CN100390898C - 在公共基片上制造的磁阻存储器及其操作方法 - Google Patents
在公共基片上制造的磁阻存储器及其操作方法 Download PDFInfo
- Publication number
- CN100390898C CN100390898C CNB028043405A CN02804340A CN100390898C CN 100390898 C CN100390898 C CN 100390898C CN B028043405 A CNB028043405 A CN B028043405A CN 02804340 A CN02804340 A CN 02804340A CN 100390898 C CN100390898 C CN 100390898C
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- CN
- China
- Prior art keywords
- magnetoresistive memory
- line
- word line
- digital
- circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 239000000758 substrate Substances 0.000 title claims abstract description 22
- 238000000034 method Methods 0.000 title claims description 13
- 238000003491 array Methods 0.000 claims abstract description 7
- 230000004044 response Effects 0.000 claims description 4
- 230000008878 coupling Effects 0.000 claims description 2
- 238000010168 coupling process Methods 0.000 claims description 2
- 238000005859 coupling reaction Methods 0.000 claims description 2
- 230000008569 process Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- 230000007704 transition Effects 0.000 description 5
- 230000006872 improvement Effects 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 230000004888 barrier function Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000005641 tunneling Effects 0.000 description 2
- 239000006096 absorbing agent Substances 0.000 description 1
- 230000001413 cellular effect Effects 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/14—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
- G11C11/15—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
- G11C11/165—Auxiliary circuits
- G11C11/1653—Address circuits or decoders
- G11C11/1657—Word-line or row circuits
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Mram Or Spin Memory Techniques (AREA)
- Semiconductor Memories (AREA)
- Hall/Mr Elements (AREA)
Abstract
Description
Claims (9)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US09/772,669 | 2001-01-30 | ||
US09/772,669 US6418046B1 (en) | 2001-01-30 | 2001-01-30 | MRAM architecture and system |
Publications (2)
Publication Number | Publication Date |
---|---|
CN1496569A CN1496569A (zh) | 2004-05-12 |
CN100390898C true CN100390898C (zh) | 2008-05-28 |
Family
ID=25095817
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CNB028043405A Expired - Lifetime CN100390898C (zh) | 2001-01-30 | 2002-01-11 | 在公共基片上制造的磁阻存储器及其操作方法 |
Country Status (9)
Country | Link |
---|---|
US (2) | US6418046B1 (zh) |
EP (1) | EP1358655B1 (zh) |
JP (2) | JP2004530240A (zh) |
KR (1) | KR100869658B1 (zh) |
CN (1) | CN100390898C (zh) |
AU (1) | AU2002243531A1 (zh) |
DE (1) | DE60229216D1 (zh) |
TW (1) | TW546652B (zh) |
WO (1) | WO2002061752A2 (zh) |
Families Citing this family (50)
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US6904324B2 (en) * | 1999-12-01 | 2005-06-07 | Meagan Medical, Inc. | Method and apparatus for deploying a percutaneous probe |
US6912424B2 (en) * | 1999-12-01 | 2005-06-28 | Meagan, Medical, Inc. | Apparatus and method for coupling therapeutic and/or monitoring equipment to a patient |
US6418046B1 (en) * | 2001-01-30 | 2002-07-09 | Motorola, Inc. | MRAM architecture and system |
US6687178B1 (en) * | 2001-02-23 | 2004-02-03 | Western Digital (Fremont), Inc. | Temperature dependent write current source for magnetic tunnel junction MRAM |
JP3869682B2 (ja) * | 2001-06-12 | 2007-01-17 | 株式会社ルネサステクノロジ | 半導体装置 |
SG102019A1 (en) * | 2001-12-04 | 2004-02-27 | Inst Data Storage | Magnetic tunnel junction magnetic random access memory |
JP2003196973A (ja) * | 2001-12-21 | 2003-07-11 | Mitsubishi Electric Corp | 薄膜磁性体記憶装置 |
US6512689B1 (en) * | 2002-01-18 | 2003-01-28 | Motorola, Inc. | MRAM without isolation devices |
KR100505104B1 (ko) * | 2002-04-30 | 2005-07-29 | 삼성전자주식회사 | 자기 램 셀들, 그 구조체들 및 그 구동방법 |
US6693824B2 (en) * | 2002-06-28 | 2004-02-17 | Motorola, Inc. | Circuit and method of writing a toggle memory |
KR100496858B1 (ko) * | 2002-08-02 | 2005-06-22 | 삼성전자주식회사 | 비트라인 클램핑 전압에 상관없이 기준 셀로 일정 전류가흐르는 마그네틱 랜덤 억세스 메모리 |
US6909628B2 (en) * | 2003-02-13 | 2005-06-21 | Taiwan Semiconductor Manufacturing Company, Ltd. | High density magnetic RAM and array architecture using a one transistor, one diode, and one MTJ cell |
US7173846B2 (en) * | 2003-02-13 | 2007-02-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetic RAM and array architecture using a two transistor, one MTJ cell |
KR100542743B1 (ko) | 2003-04-22 | 2006-01-11 | 삼성전자주식회사 | 자기 랜덤 엑세스 메모리 |
US6885577B2 (en) * | 2003-06-18 | 2005-04-26 | Taiwan Semiconductor Manufacturing Company, Ltd. | Magnetic RAM cell device and array architecture |
US7031183B2 (en) * | 2003-12-08 | 2006-04-18 | Freescale Semiconductor, Inc. | MRAM device integrated with other types of circuitry |
US7333360B2 (en) * | 2003-12-23 | 2008-02-19 | Freescale Semiconductor, Inc. | Apparatus for pulse testing a MRAM device and method therefore |
JP4819316B2 (ja) * | 2004-02-23 | 2011-11-24 | ルネサスエレクトロニクス株式会社 | 半導体装置 |
US7283384B1 (en) | 2004-03-24 | 2007-10-16 | Silicon Magnetic Systems | Magnetic memory array architecture |
US7110289B1 (en) | 2004-03-31 | 2006-09-19 | Western Digital (Fremont), Inc. | Method and system for controlling MRAM write current to reduce power consumption |
JP2008500718A (ja) * | 2004-05-27 | 2008-01-10 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | Mramを電力効率良くバイト書込みするための逆にされた磁気トンネル接合 |
WO2006038249A1 (ja) * | 2004-09-30 | 2006-04-13 | Spansion Llc | 半導体装置及びその制御方法 |
US7543211B2 (en) * | 2005-01-31 | 2009-06-02 | Everspin Technologies, Inc. | Toggle memory burst |
US7646628B2 (en) | 2005-02-09 | 2010-01-12 | Nec Corporation | Toggle magnetic random access memory and write method of toggle magnetic random access memory |
US7190612B2 (en) * | 2005-03-31 | 2007-03-13 | Grandis, Inc. | Circuitry for use in current switching a magnetic cell |
US7272035B1 (en) | 2005-08-31 | 2007-09-18 | Grandis, Inc. | Current driven switching of magnetic storage cells utilizing spin transfer and magnetic memories using such cells |
US7272034B1 (en) | 2005-08-31 | 2007-09-18 | Grandis, Inc. | Current driven switching of magnetic storage cells utilizing spin transfer and magnetic memories using such cells |
JP5035620B2 (ja) | 2005-09-14 | 2012-09-26 | 日本電気株式会社 | 磁気ランダムアクセスメモリの波形整形回路 |
JP4284326B2 (ja) * | 2006-01-12 | 2009-06-24 | 株式会社東芝 | 磁気抵抗ランダムアクセスメモリおよびその書き込み制御方法 |
US7505348B2 (en) * | 2006-10-06 | 2009-03-17 | International Business Machines Corporation | Balanced and bi-directional bit line paths for memory arrays with programmable memory cells |
US7719882B2 (en) * | 2007-02-06 | 2010-05-18 | Taiwan Semiconductor Manufacturing Company, Ltd. | Advanced MRAM design |
US7890892B2 (en) | 2007-11-15 | 2011-02-15 | International Business Machines Corporation | Balanced and bi-directional bit line paths for memory arrays with programmable memory cells |
KR20090109823A (ko) * | 2008-04-16 | 2009-10-21 | 삼성전자주식회사 | 저항체를 이용한 멀티 레벨 비휘발성 메모리 장치 |
US7903454B2 (en) * | 2008-05-02 | 2011-03-08 | Qimonda Ag | Integrated circuit, memory cell array, memory module, and method of operating an integrated circuit |
US8283771B2 (en) * | 2008-06-30 | 2012-10-09 | Intel Corporation | Multi-die integrated circuit device and method |
JP5526707B2 (ja) * | 2009-10-27 | 2014-06-18 | ソニー株式会社 | 情報記憶素子の駆動方法 |
US8456930B2 (en) | 2010-10-07 | 2013-06-04 | Hynix Semiconductor Inc. | Variable resistance memory device having equal resistances between signal paths regardless of location of memory cells within the memory array |
FR2973149B1 (fr) * | 2011-03-24 | 2021-12-10 | Univ Paris Sud 11 | Architecture de memoire logique, notamment pour mram ou pcram ou rram. |
KR101959853B1 (ko) | 2012-04-09 | 2019-03-19 | 삼성전자주식회사 | 분할 어드레싱 방식 자기 랜덤 액세스 메모리 장치 |
KR20130134918A (ko) * | 2012-05-31 | 2013-12-10 | 삼성전자주식회사 | 불휘발성 메모리를 포함하는 컴퓨터 시스템 및 컴퓨터 시스템의 동작방법 |
KR20130139066A (ko) | 2012-06-12 | 2013-12-20 | 삼성전자주식회사 | 소스라인 전압 발생기를 포함하는 자기 저항 메모리 장치 |
US9530469B2 (en) * | 2013-03-15 | 2016-12-27 | Sony Semiconductor Solutions Corporation | Integrated circuit system with non-volatile memory stress suppression and method of manufacture thereof |
KR102098244B1 (ko) | 2014-02-04 | 2020-04-07 | 삼성전자 주식회사 | 자기 메모리 소자 |
US9293171B2 (en) | 2014-03-13 | 2016-03-22 | Kabushiki Kaisha Toshiba | Resistance change memory |
US10536281B2 (en) | 2014-07-30 | 2020-01-14 | University Of South Florida | Magnetic memory physically unclonable functions |
US9368199B2 (en) * | 2014-09-02 | 2016-06-14 | Kabushiki Kaisha Toshiba | Memory device |
CN109872740A (zh) * | 2017-12-01 | 2019-06-11 | 上海磁宇信息科技有限公司 | 一种使用对称阵列参考单元的mram芯片 |
CN110070899A (zh) * | 2018-01-24 | 2019-07-30 | 上海磁宇信息科技有限公司 | 使用多重对称阵列参考单元的mram芯片及检测方法 |
KR102661099B1 (ko) * | 2018-11-08 | 2024-04-29 | 삼성전자주식회사 | 전송 소자를 포함하는 불휘발성 메모리 장치 |
KR102508925B1 (ko) | 2019-04-18 | 2023-03-09 | 삼성전자주식회사 | 메모리 장치 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5555529A (en) * | 1993-12-28 | 1996-09-10 | Intel Corporation | Power saving architecture for a cache memory |
US5702831A (en) * | 1995-11-06 | 1997-12-30 | Motorola | Ferromagnetic GMR material |
US5841728A (en) * | 1995-09-29 | 1998-11-24 | Sgs-Thomson Microelectronics, S.R.L. | Hierarchic memory device having auxiliary lines connected to word lines |
US5894447A (en) * | 1996-09-26 | 1999-04-13 | Kabushiki Kaisha Toshiba | Semiconductor memory device including a particular memory cell block structure |
US6055178A (en) * | 1998-12-18 | 2000-04-25 | Motorola, Inc. | Magnetic random access memory with a reference memory array |
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JPH0250388A (ja) * | 1988-08-12 | 1990-02-20 | Hitachi Ltd | 半導体記憶装置 |
JP3173387B2 (ja) * | 1996-09-20 | 2001-06-04 | 日本電気株式会社 | 半導体記憶装置及びデコード回路 |
US5748519A (en) * | 1996-12-13 | 1998-05-05 | Motorola, Inc. | Method of selecting a memory cell in a magnetic random access memory device |
US6134060A (en) * | 1997-06-10 | 2000-10-17 | Stmicroelectronics, Inc. | Current bias, current sense for magneto-resistive preamplifier, preamplifying integrated circuit, and related methods |
US5986925A (en) * | 1998-04-07 | 1999-11-16 | Motorola, Inc. | Magnetoresistive random access memory device providing simultaneous reading of two cells and operating method |
US5946227A (en) * | 1998-07-20 | 1999-08-31 | Motorola, Inc. | Magnetoresistive random access memory with shared word and digit lines |
WO2000042614A1 (de) * | 1999-01-13 | 2000-07-20 | Infineon Technologies Ag | Schreib-/lesearchitektur für mram |
US6477630B2 (en) * | 1999-02-24 | 2002-11-05 | International Business Machines Corporation | Hierarchical row activation method for banking control in multi-bank DRAM |
US6609174B1 (en) * | 1999-10-19 | 2003-08-19 | Motorola, Inc. | Embedded MRAMs including dual read ports |
US6205073B1 (en) * | 2000-03-31 | 2001-03-20 | Motorola, Inc. | Current conveyor and method for readout of MTJ memories |
DE10032271C2 (de) * | 2000-07-03 | 2002-08-01 | Infineon Technologies Ag | MRAM-Anordnung |
US6331943B1 (en) * | 2000-08-28 | 2001-12-18 | Motorola, Inc. | MTJ MRAM series-parallel architecture |
DE10043440C2 (de) * | 2000-09-04 | 2002-08-29 | Infineon Technologies Ag | Magnetoresistiver Speicher und Verfahren zu seinem Auslesen |
US6272040B1 (en) * | 2000-09-29 | 2001-08-07 | Motorola, Inc. | System and method for programming a magnetoresistive memory device |
US6625057B2 (en) * | 2000-11-17 | 2003-09-23 | Kabushiki Kaisha Toshiba | Magnetoresistive memory device |
DE10062570C1 (de) * | 2000-12-15 | 2002-06-13 | Infineon Technologies Ag | Schaltungsanordnung zur Steuerung von Schreib- und Lesevorgängen in einer magnetoresistiven Speicheranordnung (MRAM) |
JP3920565B2 (ja) * | 2000-12-26 | 2007-05-30 | 株式会社東芝 | 磁気ランダムアクセスメモリ |
US6594176B2 (en) * | 2001-01-24 | 2003-07-15 | Infineon Technologies Ag | Current source and drain arrangement for magnetoresistive memories (MRAMs) |
US6418046B1 (en) * | 2001-01-30 | 2002-07-09 | Motorola, Inc. | MRAM architecture and system |
US6385109B1 (en) * | 2001-01-30 | 2002-05-07 | Motorola, Inc. | Reference voltage generator for MRAM and method |
-
2001
- 2001-01-30 US US09/772,669 patent/US6418046B1/en not_active Expired - Lifetime
-
2002
- 2002-01-11 DE DE60229216T patent/DE60229216D1/de not_active Expired - Lifetime
- 2002-01-11 JP JP2002561833A patent/JP2004530240A/ja active Pending
- 2002-01-11 KR KR1020037010082A patent/KR100869658B1/ko active IP Right Grant
- 2002-01-11 EP EP02709023A patent/EP1358655B1/en not_active Expired - Lifetime
- 2002-01-11 CN CNB028043405A patent/CN100390898C/zh not_active Expired - Lifetime
- 2002-01-11 AU AU2002243531A patent/AU2002243531A1/en not_active Abandoned
- 2002-01-11 WO PCT/US2002/000962 patent/WO2002061752A2/en active Application Filing
- 2002-01-28 TW TW091101369A patent/TW546652B/zh not_active IP Right Cessation
- 2002-05-08 US US10/141,161 patent/US6552927B2/en not_active Expired - Fee Related
-
2008
- 2008-07-30 JP JP2008196451A patent/JP4834040B2/ja not_active Expired - Lifetime
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5555529A (en) * | 1993-12-28 | 1996-09-10 | Intel Corporation | Power saving architecture for a cache memory |
US5841728A (en) * | 1995-09-29 | 1998-11-24 | Sgs-Thomson Microelectronics, S.R.L. | Hierarchic memory device having auxiliary lines connected to word lines |
US5702831A (en) * | 1995-11-06 | 1997-12-30 | Motorola | Ferromagnetic GMR material |
US5894447A (en) * | 1996-09-26 | 1999-04-13 | Kabushiki Kaisha Toshiba | Semiconductor memory device including a particular memory cell block structure |
US6055178A (en) * | 1998-12-18 | 2000-04-25 | Motorola, Inc. | Magnetic random access memory with a reference memory array |
Also Published As
Publication number | Publication date |
---|---|
EP1358655A2 (en) | 2003-11-05 |
KR20030072616A (ko) | 2003-09-15 |
AU2002243531A1 (en) | 2002-08-12 |
JP4834040B2 (ja) | 2011-12-07 |
US6418046B1 (en) | 2002-07-09 |
US20020101760A1 (en) | 2002-08-01 |
WO2002061752A2 (en) | 2002-08-08 |
US20020131295A1 (en) | 2002-09-19 |
TW546652B (en) | 2003-08-11 |
US6552927B2 (en) | 2003-04-22 |
JP2008257866A (ja) | 2008-10-23 |
WO2002061752A3 (en) | 2002-10-24 |
EP1358655B1 (en) | 2008-10-08 |
JP2004530240A (ja) | 2004-09-30 |
CN1496569A (zh) | 2004-05-12 |
KR100869658B1 (ko) | 2008-11-21 |
DE60229216D1 (de) | 2008-11-20 |
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