CN101668720A - Ni-Zn-Cu系铁氧体粉末、生片和烧结体 - Google Patents
Ni-Zn-Cu系铁氧体粉末、生片和烧结体 Download PDFInfo
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- CN101668720A CN101668720A CN200880013154A CN200880013154A CN101668720A CN 101668720 A CN101668720 A CN 101668720A CN 200880013154 A CN200880013154 A CN 200880013154A CN 200880013154 A CN200880013154 A CN 200880013154A CN 101668720 A CN101668720 A CN 101668720A
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- China
- Prior art keywords
- ferrite
- sintered compact
- based ferrite
- zinc silicate
- ray diffraction
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 229910000859 α-Fe Inorganic materials 0.000 title claims abstract description 162
- 239000000843 powder Substances 0.000 title claims description 61
- 229910007565 Zn—Cu Inorganic materials 0.000 claims abstract description 92
- 239000004110 Zinc silicate Substances 0.000 claims abstract description 57
- XSMMCTCMFDWXIX-UHFFFAOYSA-N zinc silicate Chemical compound [Zn+2].[O-][Si]([O-])=O XSMMCTCMFDWXIX-UHFFFAOYSA-N 0.000 claims abstract description 57
- 235000019352 zinc silicate Nutrition 0.000 claims abstract description 57
- 238000002441 X-ray diffraction Methods 0.000 claims abstract description 48
- 239000000203 mixture Substances 0.000 claims abstract description 46
- 239000000463 material Substances 0.000 claims abstract description 25
- 229910052596 spinel Inorganic materials 0.000 claims description 34
- 239000011029 spinel Substances 0.000 claims description 34
- 230000035699 permeability Effects 0.000 claims description 19
- 150000001875 compounds Chemical class 0.000 claims description 10
- 229910004298 SiO 2 Inorganic materials 0.000 abstract description 20
- 239000002245 particle Substances 0.000 abstract 2
- 239000000919 ceramic Substances 0.000 abstract 1
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 56
- 239000011787 zinc oxide Substances 0.000 description 28
- 238000005245 sintering Methods 0.000 description 19
- 238000000034 method Methods 0.000 description 15
- 238000004519 manufacturing process Methods 0.000 description 12
- 239000011812 mixed powder Substances 0.000 description 8
- 238000002156 mixing Methods 0.000 description 8
- 239000002994 raw material Substances 0.000 description 8
- 239000004902 Softening Agent Substances 0.000 description 7
- 238000004939 coking Methods 0.000 description 7
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 6
- 239000002904 solvent Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 239000011248 coating agent Substances 0.000 description 4
- 238000000576 coating method Methods 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 4
- 238000001914 filtration Methods 0.000 description 4
- 239000011268 mixed slurry Substances 0.000 description 4
- -1 oxyhydroxide Chemical compound 0.000 description 4
- 238000000926 separation method Methods 0.000 description 4
- 229910052814 silicon oxide Inorganic materials 0.000 description 4
- 238000005303 weighing Methods 0.000 description 4
- 239000011701 zinc Substances 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 3
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical class CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 3
- 229910018605 Ni—Zn Inorganic materials 0.000 description 3
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 3
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- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 2
- BVKZGUZCCUSVTD-UHFFFAOYSA-L Carbonate Chemical compound [O-]C([O-])=O BVKZGUZCCUSVTD-UHFFFAOYSA-L 0.000 description 2
- QPLDLSVMHZLSFG-UHFFFAOYSA-N Copper oxide Chemical compound [Cu]=O QPLDLSVMHZLSFG-UHFFFAOYSA-N 0.000 description 2
- NIQCNGHVCWTJSM-UHFFFAOYSA-N Dimethyl phthalate Chemical compound COC(=O)C1=CC=CC=C1C(=O)OC NIQCNGHVCWTJSM-UHFFFAOYSA-N 0.000 description 2
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- ZZUFCTLCJUWOSV-UHFFFAOYSA-N furosemide Chemical compound C1=C(Cl)C(S(=O)(=O)N)=CC(C(O)=O)=C1NCC1=CC=CO1 ZZUFCTLCJUWOSV-UHFFFAOYSA-N 0.000 description 2
- 238000009766 low-temperature sintering Methods 0.000 description 2
- GRVDJDISBSALJP-UHFFFAOYSA-N methyloxidanyl Chemical group [O]C GRVDJDISBSALJP-UHFFFAOYSA-N 0.000 description 2
- XNGIFLGASWRNHJ-UHFFFAOYSA-N o-dicarboxybenzene Natural products OC(=O)C1=CC=CC=C1C(O)=O XNGIFLGASWRNHJ-UHFFFAOYSA-N 0.000 description 2
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- 229910052710 silicon Inorganic materials 0.000 description 2
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- QMMJWQMCMRUYTG-UHFFFAOYSA-N 1,2,4,5-tetrachloro-3-(trifluoromethyl)benzene Chemical compound FC(F)(F)C1=C(Cl)C(Cl)=CC(Cl)=C1Cl QMMJWQMCMRUYTG-UHFFFAOYSA-N 0.000 description 1
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- XBDQKXXYIPTUBI-UHFFFAOYSA-M Propionate Chemical compound CCC([O-])=O XBDQKXXYIPTUBI-UHFFFAOYSA-M 0.000 description 1
- 208000037656 Respiratory Sounds Diseases 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- MCMNRKCIXSYSNV-UHFFFAOYSA-N Zirconium dioxide Chemical compound O=[Zr]=O MCMNRKCIXSYSNV-UHFFFAOYSA-N 0.000 description 1
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- 239000001913 cellulose Substances 0.000 description 1
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- 238000005520 cutting process Methods 0.000 description 1
- FBSAITBEAPNWJG-UHFFFAOYSA-N dimethyl phthalate Natural products CC(=O)OC1=CC=CC=C1OC(C)=O FBSAITBEAPNWJG-UHFFFAOYSA-N 0.000 description 1
- 229960001826 dimethylphthalate Drugs 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000010304 firing Methods 0.000 description 1
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- GNRSAWUEBMWBQH-UHFFFAOYSA-N nickel(II) oxide Inorganic materials [Ni]=O GNRSAWUEBMWBQH-UHFFFAOYSA-N 0.000 description 1
- 229920003229 poly(methyl methacrylate) Polymers 0.000 description 1
- 229920000193 polymethacrylate Polymers 0.000 description 1
- 239000004926 polymethyl methacrylate Substances 0.000 description 1
- 239000013557 residual solvent Substances 0.000 description 1
- 229920005989 resin Polymers 0.000 description 1
- 239000011347 resin Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 239000004034 viscosity adjusting agent Substances 0.000 description 1
- 229910052725 zinc Inorganic materials 0.000 description 1
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Abstract
本发明提供一种通过添加硅酸锌而获得优良的直流叠加特性的Ni-Zn-Cu系铁氧体材料。上述课题通过如下方式解决,提供一种由尖晶石型铁氧体和硅酸锌构成的Ni-Zn-Cu系铁氧体粉末,该Ni-Zn-Cu系铁氧体粉末的组成以氧化物换算计,包括36.0~48.5mol%的Fe2O3、7.0~38mol%的NiO、4.5~40mol%的ZnO、5.0~17mol%的CuO、1.0~8.0mol%的SiO2,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.01~0.12,以及提供一种使用该Ni-Zn-Cu系铁氧体粉末进行制膜而形成的生片和Ni-Zn-Cu系铁氧体烧结体。
Description
技术领域
本发明提供一种Ni-Zn-Cu系铁氧体材料。更具体而言,本发明提供一种通过添加硅酸锌而获得优良的直流叠加特性的Ni-Zn-Cu系铁氧体材料。
背景技术
近年来,要求携带式设备、信息设备等的电子设备迅速小型化、高功能化。对用于这些设备的电感元件等的部件也同样要求小型化、高功能化。特别是对用于电源电路的电感元件,作为交流电流与直流电流叠加流通时的直流叠加特性,也要求尽可能地减少电感的降低和磁芯损耗的增加。
迄今为止,作为电感元件的材料,使用Mn-Zn系铁氧体或Ni-Zn系铁氧体,通过在电感元件的内部设置磁隙结构,提高直流叠加特性,另外,通过调整铁氧体组成或添加添加物,降低磁芯损耗。
特别是,在叠层型电感元件的情况下,通过将铁氧体材料和作为磁隙的非磁性材料叠层并同时烧制而进行制造,因而存在因二者的密合性、烧制时的收缩率的差、热膨胀率的差而难于得到所期望的特性等的问题。
为了解决这些问题,即使不设置磁隙结构,也能够使磁性材料本身具有优良的直流叠加特性的铁氧体材料的开发正在开发。已知:添加有氧化硅和氧化锆的Ni-Zn系或Ni-Zn-Cu系铁氧体(专利文献1和专利文献2)、添加有硅的Ni-Zn-Cu系铁氧体(专利文献3)。
另一方面,提案有通过使Ni-Zn-Cu系铁氧体含有Zn2SiO4而控制起因于应力变化的电感的变化的技术方案(专利文献4和专利文献5)。
专利文献1:日本特开2003-112968号公报
专利文献2:日本特开2004-172396号公报
专利文献3:日本特开2005-145781号公报
专利文献4:日本特开平2-137301号公报
专利文献5:日本特开2004-296865号公报
发明内容
在上述专利文献1~3中,记载了通过向Ni-Zn系或Ni-Zn-Cu系铁氧体添加氧化硅、氧化锆,能够抑制叠加直流电流时的导磁率的降低。然而,该技术方案并未考虑磁芯损耗,难于用作磁性材料本身具有优良的直流叠加特性的铁氧体材料。
在上述专利文献4和5中,记载了控制起因于应力变化的电感的变化的技术方案。然而,该技术方案并未考虑磁芯损耗,难于用作磁性材料本身具有优良的直流叠加特性的铁氧体材料。
因此,本发明的技术课题在于提供一种磁性材料本身具有优良的直流叠加特性的铁氧体材料。
通过如下所述的本发明,能够解决上述的技术课题。
即:本发明提供一种Ni-Zn-Cu系铁氧体粉末,其特征在于:由尖晶石型铁氧体和硅酸锌构成,该Ni-Zn-Cu系铁氧体粉末的组成以氧化物换算计,包括36.0~48.5mol%的Fe2O3、7.0~38mol%的NiO、4.5~40mol%的ZnO、5.0~17mol%的CuO、1.0~8.0mol%的SiO2,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.01~0.12(本发明1)。
另外,本发明提供一种由本发明1所述的Ni-Zn-Cu系铁氧体粉末和粘合材料形成的生片(本发明2)。
另外,本发明提供一种Ni-Zn-Cu系铁氧体烧结体,其特征在于:由尖晶石型铁氧体和硅酸锌构成,该Ni-Zn-Cu系铁氧体烧结体的组成以氧化物换算计,包括36.0~48.5mol%的Fe2O3、7.0~38mol%的NiO、4.5~40mol%的ZnO、5.0~17mol%的CuO、1.0~8.0mol%的SiO2,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度之比为0.005~0.065(本发明3)。
另外,本发明提供一种如本发明3所述的Ni-Zn-Cu系铁氧体烧结体,烧结密度为4.9~5.25g/cm3,在未施加直流叠加磁场的状态下测得的导磁率的实数部分μ0′为20~170,磁芯损耗P0为1400kW/m3以下,在施加1000A/m的直流叠加磁场的状态下测得的导磁率的实数部分μ1000′与μ0′的比μ1000′/μ0′为0.5以上,在施加1000A/m的直流叠加磁场的状态下测得的磁芯损耗P1000与P0的比P1000/P0为0.7~2.0(本发明4)。
发明的效果
本发明涉及的Ni-Zn-Cu系铁氧体粉末,由于烧结该铁氧体粉末制得的烧结体的直流叠加特性优良,所以优选用作电感元件用的铁氧体粉末。
本发明涉及的生片,由于烧结该生片制得的烧结体的直流叠加特性优良,所以优选用作电感元件用的生片。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体,由于直流叠加特性优良,所以优选用作电感元件用的铁氧体烧结体。
具体实施方式
以下,更详细地说明本发明的构成。
本发明中,作为直流叠加特性的指标,使用在未施加直流叠加磁场的状态下测得的导磁率的实数部分μ0′与在施加1000A/m的直流叠加磁场的状态下测得的导磁率的实数部分μ1000′的比μ1000′/μ0′。该比μ1000′/μ0′表示以直流叠加磁场为0A/m时的导磁率作为基准、施加1000A/m的直流叠加磁场时的导磁率的降低程度。该值通常为1以下,该值越接近于1,意味在施加了直流叠加磁场时导磁率的实数部分越难于降低,并表示这种材料的磁性材料本身具有优良的直流叠加特性。
本发明中,作为直流叠加特性的指标,还使用在未施加直流叠加磁场的状态下测得的磁芯损耗P0与在施加1000A/m的直流叠加磁场的状态下测得的磁芯损耗P1000的比为P1000/P0。该比P1000/P0表示以直流叠加磁场为0A/m时的磁芯损耗作为基准、施加1000A/m的直流叠加磁场时的磁芯损耗的变化程度。该值大于1时,表示在施加了直流叠加磁场时磁芯损耗增大。
首先,说明本发明涉及的Ni-Zn-Cu系铁氧体粉末。
本发明涉及的Ni-Zn-Cu系铁氧体粉末由尖晶石型铁氧体和硅酸锌构成,具有以氧化物换算计、包括36.0~48.5mol%的Fe2O3、7.0~38mol%的NiO、4.5~40mol%的ZnO、5.0~17mol%的CuO、1.0~8.0mol%的SiO2的组成,在该Ni-Zn-Cu系铁氧体粉末的X射线衍射中,硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比(硅酸锌的113面/尖晶石型铁氧体的311面)为0.01~0.12。
Fe2O3的组成超出上述范围的情况下,该铁氧体粉末的烧结性变差,烧结密度降低。优选Fe2O3的组成为36.0~48.0mol%,更优选为37.0~47.5mol%。
NiO的组成不足7.0mol%的情况下,将该铁氧体粉末做成烧结体时,μ1000′/μ0′变小,直流叠加特性变差。NiO的组成超过38mol%的情况下,将该铁氧体粉末做成烧结体时μ0′变小,所以在用作电感元件时难于获得大的电感值。优选NiO的组成为7.0~37mol%,更优选为8.0~37mol%。
ZnO的组成不足4.5mol%的情况下,将该铁氧体粉末做成烧结体时,μ0′变小,所以在用作电感元件时难于获得大的电感值。ZnO的组成超过40mol%的情况下,将该铁氧体粉末做成烧结体时,μ1000′/μ0′变小,直流叠加特性变差。优选ZnO的组成为5.0~39mol%。
CuO的组成不足5.0mol%的情况下,该铁氧体粉末的烧结性变差,烧结密度降低。CuO的组成超过17mol%的情况下,因为烧结体容易发生变形,所以难于获得所期望的形状的烧结体。优选CuO的组成为6.0~17mol%,更优选为6.0~16mol%。
SiO2的组成不足1.0mol%的情况下,将该铁氧体粉末做成烧结体时,μ1000′/μ0′变小,直流叠加特性变差。SiO2的组成超过8.0mol%的情况下,该铁氧体粉末的烧结性变差,烧结密度降低。优选SiO2的组成为1.0~7.0mol%。
本发明涉及的Ni-Zn-Cu系铁氧体粉末的组成中,Fe2O3为36~48mol%、NiO为7.0~25.5mol%、ZnO为16~36mol%、CuO为7.0~17mol%以及SiO2为1.0~8.0mol%的范围的情况下,因为能够进行950℃以下的烧结、所谓低温烧结,所以能够通过与Ag等的同时烧结而在烧结体内部简单地形成电路。
硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比不足0.01的情况下,将该铁氧体粉末做成烧结体时,μ1000′/μ0′变小,直流叠加特性变差。来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比超过0.120的情况下,该铁氧体粉末的烧结性变差,烧结密度降低。优选硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比为0.01~0.115。
作为将硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比(硅酸锌的113面/尖晶石型铁氧体的311面)设定为0.01~0.12的范围的方法,例如可以列举以下的方法,向预先制成的铁氧体粉末中添加如下所述的硅酸锌2~15重量%。
优选硅酸锌的组成中,ZnO为55~70mol%,SiO2为30~45mol%的范围。超出该范围的情况下,有时该铁氧体粉末的烧结性变差,烧结密度降低。更优选硅酸锌的组成中,ZnO为60~67mol%,SiO2为33~40mol%。另外,硅酸锌的化学计量组成中,ZnO为66.7mol%,SiO2为33.3mol%,组成偏离该范围,可以在硅酸锌中混合ZnO或SiO2。
优选硅酸锌的平均粒径为0.1~30μm。平均粒径超出上述范围的情况下,有时该铁氧体粉末的烧结性变差,烧结密度降低。优选平均粒径为0.2~20μm。
优选本发明涉及的Ni-Zn-Cu系铁氧体粉末的BET比表面积为4~12m2/g。BET比表面积不足4m2/g的情况下,该铁氧体粉末的烧结性变差,烧结密度降低。BET比表面积超过12m2/g的情况下,在下述的生片制造过程中,不能使该铁氧体粉末均匀分散于溶剂中。优选BET比表面积为6~11m2/g。
本发明涉及的Ni-Zn-Cu系铁氧体粉末通过下述操作可以制得,通过常用的方法,混合构成铁氧体的各元素的氧化物、碳酸盐、氢氧化物、草酸盐等原料,得到原料混合物,在大气中、在650~900℃的温度范围下,准烧制该原料混合物1~20小时后,添加按下述的方法制成的硅酸锌,粉碎该添加有硅酸锌的准烧制物。另外,通过单独粉碎准烧制物后,混合以下述的方法制成的硅酸锌而能够得到。
使用下述的方法能够制得本发明涉及的硅酸锌,在大气中、在1000~1300℃的温度范围下,烧制混合硅和锌的氧化物、碳酸盐、氢氧化物、草酸盐等原料而得到的原料混合物1~20小时。
接着,说明本发明涉及的生片。
所谓生片,是通过将上述Ni-Zn-Cu系铁氧体粉末与粘合材料、增塑剂和溶剂等混合而制得涂料,并用刮刀式涂布机等将该涂料成膜至数μm~数百μm的厚度后,进行干燥而形成的片。在叠合该片后,进行加压,制得叠层体,在规定的温度下烧结该叠层体,由此能够制得电感元件等的电子部件。
本发明涉及的生片中,相对于本发明涉及的Ni-Zn-Cu系铁氧体粉末100重量份,含有粘合材料2~20重量份、增塑剂0.5~15重量份。优选含有粘合材料4~15重量份、增塑剂1~10重量份。另外,也可以通过成膜后的干燥不充分而残留溶剂。并且,可以根据需要添加粘度调整剂等公知的添加剂。
粘合材料的种类为聚乙烯醇缩丁醛、聚丙烯酸酯、聚甲基丙烯酸甲酯、氯乙烯、聚甲基丙烯酸酯、乙烯纤维素、松香酸树脂等。优选的粘合材料为聚乙烯醇缩丁醛。
粘合材料不足2重量份的情况下,生片变脆。另外,为了具有强度,粘合材料的含量没有必要超过20重量份。
增塑剂的种类为邻苯二甲酸苄基正丁酯、丁基邻苯二甲酰基乙醇酸丁酯、邻苯二甲酸二丁酯、邻苯二甲酸二甲酯、聚乙二醇、邻苯二甲酸酯、硬脂酸丁酯、乙酸甲酯等。
增塑剂不足0.5重量份的情况下,生片变硬,并容易发生裂纹。增塑剂超过15重量份的情况下,生片变软,难于处理。
本发明涉及的生片的制造中,相对于Ni-Zn-Cu系铁氧体粉末100重量份,使用15~150重量份的溶剂。溶剂超出上述范围的情况下,因为不能获得均匀的生片,所以烧结该生片而制得的电感元件容易成为特性不均的制品。
溶剂的种类为丙酮、苯、丁醇、乙醇、甲乙酮、甲苯、丙醇、异丙醇、乙酸正丁酯、3甲基-3甲氧基-1丁醇等。
优选叠层压力为0.2×104~0.6×104t/m2。
接着,说明本发明涉及的Ni-Zn-Cu系铁氧体烧结体。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体是由尖晶石型铁氧体和硅酸锌构成的Ni-Zn-Cu系铁氧体烧结体,具有以氧化物换算计、包括36~48.5mol%的Fe2O3、7~38mol%的NiO、4.5~40mol%的ZnO、5~17mol%的CuO、1~8mol%的SiO2的组成,硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比(硅酸锌的113面/尖晶石型铁氧体的311面)为0.005~0.065。
Fe2O3的组成超出上述范围的情况下,烧结密度降低。优选Fe2O3的组成为37~47.5mol%。
NiO的组成不足7mol%的情况下,μ1000′/μ0′变小,直流叠加特性变差。NiO的组成超过38mol%的情况下,因为μ0′变小,所以在用作电感元件时难于获得大的电感值。优选NiO的组成为8~37mol%。
ZnO的组成不足4.5mol%的情况下,因为μ0′变小,所以在用作电感元件时难于获得大的电感值。ZnO的组成超过40mol%的情况下,μ1000′/μ0′变小,直流叠加特性变差。优选ZnO的组成为5~39mol%。
CuO的组成不足5mol%的情况下,烧结密度降低。CuO的组成超过17mol%的情况下,因为烧结体容易发生变形,所以难于获得所期望的形状的烧结体。优选CuO的组成为6~16mol%。
SiO2的组成不足1mol%的情况下,μ1000′/μ0′变小,直流叠加特性变差。SiO2的组成超过8mol%的情况下,烧结密度降低。优选SiO2的组成为1~7mol%。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体的组成中,Fe2O3为36~48mol%、NiO为7~25.5mol%、ZnO为16~36mol%、CuO为7~17mol%以及SiO2为1~8mol%的范围时,因为能够进行950℃以下的烧结、所谓低温烧结,所以能够通过与Ag等的同时烧结而在烧结体内部简单地形成电路。
硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比不足0.005的情况下,μ1000′/μ0′变小,直流叠加特性变差。来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比超过0.065的情况下,烧结密度降低。优选硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比为0.005~0.06。另外,将X射线衍射强度的比设定为上述范围的方法的例子如上所述。
优选本发明涉及的Ni-Zn-Cu系铁氧体烧结体的烧结密度为4.9~5.25g/cm3。烧结密度不足4.9g/cm3的情况下,由于烧结体的机械强度低,所以存在使用时破损的可能性。烧结密度高为佳,但本发明中得到的烧结密度的上限为5.25g/cm3。优选的烧结密度为4.95~5.2g/cm3。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体的导磁率的实数部分μ0′为20~170。导磁率的实数部分μ0′不足20的情况下,在用作电感元件时难于得到大的电感值。导磁率的实数部分μ0′超过170的情况下,直流叠加特性变差,优选的导磁率的实数部分μ0′为30~160。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体的μ1000′/μ0′为0.5以上。如果μ1000′/μ0′不足0.5,则只能制得直流叠加特性差的电感元件。μ1000′/μ0′的上限值为1.0。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体的磁芯损耗P0为1400kW/m3以下。磁芯损耗P0超过1400kW/m3的情况下,由于作为烧结体的损耗增大,所以只能制得效率差的电感元件。优选的磁芯损耗P0为1300kW/m3以下,更优选1200kW/m3以下,更优选1000kW/m3以下。磁芯损耗P0的下限值为100kW/m3左右。
本发明涉及的Ni-Zn-Cu系铁氧体烧结体的P1000/P0为0.7~2.0。P1000/P0超出该范围的情况下,直流叠加特性变差。优选P1000/P0为0.8~1.9。
通过下述操作,能够制得本发明的Ni-Zn-Cu系铁氧体烧结体,即通过使用模具以0.3~3.0×104t/m2的压力对本发明涉及的Ni-Zn-Cu系铁氧体粉末进行加压、所谓的粉末加压成型法制得成型体,或者通过将含有本发明涉及的Ni-Zn-Cu系铁氧体粉末的生片进行叠层、所谓的生片法制得叠层体,在880~1050℃下,烧结上述得到的成型体或叠层体1~20小时,优选1~10小时。作为成型方法,可以使用公知的方法,但优选使用上述粉末加压成型法或生片法。
如果烧结温度不足880℃,则因烧结密度降低而导致烧结体的机械强度变低。如果烧结温度超过1050℃,则因烧结体容易发生变形而难以得到期望的形状的烧结体。
<作用>
本发明的最重要之处在于下述事实:烧结由尖晶石型铁氧体和硅酸锌构成、并且Fe2O3、NiO、ZnO、CuO和SiO2在特定的组成范围的Ni-Zn-Cu系铁氧体粉末,所制得的Ni-Zn-Cu系铁氧体烧结体,磁性材料本身具有优良的直流叠加特性。该直流叠加特性提高的理由并不清楚,但本发明的发明人推断其原因在于:通过使硅酸锌存在于特定的铁氧体组成范围的Ni-Zn-Cu系铁氧体的晶界之间,使Ni-Zn-Cu系铁氧体烧结体的磁化曲线发生缓慢地倾斜且直线式的变化。
实施例
本发明的代表性的实施方式如下所述。
利用荧光X射线分析装置RIX2100(理学电机工业(株)制造),测定Ni-Zn-Cu系铁氧体粉末、Ni-Zn-Cu系铁氧体烧结体的组成。
利用X射线分析装置RINT2500(理学电机工业(株)制造),测定构成Ni-Zn-Cu系铁氧体粉末和烧结体的晶相、以及来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比。
利用モノソ一ブMS-21(YUASA-IONICS(株)制造),测定BET比表面积。
根据由试样的外径尺寸求得的体积和重量,算出Ni-Zn-Cu系铁氧体烧结体的烧结密度。
Ni-Zn-Cu系铁氧体烧结体的导磁率μ0′按照如下方法测定,在环状烧结体上实施绕线,利用B-H/Z ANALYZER E5060A(AgilentTechnologies(株)制造),在1MHz的频率、25mT的磁通密度、未施加直流叠加磁场的状态下,测定导磁率的实数部分的值,作为导磁率μ0′。
Ni-Zn-Cu系铁氧体烧结体的导磁率μ1000′按照如下方法测定,在环状烧结体上实施绕线,利用B-H/Z ANALYZER E5060A(AgilentTechnologies(株)制造),在1MHz的频率、25mT的磁通密度、施加1000A/m的直流叠加磁场的状态下,测定导磁率的实数部分的值,作为导磁率μ1000′。μ1000′/μ0′由μ0′和μ1000′计算求得。
Ni-Zn-Cu系铁氧体烧结体的磁芯损耗P0按照如下方法测定,在环状烧结体上实施绕线,利用B-H/Z ANALYZER E5060A(AgilentTechnologies(株)制造),在1MHz的频率、25mT的磁通密度、未施加直流叠加磁场的状态下,测定Pcv的值,作为磁芯损耗P0。
Ni-Zn-Cu系铁氧体烧结体的磁芯损耗P1000按照如下方法测定,在环状烧结体上实施绕线,利用B-H/Z ANALYZER E5060A(AgilentTechnologies(株)制造),在1MHz的频率、25mT的磁通密度、施加1000A/m的直流叠加磁场的状态下,测定Pcv的值,作为磁芯损耗P1000。P1000/P0由P0和P1000计算求得。
实施例1
<Ni-Zn-Cu系铁氧体粉末的制造>
按照Ni-Zn-Cu系铁氧体的组成成为规定的组成,称量各氧化物原料,利用球磨机进行湿式混合20小时后,过滤分离并干燥混合浆料,得到原料混合粉末。在720℃下,准烧制该原料混合粉末4小时,得到准烧制物,使用粉碎机(atomizer)粉碎该准烧制物,制得铁氧体粉碎粉末。
另一方面,按照硅酸锌的组成成为规定的组成,称量氧化锌和氧化硅,利用球磨机进行湿式混合20小时。过滤分离并干燥混合浆料后,在1200℃下烧制3小时,制得硅酸锌。制得的硅酸锌的组成为ZnO=66.5mol%、SiO2=33.5mol%,平均粒径为5.2μm。
接着,按照成为规定的组成,向上述铁氧体粉碎粉末中添加上述硅酸锌2重量%,利用球磨机混合并粉碎,制得本发明涉及的Ni-Zn-Cu系铁氧体粉末。
制得的Ni-Zn-Cu系铁氧体粉末的组成为Fe2O3=47.5mol%、NiO=14.0mol%、ZnO=27.0mol%、CuO=10.5mol%以及SiO2=1.0mol%。来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.010。BET比表面积为8.8m2/g。
<生片的制造>
相对于制得的Ni-Zn-Cu系铁氧体粉末100重量份,添加作为粘合材料的聚乙烯醇缩丁醛8重量份、作为增塑剂的邻苯二甲酸苄基正丁酯3重量份、作为溶剂的3甲基-3甲氧基-1丁醇50重量份,然后,充分混合,得到浆料。将该浆料用刮刀式涂布机涂布于PET膜上,形成涂膜后,通过干燥得到厚度为73μm的生片。按照长100mm×宽100mm的尺寸裁切该生片,并叠层8片后,以0.35×104t/m2的压力进行加压,制得厚度为0.58mm的生片叠压体。
<Ni-Zn-Cu系铁氧体烧结体的制造>
在890℃下,以2小时烧结制得的生片叠层体,制得厚度为0.48μm的Ni-Zn-Cu系铁氧体烧结体。制得的Ni-Zn-Cu系铁氧体烧结体的组成为Fe2O3=47.5mol%、NiO=14.2mol%、ZnO=27.1mol%、CuO=10.2mol%以及SiO2=1.0mol%。该Ni-Zn-Cu系铁氧体烧结体中,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.005。另外,烧结密度为5.01g/cm3。利用超声波加工机由该Ni-Zn-Cu系铁氧体烧结体切出外径为14mm、内径为8mm、厚度为0.48mm的环状烧结体,评价磁特性。该烧结体的μ0′为152,μ1000′/μ0′为0.50,磁芯损耗P0为380kW/m3,P1000/P0为1.88。
实施例2~实施例7
利用与实施例1同样的方法,制得Ni-Zn-Cu系铁氧体烧结体。将此时的制造条件以及制得的Ni-Zn-Cu系铁氧体烧结体的各特性表示于表1、2、3。
实施例8
制造与实施例1同样的Ni-Zn-Cu系铁氧体粉末,向该Ni-Zn-Cu系铁氧体粉末100重量份中混合聚乙烯醇6%水溶液10重量份,得到混合粉末,使用模具,以1.0×104t/m2的成型压力,将得到混合粉末7.0g成型为外径为30mm、厚度为2.9mm的圆盘状。在烧结温度900℃下,以5小时烧结该成型体,制得Ni-Zn-Cu系铁氧体烧结体。
测定得到的Ni-Zn-Cu系铁氧体烧结体的组成、X射线衍射强度比、烧结密度后,利用超声波加工机切出外径为14mm、内径为8mm、厚度为2mm的环状烧结体,评价磁特性。
将此时的制造条件以及制得的Ni-Zn-Cu系铁氧体烧结体的各特性表示于表1、2、3。
实施例9~实施例10
利用与实施例8同样的方法,制得Ni-Zn-Cu系铁氧体烧结体。将此时的制造条件以及制得的Ni-Zn-Cu系铁氧体烧结体的各特性表示于表1、2、3。
比较例1~比较例5
利用与实施例1或实施例8同样的方法,制得Ni-Zn-Cu系铁氧体烧结体。将此时的制造条件以及制得的Ni-Zn-Cu系铁氧体烧结体的各特性表示于表1、2、3。
比较例6
按照铁氧体的组成成为Fe2O3=49.5mol%、NiO=20.7mol%、ZnO=22.8mol%、CuO=7mol%,称量各氧化物原料,利用球磨机进行湿式混合20小时后,过滤分离并干燥混合浆料,得到原料混合粉末。在750℃下,以4小时准烧制该原料混合粉末,得到准烧制物,使用粉碎机粉碎该准烧制物,制得铁氧体粉碎粉末。
另一方面,按照硅酸锌的组成成为Zn2SiO4,称量氧化锌和氧化硅,利用球磨机进行湿式混合20小时。过滤分离并干燥混合浆料后,在1200℃下烧制3小时,制得硅酸锌。制得的硅酸锌的组成为ZnO=66.7mol%、SiO2=33.3mol%,平均粒径为5.0μm。
接着,向上述铁氧体粉碎粉末添加上述硅酸锌1.5wt%,利用球磨机混合并粉碎,制得本发明涉及的Ni-Zn-Cu系铁氧体粉末。
制得的Ni-Zn-Cu系铁氧体粉末的组成为Fe2O3=48.4mol%、NiO=20.4mol%、ZnO=23.6mol%、CuO=6.8mol%以及SiO2=0.8mol%。来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.006。BET比表面积为7.5m2/g。
向得到的Ni-Zn-Cu系铁氧体粉末100重量份中混合聚乙烯醇6%水溶液10重量份,得到混合粉末,利用模具,以1.0×104t/m2的成型压力将混合粉末7.0g成型为外径30mm、厚度2.9mm的圆盘状。在烧结温度1000℃下,烧结该成型体2小时,制得Ni-Zn-Cu系铁氧体烧结体。
制得的Ni-Zn-Cu系铁氧体烧结体的组成为Fe2O3=48.5mol%、NiO=20.5mol%、ZnO=23.3mol%、CuO=6.9mol%以及SiO2=0.8mol%。来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.003。另外,烧结密度为5.19g/cm3。利用超声波加工机,由该Ni-Zn-Cu系铁氧体烧结体切出外径为14mm、内径为8mm、厚度为2mm的环状烧结体,评价磁特性。该烧结体的μ0′为242,μ1000′/μ0′为0.28,磁芯损耗P0为198kW/m3,P1000/P0为2.97。
在比较例6中,因为硅酸锌相对于尖晶石型铁氧体的添加量为少量,所以在Ni-Zn-Cu系铁氧体烧结体中,硅酸锌的113面的X射线衍射强度相对于尖晶石型铁氧体的311面的X射线衍射强度的比变小,因而很难讲使用该Ni-Zn-Cu系铁氧体粉末制成的烧结体具有优良的直流叠加特性。
[表1]
[表2]
如上述实施例所示,由尖晶石型铁氧体和硅酸锌构成的Ni-Zn-Cu系铁氧体烧结体,具有以氧化物换算计、含有36~48.5mol%的Fe2O3、7~38mol%的NiO、4.5~40mol%的ZnO、5~17mol%的CuO、1~8mol%的SiO2的组成,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.005~0.065,由于该Ni-Zn-Cu系铁氧体烧结体的材料本身具有优良的直流叠加特性,因而优选用作电感元件用的磁性材料。
另外,由尖晶石型铁氧体和硅酸锌构成的Ni-Zn-Cu系铁氧体粉末,具有以氧化物换算计、含有36~48.5mol%的Fe2O3、7~38mol%的NiO、4.5~40mol%的ZnO、5~17mol%的CuO、1~8mol%的SiO2的组成,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.01~0.12,由于烧结该Ni-Zn-Cu系铁氧体粉末,得到的Ni-Zn-Cu系铁氧体烧结体的材料本身具有优良的直流叠加特性,因而优选用作电感元件用的磁性材料。
另外,使用该Ni-Zn-Cu系铁氧体粉末和粘合材料成膜为片状而形成的生片,由于烧结该生片而得到的Ni-Zn-Cu系铁氧体烧结体的材料本身具有优良的直流叠加特性,因而优选用作电感元件用的磁性材料。
以上,使用实施例更详细地说明了本发明,但本发明的数值范围的规定,在不违背本发明的要旨的范围内,还理所当然地包括将上述任意的实施例的数值作为临界值使用的全部的范围规定,并且应当认为其在本发明的说明书中已被记载。
Claims (4)
1.一种Ni-Zn-Cu系铁氧体粉末,其特征在于:
由尖晶石型铁氧体和硅酸锌构成,该Ni-Zn-Cu系铁氧体粉末的组成以氧化物换算计,包括36.0~48.5mol%的Fe2O3、7.0~38mol%的NiO、4.5~40mol%的ZnO、5.0~17mol%的CuO、1.0~8.0mol%的SiO2,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.01~0.12。
2.一种由权利要求1所述的Ni-Zn-Cu系铁氧体粉末和粘合材料形成的生片。
3.一种Ni-Zn-Cu系铁氧体烧结体,其特征在于:
由尖晶石型铁氧体和硅酸锌构成,该Ni-Zn-Cu系铁氧体烧结体的组成以氧化物换算计,包括36.0~48.5mol%的Fe2O3、7.0~38mol%的NiO、4.5~40mol%的ZnO、5.0~17mol%的CuO、1.0~8.0mol%的SiO2,来自硅酸锌的113面的X射线衍射强度相对于来自尖晶石型铁氧体的311面的X射线衍射强度的比为0.005~0.065。
4.如权利要求3所述的Ni-Zn-Cu系铁氧体烧结体,其特征在于:
烧结密度为4.9~5.25g/cm3,在未施加直流叠加磁场的状态下测得的导磁率的实数部分μ0′为20~170,磁芯损耗P0为1400kW/m3以下,在施加1000A/m的直流叠加磁场的状态下测得的导磁率的实数部分μ1000′与μ0′的比μ1000′/μ0′为0.5以上,在施加1000A/m的直流叠加磁场的状态下测得的磁芯损耗P1000与P0的比P1000/P0为0.7~2.0。
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