CN100520975C - 非易失性半导体存储器件 - Google Patents
非易失性半导体存储器件 Download PDFInfo
- Publication number
- CN100520975C CN100520975C CNB2005100081758A CN200510008175A CN100520975C CN 100520975 C CN100520975 C CN 100520975C CN B2005100081758 A CNB2005100081758 A CN B2005100081758A CN 200510008175 A CN200510008175 A CN 200510008175A CN 100520975 C CN100520975 C CN 100520975C
- Authority
- CN
- China
- Prior art keywords
- mentioned
- bit line
- main bit
- selection
- line
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP038291/2004 | 2004-02-16 | ||
| JP2004038291A JP4494820B2 (ja) | 2004-02-16 | 2004-02-16 | 不揮発性半導体記憶装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1658330A CN1658330A (zh) | 2005-08-24 |
| CN100520975C true CN100520975C (zh) | 2009-07-29 |
Family
ID=34836305
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100081758A Expired - Fee Related CN100520975C (zh) | 2004-02-16 | 2005-02-16 | 非易失性半导体存储器件 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US7123510B2 (enExample) |
| JP (1) | JP4494820B2 (enExample) |
| CN (1) | CN100520975C (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4484577B2 (ja) * | 2004-05-07 | 2010-06-16 | 株式会社ルネサステクノロジ | 半導体記憶装置及びその制御方法 |
| US7095655B2 (en) * | 2004-08-12 | 2006-08-22 | Saifun Semiconductors Ltd. | Dynamic matching of signal path and reference path for sensing |
| US7606066B2 (en) | 2005-09-07 | 2009-10-20 | Innovative Silicon Isi Sa | Memory cell and memory cell array having an electrically floating body transistor, and methods of operating same |
| JP2008047189A (ja) | 2006-08-11 | 2008-02-28 | Matsushita Electric Ind Co Ltd | 半導体記憶装置 |
| US7869246B2 (en) * | 2007-05-25 | 2011-01-11 | Marvell World Trade Ltd. | Bit line decoder architecture for NOR-type memory array |
| CN101131862B (zh) * | 2007-09-29 | 2011-03-30 | 航天东方红卫星有限公司 | 一种空间非易失存储器 |
| JP2009123274A (ja) * | 2007-11-14 | 2009-06-04 | Panasonic Corp | 半導体記憶装置 |
| JP5209289B2 (ja) | 2007-12-13 | 2013-06-12 | 三星電子株式会社 | 半導体記憶装置 |
| US7848160B2 (en) * | 2007-12-13 | 2010-12-07 | Samsung Electronics Co., Ltd. | Semiconductor storage device and method for operating the same |
| JP2009245503A (ja) | 2008-03-31 | 2009-10-22 | Nec Electronics Corp | 半導体記憶装置 |
| JP2010061711A (ja) * | 2008-09-01 | 2010-03-18 | Panasonic Corp | 半導体記憶装置 |
| JP5343916B2 (ja) | 2010-04-16 | 2013-11-13 | 富士通セミコンダクター株式会社 | 半導体メモリ |
| KR101217218B1 (ko) * | 2011-03-15 | 2012-12-31 | 고려대학교 산학협력단 | 저전력 비디오 프로세서를 위한 임베디드 메모리 설계 |
| JP5219170B2 (ja) * | 2011-09-21 | 2013-06-26 | 株式会社フローディア | 不揮発性半導体記憶装置 |
| JP2012119058A (ja) * | 2012-02-13 | 2012-06-21 | Fujitsu Semiconductor Ltd | 不揮発性半導体メモリ |
| KR102189824B1 (ko) * | 2014-08-04 | 2020-12-11 | 삼성전자주식회사 | 메모리 장치의 단위 어레이, 이를 포함하는 메모리 장치 및 메모리 시스템 |
| JP2024044809A (ja) * | 2022-09-21 | 2024-04-02 | 株式会社東芝 | 半導体記憶装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5563823A (en) * | 1993-08-31 | 1996-10-08 | Macronix International Co., Ltd. | Fast FLASH EPROM programming and pre-programming circuit design |
| US5963465A (en) * | 1997-12-12 | 1999-10-05 | Saifun Semiconductors, Ltd. | Symmetric segmented memory array architecture |
| US6633496B2 (en) * | 1997-12-12 | 2003-10-14 | Saifun Semiconductors Ltd. | Symmetric architecture for memory cells having widely spread metal bit lines |
| JP2000101050A (ja) * | 1998-09-22 | 2000-04-07 | Nec Corp | 半導体記憶装置およびメモリセルのレイアウト方法 |
| US6128226A (en) * | 1999-02-04 | 2000-10-03 | Saifun Semiconductors Ltd. | Method and apparatus for operating with a close to ground signal |
| JP3694422B2 (ja) * | 1999-06-21 | 2005-09-14 | シャープ株式会社 | ロウデコーダ回路 |
| JP2001044394A (ja) * | 1999-08-03 | 2001-02-16 | Hitachi Ltd | 半導体装置およびその副ビット線選択方法 |
| US6262914B1 (en) * | 1999-08-11 | 2001-07-17 | Texas Instruments Incorporated | Flash memory segmentation |
| US6272043B1 (en) * | 2000-01-28 | 2001-08-07 | Advanced Micro Devices, Inc. | Apparatus and method of direct current sensing from source side in a virtual ground array |
| US6351415B1 (en) * | 2001-03-28 | 2002-02-26 | Tower Semiconductor Ltd. | Symmetrical non-volatile memory array architecture without neighbor effect |
| US6584034B1 (en) * | 2001-04-23 | 2003-06-24 | Aplus Flash Technology Inc. | Flash memory array structure suitable for multiple simultaneous operations |
| JP3573341B2 (ja) * | 2001-05-09 | 2004-10-06 | 松下電器産業株式会社 | 半導体記憶装置 |
| JP2003124362A (ja) * | 2001-10-18 | 2003-04-25 | Matsushita Electric Ind Co Ltd | 不揮発性半導体記憶装置およびその駆動方法 |
-
2004
- 2004-02-16 JP JP2004038291A patent/JP4494820B2/ja not_active Expired - Fee Related
-
2005
- 2005-02-16 CN CNB2005100081758A patent/CN100520975C/zh not_active Expired - Fee Related
- 2005-02-16 US US11/058,374 patent/US7123510B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US7123510B2 (en) | 2006-10-17 |
| CN1658330A (zh) | 2005-08-24 |
| JP4494820B2 (ja) | 2010-06-30 |
| JP2005228446A (ja) | 2005-08-25 |
| US20050180212A1 (en) | 2005-08-18 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090729 Termination date: 20180216 |
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| CF01 | Termination of patent right due to non-payment of annual fee |