JP2000171699A5 - - Google Patents

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Publication number
JP2000171699A5
JP2000171699A5 JP1999316319A JP31631999A JP2000171699A5 JP 2000171699 A5 JP2000171699 A5 JP 2000171699A5 JP 1999316319 A JP1999316319 A JP 1999316319A JP 31631999 A JP31631999 A JP 31631999A JP 2000171699 A5 JP2000171699 A5 JP 2000171699A5
Authority
JP
Japan
Prior art keywords
lens
objective lens
projection objective
negative
lenses
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1999316319A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000171699A (ja
Filing date
Publication date
Priority claimed from DE19855157A external-priority patent/DE19855157A1/de
Application filed filed Critical
Publication of JP2000171699A publication Critical patent/JP2000171699A/ja
Publication of JP2000171699A5 publication Critical patent/JP2000171699A5/ja
Pending legal-status Critical Current

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JP11316319A 1998-11-30 1999-11-08 投影対物レンズ Pending JP2000171699A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19855157A DE19855157A1 (de) 1998-11-30 1998-11-30 Projektionsobjektiv
DE19855157.6 1999-09-04

Publications (2)

Publication Number Publication Date
JP2000171699A JP2000171699A (ja) 2000-06-23
JP2000171699A5 true JP2000171699A5 (enExample) 2006-12-21

Family

ID=7889476

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11316319A Pending JP2000171699A (ja) 1998-11-30 1999-11-08 投影対物レンズ

Country Status (6)

Country Link
US (1) US6522484B1 (enExample)
EP (1) EP1006387A3 (enExample)
JP (1) JP2000171699A (enExample)
KR (1) KR100652498B1 (enExample)
DE (1) DE19855157A1 (enExample)
TW (1) TW442669B (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH1195095A (ja) 1997-09-22 1999-04-09 Nikon Corp 投影光学系
DE19855157A1 (de) * 1998-11-30 2000-05-31 Zeiss Carl Fa Projektionsobjektiv
EP1139138A4 (en) 1999-09-29 2006-03-08 Nikon Corp PROJECTION EXPOSURE PROCESS, DEVICE AND OPTICAL PROJECTION SYSTEM
WO2001023933A1 (en) 1999-09-29 2001-04-05 Nikon Corporation Projection optical system
DE10064685A1 (de) * 2000-12-22 2002-07-04 Zeiss Carl Lithographieobjektiv mit einer ersten Linsengruppe, bestehend ausschließlich aus Linsen positiver Brechkraft
JP2004524554A (ja) * 2000-12-22 2004-08-12 カール・ツアイス・エスエムテイ・アーゲー 投射対物レンズ
JP2002244034A (ja) 2001-02-21 2002-08-28 Nikon Corp 投影光学系および該投影光学系を備えた露光装置
JP2002323652A (ja) 2001-02-23 2002-11-08 Nikon Corp 投影光学系，該投影光学系を備えた投影露光装置および投影露光方法
JP2002323653A (ja) 2001-02-23 2002-11-08 Nikon Corp 投影光学系，投影露光装置および投影露光方法
DE10138847A1 (de) * 2001-08-15 2003-02-27 Zeiss Carl Blende für eine Integratoreinheit
DE10151309A1 (de) * 2001-10-17 2003-05-08 Carl Zeiss Semiconductor Mfg S Projektionsbelichtungsanlage der Mikrolithographie für Lambda <200 nm
WO2003075096A2 (de) * 2002-03-01 2003-09-12 Carl Zeiss Smt Ag Refraktives projektionsobjektiv
US7190527B2 (en) 2002-03-01 2007-03-13 Carl Zeiss Smt Ag Refractive projection objective
DE10221386A1 (de) 2002-05-14 2003-11-27 Zeiss Carl Smt Ag Projektionsbelichtungssystem
DE10240002A1 (de) 2002-08-27 2004-03-11 Carl Zeiss Semiconductor Manufacturing Technologies Ag Optisches Teilsystem insbesondere für eine Projektionsbelichtungsanlage mit mindestens einem in mindestens zwei Stellungen verbringbaren optischen Element
KR100958765B1 (ko) 2002-12-19 2010-05-18 칼 짜이스 에스엠티 아게 향상된 집광기 광학계를 구비하는 조명 시스템
TWI305872B (en) * 2003-03-17 2009-02-01 Nikon Corp Optical projection system, light-exposure apparatus and light-exposure method
US7932020B2 (en) * 2003-07-10 2011-04-26 Takumi Technology Corporation Contact or proximity printing using a magnified mask image
US8208198B2 (en) 2004-01-14 2012-06-26 Carl Zeiss Smt Gmbh Catadioptric projection objective
US6961186B2 (en) * 2003-09-26 2005-11-01 Takumi Technology Corp. Contact printing using a magnified mask image
US7055127B2 (en) 2003-10-27 2006-05-30 Takumi Technology Corp. Mask data preparation
US20080151364A1 (en) * 2004-01-14 2008-06-26 Carl Zeiss Smt Ag Catadioptric projection objective
KR20170028451A (ko) 2004-05-17 2017-03-13 칼 짜이스 에스엠티 게엠베하 중간이미지를 갖는 카타디옵트릭 투사 대물렌즈
EP2628864B1 (de) 2012-02-14 2017-02-01 Heinrich Schulte GmbH + Co. KG Spül- und Abdrückvorrichtung für eine Anschlussarmatur
CN109581622B (zh) * 2017-09-29 2020-12-04 上海微电子装备（集团）股份有限公司 一种投影物镜

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5469299A (en) * 1990-05-15 1995-11-21 Olympus Optical Co., Ltd. Objective lens system
JP3041939B2 (ja) * 1990-10-22 2000-05-15 株式会社ニコン 投影レンズ系
JPH06313845A (ja) * 1993-04-28 1994-11-08 Olympus Optical Co Ltd 投影レンズ系
JP3360387B2 (ja) * 1993-11-15 2002-12-24 株式会社ニコン 投影光学系及び投影露光装置
JPH08179204A (ja) * 1994-11-10 1996-07-12 Nikon Corp 投影光学系及び投影露光装置
JP3454390B2 (ja) * 1995-01-06 2003-10-06 株式会社ニコン 投影光学系、投影露光装置及び投影露光方法
JP3624973B2 (ja) 1995-10-12 2005-03-02 株式会社ニコン 投影光学系
DE19548805A1 (de) * 1995-12-27 1997-07-03 Zeiss Carl Fa REMA-Objektiv für Mikrolithographie-Projektionsbelichtungsanlagen
JP3750123B2 (ja) * 1996-04-25 2006-03-01 株式会社ニコン 投影光学系
JPH1048517A (ja) * 1996-08-07 1998-02-20 Nikon Corp 投影光学系
JP3864399B2 (ja) * 1996-08-08 2006-12-27 株式会社ニコン 投影露光装置及び該投影露光装置に用いられる投影光学系並びにデバイス製造方法
US5852490A (en) * 1996-09-30 1998-12-22 Nikon Corporation Projection exposure method and apparatus
JP3757536B2 (ja) * 1996-10-01 2006-03-22 株式会社ニコン 投影光学系及びそれを備えた露光装置並びにデバイス製造方法
DE19653983A1 (de) * 1996-12-21 1998-06-25 Zeiss Carl Fa REMA-Objektiv für Mikrolithographie-Projektionsbelichtungsanlagen
DE19818444A1 (de) * 1997-04-25 1998-10-29 Nikon Corp Abbildungsoptik, Projektionsoptikvorrichtung und Projektionsbelichtungsverfahren
US6198576B1 (en) * 1998-07-16 2001-03-06 Nikon Corporation Projection optical system and exposure apparatus
DE19855157A1 (de) * 1998-11-30 2000-05-31 Zeiss Carl Fa Projektionsobjektiv

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