CN101243542B - 具有焊接板和加热器的基材支撑件 - Google Patents
具有焊接板和加热器的基材支撑件 Download PDFInfo
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- CN101243542B CN101243542B CN2006800301680A CN200680030168A CN101243542B CN 101243542 B CN101243542 B CN 101243542B CN 2006800301680 A CN2006800301680 A CN 2006800301680A CN 200680030168 A CN200680030168 A CN 200680030168A CN 101243542 B CN101243542 B CN 101243542B
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- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/455—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
- C23C16/45519—Inert gas curtains
- C23C16/45521—Inert gas curtains the gas, other than thermal contact gas, being introduced the rear of the substrate to flow around its periphery
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4582—Rigid and flat substrates, e.g. plates or discs
- C23C16/4583—Rigid and flat substrates, e.g. plates or discs the substrate being supported substantially horizontally
- C23C16/4586—Elements in the interior of the support, e.g. electrodes, heating or cooling devices
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- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/46—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for heating the substrate
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Abstract
本发明的基材支撑件包括一顶板、中间板及底板,其藉由硬焊而接合。顶板包括一上表面,其具有分布而遍及凹陷部的多个往外突出的突出部、网状分布的凹陷沟槽、终端连接于凹陷沟槽的真空端口,以及多个气体端口。中间板具有多个中间供应管线,其与顶板相符的顶部供应管线排为一列。底板具有多个底部供应管线,并与中间板的中间供应管线排为一列。顶板与中间板藉由第一硬焊结合层而接合,而中间板与底板藉由第二硬焊结合层而接合。
Description
技术领域
本发明涉及一种用于将一基材支撑于一基材处理室的基材支撑件。
背景技术
在制造电子电路及显示器的过程中,半导体、介电材料及导电材料是形成于基材上(例如:半导体晶片、陶瓷或玻璃基材)。而该些材料例如是藉由化学气相沉积(CVD)、物理气相沉积(PVD)、离子植入、氧化、氮化及其它制程而形成。之后,沉积的基材材料会被蚀刻而形成特征结构,例如:栅极、孔洞、接触孔及内联机。这些制程一般是于处理室中进行,而其实例是描述于共同受让给Kalyanam等人的美国专利第6491978号,此处将其全文并入以作为参考。在此类制程中,基材是放置在基材支撑件上并暴露于腔室的制程区域。支撑件通常包括一加热器,以在制程中进一步调节基材的温度。通常藉由感应或电容耦合能源至制程气体,或是耦合微波至制程气体,而使等离子于制程区域中形成,此等离子是处理基材而在基材上沉积或蚀刻材料。
因为对于形成在基材上的层及特征结构的尺寸要求渐渐朝向为具有较小尺寸,故基材上的温度均一性必须更加一致,并且基材上的可允许的温度范围亦变窄。举例来说,在CVD制程中,基材表面的温度变化会造成沉积的CVD层具有多变异的厚度;随着沉积层变得较薄,因而对于此种厚度变异的忍受范围变得更小。相似的,在蚀刻制程中,基材上不同的蚀刻速率会造成在基材上蚀刻的特征结构具有不同的形状或尺寸。因此,期望基材支撑件可以减小基材上的温度变异,而此温度变异可能造成制程异常。
在制程当中,基材表面所需的更窄温度范围较难以习知的支撑件来达成。习知的支撑件包括一由铝、不锈钢或陶瓷所制成的吸座,而其具有基材承接面、多个真空端口及净化气体或热传气体导管,以及下方的支撑板。金属座以及下方的支撑板是焊接在一起,因此焊接对接接头(butt joint)是穿过板的表面而与相邻的板接触。于一实施例中,电子束是聚焦至焊接对接接头而将接头焊接至邻近的板。然而,此种习知支撑件通常无法提供基材上所需的窄范围温度,此乃因为设置于气体及真空导管周围的电子束焊接对接接头通常并不平顺或是彼此之间并不呈现连续焊接。此造成真空压力或是净化/热传气体由该些接头泄漏,而造成基材上温度的不均一分布。在藉由焊接装配之后,通常会在板中导致局部应力产生,而在数个制程循环之后造成支撑件的弯曲或变形。板的弯曲造成各板之间产生间隔,而该些板由于具有不同厚度或间隔,因而使得自上方基材通过下方支撑板的热传速率并不平均。
习知支撑件的另一问题起因于其加热器和真空端口的配置。一般来说,单一真空端口是设置于支撑件表面以支托住基材,而此是提供基材背侧一非均匀或均匀的微弱真空吸引压力。因此,沿着支撑件的真空信道处的焊接接点的真空压力泄漏所造成背侧压力的波动很有可能导致基材跳离开支撑件。另外,紧邻于单一端口的过度吸力可能在制程中导致基材弯曲。未适当放置的基材可能会使得与下方支撑件具有不良接触或具有一间隔的区域产生温度变异。具有未适当置放于支撑板之间的内建式电阻加热器组件的支撑件,可能会造成施加不均匀的热至上方基材,而在基材上出现非对称的处理情形。
发明内容
本发明揭露一种基材支撑件,其包括具有一上表面的顶板、一中间板以及一底板。上表面包括:多个往外突出的突出部(mesa),且突出部分布而遍及一凹陷部;网状分布的多个凹陷沟槽;一真空端口,其终端连接于凹陷沟槽,并连接至一供应管线;以及多个气体端口,是连接至其他供应管线。中间板包括多个中间供应管线,该些中间供应管线与顶板的供应管线排为一列,且中间板藉由一第一硬焊结合层而与顶板接合。底板包括多个底部供应管线,该些底部供应管线与中间板的中间供应管线排为一列,且底板藉由一第二硬焊结合层而与中间板接合。
本发明揭露一种形成一基材支撑件的方法,该方法包括:形成一包括一上表面的顶板;形成一中间板;形成一底板;将顶板、中间板以及底板结合在一起。顶板是形成而使得上表面具有多个由一凹陷部延伸且往外突出的突出部,且凹陷部位于网状分布的多个凹陷沟槽之间,多个顶部供应管线的终端连接于一真空端口以及多个气体端口。中间板是形成而使其包括多个中间供应管线。底板是形成而使其包括多个底部供应管线。硬焊化合物是施加至顶板、中间板以及底板的至少二表面。藉由将顶板、中间板以及底板排为一列而形成一组合件,则顶部供应管线、中间供应管线及底部供应管线是彼此排为一列。组合件经加热至硬焊化合物的一熔化温度。组合件接着经过冷却,以在顶板、中间板以及底板之间形成硬焊接合。
附图说明
本发明的特征、实施例及优点可由上述说明、以及下方的附图和实施例而更加了解,其中附图是绘示本发明的实例。然而,应了解本发明所能采用的特征结构并非仅限于特定图式的内容,应包括这些特征的组合。
图1A,绘示支撑件的侧面剖视图,其中组合板是利用硬焊组接,而基材承接面具有真空沟槽及接触突出部;
图1B,绘示图1A所示的支撑件的上视图,显示位于支撑件上表面的真空沟槽及突出部的分布图样;
图2,绘示图1A所示的支撑件的分解视图,显示在组合之前的三个板;
图3,绘示制造该支撑组件的步骤流程图;
图4,绘示两个硬焊板的概要透视图,其具有包括电阻加热组件的电阻加热器,而电阻加热组件位于填充有电绝缘体的管中,且管与位于板上而围绕管的沟槽之间亦具有热传导粉末。
主要组件符号说明
100 支撑件 102 基材承接面/上表面
104 基材 106a 第一硬焊结合层
106b 第二硬焊结合层 108 台座
110(110a、110b、110c) 板 114 周围突出物
122 (周边)环 124 周边区域
126 边角 128 气体端口
129(129a~b)供应管线 130(130a~c)供应管线
132(132a~b)供应管线 133 密封边缘
134 突出部 135 台阶
138 凹陷部 150 沟槽
152 中央部位 154 中央区域
156 周围部位 158 周围部位
164 臂 168 沟槽
170 盘 174 真空端口
178 沟槽 179 升举孔
180 新月形部位 190 电阻加热器
192 电阻电线 193 螺旋
194 (中空)管 195 电绝缘体粉末
196(196a~b)电阻加热组件 197 沟槽
199 热传导填料
具体实施方式
基材支撑件100的示范实施例包括一用以支撑一基材104的基材承接面(或是上表面)102,其是概要绘示于「图1A及1B」。基材支撑件100包括一台座108,而台座108是由多个板110所组成,例如:一顶板110a、一中间板110b及一底板110c。板110a~110c及其界面控制传送至基材104或自基材104传送出的热传速率。顶板110a、中间板110b及底板110c是按照符合基材104的尺寸而制造的。举例来说,于一实施例中,基材104为一半导体晶片,则顶板110a为一具有正圆柱形的圆盘,且中间板110b及底板110c亦呈正圆柱形。本示范实施例的基材支撑件100是利用顶板、中间板及底板110a~c来说明的,但对于其它熟悉此技术领域的人士亦可采用较多或少的板数量。另外,板110a~c亦可包括非平面的横向连接板(cross-plate),举例来说,板110a~c具有凹槽及脊(图中未示)而可互相组配以形成单一的台座108。因此,本发明不应限制于此处所描述的实施例。
台座108亦包括一周围突出物114,其是延伸于基材承接面102的周围,并用以承接一周边环122,而周围突出物114是使得周边环122下方所提供的气体转向而围绕在基材104的周围,进而控制使沉积于基材104的周边区域124进行。基材承接面102与周围突出物114之间的过渡区域包括一室形边角126,其是呈拱形而降低边缘在等离子环境中的腐蚀敏感性(susceptibility)。环122的直径通常相较于承接在基材承接面102上的基材104的直径大约2~10%。气体(例如氦气、氮气或反应性气体)是通过多个气体端口128而提供至支撑件100的周围突出物114四周,而气体端口128的尾端是位于周围突出物114,藉此控制基材104于周边区域124的沉积或处理速率。举例来说,可提供气体以除去来自基材104周边区域124的沉积气体,进而预防材料沉积在基材104的背侧及边缘。亦可因为其它因素而提供气体,例如:控制基材边缘的沉积速率而改善沉积品质。气体端口128是经由供应管线129、130、132而连接至外部气体源(图中未示)。举例来说,真空端口174及气体端口128可连接至分别位于顶板110a、中间板110b、底板110c的一或多个顶端、中间及底部的供应管线129(129a~b)、130(130a~c)及132(132a~b)。供应管线129、130、132是彼此排为一列而用于提供气体、供应真空压力,或是允许电连接至板110a~c。气体端口128的直径需够小,而降低在该些孔洞中气体的等离子辉光放电(glow discharge)。
基材承接面102是为顶板110a的上表面,而其包括多个凸起及凹处。基材承接面102包括一密封边缘133,其是沿着基材承接面102的周围而延伸,并与放置于基材承接面102上的基材104直接接触,因而在基材承接面102的周围形成密封。基材承接面102亦具有多个往外突出的突出部134,以及接近基材承接面102中心处的中央高起台阶135。基材承接面102更包括一凹陷部138,而凹陷部138是为一由密封边缘133所包围的较低平面部位。凹陷部138在基材104后侧及支撑件100之间形成一间隔。密封边缘133、突出部134以及中央高起台阶135是将基材104举高并支撑基材104,而减少基材承接面102与上方基材104背侧的接触面积。接触面积的降低亦会减少基材104于处理室中进行制程时,会于该些接触区域形成的热点(hot spot)数目。
突出部134彼此之间是相隔一距离,并分布在基材承接面102的凹陷部138。于图中所示的实施例,突出部134是排列为同心圆,但亦可沿着径向线而排列,或是为非对称排列。突出部134的数量、间隔、尺寸及整体型态是可经选择而降低基材承接面102上的热点。另外,突出部134的高度及间隔是由用于支撑基材104而施加的真空吸引力来判定,否则,突出部134之间的基材104可能会呈现杯状或碗状。突出部134通常为圆柱状,然而亦可采用其它形状,例如:凹状、三角形或矩形。突出部134的形状及高度是经选择而促进基材104下方气体的流动,举例来说,其可导引气体至基材104下方的特定部位,或是调整真空吸引力而使基材104与支撑件100之间具有良好的热传导性。于一实施例中,突出部134通常为圆柱形。
基材承接面102上的突出部134是分散于网状分布的凹陷沟槽150之间,而沟槽150是延伸进入基材承接面102的上表面。一般来说,基材承接面102的上表面包括一中央部位152以及一周围部位156,其中,中央部位152是位于基材104的中央区域154的下方,而周围部位156则位于基材104的周围部位158下方。例如于一实施例中,凹陷沟槽150包括多个彼此分隔的放射状臂164,其是由基材承接面102的中央部位152放射状往外延伸至周围部位156。在中央部位152,放射状臂164的终端连接于一圆形沟槽168,而沟槽168中含有一真空端口174。圆形沟槽168是位于高起的盘170周围。通过真空端口174而提供的真空压力是藉由圆形沟槽168而分散进入放射状间隔设置的臂164。在基材承接面102的周围部位156,放射状臂164的终端是连接于半圆形沟槽178。举例来说,所示的实施例包括六个放射状臂164,其是相隔约60°而分布在基材承接面102上。每一个放射状臂164的终端连接于基材承接面102的周围部位156的半圆形沟槽178,每一个半圆形沟槽178是围绕一个升举孔179,其是允许升举销(图中未示)穿过支撑件100的高起的新月形部位180,而升举销是用以支撑基材104并密封位升举孔179。
真空端口174是通过分别通过顶板、中间板及底板110a~c的供应管线129a、130b、132b而连接至真空连接器(图中未示),且真空连接器会接着连接至一或多个真空泵。于组合件中,供应管路129a、130b、132b是彼此排为一列,且在其边缘是为密封的,因此真空压力可以流经板110a~c而到真空端口174,且压力并无过度损失。同样的,气体端口128是连接至分别通过顶板110a、中间板110b,及底板110c的供应管线129b、130a,c、132a,且该些供应管线是排为一列,并且在制造时将其边缘密封。举例来说,供应管线129、130、132可彼此排为一列,并在其边缘施加硬焊化合物而密封的。
在将该些板110硬焊在一起之前,电阻加热器190可设置于其中之一板110中,电阻加热器190包括一在施加电压于电阻之后而会产生热的电阻。支撑件100亦包括加热器导线(图中未示),其是延伸出台座108而传导电力至电阻加热器190。所产生热的量是与施加至电阻加热器190的能量有关。电阻加热器190较佳是能够将基材104维持在温度约200~800℃。电阻加热器190包括一或多个电阻加热组件196,其是由导电材料制成,例如:金属,举例为钨、钼、二硅化钼、铁、镍、铜、InconelTM、或其合金、或其混合物。钼具有良好的热传导性及在非氧化环境抵抗腐蚀的能力。加热器导线将电力传导至电阻加热器190,而导线可包括导体,例如钼及镍,其是通过支撑件100中的信道。
电阻加热器190可包括一个以上独立控制的第一及第二电阻加热组件196a,b,其是成形而符合上方基材104的形状。于一实施例中,电阻加热组件196a,b包括形成一同心圆(图中未示)图案的导线,而导线覆盖住一符合上方基材104的形状及尺寸的区域。于另一实施例中,电阻加热组件196a,b包括一网状的导电电线(图中未示),其是基本延伸于整个基材104下方。
在另一实施例中,如「图4」所示,电阻加热组件196a,b包括一圆柱状的电阻电线192,其是卷绕而形成一螺旋193并置入一中空管194中。管194接着填充电绝缘体粉末195,例如:粉末状的氧化镁,而使卷绕的电线192绝缘。含有电线192的管194是位于其中之一板110(例如顶板110a下侧)的沟槽197中。更进一步发现在管194与周围的沟槽197之间或其周围的间隔处填充粉末状的热传导填料199,会基本增进电阻加热器190提供的温度均一性。相信若不填充热传导填料199,则管194无法与下方或周围的沟槽197的表面接触或是适当接触,而产生间隔及空隙,其会造成电阻加热组件196a,b传送至周围板110a的热的极大变异。于一实施例中,热传导填料199包括金属,例如不锈钢颗粒。另外,具选择性的,颗粒可包括将不锈钢粉末与低熔点或熔化金属(例如:镍、铟、锡、铅等)混合,而使得颗粒在上述的硬焊热处理中变软或液化,热传导填料199则包围在位于板110a的沟槽197的管194周围。
于一实施例中,可独立控制的电阻加热组件196提供支撑件100不同部位的独立加热情况。举例来说,电阻加热组件196a,b可以在支撑件100的板110a的中央部位152和周围部位156形成至少二个同心圆,如「图1A」所示。于一实施例中,两个可独立控制的电阻加热组件196a,b是各自具有介于约2.5~5欧姆(ohm)的电阻,而可用于提供顶板110a的两个同心区域的个别加热条件。电阻加热组件196a,b是连接不同的加热器导线(图中未示),而导线往下延伸通过台座108而至外部电源供应器(图中亦未示)。基材支撑件100亦可选择性包括多个热电耦(图中未示),其尾端是接近基材104或触碰基材104,以监控支撑件100不同区域的温度,并提供调整输送至独立加热区域的功率的基础。
制造流程图的示范实施例是示于「图3」。于制造过程中,顶板、中间板、底板110a~c是分别由金属所制成,包括:铝、阳极处理铝、不锈钢、铁及市面可购得的合金,如:″HAYNES 242″、″Al-6061″、″SS 304″、″SS 316″以及INCONEL。于一实施例中,板110a~c是由不锈钢制成,藉由传统的机械加工技术而对原料板进行机械加工,而提供所需的沟槽、突出部图案、端口以及供应管线,例如「图3」所示的流程图。举例来说,板110a~c是由包含SS-316的不锈钢来进行机械加工而制成,而板110a~c亦包括作为供应管线129、130、132的孔洞,以及作为加热器导线、升举销、热电耦以及其它电源供应器或控制导线的孔洞。传统的机械加工技术包括钻孔、切槽、研磨及CMC机械加工。在机械加工之后,板110是于溶剂(如乙醇)中清洗以移除灰尘及颗粒,例如于振动超音波浴中。
之后,硬焊化合物是施加于三个板110的至少一表面,通常为与另一板110的界面接合的一界面,如「图3」所示。适当的硬焊化合物的熔化温度应该低于板110的熔点。举例来说,当板110是由不锈钢所制成,则硬焊化合物是经选择而具有小于不锈钢的熔点(例如至少200℃)的熔化温度。在制造过程中,硬焊化合物的浆液可以施加至板110之间,或是将硬焊箔的薄板放置于板110之间。硬焊化合物通常包括一合金,而该合金包括铝、铜、铟、铅、镁、镍、锡、硅及其合金。举例来说,一适合的硬焊化合物包括Cusin-1-ABATM,其是为一硬焊合金浆,并主要含有银及铜,在775℃下熔化,而其可购自加州贝蒙特的WESGO公司。一适合的硬焊箔包括MBF-20硬焊箔--METGLASTM,其是为硅基硬焊箔,并含有硼、铁、硅、铬及钴,而其熔点为约1000℃。
板110在涂覆有硬焊化合物或是在其中含有硬焊箔之后,将其排为一列而形成一组合件,藉此,供应管线129、130、132可通过板110而形成连续信道,以连接至气体端口128以及位于顶板110a上表面的真空端口174,并通过电导线而提供电源至位于板110a~c之间的电阻加热器190。「图2」是显示在硬焊之前,排为一列的三个板110a~c。接着将组合件加热而使硬焊化合物软化并与金属板110a~c的各侧反应以形成第一及第二硬焊结合层106a~b,如「图1A」所示。组合件亦可于一硬焊炉中加热,或是于一硬焊热压机中加热并施加一适当压力至组合件上。板110a~c的组合件是加热至足够高的温度,而使得硬焊化合物熔化,并使金属板110a~c连结在一起。接着,硬焊后的板110是于室温下冷却,以形成一结合的组合件,也就是支撑件100的台座108。适合的硬焊方法及材料例如描述于共同受让给Kholendenko等人的美国专利第6503368号(2000年6月29日申请)、共同受让给Wang等人的美国专利第6583980号(2000年8月18日申请)以及共同受让给Wang等人的美国专利第6490146号(2001年8月13日),上述专利皆一并并入本文而作为参考。
支撑件100的顶板110a藉由第一硬焊结合层106a而与中间板110b结合,而中间板110b藉由第二硬焊结合层106b而与底板110c结合。在基材处理期间,通常在板110a~c之间会出现温度差,此乃因为等离子所产生的热,或是来自嵌设于台座108的电阻加热器190的热。而由本发明发现,藉由硬化结合层106a,b而使板110a~c彼此结合会大幅增进板110a~c的界面接合处的热稳定性,而造成上方基材104上更均一的温度分布。一般来说,在基材104处理期间,基材104上方的等离子会使基材104变热,而此热能会由基材104而消散至支撑件100。同时,电阻加热器190亦被驱动而提供热至上方的基材104。由于皆是藉由通过支撑件100而自基材104传导热或将热传导至基材104,因此支撑件100中会形成一个温度梯度。而此温度梯度会造成在基材处理过程中,支撑件100的不同板110a~c具有不同温度,因而在板110a~c中产生热应力,而导致组合件的弯曲。
本发明的组合件的硬焊结合层106a,b藉由降低各个板之间的热传界面的变化性而允许通过多个板110a~c的热传导是为均一的。在传统的电子束焊接方法中,板之间的间隔会造成通过板的不均匀的热传速率,而此可藉由本发明的构造而避免。相对的,硬焊结合层106a,b提供两个邻近板110a~c之间一个连续的平面层,因而在板之间呈现一连续的热界面。连续的热界面提供一同质的热传导基质。在传统的电子束焊接模式中,电子束对接接头相较于周围非接头区域而提供较佳的热传速率,因而造成基材104背侧表面的热传梯度。相对的,本发明的硬焊结合层106a,b提供一具有均匀热传阻抗的薄片接合,因而具有较均一的热传速率。
而另一优点是,由于硬焊结合层106a,b提供通过板110a~c的真空及气体供应管线129、130、132较佳的密封程度。因此,较少出现由于板110a~c之间的界面出现真空泄漏而导致真空压力损失的现象。相似的,硬焊化合物在气体供应管线129、130、132周围形成紧密密封,可降低在接合处的气体泄漏,因而预防上方基材104的温度不稳定性。
根据本发明的基材支撑件100能够符合渐趋严谨的制程规格,举例来说,支持集成电路与显示器制造的进展所要求的基材104上沉积厚度均一性为约3%(1σ)。而此种制程规格需要在基材表面上维持更均一的温度分布。本发明的支撑件100藉由提供与基材104较少的接触面积,并使基材104与支撑件100的基材承接面102之间具有一间隔,而在此间隔容设有一热传气体作为热缓冲物而提供更均一的基材温度,进而提供较佳的温度均一性以及温度控制。由电阻加热器190的不均匀温度或是由电阻加热器190至周围结构的不一致热传导情形所造成的局部热点或冷点,可藉由上述的热缓冲物而变得均匀。本发明允许基材104以几近平坦的热分布情形而加热。另外,电阻加热器190具有设置于两个区域(包括放射状分布的内部区与外部区)的双重电阻加热组件196a,b,藉由个别控制两个区域允许来自第一及第二电阻加热组件196a,b的热可以被分别地调整,而进一步补偿基材104上的温度变异。
另外,基材承接面102上方的凹陷部138以及凹陷的真空沟槽150的网状分布亦协助维持基材104上良好的热分布,其是藉由保证通过真空端口174施加的真空力可均匀分布在基材104的背侧。真空端口174的终端连接于圆形沟槽178,其允许真空压力或真空的传送通过沟槽150的图样而遍及基材104的整个背侧。于一实施例中,沟槽150的图样包括间隔设置的网状分布沟槽150,其是起始于包含有真空端口174的中央部位152的内部圆形沟槽168,并沿着基材104而放射状延伸,而其终端则连接于支撑件100的周围部位156的半圆形沟槽178。真空沟槽150的网状分布提供抓持基材104的均一真空力,以预防基材104于制程当中滑落或跳离开。再者,由于基材104是以其整个背侧表面均一分布的吸力而抓持住,因此基材104与支撑件100的基材承接面102之间有更均匀的热接触,而在基材104与支撑件100之间提供较佳的热传导,因而使得基材104上的温度更为一致。
更有促进置放于支撑件100上的基材104的温度均一性的另一特征结构,亦即由基材承接面102上方的凹陷部138往上延伸的多个突出部134。突出部134提供与基材104接触并支撑基材104的实际接触表面,因而提供相对于基材承接面102凹陷部138的非接触区的可控接触区,而与基材104实际接触。于一实施例中,突出部134的数目为约10~约1000个,或甚至为约20~100个,并具有0.05~0.5英寸的直径,或是甚至为0.10英寸。于一实施例中,突出部134和密封边缘133具有例如为约20~100微米的表面平坦度,以及约4~20微英寸的表面光洁度(surface finish),以提供与上方基材104的底表面均一的热接触界面。当基材104具有变异的平坦度或是弯曲或变形,而使得无法被支撑件100以一致的力量往下抓持,则此时突出部134显得格外重要。当基材104弯曲,突出部134与网状分布的沟槽150以及凹陷部138的组合允许在基材104背侧以一足够的力量而往下抓持,而使基材104平坦并托持住基材104。
突出部134之间的凹陷部138具有一相对于突出部134上表面的接触区域的一深度,因此在基材104底部与凹陷部138之间提供一具间隔的区域。亦发现凹陷部138的表面平坦度或是反射亮度(reflective shine)亦对于基材104的温度均一性有极大影响。举例来说,高反射性的凹陷部138或是具有多变异的反射亮度的凹陷部138会分别造成来自基材104上方部位的热传速率降低或是不同。在一实施例中,凹陷部138是藉由喷珠处理(bead blasting)而使表面粗糙化,而降低其表面反射程度或其反射变异程度,以使基材104达到较佳的热传速率。一适合的表面粗糙度为约2微米(10微英寸)~80微米(400微英寸),或甚至为约4微米(20微英寸)~16微米(80微英寸)。自突出部134的上表面算起的凹陷部138深度为约25微米(0.001英寸)~250微米(0.010密尔)。
亦确定突出部13的上表面接触区域与凹陷部138的非接触区域的比例可用于判定用于提供基材104均一温度控制的电阻加热器190的内部及外部电阻加热组件196a,b所需的功率。另外,本发明的基材支撑件100在其边缘亦具有净化或反应性气体,以防止沉积于基材104的周围边缘,或是藉由导入促进或是降低基材104边缘沉积的气体,以调整基材104于边缘的沉积而改善制程特性。
上述支撑件100所具有的控温能力及控制沉积的特征结构是为独一无二的,且相对于传统基材支撑件为更加有益的。在CVD制程当中,已得知支撑件100提供一具有厚度均一性为2.3~3.5%的沉积层,相较于传统支撑件,其仅可提供5~7%的沉积层厚度均一性。此显示出本发明的基材支撑件可达到1~2倍的沉积薄膜均一性,其为非预期且惊人的结果。
本发明是参照该些较佳实施例而说明如上,而熟悉此技术领域的人士应可轻易从此获知其它的变异实施例。举例来说,支撑件100与其结合层106a,b的其它断面配置及排列应为熟悉此技术领域知人士根据本发明而可轻易得知。本发明的支撑件100可应用于多种腔室中,包括:CVD、PVD、离子植入、RTD,或是其它腔室。因此,本发明的申请专利范围的精神及范围不应限制于说明书中所揭露的较佳实施例。
Claims (14)
1.一种基材支撑件,包括:
(a)金属的顶板,包括一上表面,该上表面包括:多个往外突出的突出部,是分布而遍及一凹陷部;网状分布的多个凹陷沟槽;一真空端口,该真空端口的终端连接于该些凹陷沟槽,并连接至一供应管线;以及多个气体端口,连接至其他供应管线;
(b)金属的中间板,包括多个中间供应管线,该些中间供应管线与该顶板的多个供应管线排为一列,该中间板藉由第一硬焊结合层而与该顶板接合;以及
(c)金属的底板,包括多个底部供应管线,该些底部供应管线与该中间板的该些中间供应管线排为一列,该底板藉由第二硬焊结合层而与该中间板接合。
2.如权利要求1所述的基材支撑件,其中该第一或第二硬焊结合层中的任一个包括硬焊化合物,该硬焊化合物包括铝、铜、铟、铅、镁、镍、锡、硅及其合金的至少其中之一。
3.如权利要求1所述的基材支撑件,其中该上表面包括中央部位以及周围部位,该些凹陷沟槽包括分隔设置的多个臂,该些臂是起始于包含该真空端口的该中央部位的圆形沟槽,并放射状地延伸跨过一基材,而该些臂的终端连接于该周围部位的半圆形沟槽。
4.如权利要求1所述的基材支撑件,其中该金属包括不锈钢。
5.如权利要求1所述的基材支撑件,其中该凹陷部包括下列至少其中之一:
(1)表面粗糙度为2~80微米;以及
(2)自该些突出部的上表面算起的深度为25~250微米。
6.如权利要求1所述的基材支撑件,其中该些突出部包括下列特征的至少其中之一:
(1)该些突出部是基本为圆柱形;
(2)该些突出部的数量为10~1000个;
(3)该些突出部的表面平坦度为20~100微米;以及
(4)该些突出部的表面光洁度为0.1016至0.508微米。
7.如权利要求1所述的基材支撑件,其中在该些突出部的周围更包括密封边缘。
8.如权利要求7所述的基材支撑件,其中该密封边缘的表面平坦度为20~100微米,且表面光洁度为0.1016至0.508微米。
9.如权利要求1所述的基材支撑件,其中该顶板的下表面的沟槽内更包括电阻加热器;该电阻加热器包括下列至少其中之一:
(1)第一电阻加热元件,其设置在该顶板的周围部位的周围;以及第二电阻加热元件,其设置在该顶板的中央部位的周围;以及
(2)该第一及第二电阻加热元件各自包括同心线圈。
10.如权利要求9所述的基材支撑件,其中该电阻加热器包括电阻加热元件,该电阻加热元件是呈螺旋线圈状,且包覆有电绝缘体粉末而位于一管中。
11.如权利要求10所述的基材支撑件,其中该管是由热传导填料所包覆住,且位于该顶板的该沟槽内。
12.一种形成基材支撑件的方法,该方法包括:
(a)形成金属的顶板,该顶板包括上表面,该上表面具有由一凹陷部延伸且往外突出的多个突出部,该突出部位于网状分布的多个凹陷沟槽之间,且多个顶部供应管线的终端连接于真空端口以及多个气体端口;
(b)形成金属的中间板,该中间板包括多个中间供应管线;
(c)形成金属的底板,该底板包括多个底部供应管线;
(d)施加硬焊化合物至该顶板、该中间板以及该底板的至少二表面;
(e)将该顶板、该中间板以及该底板排为一列而形成一组合件,则该些顶部供应管线、该些中间供应管线及该些底部供应管线是彼此排为一列;
(f)加热该组合件至该硬焊化合物的熔化温度;以及
(g)冷却该组合件,以在该顶板、该中间板以及该底板之间形成硬焊接合。
13.如权利要求12所述的方法,其中上述步骤所施加的该硬焊化合物具有下列特征的至少其中之一:
(1)熔化温度低于该顶板、该中间板以及该底板的熔点;以及
(2)包括铝、铜、铟、铅、镁、镍、锡、硅及其合金的至少其中之一。
14.如权利要求13所述的方法,更包括下列的至少其中之一:
(1)形成多个凹陷沟槽,该些凹陷沟槽包括分隔设置的多个放射状臂,该些臂是由该顶板的中央部位放射状地往外延伸至该顶板的周围部位;
(2)形成多个为圆柱体的突出部;以及
(3)在该顶板的下表面形成沟槽,以容设电阻加热器,并将该电阻加热器置放入该沟槽中。
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US70939705P | 2005-08-17 | 2005-08-17 | |
US60/709,397 | 2005-08-17 | ||
PCT/US2006/032501 WO2007022471A2 (en) | 2005-08-17 | 2006-08-17 | Substrate support having brazed plates and heater |
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CN101243542A CN101243542A (zh) | 2008-08-13 |
CN101243542B true CN101243542B (zh) | 2011-02-09 |
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US (1) | US7705275B2 (zh) |
JP (1) | JP5478065B2 (zh) |
KR (1) | KR100974130B1 (zh) |
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KR20080030108A (ko) | 2008-04-03 |
JP5478065B2 (ja) | 2014-04-23 |
TWI358460B (en) | 2012-02-21 |
US7705275B2 (en) | 2010-04-27 |
TW200712244A (en) | 2007-04-01 |
US20070040265A1 (en) | 2007-02-22 |
CN101243542A (zh) | 2008-08-13 |
WO2007022471A2 (en) | 2007-02-22 |
JP2009504925A (ja) | 2009-02-05 |
WO2007022471A3 (en) | 2007-06-07 |
KR100974130B1 (ko) | 2010-08-04 |
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