ATE320018T1 - Lithographieobjektiv mit einer ersten linsengruppe, bestehend ausschliesslich aus linsen positiver brechkraft und verfahren zur herstellung mikrostrukturierter bauteile mit einem solchen objektiv - Google Patents
Lithographieobjektiv mit einer ersten linsengruppe, bestehend ausschliesslich aus linsen positiver brechkraft und verfahren zur herstellung mikrostrukturierter bauteile mit einem solchen objektivInfo
- Publication number
- ATE320018T1 ATE320018T1 AT01128878T AT01128878T ATE320018T1 AT E320018 T1 ATE320018 T1 AT E320018T1 AT 01128878 T AT01128878 T AT 01128878T AT 01128878 T AT01128878 T AT 01128878T AT E320018 T1 ATE320018 T1 AT E320018T1
- Authority
- AT
- Austria
- Prior art keywords
- lens
- refractive power
- positive refractive
- lenses
- lens group
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title abstract 2
- 238000001459 lithography Methods 0.000 title 1
- 238000005530 etching Methods 0.000 abstract 1
- 239000000758 substrate Substances 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70216—Mask projection systems
- G03F7/70241—Optical aspects of refractive lens systems, i.e. comprising only refractive elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/0095—Relay lenses or rod lenses
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/14—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation
- G02B13/143—Optical objectives specially designed for the purposes specified below for use with infrared or ultraviolet radiation for use with ultraviolet radiation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B13/00—Optical objectives specially designed for the purposes specified below
- G02B13/24—Optical objectives specially designed for the purposes specified below for reproducing or copying at short object distances
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/0025—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration
- G02B27/0037—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration with diffracting elements
- G02B27/0043—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for optical correction, e.g. distorsion, aberration with diffracting elements in projection exposure systems, e.g. microlithographic systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B9/00—Optical objectives characterised both by the number of the components and their arrangements according to their sign, i.e. + or -
- G02B9/12—Optical objectives characterised both by the number of the components and their arrangements according to their sign, i.e. + or - having three components only
- G02B9/14—Optical objectives characterised both by the number of the components and their arrangements according to their sign, i.e. + or - having three components only arranged + - +
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Lenses (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Diffracting Gratings Or Hologram Optical Elements (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE10064685A DE10064685A1 (de) | 2000-12-22 | 2000-12-22 | Lithographieobjektiv mit einer ersten Linsengruppe, bestehend ausschließlich aus Linsen positiver Brechkraft |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE320018T1 true ATE320018T1 (de) | 2006-03-15 |
Family
ID=7668748
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT01128878T ATE320018T1 (de) | 2000-12-22 | 2001-12-05 | Lithographieobjektiv mit einer ersten linsengruppe, bestehend ausschliesslich aus linsen positiver brechkraft und verfahren zur herstellung mikrostrukturierter bauteile mit einem solchen objektiv |
Country Status (5)
| Country | Link |
|---|---|
| US (3) | US6788387B2 (enExample) |
| EP (1) | EP1217412B1 (enExample) |
| JP (1) | JP2002244036A (enExample) |
| AT (1) | ATE320018T1 (enExample) |
| DE (2) | DE10064685A1 (enExample) |
Families Citing this family (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10064685A1 (de) * | 2000-12-22 | 2002-07-04 | Zeiss Carl | Lithographieobjektiv mit einer ersten Linsengruppe, bestehend ausschließlich aus Linsen positiver Brechkraft |
| JP2009104184A (ja) * | 2002-07-04 | 2009-05-14 | Nikon Corp | 投影光学系、露光装置、およびデバイス製造方法 |
| JP2005017734A (ja) * | 2003-06-26 | 2005-01-20 | Nikon Corp | 投影光学系、露光装置、およびデバイス製造方法 |
| US8208198B2 (en) | 2004-01-14 | 2012-06-26 | Carl Zeiss Smt Gmbh | Catadioptric projection objective |
| AU2003304557A1 (en) | 2003-10-22 | 2005-06-08 | Carl Zeiss Smt Ag | Refractive projection objective for immersion lithography |
| EP1690139B1 (en) * | 2003-12-02 | 2009-01-14 | Carl Zeiss SMT AG | Projection optical system |
| US20080151364A1 (en) | 2004-01-14 | 2008-06-26 | Carl Zeiss Smt Ag | Catadioptric projection objective |
| KR20170129271A (ko) | 2004-05-17 | 2017-11-24 | 칼 짜이스 에스엠티 게엠베하 | 중간이미지를 갖는 카타디옵트릭 투사 대물렌즈 |
| CN101107570B (zh) * | 2004-12-30 | 2011-02-09 | 卡尔蔡司Smt股份公司 | 投影光学系统 |
| DE102005027099A1 (de) * | 2005-06-10 | 2006-12-14 | Carl Zeiss Smt Ag | Immersionslithographieobjektiv |
| BRPI1007853B1 (pt) * | 2009-02-20 | 2019-11-12 | Thales Canada Inc | sistema de criação de imagem ótica de campo de visão duplo com lente bifocal |
| TWI390244B (zh) * | 2009-06-12 | 2013-03-21 | Largan Precision Co Ltd | 攝影鏡頭 |
| CN101975983B (zh) * | 2010-09-13 | 2012-05-30 | 北京理工大学 | 高分辨率非球面光刻物镜 |
Family Cites Families (37)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1478115A (en) * | 1974-02-15 | 1977-06-29 | Pilkington Perkin Elmer Ltd | Infra-red lenses |
| EP0332201B1 (en) | 1988-03-11 | 1994-06-29 | Matsushita Electric Industrial Co., Ltd. | Optical projection system |
| JP3454390B2 (ja) * | 1995-01-06 | 2003-10-06 | 株式会社ニコン | 投影光学系、投影露光装置及び投影露光方法 |
| JP3819048B2 (ja) * | 1995-03-15 | 2006-09-06 | 株式会社ニコン | 投影光学系及びそれを備えた露光装置並びに露光方法 |
| JP3750123B2 (ja) * | 1996-04-25 | 2006-03-01 | 株式会社ニコン | 投影光学系 |
| US5852490A (en) * | 1996-09-30 | 1998-12-22 | Nikon Corporation | Projection exposure method and apparatus |
| JP3757536B2 (ja) * | 1996-10-01 | 2006-03-22 | 株式会社ニコン | 投影光学系及びそれを備えた露光装置並びにデバイス製造方法 |
| JP3823436B2 (ja) * | 1997-04-03 | 2006-09-20 | 株式会社ニコン | 投影光学系 |
| JPH116957A (ja) * | 1997-04-25 | 1999-01-12 | Nikon Corp | 投影光学系および投影露光装置並びに投影露光方法 |
| US5990926A (en) * | 1997-07-16 | 1999-11-23 | Nikon Corporation | Projection lens systems for excimer laser exposure lithography |
| JP3925576B2 (ja) * | 1997-07-24 | 2007-06-06 | 株式会社ニコン | 投影光学系、該光学系を備えた露光装置、及び該装置を用いたデバイスの製造方法 |
| JPH1195095A (ja) * | 1997-09-22 | 1999-04-09 | Nikon Corp | 投影光学系 |
| JPH11214293A (ja) * | 1998-01-22 | 1999-08-06 | Nikon Corp | 投影光学系及び該光学系を備えた露光装置並びにデバイス製造方法 |
| US5986824A (en) * | 1998-06-04 | 1999-11-16 | Nikon Corporation | Large NA projection lens system with aplanatic lens element for excimer laser lithography |
| US5969803A (en) * | 1998-06-30 | 1999-10-19 | Nikon Corporation | Large NA projection lens for excimer laser lithographic systems |
| US6198576B1 (en) * | 1998-07-16 | 2001-03-06 | Nikon Corporation | Projection optical system and exposure apparatus |
| US6451507B1 (en) * | 1998-08-18 | 2002-09-17 | Nikon Corporation | Exposure apparatus and method |
| DE19942281A1 (de) * | 1999-05-14 | 2000-11-16 | Zeiss Carl Fa | Projektionsobjektiv |
| EP1006388A3 (de) | 1998-11-30 | 2002-05-02 | Carl Zeiss | Reduktions-Projektionsobjektiv der Mikrolithographie |
| DE19855108A1 (de) * | 1998-11-30 | 2000-05-31 | Zeiss Carl Fa | Mikrolithographisches Reduktionsobjektiv, Projektionsbelichtungsanlage und -Verfahren |
| WO2000033138A1 (de) * | 1998-11-30 | 2000-06-08 | Carl Zeiss | Hochaperturiges projektionsobjektiv mit minimalem blendenfehler |
| DE19855157A1 (de) * | 1998-11-30 | 2000-05-31 | Zeiss Carl Fa | Projektionsobjektiv |
| KR20000034967A (ko) * | 1998-11-30 | 2000-06-26 | 헨켈 카르스텐 | 수정-렌즈를 갖는 오브젝티브 및 투사 조명 장치 |
| JP2000215430A (ja) * | 1999-01-26 | 2000-08-04 | Tdk Corp | 磁気ヘッドおよびその製造方法並びに磁気ディスク装置 |
| WO2001023933A1 (en) * | 1999-09-29 | 2001-04-05 | Nikon Corporation | Projection optical system |
| EP1094350A3 (en) * | 1999-10-21 | 2001-08-16 | Carl Zeiss | Optical projection lens system |
| EP1134606B1 (de) * | 2000-01-18 | 2002-04-10 | Isco-Optic Gmbh | Projektionsobjektiv |
| DE10119861A1 (de) * | 2000-05-04 | 2001-11-08 | Zeiss Carl | Projektionsobjektiv, insbesondere für die Mikrolithographie |
| JP2002083766A (ja) * | 2000-06-19 | 2002-03-22 | Nikon Corp | 投影光学系、該光学系の製造方法、及び前記光学系を備えた投影露光装置 |
| JP4624535B2 (ja) * | 2000-09-28 | 2011-02-02 | 富士フイルム株式会社 | 広角投映レンズおよびこれを用いた投写型画像表示装置 |
| KR100866818B1 (ko) * | 2000-12-11 | 2008-11-04 | 가부시키가이샤 니콘 | 투영광학계 및 이 투영광학계를 구비한 노광장치 |
| WO2002052303A2 (de) * | 2000-12-22 | 2002-07-04 | Carl Zeiss Smt Ag | Projektionsobjektiv |
| DE10064685A1 (de) * | 2000-12-22 | 2002-07-04 | Zeiss Carl | Lithographieobjektiv mit einer ersten Linsengruppe, bestehend ausschließlich aus Linsen positiver Brechkraft |
| JP2002244034A (ja) * | 2001-02-21 | 2002-08-28 | Nikon Corp | 投影光学系および該投影光学系を備えた露光装置 |
| JP2002323653A (ja) * | 2001-02-23 | 2002-11-08 | Nikon Corp | 投影光学系,投影露光装置および投影露光方法 |
| JP2002323652A (ja) * | 2001-02-23 | 2002-11-08 | Nikon Corp | 投影光学系,該投影光学系を備えた投影露光装置および投影露光方法 |
| JP2004012825A (ja) * | 2002-06-07 | 2004-01-15 | Fuji Photo Optical Co Ltd | 投影光学系およびそれを用いた投影露光装置 |
-
2000
- 2000-12-22 DE DE10064685A patent/DE10064685A1/de not_active Withdrawn
-
2001
- 2001-12-05 AT AT01128878T patent/ATE320018T1/de not_active IP Right Cessation
- 2001-12-05 DE DE50109144T patent/DE50109144D1/de not_active Expired - Fee Related
- 2001-12-05 EP EP01128878A patent/EP1217412B1/de not_active Expired - Lifetime
- 2001-12-25 JP JP2001392742A patent/JP2002244036A/ja active Pending
- 2001-12-26 US US10/025,605 patent/US6788387B2/en not_active Expired - Fee Related
-
2004
- 2004-06-23 US US10/873,292 patent/US7023627B2/en not_active Expired - Fee Related
-
2006
- 2006-02-10 US US11/350,941 patent/US7289279B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| EP1217412A2 (de) | 2002-06-26 |
| DE50109144D1 (de) | 2006-05-04 |
| EP1217412B1 (de) | 2006-03-08 |
| US20060176573A1 (en) | 2006-08-10 |
| EP1217412A3 (de) | 2004-01-28 |
| DE10064685A1 (de) | 2002-07-04 |
| JP2002244036A (ja) | 2002-08-28 |
| US6788387B2 (en) | 2004-09-07 |
| US7023627B2 (en) | 2006-04-04 |
| US20040228001A1 (en) | 2004-11-18 |
| US20020122164A1 (en) | 2002-09-05 |
| US7289279B2 (en) | 2007-10-30 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| REN | Ceased due to non-payment of the annual fee |