10-15 | 1994-05-13 | Ricoh Co Ltd | 電界効果トランジスタおよびその製造方法 |
US20050258458A1 (en) * | 2004-05-18 | 2005-11-24 | Hung-I Wang | JFET driver circuit and JFET driving method |
CN101237189A (zh) * | 2007-01-31 | 2008-08-06 | 力博特公司 | 正激变换器 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103384147A (zh) * | 2012-05-03 | 2013-11-06 | 阿尔斯通运输股份有限公司 | 包括具有高开关速度的电子元件的设备 |
CN103384147B (zh) * | 2012-05-03 | 2017-03-01 | 阿尔斯通运输科技公司 | 包括具有高开关速度的电子元件的设备 |
CN108336987A (zh) * | 2017-01-03 | 2018-07-27 | 通用电气公司 | 用于栅极驱动电路的系统和方法 |
CN108336987B (zh) * | 2017-01-03 | 2021-03-09 | 通用电气公司 | 用于栅极驱动电路的系统和方法 |
Also Published As
Publication number | Publication date |
---|---|
EP2427964A4 (en) | 2014-07-09 |
JP2012526487A (ja) | 2012-10-25 |
US8466735B2 (en) | 2013-06-18 |
AU2010245759A1 (en) | 2011-11-24 |
US20110210340A1 (en) | 2011-09-01 |
EP2427964A2 (en) | 2012-03-14 |
WO2010129837A3 (en) | 2011-02-17 |
JP5433827B2 (ja) | 2014-03-05 |
US20100283061A1 (en) | 2010-11-11 |
US7969226B2 (en) | 2011-06-28 |
NZ596258A (en) | 2013-06-28 |
CA2759195A1 (en) | 2010-11-11 |
CN102428651B (zh) | 2015-02-18 |
WO2010129837A2 (en) | 2010-11-11 |
KR20120026517A (ko) | 2012-03-19 |
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