CN101714532B - 封装件及其制造方法 - Google Patents

封装件及其制造方法 Download PDF

Info

Publication number
CN101714532B
CN101714532B CN2009101592890A CN200910159289A CN101714532B CN 101714532 B CN101714532 B CN 101714532B CN 2009101592890 A CN2009101592890 A CN 2009101592890A CN 200910159289 A CN200910159289 A CN 200910159289A CN 101714532 B CN101714532 B CN 101714532B
Authority
CN
China
Prior art keywords
those
carrier
conductive layer
cabling
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN2009101592890A
Other languages
English (en)
Other versions
CN101714532A (zh
Inventor
金炯鲁
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Advanced Semiconductor Engineering Inc
Original Assignee
Advanced Semiconductor Engineering Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advanced Semiconductor Engineering Inc filed Critical Advanced Semiconductor Engineering Inc
Publication of CN101714532A publication Critical patent/CN101714532A/zh
Application granted granted Critical
Publication of CN101714532B publication Critical patent/CN101714532B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4821Flat leads, e.g. lead frames with or without insulating supports
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/48Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
    • H01L21/4814Conductive parts
    • H01L21/4821Flat leads, e.g. lead frames with or without insulating supports
    • H01L21/4828Etching
    • H01L21/4832Etching a temporary substrate after encapsulation process to form leads
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/50Assembly of semiconductor devices using processes or apparatus not provided for in a single one of the subgroups H01L21/06 - H01L21/326, e.g. sealing of a cap to a base of a container
    • H01L21/56Encapsulations, e.g. encapsulation layers, coatings
    • H01L21/568Temporary substrate used as encapsulation process aid
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49579Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
    • H01L23/49582Metallic layers on lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/48Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
    • H01L23/488Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
    • H01L23/495Lead-frames or other flat leads
    • H01L23/49579Lead-frames or other flat leads characterised by the materials of the lead frames or layers thereon
    • H01L23/49586Insulating layers on lead frames
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8538Bonding interfaces outside the semiconductor or solid-state body
    • H01L2224/85399Material
    • H01L2224/854Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/85438Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/85444Gold (Au) as principal constituent
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42Wire connectors; Manufacturing methods related thereto
    • H01L24/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/00014Technical content checked by a classifier the subject-matter covered by the group, the symbol of which is combined with the symbol of this group, being disclosed without further technical details
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01079Gold [Au]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181Encapsulation

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Led Device Packages (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Wire Bonding (AREA)

Abstract

一种封装件及其制造方法。封装件包括一导电层、一芯片、数个第一焊垫、数条焊线及一封胶。导电层具有一芯片承座且包括数条走线。每一走线的路径实质上平行于芯片承座的一承座面,每一走线具有一走线上表面及一走线下表面。芯片设置于承座面上且具有数个接垫。第一焊垫对应地形成于走线上表面。焊线电性连接接垫与第一焊垫。封胶包覆导电层、第一焊垫、芯片及焊线,并裸露导电层的下表面,而导电层突出于封胶的底面。

Description

封装件及其制造方法
技术领域
本发明是有关于一种封装件及其制造方法,且特别是有关于一种裸露出芯片承座的封装件及其制造方法。
背景技术
现今的电子产品功能愈来愈强大,相对的用电量也增加。用电量一增加,电子产品内的电子组件的负荷也就愈重,也因此造成更多热量的产生。因此,电子组件的散热性也愈来愈受重视。
电子组件,例如是封装件,多是把芯片完全地包覆在封胶内。这样的封装方式不用质疑地对散热是一大障碍。虽然,有些封装件以加装散热片的方式来增加散热量,但是封装件的散热能力是永远不会被满足的。因此,如何提升封装件的散热性是产业发展的重点之一。
发明内容
本发明是有关于一种封装件及其制造方法,经由芯片承座突出于封胶的底面的方式,增加芯片承座与封装件的外部的接触面积。因此,提升了封装件的散热性。
根据本发明的一方面,提出一种封装件。封装件包括一导电层、一芯片、数个第一焊垫、数条焊线及一封胶。导电层具有一芯片承座(Die Pad)且包括数条走线。每一走线的路径实质上平行于芯片承座的一承座面,每一走线具有一走线上表面及一走线下表面。芯片设置于承座面上,芯片具有数个接垫。第一焊垫对应地形成于走线上表面。焊线电性连接接垫与第一焊垫。封胶包覆导电层、第一焊垫、芯片及焊线,并裸露导电层的下表面。其中,导电层突出于封胶的底面。
根据本发明的另一方面,提出一种封装件的制造方法。制造方法包括以下步骤。提供一载体(carrier)。形成一线路图案层于载体的一载体上表面。形成一导电层于载体上表面,导电层与线路图案层互补,导电层具有一芯片承座且包括数条走线,每一走线的路径实质上平行于芯片承座的一承座面,每一走线具有一走线上表面及一走线下表面。对应地形成数个第一焊垫于走线上表面。设置一芯片于承座面上,芯片具有数个接垫。以数条焊线电性连接接垫与第一焊垫。以一封胶包覆导电层、第一焊垫、芯片及焊线。移除载体与线路图案层,以裸露出导电层的下表面,而导电层突出于封胶的底面。
为让本发明的上述内容能更明显易懂,下文特举较佳实施例,并配合附图,作详细说明如下:
附图说明
图1绘示依照本发明第一实施例的封装件的制造方法的流程图。
图2绘示第一实施例的载体的剖切图。
图3A绘示第一实施例形成有线路图案层的载体的剖切图。
图3B绘示图3A的形成有线路图案层的载体的俯视图。
图4A至4C绘示图3A的线路图案层的形成示意图。
图5绘示第一实施例形成有有机薄膜的载体的剖切图。
图6绘示第一实施例形成有第二焊垫的载体的剖切图。
图7绘示第一实施例形成有导电层的载体的剖切图。
图8绘示第一实施例形成有第一焊垫的载体的剖切图。
图9绘示第一实施例形成有第一绝缘层的载体的剖切图。
图10绘示第一实施例形成有芯片的载体的剖切图。
图11绘示第一实施例形成有焊线的载体的剖切图。
图12绘示第一实施例形成有封胶的载体的剖切图。
图13绘示图12的载体及线路图案层被移除后的剖切图。
图14绘示第一实施例形成有第二绝缘层的载体的剖切图。
图15绘示图14的封装件252的底视图。
图16绘示依照本发明第二实施例的封装件的制造方法的流程图。
图17A至17I绘示图16的各步骤示意图。
主要组件符号说明
202:载体
204:线路图案层
206:载体上表面
208、308:导电层
210、310:芯片承座
212、312:走线
214、314:承座面
216、316:走线上表面
218、318:走线下表面
220、320:第一焊垫
222、322:芯片
224、324:接垫
226、326:焊线
228、328:封胶
230、330:导电层的下表面
232、332:封胶的底面
234:有机薄膜
236、244、336、344:镍层
238、242、338、342:金层
240、340:第二焊垫
246:光阻层
248、348:第一绝缘层
250、350:第二绝缘层
252、352:封装件
254:封装件的四边
256:空间
具体实施方式
以下是提出较佳实施例作为本发明的说明,然而实施例所提出的内容,仅为举例说明之用,而绘制的图式为配合说明,并非作为限缩本发明保护范围之用。再者,实施例的图标亦省略不必要的组件,以利清楚显示本发明的技术特点。
第一实施例
请参照图1,其绘示依照本发明第一实施例的封装件的制造方法的流程图。制造方法包括以下步骤。
于步骤S102中,请同时参照图2,其绘示第一实施例的载体的剖切图。提供一载体(carrier)202。载体202的材质为一金属,例如是铜金属。
接着,于步骤S104中,请同时参照图3A及图3B,图3A绘示第一实施例形成有线路图案层的载体的剖切图,图3B绘示图3A的形成有线路图案层的载体的俯视图。如图3A及图3B所示,形成一线路图案层204于载体202的一载体上表面206。其中,线路图案层204露出数个空间256。线路图案层204的材质为金属,例如是铜金属。
此外,请同时参照图4A至4C,其绘示图3A的线路图案层的形成示意图。线路图案层204的形成步骤如下。如图4A所示,于步骤S104后,形成一光阻层246于载体上表面206。
然后,如图4B所示,图案化光阻层246。
然后,如图4C所示,形成线路图案层204于载体上表面206。在移除光阻层246后就完成如图3A所示的线路图案层204。
此外,于步骤S104之后,请同时参照图5,其绘示第一实施例形成有有机薄膜的载体的剖切图。制造方法可更包括形成一有机薄膜(organic film)234于载体202上及线路图案层204上的步骤。有机薄膜234具有黏合性,可以黏住载体202及线路图案层204。有机薄膜234的形成方式可应用化学处理的方式完成。
然后,于步骤S106中,请同时参照图6,其绘示第一实施例形成有第二焊垫的载体的剖切图。对应地形成数个第二焊垫240于载体202上,第二焊垫240包括一金层242及一镍层244。进一步地说,形成第二焊垫240的步骤为两步骤所完成,即于步骤S104之后,形成金层242于载体202上。然后,再形成镍层244于金层242上。
然后,于步骤S108中,请同时参照图7,其绘示第一实施例形成有导电层的载体的剖切图。形成一导电层208于载体上表面206上的有机薄膜234。导电层208与线路图案层204互补,也就是说,导电层208将图3A的该些空间256填满。此外,导电层208具有一芯片承座210且包括数条走线212,每一走线212具有一走线上表面216及一走线下表面218。
然后,于步骤S110中,请同时参照图8,其绘示第一实施例形成有第一焊垫的载体的剖切图。对应地形成数个第一焊垫220于走线上表面216。第一焊垫220包括一镍层236及一金层238。也就是说,第一焊垫220的形成步骤为两步骤所完成,即,于步骤S108之后,形成镍层236于走线212上。然后,再形成金层238于镍层236上。
然后,于步骤S112中,请同时参照图9,其绘示第一实施例形成有第一绝缘层的载体的剖切图。形成一第一绝缘层248于走线上表面216(走线上表面216绘示于图7),第一绝缘层248裸露出第一焊垫220。第一绝缘层248的形成方法例如是以化学浸泡(dipping)的方式完成。
然后,于步骤S114中,请同时参照图10,其绘示第一实施例形成有芯片的载体的剖切图。设置一芯片222于承座面214上。芯片222具有数个接垫224。
然后,于步骤S116中,请同时参照图11,其绘示第一实施例形成有焊线的载体的剖切图。以数条焊线226电性连接接垫224与第一焊垫220。
然后,于步骤S118中,请同时参照图12,其绘示第一实施例形成有封胶的载体的示意图。以一封胶228包覆导电层208、第一焊垫220、芯片222及焊线226。
然后,于步骤S120中,请同时参照图13,其绘示图12的载体及线路图案层被移除后的剖切图。移除载体202、线路图案层204及有机薄膜234,以裸露出导电层208的下表面230。也就是说,当载体202与线路图案层204移除后,芯片承座210的下表面及走线212的下表面被裸露出来。而移除载体202与线路图案层204的方式例如是采用一剥离(peel off)方式完成。由于有机薄膜234黏住载体202及线路图案层204,所以只需要轻微的力量就能以剥离的方式,例如是用手撕除有机薄膜234的方式,同时移除有机薄膜234、载体202及线路图案层204。
由于导电层208与线路图案层204呈互补(如图7所示),所以在移除线路图案层204后,芯片承座210的下表面及走线212的下表面除了被裸露出来外,更突出于封胶228的底面232,如图13所示。由于导电层208(即芯片承座210及走线212)突出于封胶228的底面232,故增加了导电层208与封装件252的外部的接触面积。如此,芯片222所产生的热量可以经由芯片承座210快速地传导至外部,以提升封装件252的散热性。
此外,于步骤S122中,请参照图14,其绘示第一实施例形成有第二绝缘层的载体的剖切图。形成一第二绝缘层250于走线下表面218,第二绝缘层250裸露出第二焊垫240。同样地,第二绝缘层250的形成方法例如是以化学浸泡完成。至此,完成依照本发明第一实施例的封装件252。
此外,请参照图15,其绘示图14的封装件252的底视图。走线212的路径实质上平行于芯片承座210的承座面214(承座面214绘示于图7)。也就是说,第一实施例的第二焊垫240位于走线212的一端,该端沿着承座面214延伸至邻近于封装件252的四边254。封装件252可经由延伸至四边254的第二焊垫240与外部组件,例如是电路板(未绘示)进行电性连接。
第二实施例
请参照图16及图17A至17I,图16绘示依照本发明第二实施例的封装件的制造方法的流程图,图17A至17I绘示图16的各步骤示意图。第二实施例中与第一实施例相同之处沿用相同标号,在此不再赘述。第二实施例与第一实施例不同之处在第二绝缘层的形成步骤S402可接续于步骤S104之后。
进一步地说,于步骤S102、步骤S104及形成有机薄膜234的动作完成之后,进入步骤S402,请同时参照图17A,其绘示第二实施例形成有第二绝缘层的载体剖切图。形成第二绝缘层350于载体202的载体202上。
然后,于步骤S106,请同时参照图17B,其绘示第二实施例形成有第二焊垫的载体的示意图。对应地形成数个第二焊垫340于载体202上。同样地,第二焊垫340也包括一金层342及一镍层344。也就是说,第二焊垫340的形成步骤为两步骤所完成,于步骤S402之后,形成金层342于载体202上。然后,再形成镍层344于金层342上。
然后,于步骤S108,请同时参照图17C,其绘示第二实施例形成有导电层的载体的示意图。形成导电层308于载体202上。导电层308与线路图案层204互补。导电层308具有一芯片承座310且包括数条走线312,每一走线312具有一走线上表面316及一走线下表面318。
然后,于步骤S110中,请同时参照图17D,其绘示第二实施例形成有第一焊垫的载体的示意图。对应地形成数个第一焊垫320于走线上表面316。第一焊垫320包括一镍层336及一金层338。也就是说,第一焊垫320的形成步骤为两步骤所完成,于步骤S108之后,形成镍层336于走线312上。然后,再形成金层338于镍层336上。
然后,于步骤S112中,请同时参照图17E,其绘示第二实施例形成有第一绝缘层的载体的示意图。形成一第一绝缘层348于走线上表面316,第一绝缘层348裸露出第一焊垫320。
然后,于步骤S114中,请同时参照图17F,其绘示第二实施例形成有芯片的载体的示意图。设置芯片322于承座面314上。
然后,于步骤S 116中,请同时参照图17G,其绘示第二实施例形成有焊线的载体的示意图。以焊线326电性连接接垫324与第一焊垫320。
然后,于步骤S118中,请同时参照图17H,其绘示第一实施例形成有封胶的载体的示意图。以一封胶328包覆导电层308、第一焊垫320、芯片322及焊线326。
然后,于步骤S120中,请同时参照图17I,其绘示图17H的载体及线路图案层被移除后的示意图。移除载体202与线路图案层204,以裸露出导电层308的下表面330。至此,完成依照本发明第二实施例的封装件352。
如图17I所示,导电层308突出于封胶328的底面332,使得导电层308与封装件352的外部的接触面积增加。所以,芯片322所产生的热量可以快速地传导至外部,提升了封装件352的散热性。
本发明上述实施例所揭露的封装件及其制造方法,导电层突出于封胶的底面,增加了导电层与封装件的外部的接触面积。因此,芯片所产生的热量可以经由芯片承座快速地传导至外部,提升封装件的散热性。
综上所述,虽然本发明已以较佳实施例揭露如上,然其并非用以限定本发明。本发明所属技术领域中具有通常知识者,在不脱离本发明的精神和范围内,当可作各种的更动与润饰。因此,本发明的保护范围当视后附的权利要求书所界定者为准。

Claims (13)

1.一种封装件,包括:
一导电层,具有一芯片承座且包括数条走线,所述走线的路径平行于该芯片承座的上表面,所述走线具有一走线上表面及一走线下表面;
一芯片,设置于该承座的上表面上,该芯片具有数个接垫;
数个第一焊垫,对应地形成于该些走线上表面;
数条焊线,电性连接该些接垫与该些第一焊垫;以及
一封胶,包覆该导电层、该些第一焊垫、该芯片及该些焊线,并裸露该导电层的下表面;
其中,该导电层突出于该封胶的底面。
2.如权利要求1所述的封装件,更包括:
一第一绝缘层,形成于该些走线上表面,该第一绝缘层裸露出该些第一焊垫。
3.如权利要求1所述的封装件,更包括:
数个第二焊垫,对应地形成于该些走线下表面。
4.如权利要求3所述的封装件,更包括:
一第二绝缘层,形成于该些走线下表面,该第二绝缘层裸露出该些第二焊垫。
5.一种封装件的制造方法,包括:
提供一载体;
形成一线路图案层于该载体的一载体上表面;
形成一导电层于该载体上,该导电层与该线路图案层互补,该导电层具有一芯片承座且包括数条走线,所述走线的路径平行于该芯片承座的一承座的上表面,所述走线具有一走线上表面及一走线下表面;
对应地形成数个第一焊垫于该些走线上表面;
设置一芯片于该承座的上表面上,该芯片具有数个接垫;
以数条焊线电性连接该些接垫与该些第一焊垫;
以一封胶包覆该导电层、该些第一焊垫、该芯片及该些焊线;以及
移除该载体与该线路图案层,以裸露出导电层的下表面,该导电层突出于该封胶的底面。
6.如权利要求5所述的制造方法,其中于形成该线路图案层的该步骤与形成该导电层的该步骤之间,该制造方法更包括:
形成一有机薄膜于该载体上及该线路图案层上。
7.如权利要求5所述的制造方法,其中形成该些第一焊垫的该步骤包括:
形成一镍层于该些走线上;以及
形成一金层于该镍层上。
8.如权利要求5所述的制造方法,更包括:
对应地形成数个第二焊垫于该载体上。
9.如权利要求8所述的制造方法,其中形成该些第二焊垫的该步骤包括:
形成一金层于该载体上;以及
形成一镍层于该金层上。
10.如权利要求8所述的制造方法,其中于移除该载体的该步骤后,该制造方法更包括:
形成一第二绝缘层于该些走线下表面,该第二绝缘层裸露出该些第二焊垫。
11.如权利要求5所述的制造方法,其中于形成该线路图案层的该步骤及形成该导电层的该步骤之间,该制造方法更包括:
形成一第二绝缘层于该载体上。
12.如权利要求5所述的制造方法,其中于形成该导电层的该步骤后,该制造方法更包括:
形成一第一绝缘层于该些走线上表面,该第一绝缘层裸露出该些第一焊垫。
13.如权利要求5所述的制造方法,其中于移除该载体与该线路图案层的该步骤采用一剥离方式完成。
CN2009101592890A 2008-10-02 2009-08-06 封装件及其制造方法 Active CN101714532B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US12/285,348 US7830024B2 (en) 2008-10-02 2008-10-02 Package and fabricating method thereof
US12/285,348 2008-10-02

Publications (2)

Publication Number Publication Date
CN101714532A CN101714532A (zh) 2010-05-26
CN101714532B true CN101714532B (zh) 2011-08-17

Family

ID=42075153

Family Applications (1)

Application Number Title Priority Date Filing Date
CN2009101592890A Active CN101714532B (zh) 2008-10-02 2009-08-06 封装件及其制造方法

Country Status (3)

Country Link
US (1) US7830024B2 (zh)
CN (1) CN101714532B (zh)
TW (1) TWI405308B (zh)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8129229B1 (en) * 2007-11-10 2012-03-06 Utac Thai Limited Method of manufacturing semiconductor package containing flip-chip arrangement
JP6892796B2 (ja) * 2017-07-07 2021-06-23 新光電気工業株式会社 電子部品装置及びその製造方法
IT201900009585A1 (it) * 2019-06-20 2020-12-20 St Microelectronics Srl Procedimento per fabbricare dispositivi a semiconduttore e dispositivo a semiconduttore corrispondente

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1354502A (zh) * 2000-11-17 2002-06-19 矽品精密工业股份有限公司 集成电路封装基板上的覆晶焊垫
CN1921098A (zh) * 2005-12-15 2007-02-28 钰创科技股份有限公司 一种封装结构的半导体晶粒
CN101197382A (zh) * 2006-12-06 2008-06-11 台湾沛晶股份有限公司 薄型影像芯片封装结构

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6261864B1 (en) * 2000-01-28 2001-07-17 Advanced Semiconductor Engineering, Inc. Low-pin-count chip package and manufacturing method thereof
JP2003007916A (ja) * 2001-06-19 2003-01-10 Sanyo Electric Co Ltd 回路装置の製造方法
JP2003007922A (ja) * 2001-06-19 2003-01-10 Sanyo Electric Co Ltd 回路装置の製造方法
JP2003007918A (ja) * 2001-06-19 2003-01-10 Sanyo Electric Co Ltd 回路装置の製造方法
US20040058478A1 (en) * 2002-09-25 2004-03-25 Shafidul Islam Taped lead frames and methods of making and using the same in semiconductor packaging
JP4052915B2 (ja) * 2002-09-26 2008-02-27 三洋電機株式会社 回路装置の製造方法
JP4086607B2 (ja) * 2002-09-26 2008-05-14 三洋電機株式会社 回路装置の製造方法
JP2004119729A (ja) * 2002-09-26 2004-04-15 Sanyo Electric Co Ltd 回路装置の製造方法
JP2004119727A (ja) * 2002-09-26 2004-04-15 Sanyo Electric Co Ltd 回路装置の製造方法
JP2004119726A (ja) * 2002-09-26 2004-04-15 Sanyo Electric Co Ltd 回路装置の製造方法
TWI241000B (en) * 2003-01-21 2005-10-01 Siliconware Precision Industries Co Ltd Semiconductor package and fabricating method thereof
TWI235440B (en) * 2004-03-31 2005-07-01 Advanced Semiconductor Eng Method for making leadless semiconductor package

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1354502A (zh) * 2000-11-17 2002-06-19 矽品精密工业股份有限公司 集成电路封装基板上的覆晶焊垫
CN1921098A (zh) * 2005-12-15 2007-02-28 钰创科技股份有限公司 一种封装结构的半导体晶粒
CN101197382A (zh) * 2006-12-06 2008-06-11 台湾沛晶股份有限公司 薄型影像芯片封装结构

Also Published As

Publication number Publication date
TWI405308B (zh) 2013-08-11
US20100084772A1 (en) 2010-04-08
TW201015674A (en) 2010-04-16
CN101714532A (zh) 2010-05-26
US7830024B2 (en) 2010-11-09

Similar Documents

Publication Publication Date Title
JP5572684B2 (ja) パッケージキャリア及びその製造方法
CN103458628B (zh) 多层电路板及其制作方法
TWI269462B (en) Multi-chip build-up package of an optoelectronic chip and method for fabricating the same
JP2011009686A5 (zh)
CN101859752A (zh) 具有内嵌式芯片及硅导通孔晶粒之堆栈封装结构及其制造方法
US20030151139A1 (en) Semiconductor device
CN105097760A (zh) 半导体封装件及其制法与承载结构
CN105762131B (zh) 封装结构及其制法
TWI429043B (zh) 電路板結構、封裝結構與製作電路板的方法
CN101714532B (zh) 封装件及其制造方法
JP5607092B2 (ja) パッケージ構造およびその製造方法
US8049244B2 (en) Package substrate and light emitting device using the same
CN201247772Y (zh) 线路板
CN103579173A (zh) 半导体封装件及其制法
US20130326873A1 (en) Method of fabricating multi-chip stack package structure having inner layer heat-dissipating board
CN105304583A (zh) 封装结构及其制法
CN101587842A (zh) 芯片封装载板及其制造方法
CN100470748C (zh) 晶圆级封装方法
CN104810327A (zh) 芯片封装体结构及其形成方法
CN213483740U (zh) 具有电互连桥的封装体器件
CN102956547A (zh) 半导体封装结构及其制作方法
CN209880583U (zh) 半导体封装结构
CN202940236U (zh) 封装基板构造
CN104576402A (zh) 封装载板及其制作方法
CN103050454A (zh) 堆迭封装构造

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant