ATE386570T1 - Verfahren mittels abtastenden mikroskopspritzen und produkte dafür oder dadurch erzeugt - Google Patents
Verfahren mittels abtastenden mikroskopspritzen und produkte dafür oder dadurch erzeugtInfo
- Publication number
- ATE386570T1 ATE386570T1 AT01939491T AT01939491T ATE386570T1 AT E386570 T1 ATE386570 T1 AT E386570T1 AT 01939491 T AT01939491 T AT 01939491T AT 01939491 T AT01939491 T AT 01939491T AT E386570 T1 ATE386570 T1 AT E386570T1
- Authority
- AT
- Austria
- Prior art keywords
- afm
- dpn
- tip
- provides
- molecules
- Prior art date
Links
Classifications
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- G—PHYSICS
- G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
- G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
- G21K7/00—Gamma- or X-ray microscopes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82B—NANOSTRUCTURES FORMED BY MANIPULATION OF INDIVIDUAL ATOMS, MOLECULES, OR LIMITED COLLECTIONS OF ATOMS OR MOLECULES AS DISCRETE UNITS; MANUFACTURE OR TREATMENT THEREOF
- B82B3/00—Manufacture or treatment of nanostructures by manipulation of individual atoms or molecules, or limited collections of atoms or molecules as discrete units
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y30/00—Nanotechnology for materials or surface science, e.g. nanocomposites
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/007—Processes for applying liquids or other fluent materials using an electrostatic field
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/18—Processes for applying liquids or other fluent materials performed by dipping
- B05D1/185—Processes for applying liquids or other fluent materials performed by dipping applying monomolecular layers
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B05—SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D—PROCESSES FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
- B05D1/00—Processes for applying liquids or other fluent materials
- B05D1/26—Processes for applying liquids or other fluent materials performed by applying the liquid or other fluent material from an outlet device in contact with, or almost in contact with, the surface
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y40/00—Manufacture or treatment of nanostructures
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01Q—SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBE MICROSCOPY [SPM]
- G01Q80/00—Applications, other than SPM, of scanning-probe techniques
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/165—Monolayers, e.g. Langmuir-Blodgett
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
- Y10S977/853—Biological sample
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/852—Manufacture, treatment, or detection of nanostructure with scanning probe for detection of specific nanostructure sample or nanostructure-related property
- Y10S977/854—Semiconductor sample
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
- Y10S977/856—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including etching/cutting
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/855—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure
- Y10S977/857—Manufacture, treatment, or detection of nanostructure with scanning probe for manufacture of nanostructure including coating
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/849—Manufacture, treatment, or detection of nanostructure with scanning probe
- Y10S977/86—Scanning probe structure
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/88—Manufacture, treatment, or detection of nanostructure with arrangement, process, or apparatus for testing
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/882—Assembling of separate components, e.g. by attaching
- Y10S977/884—Assembled via biorecognition entity
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/882—Assembling of separate components, e.g. by attaching
- Y10S977/884—Assembled via biorecognition entity
- Y10S977/885—Via nucleic acid hybridization
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/882—Assembling of separate components, e.g. by attaching
- Y10S977/884—Assembled via biorecognition entity
- Y10S977/886—Via protein recognition
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/84—Manufacture, treatment, or detection of nanostructure
- Y10S977/895—Manufacture, treatment, or detection of nanostructure having step or means utilizing chemical property
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T428/00—Stock material or miscellaneous articles
- Y10T428/24—Structurally defined web or sheet [e.g., overall dimension, etc.]
- Y10T428/24802—Discontinuous or differential coating, impregnation or bond [e.g., artwork, printing, retouched photograph, etc.]
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Composite Materials (AREA)
- High Energy & Nuclear Physics (AREA)
- General Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Apparatus Associated With Microorganisms And Enzymes (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Micromachines (AREA)
- Length Measuring Devices With Unspecified Measuring Means (AREA)
- Sampling And Sample Adjustment (AREA)
- Application Of Or Painting With Fluid Materials (AREA)
- Thin Film Transistor (AREA)
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US20771100P | 2000-05-26 | 2000-05-26 | |
US20771300P | 2000-05-26 | 2000-05-26 | |
US09/866,533 US6827979B2 (en) | 1999-01-07 | 2001-05-24 | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
Publications (1)
Publication Number | Publication Date |
---|---|
ATE386570T1 true ATE386570T1 (de) | 2008-03-15 |
Family
ID=27395101
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
AT01939491T ATE386570T1 (de) | 2000-05-26 | 2001-05-25 | Verfahren mittels abtastenden mikroskopspritzen und produkte dafür oder dadurch erzeugt |
Country Status (10)
Country | Link |
---|---|
US (6) | US6827979B2 (de) |
EP (1) | EP1292361B1 (de) |
JP (1) | JP5042432B2 (de) |
KR (1) | KR100809785B1 (de) |
CN (1) | CN1314578C (de) |
AT (1) | ATE386570T1 (de) |
AU (2) | AU2001265003B2 (de) |
CA (1) | CA2411198C (de) |
ES (1) | ES2300334T3 (de) |
WO (1) | WO2001091855A1 (de) |
Families Citing this family (201)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6635311B1 (en) * | 1999-01-07 | 2003-10-21 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or products thereby |
US6827979B2 (en) * | 1999-01-07 | 2004-12-07 | Northwestern University | Methods utilizing scanning probe microscope tips and products therefor or produced thereby |
US6573369B2 (en) * | 1999-05-21 | 2003-06-03 | Bioforce Nanosciences, Inc. | Method and apparatus for solid state molecular analysis |
US20020042081A1 (en) * | 2000-10-10 | 2002-04-11 | Eric Henderson | Evaluating binding affinities by force stratification and force panning |
US6897015B2 (en) | 2000-03-07 | 2005-05-24 | Bioforce Nanosciences, Inc. | Device and method of use for detection and characterization of pathogens and biological materials |
DE60135150D1 (de) * | 2000-08-15 | 2008-09-11 | Bioforce Nanosciences Inc | Vorrichtung zur bildung von nanomolekularen netzwerken |
US6817293B2 (en) * | 2001-03-28 | 2004-11-16 | Dainippon Printing Co., Ltd. | Patterning method with micro-contact printing and its printed product |
US7068377B2 (en) * | 2001-03-29 | 2006-06-27 | Georgia-Tech Rsearch Corporation | System and method for surface profiling a target object |
AU2002329606A1 (en) * | 2001-07-17 | 2003-03-03 | Bioforce Nanosciences, Inc. | Combined molecular blinding detection through force microscopy and mass spectrometry |
US7247895B2 (en) * | 2001-07-26 | 2007-07-24 | The Board Of Trustees Of The University Of Illinois | Electrostatic nanolithography probe actuation device and method |
JP2004537142A (ja) * | 2001-07-26 | 2004-12-09 | コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ | 走査型電子顕微鏡の性能を測定する方法 |
US6642129B2 (en) * | 2001-07-26 | 2003-11-04 | The Board Of Trustees Of The University Of Illinois | Parallel, individually addressable probes for nanolithography |
US7042488B2 (en) | 2001-09-27 | 2006-05-09 | Fujinon Corporation | Electronic endoscope for highlighting blood vessel |
JP4570363B2 (ja) * | 2001-10-02 | 2010-10-27 | ノースウエスタン ユニヴァーシティ | タンパク質およびペプチドのナノアレイ |
US7361310B1 (en) | 2001-11-30 | 2008-04-22 | Northwestern University | Direct write nanolithographic deposition of nucleic acids from nanoscopic tips |
WO2003048314A2 (en) * | 2001-11-30 | 2003-06-12 | Northwestern University | Direct write nanolithographic deposition of nucleic acids from nanoscopic tips |
WO2003052514A2 (en) * | 2001-12-17 | 2003-06-26 | Northwestern University | Patterning of solid state features by direct write nanolithographic printing |
US7282710B1 (en) * | 2002-01-02 | 2007-10-16 | International Business Machines Corporation | Scanning probe microscopy tips composed of nanoparticles and methods to form same |
AU2003302117A1 (en) * | 2002-02-01 | 2004-06-15 | William Marsh Rice University | Method of making a molecule-surface interface |
US8362559B2 (en) * | 2002-02-01 | 2013-01-29 | William Marsh Rice University | Hybrid molecular electronic devices containing molecule-functionalized surfaces for switching, memory, and sensor applications and methods for fabricating same |
US7998528B2 (en) * | 2002-02-14 | 2011-08-16 | Massachusetts Institute Of Technology | Method for direct fabrication of nanostructures |
AU2003211027A1 (en) * | 2002-03-27 | 2003-10-13 | Nanoink, Inc. | Method and apparatus for aligning patterns on a substrate |
US7518737B2 (en) * | 2002-03-29 | 2009-04-14 | Georgia Tech Research Corp. | Displacement-measuring optical device with orifice |
US7116430B2 (en) * | 2002-03-29 | 2006-10-03 | Georgia Technology Research Corporation | Highly-sensitive displacement-measuring optical device |
US7440117B2 (en) * | 2002-03-29 | 2008-10-21 | Georgia Tech Research Corp. | Highly-sensitive displacement-measuring optical device |
US7060977B1 (en) * | 2002-05-14 | 2006-06-13 | Nanoink, Inc. | Nanolithographic calibration methods |
WO2004033480A2 (en) * | 2002-05-21 | 2004-04-22 | Northwestern University | Peptide and protein arrays and direct-write lithographic printing of peptides and proteins |
JP4907084B2 (ja) * | 2002-05-21 | 2012-03-28 | ノースウエスタン ユニバーシティ | 静電気駆動リソグラフィー |
US20050239193A1 (en) * | 2002-05-30 | 2005-10-27 | Bioforce Nanosciences, Inc. | Device and method of use for detection and characterization of microorganisms and microparticles |
US7473887B2 (en) | 2002-07-04 | 2009-01-06 | University Of Bristol Of Senate House | Resonant scanning probe microscope |
AU2003247950A1 (en) * | 2002-07-08 | 2004-01-23 | The Regents Of The University Of California | Surface nanopatterning |
USH2223H1 (en) * | 2002-07-11 | 2008-09-02 | The United States Of America As Represented By The Secretary Of The Navy | Patterned, micrometer-sized antibody features |
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ITBO20020759A1 (it) * | 2002-12-04 | 2004-06-05 | Fabio Biscarini | Procedimento per lo stoccaggio di informazione ad |
FR2848476A1 (fr) * | 2002-12-16 | 2004-06-18 | Univ Aix Marseille Ii | Procede de micro-depot |
JP2004202602A (ja) * | 2002-12-24 | 2004-07-22 | Sony Corp | 微小構造体の製造方法、及び型材の製造方法 |
US7344832B2 (en) * | 2003-01-02 | 2008-03-18 | Bioforce Nanosciences, Inc. | Method and apparatus for molecular analysis in small sample volumes |
US7252698B2 (en) * | 2003-03-14 | 2007-08-07 | Northwestern University | Triangular nanoframes and method of making same |
WO2004083112A1 (en) * | 2003-03-19 | 2004-09-30 | Phicon Investment Holdings (Pty) Ltd | Assembling system |
CN100405519C (zh) * | 2003-03-27 | 2008-07-23 | 清华大学 | 一种场发射元件的制备方法 |
US7217396B2 (en) * | 2003-05-05 | 2007-05-15 | The Board Of Trustees Of The University Of Illinois | Microfabricated micro fluid channels |
US20040228962A1 (en) * | 2003-05-16 | 2004-11-18 | Chang Liu | Scanning probe microscopy probe and method for scanning probe contact printing |
WO2004104922A2 (en) * | 2003-05-16 | 2004-12-02 | Board Of Regents, The University Of Texas System | Image and part recognition technology |
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2001
- 2001-05-24 US US09/866,533 patent/US6827979B2/en not_active Expired - Lifetime
- 2001-05-25 AU AU2001265003A patent/AU2001265003B2/en not_active Ceased
- 2001-05-25 AU AU6500301A patent/AU6500301A/xx active Pending
- 2001-05-25 JP JP2001587865A patent/JP5042432B2/ja not_active Expired - Fee Related
- 2001-05-25 ES ES01939491T patent/ES2300334T3/es not_active Expired - Lifetime
- 2001-05-25 CN CNB018132561A patent/CN1314578C/zh not_active Expired - Fee Related
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- 2001-05-25 KR KR1020027016021A patent/KR100809785B1/ko not_active IP Right Cessation
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Also Published As
Publication number | Publication date |
---|---|
CN1444494A (zh) | 2003-09-24 |
KR20030066327A (ko) | 2003-08-09 |
AU6500301A (en) | 2001-12-11 |
US20050172704A1 (en) | 2005-08-11 |
US20040037959A1 (en) | 2004-02-26 |
KR100809785B1 (ko) | 2008-03-04 |
WO2001091855A1 (en) | 2001-12-06 |
EP1292361A1 (de) | 2003-03-19 |
CN1314578C (zh) | 2007-05-09 |
US20050181132A1 (en) | 2005-08-18 |
US7524534B2 (en) | 2009-04-28 |
EP1292361A4 (de) | 2004-07-07 |
ES2300334T3 (es) | 2008-06-16 |
US20030049381A1 (en) | 2003-03-13 |
JP5042432B2 (ja) | 2012-10-03 |
JP2003534141A (ja) | 2003-11-18 |
CA2411198A1 (en) | 2001-12-06 |
EP1292361B1 (de) | 2008-02-20 |
AU2001265003B2 (en) | 2006-12-07 |
US8187673B2 (en) | 2012-05-29 |
US20100330345A1 (en) | 2010-12-30 |
US20020063212A1 (en) | 2002-05-30 |
US6827979B2 (en) | 2004-12-07 |
CA2411198C (en) | 2011-08-16 |
US7446324B2 (en) | 2008-11-04 |
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