CA2307239A1 - Materiau thermoelectrique transducteur et son procede de fabrication - Google Patents
Materiau thermoelectrique transducteur et son procede de fabrication Download PDFInfo
- Publication number
- CA2307239A1 CA2307239A1 CA002307239A CA2307239A CA2307239A1 CA 2307239 A1 CA2307239 A1 CA 2307239A1 CA 002307239 A CA002307239 A CA 002307239A CA 2307239 A CA2307239 A CA 2307239A CA 2307239 A1 CA2307239 A1 CA 2307239A1
- Authority
- CA
- Canada
- Prior art keywords
- type semiconductor
- thermoelectric conversion
- dopant
- conversion material
- silicon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49872—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials the conductive materials containing semiconductor material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49866—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials
- H01L23/49883—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers characterised by the materials the conductive materials containing organic materials or pastes, e.g. for thick films
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/53271—Conductive materials containing semiconductor material, e.g. polysilicon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/532—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body characterised by the materials
- H01L23/53204—Conductive materials
- H01L23/5328—Conductive materials containing conductive organic materials or pastes, e.g. conductive adhesives, inks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/852—Thermoelectric active materials comprising inorganic compositions comprising tellurium, selenium or sulfur
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N10/00—Thermoelectric devices comprising a junction of dissimilar materials, i.e. devices exhibiting Seebeck or Peltier effects
- H10N10/80—Constructional details
- H10N10/85—Thermoelectric active materials
- H10N10/851—Thermoelectric active materials comprising inorganic compositions
- H10N10/855—Thermoelectric active materials comprising inorganic compositions comprising compounds containing boron, carbon, oxygen or nitrogen
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
Landscapes
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Silicon Compounds (AREA)
Abstract
L'invention porte sur un nouveau matériau thermoélectrique transducteur à base de silicium contenant un semi-conducteur de type P ou N obtenu par l'adjonction au Si de différentes impuretés, et qui peut être produit à bon prix et rendement élevé tout en présentant une qualité stable et un fort indice de performance. Normalement lorsqu'on ajoute différents éléments au Si, le coefficient de Seebeck du matériau décroît avec l'augmentation de la concentration du substrat jusqu'à ce qu'elle atteigne 10?18¿ M/m?3¿, la valeur minimale du coefficient de Seebeck étant alors comprise entre 10?18¿ et 10?19¿ M/m?3¿. Le matériau de l'invention est un semi-conducteur de type P ou N dont la concentration du substrat est comprise entre 10?17¿ et 10?20¿ M/m?3¿, et contenant du Si et entre 0,001 et 0,5 % d'atomes d'un ou plusieurs des éléments suivants: Be, Mg, C.a., Sr, Ba, Zn, Cd, Hg, B, P, As, Sb, Bi, O, S, S et Te. Il peut également être un semi-conducteur de type P ou N dont la concentration du substrat est comprise entre 10?19¿ et 10?21¿ M/m?3¿, et contenant du Si, et entre 0,5 et 10 % d'atomes d'un ou plusieurs des susdits éléments.
Applications Claiming Priority (19)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP9/309933 | 1997-10-24 | ||
JP30993397 | 1997-10-24 | ||
JP9/365676 | 1997-12-22 | ||
JP9/365677 | 1997-12-22 | ||
JP36567797 | 1997-12-22 | ||
JP36567697 | 1997-12-22 | ||
JP36567597 | 1997-12-22 | ||
JP9/365675 | 1997-12-22 | ||
JP36567497 | 1997-12-22 | ||
JP9/365674 | 1997-12-22 | ||
JP9/368828 | 1997-12-27 | ||
JP36882897 | 1997-12-27 | ||
JP18971498 | 1998-06-19 | ||
JP10/189715 | 1998-06-19 | ||
JP10/189714 | 1998-06-19 | ||
JP18971598 | 1998-06-19 | ||
JP19654698 | 1998-06-26 | ||
JP10/196546 | 1998-06-26 | ||
PCT/JP1998/003496 WO1999022410A1 (fr) | 1997-10-24 | 1998-08-05 | Materiau thermoelectrique transducteur et son procede de fabrication |
Publications (1)
Publication Number | Publication Date |
---|---|
CA2307239A1 true CA2307239A1 (fr) | 1999-05-06 |
Family
ID=27577571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CA002307239A Abandoned CA2307239A1 (fr) | 1997-10-24 | 1998-08-05 | Materiau thermoelectrique transducteur et son procede de fabrication |
Country Status (7)
Country | Link |
---|---|
EP (1) | EP1039556A4 (fr) |
JP (1) | JP4399757B2 (fr) |
KR (1) | KR100398939B1 (fr) |
CN (1) | CN1162920C (fr) |
AU (1) | AU8560198A (fr) |
CA (1) | CA2307239A1 (fr) |
WO (1) | WO1999022410A1 (fr) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016106514A1 (fr) * | 2014-12-29 | 2016-07-07 | 中国科学院福建物质结构研究所 | Matériau thermoélectrique, procédé de préparation de celui-ci et application de celui-ci |
Families Citing this family (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100419488B1 (ko) * | 1999-03-10 | 2004-02-19 | 스미토모 도큐슈 긴조쿠 가부시키가이샤 | 열전 변환 재료 및 그 제조 방법 |
JP2002094131A (ja) * | 2000-09-13 | 2002-03-29 | Sumitomo Special Metals Co Ltd | 熱電変換素子 |
JP4665156B2 (ja) * | 2004-12-22 | 2011-04-06 | 国立大学法人山口大学 | クラスレート化合物及びその製造方法 |
CN1333093C (zh) * | 2005-11-17 | 2007-08-22 | 钢铁研究总院 | 铋-碲基热电合金的制备方法 |
US20100051081A1 (en) * | 2006-12-20 | 2010-03-04 | Showa Kde Co., Ltd. | Thermoelectric conversion material, method for manufacturing the same, and thermoelectric conversion element |
CN103400932B (zh) * | 2008-08-29 | 2016-08-10 | Lg化学株式会社 | 新型热电转换材料及其制备方法,以及使用该新型热电转换材料的热电转换元件 |
KR101063938B1 (ko) * | 2008-11-13 | 2011-09-14 | 한국전기연구원 | 중저온용 열전재료 |
US20110303292A1 (en) * | 2009-02-20 | 2011-12-15 | Saki Sonoda | Light-absorbing material and photoelectric conversion element using the same |
US8390157B2 (en) * | 2009-05-14 | 2013-03-05 | Shin-Etsu Chemical Co., Ltd. | Cooling mechanism for axial gap type rotating machines |
CN101613846B (zh) * | 2009-07-13 | 2010-11-17 | 浙江大学 | 快速凝固制备Mg-Si-Sn基热电材料的方法 |
CN101736172B (zh) * | 2010-01-08 | 2011-08-03 | 武汉理工大学 | 一种SiGe合金热电材料的制备方法 |
CN102157672B (zh) * | 2011-01-28 | 2013-01-30 | 山东大学 | 全陶瓷热电发电模块及其制备方法 |
CN102983261B (zh) * | 2012-11-20 | 2015-11-25 | 溧阳市生产力促进中心 | 一种内外电极均为一端封闭金属管的热电转换电池 |
CN102983265B (zh) * | 2012-11-20 | 2015-11-25 | 溧阳市生产力促进中心 | 一种内外电极均为金属板的热电转换电池 |
US20140360546A1 (en) * | 2013-06-08 | 2014-12-11 | Alphabet Energy, Inc. | Silicon-based thermoelectric materials including isoelectronic impurities, thermoelectric devices based on such materials, and methods of making and using same |
KR101717750B1 (ko) * | 2014-11-17 | 2017-03-17 | 주식회사 엘지화학 | 이종 금속 및 산화물이 첨가된 화합물 반도체 및 그 제조방법 |
CN105839182A (zh) * | 2016-04-11 | 2016-08-10 | 西安隆基硅材料股份有限公司 | 晶体硅及其制备方法 |
JP6949850B2 (ja) * | 2016-08-31 | 2021-10-13 | 住友電気工業株式会社 | 熱電変換材料、熱電変換素子および熱電変換モジュール |
CN106418749B (zh) * | 2016-10-11 | 2018-02-16 | 广东俏丹娜科技发展有限公司 | 一种可拆卸型透气按摩胸罩 |
EP3573116B1 (fr) * | 2017-01-19 | 2020-11-04 | Mitsubishi Gas Chemical Company, Inc. | Cristal semi-conducteur et procédé de génération d'énergie |
JP6768556B2 (ja) * | 2017-02-27 | 2020-10-14 | 株式会社日立製作所 | 熱電変換材料及びその製造方法 |
JP7076096B2 (ja) * | 2017-03-31 | 2022-05-27 | 東ソー株式会社 | シリコン系薄膜及びその製造方法 |
CN110622328B (zh) * | 2017-05-19 | 2023-12-08 | 日东电工株式会社 | 半导体烧结体、电气电子部件及半导体烧结体的制造方法 |
CN107488028B (zh) * | 2017-07-14 | 2020-10-27 | 昆明理工大学 | 一种铑基氧化物热电材料及其制备方法 |
WO2020049852A1 (fr) * | 2018-09-03 | 2020-03-12 | 住友電気工業株式会社 | Élément de conversion thermoélectrique, module de conversion thermoélectrique, capteur optique, procédé de fabrication de matériau de conversion thermoélectrique, et procédé de fabrication d'élément de conversion thermoélectrique |
CN111162160B (zh) * | 2018-11-08 | 2023-09-26 | 中国科学院大连化学物理研究所 | 一种p型立方相Ge-Se基热电材料及制备方法 |
JP2020088028A (ja) * | 2018-11-19 | 2020-06-04 | トヨタ自動車株式会社 | 熱電変換素子、熱電変換システム、及びそれらを用いる発電方法 |
CN110299444A (zh) * | 2019-05-30 | 2019-10-01 | 同济大学 | 一种EuCd2Sb2基热电材料及其制备方法 |
CN113748524A (zh) * | 2019-09-09 | 2021-12-03 | 松下知识产权经营株式会社 | 热电转换材料、热电转换元件、使用热电转换材料获得电的方法以及输送热的方法 |
CN113013316A (zh) * | 2021-04-28 | 2021-06-22 | 河南鸿昌电子有限公司 | 高强制造致冷件所用的材料、致冷件晶粒和致冷件 |
CN113956042B (zh) * | 2021-09-18 | 2023-02-03 | 深圳大学 | 一种菱方相GeSe基热电材料及其制备方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2560824B2 (ja) * | 1989-02-20 | 1996-12-04 | 日本電気株式会社 | 赤外線センサの製造方法 |
JPH03196583A (ja) * | 1989-03-24 | 1991-08-28 | Nippon Steel Corp | 縦型シリコンサーモパイル及びその製造方法 |
JP2735442B2 (ja) * | 1992-10-09 | 1998-04-02 | 日本原子力研究所 | 高温作動型高効率熱電変換素子の製造法 |
JPH1022530A (ja) * | 1996-07-01 | 1998-01-23 | Sumitomo Special Metals Co Ltd | 熱電変換素子 |
-
1998
- 1998-08-05 WO PCT/JP1998/003496 patent/WO1999022410A1/fr not_active Application Discontinuation
- 1998-08-05 AU AU85601/98A patent/AU8560198A/en not_active Abandoned
- 1998-08-05 JP JP2000518415A patent/JP4399757B2/ja not_active Expired - Fee Related
- 1998-08-05 KR KR10-2000-7004420A patent/KR100398939B1/ko not_active IP Right Cessation
- 1998-08-05 CN CNB988116898A patent/CN1162920C/zh not_active Expired - Fee Related
- 1998-08-05 CA CA002307239A patent/CA2307239A1/fr not_active Abandoned
- 1998-08-05 EP EP98936676A patent/EP1039556A4/fr not_active Withdrawn
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016106514A1 (fr) * | 2014-12-29 | 2016-07-07 | 中国科学院福建物质结构研究所 | Matériau thermoélectrique, procédé de préparation de celui-ci et application de celui-ci |
Also Published As
Publication number | Publication date |
---|---|
JP4399757B2 (ja) | 2010-01-20 |
CN1280706A (zh) | 2001-01-17 |
KR100398939B1 (ko) | 2003-10-10 |
AU8560198A (en) | 1999-05-17 |
EP1039556A4 (fr) | 2007-02-21 |
CN1162920C (zh) | 2004-08-18 |
WO1999022410A1 (fr) | 1999-05-06 |
EP1039556A1 (fr) | 2000-09-27 |
KR20010031402A (ko) | 2001-04-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
EEER | Examination request | ||
FZDE | Discontinued |