WO2016174893A1 - 光学フィルムの製造方法、及び、光学フィルム - Google Patents
光学フィルムの製造方法、及び、光学フィルム Download PDFInfo
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- WO2016174893A1 WO2016174893A1 PCT/JP2016/053985 JP2016053985W WO2016174893A1 WO 2016174893 A1 WO2016174893 A1 WO 2016174893A1 JP 2016053985 W JP2016053985 W JP 2016053985W WO 2016174893 A1 WO2016174893 A1 WO 2016174893A1
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- WIPO (PCT)
- Prior art keywords
- layer resin
- optical film
- resin
- fluorine
- upper layer
- Prior art date
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- C—CHEMISTRY; METALLURGY
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- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
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Definitions
- the present invention relates to a method for producing an optical film and an optical film. More specifically, the present invention relates to a method for producing an optical film having a nanometer-sized uneven structure and an optical film produced by the method for producing an optical film.
- an optical film having a nanometer-sized uneven structure is used as an antireflection film.
- an optical film having a nanometer-sized uneven structure is used as an antireflection film.
- the refractive index continuously changes from the air layer to the base film, the reflected light can be dramatically reduced.
- the attached dirt tends to spread, and further, convex
- the attached dirt is easily visually recognized because its reflectance is significantly different from that of the optical film.
- the conventional optical film has insufficient antifouling property and has room for improvement. Further, when wiping off dirt or the like adhering to the surface, the fluorine-based material used for enhancing the antifouling property can be easily removed, and there is room for improvement in terms of enhancing the scratch resistance.
- Patent Document 1 discloses a configuration in which a water-repellent film made of polytetrafluoroethylene is formed on the surface of an uneven structure.
- the adhesion between the concavo-convex structure and the film made of polytetrafluoroethylene is weak, so that it is easy to peel off.
- membrane which consists of polytetrafluoroethylene is thin, intensity
- the said patent document 2 is disclosing the method of forming an uneven structure by supplying the photocurable resin composition containing a fluorine compound between a base film and a metal mold, rolling, and making it harden
- concentration of the fluorine compound on the surface of the concavo-convex structure is not sufficient, the oil repellency is insufficient. Therefore, there was room for improvement in terms of enhancing the antifouling property.
- Patent Document 3 discloses a configuration in which a lubricating layer made of a fluorine-based lubricant containing a perfluoroalkyl polyether carboxylic acid is formed on the surface of an uneven structure.
- a lubricating layer made of a fluorine-based lubricant containing a perfluoroalkyl polyether carboxylic acid is formed on the surface of an uneven structure.
- the present invention has been made in view of the above-mentioned present situation, and provides an optical film manufacturing method and an optical film that have excellent antireflection properties and excellent antifouling properties and scratch resistance. It is the purpose.
- the inventors of the present invention have studied various methods for producing an optical film having excellent antireflection properties and excellent antifouling properties and scratch resistance, and applied a lower layer resin and an upper layer resin, and the two layers are In the laminated state, the mold was pressed against two layers to form a resin layer having a nanometer-sized uneven structure on the surface, and then attention was paid to a method of curing the resin layer.
- the monomer component of the upper layer resin contains a fluorine-containing monomer, and at least one monomer component of the lower layer resin and the upper layer resin contains a compatible monomer that is compatible with the fluorine-containing monomer, and is dissolved in the lower layer resin and the upper layer resin.
- one embodiment of the present invention is a method for producing an optical film having a concavo-convex structure having a plurality of convex portions provided at a pitch equal to or less than the wavelength of visible light on the surface, and a step of applying a lower layer resin and an upper layer resin ( 1) With the applied lower layer resin and the upper layer resin laminated, a mold is pressed against the lower layer resin and the upper layer resin from the upper layer resin side to form a resin layer having the uneven structure on the surface And the step (3) of curing the resin layer, the lower layer resin includes at least one first monomer not containing a fluorine atom, and the upper layer resin contains a fluorine atom.
- At least one second monomer and a fluorine-containing monomer Not containing at least one second monomer and a fluorine-containing monomer, wherein at least one of the first monomer and the second monomer is compatible with the fluorine-containing monomer.
- monomers and may be a method for producing an optical film that dissolves in the lower layer resin and the upper layer resin.
- Another embodiment of the present invention may be an optical film manufactured by the above-described optical film manufacturing method.
- Another aspect of the present invention is an optical film including a cured resin layer having a concavo-convex structure on the surface, wherein the concavo-convex structure is provided with a plurality of convex portions at a pitch equal to or less than the wavelength of visible light.
- the cured resin layer contains carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms as constituent atoms, under the conditions of an X-ray beam diameter of 100 ⁇ m, an analysis area of 1000 ⁇ m ⁇ 500 ⁇ m, and a photoelectron extraction angle of 45 °.
- the number of carbon atoms on the surface of the concavo-convex structure, the number of nitrogen atoms, the number of oxygen atoms, and the total number of fluorine atoms measured by X-ray photoelectron spectroscopy may be an optical film of 33 atom% or more.
- Another aspect of the present invention is an optical film including a cured resin layer having a concavo-convex structure on the surface, wherein the concavo-convex structure is provided with a plurality of convex portions at a pitch equal to or less than the wavelength of visible light.
- the cured resin layer contains carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms as constituent atoms, under the conditions of an X-ray beam diameter of 100 ⁇ m, an analysis area of 1000 ⁇ m ⁇ 500 ⁇ m, and a photoelectron extraction angle of 45 °.
- Curve fitting with a peak derived from a C—O bond, a peak derived from a C ⁇ O bond, and a peak derived from an OCF 2 bond with respect to the O1s peak on the surface of the concavo-convex structure measured by X-ray photoelectron spectroscopy of in the spectrum obtained by the peak surface from said OCF 2 binding to the sum of the peak areas derived from the peak area and the C O bond derived from the C-O bond
- the ratio may be an optical film is 0.3 or more.
- Another aspect of the present invention is an optical film including a cured resin layer having a concavo-convex structure on the surface, wherein the concavo-convex structure is provided with a plurality of convex portions at a pitch equal to or less than the wavelength of visible light.
- the cured resin layer contains carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms as constituent atoms, under the conditions of an X-ray beam diameter of 100 ⁇ m, an analysis area of 1000 ⁇ m ⁇ 500 ⁇ m, and a photoelectron extraction angle of 45 °.
- the number of carbon atoms on the surface of the concavo-convex structure, the number of nitrogen atoms, the number of oxygen atoms, and the total number of fluorine atoms measured by X-ray photoelectron spectroscopy the number of ratios MF S (unit: the atom%) and defined, D in polyhydroxystyrene converted in the depth direction from the surface of the uneven structure (unit: nm) the carbon raw at distant positions
- the number of the number of the nitrogen atom, the number of the oxygen atoms and the number ratio of MF D (unit: the atom%) of the fluorine atoms to the total number of the number of the fluorine atoms when a defined, MF D / MF When S 0.3, D may be an optical film of 240 nm or more.
- the manufacturing method of an optical film excellent in antifouling property and abrasion resistance, and an optical film can be provided, having excellent antireflection properties.
- FIG. 3 is a schematic cross-sectional view illustrating the manufacturing process of the optical film of Embodiment 1 (steps a to d).
- FIG. 10 is a schematic cross-sectional view illustrating a manufacturing process of the optical film of Embodiment 2 (steps a to c). It is a cross-sectional schematic diagram explaining the manufacturing process of the optical film of Embodiment 3 (process ac).
- FIG. 6 is a schematic cross-sectional view illustrating a manufacturing process of the optical film of Comparative Example 1 (steps a to d). It is a cross-sectional schematic diagram explaining the manufacturing process of the optical film of the comparative example 3 (process ac). 10 is a graph showing a measurement result of reflectance in Example 7.
- FIG. 6 is a graph showing a survey spectrum of the surface of optical films of Investigation Examples 1 to 4. It is a graph which shows the relationship between the thickness of upper layer resin, and a contact angle. It is a graph showing the relationship between the thickness of the upper resin and the ratio of the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms to the total number of fluorine atoms on the surface of the concavo-convex structure . It is a graph showing the narrow spectrum of the surface of the optical film of Study Examples 1-4, (a) shows the C1s peak, (b) shows the N1s peak, (c) shows the O1s peak, (d) is F1s peak is shown.
- the thickness of the upper layer resin, the C1s peak is a graph showing the relationship between the ratio of the peak area derived from CF 2 bonds to the peak area derived from binding species other than CF 2 bond.
- the thickness of the upper layer resin, the C1s peak is a graph showing the relationship between the CF 3 bonds and the ratio of the peak area derived from CF 3 bond and OCF 2 binding to the peak area derived from binding species other than OCF 2 binding.
- the thickness of the upper layer resin, the O1s peak is a graph showing the relationship between the ratio of the peak area derived from OCF 2 binding to the peak area derived from binding species other than OCF 2 binding. It is a graph which shows the ratio of the number of each atom with respect to the total number of the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms in the cured resin layer of the optical film of examination example 1.
- 6 is a graph showing the distribution state of fluorine atoms in the cured resin layers of the optical films of Investigation Examples 1 to 4.
- 6 is a graph showing the distribution state of CF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- 6 is a graph showing a distribution state of CF 3 bonds and OCF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- 6 is a graph showing the distribution state of OCF 2 bonds in the cured resin layers of the optical films of Investigation Examples 1 to 4.
- 6 is a graph showing the abundance ratio of carbon atoms derived from CF 2 bonds in the cured resin layers of the optical films of Investigation Examples 1 to 4.
- the graph which shows the ratio of the number of atoms derived from each bond type with respect to the total number of the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms in the cured resin layer of the optical film of Study Example 4.
- It is. 25 is a graph illustrating M1 T and M1 ST of Study Example 4 in FIG. 24.
- FIG. 6 is a graph showing the abundance ratio of carbon atoms derived from CF 3 bonds and OCF 2 bonds in the cured resin layers of the optical films of Investigation Examples 1 to 4.
- 28 is a graph illustrating M2 T and M2 ST of Study Example 4 in FIG. 5 is a graph showing the abundance ratio of oxygen atoms derived from OCF 2 bonds in the cured resin layers of the optical films of Investigation Examples 1 to 4.
- 30 is a graph illustrating M3 T and M3 ST of Study Example 4 in FIG. 29.
- FIG. 1 is a schematic cross-sectional view illustrating the manufacturing process of the optical film of Embodiment 1 (steps a to d).
- steps a to d the manufacturing process of the optical film of Embodiment 1
- FIG. 1 the manufacturing method of the optical film of Embodiment 1 is explained in full detail.
- the lower layer resin 3 is applied on the base film 2 as shown in FIG.
- the coating method of the lower layer resin 3 is not particularly limited, and examples thereof include a method of coating by a gravure method, a slot die method, or the like.
- an upper layer resin 4 is applied on the applied lower layer resin 3.
- the upper layer resin 4 is formed on the side opposite to the base film 2 of the lower layer resin 3.
- the method for applying the upper layer resin 4 is not particularly limited, and examples thereof include a method of applying by a spray method, a gravure method, a slot die method, or the like. From the viewpoint of easily adjusting the film thickness and reducing the cost of the apparatus, it is preferable to employ a spray method. Among these, application using a swirl nozzle, an electrostatic nozzle, or an ultrasonic nozzle is particularly preferable.
- (C) Formation of concavo-convex structure As shown in FIG. 1C, in a state where the applied lower layer resin 3 and upper layer resin 4 are laminated, a mold 5 is attached to the lower layer resin 3 and the upper layer resin 4.
- the resin layer 8 having a concavo-convex structure on the surface is formed by pressing from the upper resin 4 side.
- the resin layer 8 is one in which the lower layer resin 3 and the upper layer resin 4 are integrated and there is no interface between them.
- the concavo-convex structure formed on the resin layer 8 is a structure in which a plurality of convex portions (projections) 6 are provided with a pitch P (distance between vertices of adjacent convex portions 6) P equal to or less than the wavelength of visible light, that is, a moth-eye structure. Corresponds to (an eyelet-like structure).
- the resin layer 8 on which the cured uneven structure of the resin layer is formed is cured.
- the method for curing the resin layer 8 is not particularly limited, and examples thereof include light, heat, combined use of light and heat, and the like, and ultraviolet light is preferable.
- count of light irradiation with respect to the resin layer 8 is not specifically limited, Only once may be sufficient and multiple times may be sufficient. Moreover, light irradiation may be performed from the base film 2 side, and may be performed from the resin layer 8 side.
- the steps (a) to (d) can be performed continuously and efficiently.
- the material of the base film 2 examples include triacetyl cellulose (TAC) (solubility parameter: 12.2 (cal / cm 3 ) 1/2 ), polyethylene terephthalate (PET) (solubility parameter: 10.7 (cal / cm 3 ) 1/2 ), polymethyl methacrylate (PMMA) (solubility parameter: 9.06 (cal / cm 3 ) 1/2 ), cycloolefin polymer (COP) (solubility parameter: 7.4 (cal / cm 3) ) 1/2 ), polycarbonate (PC) and the like, and may be selected according to the use environment. According to such a material, the base film 2 having high hardness and excellent transparency and weather resistance can be obtained.
- TAC triacetyl cellulose
- PET polyethylene terephthalate
- PMMA polymethyl methacrylate
- COP cycloolefin polymer
- PC polycarbonate
- the base film 2 may be subjected to an easy adhesion treatment, and for example, a TAC film (solubility parameter: 11 (cal / cm 3 ) 1/2 ) subjected to the easy adhesion treatment can be used. .
- the base film 2 may be subjected to saponification treatment.
- a TAC film solubility parameter: 16.7 (cal / cm 3 ) 1/2 ) subjected to saponification treatment is used. Can do.
- the thickness of the base film 2 is not particularly limited, it is preferably 10 ⁇ m or more and 120 ⁇ m or less, and more preferably 40 ⁇ m or more and 80 ⁇ m or less from the viewpoint of ensuring transparency and workability.
- the lower layer resin 3 includes at least one first monomer that does not contain a fluorine atom.
- the first monomer include acrylate monomers such as urethane acrylate, polyfunctional acrylate, and monofunctional acrylate, and a mixture of two or more acrylate monomers (photocurable resin) is preferably used. it can. According to such a material, the lower layer resin 3 having a refractive index suitable for combination with the base film 2 and excellent in transparency, flexibility, and weather resistance can be obtained.
- urethane acrylate for example, urethane acrylate manufactured by Shin-Nakamura Chemical Co., Ltd. (product name: UA-7100, solubility parameter: 10.2 (cal / cm 3 ) 1/2 , molecular weight: 1700, surface tension: 85.2 dyn ), Urethane acrylate manufactured by Shin-Nakamura Chemical Co., Ltd.
- polyfunctional acrylate for example, a polyfunctional acrylate manufactured by Shin-Nakamura Chemical Co., Ltd. (product name: ATM-35E, solubility parameter: 9.6 (cal / cm 3 ) 1/2 , molecular weight: 1892, surface tension: 76 .8 dyn / cm), polyfunctional acrylate manufactured by Shin-Nakamura Chemical Co., Ltd.
- Examples of the monofunctional acrylate include an amide group-containing monomer (product name: ACMO (registered trademark), solubility parameter: 12.0 (cal / cm 3 ) 1/2 , molecular weight: 141, surface tension: manufactured by KJ Chemicals.
- hydroxyl group-containing monomer product name: CHDMMA, solubility parameter: 11.6 (cal / cm 3 1/2, molecular weight: 198, surface tension: 43.5dyn / cm), manufactured by Nippon Kasei Chemical Co., Ltd. of the hydroxyl group-containing monomer (product name: 4HBA, solubility parameter: 11.6 (cal / cm 3) 1/2, the molecular weight: 144, surface tension: 36.3 dyn / cm), acetoacetoxy group-containing monomer (product name: AAEM, solubility parameter: 10.6 (cal / cm 3 ) 1/2 , molecular weight: 214, surface, manufactured by Nippon Synthetic Chemical Co., Ltd. Tension: 39.5 dyn / cm).
- the solubility parameter is calculated by the Fedors' estimation method described in Non-Patent Documents 1 and 2 above, which is estimated from the molecular structure.
- the surface tension is measured using a penetration rate method.
- l indicates the penetration depth of water
- t indicates time
- r indicates the capillary radius of the filled object
- ⁇ indicates the surface tension
- ⁇ indicates the viscosity of water
- ⁇ Indicates a contact angle. The smaller the surface tension, the greater the contact angle, indicating higher water repellency.
- the lower layer resin 3 may further contain a polymerization initiator.
- the polymerization initiator include a photopolymerization initiator.
- the photopolymerization initiator is a compound that is active with respect to active energy rays and is added to initiate a polymerization reaction for polymerizing monomers.
- a radical polymerization initiator, an anionic polymerization initiator, a cationic polymerization initiator and the like can be used.
- photopolymerization initiators examples include acetophenones such as p-tert-butyltrichloroacetophenone, 2,2′-diethoxyacetophenone, 2-hydroxy-2-methyl-1-phenylpropan-1-one; Ketones such as benzophenone, 4,4′-bisdimethylaminobenzophenone, 2-chlorothioxanthone, 2-methylthioxanthone, 2-ethylthioxanthone, 2-isopropylthioxanthone; benzoin, benzoin methyl ether, benzoin isopropyl ether, benzoin isobutyl ether, etc.
- acetophenones such as p-tert-butyltrichloroacetophenone, 2,2′-diethoxyacetophenone, 2-hydroxy-2-methyl-1-phenylpropan-1-one
- Ketones such as benzophenone, 4,4′-bisdimethylaminobenzophenone, 2-
- Benzyl ketals such as benzyl dimethyl ketal and hydroxycyclohexyl phenyl ketone.
- Known photopolymerization initiators include a photopolymerization initiator (product name: IRGACURE (registered trademark) 819) manufactured by BASF.
- the thickness D L (after application) of the lower layer resin 3 is not particularly limited, but is preferably 3 ⁇ m or more and 30 ⁇ m or less, and more preferably 5 ⁇ m or more and 7 ⁇ m or less.
- the viscosity of the lower layer resin 3 is preferably greater than 10 cp and less than 10000 cp at 25 ° C.
- the viscosity of the lower layer resin 3 at 25 ° C. is larger than 10 cp, the fluorine-containing monomer contained in the upper layer resin 4 is mixed in the lower layer resin 3 in a state where the lower layer resin 3 and the upper layer resin 4 are laminated. It can prevent suitably that the density
- the viscosity of the lower layer resin 3 at 25 ° C. is less than 10,000 cp, the applicability of the lower layer resin 3 can be suitably improved.
- the viscosity is measured using a TV25 viscometer (product name: TVE-25L) manufactured by Toki Sangyo Co., Ltd.
- the upper layer resin 4 contains a fluorine-containing monomer. According to the fluorine-containing monomer, the surface free energy of the optical film 1 can be lowered, and the optical film 1 having excellent antifouling properties can be obtained by combining with the moth-eye structure.
- the fluorine-containing monomer includes a site including at least one selected from the group consisting of a fluoroalkyl group, a fluorooxyalkyl group, a fluoroalkenyl group, a fluoroalkanediyl group, and a fluorooxyalkanediyl group, and a reactive site. It is preferable to have.
- a fluoroalkyl group, a fluorooxyalkyl group, a fluoroalkenyl group, a fluoroalkanediyl group, and a fluorooxyalkanediyl group are respectively an alkyl group, an oxyalkyl group, an alkenyl group, an alkanediyl group, and an oxyalkanediyl group. It is a substituent in which at least part of the hydrogen atoms it has are substituted with fluorine atoms.
- a fluoroalkyl group, a fluorooxyalkyl group, a fluoroalkenyl group, a fluoroalkanediyl group, and a fluorooxyalkanediyl group are all substituents mainly composed of fluorine atoms and carbon atoms, and are branched in the structure. May be present, and a plurality of these substituents may be linked.
- the reactive site refers to a site that reacts with other components by external energy such as light and heat.
- Examples of such reactive sites include alkoxysilyl groups, silyl ether groups, hydrolyzed silanol groups, carboxyl groups, hydroxyl groups, epoxy groups, vinyl groups, allyl groups, acryloyl groups, methacryloyl groups, and the like. It is done.
- the reactive site is preferably an alkoxysilyl group, a silyl ether group, a silanol group, an epoxy group, a vinyl group, an allyl group, an acryloyl group, or a methacryloyl group from the viewpoint of reactivity and handling properties, and a vinyl group or an allyl group.
- An acryloyl group or a methacryloyl group is more preferable, and an acryloyl group or a methacryloyl group is particularly preferable.
- R f1 is a moiety containing at least one selected from the group consisting of a fluoroalkyl group, a fluorooxyalkyl group, a fluoroalkenyl group, a fluoroalkanediyl group, and a fluorooxyalkanediyl group.
- R 2 represents an alkanediyl group, an alkanetriyl group, or an ester structure, urethane structure, ether structure, or triazine structure derived therefrom.
- D 1 represents a reactive site.
- Examples of the monomer represented by the general formula (A) include 2,2,2-trifluoroethyl acrylate, 2,2,3,3,3-pentafluoropropyl acrylate, and 2-perfluorobutylethyl acrylate.
- the fluoropolyether moiety is a moiety composed of a fluoroalkyl group, an oxyfluoroalkyl group, an oxyfluoroalkyldiyl group, etc., and has a structure represented by the following general formula (B) or (C).
- n1 is an integer of 1 to 3
- n2 to n5 are 1 or 2
- k, m, p, and s are integers of 0 or more.
- a preferable combination of n1 to n5 is a combination in which n1 is 2 or 3, and n2 to n5 is 1 or 2, and a more preferable combination is n1 is 3, n2 and n4 are 2, and n3 and n5 are 1 or 2. 2 is a combination.
- the number of carbon atoms contained in the fluoropolyether moiety is preferably 4 or more and 12 or less, more preferably 4 or more and 10 or less, and still more preferably 6 or more and 8 or less.
- the fluorine-containing monomer may have a plurality of fluoropolyether sites per molecule.
- Known fluorine-containing monomers include, for example, a fluorine-based additive (product name: OPTOOL DAC-HP, solubility parameter: 9.7 (cal / cm 3 ) 1/2 ) manufactured by Daikin Industries, Ltd., Daikin Industries Fluorine additive (product name: Optool DSX) manufactured by Asahi Glass Co., Ltd.
- a fluorine-based additive product name: OPTOOL DAC-HP, solubility parameter: 9.7 (cal / cm 3 ) 1/2
- Daikin Industries Fluorine additive product name: Optool DSX manufactured by Asahi Glass Co., Ltd.
- Fluorine additive product name: Afluid, solubility parameter: 9 to 11 (cal / cm 3 ) 1/2 , surface tension: 11 dyn / cm
- a fluoric additive manufactured by DIC product name: Mega-Fac (registered trademark) RS-76-NS
- a fluoric additive manufactured by DIC product name: Mega-Fac RS-75
- oil products company Fluorine-based additive product name: C10GACRY) manufactured by Oji Oil Co., Ltd.
- fluorine-based additive product name: C8HGOL manufactured by Yushi Co., Ltd. are listed.
- the fluorine-containing monomer may also be contained in the lower layer resin 3.
- the concentration of the fluorine-containing monomer in the upper layer resin 4 is preferably higher than the concentration of the fluorine-containing monomer in the lower layer resin 3. It is particularly preferable that the lower layer resin 3 does not contain a fluorine-containing monomer.
- the concentration of the fluorine-containing monomer in the upper layer resin 4 is preferably greater than 0% by weight and less than 20% by weight. When the concentration of the fluorine-containing monomer is less than 20% by weight, it is possible to suitably prevent the occurrence of white turbidity due to the large amount of the fluorine-containing monomer.
- the upper layer resin 4 includes at least one second monomer that does not contain a fluorine atom.
- second monomer examples include an amide group-containing monomer (product name: ACMO) manufactured by KJ Chemicals, an amide group-containing monomer (product name: HEAA) manufactured by KJ Chemicals, and an amide manufactured by KJ Chemicals.
- Group-containing monomer product name: DEAA
- Nippon Kasei's hydroxyl group-containing monomer product name: CHDMMA
- Nippon Kasei's hydroxyl group-containing monomer product name: 4HBA
- Nippon Synthetic Chemical Co., Ltd. containing acetoacetoxy group A monomer product name: AAEM
- the thickness D U (after application) of the upper layer resin 4 is not particularly limited, but is preferably 0.1 ⁇ m or more and 15 ⁇ m or less, more preferably 1 ⁇ m or more and 10 ⁇ m or less, and 2 ⁇ m or more and 8 ⁇ m or less. Is more preferably 5 ⁇ m or more and 8 ⁇ m or less.
- a fluorosurfactant having a low surface tension for example, a fluorosurfactant manufactured by AGC Seimi Chemical Co., Ltd.
- a fluorine-based solvent for example, a fluorine-based solvent (product name: diluent ZV) manufactured by Fluoro Technology) may be further added to the upper layer resin 4.
- the viscosity of the upper layer resin 4 is preferably greater than 0.1 cp and less than 100 cp at 25 ° C.
- the viscosity of the upper resin 4 at 25 ° C. is less than 100 cp, the fluidity of the fluorine-containing monomer contained in the upper resin 4 can be suitably ensured, and the applicability of the upper resin 4 can be suitably improved.
- the viscosity of the upper resin 4 at 25 ° C. is larger than 0.1 cp, the applicability of the upper resin 4 can be suitably improved, and the thickness of the upper resin 4 can be easily controlled.
- the upper layer resin 4 is preferably a solventless resin.
- the upper layer resin 4 is preferably a solventless resin.
- an apparatus for drying and removing the solvent is unnecessary, and the apparatus cost can be reduced. Further, since no solvent is used, the cost can be reduced and productivity can be increased.
- the fluorine-containing monomer is excessively mixed, and there is a concern that the concentration of the fluorine atoms 7 near the surface of the optical film 1 is lowered. Moreover, since volatility becomes high, there exists a possibility that applicability
- At least one of the first monomer and the second monomer contains a compatible monomer that is compatible with the fluorine-containing monomer, and is dissolved in the lower layer resin 3 and the upper layer resin 4.
- a fluorine-containing monomer collects in the surface vicinity of the optical film 1 ensuring the compatibility with a compatible monomer, the density
- the monomer composition is continuously mixed after being instantaneously mixed and polymerized at these interfaces. It is important to realize a state where the interface does not exist by changing.
- the compatible monomer is added for the purpose of improving the compatibility between the lower layer resin 3 and the upper layer resin 4. Thereby, the optical film 1 excellent in scratch resistance can be obtained.
- a reactive dilution monomer for a photocurable resin can be suitably used.
- the reactive dilution monomer include an amide group-containing monomer (product name: ACMO) manufactured by KJ Chemicals, an amide group-containing monomer (product name: HEAA) manufactured by KJ Chemicals, and an amide group-containing monomer manufactured by KJ Chemicals.
- DEAA Nippon Kasei Co., Ltd. hydroxyl group-containing monomer
- CHDMMA Nippon Kasei Co., Ltd. hydroxyl group-containing monomer
- 4HBA Nippon Synthetic Chemical Co., Ltd.
- acetoacetoxy group-containing monomer (Product) Name: AAEM).
- the fluorine-containing monomer can be suitably dissolved.
- the base film 2 for example, TAC film
- the adhesiveness of the base film 2 and the lower layer resin 3 can be improved suitably.
- the compatible monomer preferably has an acid amide bond in the molecule.
- the solubility parameter of the fluorine-containing monomer is preferably 5 (cal / cm 3 ) 1/2 or more and 11 (cal / cm 3 ) 1/2 or less.
- the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3 is preferably 7 (cal / cm 3 ) 1/2 or more and 16 (cal / cm 3 ) 1/2 or less.
- the solubility parameter of the monomer component excluding the compatible monomer in the upper layer resin 4 is preferably 7 (cal / cm 3 ) 1/2 or more and 16 (cal / cm 3 ) 1/2 or less.
- the solubility parameter of the compatible monomer is not particularly limited and can be appropriately selected. From the viewpoint of sufficiently increasing the compatibility between the lower layer resin 3 and the upper layer resin 4, 5 (cal / cm 3 ) 1/2 or more, It is preferably 16 (cal / cm 3 ) 1/2 or less, more preferably 8.3 (cal / cm 3 ) 1/2 or more and 9.7 (cal / cm 3 ) 1/2 or less. 8.3 (cal / cm 3 ) 1/2 or more and 9.5 (cal / cm 3 ) 1/2 or less is more preferable. Since the solubility parameter of the compatible monomer is low, the compatibility with the fluorine-containing monomer is further increased, so that the concentration of the fluorine-containing monomer in the upper resin 4 can be set in a wide range. Therefore, even when the concentration of the fluorine-containing monomer in the upper layer resin 4 is high, the occurrence of white turbidity, layer separation, and the like can be suppressed, and the appearance after the upper layer resin 4 is cured is also improved.
- the solubility parameter of each material is multiplied by the weight ratio of each material to the whole monomer component excluding the compatible monomer.
- the sum is defined as the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3 (also simply referred to as the solubility parameter of the lower layer resin).
- the solubility parameter of each material is multiplied by the weight ratio of each material to the whole monomer component excluding the compatible monomer.
- the sum is defined as the solubility parameter of the monomer component excluding the compatible monomer in the upper layer resin 4 (also simply referred to as the solubility parameter of the upper layer resin).
- the solubility parameter of the fluorine-containing monomer is defined as the solubility parameter of the fluorine-containing monomer.
- the solubility parameter of each compatible monomer multiplied by the weight ratio of each compatible monomer to the entire compatible monomer component is defined as the solubility parameter of the compatible monomer.
- the difference between the solubility parameter of the compatible monomer and the solubility parameter of the fluorine-containing monomer is 0 (cal / cm 3 ) 1/2 or more and 4.0 (cal / cm 3 ) from the viewpoint of sufficiently increasing the compatibility between the two. ) Is preferably 1/2 or less, more preferably 0 (cal / cm 3 ) 1/2 or more, and 3.0 (cal / cm 3 ) 1/2 or less, and 0 (cal / cm 3 ) More preferably, it is 1/2 or more and 2.5 (cal / cm 3 ) 1/2 or less.
- the difference between the solubility parameter of the compatible monomer and the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3 is 0 (cal / cm 3 ) 1/2 from the viewpoint of sufficiently enhancing the compatibility between the two. As described above, 3.0 (cal / cm 3 ) 1/2 or less is preferable, and 0 (cal / cm 3 ) 1/2 or more and 2.0 (cal / cm 3 ) 1/2 or less. More preferred.
- the difference between the solubility parameter of the compatible monomer and the solubility parameter of the monomer component excluding the compatible monomer in the upper layer resin 4 is 0 (cal / cm 3 ) 1/2 from the viewpoint of sufficiently enhancing the compatibility between the two. As described above, 3.0 (cal / cm 3 ) 1/2 or less is preferable, and 0 (cal / cm 3 ) 1/2 or more and 2.0 (cal / cm 3 ) 1/2 or less. More preferred.
- the fluorine-containing monomer contained in the upper layer resin 4 is mixed in the lower layer resin 3, and the concentration of fluorine atoms 7 in the vicinity of the surface of the upper layer resin 4 is reduced.
- the difference between the solubility parameter of the fluorine-containing monomer and the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3 is 3.0 (cal / cm 3 ) 1/2 or more 5.0 (cal / cm 3 ) 1/2 or less.
- the difference between the solubility parameter of the base film 2 and the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3 is 0 (cal / cm 3 ) 1 / from the viewpoint of sufficiently enhancing the adhesion between the two. It is preferably 2 or more and 5.0 (cal / cm 3 ) 1/2 or less.
- the compatible monomer is contained in at least one of the first monomer (lower layer resin 3) and the second monomer (upper layer resin 4).
- Examples of the form include the following (i) to (iii). .
- the difference between the solubility parameter of the monomer component excluding the compatible monomer in the morphological lower layer resin 3 in which the compatible monomer is contained in the first monomer and the second monomer, and the solubility parameter of the fluorine-containing monomer is It is effective when it is large (for example, 2.0 (cal / cm 3 ) 1/2 or more).
- the compatibility monomer contained in the first monomer and the compatibility monomer contained in the second monomer may have different solubility parameters or the same solubility parameter. When both solubility parameters differ, it is preferable that the solubility parameter of the compatible monomer contained in said 1st monomer is larger than the solubility parameter of the compatible monomer contained in said 2nd monomer.
- the solubility parameter includes the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3, and the solubility parameter of the fluorine-containing monomer. It is preferable that it is an intermediate value.
- the solubility parameter of the morphological compatibility monomer in which the compatible monomer is contained only in the first monomer includes the solubility parameter of the monomer component excluding the compatibility monomer in the lower layer resin 3, the solubility parameter of the fluorine-containing monomer, It is preferable that it is an intermediate value.
- the solubility parameter of the morphological-compatible monomer in which the compatible monomer is contained only in the second monomer includes the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin 3, the solubility parameter of the fluorine-containing monomer, It is preferable that it is an intermediate value.
- the mold 5 forms a concavo-convex structure (moth eye structure) by being pressed against the lower layer resin 3 and the upper layer resin 4.
- the mold 5 for example, one produced by the following method can be used.
- a substrate in which silicon dioxide (SiO 2 ) as an insulating layer and pure aluminum are sequentially formed on an aluminum base material is manufactured.
- the insulating layer and the pure aluminum layer can be continuously formed by forming the aluminum base material into a roll shape.
- a female mold (mold) having a moth-eye structure can be produced by alternately repeating anodic oxidation and etching on the pure aluminum layer formed on the surface of the substrate.
- the mold 5 is preferably subjected to a mold release process.
- mold release treatment By performing mold release treatment on the mold 5, the surface free energy of the mold 5 can be lowered, and when the mold 5 is pressed, the fluorine-containing monomer is placed near the surface of the resin layer 8 (upper resin 4). It can collect suitably. Moreover, it can prevent suitably that a fluorine-containing monomer leaves
- the mold release treatment is preferably a surface treatment with a silane coupling agent.
- the silane coupling agent a fluorine-based silane coupling agent is preferably used.
- a moth-eye structure can be formed on the surface, and further, while increasing the concentration of fluorine atoms 7 in the vicinity of the surface, the lower resin 3 and the upper resin 4 Since the resin layer 8 with improved adhesion can be formed, an optical film excellent in antifouling properties and scratch resistance while having excellent antireflection properties can be produced.
- optical film 1 manufactured by the manufacturing method mentioned above is demonstrated below.
- the optical film 1 is equipped with the base material film 2 and the hardened
- the optical film 1 corresponds to an antireflection film provided on the surface, that is, an antireflection film having a moth-eye structure, with a plurality of convex portions 6 having a pitch P equal to or less than the wavelength of visible light.
- the optical film 1 can show the excellent antireflection property (low reflectivity) by a moth-eye structure.
- the shape of the convex portion 6 is not particularly limited, and for example, it is narrower toward the tip, such as a shape (bell shape) constituted by a columnar lower portion and a hemispherical upper portion, a cone shape (cone shape, conical shape), or the like.
- the convex portion 6 may have a shape having a branch protrusion.
- the branch protrusion indicates a convex portion corresponding to a portion having irregular intervals, which has been formed in the process of anodizing and etching for producing the mold 5.
- the bottom of the gap between adjacent convex portions 6 has an inclined shape, but it may have a horizontal shape without being inclined.
- the pitch P between the adjacent convex portions 6 is not particularly limited as long as it is less than or equal to the wavelength of visible light (780 nm). However, from the viewpoint of ensuring sufficient antifouling properties, it is preferably 100 nm or more and 400 nm or less, and 100 nm. As mentioned above, it is more preferable that it is 200 nm or less.
- the pitch between adjacent convex portions excludes branch protrusions in a 1 ⁇ m square region of a planar photograph taken with a scanning electron microscope (product name: S-4700) manufactured by Hitachi High-Technologies Corporation. The average value of the distance between all the adjacent convex parts is shown.
- the pitch between adjacent convex portions is osmium oxide VIII (thickness: 5 nm) manufactured by Wako Pure Chemical Industries, Ltd. on the concavo-convex structure using an osmium coater (product name: Neoc-ST) manufactured by Meiwa Forsys. It is measured in the state which applied.
- the height of the convex part 6 is not specifically limited, From the viewpoint of making it compatible with the suitable aspect ratio of the convex part 6 mentioned later, it is preferable that it is 50 nm or more and 600 nm or less, and it is more preferable that it is 100 nm or more and 300 nm or less. .
- the height of the convex portion is 10 pieces arranged continuously except for branch protrusions in a cross-sectional photograph taken with a scanning electron microscope (product name: S-4700) manufactured by Hitachi High-Technologies Corporation. The average value of the height of a convex part is shown.
- the convex portion having a defect or a deformed portion (such as a portion deformed when preparing a sample) is excluded.
- the sample one sampled in an area where there is no specific defect of the optical film is used.
- the optical film is a roll produced continuously, the one sampled near the center is used.
- the height of the protrusions was applied to Osmium oxide VIII (thickness: 5 nm) manufactured by Wako Pure Chemical Industries, Ltd. on the uneven structure using an osmium coater (product name: Neoc-ST) manufactured by Meiwa Forsys. Measured in the state.
- the aspect ratio of the convex portion 6 is not particularly limited, but is preferably 0.8 or more and 1.5 or less.
- the aspect ratio of the convex portion 6 is 1.5 or less, the workability of the moth-eye structure is sufficiently increased, sticking occurs, or the transfer condition when forming the moth-eye structure is deteriorated (the mold 5 is Clogging or wrapping, etc.) Concerns are reduced.
- the aspect ratio of the convex portion 6 is 0.8 or more, optical phenomena such as moire and rainbow unevenness can be sufficiently prevented, and good reflection characteristics can be realized.
- the aspect ratio of the convex portion indicates a ratio (height / pitch) between the pitch between adjacent convex portions and the height of the convex portion, which is measured by the method described above.
- the arrangement of the convex portions 6 is not particularly limited, and may be arranged randomly or regularly. From the viewpoint of sufficiently preventing the occurrence of moiré, it is preferably arranged randomly.
- the contact angle of water with respect to the surface of the optical film 1 is preferably 100 ° or more, and the contact angle of hexadecane is preferably 40 ° or more. In this case, an optical film having sufficiently high water repellency and oil repellency can be obtained. Further, the contact angle of water with respect to the surface of the optical film 1 is preferably 150 ° or more, and the contact angle of hexadecane is more preferably 90 ° or more. In this case, an optical film having higher water repellency and oil repellency, that is, super water repellency and super oil repellency can be obtained.
- the contact angle of water is one of the indexes indicating the degree of water repellency, and the greater the contact angle of water, the higher the water repellency.
- the contact angle of hexadecane is one index indicating the degree of oil repellency, and the larger the contact angle of hexadecane, the higher the oil repellency.
- the central portion of the sample is selected as the first measurement point, and the second and third measurement points are 20 mm or more away from the first measurement point and the first measurement point. It is assumed that two points that are symmetrical with respect to each other are selected.
- FIG. 2 is a schematic cross-sectional view illustrating the production process of the optical film of Embodiment 2 (steps a to c). Since the second embodiment is the same as the first embodiment except that the lower layer resin and the upper layer resin are applied simultaneously, the description of overlapping points will be omitted as appropriate.
- an optical film having excellent antireflection properties and excellent antifouling properties and scratch resistance is produced. can do. Furthermore, since the lower layer resin 3 and the upper layer resin 4 are applied simultaneously, the number of steps can be reduced as compared with the first embodiment.
- FIG. 3 is a schematic cross-sectional view illustrating the manufacturing process of the optical film of Embodiment 3 (steps a to c).
- the third embodiment is the same as the first embodiment except that the method of applying the upper layer resin is changed, and thus the description of overlapping points will be omitted as appropriate.
- the lower layer resin 3 is applied on the base film 2 as shown in FIG.
- the upper resin 4 is applied on the uneven surface of the mold 5. Note that the thickness D U (after application) of the upper layer resin 4 in the present embodiment is opposite to the mold 5 from the position corresponding to the bottom of the recess of the mold 5 as shown in FIG. Shows the distance to the surface.
- an optical film having excellent antireflection properties and excellent antifouling properties and scratch resistance is produced. can do. Furthermore, since the upper layer resin 4 is laminated on the lower layer resin 3 and the concavo-convex structure is simultaneously formed, the number of steps can be reduced as compared with the first embodiment. In addition, by performing a mold release treatment on the mold 5, before laminating the upper resin 4 on the lower resin 3, the fluorine-containing monomer contained in the upper resin 4 is removed from the mold 5, that is, the surface of the upper resin 4. It can be suitably collected in the vicinity. Therefore, the concentration of fluorine atoms 7 in the vicinity of the surface of the optical film 1 can be increased more suitably.
- the upper resin 4 is a fluorine-containing monomer (for example, a fluorine-based additive (product name: OPTOOL DAC-HP manufactured by Daikin Industries, Ltd.)).
- a fluorine-based additive product name: OPTOOL DAC-HP manufactured by Daikin Industries, Ltd.
- the weight ratio of the fluorosurfactant or the fluorosolvent to the upper layer resin 4 is preferably 1% by weight or more and 200% by weight or less.
- Example 1 The optical film was manufactured by the manufacturing method of the optical film of Embodiment 1. The manufacturing process was as follows.
- the lower layer resin 3 was applied onto the base film 2 with a bar coater (product name: No. 03) manufactured by Daiichi Rika Co., Ltd.
- a bar coater product name: No. 03
- the solubility parameter of the base film 2 was 10.7 (cal / cm 3 ) 1/2 .
- the thickness of the base film 2 was 75 ⁇ m.
- urethane acrylate product name: UA-7100: 31% by weight ⁇ Multifunctional acrylate (product name: ATM-35E) manufactured by Shin-Nakamura Chemical Co., Ltd .: 40% by weight ⁇ Multifunctional acrylate manufactured by Shin-Nakamura Chemical Co., Ltd. (Product name: A-TMM-3LM-N): 27.5% by weight -Photopolymerization initiator (product name: IRGACURE 819) manufactured by BASF: 1.5% by weight
- the solubility parameter of the lower layer resin 3 (excluding the photopolymerization initiator) was 10.5 (cal / cm 3 ) 1/2 .
- the thickness D L (after application) of the lower layer resin 3 was 7 ⁇ m.
- the solubility parameter of the fluorine-containing monomer was 9.7 (cal / cm 3 ) 1/2 .
- the solubility parameter of the compatible monomer was 12.0 (cal / cm 3 ) 1/2 .
- the thickness D U (after application) of the upper layer resin 4 was 1.3 ⁇ m.
- anodization, etching, anodization, etching, anodization, etching, anodization, etching, and anodization are sequentially performed (anodization: 5 times, etching: 4 times), thereby forming the inside of aluminum.
- Anodization: 5 times, etching: 4 times thereby forming the inside of aluminum.
- a large number of minute holes (concave portions) having a shape (tapered shape) that narrows toward the surface are formed, and as a result, a mold 5 having an uneven structure is obtained.
- the concavo-convex structure of the mold 5 can be changed by adjusting the time for performing anodic oxidation and the time for performing etching.
- the time for performing one anodic oxidation was 316 seconds, and the time for performing one etching was 825 seconds.
- the pitch of the convex part was 200 nm and the height of the convex part was 350 nm.
- the mold 5 was subjected to a mold release treatment in advance with a fluorine-based additive (product name: OPTOOL DSX) manufactured by Daikin Industries.
- Example 2 An optical film was produced by the same production method as in Example 1 except that the thickness D U (after application) of the upper layer resin 4 was 6.5 ⁇ m.
- Example 3 The optical film was manufactured by the manufacturing method of the optical film of Embodiment 3. The manufacturing process was as follows.
- the lower layer resin 3 was applied onto the base film 2 with a bar coater (product name: No. 03) manufactured by Daiichi Rika Co., Ltd.
- the upper layer resin 4 was applied onto the uneven surface of the mold 5 by ultrasonic spray (Nozzle product name: Vortex) manufactured by Sono-Tek.
- the base film 2 the lower layer resin 3, the upper layer resin 4, and the mold 5, the same ones as in Example 1 were used.
- the thickness D L (after application) of the lower layer resin 3 was 7 ⁇ m.
- the thickness D U (after application) of the upper layer resin 4 was 1.3 ⁇ m.
- Example 4 An optical film was produced by the same production method as in Example 3 except that the thickness D U (after application) of the upper layer resin 4 was 2.5 ⁇ m.
- Example 5 An optical film was produced by the same production method as in Example 3 except that the thickness D U (after application) of the upper layer resin 4 was 3.8 ⁇ m.
- Example 6 An optical film was produced by the same production method as in Example 3 except that the thickness D U (after application) of the upper layer resin 4 was 25.0 ⁇ m.
- Example 7 An optical film was produced by the same production method as in Example 3 except that the material of the base film, the apparatus used for coating the upper layer resin, and the thickness of the upper layer resin were changed.
- a TAC film product name: Fujitac (registered trademark) TD80UL
- Fuji Film Co., Ltd. which had been subjected to an easy adhesion treatment was used.
- the solubility parameter of the base film 2 was 11 (cal / cm 3 ) 1/2 .
- the thickness of the base film 2 was 75 ⁇ m.
- a bar coater product name: No. 02 manufactured by Daiichi Rika Co., Ltd. was used.
- the thickness D U (after application) of the upper layer resin 4 was 2 ⁇ m.
- Example 8 An optical film was produced by the same production method as Example 7 except that the mold 5 was not subjected to the mold release treatment in advance and the thickness D L (after application) of the lower layer resin 3 was set to 6 ⁇ m.
- FIG. 4 is a schematic cross-sectional view illustrating the manufacturing process of the optical film of Comparative Example 1 (steps a to d). The manufacturing process was as follows.
- the lower layer resin 103a was applied onto the base film 102 by a bar coater (product name: No. 03) manufactured by Daiichi Rika Co., Ltd. The following were used as the base film 102 and the lower layer resin 103a.
- the thickness of the base film 102 was 75 ⁇ m.
- ⁇ Lower layer resin 103a> A mixture of the following materials (the numerical value given to each material indicates the concentration of each material in the lower layer resin 103a) ⁇ Shin Nakamura Chemical Co., Ltd.
- urethane acrylate product name: UA-7100: 31% by weight ⁇ Multifunctional acrylate (product name: ATM-35E) manufactured by Shin-Nakamura Chemical Co., Ltd .: 40% by weight ⁇ Multifunctional acrylate manufactured by Shin-Nakamura Chemical Co., Ltd. (Product name: A-TMM-3LM-N): 27.5% by weight -Photopolymerization initiator (product name: IRGACURE 819) manufactured by BASF: 1.5% by weight
- the thickness (after application) of the lower layer resin 103a was 7 ⁇ m.
- anodization, etching, anodization, etching, anodization, etching, anodization, etching, and anodization are sequentially performed (anodization: 5 times, etching: 4 times), thereby forming the inside of aluminum.
- Many fine holes (concave portions) having a shape (tapered shape) narrowing toward the surface were formed, and as a result, a mold 105 having an uneven structure was obtained.
- the time for one anodic oxidation was 316 seconds
- the time for one etching was 825 seconds.
- the pitch of the convex part was 200 nm and the height of the convex part was 350 nm.
- the mold 105 was subjected to mold release treatment in advance with a fluorine-based additive (product name: OPTOOL DSX) manufactured by Daikin Industries.
- a base film is formed on the lower layer resin 103a having a concavo-convex structure by using a UV lamp (product name: LIGHT HANMAR6J6P3) manufactured by Fusion UV systems. It was cured by irradiation with ultraviolet rays (irradiation amount: 200 mJ / cm 2 ) from the 102 side. Then, after oxygen (O 2 ) plasma treatment is performed on the surface of the cured lower layer resin 103a, silicon dioxide (SiO 2 ) is formed on the lower layer resin 103a by radio frequency (RF) sputtering, and silicon dioxide Layer 109 was formed. The thickness of the silicon dioxide layer 109 was 10 nm.
- RF radio frequency
- the upper layer resin 104 is applied on the silicon dioxide layer 109, and an induction heating method (degree of vacuum: 1 ⁇ 10 ⁇ 4 to 1 ⁇ 10 ⁇ 3 Pa) is applied. Used to deposit. As a result, the optical film 101a was completed.
- a fluorine-based additive product name: OPTOOL DSX
- the thickness of the upper layer resin 104 was 10 nm or less.
- the surface specification of the optical film 101a was as follows. Shape of convex portion 106a: pitch Q1 of bell-shaped convex portion 106a: 200 nm Height of convex portion 106a: 200 to 250 nm
- Comparative Example 2 An optical film was produced by the same production method as in Comparative Example 1 except that no silicon dioxide film was formed for the purpose of eliminating damage to the lower layer resin 103a when the silicon dioxide film was formed.
- FIG. 5 is a schematic cross-sectional view illustrating the manufacturing process of the optical film of Comparative Example 3 (steps a to c). The manufacturing process was as follows.
- a lower layer resin 103b to which a fluorine-containing monomer containing a fluorine atom 107 is added on a base film 102 is a bar made by Daiichi Rika Co., Ltd.
- the coating was applied with a coater (product name: No. 03).
- the base film 102 and the lower layer resin 103b the following were used.
- the thickness of the base film 102 was 75 ⁇ m.
- ⁇ Lower layer resin 103b> A mixture of the following materials (the numerical value given to each material indicates the concentration of each material in the lower layer resin 103b) ⁇ Shin Nakamura Chemical Co., Ltd. urethane acrylate (Product name: UA-7100): 24.5% by weight ⁇ Multifunctional acrylate (product name: ATM-35E) manufactured by Shin-Nakamura Chemical Co., Ltd .: 32.0% by weight ⁇ Multifunctional acrylate manufactured by Shin-Nakamura Chemical Co., Ltd.
- a base film is formed on the lower layer resin 103b having a concavo-convex structure by using a UV lamp (product name: LIGHT HANMAR 6J6P3) manufactured by Fusion UV systems. It was cured by irradiation with ultraviolet rays (irradiation amount: 200 mJ / cm 2 ) from the 102 side. As a result, the optical film 101b was completed.
- the surface specification of the optical film 101b was as follows. Shape of convex portion 106b: Pitch Q2 of bell-shaped convex portion 106b: 200 nm Height of convex part 106b: 200 to 250 nm
- the luminous reflectance (Y value) of the samples of each example was evaluated. Specifically, the light source was irradiated from the orientation of a polar angle of 5 ° with respect to the surface of the sample of each example, and the regular reflectance of the sample of each example with respect to each wavelength of incident light was measured. The reflectance (Y value) at a wavelength of 550 nm was used as an evaluation index for antireflection properties. The reflectance was measured in a wavelength range of 250 to 850 nm using a spectrophotometer (product name: V-560) manufactured by JASCO Corporation.
- FIG. 6 is a graph showing the measurement results of the reflectance in Example 7.
- the Y value at a wavelength of 550 nm was 0.05%
- a * was ⁇ 0.03
- b * was ⁇ 1.06.
- the contact angle of water with the surface of the sample of each example was evaluated.
- the method for measuring the contact angle is as described above.
- the case where the contact angle of water was 100 ° or more was determined to be an acceptable level (excellent water repellency).
- the contact angle of hexadecane with the surface of each sample was evaluated.
- the method for measuring the contact angle is as described above.
- the case where the contact angle of hexadecane was 20 ° or more was judged to be an acceptable level (excellent oil repellency).
- Nivea Cream manufactured by Nivea Kao Co., Ltd. was attached to the surface of each sample and left for 3 days in an environment of temperature 25 ° C. and humidity 40-60%. Then, using a non-woven fabric (product name: Xavina (registered trademark)) manufactured by KB Seiren, each sample was wiped 50 times in one direction, and it was observed in an environment with an illuminance of 100 lx. .
- ⁇ dirt can be completely wiped off
- ⁇ dirt that is not perfect can be wiped off
- ⁇ most of dirt cannot be wiped off
- X dirt cannot be wiped off at all.
- the case where the evaluation result was “ ⁇ ” or “ ⁇ ” was determined to be an acceptable level (excellent wiping property).
- steel wool (SW) resistance to the samples of each example was evaluated. Specifically, the surface of the sample of each example is rubbed with steel wool (product name: # 0000) made by Nippon Steel Wool under a predetermined load, and the load at the time of scratching is scratch-resistant. Was used as an evaluation index.
- a surface property measuring machine product name: 14FW
- the stroke width was 30 mm
- the speed was 100 mm / s
- the number of times of rubbing was 10 reciprocations.
- the presence or absence of scratches was visually observed in an environment with an illuminance of 100 lx (fluorescent lamp).
- the case where the steel wool resistance was 100 g or more was judged to be an acceptable level (excellent scratch resistance).
- the slipperiness was evaluated by palpation with a cotton swab.
- evaluation indexes ⁇ : very slippery, ⁇ : slippery, ⁇ : slippery, x: not slippery were used.
- the evaluation result was ⁇ , ⁇ , or ⁇ , it was judged as an acceptable level (excellent slipperiness).
- each of Examples 1 to 8 had excellent antireflection properties and excellent antifouling properties and scratch resistance.
- Examples 2 to 8 were more excellent in antifouling property and scratch resistance
- Examples 6 and 7 were particularly excellent in antifouling property and scratch resistance. That is, it was found that it is preferable to adopt the method for producing an optical film of Embodiment 3 from the viewpoint of making the antifouling property and scratch resistance particularly excellent. Further, when Example 1 and Example 3 in which the thickness of the upper layer resin 4 is the same (1.3 ⁇ m) are compared, Example 3 is superior in antifouling property and scratch resistance.
- Comparative Examples 1 and 2 since the upper layer resin 104 is applied after the lower layer resin 103a is cured, the adhesion between the lower layer resin 103a and the upper layer resin 104 is low, and scratch resistance is obtained.
- the properties were inferior (Comparative Example 1), and the wiping properties were also inferior (Comparative Examples 1 and 2).
- Comparative Example 3 the concentration of the fluorine-containing monomer was set higher than that of each Example for the purpose of enhancing the antifouling property, but white turbidity due to the large amount of the fluorine-containing monomer was generated.
- ⁇ Upper layer resin 4> A mixture of the following materials (the numerical value given to each material indicates the concentration of each material in the upper resin 4).
- Fluorine-containing monomer A 10% by weight
- Fluorine-containing monomer B 40% by weight -Compatible monomer: Amide group-containing monomer (product name: ACMO) manufactured by KJ Chemicals: 50% by weight
- the fluorine-containing monomer A is a mixture of 4-acryloylmorpholine (concentration: 75% or more and 85% or less) and perfluoropolyether (PFPE) (concentration: 15% or more and 25% or less) (in parentheses).
- the numerical value indicates the concentration of each component in the fluorine-containing monomer A.), and the solid content concentration was 20% by weight.
- the solid content concentration of the fluorine-containing monomer A in the upper layer resin 4 was 2.2% by weight.
- the fluorine-containing monomer B was a fluorine-based surfactant described in Patent Document 4.
- the application amount of the upper layer resin 4 to the mold 5 was 2.1 ⁇ l, and the application area was 80 mm ⁇ 70 mm. That is, the thickness (converted value) of the upper layer resin 4 was 0.375 ⁇ m.
- Example 2 An optical film was produced by the same production method as in Example 1 except that the amount of the upper layer resin applied to the mold was changed.
- the application amount of the upper layer resin 4 to the mold 5 was 6.5 ⁇ l, and the application area was 80 mm ⁇ 70 mm. That is, the thickness (converted value) of the upper layer resin 4 was 1.16 ⁇ m.
- Example 3 An optical film was produced by the same production method as in Example 1 except that the amount of the upper layer resin applied to the mold was changed.
- the application amount of the upper layer resin 4 to the mold 5 was 13.3 ⁇ l, and the application area was 80 mm ⁇ 70 mm. That is, the thickness (converted value) of the upper layer resin 4 was 2.38 ⁇ m.
- Example 4 An optical film was produced by the same production method as in Example 1 except that the amount of the upper layer resin applied to the mold was changed.
- the application amount of the upper layer resin 4 to the mold 5 was 30.5 ⁇ l, and the application area was 80 mm ⁇ 70 mm. That is, the thickness (converted value) of the upper layer resin 4 was 5.45 ⁇ m.
- the contact angle of water with the surface of the sample of each study example was evaluated.
- the oil repellency the contact angle of hexadecane to the surface of the sample of each study example was evaluated.
- the method for measuring the contact angle is as described above.
- the ease of wiping off the fingerprint attached to the surface of the sample of each study example was evaluated. Specifically, first, a fingerprint was attached to the surface of the sample of each study example, and left for 3 days in an environment of temperature 25 ° C. and humidity 40-60%. Thereafter, the sample of each study example was wiped 50 times in one direction using a non-woven fabric (product name: Xavina) manufactured by KB Seiren Co., Ltd., and observed in an environment with an illuminance of 100 lx. About the ease of wiping off a fingerprint, it evaluated that it was high in order of A, B, C, and D (D: easy to wipe off).
- the antifouling property was higher in the order of Study Example 1, Study Example 2, Study Example 3, and Study Example 4. That is, it was found that the antifouling property increases as the amount of the upper resin 4 applied to the mold 5 increases (when the upper resin 4 becomes thicker).
- the oil repellency was comparable to each other, but the study example 2 was superior in the fingerprint wiping property to the study example 1. This is presumably because the fingerprint contains not only oil but also water, and the water repellency (in the study example 2 is higher than the study example 1) also contributes to the fingerprint wiping property.
- an X-ray photoelectron spectrometer (product name: PHI 5000 VersaProbe II) manufactured by ULVAC-PHI was used, and the specifications were as follows. ⁇ Device specifications> X-ray source: Monochromatic AlK ⁇ ray (1486.6 eV) ⁇ Spectroscope: Electrostatic concentric hemispherical analyzer ⁇ Amplifier: Multi-channel type
- FIG. 7 is a graph showing a survey spectrum of the surfaces of the optical films of Study Examples 1 to 4. “C / s” on the vertical axis in FIG. 7 is an abbreviation for “counts / second”. The same applies to other drawings.
- the measurement conditions for the survey spectrum were as follows. ⁇ Measurement conditions> ⁇ X-ray beam diameter: 100 ⁇ m (25 W, 15 kV) ⁇ Analysis area: 1000 ⁇ m ⁇ 500 ⁇ m -Photoelectron extraction angle: 45 ° ⁇ Pass energy: 187.85 eV
- C1s peak, N1s peak, O1s peak, and F1s peak were detected in any of the optical films of Study Examples 1 to 4.
- the cured resin layers of the optical films of Study Examples 1 to 4 contained carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms as constituent atoms.
- the ratio of the number of each atom to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms on the surface of the concavo-convex structure was calculated.
- Table 3 shows the calculation results.
- the surface of the concavo-convex structure refers to a region within 6 nm in the depth direction from the outermost surface of the concavo-convex structure.
- the fluorine content on the surface of the concavo-convex structure is preferably 16 atom% or more, more preferably 33 atom% or more, still more preferably 43 atom% or more, and particularly preferably 48 atom% or more.
- a preferable upper limit of the fluorine content on the surface of the concavo-convex structure is 55 atom%, and a more preferable upper limit is 50 atom%.
- the fluorine content on the surface of the concavo-convex structure is greater than 55 atom%, the cured resin layer may become cloudy.
- Table 3 of Non-Patent Document 3 describes a state in which the concentration of fluorine atoms on the surface is increased. However, as shown in Table 4, according to the optical films of Study Examples 2 to 4, it is possible to realize a state in which the concentration of fluorine atoms on the surface is higher than the state described in Non-Patent Document 3.
- FIG. 8 is a graph showing the relationship between the thickness of the upper layer resin and the contact angle.
- FIG. 9 shows the relationship between the thickness of the upper resin and the ratio of the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms to the total number of fluorine atoms on the surface of the concavo-convex structure. It is a graph to show.
- the tendency of the contact angle of hexadecane with respect to the thickness of the upper layer resin 4 was considered to be related not only to the fluorine content on the surface of the concavo-convex structure with respect to the thickness of the upper layer resin 4 but also to other factors.
- FIG. 10 is a graph showing a narrow spectrum of the surface of the optical films of Study Examples 1 to 4, where (a) shows the C1s peak, (b) shows the N1s peak, (c) shows the O1s peak, (D) shows the F1s peak.
- the measurement conditions for the narrow spectrum were as follows. ⁇ X-ray beam diameter: 100 ⁇ m (25 W, 15 kV) ⁇ Analysis area: 1000 ⁇ m ⁇ 500 ⁇ m -Photoelectron extraction angle: 45 ° ⁇ Pass energy: 46.95 eV
- the peak of the obtained narrow spectrum was separated into a plurality of peaks, and the binding species corresponding to each peak was identified from each peak position and shape.
- the analysis result of the C1s peak and O1s peak of the examination example 4 is illustrated. The other analysis examples were similarly analyzed.
- FIG. 11 is a graph showing the analysis result of the C1s peak of Study Example 4 in FIG.
- the peak C R corresponds to the C1s peak of the study example 4 in FIG. 10 (a).
- the peaks C1 to C7 are spectra obtained by curve fitting with peaks derived from each bond type with respect to the peak C R (C1s peak). Note that the obtained spectrum was subjected to charge correction so that the position of the peak C1 was 284.6 eV.
- Table 5 shows the positions of the peaks C1 to C7 and the identified binding species. In identifying each binding species, the information described in Non-Patent Document 4 and Table 1 of Non-Patent Document 5 were used.
- the peak C7 is identified as “CF 3 bond and OCF 2 bond”.
- the peak derived from the CF 3 bond and the OCF 2 bond are shown. Since it is located at almost the same position as the peak derived from it, it was difficult to separate the two peaks.
- FIG. 12 is a graph showing the analysis result of the O1s peak of Study Example 4 in FIG.
- the peak O R corresponds to O1s peak of the study example 4 in FIG. 10 (c).
- peaks O1 to O3 are spectra obtained by curve fitting with peaks derived from each bond type with respect to peak O R (O1s peak).
- Table 6 shows the positions of the peaks O1 to O3 and the identified binding species. In identifying each binding species, the information described in Non-Patent Document 6 was used.
- the peak O3 is identified as “OF x bond”, but according to FIG. 2 of Non-Patent Document 7, it was found that it corresponds to the OCF 2 bond.
- the OCF 2 bond is, for example, a bond included in PFPE that is a component of the fluorine-containing monomer A.
- the peak derived from the OCF 2 bond in PFPE is shifted to a higher energy side than usual.
- each of the narrow spectrum peaks on the surfaces of the optical films of Examination Examples 1 to 4 is a CF 2 bond-derived peak (peak C6), a CF 3 bond and an OCF 2 bond-derived peak (peak C7), It could be divided into a peak derived from the OCF 2 bond (peak O3) and a peak derived from other bond species.
- FIG. 13 is a graph showing the relationship between the thickness of the upper layer resin and the ratio of the peak area derived from the CF 2 bond to the peak area derived from the bond type other than the CF 2 bond in the C1s peak.
- the specifications of each data point in FIG. 13 are as follows. “ ⁇ ”: Ratio of peak area derived from CF 2 bond (area of peak C6) to peak area derived from CC bond (peak C1 area) • “ ⁇ ”: CO bond, CN to the peak area derived from coupling such (the sum of the areas of the area and the peak C3 of the peak C2), the ratio, of the peak area derived from CF 2 bonds (area of peak C6) " ⁇ ”: CHF binding, from COO bond, etc.
- ⁇ corresponds to the left vertical axis
- ⁇ corresponds to the right vertical axis.
- FIG. 14 is a graph showing the relationship between the thickness of the upper resin and the ratio of the peak area derived from the CF 3 bond and the OCF 2 bond to the peak area derived from the bond type other than the CF 3 bond and the OCF 2 bond in the C1s peak. is there.
- the specifications of each data point in FIG. 14 are as follows. “ ⁇ ”: Ratio of peak area derived from CF 3 bond and OCF 2 bond (area of peak C7) to peak area derived from CC bond (peak C1 area) • “ ⁇ ”: CO bond , Ratio of peak area derived from CF 3 bond and OCF 2 bond (area of peak C7) to peak area derived from C—N bond or the like (sum of area of peak C2 and area of peak C3).
- ⁇ Ratio of peak area derived from CF 3 bond and OCF 2 bond (area of peak C7) to peak area derived from CHF bond, COO bond, etc. (sum of area of peak C4 and area of peak C5)
- ⁇ and ⁇ correspond to the left vertical axis
- ⁇ corresponds to the right vertical axis.
- FIG. 15 is a graph showing the relationship between the thickness of the upper layer resin and the ratio of the peak area derived from the OCF 2 bond to the peak area derived from the bond type other than the OCF 2 bond in the O1s peak.
- “ ⁇ ” indicates the peak area derived from the OCF 2 bond relative to the sum of the peak area derived from the C—O bond (area of the peak O1) and the peak area derived from the C ⁇ O bond (area of the peak O2).
- the ratio of (area of peak O3) is shown. As shown in FIG.
- the ratio of the peak area derived from the OCF 2 bond to the sum of the peak area derived from the C—O bond and the peak area derived from the C ⁇ O bond is the same as in Example 1 (thickness of the upper resin 4: 0). 0.375 for Study Example 2 (upper layer resin 4 thickness: 1.16 ⁇ m), 0.355 for Study Example 3 (thickness of upper layer resin 4: 2.38 ⁇ m), Study Example 4 (.375 ⁇ m). The thickness of the upper layer resin 4 was 5.27 ⁇ m) and was 1.027.
- FIG. 8 When FIG. 8 is compared with FIGS. 13 to 15, the peak area derived from the C—O bond and C ⁇ O shown in FIG. 15 are most correlated with the tendency of the contact angle of hexadecane with respect to the thickness of the upper resin 4. It was found that the ratio was the ratio of the peak area derived from the OCF 2 bond to the sum of the peak area derived from the bond. From the above, when the ratio of the peak area derived from the OCF 2 bond to the sum of the peak area derived from the C—O bond and the peak area derived from the C ⁇ O bond increases, the contact angle of hexadecane increases. It turned out that oiliness increases.
- the ratio of the peak area derived from the OCF 2 bond to the sum of the peak area derived from the C—O bond and the peak area derived from the C ⁇ O bond is preferably 0.1 or more, and more preferably 0.3 or more. More preferably, it is more preferably 0.6 or more, and particularly preferably 1 or more.
- the preferable upper limit of the ratio of the peak area derived from the OCF 2 bond to the sum of the peak area derived from the C—O bond and the peak area derived from the C ⁇ O bond is 1.1.
- the gas cluster ion beam is composed of several tens to several thousand atoms, and is an ion beam having a very low energy per atom.
- argon gas cluster ion beam since sputtering atoms do not remain when sputtering on a sample, it cannot be achieved with C 60 ions, and it is an ultra-low energy ion etching of about 1 to 20 eV per atom. Is feasible.
- chemical changes derived from argon gas cluster ions hardly occur on the surface of the sample after sputtering, it is possible to perform etching on organic substances.
- an X-ray photoelectron spectrometer (product name: PHI 5000 VersaProbe II) manufactured by ULVAC-PHI is equipped with an argon gas cluster sputter ion gun (product name: 06-2000) manufactured by the same company. Using.
- FIG. 16 is a graph showing the ratio of the number of each atom to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms in the cured resin layer of the optical film of Study Example 1. It is.
- FIG. 17 is a graph showing the ratio of the number of each atom to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms in the cured resin layer of the optical film of Study Example 2. It is.
- FIG. 18 is a graph showing the ratio of the number of each atom to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms in the cured resin layer of the optical film of Study Example 3. It is.
- FIG. 19 is a graph showing the ratio of the number of each atom to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms in the cured resin layer of the optical film of Study Example 4. It is.
- the sputtering conditions by the argon gas cluster ion beam and the charging neutralization conditions were as follows. Note that the measurement conditions by X-ray photoelectron spectroscopy were the same as the measurement conditions for the narrow spectrum in Evaluation 3 above.
- the horizontal axis D (unit: ⁇ m) indicates the distance from the surface of the concavo-convex structure to the depth direction, and is a value converted to polyhydroxystyrene.
- the vertical axis “atomic concentration” in FIGS. 16 to 19 represents the ratio of the number of each atom to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms (unit: atom%). ).
- the ratio of the number of fluorine atoms to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms depends on the cured resin layer. It was found that it decreased with respect to the depth direction. That is, it was found that the fluorine content was higher on the surface side of the cured resin layer (surface side of the concavo-convex structure).
- the concentration of fluorine atoms in the cured resin layer was calculated by the following formula for each of FIGS.
- [Concentration of fluorine atoms in the cured resin layer] (unit:%) [area of fluorine atom profile] / [area of plot area]
- the [area of the plot area] is specifically the product of the length in the horizontal axis range (11.5 ⁇ m: the thickness of the cured resin layer) and the length in the vertical axis range (100%). Point to.
- the concentration of fluorine atoms in the cured resin layer was at most about 1%, and the transparency was high.
- the fluorine content on the surface of the concavo-convex structure is high, and fluorine atoms are present at a high concentration on the surface side of the cured resin layer (surface side of the concavo-convex structure). I understood. Therefore, according to the optical films of Examination Examples 1 to 4, both transparency and antifouling properties can be achieved.
- the concentration of fluorine atoms in the cured resin layer is preferably 2% or less, and more preferably 1.1% or less. When the concentration of fluorine atoms in the cured resin layer is greater than 2%, the cured resin layer may become cloudy.
- FIG. 20 is a graph showing the distribution state of fluorine atoms in the cured resin layers of the optical films of Study Examples 1 to 4.
- the sputtering conditions by the argon gas cluster ion beam, the charging neutralization conditions, and the measurement conditions by the X-ray photoelectron spectroscopy were the same as in the evaluation 4.
- the horizontal axis D (unit: nm) in FIG. 20 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “MF D / MF S ” in FIG. 20 indicates the ratio of MF D to MF S defined as follows.
- MF D (Unit: atom%): the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms at a position D (unit: nm) away from the surface of the concavo-convex structure in the depth direction in terms of polyhydroxystyrene
- the ratio of the number of fluorine atoms to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms depends on the depth of the cured resin layer. It was found that it decreased with respect to the vertical direction. Moreover, it turned out that the decreasing tendency of a fluorine content rate is moderate in order of the examination example 1, the examination example 2, the examination example 3, and the examination example 4. That is, it was found that as the amount of the upper layer resin 4 applied to the mold 5 increases (when the upper layer resin 4 becomes thicker), fluorine atoms exist deeper in the cured resin layer.
- the anti-fouling property is sufficiently enhanced.
- FIG. 21 is a graph showing the distribution state of CF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- the horizontal axis D (unit: nm) in FIG. 21 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “M1 D / M1 S ” in FIG. 21 indicates the ratio of M1 D to M1 S defined as follows.
- ⁇ M1 S in C1s peak detected from the surface of the concavo-convex structure, CF 2 bond derived peak area ⁇ M1 D: D In polyhydroxystyrene converted in the depth direction from the surface of the concavo-convex structure (unit: nm) away The peak area derived from the CF 2 bond in the C1s peak detected from C 2 s where the peak derived from the CF 2 bond is analyzed as corresponding to the peak separated from the C 1s peak (eg, peak C 6 in FIG. 11). went.
- FIG. 22 is a graph showing the distribution state of CF 3 bonds and OCF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- the horizontal axis D (unit: nm) in FIG. 22 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “M2 D / M2 S ” in FIG. 22 indicates the ratio of M2 D to M2 S defined as follows.
- M2 S Peak area derived from CF 3 bond and OCF 2 bond in the C1s peak detected from the surface of the concavo-convex structure.
- M2 D D in terms of polyhydroxystyrene in the depth direction from the surface of the concavo-convex structure (unit: nm) ) Peak area derived from CF 3 bond and OCF 2 bond in the C1s peak detected from a distant position, where the peak derived from CF 3 bond and OCF 2 bond is a peak separated from the C1s peak (for example, FIG. 11 Analysis was carried out as corresponding to the peak C7) in the middle.
- FIG. 23 is a graph showing the distribution state of OCF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- the horizontal axis D (unit: nm) in FIG. 23 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “M3 D / M3 S ” in FIG. 23 indicates the ratio of M3 D to M3 S defined as follows.
- M3 S Peak area derived from OCF 2 bond in the O1s peak detected from the surface of the concavo-convex structure.
- M3 D D (unit: nm) away from the surface of the concavo-convex structure in the depth direction in terms of polyhydroxystyrene.
- the peak area derived from the OCF 2 bond in the O1s peak detected from the peak is analyzed here as the peak derived from the OCF 2 bond corresponding to the peak separated from the O1s peak (for example, the peak O3 in FIG. 12). went.
- the components containing the fluorine-containing monomer A and the fluorine-containing monomer B are polyhydroxystyrene in the depth direction from the surface of the concavo-convex structure. It was found that it exists at a high concentration in a region within 1 ⁇ m in terms of conversion. Therefore, the concentration of the components containing the fluorine-containing monomer A and the fluorine-containing monomer B was investigated.
- FIG. 24 is a graph showing the abundance ratio of carbon atoms derived from CF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- the horizontal axis D (unit: nm) in FIG. 24 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “M1 ST / M1 T ” in FIG. 24 indicates the ratio of M1 ST to M1 T defined as follows.
- M1 T and M1 ST were calculated by the following procedure. Below, the calculation method with respect to the examination example 4 is illustrated. The same calculation was performed for other study examples.
- FIG. 25 shows the number of atoms derived from each bond type relative to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms in the cured resin layer of the optical film of Study Example 4. It is a graph which shows a ratio.
- peak C6 CF 2 bond
- peak C7 CF 3 bond and OCF 2 bond
- peak O3 OCF 2 bond
- the horizontal axis D (unit: nm) in FIG. 25 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “atomic concentration” in FIG. 25 represents the ratio of the number of atoms derived from each bond type to the total number of carbon atoms, nitrogen atoms, oxygen atoms, and fluorine atoms (unit: atom%). Specifically, it is as follows.
- ⁇ C1s (C6): the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms and the number ratio ⁇ C1s carbon atoms CF 2 bonds from the total number of the number of fluorine atoms (C7): carbon atoms Ratio of the number of carbon atoms derived from CF 3 bonds and OCF 2 bonds to the total number of fluorine atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms ⁇ O1s (O3): the number of carbon atoms, nitrogen Ratio of the number of oxygen atoms derived from the OCF 2 bond to the total number of atoms, oxygen atoms, and fluorine atoms
- FIG. 26 is a graph illustrating M1 T and M1 ST of Study Example 4 in FIG. M1 T : area of the profile of C1s (C6) M1 ST : area of the horizontal axis 0 to D in the profile of C1s (C6)
- FIG. 27 is a graph showing the abundance ratio of carbon atoms derived from CF 3 bonds and OCF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- the horizontal axis D (unit: nm) in FIG. 27 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “M2 ST / M2 T ” in FIG. 27 indicates the ratio of M2 ST to M2 T defined as follows.
- M2 T equivalent to the number of carbon atoms derived from CF 3 bonds and OCF 2 bonds in the cured resin layer
- M2 T and M2 ST were calculated by the following procedure. Below, the calculation method with respect to the examination example 4 is illustrated. The same calculation was performed for other study examples.
- FIG. 28 is a graph illustrating M2 T and M2 ST of Study Example 4 in FIG. M2 T : area of the profile of C1s (C7) M2 ST : area of the horizontal axis 0 to D in the profile of C1s (C7)
- FIG. 29 is a graph showing the abundance ratio of oxygen atoms derived from OCF 2 bonds in the cured resin layers of the optical films of Study Examples 1 to 4.
- the horizontal axis D (unit: nm) in FIG. 29 indicates the distance from the surface of the concavo-convex structure in the depth direction, and is a polyhydroxystyrene equivalent value.
- the vertical axis “M3 ST / M3 T ” in FIG. 29 indicates the ratio of M3 ST to M3 T defined as follows.
- M3 T and M3 ST were calculated by the following procedure. Below, the calculation method with respect to the examination example 4 is illustrated. The same calculation was performed for other study examples.
- FIG. 30 is a graph illustrating M3 T and M3 ST of Study Example 4 in FIG.
- M3 T Area of the profile of O1s (O3)
- M3 ST Area of the range of the horizontal axis 0 to D in the profile of O1s (O3)
- carbon derived from CF 2 bonds At least one atom selected from the group consisting of atoms, carbon atoms derived from CF 3 bonds and OCF 2 bonds, and oxygen atoms derived from OCF 2 bonds is converted into polyhydroxystyrene in the depth direction from the surface of the concavo-convex structure It is preferable that 95% or more of the number in the cured resin layer is contained in the region within 1 ⁇ m, and more preferably 99% or more.
- the carbon atom derived from the CF 2 bond, the carbon atom derived from the CF 3 bond and the OCF 2 bond, and the oxygen atom derived from the OCF 2 bond are each converted to polyhydroxystyrene in the depth direction from the surface of the concavo-convex structure. More preferably, 99% or more of the number in the cured resin layer is contained in the region within 1 ⁇ m.
- One embodiment of the present invention is a method for producing an optical film having a concavo-convex structure provided with a plurality of convex portions at a pitch equal to or smaller than the wavelength of visible light on the surface, and a step of applying a lower layer resin and an upper layer resin (1) And a step of forming a resin layer having the concavo-convex structure on the surface by pressing a mold against the lower layer resin and the upper layer resin from the upper layer resin side in a state where the applied lower layer resin and the upper layer resin are laminated. (2) and the step (3) of curing the resin layer, the lower layer resin includes at least one first monomer that does not contain a fluorine atom, and the upper layer resin does not contain a fluorine atom.
- a compatible monomer containing a kind of second monomer and a fluorine-containing monomer, wherein at least one of the first monomer and the second monomer is compatible with the fluorine-containing monomer may be a method for producing an optical film that dissolves in the lower layer resin and the upper layer resin.
- “Applying the lower layer resin and the upper layer resin” in the step (1) is not only the case where the lower layer resin and the upper layer resin are applied on the same base material, but also the lower layer resin and the upper layer resin. This includes the case where it is applied on a different substrate.
- the lower layer resin and the upper layer resin are applied on different base materials, for example, the lower layer resin may be applied onto a base film, and the upper layer resin may be applied onto the mold. .
- step (2) “pressing a mold from the upper layer resin side to the lower layer resin and the upper layer resin in a state where the applied lower layer resin and the upper layer resin are laminated” means the lower layer This includes not only the case where the mold is pressed after the resin and the upper layer resin are laminated, but also the case where the mold is pressed while the lower layer resin and the upper layer resin are laminated.
- the lower layer resin and the upper layer resin are laminated (hereinafter also referred to as a lamination step), and the mold is attached to the lower layer resin and the upper layer resin from the upper layer resin side. It includes a method in which pressing (hereinafter also referred to as pressing step) is performed at different timing or the same timing.
- the lower layer resin and the upper layer resin are sequentially applied onto the base film (the lamination step), and then the mold is pressed against the lower layer resin and the upper layer resin from the upper layer resin side (the pressing step). ). That is, the said process (1) may be performed by apply
- application of the lower layer resin and the upper layer resin can be suitably performed by providing an apparatus of a general application method (for example, gravure method, slot die method, etc.).
- the lower layer resin and the upper layer resin are simultaneously coated on the base film (the upper layer resin is formed on the side opposite to the base film of the lower layer resin) (the laminating step), and then The mold is pressed against the lower layer resin and the upper layer resin from the upper layer resin side (the pressing step). That is, the said process (1) may be performed by apply
- the upper layer resin and the lower layer resin are sequentially applied onto the mold (the lamination step), and then the mold on which the upper layer resin and the lower layer resin are applied is pressed against the base film ( Pressing step above). That is, the step (1) may be performed by sequentially applying the upper layer resin and the lower layer resin onto the mold. In this case, for example, if a flexible mold is used as the mold, the uneven structure can be easily formed regardless of the shape of the base film.
- the step (1) may be performed by simultaneously applying the upper layer resin and the lower layer resin on the mold.
- the uneven structure can be easily formed regardless of the shape of the base film.
- the following method (v) is preferable.
- the lower layer resin is applied onto a base film, the upper layer resin is applied onto the mold, and then the mold with the upper layer resin is applied from the upper layer resin side to the base material.
- the upper layer resin is laminated on the lower layer resin (the laminating step) while pressing against the lower layer resin applied on the film (the pressing step). That is, the step (1) is performed by applying the lower layer resin on a base film and applying the upper layer resin on the mold, and the step (2) is performed by applying the upper layer resin.
- the mold may be pressed from the upper layer resin side against the lower layer resin coated on the base film.
- the upper layer resin can be laminated on the lower layer resin and the concavo-convex structure can be simultaneously formed.
- the number of steps can be reduced as compared with the case where the lower layer resin and the upper layer resin are sequentially applied onto the base film.
- antifouling property can be improved suitably and especially the loss of the constituent material of upper layer resin can be suppressed to the minimum.
- the upper layer resin may be applied by a spray method.
- the thickness of the upper layer resin can be easily adjusted.
- the thickness is uniform.
- the upper layer resin is preferably applied using, for example, a swirl nozzle, electrostatic nozzle, ultrasonic nozzle or the like. Since the fluorine-containing monomer contained in the upper layer resin is relatively expensive, the material cost of the optical film can be reduced by thinly applying the upper layer resin. Moreover, the apparatus cost can be suppressed by adopting the spray system.
- the mold may be subjected to a mold release process.
- die can be made low, and when pressing the said metal mold
- the said resin layer is hardened, it can prevent suitably that the said fluorine-containing monomer leaves
- the concentration of fluorine atoms in the vicinity of the surface of the optical film can be suitably increased.
- the mold release treatment may be a surface treatment with a silane coupling agent. Thereby, the said mold release process can be performed suitably.
- the viscosity of the lower layer resin may be greater than 10 cp and less than 10,000 cp at 25 ° C.
- the viscosity of the upper layer resin may be greater than 0.1 cp and less than 100 cp at 25 ° C. Thereby, the fluidity
- the fluorine-containing monomer may be cured by ultraviolet rays. Thereby, the said fluorine-containing monomer can be utilized effectively.
- the concentration of the fluorine-containing monomer in the upper layer resin may be greater than 0% by weight and less than 20% by weight. Thereby, generation
- the upper layer resin may not contain a solvent. That is, the upper layer resin may be a solventless resin. When no solvent is added to the upper layer resin, an apparatus for drying and removing the solvent is unnecessary, and the apparatus cost can be reduced. Moreover, since the said solvent is not used, the cost can be reduced and productivity can be improved. On the other hand, when a solvent is added to the upper layer resin, there is a concern that the fluorine-containing monomer is excessively mixed and the concentration of fluorine atoms in the vicinity of the surface of the optical film is lowered. Moreover, since volatility becomes high, there exists a possibility that applicability
- the compatible monomer may have an acid amide bond in the molecule. Thereby, the said compatible monomer can be utilized effectively.
- the difference between the solubility parameter of the compatible monomer and the solubility parameter of the fluorine-containing monomer may be 0 (cal / cm 3 ) 1/2 or more and 4.0 (cal / cm 3 ) 1/2 or less. Good. Thereby, the compatibility of the said compatible monomer and the said fluorine-containing monomer can fully be improved.
- the difference between the solubility parameter of the compatible monomer and the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin is 0 (cal / cm 3 ) 1/2 or more, 3.0 (cal / cm 3 ) It may be 1/2 or less. Thereby, the compatibility of the said compatible monomer and the said lower layer resin can fully be improved.
- the difference between the solubility parameter of the compatible monomer and the solubility parameter of the monomer component excluding the compatible monomer in the upper layer resin is 0 (cal / cm 3 ) 1/2 or more, 3.0 (cal / cm 3 ) It may be 1/2 or less. Thereby, the compatibility of the said compatible monomer and the said upper layer resin can fully be improved.
- the difference between the solubility parameter of the fluorine-containing monomer and the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin is 3.0 (cal / cm 3 ) 1/2 or more, 5.0 (cal / Cm 3 ) 1/2 or less.
- the difference between the solubility parameter of the substrate film and the solubility parameter of the monomer component excluding the compatible monomer in the lower layer resin is 0 (cal / cm 3 ) 1/2 or more, 5.0 (cal / cm 3). ) It may be 1/2 or less. Thereby, the adhesiveness of the said base film and the said lower layer resin can fully be improved.
- the contact angle of water with respect to the surface of the optical film may be 100 ° or more, and the contact angle of hexadecane may be 40 ° or more. Thereby, the said optical film with sufficiently high water repellency and oil repellency is obtained.
- the ratio of the number of carbon atoms, the number of nitrogen atoms, the number of oxygen atoms, and the number of fluorine atoms to the total number of fluorine atoms on the surface of the concavo-convex structure is 43 atom% or more. Also good. Thereby, the above-mentioned optical film having a sufficiently excellent antifouling property can be realized.
- the concentration of the fluorine atom in the cured resin layer is 2% or less by X-ray photoelectron spectroscopy under the conditions of an X-ray beam diameter of 100 ⁇ m, an analysis area of 1000 ⁇ m ⁇ 500 ⁇ m, and a photoelectron extraction angle of 45 °.
- at least one atom selected from the group consisting of the carbon atom derived from CF 2 bond, the carbon atom derived from CF 3 bond and OCF 2 bond, and the oxygen atom derived from OCF 2 bond is 95% or more of the number in the cured resin layer may be contained in a region within 1 ⁇ m in terms of polyhydroxystyrene in the depth direction from the surface of the concavo-convex structure.
- concentration of the said fluorine atom in the said cured resin layer is a low state of 2% or less
- mold containing the said fluorine atom is on the surface side (the surface side of the said uneven structure) of the said cured resin layer. It is possible to realize the above optical film which is present at a high concentration and has a sufficiently excellent antifouling property.
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Abstract
Description
図1は、実施形態1の光学フィルムの製造プロセスを説明する断面模式図である(工程a~d)。以下、図1を参照して、実施形態1の光学フィルムの製造方法について詳述する。
まず、図1(a)に示すように、基材フィルム2上に下層樹脂3を塗布する。下層樹脂3の塗布方法としては特に限定されず、例えば、グラビア方式、スロットダイ方式等で塗布する方法が挙げられる。
図1(b)に示すように、塗布された下層樹脂3上に上層樹脂4を塗布する。その結果、上層樹脂4は、下層樹脂3の基材フィルム2とは反対側に形成される。上層樹脂4の塗布方法としては特に限定されず、例えば、スプレー方式、グラビア方式、スロットダイ方式等で塗布する方法が挙げられる。膜厚が容易に調整可能であり、かつ、装置コストを抑える観点からは、スプレー方式を採用することが好ましい。中でも、スワールノズル、静電ノズル、又は、超音波ノズルを用いて塗布することが特に好適である。
図1(c)に示すように、塗布された下層樹脂3、及び、上層樹脂4が積層された状態で、下層樹脂3、及び、上層樹脂4に金型5を上層樹脂4側から押し付け、凹凸構造を表面に有する樹脂層8を形成する。樹脂層8は、下層樹脂3、及び、上層樹脂4が一体化し、両者の界面が存在しないものである。樹脂層8に形成された凹凸構造は、複数の凸部(突起)6が可視光の波長以下のピッチ(隣接する凸部6の頂点間の距離)Pで設けられた構造、すなわち、モスアイ構造(蛾の目状の構造)に相当する。
凹凸構造が形成された樹脂層8を硬化する。その結果、図1(d)に示すような、凹凸構造を表面に有する樹脂層8の硬化物を含む光学フィルム1が完成する。樹脂層8の硬化方法としては特に限定されず、光、熱、光及び熱の併用等によるものが挙げられ、紫外線によるものであることが好ましい。樹脂層8に対する光照射の回数は特に限定されず、1回のみであってもよいし、複数回であってもよい。また、光照射は、基材フィルム2側から行ってもよく、樹脂層8側から行ってもよい。
Rf1-R2-D1 (A)
上記一般式(A)中、Rf1は、フルオロアルキル基、フルオロオキシアルキル基、フルオロアルケニル基、フルオロアルカンジイル基、及び、フルオロオキシアルカンジイル基からなる群より選択される少なくとも1つを含む部位を表す。R2は、アルカンジイル基、アルカントリイル基、又は、それらから導出されるエステル構造、ウレタン構造、エーテル構造、トリアジン構造を表す。D1は、反応性部位を表す。
CFn1H(3-n1)-(CFn2H(2-n2))kO-(CFn3H(2-n3))mO- (B)
-(CFn4H(2-n4))pO-(CFn5H(2-n5))sO- (C)
上記一般式(B)及び(C)中、n1は1~3の整数であり、n2~n5は1又は2であり、k、m、p、及び、sは0以上の整数である。n1~n5の好ましい組み合わせとしては、n1が2又は3、n2~n5が1又は2である組み合わせであり、より好ましい組み合わせとしては、n1が3、n2及びn4が2、n3及びn5が1又は2である組み合わせである。
下層樹脂3中の相溶性モノマーを除いたモノマー成分の溶解度パラメータと、フッ素含有モノマーの溶解度パラメータとの差が大きい(例えば、2.0(cal/cm3)1/2以上)場合に効果的である。上記第一のモノマーに含まれる相溶性モノマー、及び、上記第二のモノマーに含まれる相溶性モノマーは、溶解度パラメータが互いに異なっていてもよく、同じであってもよい。両者の溶解度パラメータが異なる場合、上記第一のモノマーに含まれる相溶性モノマーの溶解度パラメータは、上記第二のモノマーに含まれる相溶性モノマーの溶解度パラメータよりも大きいことが好ましい。両者の溶解度パラメータが同じである場合、同じ相溶性モノマーを用いてもよく、その溶解度パラメータは、下層樹脂3中の相溶性モノマーを除いたモノマー成分の溶解度パラメータと、フッ素含有モノマーの溶解度パラメータとの中間値であることが好ましい。
相溶性モノマーの溶解度パラメータは、下層樹脂3中の相溶性モノマーを除いたモノマー成分の溶解度パラメータと、フッ素含有モノマーの溶解度パラメータとの中間値であることが好ましい。
相溶性モノマーの溶解度パラメータは、下層樹脂3中の相溶性モノマーを除いたモノマー成分の溶解度パラメータと、フッ素含有モノマーの溶解度パラメータとの中間値であることが好ましい。
図2は、実施形態2の光学フィルムの製造プロセスを説明する断面模式図である(工程a~c)。実施形態2は、下層樹脂及び上層樹脂を同時に塗布すること以外、実施形態1と同様であるため、重複する点については説明を適宜省略する。
まず、図2(a)に示すように、基材フィルム2上に下層樹脂3、及び、上層樹脂4を共押し出し方式を用いて同時に塗布する。その結果、上層樹脂4は、下層樹脂3の基材フィルム2とは反対側に形成される。
図2(b)に示すように、塗布された下層樹脂3、及び、上層樹脂4が積層された状態で、下層樹脂3、及び、上層樹脂4に金型5を上層樹脂4側から押し付け、凹凸構造を表面に有する樹脂層8を形成する。
凹凸構造が形成された樹脂層8を硬化する。その結果、図2(c)に示すような、凹凸構造を表面に有する樹脂層8の硬化物を含む光学フィルム1が完成する。
図3は、実施形態3の光学フィルムの製造プロセスを説明する断面模式図である(工程a~c)。実施形態3は、上層樹脂の塗布方法を変更すること以外、実施形態1と同様であるため、重複する点については説明を適宜省略する。
まず、図3(a)に示すように、基材フィルム2上に下層樹脂3を塗布する。一方、金型5の凹凸面上に上層樹脂4を塗布する。なお、本実施形態における上層樹脂4の厚みDU(塗布後)は、図3(a)に示すように、金型5の凹部の底点に対応する位置から、金型5とは反対側の表面までの距離を示す。
図3(b)に示すように、上層樹脂4が塗布された金型5を、上層樹脂4側から、基材フィルム2上に塗布された下層樹脂3に押し付けることによって、下層樹脂3上に上層樹脂4を積層させると同時に凹凸構造を形成する。その結果、凹凸構造を表面に有する樹脂層8が形成される。
凹凸構造が形成された樹脂層8を硬化する。その結果、図3(c)に示すような、凹凸構造を表面に有する樹脂層8の硬化物を含む光学フィルム1が完成する。
実施形態1の光学フィルムの製造方法によって、光学フィルムを製造した。製造プロセスは以下のようにした。
まず、基材フィルム2上に下層樹脂3を、第一理化社製のバーコーター(製品名:No.03)で塗布した。基材フィルム2、及び、下層樹脂3としては、以下のものを用いた。
<基材フィルム2>
易接着処理が施された東洋紡社製のPETフィルム(製品名:コスモシャイン(登録商標)A4300)
基材フィルム2の溶解度パラメータは10.7(cal/cm3)1/2であった。基材フィルム2の厚みは75μmであった。
<下層樹脂3>
下記材料の混合物(各材料に付した数値は、下層樹脂3中の各材料の濃度を示す。)
・新中村化学工業社製のウレタンアクリレート(製品名:UA-7100):31重量%
・新中村化学工業社製の多官能アクリレート(製品名:ATM-35E):40重量%
・新中村化学工業社製の多官能アクリレート(製品名:A-TMM-3LM-N):27.5重量%
・BASF社製の光重合開始剤(製品名:IRGACURE819):1.5重量%
下層樹脂3(光重合開始剤を除く)の溶解度パラメータは10.5(cal/cm3)1/2であった。下層樹脂3の厚みDL(塗布後)は7μmであった。
塗布された下層樹脂3上に上層樹脂4を、Sono-Tek社製の超音波スプレー(ノズルの製品名:Vortex)で塗布した。上層樹脂4としては、以下のものを用いた。
<上層樹脂4>
下記材料の混合物(各材料に付した数値は、上層樹脂4中の各材料の濃度を示す。)
・フッ素含有モノマー:ダイキン工業社製のフッ素系添加剤(製品名:オプツールDAC-HP):10重量%
・相溶性モノマー:KJケミカルズ社製のアミド基含有モノマー(製品名:ACMO):90重量%
なお、フッ素含有モノマーとして用いた「オプツールDAC-HP」は、その固形分濃度が10重量%であった。フッ素含有モノマーの溶解度パラメータは9.7(cal/cm3)1/2であった。相溶性モノマーの溶解度パラメータは12.0(cal/cm3)1/2であった。上層樹脂4の厚みDU(塗布後)は1.3μmであった。
塗布された下層樹脂3、及び、上層樹脂4が積層された状態で、下層樹脂3、及び、上層樹脂4に金型5を上層樹脂4側から押し付け、凹凸構造を表面に有する樹脂層8を形成した。金型5としては、下記の方法で作製したものを用いた。
<金型5>
まず、ガラス基板上に、アルミニウムをスパッタリング法によって成膜した。次に、成膜されたアルミニウムに対して、陽極酸化及びエッチングを交互に繰り返すことによって、多数の微小な穴(凹部)(隣り合う穴の底点間の距離が可視光の波長以下)が設けられた陽極酸化層を形成した。具体的には、陽極酸化、エッチング、陽極酸化、エッチング、陽極酸化、エッチング、陽極酸化、エッチング、及び、陽極酸化を順に行う(陽極酸化:5回、エッチング:4回)ことによって、アルミニウムの内部に向かって細くなる形状(テーパー形状)を有する微小な穴(凹部)を多数形成し、その結果、凹凸構造を有する金型5が得られた。この際、陽極酸化を行う時間、及び、エッチングを行う時間を調整することによって、金型5の凹凸構造を変化させることができる。本実施例においては、1回の陽極酸化を行う時間を316秒とし、1回のエッチングを行う時間を825秒とした。金型5を走査型電子顕微鏡で観察したところ、凸部のピッチは200nm、凸部の高さは350nmであった。なお、金型5には、ダイキン工業社製のフッ素系添加剤(製品名:オプツールDSX)によって事前に離型処理を施した。
凹凸構造が形成された樹脂層8に、Fusion UV systems社製のUVランプ(製品名:LIGHT HANMAR6J6P3)を用いて、基材フィルム2側から紫外線(照射量:200mJ/cm2)を照射して硬化させた。その結果、凹凸構造を表面に有する樹脂層8の硬化物を含む光学フィルム1が完成した。光学フィルム1の表面仕様は、以下の通りであった。
凸部6の形状:釣鐘状
凸部6のピッチP:200nm
凸部6の高さ:200~250nm
上層樹脂4の厚みDU(塗布後)を6.5μmとしたこと以外、実施例1と同様の製造方法によって光学フィルムを製造した。
実施形態3の光学フィルムの製造方法によって、光学フィルムを製造した。製造プロセスは以下のようにした。
まず、基材フィルム2上に下層樹脂3を、第一理化社製のバーコーター(製品名:No.03)で塗布した。一方、金型5の凹凸面上に上層樹脂4を、Sono-Tek社製の超音波スプレー(ノズルの製品名:Vortex)で塗布した。基材フィルム2、下層樹脂3、上層樹脂4、及び、金型5としては、実施例1と同様なものを用いた。下層樹脂3の厚みDL(塗布後)は7μmであった。上層樹脂4の厚みDU(塗布後)は1.3μmであった。
上層樹脂4が塗布された金型5を、上層樹脂4側から、基材フィルム2上に塗布された下層樹脂3に押し付けることによって、下層樹脂3上に上層樹脂4を積層させると同時に凹凸構造を形成した。
凹凸構造が形成された樹脂層8に、Fusion UV systems社製のUVランプ(製品名:LIGHT HANMAR6J6P3)を用いて、基材フィルム2側から紫外線(照射量:200mJ/cm2)を照射して硬化させた。その結果、凹凸構造を表面に有する樹脂層8の硬化物を含む光学フィルム1が完成した。光学フィルム1の表面仕様は、以下の通りであった。
凸部6の形状:釣鐘状
凸部6のピッチP:200nm
凸部6の高さ:200~250nm
上層樹脂4の厚みDU(塗布後)を2.5μmとしたこと以外、実施例3と同様の製造方法によって光学フィルムを製造した。
上層樹脂4の厚みDU(塗布後)を3.8μmとしたこと以外、実施例3と同様の製造方法によって光学フィルムを製造した。
上層樹脂4の厚みDU(塗布後)を25.0μmとしたこと以外、実施例3と同様の製造方法によって光学フィルムを製造した。
基材フィルムの材料、上層樹脂の塗布に用いた装置、及び、上層樹脂の厚みを変更したこと以外、実施例3と同様の製造方法によって光学フィルムを製造した。
金型5に対する離型処理を事前に施さず、下層樹脂3の厚みDL(塗布後)を6μmとしたこと以外、実施例7と同様の製造方法によって光学フィルムを製造した。
図4は、比較例1の光学フィルムの製造プロセスを説明する断面模式図である(工程a~d)。製造プロセスは以下のようにした。
まず、図4(a)に示すように、基材フィルム102上に下層樹脂103aを、第一理化社製のバーコーター(製品名:No.03)で塗布した。基材フィルム102、及び、下層樹脂103aとしては、以下のものを用いた。
<基材フィルム102>
易接着処理が施された富士フイルム社製のTACフィルム(製品名:フジタックTD80UL)
基材フィルム102の厚みは75μmであった。
<下層樹脂103a>
下記材料の混合物(各材料に付した数値は、下層樹脂103a中の各材料の濃度を示す。)
・新中村化学工業社製のウレタンアクリレート(製品名:UA-7100):31重量%
・新中村化学工業社製の多官能アクリレート(製品名:ATM-35E):40重量%
・新中村化学工業社製の多官能アクリレート(製品名:A-TMM-3LM-N):27.5重量%
・BASF社製の光重合開始剤(製品名:IRGACURE819):1.5重量%
下層樹脂103aの厚み(塗布後)は7μmであった。
図4(b)に示すように、塗布された下層樹脂103aに金型105を押し付け、凹凸構造を形成した。金型105としては、下記の方法で作製したものを用いた。
<金型105>
まず、ガラス基板上に、アルミニウムをスパッタリング法によって成膜した。次に、成膜されたアルミニウムに対して、陽極酸化及びエッチングを交互に繰り返すことによって、多数の微小な穴(凹部)(隣り合う穴の底点間の距離が可視光の波長以下)が設けられた陽極酸化層を形成した。具体的には、陽極酸化、エッチング、陽極酸化、エッチング、陽極酸化、エッチング、陽極酸化、エッチング、及び、陽極酸化を順に行う(陽極酸化:5回、エッチング:4回)ことによって、アルミニウムの内部に向かって細くなる形状(テーパー形状)を有する微小な穴(凹部)を多数形成し、その結果、凹凸構造を有する金型105が得られた。本比較例においては、1回の陽極酸化を行う時間を316秒とし、1回のエッチングを行う時間を825秒とした。金型105を走査型電子顕微鏡で観察したところ、凸部のピッチは200nm、凸部の高さは350nmであった。なお、金型105には、ダイキン工業社製のフッ素系添加剤(製品名:オプツールDSX)によって事前に離型処理を施した。
図4(c)に示すように、凹凸構造が形成された下層樹脂103aに、Fusion UV systems社製のUVランプ(製品名:LIGHT HANMAR6J6P3)を用いて、基材フィルム102側から紫外線(照射量:200mJ/cm2)を照射して硬化させた。そして、硬化された下層樹脂103aの表面に対して酸素(O2)プラズマ処理を施した後、下層樹脂103a上に二酸化ケイ素(SiO2)を高周波(RF)スパッタ法によって成膜し、二酸化ケイ素の層109を形成した。二酸化ケイ素の層109の厚みは10nmであった。
図4(d)に示すように、二酸化ケイ素の層109上に上層樹脂104を、誘導加熱方式(真空度:1×10-4~1×10-3Pa)を用いて蒸着した。その結果、光学フィルム101aが完成した。上層樹脂104としては、フッ素原子107を含有するダイキン工業社製のフッ素系添加剤(製品名:オプツールDSX)を用いた。上層樹脂104の厚みは10nm以下であった。また、光学フィルム101aの表面仕様は、以下の通りであった。
凸部106aの形状:釣鐘状
凸部106aのピッチQ1:200nm
凸部106aの高さ:200~250nm
二酸化ケイ素を成膜する際の下層樹脂103aへのダメージを無くすことを目的として、二酸化ケイ素を成膜しなかったこと以外、比較例1と同様の製造方法によって光学フィルムを製造した。
図5は、比較例3の光学フィルムの製造プロセスを説明する断面模式図である(工程a~c)。製造プロセスは以下のようにした。
まず、図5(a)に示すように、基材フィルム102上に、フッ素原子107を含有するフッ素含有モノマーを添加した下層樹脂103bを、第一理化社製のバーコーター(製品名:No.03)で塗布した。基材フィルム102、及び、下層樹脂103bとしては、以下のものを用いた。
<基材フィルム102>
易接着処理が施された富士フイルム社製のTACフィルム(製品名:フジタックTD80UL)
基材フィルム102の厚みは75μmであった。
<下層樹脂103b>
下記材料の混合物(各材料に付した数値は、下層樹脂103b中の各材料の濃度を示す。)
・新中村化学工業社製のウレタンアクリレート(製品名:UA-7100):24.5重量%
・新中村化学工業社製の多官能アクリレート(製品名:ATM-35E):32.0重量%
・新中村化学工業社製の多官能アクリレート(製品名:A-TMM-3LM-N):22.0重量%
・BASF社製の光重合開始剤(製品名:IRGACURE819):1.5重量%
・フッ素含有モノマー:ダイキン工業社製のフッ素系添加剤(製品名:オプツールDAC-HP):20重量%
下層樹脂103bの厚み(塗布後)は7μmであった。
図5(b)に示すように、塗布された下層樹脂103bに金型105を押し付け、凹凸構造を形成した。金型105としては、比較例1と同様なものを用いた。
図5(c)に示すように、凹凸構造が形成された下層樹脂103bに、Fusion UV systems社製のUVランプ(製品名:LIGHT HANMAR6J6P3)を用いて、基材フィルム102側から紫外線(照射量:200mJ/cm2)を照射して硬化させた。その結果、光学フィルム101bが完成した。光学フィルム101bの表面仕様は、以下の通りであった。
凸部106bの形状:釣鐘状
凸部106bのピッチQ2:200nm
凸部106bの高さ:200~250nm
実施例1~8、及び、比較例1~3の光学フィルムについて、反射防止性、防汚性(撥水性、撥油性、及び、拭き取り性)、耐擦傷性、透明性、並びに、滑り性の評価結果を、表1に示す。
上述したように、実施形態3の光学フィルムの製造方法によれば、より優れた防汚性が実現可能であることが分かった。以下では、実施形態3の光学フィルムの製造方法によって製造される光学フィルムの検討例を挙げて、防汚性に優れた光学フィルムの好ましい特徴について説明する。
実施形態3の光学フィルムの製造方法によって、光学フィルムを製造した。製造プロセスは以下のようにした。
まず、基材フィルム2上に下層樹脂3を、第一理化社製のバーコーター(製品名:No.06)で塗布した。一方、金型5の凹凸面上に上層樹脂4を、浜松ナノテクノロジー社製の静電スプレー(製品名:PDS-Dシリーズ)で塗布した。静電ノズルに対する印加電圧は、2.5kVであった。基材フィルム2、下層樹脂3、及び、上層樹脂4としては、以下のものを用いた。金型5としては、実施例1と同様なものを用いた。
易接着処理が施された東洋紡社製のPETフィルム(製品名:コスモシャインA4300)
基材フィルム2の厚みは60μmであった。
下記材料の混合物(各材料に付した数値は、下層樹脂3中の各材料の濃度を示す。)
・新中村化学工業社製のウレタンアクリレート(製品名:UA-7100):31重量%
・新中村化学工業社製の多官能アクリレート(製品名:ATM-35E):40重量%
・新中村化学工業社製の多官能アクリレート(製品名:A-TMM-3LM-N):27.5重量%
・BASF社製の光重合開始剤(製品名:IRGACURE819):1.5重量%
下層樹脂3の厚みDL(塗布後)は14μmであった。
下記材料の混合物(各材料に付した数値は、上層樹脂4中の各材料の濃度を示す。)
・フッ素含有モノマーA:10重量%
・フッ素含有モノマーB:40重量%
・相溶性モノマー:KJケミカルズ社製のアミド基含有モノマー(製品名:ACMO):50重量%
フッ素含有モノマーAは、4-アクリロイルモルホリン(濃度:75%以上、85%以下)と、パーフルオロポリエーテル(PFPE)(濃度:15%以上、25%以下)との混合物であり(括弧中の数値は、フッ素含有モノマーA中の各成分の濃度を示す。)、その固形分濃度が20重量%であった。上層樹脂4中のフッ素含有モノマーAの固形分濃度は、2.2重量%であった。フッ素含有モノマーBは、上記特許文献4に記載のフッ素系界面活性剤であった。金型5に対する上層樹脂4の塗布量は2.1μlであり、塗布面積は80mm×70mmであった。すなわち、上層樹脂4の厚み(換算値)は0.375μmであった。
上層樹脂4が塗布された金型5を、上層樹脂4側から、基材フィルム2上に塗布された下層樹脂3に押し付けることによって、下層樹脂3上に上層樹脂4を積層させると同時に凹凸構造を形成した。
凹凸構造が形成された樹脂層8に、LPL社製のビデオライト(製品名:VL-G151)を用いて、基材フィルム2側から紫外線を3分間照射して硬化させた(積算光量:54mJ/cm2)。その結果、凹凸構造を表面に有する樹脂層8の硬化物(以下、硬化樹脂層とも言う。)を含む光学フィルム1が完成した。光学顕微鏡で観測したところ、硬化樹脂層の厚みは11.5μmであった。光学フィルム1の表面仕様は、以下の通りであった。
凸部6の形状:釣鐘状
凸部6のピッチP:200nm
凸部6の高さ:250~300nm
金型に対する上層樹脂の塗布量を変更したこと以外、検討例1と同様の製造方法によって光学フィルムを製造した。
金型に対する上層樹脂の塗布量を変更したこと以外、検討例1と同様の製造方法によって光学フィルムを製造した。
金型に対する上層樹脂の塗布量を変更したこと以外、検討例1と同様の製造方法によって光学フィルムを製造した。
検討例1~4の光学フィルムについて、防汚性(撥水性、撥油性、及び、指紋拭き取り性)を評価した。評価結果を表2に示す。
検討例1~4の光学フィルムの表面、すなわち、凹凸構造の表面に対して、X線光電子分光法(XPS:X-ray Photoelectron Spectroscopy)による測定を行った。X線光電子分光法によれば、試料の表面にX線を照射し、そこから飛び出す光電子の運動エネルギーを測定することによって、試料の構成原子の組成及び化学結合状態(結合種)を分析することができる。測定装置としては、アルバック・ファイ社製のX線光電子分光分析装置(製品名:PHI 5000 VersaProbe II)を用い、その仕様は下記の通りであった。
<装置仕様>
・X線源:単色化AlKα線(1486.6eV)
・分光器:静電同心半球型分析器
・増幅器:多チャンネル式
<測定条件>
・X線ビーム径:100μm(25W、15kV)
・分析面積:1000μm×500μm
・光電子の取り出し角度:45°
・パスエネルギー:187.85eV
X線光電子分光法によって検討例1~4の光学フィルムの表面のナロースペクトルを測定し、上層樹脂4の厚みに対するヘキサデカンの接触角の傾向とフッ素原子を含む結合種との相関性を調査した。
・X線ビーム径:100μm(25W、15kV)
・分析面積:1000μm×500μm
・光電子の取り出し角度:45°
・パスエネルギー:46.95eV
・「○」:C-C結合等由来のピーク面積(ピークC1の面積)に対する、CF2結合由来のピーク面積(ピークC6の面積)の比率
・「□」:C-O結合、C-N結合等由来のピーク面積(ピークC2の面積とピークC3の面積との和)に対する、CF2結合由来のピーク面積(ピークC6の面積)の比率
・「△」:CHF結合、COO結合等由来のピーク面積(ピークC4の面積とピークC5の面積との和)に対する、CF2結合由来のピーク面積(ピークC6の面積)の比率
ここで、図13中の縦軸について、上記「○」及び「□」は左側の縦軸に対応し、上記「△」は右側の縦軸に対応している。
・「○」:C-C結合等由来のピーク面積(ピークC1の面積)に対する、CF3結合及びOCF2結合由来のピーク面積(ピークC7の面積)の比率
・「□」:C-O結合、C-N結合等由来のピーク面積(ピークC2の面積とピークC3の面積との和)に対する、CF3結合及びOCF2結合由来のピーク面積(ピークC7の面積)の比率
・「△」:CHF結合、COO結合等由来のピーク面積(ピークC4の面積とピークC5の面積との和)に対する、CF3結合及びOCF2結合由来のピーク面積(ピークC7の面積)の比率
ここで、図14中の縦軸について、上記「○」及び「□」は左側の縦軸に対応し、上記「△」は右側の縦軸に対応している。
検討例1~4の光学フィルムに対して、硬化樹脂層の構成原子の分布状態を調査するため、ガスクラスターイオンビーム(GCIB:Gas Cluster Ion Beam)によって凹凸構造をエッチングしながら、X線光電子分光法による測定を行った。
<スパッタリング条件>
・イオン源:アルゴンガスクラスターイオンビーム
・加速電圧:10kV(15mA Emission)
・試料電流:30nA
・ラスター領域:4mm×3mm
・Zalar回転:未使用
・スパッタリング時間:81分間(1.5分×2サイクル、3分×8サイクル、及び、6分×9サイクルの合計時間)
・スパッタリングレート(エッチングレート):27nm/分(ポリヒドロキシスチレン換算)
<帯電中和条件>
・電子銃:Bias 1.0V(20μA Emission)
・イオン銃:3V(7mA Emission)
[硬化樹脂層中のフッ素原子の濃度](単位:%)=[フッ素原子のプロファイルの面積]/[プロットエリアの面積]
ここで、[プロットエリアの面積]は、具体的には、横軸の範囲の長さ(11.5μm:硬化樹脂層の厚み)と縦軸の範囲の長さ(100%)との積を指す。
上記評価4で得られた結果に対して、硬化樹脂層におけるフッ素原子の分布状態をより詳細に調査した。図20は、検討例1~4の光学フィルムの硬化樹脂層におけるフッ素原子の分布状態を示すグラフである。アルゴンガスクラスターイオンビームによるスパッタリング条件、帯電中和条件、及び、X線光電子分光法による測定条件は、上記評価4と同様であった。
・MFS(単位:atom%):凹凸構造の表面における炭素原子の数、窒素原子の数、酸素原子の数、及び、フッ素原子の数の合計数に対するフッ素原子の数の比率
・MFD(単位:atom%):凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)離れた位置における炭素原子の数、窒素原子の数、酸素原子の数、及び、フッ素原子の数の合計数に対するフッ素原子の数の比率
上記評価5によって、硬化樹脂層におけるフッ素原子の分布状態が分かった。次に、硬化樹脂層の深さ方向に対するスペクトルのピークを結合種毎に分離することによって、硬化樹脂層におけるフッ素含有モノマーA及びフッ素含有モノマーBの含有成分(CF2結合、CF3結合、及び、OCF2結合)の分布状態を調査した。
・M1S:凹凸構造の表面から検出されるC1sピークにおける、CF2結合由来のピーク面積
・M1D:凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)離れた位置から検出されるC1sピークにおける、CF2結合由来のピーク面積
ここで、CF2結合由来のピークは、C1sピークから分離されたピーク(例えば、図11中のピークC6)に相当するものとして解析を行った。
・M2S:凹凸構造の表面から検出されるC1sピークにおける、CF3結合及びOCF2結合由来のピーク面積
・M2D:凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)離れた位置から検出されるC1sピークにおける、CF3結合及びOCF2結合由来のピーク面積
ここで、CF3結合及びOCF2結合由来のピークは、C1sピークから分離されたピーク(例えば、図11中のピークC7)に相当するものとして解析を行った。
・M3S:凹凸構造の表面から検出されるO1sピークにおける、OCF2結合由来のピーク面積
・M3D:凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)離れた位置から検出されるO1sピークにおける、OCF2結合由来のピーク面積
ここで、OCF2結合由来のピークは、O1sピークから分離されたピーク(例えば、図12中のピークO3)に相当するものとして解析を行った。
・M1T:硬化樹脂層中のCF2結合由来の炭素原子の数に相当するもの
・M1ST:凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)以内の領域に存在する、CF2結合由来の炭素原子の数に相当するもの
D=1000nm(1μm)であるときのM1ST/M1Tは、検討例1~4のいずれにおいても1であった。
・C1s(C6):炭素原子の数、窒素原子の数、酸素原子の数、及び、フッ素原子の数の合計数に対するCF2結合由来の炭素原子の数の比率
・C1s(C7):炭素原子の数、窒素原子の数、酸素原子の数、及び、フッ素原子の数の合計数に対するCF3結合及びOCF2結合由来の炭素原子の数の比率
・O1s(O3):炭素原子の数、窒素原子の数、酸素原子の数、及び、フッ素原子の数の合計数に対するOCF2結合由来の酸素原子の数の比率
・M1T:C1s(C6)のプロファイルの面積
・M1ST:C1s(C6)のプロファイルにおける横軸0~Dの範囲の面積
・M2T:硬化樹脂層中のCF3結合及びOCF2結合由来の炭素原子の数に相当するもの
・M2ST:凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)以内の領域に存在する、CF3結合及びOCF2結合由来の炭素原子の数に相当するもの
D=1000nm(1μm)であるときのM2ST/M2Tは、検討例1~4のいずれにおいても1であった。
・M2T:C1s(C7)のプロファイルの面積
・M2ST:C1s(C7)のプロファイルにおける横軸0~Dの範囲の面積
・M3T:硬化樹脂層中のOCF2結合由来の酸素原子の数に相当するもの
・M3ST:凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)以内の領域に存在する、OCF2結合由来の酸素原子の数に相当するもの
D=1000nm(1μm)であるときのM3ST/M3Tは、検討例1~3で1、検討例4で0.99であった。
・M3T:O1s(O3)のプロファイルの面積
・M3ST:O1s(O3)のプロファイルにおける横軸0~Dの範囲の面積
本発明の一態様は、複数の凸部が可視光の波長以下のピッチで設けられた凹凸構造を表面に有する光学フィルムの製造方法であって、下層樹脂及び上層樹脂を塗布する工程(1)と、塗布された上記下層樹脂及び上記上層樹脂が積層された状態で、上記下層樹脂及び上記上層樹脂に金型を上記上層樹脂側から押し付け、上記凹凸構造を表面に有する樹脂層を形成する工程(2)と、上記樹脂層を硬化する工程(3)とを含み、上記下層樹脂は、フッ素原子を含有しない少なくとも一種の第一のモノマーを含み、上記上層樹脂は、フッ素原子を含有しない少なくとも一種の第二のモノマー、及び、フッ素含有モノマーを含み、上記第一のモノマー及び上記第二のモノマーの少なくとも一方は、上記フッ素含有モノマーと相溶する相溶性モノマーを含み、かつ、上記下層樹脂及び上記上層樹脂中に溶解する光学フィルムの製造方法であってもよい。
すなわち、上記工程(1)は、上記下層樹脂及び上記上層樹脂を基材フィルム上に順に塗布することによって行われてもよい。この場合、一般的な塗布方式(例えば、グラビア方式、スロットダイ方式等)の装置を併設することによって、上記下層樹脂及び上記上層樹脂の塗布を好適に行うことができる。
すなわち、上記工程(1)は、上記下層樹脂及び上記上層樹脂を基材フィルム上に同時に塗布することによって行われてもよい。この場合、上記下層樹脂及び上記上層樹脂の塗布を好適に行うことができる。更に、上記下層樹脂及び上記上層樹脂を上記基材フィルム上に順に塗布する場合よりも、塗布装置を簡略化し、工程数を減らすことができるため、生産性が高まる。
すなわち、上記工程(1)は、上記上層樹脂及び上記下層樹脂を上記金型上に順に塗布することによって行われてもよい。この場合、例えば、上記金型としてフレキシブルなものを用いれば、上記基材フィルムの形状によらず、上記凹凸構造を容易に形成することができる。
すなわち、上記工程(1)は、上記上層樹脂及び上記下層樹脂を上記金型上に同時に塗布することによって行われてもよい。この場合、例えば、上記金型としてフレキシブルなものを用いれば、上記基材フィルムの形状によらず、上記凹凸構造を容易に形成することができる。
すなわち、上記工程(1)は、上記下層樹脂を基材フィルム上に塗布し、上記上層樹脂を上記金型上に塗布することによって行われ、上記工程(2)は、上記上層樹脂が塗布された上記金型を、上記上層樹脂側から、上記基材フィルム上に塗布された上記下層樹脂に押し付けることによって行われてもよい。この場合、上記上層樹脂を上記下層樹脂上へ積層させることと上記凹凸構造の形成とを同時に行うことができる。更に、上記下層樹脂及び上記上層樹脂を上記基材フィルム上に順に塗布する場合よりも、工程数を減らすことができる。また、本方法によれば、防汚性を好適に高めることができ、特に上層樹脂の構成材料のロスを最小限に抑えることができる。
2、102:基材フィルム
3、103a、103b:下層樹脂
4、104:上層樹脂
5、105:金型
6、106a、106b:凸部
7、107:フッ素原子
8:樹脂層
109:二酸化ケイ素の層
P、Q1、Q2:ピッチ
DL:下層樹脂の厚み
DU:上層樹脂の厚み
C1、C2、C3、C4、C5、C6、C7、CR、O1、O2、O3、OR:ピーク
Claims (25)
- 複数の凸部が可視光の波長以下のピッチで設けられた凹凸構造を表面に有する光学フィルムの製造方法であって、
下層樹脂及び上層樹脂を塗布する工程(1)と、
塗布された前記下層樹脂及び前記上層樹脂が積層された状態で、前記下層樹脂及び前記上層樹脂に金型を前記上層樹脂側から押し付け、前記凹凸構造を表面に有する樹脂層を形成する工程(2)と、
前記樹脂層を硬化する工程(3)とを含み、
前記下層樹脂は、フッ素原子を含有しない少なくとも一種の第一のモノマーを含み、
前記上層樹脂は、フッ素原子を含有しない少なくとも一種の第二のモノマー、及び、フッ素含有モノマーを含み、
前記第一のモノマー及び前記第二のモノマーの少なくとも一方は、前記フッ素含有モノマーと相溶する相溶性モノマーを含み、かつ、前記下層樹脂及び前記上層樹脂中に溶解することを特徴とする光学フィルムの製造方法。 - 前記工程(1)は、前記下層樹脂及び前記上層樹脂を基材フィルム上に順に塗布することによって行われることを特徴とする請求項1に記載の光学フィルムの製造方法。
- 前記工程(1)は、前記下層樹脂及び前記上層樹脂を基材フィルム上に同時に塗布することによって行われることを特徴とする請求項1に記載の光学フィルムの製造方法。
- 前記工程(1)は、前記下層樹脂を基材フィルム上に塗布し、前記上層樹脂を前記金型上に塗布することによって行われ、
前記工程(2)は、前記上層樹脂が塗布された前記金型を、前記上層樹脂側から、前記基材フィルム上に塗布された前記下層樹脂に押し付けることによって行われることを特徴とする請求項1に記載の光学フィルムの製造方法。 - 前記上層樹脂は、スプレー方式によって塗布されることを特徴とする請求項2又は4に記載の光学フィルムの製造方法。
- 前記金型は、離型処理が施されていることを特徴とする請求項1~5のいずれかに記載の光学フィルムの製造方法。
- 前記離型処理は、シランカップリング剤による表面処理であることを特徴とする請求項6に記載の光学フィルムの製造方法。
- 前記下層樹脂の粘度は、25℃において、10cpよりも大きく、10000cp未満であることを特徴とする請求項1~7のいずれかに記載の光学フィルムの製造方法。
- 前記上層樹脂の粘度は、25℃において、0.1cpよりも大きく、100cp未満であることを特徴とする請求項1~8のいずれかに記載の光学フィルムの製造方法。
- 前記フッ素含有モノマーは、紫外線によって硬化することを特徴とする請求項1~9のいずれかに記載の光学フィルムの製造方法。
- 前記上層樹脂中の前記フッ素含有モノマーの濃度は、0重量%よりも大きく、20重量%未満であることを特徴とする請求項1~10のいずれかに記載の光学フィルムの製造方法。
- 前記上層樹脂には、溶剤が添加されていないことを特徴とする請求項1~11のいずれかに記載の光学フィルムの製造方法。
- 前記相溶性モノマーは、酸アミド結合を分子内に有することを特徴とする請求項1~12のいずれかに記載の光学フィルムの製造方法。
- 前記相溶性モノマーの溶解度パラメータと、前記フッ素含有モノマーの溶解度パラメータとの差は、0(cal/cm3)1/2以上、4.0(cal/cm3)1/2以下であることを特徴とする請求項1~13のいずれかに記載の光学フィルムの製造方法。
- 前記相溶性モノマーの溶解度パラメータと、前記下層樹脂中の前記相溶性モノマーを除いたモノマー成分の溶解度パラメータとの差は、0(cal/cm3)1/2以上、3.0(cal/cm3)1/2以下であることを特徴とする請求項1~14のいずれかに記載の光学フィルムの製造方法。
- 前記相溶性モノマーの溶解度パラメータと、前記上層樹脂中の前記相溶性モノマーを除いたモノマー成分の溶解度パラメータとの差は、0(cal/cm3)1/2以上、3.0(cal/cm3)1/2以下であることを特徴とする請求項1~15のいずれかに記載の光学フィルムの製造方法。
- 請求項1~16のいずれかに記載の光学フィルムの製造方法により製造される光学フィルム。
- 前記光学フィルムの表面に対して、水の接触角は100°以上であり、ヘキサデカンの接触角は40°以上であることを特徴とする請求項17に記載の光学フィルム。
- 凹凸構造を表面に有する硬化樹脂層を含む光学フィルムであって、
前記凹凸構造は、複数の凸部が可視光の波長以下のピッチで設けられたものであり、
前記硬化樹脂層は、炭素原子、窒素原子、酸素原子、及び、フッ素原子を構成原子として含み、
X線ビーム径100μm、分析面積1000μm×500μm、及び、光電子の取り出し角度45°の条件下でのX線光電子分光法によって測定される、前記凹凸構造の表面における前記炭素原子の数、前記窒素原子の数、前記酸素原子の数、及び、前記フッ素原子の数の合計数に対する前記フッ素原子の数の比率は、33atom%以上であることを特徴とする光学フィルム。 - 前記凹凸構造の表面における前記炭素原子の数、前記窒素原子の数、前記酸素原子の数、及び、前記フッ素原子の数の合計数に対する前記フッ素原子の数の比率は、43atom%以上であることを特徴とする請求項19に記載の光学フィルム。
- 前記硬化樹脂層中の前記フッ素原子の濃度は、2%以下であり、
X線ビーム径100μm、分析面積1000μm×500μm、及び、光電子の取り出し角度45°の条件下でのX線光電子分光法によって測定するとき、CF2結合由来の前記炭素原子と、CF3結合及びOCF2結合由来の前記炭素原子と、前記OCF2結合由来の前記酸素原子とからなる群より選択される少なくとも一種の原子は、前記凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算で1μm以内の領域に、前記硬化樹脂層中の数の95%以上含まれていることを特徴とする請求項19又は20に記載の光学フィルム。 - 凹凸構造を表面に有する硬化樹脂層を含む光学フィルムであって、
前記凹凸構造は、複数の凸部が可視光の波長以下のピッチで設けられたものであり、
前記硬化樹脂層は、炭素原子、窒素原子、酸素原子、及び、フッ素原子を構成原子として含み、
X線ビーム径100μm、分析面積1000μm×500μm、及び、光電子の取り出し角度45°の条件下でのX線光電子分光法によって測定される、前記凹凸構造の表面におけるO1sピークに対して、C-O結合由来のピーク、C=O結合由来のピーク、及び、OCF2結合由来のピークでカーブフィッティングして得られるスペクトルにおいて、前記C-O結合由来のピーク面積と前記C=O結合由来のピーク面積との和に対する前記OCF2結合由来のピーク面積の比率は、0.3以上であることを特徴とする光学フィルム。 - 前記硬化樹脂層中の前記フッ素原子の濃度は、2%以下であり、
X線ビーム径100μm、分析面積1000μm×500μm、及び、光電子の取り出し角度45°の条件下でのX線光電子分光法によって測定するとき、CF2結合由来の前記炭素原子と、CF3結合及び前記OCF2結合由来の前記炭素原子と、前記OCF2結合由来の前記酸素原子とからなる群より選択される少なくとも一種の原子は、前記凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算で1μm以内の領域に、前記硬化樹脂層中の数の95%以上含まれていることを特徴とする請求項22に記載の光学フィルム。 - 凹凸構造を表面に有する硬化樹脂層を含む光学フィルムであって、
前記凹凸構造は、複数の凸部が可視光の波長以下のピッチで設けられたものであり、
前記硬化樹脂層は、炭素原子、窒素原子、酸素原子、及び、フッ素原子を構成原子として含み、
X線ビーム径100μm、分析面積1000μm×500μm、及び、光電子の取り出し角度45°の条件下でのX線光電子分光法によって測定される、前記凹凸構造の表面における前記炭素原子の数、前記窒素原子の数、前記酸素原子の数、及び、前記フッ素原子の数の合計数に対する前記フッ素原子の数の比率をMFS(単位:atom%)と定義し、前記凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算でD(単位:nm)離れた位置における前記炭素原子の数、前記窒素原子の数、前記酸素原子の数、及び、前記フッ素原子の数の合計数に対する前記フッ素原子の数の比率をMFD(単位:atom%)と定義すると、MFD/MFS=0.3を満たすときのDは、240nm以上であることを特徴とする光学フィルム。 - 前記硬化樹脂層中の前記フッ素原子の濃度は、2%以下であり、
X線ビーム径100μm、分析面積1000μm×500μm、及び、光電子の取り出し角度45°の条件下でのX線光電子分光法によって測定するとき、CF2結合由来の前記炭素原子と、CF3結合及びOCF2結合由来の前記炭素原子と、前記OCF2結合由来の前記酸素原子とからなる群より選択される少なくとも一種の原子は、前記凹凸構造の表面から深さ方向にポリヒドロキシスチレン換算で1μm以内の領域に、前記硬化樹脂層中の数の95%以上含まれていることを特徴とする請求項24に記載の光学フィルム。
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