WO2020042531A1 - 显示面板及显示面板检测方法 - Google Patents

显示面板及显示面板检测方法 Download PDF

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Publication number
WO2020042531A1
WO2020042531A1 PCT/CN2019/071656 CN2019071656W WO2020042531A1 WO 2020042531 A1 WO2020042531 A1 WO 2020042531A1 CN 2019071656 W CN2019071656 W CN 2019071656W WO 2020042531 A1 WO2020042531 A1 WO 2020042531A1
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WO
WIPO (PCT)
Prior art keywords
test
display panel
test point
display area
resistance value
Prior art date
Application number
PCT/CN2019/071656
Other languages
English (en)
French (fr)
Inventor
黄耀立
贺兴龙
Original Assignee
武汉华星光电技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 武汉华星光电技术有限公司 filed Critical 武汉华星光电技术有限公司
Priority to US16/338,436 priority Critical patent/US20200090564A1/en
Publication of WO2020042531A1 publication Critical patent/WO2020042531A1/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/041—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/20—Investigating the presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/14—Measuring resistance by measuring current or voltage obtained from a reference source
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N9/00—Details of colour television systems
    • H04N9/12—Picture reproducers
    • H04N9/31—Projection devices for colour picture display, e.g. using electronic spatial light modulators [ESLM]
    • H04N9/3191—Testing thereof
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2300/00—Aspects of the constitution of display devices
    • G09G2300/04—Structural and physical details of display devices
    • G09G2300/0421—Structural details of the set of electrodes
    • G09G2300/0426—Layout of electrodes and connections
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2330/00—Aspects of power supply; Aspects of display protection and defect management
    • G09G2330/12—Test circuits or failure detection circuits included in a display system, as permanent part thereof

Definitions

  • the present invention relates to the field of display technology, and in particular, to a display panel detection method and a display panel based on whether or not a crack occurs on a display panel glass.
  • the display panel consists of two upper and lower glass substrates. In order to test the functions of various components of the product and confirm whether each component has a damaged failure phenomenon, the display panel is usually subjected to various mechanical tests.
  • a slight crack may be generated on the edge of the glass substrate of some display panels, and the slight crack does not cause great damage to the circuit and can also display normally. However, during subsequent use, slight cracks may gradually expand, so that some of the lines provided on the glass substrate are completely broken, causing poor display.
  • An object of the present invention is to provide a display panel detection method and a display panel that can finely and effectively detect whether a display panel has a crack, so as to realize crack detection without disassembling the machine, improve detection efficiency, and avoid leakage. Defective products to the client.
  • the display panel of the present invention includes a glass substrate including a display area and a non-display area, the display area is used for displaying a picture, and the non-display area is located at the outermost periphery of the glass substrate; a display chip Is provided on the non-display area, the display chip serves as a driving element of the display panel; and a test metal circuit is provided on the non-display area, and is arranged along the non-display area, and the test metal A first test point is set at the start position of the line, and a second test point is set at the end position of the test metal line. The first test point and the second test point are not connected to each other to form a non-closed circuit. The first test point and the second test point are used to make electrical contact with an external resistance tester to detect the resistance value of the test metal circuit.
  • the glass substrate includes an upper color filter substrate and a lower thin film transistor array substrate.
  • the thin film transistor array substrate includes a substrate, and a functional layer is disposed on the substrate. There is a lip portion between one side portion and one side portion of the thin film transistor array substrate, and the functional layer is provided with an open groove corresponding to the lip portion, the first test point of the test metal circuit and The second test point is disposed below the groove.
  • a transparent conductive film layer is provided on the first test point and the second test point of the test metal circuit and extends to two opposite sides of the groove.
  • the functional layer includes a lower insulating layer, a gate insulating layer, an intermediate dielectric layer, a flat layer, an upper insulating layer, and a passivation layer, and the passivation layer Frame sealant is provided thereon, and the color film substrate is fixed to the frame sealant, wherein the groove penetrates the passivation layer, the upper insulation layer, the flat layer, and the intermediate intermediary.
  • An electrical layer, and the test metal line is disposed on the gate insulating layer.
  • test metal circuit is located and penetrates directly below the display chip.
  • the non-display area of the glass substrate surrounds the display area and includes an upper edge portion and a lower edge portion, and the first test point and the second test point of the test metal circuit are disposed on the upper side. The position of the lower or lower part.
  • the resistance value of the test metal circuit includes a first resistance value and a second resistance value
  • the second resistance value is obtained after the display panel is mechanically tested
  • the first resistance The value is obtained before the display panel is subjected to a mechanical test
  • the second resistance value exceeds a predetermined range of the first resistance value, the glass substrate of the display panel is determined to have cracks.
  • the present invention further provides a display panel detection method, wherein the display panel detection method includes:
  • the display area is used for displaying a picture
  • the non-display area is located at the outermost periphery of the glass substrate
  • test metal line is deposited on the non-display area, and the test metal line is arranged around the display area, wherein a first test point is set at a start position of the test metal line, and an end position of the metal line is set There is a second test point, the first test point and the second test point are not connected to each other to form a non-closed circuit; and
  • the first test point and the second test point are electrically contacted with an external resistance tester to detect the resistance value of the test metal circuit.
  • the glass substrate includes an upper color filter substrate and a lower thin film transistor array substrate.
  • the thin film transistor array substrate includes a substrate, and a functional layer is disposed on the substrate.
  • a lip portion is formed between one side portion and one side portion of the thin film transistor array substrate, and the functional layer is recessed with an open groove corresponding to the lip portion, wherein the first test of the test metal circuit The point and the second test point are disposed below the groove.
  • the display panel is subjected to a mechanical test, and before the mechanical test is performed, the first test point and the second test point are electrically contacted through the external resistance testing instrument, and To detect the resistance value of the test metal line and obtain a first resistance value, and after the mechanical test, obtain the second resistance value of the test metal line through the detection of the external resistance test instrument, wherein When the second resistance value exceeds a predetermined range of the first resistance value, the glass substrate of the display panel is determined to have cracks.
  • a transparent conductive film layer is provided on the first test point and the second test point of the test metal circuit and extends to two opposite sides of the groove.
  • the present invention further provides a display panel, including:
  • the glass substrate includes a display area and a non-display area, the display area is used for displaying a picture, and the non-display area is located at the outermost periphery of the glass substrate;
  • a display chip provided on the non-display area, the display chip serving as a driving element of the display panel;
  • a test metal line is provided on the non-display area and is arranged around the non-display area.
  • a first test point is set at a start position of the test metal line, and a second test is set at an end position of the metal line. Point, the first test point and the second test point are not connected to each other to form a non-closed circuit, and the first test point and the second test point are used to make electrical contact with an external resistance test instrument to detect A resistance value of the test metal line;
  • the glass substrate includes an upper color filter substrate and a lower thin film transistor array substrate.
  • the thin film transistor array substrate includes a substrate, a functional layer is provided on the substrate, one side of the color film substrate and the thin film.
  • a lip portion is provided between one side of the transistor array substrate, and the functional layer is provided with a groove corresponding to the lip portion, and the groove penetrates in the direction of the color filter substrate and is opened to the outside.
  • the first test point and the second test point of the test metal circuit are disposed below the groove.
  • a transparent conductive film layer is provided on the first test point and the second test point of the test metal circuit and extends to two opposite sides of the groove.
  • test metal circuit is located and penetrates directly below the display chip.
  • the resistance value of the test metal circuit includes a first resistance value and a second resistance value
  • the second resistance value is obtained after the display panel is mechanically tested
  • the first resistance The value is obtained before the display panel is subjected to a mechanical test
  • the second resistance value exceeds a predetermined range of the first resistance value, the glass substrate of the display panel is determined to have cracks.
  • the present invention utilizes a non-closed circuit for testing a metal circuit and sets the testing metal circuit at the outermost periphery of a glass substrate. After the mechanical test of the finished product of the display panel, the first electrical contact is directly made by the external resistance tester. The test point and the second test point are used to detect the change in the resistance value of the test metal circuit.
  • the glass substrate of the display panel can be screened for fine cracks without disassembling, which effectively solves the need to disassemble the traditional display panel first. It is inconvenient to detect, and can avoid the problem of defective products leaking to the client due to the inability to accurately detect glass cracks.
  • FIG. 1 is a schematic structural diagram of a display panel according to an embodiment of the present invention.
  • FIG. 2 is a schematic cross-sectional view of a display panel according to an embodiment of the present invention.
  • FIG. 3 is a schematic structural diagram of a display panel according to an embodiment of the present invention.
  • FIG. 4 is a schematic structural diagram of a display panel according to an embodiment of the present invention.
  • FIG. 5 is a schematic partial cross-sectional view of a display panel according to an embodiment of the present invention.
  • FIG. 6 is a flowchart of a display panel detection method of the present invention.
  • the invention discloses a display panel and a display panel detection method.
  • the display panel is, for example, a display panel with an in-cell touch circuit, and can accurately detect whether a finished product of the display panel is not required to be disassembled. Testing method with cracks.
  • FIG. 1 is a schematic structural diagram of a display panel according to an embodiment of the present invention.
  • the display panel 1 of the present invention includes a glass substrate 2 including a display area 10 and a non-display area 11.
  • the non-display area 11 is located at the outermost periphery of the glass substrate 2, that is, the non-display area 11 surrounds the display area 10 and includes an upper portion 111 and a lower portion 112.
  • the display area 10 is an area on the display panel 1 for displaying a screen.
  • a display chip 24 is provided on the glass substrate 2, which is a driving element of the display panel 1.
  • FIG. 2 is a schematic cross-sectional view of a display panel according to an embodiment of the present invention.
  • the glass substrate 2 includes a color filter substrate 21 on the upper layer and a thin film transistor array substrate 22 on the lower layer.
  • the thin film transistor array substrate 22 includes a substrate 230 on which a functional layer 23 is disposed.
  • the functional layer 23 includes a lower insulating layer 231, a gate insulating layer 232, an intermediate dielectric layer 233, a flat layer 234, an upper insulating layer 235, and a passivation layer 236 in this order from the top, and the passivation layer 236
  • a frame sealant 4 and the color filter substrate 21 fixed to the frame sealant 4 are arranged on the frame sealant 4.
  • the color filter substrate 21 and the thin film transistor array substrate 22 respectively include the display area 10 and the non-display area 11.
  • a lip portion 221 is provided between one side portion of the color filter substrate 21 and one side portion of the thin film transistor array substrate 22, and the functional layer 23 is provided corresponding to the lip portion 221 with an opening on ⁇ ⁇ 20 ⁇
  • the groove 20 penetrates the passivation layer 236, the upper insulating layer 235, the flat layer 234, and the intermediate dielectric layer 233 through an etching process. In other words, the groove 20 penetrates toward the color filter substrate 21 and opens to the outside.
  • the display panel 1 of the present invention includes a test metal circuit 3.
  • the test metal circuit 3 is disposed in the non-display area 11, and is disposed along the winding and corresponding to the non-display area 11.
  • a first test point 31 is set at a start position of the test metal line 3, and a second test point 32 is set at an end position of the test metal line 3.
  • the first test point 31 and the second test point 32 are not connected to each other.
  • the first test point 31 and the second test point 32 are disposed on the right side of the lower portion 112 of the non-display area 11.
  • the test metal circuit 3 of the present invention is not electrically connected to other components in the display panel 1, which prevents the test metal circuit 3 from being affected by resistance tests of an external resistance tester (not shown).
  • the test metal circuit 3 is disposed on the gate insulating layer 232, and the first test point 31 and the second test point 32 are disposed below the groove 20 and are opened at The lip portion 221.
  • the first test point 31 and the second test point 32 are provided with a transparent conductive film layer 33 extending to two opposite sides of the groove 20.
  • the material of the transparent conductive film layer 33 is indium tin oxide.
  • FIG. 3 and 4 are schematic structural diagrams of a display panel according to an embodiment of the present invention.
  • the first test point 31 and the second test point 32 of the test metal line 3 are provided on the left side of the upper side portion 111 of the non-display area 11.
  • the first test point 31 and the second test point 32 of the test metal circuit 3 are provided on the left side of the lower portion 112 of the non-display area 11.
  • the setting positions of the first test point 31 and the second test point 32 are determined according to different types of external resistance testing instruments.
  • FIG. 5 is a schematic partial cross-sectional view of a display panel according to an embodiment of the present invention. Since the display chip 24 is provided at the outermost periphery of the display panel 1 and there are lines on the upper and lower portions of the display chip 24, only the test chip 24 has space underneath the test chip 24, so the test metal circuit 3 is located and penetrates the Directly below the display chip 24. Therefore, the layout of the test metal circuit 3 does not occupy additional space for the glass substrate 2.
  • the resistance value of the test metal circuit 3 is detected through the external resistance tester, and the two test leads of the external resistance tester are directly and electrically contacted The first test point 31 and the second test point 32 of the metal circuit 3 are tested, and a first resistance value is obtained.
  • the first resistance value is defined as a standard value.
  • the resistance value of the test metal circuit 3 is detected by an external resistance test instrument, and a second resistance value is obtained.
  • the first possible crack location of the glass substrate 2 is at the outermost periphery of the glass substrate 2, and the crack will damage the test metal circuit 3 and cause the resistance value of the test metal circuit 3 to change.
  • the second resistance value exceeds a predetermined range of the first resistance value, for example, it exceeds ten percent of the first resistance value, the glass substrate 2 of the display panel 1 is determined to have a crack.
  • the thickness of the test metal wire may also affect the detection result.
  • the finer cracks can have a large effect on the resistance of thin metal wires, and the finer cracks have a small effect on the resistance of thick metal wires. Therefore, thin metal wires are used when monitoring finer cracks, and larger wires are used when monitoring larger cracks. Thick metal wire.
  • the present invention utilizes a non-closed circuit for testing a metal circuit and sets the testing metal circuit at the outermost periphery of a glass substrate. After the mechanical test of the finished product of the display panel, the first electrical contact is directly made by the external resistance tester. The test point 31 and the second test point 32 are used to detect the change of the resistance value of the test metal circuit 3, and the glass substrate of the display panel can be screened for fine cracks without disassembling, effectively solving the needs of the traditional display panel. The inconvenience of disassembling and disassembling is performed in advance, and the problem of leaking defective products to the client due to failure to accurately detect glass cracks can be avoided.
  • FIG. 6 is a flowchart of a display panel detection method of the present invention.
  • the display panel detection method of the present invention includes the following steps: Step S1: define a display area and a non-display area on a glass substrate, the display area is used for displaying a picture, and the non-display area is located in the display area. The outermost periphery of the glass substrate.
  • Step S2 Setting a display chip on the glass substrate.
  • Step S3 forming a test metal line by physical vapor deposition on the non-display area, the test metal line is arranged along the non-display area, and a first test point is set at a start position of the test metal line, A second test point is provided at an end position of the metal line, and the first test point and the second test point are not connected to each other to form a non-closed circuit.
  • Step S4 The first test point and the second test point are electrically contacted with an external resistance tester to detect the resistance value of the test metal line.
  • the display panel is first subjected to a mechanical test, and before the mechanical test is performed, the first resistance point and the second resistance point are electrically contacted through the external resistance testing instrument for the purpose of detection.
  • the test metal circuit has a resistance value and obtains a first resistance value.
  • a second resistance value of the test metal circuit is obtained through detection by the external resistance testing instrument, and when the second resistance value exceeds a predetermined range of the first resistance value At this time, the glass substrate of the display panel was determined to have cracks.
  • the glass substrate includes an upper color filter substrate and a lower thin film transistor array substrate.
  • the thin film transistor array substrate is provided with a functional layer, and one side of the color film substrate and the thin film transistor array substrate A lip portion is formed between one side portion, and the functional layer is recessed with an open groove corresponding to the lip portion, wherein a first test point and a second test point of the test metal line are provided in the Under the groove.
  • the test lead of the external resistance testing instrument directly enters the groove from the outside and electrically contacts the first test point and the second test point, so that the resistance of the test metal line can be directly detected without disassembling the machine. value.
  • a transparent conductive film layer is provided on the first test point and the second test point of the test metal circuit and extends to two opposite sides of the groove.
  • the structure of the display panel used in the panel detection method of the present invention is the same as the structure of the display panel of the foregoing embodiment, and details are not described herein again.

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Abstract

一种显示面板(1)，包括玻璃基板(2)、显示区域(10)及非显示区域(11)。非显示区域(11)位于玻璃基板(2)的最外围。显示芯片(24)设于非显示区域(11)上，并作为显示面板(1)的驱动元件。测试金属线路(3)沿绕非显示区域(11)设置。测试金属线路(3)的开始位置设有第一测试点(31)，而结束位置设有第二测试点(32)，且第一测试点(31)及第二测试点(32)互不连通，用以形成不闭合电路。第一测试点(31)及第二测试点(32)用以和一外部电阻测试仪器电性接触，以检测测试金属线路(3)的电阻值。

Description

显示面板及显示面板检测方法 技术领域
本发明涉及显示技术领域，特别是涉及一种针对显示面板玻璃是否有裂纹的显示面板检测方法及显示面板。
 背景技术
显示面板由上下两块玻璃基板组成，为了检测产品各种组件的功能，确认各组件是否有损坏的失效现象，通常会让显示面板进行各机械测试。
显示面板在裂片、组装等制程工艺过程中，由于各种制程工艺可能造成玻璃基板产生裂纹的问题，且显示面板完成后仍需通过各种机械测试，而所述机械测试亦可能造成裂纹的产生，因此在显示面板提供至客户端前，必须先行检测是否具有瑕疵。显示面板在在进行4PB(four-point-bendingtest)、跌落、震动等机械测试时，传统方式是于机械测试完后，进行显示画面测试，显示画面无异常则判定测试通过。若显示画面异常，则说明线路被跌落损坏，判定测试不通过。但是，部分显示面板玻璃基板的边缘会产生轻微的裂纹，而轻微的裂纹并不会对电路造成大的损伤，也能正常显示。然而，在后续使用过程中，轻微的裂纹可能会慢慢扩大，以至于设置在玻璃基板上的部分线路彻底断裂，引起显示不良。
 技术问题
本发明的目的在于提供一种可精细地，并可有效检测显示面板是否具有裂纹的显示面板检测方法及显示面板，用以实现不用拆机而可进行裂纹检测，提升检测效率，避免造成漏放不良品至客户端。
 技术解决方案
为达到前述目的，本发明的显示面板，包括玻璃基板，包括一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围；显示芯片，设于所述非显示区域上，所述显示芯片作为所述显示面板的驱动元件；及测试金属线路，设于所述非显示区，并沿绕所述非显示区域设置，所述测试金属线路的开始位置设有第一测试点，所述测试金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路，且所述第一测试点及第二测试点用以和一外部电阻测试仪器电性接触，以检测所述测试金属线路的电阻值。
在一优选实施例中，所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板包括一基底，所述基底上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间具有一唇缘部，所述功能层对应所述唇缘部设有一开放于外的凹槽，所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。
在另一优选实施例中，所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
在另一优选实施例中，所述功能层包括一下绝缘层、一栅极绝缘层、一中间介电层、一平坦层、一上绝缘层，及一钝化层，且所述钝化层上设有封框胶，所述彩膜基板黏固于所述封框胶的，其中所述凹槽穿透所述钝化层、所述上绝缘层、所述平坦层及所述中间介电层，而所述测试金属线路设于所述栅极绝缘层上。
在另一优选实施例中，所述测试金属线路位于并穿透所述显示芯片的正下方。
在另一优选实施例中，所述玻璃基板的非显示区域围绕所述显示区域，并包括上边部及下边部，所述测试金属线路的第一测试点及第二测试点设于所述上边部或下边部的位置。
在另一优选实施例中，所述测试金属线路的电阻值包括第一电阻值及第二电阻值，所述第二电阻值是所述显示面板经由机械测试后取得，而所述第一电阻值是所述显示面板经由机械测试前取得，其中所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
本发明另外提供一种显示面板检测方法，其特征在于，所述显示面板检测方法包括：
在玻璃基板上定义一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围；
在所述玻璃基板上设置显示芯片；
在所述非显示区域上沉积一测试金属线路，所述测试金属线路沿绕所述显示区域设置，其中所述测试金属线路的开始位置设有第一测试点，所述金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路；及
将所述第一测试点及第二测试点和一外部电阻测试仪器电性接触而检测所述测试金属线路的电阻值。
在一优选实施例中，所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板包括一基底，所述基底上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间形成有一唇缘部，所述功能层对应所述唇缘部凹设有一开放于外的凹槽，其中所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。
在另一优选实施例中，将所述显示面板进行机械测试，并于进行所述机械测试前，透过所述外部电阻测试仪器电性接触所述第一测试点及第二测试点，用以检测所述测试金属线路的电阻值，并取得第一电阻值，而于所述机械测试后，再透过所述外部电阻测试仪器的检测取得所述测试金属线路的第二电阻值，其中当所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
在另一优选实施例中，所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
本发明另外提供一种显示面板，包括：
玻璃基板，包括一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围；
显示芯片，设于所述非显示区域上，所述显示芯片作为所述显示面板的驱动元件；及
测试金属线路，设于所述非显示区上，并沿绕所述非显示区域设置，所述测试金属线路的开始位置设有第一测试点，所述金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路，且所述第一测试点及第二测试点用以和一外部电阻测试仪器电性接触，以检测所述测试金属线路的电阻值；
其中所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板包括一基底，所述基底上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间具有一唇缘部，所述功能层对应所述唇缘部设有一凹槽，所述凹槽朝向所述彩膜基板的方向穿透，并开放于外部，所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。
在一优选实施例中，所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
在另一优选实施例中，所述测试金属线路位于并穿透所述显示芯片的正下方。
在另一优选实施例中，所述测试金属线路的电阻值包括第一电阻值及第二电阻值，所述第二电阻值是所述显示面板经由机械测试后取得，而所述第一电阻值是所述显示面板经由机械测试前取得，其中所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
 有益效果
本发明利用测试金属线路的不闭合电路，并将测试金属线路设于玻璃基板的最外围，可以于显示面板的完成品进行机械测试后，藉由外部电阻测试仪器直接电性接触所述第一测试点及第二测试点，用以检测所述测试金属线路的电阻值的变化，可以无需拆机即可筛选出显示面板的玻璃基板是否有细微裂纹，有效地解决传统显示面板需要先行拆机检测的不便，且可避免因无法精确地检测玻璃裂纹，而导致不良品漏放至客户端的问题。
 附图说明
图1为本发明一种实施例之显示面板的结构示意图。
图2为本发明一种实施例之显示面板的剖面示意图。
图3为本发明一种实施例之显示面板的结构示意图。
图4为本发明一种实施例之显示面板的结构示意图。
图5为本发明一种实施例之显示面板的局部剖面示意图。
图6为本发明显示面板检测方法的流程图。
 本发明的最佳实施方式
以下各实施例的说明是参考附加的图式，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如「上」、「下」、「前」、「后」、「左」、「右」、「内」、「外」、「侧面」等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。
本发明揭露一种显示面板及显示面板检测方法，显示面板例如为具有内嵌式触控电路的显示面板，及可在无需拆机的情况下，即可精细地针对显示面板的完成品检测是否具有裂纹的检测方法。
图1为本发明一种实施例之显示面板的结构示意图。如图1所示，本发明的显示面板1包括玻璃基板2，包括一显示区域10及一非显示区域11。所述非显示区域11位于所述玻璃基板2的最外围，亦即，所述非显示区域11围绕所述显示区域10，并包括上边部111及下边部112。所述显示区域10即所述显示面板1上用以显示画面的区域。此外，所述玻璃基板2上设有一显示芯片24，其为所述显示面板1的驱动元件。
图2为本发明一种实施例之显示面板的剖面示意图。如图2所述，所述玻璃基板2包括上层的彩膜基板21及下层的薄膜晶体管阵列基板22，所述薄膜晶体管阵列基板22包括一基底230，所述基底230上设有功能层23。所述功能层23由往上依序包括有下绝缘层231、栅极绝缘层232、中间介电层233、平坦层234、上绝缘层235及钝化层236，且所述钝化层236上设有封框胶4及黏固于所述封框胶4的所述彩膜基板21。此外，所述彩膜基板21及所述薄膜晶体管阵列基板22分别包括所述显示区域10及所述非显示区域11。
特别说明的是，所述彩膜基板21的一边部和所述薄膜晶体管阵列基板22的一边部之间具有一唇缘部221，所述功能层23对应所述唇缘部221设有一开放于外的凹槽20。具体而言，所述凹槽20通过蚀刻工艺穿透所述钝化层236、所述上绝缘层235、所述平坦层234及所述中间介电层233。换言之，所述凹槽20朝向所述彩膜基板21的方向穿透并开放于外部。
续请参阅图1，本发明的显示面板1包括测试金属线路3。所述测试金属线路3设于所述非显示区域11，并沿绕且对应所述非显示区域11设置。所述测试金属线路3的开始位置设有第一测试点31，所述测试金属线路3的结束位置设有第二测试点32，所述第一测试点31及第二测试点32互不连通，用以形成不闭合电路。于此较佳实施例中，所述第一测试点31及第二测试点32设于非显示区域11的下边部112的右侧。具体而言，本发明的测试金属线路3并不与显示面板1内其他构件电性连接，避免所述测试金属线路3接受外部电阻测试仪器(未图示)的电阻测试受到影响。
续请参阅图2，所述测试金属线路3设于所述栅极绝缘层232上，且所述第一测试点31及第二测试点32设于所述凹槽20的下方，并开放于所述唇缘部221。此外，为防止裸露的测试金属线路3被腐蚀风险，所述第一测试点31及第二测试点32上设有一透明导电膜层33，其延伸至所述凹槽20的相对二侧。所述透明导电膜层33的材料为铟锡氧化物。
图3及图4分别为本发明一种实施例之显示面板的结构示意图。如图3所示，所述测试金属线路3的第一测试点31及第二测试点32设于非显示区域11的上边部111的左侧。如图4所示，所述测试金属线路3的第一测试点31及第二测试点32设于非显示区域11的下边部112的左侧。所述第一测试点31及第二测试点32的设置位置是依据不同外部电阻测试仪器的类型而定。
图5为本发明一种实施例之显示面板的局部剖面示意图。由于显示芯片24是设于显示面板1的最外围，且显示芯片24的上下部分均有线路，只有显示芯片24底下有空间放置测试金属线，故所述测试金属线路3位于并穿透所述显示芯片24的正下方。藉此，所述测试金属线路3的布设不会额外占用玻璃基板2的配置空间。
一般显示面板于制作完成后，完成品的显示面板提供至客户端之前，会先经过各种机械测试的检测，例如4PB、跌落、震动等机械测试，用以检测显示画面是否异常，但往往画面显示正常却不全然表示玻璃基板不具有裂纹。本发明显示面板1于完成品阶段，在接受机械测试前，先经由所述外部电阻测试仪器检测所述测试金属线路3的电阻值，将外部电阻测试仪器的两个表笔分别并直接电性接触所述测试金属线路3的第一测试点31及第二测试点32，并取得第一电阻值。所述第一电阻值即定义为一标准值。再于显示面板1接受机械测试后，经由外部电阻测试仪器检测所述测试金属线路3的电阻值，并取得第二电阻值。由于经过机械测试后，玻璃基板2最先可能产生裂纹的位置是在玻璃基板2的最外围，而裂纹会损坏测试金属线路3，造成测试金属线路3的电阻值的改变。当所述第二电阻值超过所述第一电阻值的一预定范围时，例如超过所述第一电阻值的百分之十，则所述显示面板1的玻璃基板2经判定为具有裂纹。
于另一具体实施中，测试金属线的粗细不同亦会影响检测结果。较细微的裂纹能对细的金属线电阻造成大的影响，较细微的裂纹对粗的金属线电阻影响很小，因此在需要监测较细微裂纹时采用细金属线，需要监测较大裂纹时采用粗金属线，择优而用。
本发明利用测试金属线路的不闭合电路，并将测试金属线路设于玻璃基板的最外围，可以于显示面板的完成品进行机械测试后，藉由外部电阻测试仪器直接电性接触所述第一测试点31及第二测试点32，用以检测所述测试金属线路3的电阻值的变化，可以无需拆机即可筛选出显示面板的玻璃基板是否有细微裂纹，有效地解决传统显示面板需要先行拆机检测的不便，且可避免因无法精确地检测玻璃裂纹，而导致不良品漏放至客户端的问题。
本发明另外提供一种显示面板检测方法。图6为本发明显示面板检测方法的流程图。如图6所示，本发明显示面板检测方法包括如下步骤：步骤S1：在玻璃基板上定义一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围。
步骤S2：在所述玻璃基板上设置显示芯片。
步骤S3：在所述非显示区域上通过物理气相沉积形成一测试金属线路，所述测试金属线路沿绕所述非显示区域设置，其中所述测试金属线路的开始位置设有第一测试点，所述金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路。
步骤S4：将所述第一测试点及第二测试点电性接触于一外部电阻测试仪器，以检测所述测试金属线路的电阻值。
于实际检测时，先将所述显示面板进行机械测试，并于进行所述机械测试前，透过所述外部电阻测试仪器电性接触所述第一测试点及第二测试点，用以检测所述测试金属线路的电阻值，并取得第一电阻值。而于所述机械测试后，再透过所述外部电阻测试仪器的检测取得所述测试金属线路的第二电阻值，其中当所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
具体而言，所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间形成有一唇缘部，所述功能层对应所述唇缘部凹设有一开放于外的凹槽，其中所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。换言之，所述外部电阻测试仪器的表笔直接由外进入所述凹槽而电性接触所述第一测试点及第二测试点，进而可以不用拆机而可直接检测所述测试金属线路的电阻值。
此外，所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
用于本发明面板检测方法的显示面板的结构，其相同于前述实施例的显示面板的结构，于此不再赘述。
综上所述，虽然本发明已以优选实施例揭露如上，但上述优选实施例并非用以限制本发明，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，因此本发明的保护范围以权利要求界定的范围为准。

Claims (15)

  1. 一种显示面板，包括：
    玻璃基板，包括一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围；
    显示芯片，设于所述非显示区域上，所述显示芯片作为所述显示面板的驱动元件；及
    测试金属线路，设于所述非显示区上，并沿绕所述非显示区域设置，所述测试金属线路的开始位置设有第一测试点，所述测试金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路，且所述第一测试点及第二测试点用以和一外部电阻测试仪器电性接触，以检测所述测试金属线路的电阻值。
  2. 如权利要求1的显示面板，其中所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板包括一基底，所述基底上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间具有一唇缘部，所述功能层对应所述唇缘部设有一开放于外的凹槽，所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。
  3. 如权利要求2的显示面板，其中所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
  4. 如权利要求2的显示面板，其中所述功能层包括一下绝缘层、一栅极绝缘层、一中间介电层、一平坦层、一上绝缘层，及一钝化层，且所述钝化层上设有封框胶，所述彩膜基板黏固于所述封框胶，其中所述凹槽穿透所述钝化层、所述上绝缘层、所述平坦层及所述中间介电层，而所述测试金属线路设于所述栅极绝缘层上。
  5. 如权利要求1的显示面板，其中所述测试金属线路位于并穿透所述显示芯片的正下方。
  6. 如权利要求1的显示面板，其中所述玻璃基板的非显示区域围绕所述显示区域，并包括上边部及下边部，所述测试金属线路的第一测试点及第二测试点设于所述上边部或下边部的位置。
  7. 如权利要求1的显示面板，其中所述测试金属线路的电阻值包括第一电阻值及第二电阻值，所述第二电阻值是所述显示面板经由机械测试后取得，而所述第一电阻值是所述显示面板经由机械测试前取得，其中所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
  8. 一种显示面板检测方法，包括：
    在玻璃基板上定义一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围；
    在所述非显示区域上设置显示芯片；
    在所述非显示区域上沉积一测试金属线路，所述测试金属线路沿绕所述非显示区域设置，其中所述测试金属线路的开始位置设有第一测试点，所述测试金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路；及
    将所述第一测试点及第二测试点和一外部电阻测试仪器电性接触而检测所述测试金属线路的电阻值。
  9. 如权利要求8的显示面板检测方法，其中所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板包括一基底，所述基底上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间形成有一唇缘部，所述功能层对应所述唇缘部凹设有一开放于外的凹槽，其中所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。
  10. 如权利要求8的显示面板检测方法，其中将所述显示面板进行机械测试，并于进行所述机械测试前，透过所述外部电阻测试仪器电性接触所述第一测试点及第二测试点，用以检测所述测试金属线路的电阻值，并取得第一电阻值，而于所述机械测试后，再透过所述外部电阻测试仪器的检测取得所述测试金属线路的第二电阻值，其中当所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
  11. 如权利要求9的显示面板，其中所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
  12. 一种显示面板，包括：
    玻璃基板，包括一显示区域及一非显示区域，所述显示区域用于显示画面，所述非显示区域位于所述玻璃基板的最外围；
    显示芯片，设于所述非显示区域上，所述显示芯片作为所述显示面板的驱动元件；及
    测试金属线路，设于所述非显示区上，并沿绕所述非显示区域设置，所述测试金属线路的开始位置设有第一测试点，所述测试金属线路的结束位置设有第二测试点，所述第一测试点及第二测试点互不连通，用以形成不闭合电路，且所述第一测试点及第二测试点用以和一外部电阻测试仪器电性接触，以检测所述测试金属线路的电阻值；
    其中所述玻璃基板包括上层的彩膜基板及下层的薄膜晶体管阵列基板，所述薄膜晶体管阵列基板包括一基底，所述基底上设有功能层，所述彩膜基板的一边部和所述薄膜晶体管阵列基板的一边部之间具有一唇缘部，所述功能层对应所述唇缘部设有一凹槽，所述凹槽朝向所述彩膜基板的方向穿透，并开放于外部，所述测试金属线路的第一测试点及第二测试点设于所述凹槽的下方。
  13. 如权利要求12的显示面板，其中所述测试金属线路的第一测试点及第二测试点上设有一透明导电膜层，其延伸至所述凹槽的相对二侧。
  14. 如权利要求12的显示面板，其中所述测试金属线路位于并穿透所述显示芯片的正下方。
  15. 如权利要求12的显示面板，其中所述测试金属线路的电阻值包括第一电阻值及第二电阻值，所述第二电阻值是所述显示面板经由机械测试后取得，而所述第一电阻值是所述显示面板经由机械测试前取得，其中所述第二电阻值超过所述第一电阻值的一预定范围时，所述显示面板的玻璃基板经判定具有裂纹。
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