ATE305141T1 - Eingangspuffer und spannungspegel- detektionsverfahren - Google Patents

Eingangspuffer und spannungspegel- detektionsverfahren

Info

Publication number
ATE305141T1
ATE305141T1 AT02794194T AT02794194T ATE305141T1 AT E305141 T1 ATE305141 T1 AT E305141T1 AT 02794194 T AT02794194 T AT 02794194T AT 02794194 T AT02794194 T AT 02794194T AT E305141 T1 ATE305141 T1 AT E305141T1
Authority
AT
Austria
Prior art keywords
input buffer
input
state detector
mid
voltage level
Prior art date
Application number
AT02794194T
Other languages
German (de)
English (en)
Inventor
Timothy B Cowles
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of ATE305141T1 publication Critical patent/ATE305141T1/de

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175—Coupling arrangements; Interface arrangements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
    • G01R19/16595—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window) with multi level indication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Nonlinear Science (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Logic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Amplifiers (AREA)
AT02794194T 2001-12-10 2002-12-06 Eingangspuffer und spannungspegel- detektionsverfahren ATE305141T1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/016,513 US6545510B1 (en) 2001-12-10 2001-12-10 Input buffer and method for voltage level detection
PCT/US2002/039176 WO2003054560A1 (en) 2001-12-10 2002-12-06 Input buffer and method for voltage level detection

Publications (1)

Publication Number Publication Date
ATE305141T1 true ATE305141T1 (de) 2005-10-15

Family

ID=21777508

Family Applications (1)

Application Number Title Priority Date Filing Date
AT02794194T ATE305141T1 (de) 2001-12-10 2002-12-06 Eingangspuffer und spannungspegel- detektionsverfahren

Country Status (10)

Country Link
US (2) US6545510B1 (enExample)
EP (1) EP1456675B1 (enExample)
JP (2) JP4414763B2 (enExample)
KR (1) KR100652253B1 (enExample)
CN (1) CN100507582C (enExample)
AT (1) ATE305141T1 (enExample)
AU (1) AU2002359642A1 (enExample)
DE (1) DE60206299T2 (enExample)
TW (1) TW580795B (enExample)
WO (1) WO2003054560A1 (enExample)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6545510B1 (en) * 2001-12-10 2003-04-08 Micron Technology, Inc. Input buffer and method for voltage level detection
ITRM20020322A1 (it) * 2002-06-07 2003-12-09 Micron Technology Inc Rivelatore di bassa tensione di alimentazione.
US7026646B2 (en) * 2002-06-20 2006-04-11 Micron Technology, Inc. Isolation circuit
US6967348B2 (en) * 2002-06-20 2005-11-22 Micron Technology, Inc. Signal sharing circuit with microelectric die isolation features
KR100891322B1 (ko) * 2002-09-25 2009-03-31 삼성전자주식회사 데이터 입력 마진을 개선할 수 있는 동시 양방향 입출력회로
US6879534B2 (en) * 2002-11-01 2005-04-12 Hewlett-Packard Development Company, L.P. Method and system for minimizing differential amplifier power supply sensitivity
US6930534B1 (en) * 2003-05-16 2005-08-16 Transmeta Corporation Temperature compensated integrated circuits
US20050075809A1 (en) * 2003-09-18 2005-04-07 Ewc Controls Incorporated Apparatus and method for detecting, filtering and conditioning AC voltage signals
US7088139B1 (en) * 2003-12-31 2006-08-08 National Semiconductor Corporation Low power tri-level decoder circuit
FR2868629B1 (fr) * 2004-04-05 2006-08-25 Atmel Corp Detecteur de tension de seuil differentiel
US7206234B2 (en) * 2005-06-21 2007-04-17 Micron Technology, Inc. Input buffer for low voltage operation
KR100907930B1 (ko) * 2007-07-03 2009-07-16 주식회사 하이닉스반도체 테스트 시간을 줄일 수 있는 반도체 메모리 장치
TW200908553A (en) * 2007-08-07 2009-02-16 Univ Chung Yuan Christian Multi-level comparator for fix power consumption
US7804334B2 (en) * 2008-07-29 2010-09-28 Qualcomm Incorporated High signal level compliant input/output circuits
US8593203B2 (en) 2008-07-29 2013-11-26 Qualcomm Incorporated High signal level compliant input/output circuits
TWI440313B (zh) 2010-09-03 2014-06-01 Mstar Semiconductor Inc 多態信號指示器
CN102401850B (zh) * 2010-09-08 2014-07-16 晨星软件研发(深圳)有限公司 多态信号指示器
TWI473428B (zh) * 2011-08-16 2015-02-11 Himax Analogic Inc 高壓元件電路及其電壓過低鎖定電路
TW201516418A (zh) * 2013-10-22 2015-05-01 Sunbeen Technology Inc 電壓檢測方法及使用該方法的電壓檢測裝置
US11125454B2 (en) * 2014-05-19 2021-09-21 Lennox Industries Inc. HVAC controller having multiplexed input signal detection and method of operation thereof
US10175272B2 (en) * 2014-08-26 2019-01-08 Intersil Americas LLC Remote differential voltage sensing
JP6779277B2 (ja) * 2015-07-29 2020-11-04 アンペア・コンピューティング・エルエルシー 電圧変化をモニターするためのシステム、その方法、および電力モニターシステム
US10859610B2 (en) 2016-04-27 2020-12-08 The University Of Bristol Voltage detector and voltage detector system
US20210143808A1 (en) * 2017-06-22 2021-05-13 Minima Processor Oy Timing event detection
CN109921783B (zh) * 2017-12-12 2023-07-07 华润微集成电路(无锡)有限公司 三态输入解码电路及其解码方法
KR102487430B1 (ko) * 2018-05-10 2023-01-11 에스케이하이닉스 주식회사 기준전압 생성 회로, 이를 이용하는 버퍼, 반도체 장치 및 반도체 시스템
KR102697884B1 (ko) * 2019-10-04 2024-08-22 에스케이하이닉스 주식회사 전압 생성 회로 및 이를 포함하는 입력 버퍼
US11829169B2 (en) * 2020-05-14 2023-11-28 Texas Instruments Incorporated USB power delivery management
CN112485654B (zh) * 2020-11-16 2023-07-21 上海唯捷创芯电子技术有限公司 一种芯片端口状态检测电路、芯片及通信终端
CN112787654B (zh) * 2021-01-06 2025-05-23 深圳市紫光同创电子股份有限公司 差分输入缓冲电路、差分信号缓冲电路及fpga芯片
CN115267304B (zh) * 2021-04-30 2025-09-02 脸萌有限公司 供电电压检测器、供电电压检测装置、系统和介质
CN113572468B (zh) * 2021-07-09 2024-06-11 力神（青岛）新能源有限公司 一种双输入信号同步检测电路

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3806915A (en) * 1972-09-05 1974-04-23 Us Navy Multithreshold analog to digital converter
JPS5329767A (en) * 1976-09-01 1978-03-20 Hitachi Ltd Control circuit
JPS62254072A (ja) * 1986-02-20 1987-11-05 Fujitsu Ltd 多値電圧レベル比較回路
DE4131417C1 (enExample) 1991-09-20 1993-04-22 Braun Ag, 6000 Frankfurt, De
CN2155572Y (zh) * 1993-03-12 1994-02-09 成都供电局 中央信号装置
US5381054A (en) * 1993-12-07 1995-01-10 Rockwell International Corporation Multiple input comparator circuit for a switched resistive network
US5572147A (en) 1995-09-08 1996-11-05 United Microelectronics Corporation Power supply voltage detector
JPH09265797A (ja) 1996-03-29 1997-10-07 Nec Corp 高電圧検出回路
FR2749939B1 (fr) 1996-06-13 1998-07-31 Sgs Thomson Microelectronics Detecteur de gamme de tension d'alimentation dans un circuit integre
KR100186344B1 (ko) * 1996-10-18 1999-04-15 문정환 히스테리시스 입력버퍼
US5995426A (en) 1997-11-04 1999-11-30 Micron Technology, Inc. Testing parameters of an electronic device
US6037762A (en) 1997-12-19 2000-03-14 Texas Instruments Incorporated Voltage detector having improved characteristics
US5959929A (en) 1997-12-29 1999-09-28 Micron Technology, Inc. Method for writing to multiple banks of a memory device
US6289476B1 (en) 1998-06-10 2001-09-11 Micron Technology, Inc. Method and apparatus for testing the timing of integrated circuits
US6028456A (en) * 1998-08-18 2000-02-22 Toko, Inc. Dual-threshold comparator circuit utilizing a single input pin
US6133753A (en) * 1998-11-25 2000-10-17 Analog Devices, Inc. Tri-state input detection circuit
US6545510B1 (en) * 2001-12-10 2003-04-08 Micron Technology, Inc. Input buffer and method for voltage level detection

Also Published As

Publication number Publication date
US6700416B2 (en) 2004-03-02
EP1456675B1 (en) 2005-09-21
WO2003054560A1 (en) 2003-07-03
TW200301040A (en) 2003-06-16
TW580795B (en) 2004-03-21
JP5191260B2 (ja) 2013-05-08
KR20040075873A (ko) 2004-08-30
JP2005514595A (ja) 2005-05-19
JP2008164638A (ja) 2008-07-17
DE60206299T2 (de) 2006-06-22
US20030122589A1 (en) 2003-07-03
EP1456675A1 (en) 2004-09-15
JP4414763B2 (ja) 2010-02-10
US6545510B1 (en) 2003-04-08
CN1618022A (zh) 2005-05-18
CN100507582C (zh) 2009-07-01
KR100652253B1 (ko) 2006-12-01
AU2002359642A1 (en) 2003-07-09
DE60206299D1 (de) 2005-10-27

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Legal Events

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