DE60206299D1 - Eingangspuffer und spannungspegel-detektionsverfahren - Google Patents

Eingangspuffer und spannungspegel-detektionsverfahren

Info

Publication number
DE60206299D1
DE60206299D1 DE60206299T DE60206299T DE60206299D1 DE 60206299 D1 DE60206299 D1 DE 60206299D1 DE 60206299 T DE60206299 T DE 60206299T DE 60206299 T DE60206299 T DE 60206299T DE 60206299 D1 DE60206299 D1 DE 60206299D1
Authority
DE
Germany
Prior art keywords
input buffer
input
state detector
mid
voltage level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60206299T
Other languages
English (en)
Other versions
DE60206299T2 (de
Inventor
B Cowles
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micron Technology Inc
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Application granted granted Critical
Publication of DE60206299D1 publication Critical patent/DE60206299D1/de
Publication of DE60206299T2 publication Critical patent/DE60206299T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/01—Shaping pulses
    • H03K5/08—Shaping pulses by limiting; by thresholding; by slicing, i.e. combined limiting and thresholding
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
    • H03K19/0175—Coupling arrangements; Interface arrangements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16504—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed
    • G01R19/16519—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the components employed using FET's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16566—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533
    • G01R19/1659—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window)
    • G01R19/16595—Circuits and arrangements for comparing voltage or current with one or several thresholds and for indicating the result not covered by subgroups G01R19/16504, G01R19/16528, G01R19/16533 to indicate that the value is within or outside a predetermined range of values (window) with multi level indication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/165—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
    • G01R19/16533—Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values characterised by the application
    • G01R19/16557—Logic probes, i.e. circuits indicating logic state (high, low, O)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31721—Power aspects, e.g. power supplies for test circuits, power saving during test

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Computer Hardware Design (AREA)
  • Engineering & Computer Science (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • General Engineering & Computer Science (AREA)
  • Logic Circuits (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Oscillators With Electromechanical Resonators (AREA)
  • Amplifiers (AREA)
DE60206299T 2001-12-10 2002-12-06 Eingangspuffer und spannungspegel-detektionsverfahren Expired - Lifetime DE60206299T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US16513 2001-12-10
US10/016,513 US6545510B1 (en) 2001-12-10 2001-12-10 Input buffer and method for voltage level detection
PCT/US2002/039176 WO2003054560A1 (en) 2001-12-10 2002-12-06 Input buffer and method for voltage level detection

Publications (2)

Publication Number Publication Date
DE60206299D1 true DE60206299D1 (de) 2005-10-27
DE60206299T2 DE60206299T2 (de) 2006-06-22

Family

ID=21777508

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60206299T Expired - Lifetime DE60206299T2 (de) 2001-12-10 2002-12-06 Eingangspuffer und spannungspegel-detektionsverfahren

Country Status (10)

Country Link
US (2) US6545510B1 (de)
EP (1) EP1456675B1 (de)
JP (2) JP4414763B2 (de)
KR (1) KR100652253B1 (de)
CN (1) CN100507582C (de)
AT (1) ATE305141T1 (de)
AU (1) AU2002359642A1 (de)
DE (1) DE60206299T2 (de)
TW (1) TW580795B (de)
WO (1) WO2003054560A1 (de)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6545510B1 (en) * 2001-12-10 2003-04-08 Micron Technology, Inc. Input buffer and method for voltage level detection
ITRM20020322A1 (it) * 2002-06-07 2003-12-09 Micron Technology Inc Rivelatore di bassa tensione di alimentazione.
US6967348B2 (en) * 2002-06-20 2005-11-22 Micron Technology, Inc. Signal sharing circuit with microelectric die isolation features
US7026646B2 (en) * 2002-06-20 2006-04-11 Micron Technology, Inc. Isolation circuit
KR100891322B1 (ko) * 2002-09-25 2009-03-31 삼성전자주식회사 데이터 입력 마진을 개선할 수 있는 동시 양방향 입출력회로
US6879534B2 (en) * 2002-11-01 2005-04-12 Hewlett-Packard Development Company, L.P. Method and system for minimizing differential amplifier power supply sensitivity
US6930534B1 (en) * 2003-05-16 2005-08-16 Transmeta Corporation Temperature compensated integrated circuits
US20050075809A1 (en) * 2003-09-18 2005-04-07 Ewc Controls Incorporated Apparatus and method for detecting, filtering and conditioning AC voltage signals
US7088139B1 (en) * 2003-12-31 2006-08-08 National Semiconductor Corporation Low power tri-level decoder circuit
FR2868629B1 (fr) * 2004-04-05 2006-08-25 Atmel Corp Detecteur de tension de seuil differentiel
US7206234B2 (en) 2005-06-21 2007-04-17 Micron Technology, Inc. Input buffer for low voltage operation
KR100907930B1 (ko) * 2007-07-03 2009-07-16 주식회사 하이닉스반도체 테스트 시간을 줄일 수 있는 반도체 메모리 장치
TW200908553A (en) * 2007-08-07 2009-02-16 Univ Chung Yuan Christian Multi-level comparator for fix power consumption
US7804334B2 (en) * 2008-07-29 2010-09-28 Qualcomm Incorporated High signal level compliant input/output circuits
US8593203B2 (en) 2008-07-29 2013-11-26 Qualcomm Incorporated High signal level compliant input/output circuits
TWI440313B (zh) 2010-09-03 2014-06-01 Mstar Semiconductor Inc 多態信號指示器
CN102401850B (zh) * 2010-09-08 2014-07-16 晨星软件研发(深圳)有限公司 多态信号指示器
TWI473428B (zh) * 2011-08-16 2015-02-11 Himax Analogic Inc 高壓元件電路及其電壓過低鎖定電路
TW201516418A (zh) * 2013-10-22 2015-05-01 Sunbeen Technology Inc 電壓檢測方法及使用該方法的電壓檢測裝置
US11125454B2 (en) * 2014-05-19 2021-09-21 Lennox Industries Inc. HVAC controller having multiplexed input signal detection and method of operation thereof
US10175272B2 (en) * 2014-08-26 2019-01-08 Intersil Americas LLC Remote differential voltage sensing
EP3329287B1 (de) * 2015-07-29 2022-04-20 Ampere Computing LLC Hochfrequenzspannungsversorgungsmonitor
EP3449266B1 (de) 2016-04-27 2022-10-12 The University of Bristol Spannungsdetektor und spannungsdetektorsystem
US20210143808A1 (en) * 2017-06-22 2021-05-13 Minima Processor Oy Timing event detection
CN109921783B (zh) * 2017-12-12 2023-07-07 华润微集成电路(无锡)有限公司 三态输入解码电路及其解码方法
KR102487430B1 (ko) 2018-05-10 2023-01-11 에스케이하이닉스 주식회사 기준전압 생성 회로, 이를 이용하는 버퍼, 반도체 장치 및 반도체 시스템
US11829169B2 (en) * 2020-05-14 2023-11-28 Texas Instruments Incorporated USB power delivery management
CN113572468B (zh) * 2021-07-09 2024-06-11 力神（青岛）新能源有限公司 一种双输入信号同步检测电路

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3806915A (en) * 1972-09-05 1974-04-23 Us Navy Multithreshold analog to digital converter
JPS5329767A (en) * 1976-09-01 1978-03-20 Hitachi Ltd Control circuit
JPS62254072A (ja) * 1986-02-20 1987-11-05 Fujitsu Ltd 多値電圧レベル比較回路
DE4131417C1 (de) 1991-09-20 1993-04-22 Braun Ag, 6000 Frankfurt, De
US5381054A (en) * 1993-12-07 1995-01-10 Rockwell International Corporation Multiple input comparator circuit for a switched resistive network
US5572147A (en) 1995-09-08 1996-11-05 United Microelectronics Corporation Power supply voltage detector
JPH09265797A (ja) 1996-03-29 1997-10-07 Nec Corp 高電圧検出回路
FR2749939B1 (fr) 1996-06-13 1998-07-31 Sgs Thomson Microelectronics Detecteur de gamme de tension d'alimentation dans un circuit integre
KR100186344B1 (ko) * 1996-10-18 1999-04-15 문정환 히스테리시스 입력버퍼
US5995426A (en) 1997-11-04 1999-11-30 Micron Technology, Inc. Testing parameters of an electronic device
US6037762A (en) 1997-12-19 2000-03-14 Texas Instruments Incorporated Voltage detector having improved characteristics
US5959929A (en) 1997-12-29 1999-09-28 Micron Technology, Inc. Method for writing to multiple banks of a memory device
US6289476B1 (en) 1998-06-10 2001-09-11 Micron Technology, Inc. Method and apparatus for testing the timing of integrated circuits
US6028456A (en) * 1998-08-18 2000-02-22 Toko, Inc. Dual-threshold comparator circuit utilizing a single input pin
US6133753A (en) * 1998-11-25 2000-10-17 Analog Devices, Inc. Tri-state input detection circuit
US6545510B1 (en) * 2001-12-10 2003-04-08 Micron Technology, Inc. Input buffer and method for voltage level detection

Also Published As

Publication number Publication date
JP5191260B2 (ja) 2013-05-08
TW580795B (en) 2004-03-21
DE60206299T2 (de) 2006-06-22
CN1618022A (zh) 2005-05-18
EP1456675A1 (de) 2004-09-15
US20030122589A1 (en) 2003-07-03
JP2005514595A (ja) 2005-05-19
EP1456675B1 (de) 2005-09-21
KR100652253B1 (ko) 2006-12-01
WO2003054560A1 (en) 2003-07-03
US6545510B1 (en) 2003-04-08
JP4414763B2 (ja) 2010-02-10
US6700416B2 (en) 2004-03-02
CN100507582C (zh) 2009-07-01
JP2008164638A (ja) 2008-07-17
AU2002359642A1 (en) 2003-07-09
TW200301040A (en) 2003-06-16
ATE305141T1 (de) 2005-10-15
KR20040075873A (ko) 2004-08-30

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition