WO2017159058A1 - レベルシフト回路 - Google Patents
レベルシフト回路 Download PDFInfo
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- WO2017159058A1 WO2017159058A1 PCT/JP2017/002667 JP2017002667W WO2017159058A1 WO 2017159058 A1 WO2017159058 A1 WO 2017159058A1 JP 2017002667 W JP2017002667 W JP 2017002667W WO 2017159058 A1 WO2017159058 A1 WO 2017159058A1
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/16—Modifications for eliminating interference voltages or currents
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/51—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used
- H03K17/56—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices
- H03K17/687—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the components used by the use, as active elements, of semiconductor devices the devices being field-effect transistors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/02—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components
- H03K19/08—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices
- H03K19/094—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors
- H03K19/0944—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET
- H03K19/0948—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits using specified components using semiconductor devices using field-effect transistors using MOSFET or insulated gate field-effect transistors, i.e. IGFET using CMOS or complementary insulated gate field-effect transistors
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- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K19/00—Logic circuits, i.e. having at least two inputs acting on one output; Inverting circuits
- H03K19/0175—Coupling arrangements; Interface arrangements
- H03K19/0185—Coupling arrangements; Interface arrangements using field effect transistors only
Definitions
- the present invention relates to a level shift circuit, and more particularly to a level shift circuit for transmitting a signal generated based on a low-side ground potential to a drive circuit for driving a high-side switch element of two switch elements forming a half-bridge circuit.
- a level shift circuit for transmitting a signal generated based on a low-side ground potential to a drive circuit for driving a high-side switch element of two switch elements forming a half-bridge circuit.
- HV driver IC HVIC
- a signal for turning on or off the high-side switch element cannot be directly used as a signal generated with reference to the ground potential on the low side, and is used after being level-shifted by the level shift circuit ( For example, see Patent Documents 1 and 2).
- the level shift circuits described in Patent Documents 1 and 2 will be described in order.
- FIG. 5 is a diagram showing a configuration example of a half-bridge circuit using a conventional level shift circuit.
- a high-side switch element XD1 and a low-side switch element XD2 are connected in series to form an output circuit 100, and a high-voltage power supply E (hereinafter, the voltage is also represented by E) is provided at both ends. It is connected.
- the switch elements XD1 and XD2 use N-channel power MOSFETs (Metal-Oxide-Semiconductor Field-Effect Transistors) in the illustrated example.
- MOSFETs Metal-Oxide-Semiconductor Field-Effect Transistors
- the high-side switch element XD1 is controlled by the output signal HO of the high-side drive circuit 110, and the low-side switch element XD2 is controlled by the output signal LO of the low-side drive circuit 120.
- the high-side drive circuit 110 includes a high-side driver 111 that drives the switch element XD1, a power supply E1 (hereinafter, the voltage is also represented by E1), and a level shift circuit that includes other components.
- the level shift circuit has a series circuit of a level shift resistor LSR1 and a high voltage transistor HVN1 of an N channel MOSFET and a series circuit of a level shift resistor LSR2 and a high voltage transistor HVN2 of an N channel MOSFET.
- One end of each of these series circuits is connected to a power supply line VB (hereinafter, the potential is also expressed as VB) connected to the high potential side terminal of the power supply E1, and the other end is grounded as a low side reference potential. It is connected to a potential (GND).
- a set signal SET for instructing the start timing of the ON period of the switch element XD1 is input to the gate of the high voltage transistor HVN1.
- a reset signal RSET for instructing the end timing of the ON period of the switch element XD1 is input to the gate of the high breakdown voltage transistor HVN2.
- the capacitors connected between the source and drain of the high voltage transistors HVN1 and HVN2 represent the parasitic capacitances Cds1 and Cds2 of the high voltage transistors HVN1 and HVN2.
- a connection point setdrn between the level shift resistor LSR1 and the high breakdown voltage transistor HVN1 (hereinafter, the signal is also represented by a set drain signal setdrn) is connected to the latch malfunction protection circuit 112.
- a connection point resdrn (hereinafter also referred to as a reset drain signal resdrn) between the level shift resistor LSR2 and the high breakdown voltage transistor HVN2 is also connected to the latch malfunction protection circuit 112.
- the latch malfunction protection circuit 112 functions to pass the set drain signal setdrn and the reset drain signal resdrn as they are only when one of the connection points setdrn and resdrn is at the L level and the other is at the H level.
- the output of the latch malfunction protection circuit 112 is connected to the latch circuit 113, and the output of the latch circuit 113 is connected to the high side driver 111.
- the output of the latch circuit 113 is also connected to the input of the inverter circuit INV1, and the output of the inverter circuit INV1 is connected to the input of the inverter circuit INV2.
- the output of the inverter circuit INV1 is also connected to one end of a series circuit composed of a resistor R11 and a resistor R12, and the other end of the series circuit is connected to a connection point setdrn.
- the middle point of the resistors R11 and R12 is connected to the gate of a transistor PM2 of a P-channel MOSFET connected in parallel to the level shift resistor LSR2.
- the output of the inverter circuit INV2 is connected to one end of a series circuit composed of a resistor R13 and a resistor R14, and the other end of the series circuit is connected to a connection point resdrn.
- the middle point of the resistors R13 and R14 is connected to the gate of a transistor PM1 of a P-channel MOSFET connected in parallel to the level shift resistor LSR1.
- the level shift circuit also includes diodes D1 and D2, and their anodes are connected to a connection point VS between the switch element XD1 and the switch element XD2 (hereinafter, this potential is also expressed as a high-side reference potential VS). ing.
- the cathode of the diode D1 is connected to the connection point setdrn, and the cathode of the diode D2 is connected to the connection point resdrn.
- the diodes D1 and D2 are for clamping the voltage at the connection points setdrn and resdrrn so as not to exceed the high-side reference potential VS to prevent an overvoltage from being input to the latch malfunction protection circuit 112.
- the low-side drive circuit 120 includes a low-side driver 121 that drives the switch element XD2 and a power supply E2.
- the low-side driver 121 receives power from the power supply E2, inputs a low-side control signal, and outputs an output signal LO for driving the switch element XD2 on and off.
- One end of the load L is connected to the connection point VS between the switch element XD1 and the switch element XD2 of the output circuit 100, that is, the power supply line that is the high-side reference potential, and the other end of the load L is the low-side drive circuit 120. Is connected to a ground potential (GND), which is a reference potential.
- GND ground potential
- the high-side reference potential VS at the connection point VS is rapidly switched from the ground potential to the high-voltage voltage E.
- the voltage VB of the power supply line VB of the high side drive circuit 110 is added with the voltage E1 of the power supply E1, and the voltage from the ground potential becomes (E + E1).
- the high breakdown voltage transistors HVN1 and HVN2 are turned off, the potential VB is applied to the connection points setdrn and resdrn via the level shift resistors LSR1 and LSR2.
- the latch malfunction protection circuit 112 blocks the passage of the set drain signal setdrn and the reset drain signal resdrn because both of the two input signals are at the H level. The state in which the element XD1 is turned on is maintained.
- a CR circuit is formed by the level shift resistors LSR1 and LSR2 and the parasitic capacitances Cds1 and Cds2. Since the voltage (E + E1) is applied to the CR circuit, an error signal called dV / dt noise is superimposed on the connection points setdrn and resdrn until charging of the parasitic capacitors Cds1 and Cds2 is completed.
- the potentials of the connection points setdrn and resdrn are at the L level, and the latch malfunction protection circuit 112 has both the two input signals at the L level. It should block the passage of setdrn and reset drain signal resdrn.
- the capacitance values of the parasitic capacitances Cds1 and Cds2 are likely to vary due to manufacturing variations.
- V (t) is the voltage applied to the CR circuit
- Vx is the voltage at the connection point of CR
- k is the rising slope of V (t).
- V (t) -Vx kCR (1-exp (-t / CR)) (For example, equation (13) in Patent Document 1).
- the resistance values of the level shift resistors LSR1 and LSR2 are changed in the direction in which the state of the output signal of the latch circuit 113 is maintained depending on the state of the output signal of the latch circuit 113. That is, when the output signal of the latch circuit 113 is at the H level, the L level inverted by the inverter circuit INV1 is applied to the resistor R11. Since the L level of the output of the inverter circuit INV1 is equal to the high side reference potential VS, the gate voltage of the transistor PM2 is pulled down to turn on. At the same time, the H level further inverted by the inverter circuit INV2 is applied to the resistor R13.
- the transistor PM1 Since the H level of the output of the inverter circuit INV2 is equal to the potential VB, the transistor PM1 is turned off when its gate voltage is pulled up. Thus, (the combined resistance of the level shift resistor LSR1 and the source-drain resistance of the transistor PM1)> (the combined resistance of the on-resistance of the level shift resistor LSR2 and the transistor PM2), and dV / dt noise is generated.
- the potential of the reset drain signal resdrn is less likely to drop compared to the potential of the set drain signal setdrn.
- the latch circuit 113 Since it becomes the potential side of the set drain signal setdrn alone due to the dV / dt noise, the latch circuit 113 is not erroneously reset and the state of the output signal does not change.
- the on-resistance (impedance) of the transistor PM2 forming the combined resistance with the level shift resistor LSR2 is determined by the resistance ratio of the resistor R11 and the resistor R12.
- the set drain signal setdrn is less likely to drop, so that the latch circuit 113 is not set erroneously and the state of the output signal does not change. I am doing so.
- FIG. 6 is a diagram showing another configuration example of a half-bridge circuit using a conventional level shift circuit.
- the same or equivalent components as those shown in FIG. 5 are denoted by the same reference numerals, and detailed description thereof is omitted.
- the level shift circuit shown in FIG. 6 includes an OR circuit OR1 and P-channel MOSFET transistors PM3 and PM4 connected in parallel to the level shift resistors LSR1 and LSR2.
- the input of the OR circuit OR1 is connected to the connection points setdrn and resdrn of the level shift output, and the output of the OR circuit OR1 is connected to the gates of the transistors PM3 and PM4.
- the high-voltage transistors HVN1 and HVN2 are turned off when the low-side switch element XD is turned off and the high-side switch element XD1 is turned on to increase the potential VB of the power supply line VB, the parasitic capacitance Cds1 , Cds 2, the potentials at the connection points setdrn, resdrn are lowered.
- the OR circuit OR1 detects that the potentials of both connection points setdrn and resdrn are both lower than the logic threshold value, the OR circuit OR1 outputs an L level, and the transistors PM1 and PM2 connected in parallel to the level shift resistors LSR1 and LSR2 are output. turn on.
- connection points setdrn and resdrn are both pulled up to the H level.
- detailed explanation is omitted, even if dV / dt noise is generated in a state where the capacitance values of the parasitic capacitances Cds1 and Cds2 are different, a normal signal is input from the connection points setdrn and resdrn. Therefore, the latch circuit 113 will not be set or reset by mistake because the side becomes the L level or both of them only become the L level or the H level together.
- Japanese Patent No. 5402852 paragraphs [0120] to [0133], FIG. 15
- Japanese Patent No. 5354417 paragraphs [0033] to [0041], FIG. 1
- the high side reference potential VS rises when the low side switch element XD2 is turned off and the high side switch element XD1 is switched from the off state to the on state. May rise.
- the load L is an inductive load, and the current flowing from the load L into the output circuit 100 during the dead time when both the switch elements XD1 and XD2 are turned off is not suddenly cut off.
- the current flowing from the load L to the output circuit 100 is charged to the stray capacitance of the line of the high side reference potential VS, and the high side reference potential VS rises rapidly and dV / dt noise is generated. To do.
- Such dV / dt noise is often sustained longer by the load L than dV / dt noise that is instantaneously generated when the high-side switch element XD1 is switched from the off state to the on state.
- the present invention has been made in view of such points, and a level shift circuit is provided that prevents malfunction even when long-time dV / dt noise occurs in a power supply line that is a high-side reference potential.
- the purpose is to provide.
- a level shift circuit for level-shifting a signal generated based on the low-side ground potential and transmitting the level-shifted signal to a circuit for driving the high-side switch element.
- the level shift circuit includes a first series circuit of a first resistor and a first transistor connected between the high-side high-voltage power supply line and the ground potential, and the high-side high voltage.
- a first AND circuit that inputs a first output of a detection circuit and a signal at the first connection point and controls the sixth transistor; a second output of the dV / dt period detection circuit; And a second AND circuit for inputting the signal of the second connection point and controlling the fourth transistor.
- the third transistor is controlled by an output signal of the latch circuit
- the fifth transistor is controlled by a signal obtained by logically inverting the output signal of the latch circuit.
- the level shift circuit having the above-described configuration is provided with the dV / dt period detection circuit, it can cope with the generation of dV / dt noise for a long time, so that there is an advantage that the malfunction tolerance against dV / dt can be improved. In addition, since the level shift circuit is less likely to malfunction, the reliability of the half bridge circuit to which the level shift circuit is applied is improved.
- connection points and lines and potentials, voltages, signals, and the like at the connection points and lines.
- FIG. 1 is a circuit diagram showing a configuration example of a half bridge circuit using a level shift circuit according to an embodiment of the present invention
- FIG. 2 is a circuit diagram showing a configuration example of an AND circuit
- FIG. 3 is a dV / dt period
- FIG. 4 is a circuit diagram showing a configuration example of the detection circuit
- FIG. 4 is a diagram showing operation waveforms of the level shift circuit.
- the parts other than the level shift circuit are the same as the components shown in FIGS. 5 and 6, and therefore the corresponding components are denoted by the same reference numerals.
- a high-side switch element XD1 and a low-side switch element XD2 are connected in series to form an output circuit 100, and a high-voltage power supply E is connected to both ends.
- N-channel power MOSFETs are used as the switch elements XD1 and XD2.
- the high-side switch element XD1 is ON / OFF controlled when the gate is connected to the output of the high-side drive circuit 110 and driven by the output signal HO of the high-side drive circuit 110.
- the low-side switch element XD2 has its gate connected to the output of the low-side drive circuit 120 and is driven by the output signal LO of the low-side drive circuit 120 to be turned on / off.
- the high-side drive circuit 110 includes a high-side driver 111 that drives the switch element XD1, a high-side power supply E1, and a level shift circuit that includes other components.
- the level shift circuit has a series circuit of a level shift resistor LSR1 and a high voltage transistor HVN1 of an N channel MOSFET and a series circuit of a level shift resistor LSR2 and a high voltage transistor HVN2 of an N channel MOSFET.
- One end of each of these series circuits is connected to a power supply line VB connected to the high potential side terminal of the power supply E1, and the other end is connected to a ground potential (GND) which is a low side reference potential.
- the level shift resistor LSR1 is connected in parallel with transistors PM1 and PM1X of a P-channel MOSFET having a two-stage series configuration.
- the level shift resistor LSR2 is connected in parallel with transistors PM2 and PM2X of a P-channel MOSFET having a two-stage series configuration.
- the level shift resistor LSR1 is further connected in parallel with a P-channel MOSFET transistor PM3, and the level shift resistor LSR2 is further connected in parallel with a P-channel MOSFET transistor PM4.
- a set signal SET for instructing the start timing of the ON period of the switch element XD1 is input to the gate of the high voltage transistor HVN1 from a control circuit (not shown). Further, a reset signal RSET for instructing the end timing of the ON period of the switch element XD1 is input from a control circuit (not shown) to the gate of the high voltage transistor HVN2.
- the capacitors connected between the source and drain of the high voltage transistors HVN1 and HVN2 are the parasitic capacitances Cds1 and Cds2 of the high voltage transistors HVN1 and HVN2.
- the connection point setdrn between the level shift resistor LSR1 and the high breakdown voltage transistor HVN1 and the connection point resdrn between the level shift resistor LSR2 and the high breakdown voltage transistor HVN2 are connected to the latch malfunction protection circuit 112, respectively.
- the latch malfunction protection circuit 112 determines whether or not the signal state of the connection points setdrn and resdrn is a condition that causes a malfunction, and when it is determined that the condition causes a malfunction, the latch malfunction protection circuit 112 functions to block signal passage. .
- a condition for causing a malfunction is a case where the potentials of the connection points setdrn and resdrn are both H or L level. When it is determined that the condition does not cause malfunction, the latch malfunction protection circuit 112 passes the signals of the connection points setdrn and resdrn as they are.
- the output of the latch malfunction protection circuit 112 is connected to the latch circuit 113, and the output of the latch circuit 113 is connected to the high side driver 111.
- the output of the latch circuit 113 is also connected to the gate of the transistor PM1.
- the output of the latch circuit 113 is further connected to the input of the inverter circuit INV, and the output of the inverter circuit INV is connected to the gate of the transistor PM2.
- the level shift circuit also includes an OR circuit OR1, an AND circuit AND1, an AND circuit AND2, and a dV / dt period detection circuit 114.
- the input of the OR circuit OR1 is connected to the connection points setdrn and resdrn, respectively, and the output of the OR circuit OR1 is connected to the gates of the transistors PM3 and PM4, respectively.
- the input of the AND circuit AND1 is connected to the connection point setdrn and the output OUT1 of the dV / dt period detection circuit 114, and the output of the AND circuit AND1 is the gate of the transistor PM2X and the input IN1 of the dV / dt period detection circuit 114 Are connected to each.
- the input of the AND circuit AND2 is connected to the connection point resdrn and the output OUT2 of the dV / dt period detection circuit 114, and the output of the AND circuit AND2 is the gate of the transistor PM1X and the input IN2 of the dV / dt period detection circuit 114 Are connected to each.
- the input IN3 is connected to the connection point setdrn
- the input IN4 is connected to the connection point resdrn
- the input POR is connected to a control circuit (not shown) so as to receive the power-on reset signal POR. Has been.
- the level shift circuit also includes diodes D1 and D2, and the anodes thereof are connected to a connection point VS between the switch element XD1 and the switch element XD2.
- the cathode of the diode D1 is connected to the connection point setdrn, and the cathode of the diode D2 is connected to the connection point resdrn.
- the low-side drive circuit 120 includes a low-side driver 121 that drives the switch element XD2 and a power supply E2.
- the low side driver 121 is supplied with power from the power source E2, receives a low side control signal from a control device (not shown), and outputs an output signal LO for driving the switch element XD2 on and off.
- connection point VS between the switch element XD1 and the switch element XD2, which is the output part, is connected to one end of the load L, and the other end of the load L is connected to the ground potential (GND).
- the AND circuit AND1 and the AND circuit AND2 have the same configuration. For this reason, in FIG. 2, the reference numerals of the terminals of the AND circuit AND2 corresponding to the AND circuit AND1 are shown in parentheses.
- the AND circuit AND1 (AND2) includes three P-channel MOSFET transistors PM11, PM12, PM13, one N-channel MOSFET transistor NM11, and a resistor Rt.
- the transistors PM11 and PM12 have their sources and drains connected to each other and their sources connected to the power supply line VB.
- the gate of the transistor PM11 constitutes an input connected to the output OUT1 (OUT2) of the dV / dt period detection circuit 114, and the gate of the transistor PM12 constitutes an input connected to the connection point setdrn (resdrn). .
- the drains of the transistors PM11 and PM12 are connected to the line of the high side reference potential VS via the resistor Rt.
- a connection point between the drains of the transistors PM11 and PM12 and the resistor Rt is connected to the gates of the transistors PM13 and NM11 constituting the CMOS inverter circuit.
- the source of the transistor PM13 is connected to the power supply line VB, and the source of the transistor NM11 is connected to the line of the high side reference potential VS.
- the drains of the transistors PM13 and NM11 are connected to each other and constitute an output AND1_OUT (AND2_OUT) of the AND circuit AND1 (AND2).
- a characteristic point of this AND circuit AND1 is that the load of the input transistors PM11 and PM12 is constituted by a resistor Rt. That is, in a general CMOS OR circuit, the loads of the input transistors PM11 and PM12 have two N-channel MOSFET transistors connected in series and the gates connected to the gates of the transistors PM11 and PM12, respectively. It is a configuration.
- the AND circuit AND1 (AND2) does not immediately change the logic state of the output AND1_OUT (AND2_OUT) to H level when a signal of H level is applied to two inputs at the same time. It changes to H level after a delay. This delay time is changed by adjusting the value of the resistor Rt.
- the output AND1_OUT (AND2_OUT) immediately becomes L level.
- the dV / dt period detection circuit 114 has two latch circuits LT1, LT2, a comparator COMP1, resistors R1, R2, a reference voltage Vref, and an OR circuit OR2.
- the reset input R of the latch circuit LT1 and the set input S of the latch circuit LT2 are connected to the input IN1 of the dV / dt period detection circuit 114, and the set input S of the latch circuit LT1 and the reset input R of the latch circuit LT2 are dV /
- the dt period detection circuit 114 is connected to the input IN2.
- the inverted output ZQ of the latch circuit LT1 constitutes the output OUT1 of the dV / dt period detection circuit 114
- the inverted output ZQ of the latch circuit LT2 constitutes the output OUT2 of the dV / dt period detection circuit 114.
- the clear input CLR of the latch circuits LT1 and LT2 is connected to the output of the OR circuit OR2.
- the latch circuits LT1 and LT2 are set or reset depending on whether the H level is the set input S or the reset input R. .
- the state does not change due to the response delay of the internal circuit.
- the outputs OUT1 and OUT2 of the latch circuits LT1 and LT2 are signals obtained by inverting the states of the latch circuits LT1 and LT2, respectively.
- the outputs OUT1 and OUT2 become H level, respectively.
- the non-inverting input (+) of the comparator COMP1 is connected to a connection point where one terminals of the resistor R1 and the resistor R2 are connected to each other.
- the other terminal of the resistor R1 constitutes an input IN3 of the dV / dt period detection circuit 114, and the other terminal of the resistor R2 constitutes an input IN4 of the dV / dt period detection circuit 114.
- the inverting input ( ⁇ ) of the comparator COMP1 is connected to the positive terminal of the reference voltage Vref, and the negative terminal of the reference voltage Vref is connected to the high side reference potential VS.
- the output of the comparator COMP1 is connected to one input of the OR circuit OR2, and the other input of the OR circuit OR2 constitutes the input POR of the dV / dt period detection circuit 114 that receives the power-on reset signal POR. Yes.
- the circuits of the resistors R1 and R2 connected to the non-inverting input of the comparator COMP1 are circuits that take a weighted average of the potential of the set drain signal setdrn and the potential of the reset drain signal resdrn.
- the reference voltage Vref input to the inverting input of the comparator COMP1 is a considerably high value (a value near the potential VB). For this reason, in a state where dV / dt is applied to the high-side reference potential VS, the potential of the set drain signal setdrn and the potential of the reset drain signal resdrn are always lower than the potential VB due to the potential drop of the resistance. Does not exceed the reference voltage Vref. Therefore, in a state where dV / dt is generated, the comparator COMP1 always outputs an L level signal and does not clear the latch circuits LT1 and LT2.
- the latch circuit 113 is set via the latch malfunction protection circuit 112, and the high side driver 111 drives the switch element XD1 to turn it on. .
- the high-side reference potential VS is switched from the ground potential to the high-voltage voltage E, and the potential VB of the power supply line VB of the high-side drive circuit 110 becomes the voltage (E + E1).
- the potential VB is applied to the connection points setdrn and resdrn via the level shift resistors LSR1 and LSR2.
- the parasitic capacitances Cds1 and Cds2 are charged via the set-side and reset-side impedances Z1 and Z2. Is started. At this time, even if there is a difference in the capacitance values of the parasitic capacitances Cds1 and Cds2, the transistors PM2 and PM2X are both on and the reset-side impedance Z2 is very low, so that the parasitic capacitance Cds2 is completely charged first. As a result, the potential of the connection point resdrn rises first.
- the connection point setdrn rises with a delay. That is, since the difference between the series resistance of the transistors PM1 and PM1X and the series resistance of the transistors PM2 and PM2X is very large (one of the two transistors is on and the other is off), the parasitic capacitances Cds1 and Cds2 Even if there is a difference in capacitance value, the effect is negligible. Thereby, the influence of dV / dt noise generated when the high-side switch element XD1 is turned on can be suppressed.
- FIG. 4 shows operation waveforms of the gates of the transistors PM3 and PM4, the gate of the transistor PM2X, the gate of the transistor PM1X, the high side reference potential VS, the connection point setdrn, the connection point resdrn, and the output signal HO from the top. .
- the initial value of the output of latch circuit 113 and output signal HO is L level.
- these operation waveforms change with reference to the high-side reference potential VS.
- the parasitic capacitance Cds1 has a larger capacitance value than the parasitic capacitance Cds2 (Cds1> Cds2).
- the switch elements XD1 and XD2 of the output circuit 100 are turned off before the dV / dt noise is applied, the high voltage transistors HVN1 and HVN2 are turned off, and the latch circuit 113 outputs an L level signal. ing. For this reason, since the potential VB is applied to the connection points setdrn and resdrrn via the level shift resistors LSR1 and LSR2, respectively, they are held at a high potential.
- the comparator COMP1 outputs an H level signal to clear the latch circuits LT1 and LT2, and the outputs OUT1 and OUT2 of the latch circuits LT1 and LT2 output an H level signal.
- the AND circuits AND1 and AND2 each output an H level signal because two inputs are at the H level.
- the transistors PM1X, PM2X, PM3, and PM4 are turned off because their gates are at the H level (the state before time t1 in FIG. 4).
- the transistor PM1 connected in series to the transistor PM1X is on because its gate is at the L level.
- the transistor PM2 connected in series to the transistor PM2X is turned off because its gate is at the H level by the inverter circuit INV.
- the AND circuits AND1 and AND2 output L level signals.
- the transistors PM1X and PM2X are turned on when their gates become L level.
- the transistor PM1 since the transistor PM1 is turned on and the R value of the CR circuit on the connection point setdrn side is small (the on resistance level of the transistors PM1 and PM1X), the influence of dV / dt is small.
- threshold values Vth_AND1 and Vth_AND2 of the AND circuits AND1 and AND2 are not determined by the balance between the P-channel MOSFET and the N-channel MOSFET as in the case of the CMOS configuration, but are P-channel MOSFETs constituting the AND circuits AND1 and AND2. Since it is determined only by the threshold values of the transistors PM11 and PM12, the value is close to the potential VB.
- the OR circuit OR1 When the potentials of the connection points setdrn and resdrn are further lowered with the elapse of time, and the potentials of both fall below the threshold value Vth_OR1 of the OR circuit OR1, the OR circuit OR1 outputs an L level signal. Thereby, the transistors PM3 and PM4 are turned on when their gates become L level. When the transistors PM3 and PM4 are turned on, the parasitic capacitors Cds1 and Cds2 are charged by impedances Z1 and Z2 in which the on-resistances of the transistors PM3 and PM4 are connected in parallel.
- the parasitic capacitances Cds1 and Cds2 are instantaneously charged, and the potentials of the connection points setdrn and resdrn rise.
- the OR circuit OR1 outputs an H level signal and turns off the transistors PM3 and PM4. That is, the transistors PM3 and PM4 are instantaneously turned on only immediately after the dV / dt noise is applied, and the parasitic capacitances Cds1 and Cds2 are rapidly charged.
- the latch malfunction protection circuit 112 since the potential drop on the connection point setdrn side is small and the parasitic capacitance Cds1 is charged with the low impedance Z1, the potential at the connection point setdrn increases. For this reason, since the potential at the connection point resdrn is inputted as the L level with respect to the input threshold value of the latch malfunction protection circuit 112, the latch malfunction protection circuit 112 has the H level at the connection point setdrn and the L level at the connection point resdrn. Do not block the signal. However, since the L level is on the reset side, the level shift circuit does not cause a malfunction that the output signal HO keeps the L level and is inverted to the H level.
- the outputs OUT1 and OUT2 of the latch circuits LT1 and LT2 are fixed to the H level and the L level, respectively (the output of the latch circuits LT1 and LT2 is not changed even if the output of the AND circuit AND2 subsequently becomes the H level). It does not change). Since the output OUT2 is fixed at the L level, the output of the AND circuit AND2 is also determined at the L level, and then the AND circuit even if the potential at the connection point resdrn becomes larger than the threshold value Vth_AND2 of the AND circuit AND2. The output of AND2 does not become H level, and the on state of the transistor PM1X (that is, the state where the potential VB and the connection point resdrn are connected by the on resistances of the transistors PM1 and PM1X) is continued.
- the weighted average potential at the connection points setdrn and resdrn is equal to or lower than the reference voltage Vref (a value near the potential VB).
- Vref a value near the potential VB.
- the comparator COMP1 compares the weighted average of the potentials of the connection points setdrn and resdrrn with the reference voltage Vref (near value of the potential VB), and determines that the dV / dt has ended, Output.
- This signal is supplied to the clear input CLR of the latch circuits LT1 and LT2 via the OR circuit OR2, and the latch circuits LT1 and LT2 output an H level signal to the inverted output ZQ.
- the outputs OUT1 and OUT2 of the dV / dt period detection circuit 114 become H level
- the two inputs of the AND circuits AND1 and AND2 both become H level.
- the outputs of the AND circuits AND1 and AND2 tend to change to the H level.
- the dV / dt period detection circuit 114 is provided in the level shift circuit, even if a long dV / dt noise occurs, the latch circuit 113 malfunctions until the generation of the dV / dt noise is finished.
- the prevention function can be sustained.
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Abstract
Description
図5において、ハイサイドのスイッチ素子XD1およびローサイドのスイッチ素子XD2は、直列に接続されて出力回路100を構成し、両端には高電圧の電源E(以下、その電圧もEで表す。)が接続されている。ここで、スイッチ素子XD1,XD2は、図示の例では、NチャネルのパワーMOSFET(Metal-Oxide-Semiconductor Field-Effect Transistor)を用いている。
V(t)-Vx=kCR(1-exp(-t/CR))
で表される(たとえば、特許文献1の(13)式)。この式から、レベルシフト回路の容量や抵抗値が大きいほど、また、Vxの変化が急であるほどdV/dtノイズの大きさが大きいので、寄生容量Cds1,Cds2の容量の差が大きいとそれによる影響も大きいことがわかる。したがって、寄生容量Cds1,Cds2の容量の差が大きい場合、結果的に、セット信号SETまたはリセット信号RSETが入力されたときと同様の動作をするようになり、ハーフブリッジ回路の誤動作につながる。
論理積回路AND1および論理積回路AND2は、同じ構成を有している。このため、図2では、論理積回路AND1に対応する論理積回路AND2の端子の符号は、かっこ書きで示している。論理積回路AND1(AND2)は、3つのPチャネルMOSFETのトランジスタPM11,PM12,PM13と1つのNチャネルMOSFETのトランジスタNM11と抵抗Rtとを有している。トランジスタPM11,PM12は、ソース・ドレインを互いに接続し、ソースを電源ラインVBに接続している。トランジスタPM11のゲートは、dV/dt期間検出回路114の出力OUT1(OUT2)に接続される入力を構成し、トランジスタPM12のゲートは、接続点setdrn(resdrn)に接続される入力を構成している。トランジスタPM11,PM12のドレインは、抵抗Rtを介してハイサイド基準電位VSのラインに接続されている。トランジスタPM11,PM12のドレインと抵抗Rtとの接続点は、CMOSインバータ回路を構成するトランジスタPM13,NM11のゲートに接続されている。トランジスタPM13のソースは、電源ラインVBに接続され、トランジスタNM11のソースは、ハイサイド基準電位VSのラインに接続されている。トランジスタPM13,NM11のドレインは、互いに接続され、この論理積回路AND1(AND2)の出力AND1_OUT(AND2_OUT)を構成している。
110 ハイサイド駆動回路
111 ハイサイドドライバ
112 ラッチ誤動作保護回路
113 ラッチ回路
114 dV/dt期間検出回路
120 ローサイド駆動回路
121 ローサイドドライバ
AND1,AND2 論理積回路
COMP1 比較器
Cds1,Cds2 寄生容量
D1,D2 ダイオード
HVN1,HVN2 高耐圧トランジスタ
INV インバータ回路
L 負荷
LSR1,LSR2 レベルシフト抵抗
LT1,LT2 ラッチ回路
OR1,OR2 論理和回路
PM1,PM1X,PM2,PM2X,PM11,PM12,PM13,NM11,PM3,PM4 トランジスタ
R1,R2,Rt 抵抗
VB ハイサイド電源ラインの電位
VS ハイサイド基準電位
Vref 基準電圧
XD1,XD2 スイッチ素子
setdrn,resdrn 接続点
Claims (4)
- ローサイドの接地電位を基準に生成された信号をレベルシフトしてハイサイドのスイッチ素子を駆動する回路に伝達するレベルシフト回路であって、
前記ハイサイドの高電圧側電源ラインと前記接地電位との間に接続された第1の抵抗と第1のトランジスタとの第1の直列回路と、
前記ハイサイドの高電圧側電源ラインと前記接地電位との間に接続された第2の抵抗と第2のトランジスタとの第2の直列回路と、
前記第1の抵抗と前記第1のトランジスタとの第1の接続点の信号および前記第2の抵抗と前記第2のトランジスタとの第2の接続点の信号を入力するラッチ誤動作保護回路と、
前記ラッチ誤動作保護回路の出力が入力されるラッチ回路と、
直列に接続されて前記第1の抵抗に並列に接続された第3のトランジスタおよび第4のトランジスタと、
直列に接続されて前記第2の抵抗に並列に接続された第5のトランジスタおよび第6のトランジスタと、
前記第1の接続点の信号および前記第2の接続点の信号を入力して前記ハイサイドの基準電位ラインにおけるdV/dtノイズの発生を検出するdV/dt期間検出回路と、
前記dV/dt期間検出回路の第1の出力と前記第1の接続点の信号とを入力し、前記第6のトランジスタを制御する第1の論理積回路と、
前記dV/dt期間検出回路の第2の出力と前記第2の接続点の信号とを入力し、前記第4のトランジスタを制御する第2の論理積回路と、
を備え、
前記第3のトランジスタが前記ラッチ回路の出力信号によって制御されると共に、前記第5のトランジスタが前記ラッチ回路の出力信号を論理反転した信号によって制御される、レベルシフト回路。 - 前記第1の抵抗に並列に接続された第7のトランジスタと、前記第2の抵抗に並列に接続された第8のトランジスタと、前記第1の接続点の信号および前記第2の接続点の信号を入力して前記第1の接続点の信号および前記第2の接続点の信号が共に入力閾値を低下したときだけ前記第7のトランジスタおよび前記第8のトランジスタをオン制御する論理和回路と、をさらに備えた、請求項1記載のレベルシフト回路。
- 前記dV/dt期間検出回路は、前記第1の論理積回路の出力をリセット入力に受け、前記第2の論理積回路の出力をセット入力に受け、反転出力を前記第1の出力とした第1のラッチ回路と、前記第2の論理積回路の出力をリセット入力に受け、前記第1の論理積回路の出力をセット入力に受け、反転出力を前記第2の出力とした第2のラッチ回路と、第1の入力に前記第1の接続点の信号を第3の抵抗を介して受けると共に前記第2の接続点の信号を第4の抵抗を介して受け、第2の入力には、前記ハイサイドの高電圧側電源ラインの電位の近傍値を有する基準電源が接続され、前記第1の接続点の信号および前記第2の接続点の信号の加重平均値が前記基準電源の電位を超えると前記第1のラッチ回路および前記第2のラッチ回路をクリアする比較器とを有する、請求項1記載のレベルシフト回路。
- 前記第1の論理積回路は、ソースが前記ハイサイドの高電圧側電源ラインに接続され、ゲートに前記dV/dt期間検出回路の前記第1の出力を受けて制御される第1のPチャネルトランジスタと、ソースが前記ハイサイドの高電圧側電源ラインに接続され、ゲートに前記第1の接続点の信号を受けて制御される第2のPチャネルトランジスタと、前記第1のPチャネルトランジスタおよび前記第2のPチャネルトランジスタのドレインと前記ハイサイドの基準電位ラインとの間に接続された第1の遅延時間調整用抵抗と、ソースが前記ハイサイドの高電圧側電源ラインに接続され、ゲートが前記第1のPチャネルトランジスタおよび前記第2のPチャネルトランジスタのドレインと前記第1の遅延時間調整用抵抗との接続点に接続される第3のPチャネルトランジスタと、ソースが前記ハイサイドの基準電位ラインに接続され、ゲートが前記第3のPチャネルトランジスタのゲートに接続され、ドレインが前記第3のPチャネルトランジスタのドレインに接続されると共に前記第6のトランジスタのゲートと前記第1のラッチ回路のリセット入力および前記第2のラッチ回路のセット入力とに接続される第1のNチャネルトランジスタとを有し、
前記第2の論理積回路は、ソースが前記ハイサイドの高電圧側電源ラインに接続され、ゲートに前記dV/dt期間検出回路の前記第2の出力の信号を受けて制御される第4のPチャネルトランジスタと、ソースが前記ハイサイドの高電圧側電源ラインに接続され、ゲートに前記第2の接続点の信号を受けて制御される第5のPチャネルトランジスタと、前記第4のPチャネルトランジスタおよび前記第5のPチャネルトランジスタのドレインと前記ハイサイドの基準電位ラインとの間に接続された第2の遅延時間調整用抵抗と、ソースが前記ハイサイドの高電圧側電源ラインに接続され、ゲートが前記第4のPチャネルトランジスタおよび前記第5のPチャネルトランジスタのドレインと前記第2の遅延時間調整用抵抗との接続点に接続される第6のPチャネルトランジスタと、ソースが前記ハイサイドの基準電位ラインに接続され、ゲートが前記第6のPチャネルトランジスタのゲートに接続され、ドレインが前記第6のPチャネルトランジスタのドレインに接続されると共に前記第4のトランジスタのゲートと前記第1のラッチ回路のセット入力および前記第2のラッチ回路のリセット入力とに接続される第2のNチャネルトランジスタとを有している、請求項3記載のレベルシフト回路。
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US11476847B2 (en) | 2020-12-15 | 2022-10-18 | Mitsubishi Electric Corporation | Semiconductor device drive circuit |
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JP7246897B2 (ja) * | 2018-11-14 | 2023-03-28 | ローム株式会社 | 半導体集積回路、ハイサイドトランジスタの駆動回路、dc/dcコンバータのコントローラ |
US10659038B1 (en) * | 2019-03-12 | 2020-05-19 | Nxp Usa, Inc. | Power on reset latch circuit |
KR20230048932A (ko) * | 2021-10-05 | 2023-04-12 | 주식회사 엘엑스세미콘 | 레벨 쉬프터, 레벨 쉬프터의 구동 방법, 레벨 쉬프터를 포함하는 게이트 드라이버, 및 게이트 드라이버의 구동 방법 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003273715A (ja) * | 2002-03-19 | 2003-09-26 | Mitsubishi Electric Corp | パワーデバイスの駆動回路 |
JP2012075267A (ja) * | 2010-09-29 | 2012-04-12 | Mitsubishi Electric Corp | スイッチング素子の駆動回路 |
WO2012070174A1 (ja) * | 2010-11-25 | 2012-05-31 | 富士電機株式会社 | 半導体基板中の抵抗を利用するレベルシフト回路 |
JP2013179501A (ja) * | 2012-02-28 | 2013-09-09 | Fuji Electric Co Ltd | 半導体装置およびハイサイド回路の駆動方法 |
JP2013219714A (ja) * | 2012-04-12 | 2013-10-24 | Fuji Electric Co Ltd | 半導体基板中の寄生抵抗を利用するレベルシフト回路 |
Family Cites Families (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5354417A (en) | 1976-10-28 | 1978-05-17 | Toshiba Corp | Key input device |
JPS542852A (en) | 1977-06-08 | 1979-01-10 | Akira Washida | Tooth brush |
KR101058937B1 (ko) * | 2004-07-13 | 2011-08-23 | 페어차일드코리아반도체 주식회사 | 레벨 쉬프트 회로 및 이의 오동작 방지 방법 |
CN1744439B (zh) * | 2004-09-01 | 2010-04-21 | 冲电气工业株式会社 | 电平移位器电路、显示装置及其驱动电路和应力测试方法 |
JP3915815B2 (ja) * | 2005-03-23 | 2007-05-16 | サンケン電気株式会社 | レベルシフト回路および電源装置 |
JP5326927B2 (ja) * | 2009-08-19 | 2013-10-30 | 富士電機株式会社 | レベルシフト回路 |
JP5402852B2 (ja) | 2009-12-04 | 2014-01-29 | 富士電機株式会社 | レベルシフト回路 |
US8405422B2 (en) | 2010-09-30 | 2013-03-26 | Fuji Electric Co., Ltd. | Level shift circuit |
JP5936564B2 (ja) | 2013-02-18 | 2016-06-22 | 三菱電機株式会社 | 駆動回路 |
JP6194959B2 (ja) * | 2013-09-27 | 2017-09-13 | 富士電機株式会社 | 駆動回路および半導体装置 |
-
2017
- 2017-01-26 DE DE112017000080.7T patent/DE112017000080T5/de active Pending
- 2017-01-26 WO PCT/JP2017/002667 patent/WO2017159058A1/ja active Application Filing
- 2017-01-26 CN CN201780002854.5A patent/CN107925409B/zh active Active
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-
2018
- 2018-03-01 US US15/909,955 patent/US10063226B2/en active Active
-
2019
- 2019-07-31 JP JP2019140776A patent/JP6819739B2/ja active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003273715A (ja) * | 2002-03-19 | 2003-09-26 | Mitsubishi Electric Corp | パワーデバイスの駆動回路 |
JP2012075267A (ja) * | 2010-09-29 | 2012-04-12 | Mitsubishi Electric Corp | スイッチング素子の駆動回路 |
WO2012070174A1 (ja) * | 2010-11-25 | 2012-05-31 | 富士電機株式会社 | 半導体基板中の抵抗を利用するレベルシフト回路 |
JP2013179501A (ja) * | 2012-02-28 | 2013-09-09 | Fuji Electric Co Ltd | 半導体装置およびハイサイド回路の駆動方法 |
JP2013219714A (ja) * | 2012-04-12 | 2013-10-24 | Fuji Electric Co Ltd | 半導体基板中の寄生抵抗を利用するレベルシフト回路 |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2019197959A (ja) * | 2018-05-07 | 2019-11-14 | 新日本無線株式会社 | レベル変換回路 |
JP7166072B2 (ja) | 2018-05-07 | 2022-11-07 | 日清紡マイクロデバイス株式会社 | レベル変換回路 |
US11476847B2 (en) | 2020-12-15 | 2022-10-18 | Mitsubishi Electric Corporation | Semiconductor device drive circuit |
JP7438091B2 (ja) | 2020-12-15 | 2024-02-26 | 三菱電機株式会社 | 半導体デバイス駆動回路 |
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