CN101842712B - 插入件、托盘及电子元件测试装置 - Google Patents

插入件、托盘及电子元件测试装置 Download PDF

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Publication number
CN101842712B
CN101842712B CN200780101442.3A CN200780101442A CN101842712B CN 101842712 B CN101842712 B CN 101842712B CN 200780101442 A CN200780101442 A CN 200780101442A CN 101842712 B CN101842712 B CN 101842712B
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China
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electronic component
insert
aforementioned
pallet
main body
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Chinese (zh)
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CN101842712A (zh
Inventor
筬部明浩
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Advantest Corp
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Advantest Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
CN200780101442.3A 2007-11-26 2007-11-26 插入件、托盘及电子元件测试装置 Active CN101842712B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2007/072789 WO2009069190A1 (ja) 2007-11-26 2007-11-26 インサート、トレイ及び電子部品試験装置

Publications (2)

Publication Number Publication Date
CN101842712A CN101842712A (zh) 2010-09-22
CN101842712B true CN101842712B (zh) 2013-01-30

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ID=40678108

Family Applications (1)

Application Number Title Priority Date Filing Date
CN200780101442.3A Active CN101842712B (zh) 2007-11-26 2007-11-26 插入件、托盘及电子元件测试装置

Country Status (6)

Country Link
JP (1) JPWO2009069190A1 (ja)
KR (1) KR101149747B1 (ja)
CN (1) CN101842712B (ja)
PT (1) PT104140A (ja)
TW (1) TWI396847B (ja)
WO (1) WO2009069190A1 (ja)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013053991A (ja) * 2011-09-06 2013-03-21 Seiko Epson Corp ハンドラー及び部品検査装置
KR101488488B1 (ko) * 2013-07-09 2015-02-02 주식회사 오킨스전자 엘이디모듈 테스트장치
TW201610444A (zh) * 2014-09-11 2016-03-16 Motech Taiwan Automatic Corp 電子元件測試模組之啓閉裝置（三）
KR101887071B1 (ko) * 2016-09-01 2018-09-10 리노공업주식회사 검사장치의 슬라이더 조작기구
CN116643065B (zh) * 2023-07-26 2023-11-07 中国电子科技集团公司第十研究所 一种模拟类模块用柔性装夹装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW530159B (en) * 1999-07-16 2003-05-01 Advantest Corp Insert for electric devices testing apparatus
CN1610832A (zh) * 2002-03-06 2005-04-27 株式会社爱德万测试 插入体和具有它的电子部件处理装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6369595B1 (en) * 1999-01-21 2002-04-09 Micron Technology, Inc. CSP BGA test socket with insert and method
JP4222442B2 (ja) * 1999-07-16 2009-02-12 株式会社アドバンテスト 電子部品試験装置用インサート
JP4279413B2 (ja) * 1999-07-16 2009-06-17 株式会社アドバンテスト 電子部品試験装置用インサート
AU2003227357A1 (en) * 2003-04-23 2004-11-19 Advantest Corporation Insert and tray respectively for electronic component handling device and electronic component handling device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TW530159B (en) * 1999-07-16 2003-05-01 Advantest Corp Insert for electric devices testing apparatus
CN1610832A (zh) * 2002-03-06 2005-04-27 株式会社爱德万测试 插入体和具有它的电子部件处理装置

Also Published As

Publication number Publication date
JPWO2009069190A1 (ja) 2011-04-07
KR101149747B1 (ko) 2012-06-01
TWI396847B (zh) 2013-05-21
TW200946917A (en) 2009-11-16
CN101842712A (zh) 2010-09-22
PT104140A (pt) 2008-09-17
KR20100052564A (ko) 2010-05-19
WO2009069190A1 (ja) 2009-06-04

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