WO2015152218A1 - 基板処理装置、デバイス製造方法及び基板処理方法 - Google Patents
基板処理装置、デバイス製造方法及び基板処理方法 Download PDFInfo
- Publication number
- WO2015152218A1 WO2015152218A1 PCT/JP2015/060079 JP2015060079W WO2015152218A1 WO 2015152218 A1 WO2015152218 A1 WO 2015152218A1 JP 2015060079 W JP2015060079 W JP 2015060079W WO 2015152218 A1 WO2015152218 A1 WO 2015152218A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- line
- substrate processing
- pulse
- units
- Prior art date
Links
Images
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/20—Exposure; Apparatus therefor
- G03F7/24—Curved surfaces
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F9/00—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically
- G03F9/70—Registration or positioning of originals, masks, frames, photographic sheets or textured or patterned surfaces, e.g. automatically for microlithography
- G03F9/7088—Alignment mark detection, e.g. TTR, TTL, off-axis detection, array detector, video detection
Definitions
- a substrate processing apparatus and a device manufacturing method can be provided. Furthermore, it is possible to provide a substrate processing method in which drawing accuracy (such as uniformity of exposure amount) and fidelity when one drawing unit draws a pattern along a drawing line is improved.
- FIG. 15 is an explanatory diagram schematically showing the relationship between the reference pattern of the rotating drum and the drawing line.
- FIG. 16 is an explanatory diagram schematically illustrating a signal output from a photoelectric sensor that receives reflected light from the reference pattern of the rotating drum in a bright field.
- FIG. 17 is an explanatory diagram schematically showing a photoelectric sensor that receives reflected light from the reference pattern of the rotating drum in a dark field.
- FIG. 18 is an explanatory diagram schematically showing a signal output from a photoelectric sensor that receives reflected light from the reference pattern of the rotating drum in a dark field.
- FIG. 19 is an explanatory diagram schematically showing the positional relationship between the reference patterns of the rotating drum.
- the nip-type driving roller DR4 rotates while sandwiching both front and back surfaces of the substrate P conveyed from the edge position controller EPC, and sends the substrate P downstream in the conveyance direction, thereby directing the substrate P toward the rotating drum DR. Transport.
- the rotary drum DR supports a portion of the substrate P that is subjected to pattern exposure in close contact with a cylindrical outer peripheral surface having a constant radius from a rotation center line (rotation axis) AX2 extending in the Y direction. By rotating around, the substrate P is transported in the longitudinal direction.
- the apparatus frame 13 includes, in order from the lower side in the Z direction, a main body frame 21, a three-point seat 22 as a support mechanism, a first optical surface plate 23, a moving mechanism 24, and a second mechanism frame. And an optical surface plate 25.
- the main body frame 21 is a part that is installed on the installation surface E via the vibration isolation units SU1, SU2.
- the main body frame 21 rotatably supports (supports) the rotating drum DR and the tension adjusting rollers RT1 (not shown) and RT2.
- the first optical surface plate 23 is provided on the upper side in the vertical direction of the rotary drum DR, and is installed on the main body frame 21 via a three-point seat 22.
- the rotation range is, for example, about ⁇ several hundred milliradians with respect to the reference position, and is structured such that the angle can be set with a resolution of 1 to several milliradians.
- the moving mechanism 24 moves the second optical surface plate 25 in the X direction with respect to the first optical surface plate 23 while keeping the surface surfaces of the first optical surface plate 23 and the second optical surface plate 25 parallel to each other.
- a mechanism for precisely and finely shifting in at least one of the Y direction and the rotational axis I can be finely displaced from the reference position in the X or Y direction with a resolution of the order of ⁇ m.
- the light source device CNT is installed on the main body frame 21 of the device frame 13.
- the light source device CNT emits a laser beam as a drawing beam LB projected onto the substrate P.
- the light source device CNT includes a light source that emits light in a predetermined wavelength range suitable for exposure of the photosensitive functional layer on the substrate P and having a strong photoactive action in the ultraviolet range.
- a laser light source that uses YAG third harmonic laser light (wavelength 355 nm) and continuously oscillates or pulse oscillates at about several KHz to several hundreds of MHz can be used.
- Each of the drawing lines LL1 to LL5 is formed substantially in parallel along the width direction (Y direction) of the substrate P, that is, along the rotation center line AX2 of the rotary drum DR, and is shorter than the length of the substrate P in the width direction. Yes. More precisely, each of the drawing lines LL1 to LL5 is such that when the substrate P is transported at the reference speed by the substrate transport mechanism 12, the pattern splicing error obtained by the plurality of drawing lines LL1 to LL5 is minimized.
- the rotation center line AX2 of the rotary drum DR may be tilted by a predetermined angle with respect to the extending direction (axial direction or width direction).
- the odd-numbered first drawing line LL1, third drawing line LL3, and fifth drawing line LL5 are arranged at a predetermined interval in the direction of the center line AX2 of the rotary drum DR. Further, the even-numbered second drawing line LL2 and fourth drawing line LL4 are arranged at a predetermined interval in the direction of the center line AX2 of the rotary drum DR. At this time, the second drawing line LL2 is arranged between the first drawing line LL1 and the third drawing line LL3 in the direction of the center line AX2. Similarly, the third drawing line LL3 is disposed between the second drawing line LL2 and the fourth drawing line LL4 in the direction of the center line AX2.
- the drawing end positions of the odd-numbered drawing lines LL1 and LL3 and the drawing end positions of the even-numbered drawing lines LL2 and LL4 are equal to or less than the radial dimension of the spot light with respect to the Y direction. Are adjacent (or coincident) with each other.
- the drawing apparatus 11 includes a plurality of drawing units UW1 to UW5 described above, a branch optical system SL that branches the drawing beam LB from the light source device CNT and guides it to the drawing units UW1 to UW5, and calibration detection for performing calibration.
- System 31 The drawing apparatus 11 includes a plurality of drawing units UW1 to UW5 described above, a branch optical system SL that branches the drawing beam LB from the light source device CNT and guides it to the drawing units UW1 to UW5, and calibration detection for performing calibration.
- the first optical system 41 of the branch optical system SL is provided with a beam shifter mechanism 44 that two-dimensionally shifts the drawing beam LB in a plane orthogonal to the traveling axis of the drawing beam LB.
- the third optical system 43 is provided with a beam shifter mechanism 45 that laterally shifts the drawing beam LB two-dimensionally.
- a part on the light source device CNT side is installed on the main body frame 21, while another part on the drawing units UW1 to UW5 side is installed on the second optical surface plate 25.
- the first optical system 41 includes a half-wave plate 51, a polarizing mirror (polarizing beam splitter) 52, a beam diffuser 53, a first reflecting mirror 54, a first relay lens 55, and a second relay lens 56. , A beam shifter mechanism 44, a second reflection mirror 57, a third reflection mirror 58, a fourth reflection mirror 59, and a first beam splitter 60. 4 and 5, it is difficult to understand the positional relationship between these members, and therefore, description will be made with reference to the perspective view of FIG. 6.
- the drawing beam LB emitted from the light source device CNT in the + X direction is incident on the half-wave plate 51.
- the half-wave plate 51 is rotatable in the incident surface of the drawing beam LB.
- the polarization direction of the drawing beam LB incident on the half-wave plate 51 is a predetermined polarization direction corresponding to the rotational position (angle) of the half-wave plate 51.
- the drawing beam LB that has passed through the half-wave plate 51 is incident on the polarizing mirror 52.
- the polarization mirror 52 transmits a light component in a predetermined polarization direction included in the drawing beam LB, while reflecting a light component in the other polarization direction in the + Y direction. Therefore, the intensity of the drawing beam LB reflected by the polarizing mirror 52 can be adjusted according to the rotational position of the half-wave plate 51 by the cooperation of the half-wave plate 51 and the polarizing mirror 52.
- a part (unnecessary light component) of the drawing beam LB transmitted through the polarizing mirror 52 is irradiated to a beam diffuser (light trap) 53.
- the beam diffuser 53 absorbs a part of the light component of the incident drawing beam LB and suppresses the leakage of the light component to the outside. Further, when adjusting various optical systems through which the drawing beam LB passes, the beam diffuser 53 absorbs many light components of the drawing beam LB because the power is too strong and dangerous if the laser power remains at its maximum. In addition, it is also used to change the rotational position (angle) of the half-wave plate 51 to greatly attenuate the power of the drawing beam LB toward the drawing units UW1 to UW5.
- the drawing beam LB reflected by the polarizing mirror 52 in the + Y direction is reflected by the first reflecting mirror 54 in the + X direction, enters the beam shifter mechanism 44 via the first relay lens 55 and the second relay lens 56, The second reflection mirror 57 is reached.
- the first relay lens 55 converges the drawing beam LB (substantially parallel light beam) from the light source device CNT to form a beam waist, and the second relay lens 56 makes the drawing beam LB diverged after convergence into a parallel light beam again.
- the beam shifter mechanism 44 includes two parallel flat plates (quartz) arranged along the traveling direction (+ X direction) of the drawing beam LB, and one of the parallel flat plates is a Y-axis.
- the other plane parallel plate is provided so as to be inclined around an axis parallel to the Z axis.
- the drawing beam LB is laterally shifted in the ZY plane and emitted from the beam shifter mechanism 44 in accordance with the inclination angle of each parallel plane plate.
- the drawing beam LB is reflected in the ⁇ Y direction by the second reflecting mirror 57, reaches the third reflecting mirror 58, is reflected in the ⁇ Z direction by the third reflecting mirror 58, and reaches the fourth reflecting mirror 59. .
- the drawing beam LB is reflected in the + Y direction by the fourth reflecting mirror 59 and enters the first beam splitter 60.
- the first beam splitter 60 reflects a part of the light amount component of the drawing beam LB in the ⁇ X direction and guides it to the second optical system 42, and guides the remaining light amount component of the drawing beam LB to the third optical system 43.
- the drawing beam LB guided to the second optical system 42 is distributed to the three drawing units UW1, UW3, UW5, and the drawing beam LB guided to the third optical system 43 is further ahead. Is distributed to the two drawing units UW2 and UW4. Therefore, the first beam splitter 60 preferably has a ratio of reflectance to transmittance at the light splitting surface of 3: 2 (reflectance 60%, transmittance 40%), but it is not always necessary. It may be 1: 1.
- the third reflection mirror 58 and the fourth reflection mirror 59 are provided on the rotation axis I of the moving mechanism 24 at a predetermined interval. That is, the center line of the drawing beam LB (parallel light beam) reflected by the third reflection mirror 58 and directed to the fourth reflection mirror 59 is set to coincide with the rotation axis I (coaxial).
- the optical path of the drawing beam LB from the fourth reflection mirror 59 to the first beam splitter 60 is not changed. Therefore, even if the second optical surface plate 25 is rotated with respect to the first optical surface plate 23 by the moving mechanism 24, the drawing beam LB emitted from the light source device CNT installed on the main body frame 21 side is used as the second optical surface plate. It is possible to suitably and stably guide the plurality of drawing units UW1 to UW5 installed on the surface plate 25 side.
- the drawing beam LB reflected in the ⁇ X direction by the first beam splitter 60 of the first optical system 41 is reflected in the ⁇ Y direction by the fifth reflecting mirror 61 and enters the second beam splitter 62.
- a part of the drawing beam LB incident on the second beam splitter 62 is reflected in the ⁇ Z direction and guided to one drawing unit UW5 having an odd number (see FIG. 5).
- the drawing beam LB transmitted through the second beam splitter 62 is incident on the third beam splitter 63.
- a part of the drawing beam LB incident on the third beam splitter 63 is reflected in the ⁇ Z direction, and is guided to one odd-numbered drawing unit UW3 (see FIG. 5).
- the drawing beam LB transmitted through the third beam splitter 63 is reflected in the ⁇ Z direction by the sixth reflecting mirror 64 and guided to one odd-numbered drawing unit UW1 (see FIG. 5).
- the drawing beam LB irradiated to the odd-numbered drawing units UW1, UW3, UW5 is slightly inclined with respect to the ⁇ Z direction.
- the ratio of the reflectance and transmittance of the second beam splitter 62 is 1: 2
- the ratio of the reflectance and transmittance of the third beam splitter 63 is 1: 1. It is better to approach.
- the third optical system 43 branches the other drawing beam LB branched by the first beam splitter 60 of the first optical system 41 toward even-numbered drawing units UW2 and UW4 described later.
- the third optical system 43 includes a seventh reflection mirror 71, a beam shifter mechanism 45, an eighth reflection mirror 72, a fourth beam splitter 73, and a ninth reflection mirror 74.
- the drawing beam LB transmitted in the + Y direction by the first beam splitter 60 of the first optical system 41 is reflected in the + X direction by the seventh reflection mirror 71, passes through the beam shifter mechanism 45, and enters the eighth reflection mirror 72.
- the beam shifter mechanism 45 is composed of two parallel plane plates (quartz) that can be tilted similarly to the beam shifter mechanism 44, and the drawing beam LB traveling in the + X direction toward the eighth reflecting mirror 72 is laterally moved in the ZY plane. Shift.
- the drawing beam LB reflected in the ⁇ Y direction by the eighth reflecting mirror 72 is incident on the fourth beam splitter 73.
- a part of the drawing beam LB irradiated on the fourth beam splitter 73 is reflected in the ⁇ Z direction and guided to one even-numbered drawing unit UW4 (see FIG. 5).
- the drawing beam LB that has passed through the fourth beam splitter 73 is reflected in the ⁇ Z direction by the ninth reflecting mirror 74 and guided to one even-numbered drawing unit UW2.
- the drawing beam LB irradiated to the even-numbered drawing units UW2 and UW4 is slightly inclined with respect to the ⁇ Z direction.
- the drawing beam LB from the light source device CNT is branched into a plurality of parts toward the plurality of drawing units UW1 to UW5.
- the first beam splitter 60, the second beam splitter 62, the third beam splitter 63, and the fourth beam splitter 73 have the same beam intensity of the drawing beam LB irradiated to the plurality of drawing units UW1 to UW5.
- the reflectance is set to an appropriate reflectance according to the number of branches of the drawing beam LB.
- the beam shifter mechanism 44 is disposed between the second relay lens 56 and the second reflection mirror 57.
- the beam shifter mechanism 44 can finely adjust all the positions of the drawing lines LL1 to LL5 formed on the substrate P on the order of ⁇ m within the drawing surface of the substrate P.
- the beam shifter mechanism 45 finely draws even-numbered second drawing lines LL2 and fourth drawing lines LL4 on the drawing surface of the substrate P in the ⁇ m order among the drawing lines LL1 to LL5 formed on the substrate P. Can be adjusted.
- the configuration of the optical system in each of the drawing units UW1 to UW5 will be described with reference to FIG. Since the drawing units UW1 to UW5 have the same configuration, the first drawing unit UW1 (hereinafter simply referred to as the drawing unit UW1) will be described as an example.
- the drawing unit UW1 shown in FIG. 4 includes an optical deflector 81, a polarization beam splitter PBS, and a quarter wavelength plate so as to scan the spot light of the drawing beam LB along the drawing line LL1 (first drawing line LL1). 82, a scanner 83, a bending mirror 84, an f- ⁇ lens system 85, and a Y magnification correcting optical member (lens group) 86B including a cylindrical lens 86.
- a calibration detection system 31 is provided adjacent to the deflection beam splitter PBS.
- the control unit 16 shown in FIG. 1 switches the projection / non-projection of the drawing beam LB onto the substrate P at high speed by switching the optical deflector 81 to ON / OFF. Specifically, one of the drawing beams LB distributed by the branch optical system SL is irradiated to the optical deflector 81 through the relay lens 91 with a slight inclination with respect to the ⁇ Z direction. When the optical deflector 81 is switched OFF, the drawing beam LB goes straight in an inclined state and is shielded by a light shielding plate 92 provided at the end after passing through the optical deflector 81.
- the drawing beam LB (first-order diffracted light) is deflected in the ⁇ Z direction, passes through the optical deflector 81, and is above the Z direction of the optical deflector 81. Irradiation is performed on the polarization beam splitter PBS provided. Therefore, when the optical deflector 81 is switched ON, the spot light of the drawing beam LB is projected onto the substrate P, and when the optical deflector 81 is switched OFF, the spot light of the drawing beam LB is applied to the substrate P. Not projected.
- the drawing beam LB (first-order diffracted light) emitted from the optical deflector 81 diverges. Therefore, a relay lens 93 that returns the diverging drawing beam LB to a parallel light beam is provided after the optical deflector 81.
- the polarization beam splitter PBS reflects the drawing beam LB irradiated from the optical deflector 81 through the relay lens 93.
- the drawing beam LB emitted from the polarization beam splitter PBS is a quarter wavelength plate 82, a scanner 83 (rotating polygon mirror), a bending mirror 84, an f- ⁇ lens system 85, a Y magnification correcting optical member 86B, and a cylindrical lens.
- the light is condensed on the substrate P as scanning spot light.
- the polarization beam splitter PBS is projected onto the outer peripheral surface of the substrate P or the rotating drum DR below it in cooperation with the quarter wavelength plate 82 provided between the polarization beam splitter PBS and the scanner 83. Since the reflected light of the drawing beam LB moves backward in the order of the Y magnification correcting optical member 86B, the cylindrical lens 86, the f- ⁇ lens system 85, the bending mirror 84, and the scanner 83, the reflected light is transmitted. be able to.
- the drawing beam LB irradiated from the optical deflector 81 to the polarization beam splitter PBS is a laser beam that becomes S-polarized linearly polarized light and is reflected by the polarization beam splitter PBS.
- the drawing beam LB reflected by the polarization beam splitter PBS passes through the quarter-wave plate 82, the scanner 83, the bending mirror 84, the f- ⁇ lens system 85, the Y magnification correcting optical member 86B, and the cylindrical lens 86. Then, the spot light of the drawing beam LB irradiated onto the substrate P and condensed on the substrate P is circularly polarized.
- the reflected light from the substrate P travels backward through the transmission path of the drawing beam LB and passes through the quarter-wave plate 82 again, thereby becoming laser light that becomes P-polarized linearly polarized light. It becomes. For this reason, the reflected light reaching the polarization beam splitter PBS from the substrate P (or the rotating drum DR) is transmitted through the polarization beam splitter PBS and irradiated to the photoelectric sensor 31Cs of the calibration detection system 31 via the relay lens 94.
- the polarization beam splitter PBS is an optical splitter arranged between the scanning optical system including the scanner 83 and the calibration detection system 31. Since the calibration detection system 31 shares a part of the optical transmission system of the drawing beam LB to the substrate P, it becomes an easy and compact optical system.
- the scanner 83 includes a reflection mirror 96, a rotating polygon mirror (rotating polygonal mirror) 97, and an origin detector 98.
- the drawing beam LB parallel light beam
- the rotating polygon mirror 97 includes a rotating shaft 97a extending in the Z direction and a plurality of reflecting surfaces 97b formed around the rotating shaft 97a.
- the rotating polygon mirror 97 rotates the rotation axis 97a in a predetermined rotation direction so that the reflection angle of the drawing beam LB (the beam whose intensity is modulated by the optical deflector 81) irradiated to the reflection surface 97b is changed to the XY plane.
- the reflected drawing beam LB is collected into spot light by the bending mirror 84, the f- ⁇ lens system 85, and the second cylindrical lens 86 (and the Y magnification correcting optical member 86B).
- the light is scanned along the drawing line LL1 (similarly, LL2 to LL5) on the substrate P.
- the origin detector 98 detects the origin of the drawing beam LB scanned along the drawing line LL1 (similarly, LL2 to LL5) of the substrate P.
- the origin detector 98 is disposed on the opposite side of the reflecting mirror 96 with the drawing beam LB reflected by each reflecting surface 97b interposed therebetween.
- the photoelectric detector is illustrated as the origin detector 98 for simplicity of explanation, but actually, the detection beam is projected toward the reflecting surface 97b of the rotating polygon mirror 97 on which the drawing beam LB is projected.
- a detection light source such as an LED or a semiconductor laser is provided, and the origin detector 98 photoelectrically detects the reflected light of the detection beam on the reflecting surface 97b through a thin slit.
- the origin detector 98 outputs a pulse signal representing the origin always before a timing at which the spot light is irradiated to the drawing start position of the drawing lines LL1 (LL2 to LL5) on the substrate P. It is set to be.
- the drawing beam LB emitted from the scanner 83 to the bending mirror 84 is reflected in the ⁇ Z direction by the bending mirror 84 and enters the f- ⁇ lens system 85 and the cylindrical lens 86 (and the Y magnification correcting optical member 86B). .
- each reflecting surface 97b of the rotating polygon mirror 97 is not strictly parallel to the center line of the rotating shaft 97a but is slightly tilted (tilted), it is caused by the spot light projected on the substrate P.
- the drawing lines (LL1 to LL5) are blurred in the X direction on the substrate P for each reflecting surface 97b. Therefore, by using the two cylindrical lenses 95 and 86 with reference to FIG. 8, the blurring of the drawing lines LL1 to LL5 in the X direction with respect to the surface tilt of each reflecting surface 97b of the rotating polygon mirror 97 is reduced. Or explain that it can be resolved.
- FIG. 8 shows a state in which the optical paths of the cylindrical lens 95, the scanner 83, the f- ⁇ lens system 85, and the cylindrical lens 86 are expanded on the XY plane, and the right side of FIG. 8 expands the optical path in the XZ plane. Shows how it was done.
- the reflecting surface 97b to which the drawing beam LB of the rotating polygon mirror 97 is irradiated is arranged so as to be the entrance pupil position (front focal position) of the f- ⁇ lens system 85.
- the incident angle of the drawing beam LB incident on the f- ⁇ lens system 85 becomes ⁇ p with respect to the rotational angle ⁇ p / 2 of the rotating polygon mirror 97, and the substrate P (irradiated surface is proportional to the incident angle ⁇ p).
- the image height position of the spot light projected on is determined. Further, by setting the reflecting surface 97b to the front focal position of the f- ⁇ lens system 85, the drawing beam LB projected onto the substrate P is telecentric at any position on the drawing line (the main part of the drawing beam that becomes spot light). The light beam is always parallel to the optical axis AXf of the f- ⁇ lens system 85).
- the two cylindrical lenses 95 and 86 function as parallel flat glass having zero refractive power (power) in a plane (XY plane) perpendicular to the rotation axis 97a of the rotating polygon mirror 97.
- the lens In the Z direction (in the XZ plane) in which the rotation shaft 97a extends, the lens functions as a convex lens having a constant positive refractive power.
- the drawing beam LB (substantially parallel light beam) incident on the first cylindrical lens 95 has a circular shape of about several millimeters, but the focal position of the cylindrical lens 95 in the XZ plane is rotated via the reflection mirror 96.
- a slit-shaped spot light having a beam width of several mm in the XY plane and converged in the Z direction extends in the rotation direction on the reflection surface 97b and is condensed. To do.
- the drawing beam LB reflected by the reflecting surface 97b of the rotating polygon mirror 97 is a parallel light beam in the XY plane, but becomes a divergent light beam in the XZ plane (the direction in which the rotating shaft 97a extends), and the f- ⁇ lens system 85. Is incident on. Therefore, the drawing beam LB immediately after exiting the f- ⁇ lens system 85 is almost a parallel light beam in the XZ plane (the direction in which the rotation shaft 97a extends), but due to the action of the second cylindrical lens 86.
- the spot light is also condensed in the transport direction of the substrate P perpendicular to the direction in which the drawing lines LL1 to LL5 extend. As a result, a small circular spot light is projected on each drawing line on the substrate P.
- the cylindrical lens 86 By providing the cylindrical lens 86, the reflecting surface 97b of the rotating polygon mirror 97 and the substrate P (irradiated surface) are optically set in an image conjugate relationship within the XZ plane as shown on the right side of FIG. Can do. Therefore, even if each reflecting surface 97b of the rotating polygon mirror 97 has a tilt error with respect to the non-scanning direction (direction in which the rotating shaft 97a extends) orthogonal to the scanning direction of the drawing beam LB, the drawing line on the substrate P The positions (LL1 to LL5) do not shift in the non-scanning direction of the spot light (the transport direction of the substrate P). As described above, by providing the cylindrical lenses 95 and 86 before and after the rotating polygon mirror 97, it is possible to configure a surface tilt correction optical system of the polygon reflecting surface with respect to the non-scanning direction.
- the scanners 83 of the plurality of drawing units UW1 to UW5 have a symmetric configuration with respect to the center plane p3.
- three scanners 83 corresponding to the drawing units UW1, UW3, UW5 are arranged on the upstream side in the rotation direction of the rotary drum DR (the ⁇ X direction side in FIG. 7), and the drawing units UW2,
- Two scanners 83 corresponding to UW4 are arranged on the downstream side in the rotation direction of the rotary drum DR (the + X direction side in FIG. 7).
- the three upstream scanners 83 and the two downstream scanners 83 are arranged to face each other across the center plane p3.
- the three upstream scanners 83 and the two downstream scanners 83 are in an arrangement relationship rotated by 180 ° about the rotation axis I (Z axis). For this reason, for example, when the rotating polygon mirror 97 is irradiated with the drawing beam LB while the three upstream rotating polygon mirrors 97 rotate counterclockwise, the drawing beam LB reflected by the rotating polygon mirror 97 is drawn. Scanning is performed in a predetermined scanning direction (for example, + Y direction in FIG. 7) from the start position to the drawing end position.
- a predetermined scanning direction for example, + Y direction in FIG. 7
- the drawing beam LB reflected by the rotating polygon mirror 97 is changed to the drawing start position. Is scanned in the scanning direction (for example, the ⁇ Y direction in FIG. 7) opposite to the upstream three rotating polygon mirrors 97 from the drawing end position to the drawing end position.
- the axis of the drawing beam LB reaching the substrate P from the odd-numbered drawing units UW1, UW3, UW5 is in a direction coinciding with the installation direction line Le1. That is, the installation orientation line Le1 is a line connecting the odd-numbered drawing lines LL1, LL3, LL5 and the rotation center line AX2 in the XZ plane.
- the axis of the drawing beam LB reaching the substrate P from the even-numbered drawing units UW2 and UW4 is in a direction that coincides with the installation orientation line Le2.
- the installation orientation line Le2 is a line connecting the even-numbered drawing lines LL2 and LL4 and the rotation center line AX2 in the XZ plane. For this reason, each traveling direction (principal ray) of the drawing beam LB projected as spot light on the substrate P is set so as to be directed to the rotation center line AX2 of the rotating drum DR.
- the Y magnification correcting optical member 86B is arranged between the f- ⁇ lens system 85 and the substrate P.
- the Y magnification correcting optical member 86B can enlarge or reduce the drawing lines LL1 to LL5 formed by the respective drawing units UW1 to UW5 isotropically by a minute amount in the Y direction.
- a transparent parallel flat plate (quartz) having a certain thickness covering each of the drawing lines LL1 to LL5 is mechanically bent (bending) in the direction in which the drawing line extends to multiply the drawing line in the Y direction.
- a mechanism for changing the (scanning length) or a mechanism for changing the magnification (scanning length) in the Y direction of the drawing line by moving a part of the three lens systems of the convex lens, the concave lens, and the convex lens in the optical axis direction. Etc. can be used.
- the drawing apparatus 11 configured as described above draws a predetermined pattern on the substrate P by controlling each unit by the control unit 16. That is, the control unit 16 performs ON / OFF modulation of the optical deflector 81 based on CAD information of a pattern to be drawn on the substrate P during the period in which the drawing beam LB projected on the substrate P is scanned in the scanning direction. By doing so, the drawing beam LB is deflected, and a pattern is drawn on the photosensitive layer of the substrate P. Further, the control unit 16 synchronizes the scanning direction of the drawing beam LB that scans along the drawing line LL1 and the movement in the transport direction of the substrate P due to the rotation of the rotary drum DR, so that the drawing line in the exposure region A7 is synchronized. A predetermined pattern is drawn on the portion corresponding to LL1.
- the alignment microscopes AM1 and AM2 detect an alignment mark formed in advance on the substrate P, or a reference mark or reference pattern formed on the rotary drum DR.
- the alignment mark of the substrate P and the reference mark or reference pattern of the rotating drum DR are simply referred to as a mark.
- the alignment microscopes AM1 and AM2 are used to align (align) the substrate P and a predetermined pattern drawn on the substrate P, and to calibrate the rotary drum DR and the drawing device 11.
- the alignment microscopes AM1 and AM2 are provided upstream of the drawing lines LL1 to LL5 formed by the drawing device 11 in the rotation direction of the rotary drum DR (the conveyance direction of the substrate P). Further, the alignment microscope AM1 is arranged on the upstream side in the rotation direction of the rotary drum DR as compared with the alignment microscope AM2.
- the alignment microscopes AM1 and AM2 project the illumination light onto the substrate P or the rotating drum DR, and at the same time, an objective lens system GA (a representative lens of the alignment microscope AM2 in FIG. 9) serving as a detection probe for entering the light generated by the mark.
- Imaging system GD (represented in FIG. 9) that captures a mark image (bright field image, dark field image, fluorescent image, etc.) received through the objective lens system GA with a two-dimensional CCD, CMOS, etc.
- the illumination light for alignment is light in a wavelength region that has little sensitivity to the photosensitive layer on the substrate P, for example, light having a wavelength of about 500 to 800 nm.
- Alignment microscopes AM1 are provided in a plurality (for example, three) in a line in the Y direction (width direction of the substrate P). Similarly, a plurality of (for example, three) alignment microscopes AM2 are provided in a line in the Y direction (the width direction of the substrate P). That is, a total of six alignment microscopes AM1 and AM2 are provided.
- FIG. 3 shows the arrangement of the objective lens systems GA1 to GA3 of the three alignment microscopes AM1 among the objective lens systems GA of the six alignment microscopes AM1 and AM2 for easy understanding.
- the observation regions (detection positions) Vw1 to Vw3 on the substrate P (or the outer peripheral surface of the rotary drum DR) by the objective lens systems GA1 to GA3 of the three alignment microscopes AM1 are, as shown in FIG. 3, the rotation center line AX2 and They are arranged at predetermined intervals in the parallel Y direction.
- the optical axes La1 to La3 of the objective lens systems GA1 to GA3 passing through the centers of the observation regions Vw1 to Vw3 are all parallel to the XZ plane.
- observation regions Vw4 to Vw6 on the substrate P (or the outer peripheral surface of the rotating drum DR) by the objective lens systems GA of the three alignment microscopes AM2 are Y parallel to the rotation center line AX2, as shown in FIG. Arranged at predetermined intervals in the direction.
- the optical axes La4 to La6 of each objective lens system GA passing through the centers of the observation regions Vw4 to Vw6 are all parallel to the XZ plane.
- the observation areas Vw1 to Vw3 and the observation areas Vw4 to Vw6 are arranged at a predetermined interval in the rotation direction of the rotary drum DR.
- the mark observation areas Vw1 to Vw6 by the alignment microscopes AM1 and AM2 are set to a range of, for example, about 500 to 200 ⁇ m square on the substrate P and the rotating drum DR.
- the optical axes La1 to La3 of the alignment microscope AM1 that is, the optical axes La1 to La3 of the objective lens system GA, are set in the same direction as the installation orientation line Le3 extending in the radial direction of the rotary drum DR from the rotation center line AX2.
- the installation direction line Le3 is a line connecting the observation regions Vw1 to Vw3 of the alignment microscope AM1 and the rotation center line AX2 when viewed in the XZ plane of FIG.
- the optical axes La4 to La6 of the alignment microscope AM2 are set in the same direction as the installation direction line Le4 extending in the radial direction of the rotary drum DR from the rotation center line AX2.
- the installation direction line Le4 is a line connecting the observation areas Vw4 to Vw6 of the alignment microscope AM2 and the rotation center line AX2 when viewed in the XZ plane of FIG.
- the angle formed by the center plane p3 and the installation orientation line Le3 is the same as that of the center plane p3. It is larger than the angle formed by the installation orientation line Le4.
- an exposure area A7 drawn by each of the five drawing lines LL1 to LL5 is arranged at a predetermined interval in the X direction.
- a plurality of alignment marks Ks1 to Ks3 (hereinafter abbreviated as marks) for alignment are formed in a cross shape, for example.
- the mark Ks1 is provided in the peripheral area on the ⁇ Y side of the exposure area A7 at a constant interval in the X direction, and the mark Ks3 is fixed in the peripheral area on the + Y side of the exposure area A7 in the X direction. Provided at intervals. Further, the mark Ks2 is provided at the center in the Y direction in a blank area between two exposure areas A7 adjacent in the X direction.
- the marks Ks1 are sequentially captured while the substrate P is being sent in the observation region Vw1 of the objective lens system GA1 of the alignment microscope AM1 and in the observation region Vw4 of the objective lens system GA of the alignment microscope AM2. Formed. Further, the mark Ks3 is sequentially captured while the substrate P is being sent in the observation region Vw3 of the objective lens system GA3 of the alignment microscope AM1 and in the observation region Vw6 of the objective lens system GA of the alignment microscope AM2. Formed. Further, the marks Ks2 are sequentially captured while the substrate P is being sent in the observation region Vw2 of the objective lens system GA2 of the alignment microscope AM1 and in the observation region Vw5 of the objective lens system GA of the alignment microscope AM2. It is formed so that.
- the alignment microscopes AM1 and AM2 on both sides in the Y direction of the rotating drum DR constantly observe or detect the marks Ks1 and Ks3 formed on both sides in the width direction of the substrate P. be able to.
- the center alignment microscope AM1 and AM2 in the Y direction of the rotary drum DR is a mark formed in a blank portion between the exposure areas A7 drawn on the substrate P. Ks2 can always be observed or detected.
- the exposure apparatus EX is a so-called multi-beam type drawing apparatus
- a plurality of patterns drawn on the substrate P are drawn in the Y direction by the drawing lines LL1 to LL5 of the plurality of drawing units UW1 to UW5. Therefore, calibration is required to keep the joining accuracy of the plurality of drawing units UW1 to UW5 within an allowable range.
- the relative positional relationship of the observation areas Vw1 to Vw6 of the alignment microscopes AM1 and AM2 with respect to the respective drawing lines LL1 to LL5 of the plurality of drawing units UW1 to UW5 needs to be precisely determined by the baseline management. Calibration is also necessary for the baseline management.
- the exposure apparatus EX uses a rotating drum DR having a reference mark or a reference pattern on the outer peripheral surface.
- the rotary drum DR has scale portions GPa and GPb that constitute a part of a rotational position detecting mechanism 14 to be described later, on both ends of the outer peripheral surface thereof, as in FIGS.
- the rotary drum DR is provided with engraved restriction bands CLa and CLb having narrow grooves by concave grooves or convex rims on the inner sides of the scale parts GPa and GPb.
- the width in the Y direction of the substrate P is set to be smaller than the interval in the Y direction between the two regulation bands CLa and CLb, and the substrate P is sandwiched between the regulation bands CLa and CLb on the outer peripheral surface of the rotary drum DR. It is supported in close contact with the inner region.
- the rotating drum DR has a plurality of line patterns RL1 (line patterns) inclined at +45 degrees with respect to the rotation center line AX2 and ⁇ 45 with respect to the rotation center line AX2 on the outer peripheral surface sandwiched between the regulation bands CLa and CLb.
- a mesh-like reference pattern (which can also be used as a reference mark) RMP is provided in which a plurality of line patterns RL2 (line patterns) inclined at degrees are repeatedly engraved at a constant pitch (period) Pf1, Pf2. Note that the widths of the line patterns RL1 and RL2 are LW.
- the reference pattern RMP is an oblique pattern (an oblique lattice pattern) that is uniform over the entire surface so that the frictional force, the tension of the substrate P, and the like do not change at the portion where the substrate P and the outer peripheral surface of the rotary drum DR are in contact with each other.
- the line patterns RL1 and RL2 are not necessarily inclined at 45 degrees, and may be a vertical and horizontal mesh pattern in which the line pattern RL1 is parallel to the Y axis and the line pattern RL2 is parallel to the X axis.
- the line patterns RL1 and RL2 may be crossed at an angle that results in a rhombus.
- the rotational position detection mechanism 14 optically detects the rotational position of the rotary drum DR, and an encoder system using, for example, a rotary encoder is applied.
- the rotational position detection mechanism 14 includes a scale measuring unit GPa, GPb provided at both ends of the rotating drum DR, and a plurality of encoder heads EN1, EN2, EN3, EN4 facing each of the scale units GPa, GPb. It is. 4 and 9, only four encoder heads EN1, EN2, EN3, and EN4 that face the scale part GPa are shown, but similar encoder heads EN1, EN2, EN3, and EN4 face the scale part GPb. Arranged.
- the rotational position detection mechanism 14 includes displacement meters YN1, YN2, YN3, and YN4 that can detect a shake (a slight displacement in the Y direction in which the rotational center line AX2 extends) at both ends of the rotational drum DR.
- the scales of the scale parts GPa and GPb are respectively formed in an annular shape over the entire circumferential direction of the outer peripheral surface of the rotary drum DR.
- the scale parts GPa and GPb are diffraction gratings in which concave or convex grating lines are formed at a constant pitch (for example, 20 ⁇ m) in the circumferential direction of the outer peripheral surface of the rotary drum DR, and are configured as incremental scales. For this reason, the scale parts GPa and GPb rotate integrally with the rotary drum DR around the rotation center line AX2.
- the substrate P is configured to be wound inside the scale portions GPa and GPb at both ends of the rotary drum DR, that is, inside the regulation bands CLa and CLb.
- the outer peripheral surfaces of the scale portions GPa and GPb and the outer peripheral surface of the portion of the substrate P wound around the rotary drum DR are on the same plane (same radius from the center line AX2).
- the outer peripheral surfaces of the scale portions GPa and GPb may be made higher by the thickness of the substrate P in the radial direction than the outer peripheral surface for winding the substrate of the rotary drum DR.
- the outer peripheral surfaces of the scale portions GPa and GPb formed on the rotary drum DR can be set to have substantially the same radius as the outer peripheral surface of the substrate P. Therefore, the encoder heads EN1, EN2, EN3, and EN4 can detect the scale portions GPa and GPb at the same radial position as the drawing surface on the substrate P wound around the rotary drum DR. The Abbe error caused by the difference in the radial direction of the rotating system can be reduced.
- Encoder heads EN1, EN2, EN3, and EN4 are respectively disposed around the scale portions GPa and GPb as viewed from the rotation center line AX2, and are located at different positions in the circumferential direction of the rotary drum DR.
- the encoder heads EN1, EN2, EN3, EN4 are connected to the control unit 16.
- the encoder heads EN1, EN2, EN3, and EN4 project measurement light beams toward the scale portions GPa and GPb, and photoelectrically detect the reflected light beams (diffracted light), thereby causing the scale portions GPa and GPb in the circumferential direction.
- a detection signal (for example, a two-phase signal having a phase difference of 90 degrees) corresponding to the position change is output to the control unit 16.
- the control unit 16 interpolates and digitally processes the detection signal with a counter circuit (not shown), thereby changing the angular change of the rotating drum DR, that is, the change in the circumferential position of the outer peripheral surface with submicron resolution. It can be measured.
- the controller 16 can also measure the transport speed of the substrate P from the change in the angle of the rotary drum DR.
- the encoder head EN1 is disposed on the installation direction line Le1.
- the installation azimuth line Le1 is a line connecting the projection area (reading position) of the measurement light beam onto the scale part GPa (GPb) by the encoder head EN1 and the rotation center line AX2 in the XZ plane.
- the installation direction line Le1 is a line connecting the drawing lines LL1, LL3, LL5 and the rotation center line AX2 in the XZ plane. From the above, the line connecting the reading position of the encoder head EN1 and the rotation center line AX2 and the line connecting the drawing lines LL1, LL3, LL5 and the rotation center line AX2 are the same azimuth line.
- the encoder head EN2 is disposed on the installation orientation line Le2.
- the installation orientation line Le2 is a line connecting the projection area (reading position) of the measurement light beam on the scale part GPa (GPb) by the encoder head EN2 and the rotation center line AX2 in the XZ plane.
- the installation direction line Le2 is a line connecting the drawing lines LL2 and LL4 and the rotation center line AX2 in the XZ plane. From the above, the line connecting the reading position of the encoder head EN2 and the rotation center line AX2 and the line connecting the drawing lines LL2, LL4 and the rotation center line AX2 are the same azimuth line.
- the encoder head EN3 is disposed on the installation direction line Le3.
- the installation azimuth line Le3 is a line connecting the projection area (reading position) of the measurement light beam onto the scale part GPa (GPb) by the encoder head EN3 and the rotation center line AX2 in the XZ plane.
- the installation orientation line Le3 is a line connecting the observation areas Vw1 to Vw3 of the substrate P by the alignment microscope AM1 and the rotation center line AX2 in the XZ plane.
- the line connecting the reading position of the encoder head EN3 and the rotation center line AX2 and the line connecting the observation areas Vw1 to Vw3 of the alignment microscope AM1 and the rotation center line AX2 have the same orientation when viewed in the XZ plane. It is a line.
- the encoder head EN4 is arranged on the installation direction line Le4.
- the installation azimuth line Le4 is a line connecting the projection area (reading position) of the measurement light beam onto the scale part GPa (GPb) by the encoder head EN4 and the rotation center line AX2 in the XZ plane.
- the installation direction line Le4 is a line connecting the observation areas Vw4 to Vw6 of the substrate P by the alignment microscope AM2 and the rotation center line AX2 in the XZ plane.
- the line connecting the reading position of the encoder head EN4 and the rotation center line AX2 and the line connecting the observation areas Vw4 to Vw6 of the alignment microscope AM2 and the rotation center line AX2 have the same orientation when viewed in the XZ plane. It is a line.
- installation directions (angle directions in the XZ plane with the rotation center line AX2 as the center) of the encoder heads EN1, EN2, EN3, EN4 are represented by installation direction lines Le1, Le2, Le3, Le4, as shown in FIG.
- a plurality of drawing units UW1 to UW5 and encoder heads EN1 and EN2 are arranged so that the installation orientation lines Le1 and Le2 are at an angle ⁇ ⁇ ° with respect to the center plane p3.
- the installation azimuth line Le1 and the installation azimuth line Le2 are such that the encoder head EN1 and the encoder head EN2 are installed in a spatially non-interfering state around the scale of the scale part GPa (GPb).
- Displacement meters YN1, YN2, YN3, and YN4 are respectively arranged around the scale portion GPa or GPb as viewed from the rotation center line AX2, and are in different positions in the circumferential direction of the rotary drum DR.
- the displacement meters YN1, YN2, YN3, YN4 are connected to the control unit 16.
- the displacement meters YN1, YN2, YN3, and YN4 can reduce the Abbe error by detecting the displacement at a position as close to the radial direction as possible with respect to the drawing surface on the substrate P wound around the rotary drum DR.
- the displacement gauges YN1, YN2, YN3, and YN4 project a measurement light beam toward one of both ends of the rotary drum DR, and photoelectrically detect the reflected light beam (or diffracted light), thereby detecting the rotation drum DR.
- a detection signal corresponding to a change in position of both ends in the Y direction (width direction of the substrate P) is output to the control unit 16.
- the control unit 16 digitally processes the detection signal by a measurement circuit (not shown) (a counter circuit, an interpolation circuit, etc.), thereby substituting the displacement change in the Y direction of the rotating drum DR (and the substrate P) with submicron resolution. Can be measured.
- the control unit 16 can also measure the swing of the rotating drum DR from one change at both ends of the rotating drum DR.
- the displacement gauges YN1, YN2, YN3, and YN4 may be one of the four, but for measurement of the rotation of the rotating drum DR, if there are three or more of the four, both end portions of the rotating drum DR. It is possible to grasp the movement (dynamic inclination change, etc.) of one of the surfaces.
- the control unit 16 can constantly measure marks and patterns on the substrate P (or marks on the rotary drum DR) by the alignment microscopes AM1 and AM2, the displacement meters YN1, YN2, YN3, and YN4 are omitted. May be.
- control unit 16 detects the rotation angle positions of the scale units (rotating drums DR) GPa and GPb by the encoder heads EN1 and EN2, and based on the detected rotation angle positions, the odd-numbered and even-numbered drawing units UW1. -Drawing by UW5. That is, the control unit 16 performs ON / OFF modulation of the optical deflector 81 based on CAD information of a pattern to be drawn on the substrate P during the period in which the drawing beam LB projected on the substrate P is scanned in the scanning direction. However, by performing the ON / OFF modulation timing by the optical deflector 81 based on the detected rotation angle position, the pattern can be accurately drawn on the photosensitive layer of the substrate P.
- control unit 16 rotates the scale units GPa and GPb (rotary drum DR) detected by the encoder heads EN3 and EN4 when the alignment marks Ks1 to Ks3 on the substrate P are detected by the alignment microscopes AM1 and AM2.
- the control unit 16 rotates the scale units GPa and GPb (rotating drum DR) detected by the encoder heads EN3 and EN4 when the reference pattern RMP on the rotating drum DR is detected by the alignment microscopes AM1 and AM2.
- the alignment microscopes AM1 and AM2 can precisely measure the rotation angle position (or circumferential position) of the rotary drum DR at the moment when the mark is sampled in the observation regions Vw1 to Vw6.
- the exposure apparatus EX based on the measurement result, the substrate P and a predetermined pattern drawn on the substrate P are aligned (aligned), and the rotary drum DR and the drawing apparatus 11 are calibrated. To do.
- the actual sampling corresponds to the position of the mark on the substrate P and the position of the reference pattern on the rotating drum DR in which the rotational angle position of the rotating drum DR measured by the encoder heads EN3 and EN4 is roughly known in advance.
- the image information output from the imaging systems GD of the alignment microscopes AM1 and AM2 is written into the image memory or the like at high speed. That is, the image information output from each imaging system GD is sampled using the rotation angle position of the rotary drum DR measured by the encoder heads EN3 and EN4 as a trigger.
- the mark on the substrate P and the reference pattern RMP on the rotary drum DR are moved in one direction with respect to the observation regions Vw1 to Vw6, when sampling the image information output from each imaging system GD, It is desirable to use a CCD or CMOS image sensor having a high shutter speed. Along with this, it is necessary to increase the luminance of the illumination light that illuminates the observation regions Vw1 to Vw6, and it is conceivable to use a strobe light, a high-intensity LED, or the like as the illumination light source of the alignment microscopes AM1 and AM2.
- FIG. 11 is an explanatory diagram showing a positional relationship between a drawing line and a drawing pattern on the substrate.
- the drawing units UW1 to UW5 draw the patterns PT1 to PT5 by scanning the spot light of the drawing beam LB along the drawing lines LL1 to LL5.
- the drawing start positions OC1 to OC5 of the drawing lines LL1 to LL5 are the drawing start ends PTa of the patterns PT1 to PT5.
- the drawing end positions EC1 to EC5 of the drawing lines LL1 to LL5 become the drawing end PTb of the patterns PT1 to PT5.
- the drawing end PTb is joined to the drawing end PTb of the pattern PT2.
- the drawing start end PTa of the pattern PT2 is joined to the drawing start end PTa of the pattern PT3
- the drawing end PTb of the pattern PT3 is joined to the drawing end PTb of the pattern PT4
- the drawing start end PTa of the pattern PT4 is joined to the drawing start end PTa of the pattern PT5.
- the patterns PT1 to PT5 drawn on the substrate P are joined together in the width direction of the substrate P as the substrate P moves in the longitudinal direction, and the device pattern is drawn on the entire large exposure area A7.
- FIG. 12 is an explanatory diagram showing the relationship between the spot light of the drawing beam and the drawing line.
- the drawing lines LL1 and LL2 of the drawing units UW1 and UW2 will be described as a representative. The same applies to the drawing lines LL3 to LL5 of the drawing units UW3 to UW5, and the description thereof will be omitted.
- the beam spot light SP of the drawing beam LB moves along the drawing lines LL1 and LL2 on the substrate P along the drawing lines LL1 and LL2 from the drawing start positions OC1 and OC2 to the drawing end positions EC1 and EC2. Scanned by length LBL.
- the drawing lines LL1 and LL2 are constant in the X direction on the substrate P.
- Move (sub-scan) at a pitch is set to a distance CXs that is approximately 1 ⁇ 2 of the diameter Xs of the spot light SP, but is not limited thereto.
- the spot lights SP adjacent in the X direction are overlapped and exposed at a distance CXs that is 1 ⁇ 2 of the diameter Xs (or other overlapping distance may be used).
- the beam spot light SP shot at the drawing end position EC1 of the drawing line LL1 and the beam spot light SP shot at the drawing end position EC2 of the drawing line LL2 move in the longitudinal direction of the substrate P (ie, sub-scanning). ),
- the drawing start position OC1 and the drawing end position EC1 of the drawing line LL1, and the drawing start position OC2 of the drawing line LL2 and the drawing so as to be spliced in the width direction (Y direction) of the substrate P with the overlapping distance CXs.
- An end position EC2 is set.
- the spot light SP is occupied by 2 rows ⁇ 2 columns (a total of four spot lights aligned in both main scanning and sub scanning directions).
- the line width pattern can be exposed satisfactorily.
- the drawing on the drawing lines (LL1 to LL5) by the rotating polygon mirror 97 is performed.
- the number of scanning of the spot light SP (drawing beam LB) can be set to 1666.66. This means that patterns of 1666 or more drawing lines can be drawn on the substrate P in the transport direction (X direction) per second.
- the overlapping distance CXs of the spot lights in the sub-scanning direction (X direction) is less than or equal to 1 ⁇ 2 of the spot light diameter Xs.
- the amount of exposure given to the photosensitive layer of the substrate P can be increased.
- the drawing line LL1 shown in FIG. 12 (the same applies to LL2 to LL5) in the X direction (the transport direction of the substrate P).
- the pitch (distance CXs) can be about 3 ⁇ m.
- the pattern drawing resolution R in the main scanning direction (Y direction), together with the effective diameter Xs of the spot light SP and the scanning frequency Fms, is that of the acousto-optic element (AOM) constituting the optical deflector 81.
- AOM acousto-optic element
- an acoustooptic element (AOM) of the optical deflector 81 having a maximum response frequency Fss of 100 MHz is used, and the ON / OFF switching time is set to 10 nsec. .
- the resolution R is halved to 1.5 ⁇ m.
- the conveyance speed of the substrate P by the rotation of the rotary drum DR is halved.
- the rotational speed of the rotating polygon mirror 97 may be increased.
- a resist having a resist sensitivity Sr of about 30 mj / cm 2 is used for a resist used in photolithography.
- the transmittance ⁇ Ts of the optical system is 0.5 (50%)
- the effective scanning period in one reflecting surface 97b of the rotating polygon mirror 97 is about 1/3
- the drawing line length LBL is 30 mm
- the drawing units UW1 to UW1 ⁇ Assuming that the number Nuw of UW5 is 5 and the transport speed Vp of the substrate P by the rotating drum DR is 5 mm / s (300 mm / min), the necessary laser power Pw of the light source device CNT can be estimated as the following equation.
- the required laser power Pw of the light source device CNT can be estimated by the following equation.
- a light source device CNT having a beam output of about 3 to 5 W is required to perform exposure at the same speed.
- the transport speed Vp of the substrate P due to the rotation of the rotating drum DR is reduced to 30/80 from the initial value of 5 mm / s, the beam output becomes 1.4. It is also possible to perform exposure with a light source device of about 1.9 W.
- the length LBL of the drawing line is set to 30 mm, and the resolution determined by the light switching by the spot diameter Xs of the beam spot light SP and the acoustooptic element (AOM) of the optical deflector 81 (in the minimum grid for specifying the beam position, (Corresponding to one pixel) If Xg is equal to 3 ⁇ m, the rotation time of the rotating polygon mirror 97 when the rotation speed of the 10-side rotating polygon mirror 97 is 10,000 rpm is 3/500 seconds.
- the horizontal axis in FIG. 13 represents the drawing position of the spot light SP in the Y direction along the drawing line or the X direction along the transport direction of the substrate P, or the size of the spot light SP, and the vertical axis represents a single spot.
- This represents a relative intensity value obtained by standardizing the peak intensity of the light SP to 1.0.
- the intensity distribution of the single spot light SP is assumed to be J1, and the description will be made assuming a Gaussian distribution.
- the intensity distribution J2 indicates an integrated profile when the interval distance of the spot light SP for two pulses is 0.75 ⁇ m
- the intensity distribution J6 indicates the intensity of the single spot light SP.
- An integration profile when the full width at half maximum (FWHM) of the distribution J1 is set to 1.78 ⁇ m is shown.
- Such an optimal distance CXs is the pulse emission frequency Fz of the light source device CNT and the scanning speed or scanning time Ts of the spot light SP along the drawing line (the rotational speed of the rotating polygon mirror 97) in the main scanning direction.
- the sub-scanning direction can be set by adjusting at least one of the drawing line scanning frequency Fms (the rotational speed of the rotating polygon mirror 97) and the moving speed of the substrate P in the X direction. Can be set.
- the light source device CNT has a pulse emission frequency Fz with a relationship of Fz> LBL / (Ts ⁇ Xs).
- Fz LBL / (Ts ⁇ CXs)
- the pattern to be drawn is divided into pixel units of 3 ⁇ m ⁇ 3 ⁇ m, for example, and “0” is set as to whether or not the spot light of the pulse beam is irradiated for each pixel unit.
- the bit string (drawing data) represented by “1”.
- the reference pattern RMP is integral with the outer peripheral surface of the rotary drum DR.
- an arbitrary reference pattern RMP1 moves with the movement of the outer peripheral surface of the rotary drum DR.
- the reference pattern RMP1 passes through the drawing lines LL1, LL3, LL5 and then passes through the drawing lines LL2, LL4.
- the control unit 16 scans the drawing beams LB of the drawing units UW1, UW3, and UW5.
- the control unit 16 scans the drawing beam LB of the drawing units UW2 and UW4 (step S1). Therefore, the reference pattern RMP1 is a reference for grasping the positional relationship between the drawing units UW1 to UW5.
- the drawing units UW1 to UW5 draw the drawing beam LB from the drawing start position OC1 in the direction (Y direction) along the rotation center line AX2 of the rotary drum DR described above (see FIG. 12). Only the third column scan SC3 is performed.
- the delay circuit 202 includes a counter that counts the number of pulses of the multiplied clock signal CKs to a predetermined value ⁇ Ns.
- the time during which the counter counts the predetermined value ⁇ Ns corresponds to the delay time Td.
- the predetermined value ⁇ Ns is set by the preset circuit 206.
- the preset circuit 206 has a standard value Ns 0 as an initial value of the predetermined value ⁇ Ns inside, and a preset value Dsb (a value corresponding to the change ⁇ Td of the delay time Td) is sent from the outside (main CPU or the like). Then, the new predetermined value ⁇ Ns is rewritten to the previous predetermined value ⁇ Ns + Dsb.
- FIG. 24 is a timing chart showing time transitions of signals at various parts in the circuit configuration of FIG. It is assumed that a standard value Ns 0 as an initial value is set in the preset circuit 206, and the predetermined value ⁇ Ns applied to the delay circuit 202 is the standard value Ns 0 . Before the counter circuit 208 counts to the set number of pulses Nck, that is, before the completion pulse signal b is generated, the predetermined value ⁇ Ns from the preset circuit 206 is Ns0, and the delay circuit 202 is as shown in FIG.
- each of the drawing lines LL1 to LL5 can be slightly rotated (tilted) individually on the substrate P. Since the beam LB scanned by the rotating polygon mirror 97 is imaged (condensed) along the generatrix of the cylindrical lens 86 in the non-scanning direction, each drawing line LL1 is rotated by the rotation of the cylindrical lens 86 about the optical axis AXf. It is possible to rotate (tilt) LL5.
- a backplane layer composed of electrodes, wiring, insulating film, TFT (thin film semiconductor), etc. constituting the display panel device is formed on the substrate P, and an organic EL or the like is laminated on the backplane.
- a light emitting layer (display pixel portion) is formed by the self light emitting element (step S203).
- the exposure apparatus EX described in each of the previous embodiments is used, and a photosensitive silane coupling material is applied instead of the conventional photolithography process in which the photoresist layer is exposed and developed.
- the substrate P is diced for each display panel device continuously manufactured on the long substrate P by a roll method, and a protective film (environmental barrier layer) or a color filter is formed on the surface of each display panel device.
- a device is assembled by pasting sheets or the like (step S204).
- an inspection process is performed to determine whether the display panel device functions normally or satisfies desired performance and characteristics (step S205).
- a display panel flexible display
- An electronic device created on a flexible long sheet substrate is not limited to a display panel, but a flexible wiring network as a harness (wiring bundle) for connection between various electronic components mounted on automobiles, trains, etc. It may be.
Abstract
Description
図1は、第1実施形態の露光装置(基板処理装置)の全体構成を示す図である。第1実施形態の基板処理装置は、基板Pに露光処理を施す露光装置EXであり、露光装置EXは、露光後の基板Pに各種処理を施してデバイスを製造するデバイス製造システム1に組み込まれている。先ず、デバイス製造システム1について説明する。
デバイス製造システム1は、デバイスとしてのフレキシブル・ディスプレーを製造するライン(フレキシブル・ディスプレー製造ライン)である。フレキシブル・ディスプレーとしては、例えば有機ELディスプレー等がある。このデバイス製造システム1は、可撓性(フレキシブル)の長尺の基板Pをロール状に巻回した図示しない供給用ロールから、該基板Pが送り出され、送り出された基板Pに対して各種処理を連続的に施した後、処理後の基板Pを可撓性のデバイスとして図示しない回収用ロールに巻き取る、いわゆるロール・ツー・ロール(Roll to Roll)方式となっている。第1実施形態のデバイス製造システム1では、フィルム状のシートである基板Pが供給用ロールから送り出され、供給用ロールから送り出された基板Pが、順次、プロセス装置U1、露光装置EX、プロセス装置U2を経て、回収用ロールに巻き取られるまでの例を示している。ここで、デバイス製造システム1の処理対象となる基板Pについて説明する。
続いて、図1から図10を参照して、露光装置EXについて説明する。図2は、図1の露光装置の主要部の配置を示す斜視図である。図3は、基板上でのアライメント顕微鏡と描画ラインとの配置関係を示す図である。図4は、図1の露光装置の回転ドラム及び描画装置(描画ユニット)の構成を示す図である。図5は、図1の露光装置の主要部の配置を示す平面図である。図6は、図1の露光装置の分岐光学系の構成を示す斜視図である。図7は、図1の露光装置の複数の描画ユニット内の走査器の配置関係を示す図である。図8は、走査器の反射面の倒れによる描画ラインのずれを解消する為の光学構成を説明する図である。図9は、基板上でのアライメント顕微鏡と描画ラインとエンコーダヘッドとの配置関係を示す斜視図である。図10は、図1の露光装置の回転ドラムの表面構造の一例を示す斜視図である。
β=Δwp’/Δwp=1±(ΔTd/Δwp)〔但し、ΔTd<Δwp〕
となり、描画ラインに沿って描画されるパターンの幅方向の寸法は、β>1のときは描画データで規定される設計値よりも拡大され、β<1のとき(図24の場合)は設計値よりも縮小される。
次に、第2実施形態の露光装置EXについて説明する。なお、第2実施形態では、第1実施形態と重複する記載を避けるべく、第1実施形態と異なる部分についてのみ説明し、第1実施形態と同様の構成要素については、第1実施形態と同じ符号を付して説明する。
次に、図25を参照して、デバイス製造方法について説明する。図25は、各実施形態のデバイス製造方法を示すフローチャートである。
11 描画装置
12 基板搬送機構
13 装置フレーム
14 回転位置検出機構
16 制御部
23 第1光学定盤
24 移動機構
25 第2光学定盤
31 キャリブレーション検出系
31Cs 光電センサー
31f 遮光部材
73 第4ビームスプリッタ
81 光偏向器
83 走査器
96 反射ミラー
97 回転ポリゴンミラー
97a 回転軸
97b 反射面
98 原点検出器
AM1,AM2 アライメント顕微鏡
DR 回転ドラム
EN1,EN2,EN3,EN4 エンコーダヘッド
EX 露光装置
I 回転軸
LL1~LL5 描画ライン
PBS 偏向ビームスプリッタ
UW1~UW5 描画ユニット
Claims (24)
- 長尺のシート状の基板の一部を、前記長尺の方向に湾曲した支持面を有する支持部材で支持しながら、前記長尺の方向に移動させる搬送装置と、
前記支持面で支持された前記基板に変調された描画ビームを投射しつつ、前記長尺の方向と交差した前記基板の幅方向に該基板の幅よりも狭い範囲で走査し、該走査で得られる描画ラインに沿って所定のパターンを描画する複数の描画ユニットを含み、
該複数の描画ユニットの各描画ラインによって前記基板上に描画されるパターン同士が、前記基板の長尺の方向への移動に伴って前記基板の幅方向に継ぎ合わされるように、前記複数の描画ユニットを前記基板の幅方向に配置した描画装置と、
前記搬送装置による前記基板の移動量または移動位置に応じた移動情報を出力する移動計測装置と、
前記複数の描画ユニットの各々によって前記基板上に形成される前記描画ラインの相互の位置関係に関するキャリブレーション情報を予め記憶すると共に、該キャリブレーション情報と前記移動計測装置から出力される移動情報とに基づいて、前記複数の描画ユニットの各々の前記描画ビームによって前記基板上に形成されるパターンの描画位置を調整する制御部と、を備える基板処理装置。 - 前記支持部材は、前記基板の幅方向に延びた中心線から一定半径で湾曲した円筒状の外周面の一部で前記基板を支持し、前記中心線の回りに回転することにより、前記基板を前記長尺の方向に搬送する回転ドラムである請求項1に記載の基板処理装置。
- 前記複数の描画ユニットは、前記基板上で互いに継ぎ合されるパターンを描画する隣り合った描画ユニットの一方を奇数番とし他方を偶数番としたとき、該奇数番の描画ユニットの各々による奇数番の描画ラインと、前記偶数番の描画ユニットの各々による偶数番の描画ラインとが、前記回転ドラムの外周面の周方向に一定の角度間隔で位置するように配置される、請求項2に記載の基板処理装置。
- 前記奇数番の描画ラインの各々は、前記基板上で前記回転ドラムの回転の中心線とほぼ平行になるように、前記基板の幅方向に一列に配置され、前記偶数番の描画ラインの各々は、前記基板上で前記回転ドラムの回転の中心線とほぼ平行になるように、前記基板の幅方向に一列に配置される、請求項3に記載の基板処理装置。
- 前記移動計測装置は、前記回転ドラムの中心線から所定半径の周方向に形成された目盛を有し、前記回転ドラムと共に回転するように設けられたスケール部と、該スケール部の目盛と対向して配置され、前記位置情報を出力するエンコーダヘッドとを含む、請求項2から4のいずれか1項に記載の基板処理装置。
- 前記移動計測装置は、前記回転ドラムの中心線から所定半径の周方向に形成された目盛を有し、前記回転ドラムと共に回転するように設けられたスケール部と、
前記一列に配置される前記奇数番の描画ラインを前記回転ドラムの回転の中心線からみたときの第1方位と同じ方向で前記スケール部の目盛と対向して配置される第1エンコーダヘッドと、前記一列に配置される前記偶数番の描画ラインを前記回転ドラムの回転の中心線からみたときの第2方位と同じ方向で前記スケール部の目盛と対向して配置される第2エンコーダヘッドとを含む、請求項4に記載の基板処理装置。 - 前記第1方位と前記第2方位は、前記第1エンコーダヘッドと前記第2エンコーダヘッドとが前記スケール部の目盛の周囲に空間的に非干渉状態で設置されるような角度範囲に設定される、請求項6に記載の基板処理装置。
- 前記基板処理装置は、前記基板の長尺の方向に離散又は連続して前記基板上に形成された特定パターンを検出する為の検出プローブを含み、該検出プローブによる前記基板上の検出領域が前記複数の描画ユニットの各々による前記描画ラインよりも、前記基板の搬送方向の上流側に設定されるように、前記回転ドラムの周囲に配置される基板パターン検出装置をさらに備え、
前記制御部は、前記キャリブレーション情報及び前記移動計測装置から出力される移動情報に加え、前記検出プローブの前記検出領域にて検出される前記特定パターンの位置情報に基づいて、前記描画ビームによるパターンの描画位置の調整を実行する、請求項2から7のいずれか1項に記載の基板処理装置。 - 前記制御部による前記描画位置の調整は、前記搬送装置による前記基板の移動速度を変更する処理を含む、請求項1から8のいずれか1項に記載の基板処理装置。
- 前記制御部による前記描画位置の調整は、前記長尺の方向における前記基板の単位時間当たりの移動距離と、該移動距離内に含まれる前記描画ラインの本数との関係を変更する処理を含む、請求項1から8のいずれか1項に記載の基板処理装置。
- 前記描画装置は、さらに、前記描画ビームとして、システムクロックと同期した紫外域の波長のパルス光を発生するパルス光源を備え、
前記制御部による描画位置の調整は、前記描画ビームが走査ラインに沿って走査している間に、前記システムクロックの周期を部分的に変更する処理を含む、請求項1から10のいずれか1項に記載の基板処理装置。 - 前記制御部による描画位置の調整は、前記描画ビームの走査によって形成される前記描画ラインの長さを変更する処理を含む、請求項1から11のいずれか1項に記載の基板処理装置。
- 前記複数の描画ユニットの各々から前記基板に投射される前記描画ビームの各進行方向は、いずれも前記回転ドラムの回転の中心線に向かうように設定される、請求項2から12のいずれか1項に記載の基板処理装置。
- 基板処理装置は、前記複数の描画ユニットを所定の位置関係で保持する定盤と、
前記複数の描画ユニットの各々からの描画ビームによって前記基板上に形成される前記複数の描画ラインを含む描画面内の所定点を中心として、前記描画面内で前記定盤を回転させる回転機構とを含み、
前記制御部による描画位置の調整は、前記定盤を回転させる処理を含む、請求項1から13のいずれか1項に記載の基板処理装置。 - 前記複数の描画ユニットの各々は、
前記基板に向かう前記描画ビームを一方向に偏向走査する回転多面鏡と、
前記回転多面鏡で偏向走査された描画ビームを前記基板上の描画ラインに導くf-θレンズと、
前記f-θレンズと前記基板との間に設けられ、前記描画ラインが延びる方向とほぼ平行な母線を有し、該母線と直交する方向に前記描画ビームを集光するシリンドリカルレンズと、をさらに備えている請求項1から14のいずれか1項に記載の基板処理装置。 - 請求項1から15のいずれか1項に記載の基板処理装置を用いて前記基板に前記パターンを形成する、デバイス製造方法。
- 長尺のシート基板に電子デバイスのパターンを描画する基板処理方法であって、
前記シート基板を長尺の方向に所定速度で送ることと、
パルス光源装置から周波数Fzでパルス発振される紫外波長域のビームを、前記シート基板の表面でスポット光に集光させると共に、前記ビームを光走査器によって振ることによって、前記スポット光を前記長尺の方向と交差した幅方向に延びる長さLBLの描画ラインに沿って走査することと、
前記スポット光の走査の間、前記パターンに対応した描画データに基づいて前記スポット光の強度を変調することと、を含み、
前記ビームの1パルスの集光によるスポット光と、次の1パルスの集光によるスポット光との前記描画ラインに沿った間隔をCXs、前記スポット光の前記描画ラインに沿った実効的な寸法をXs、前記スポット光が前記長さLBLを走査する走査時間をTs、としたとき、Xs>CXs、且つ、Fz>LBL/(Ts・Xs)、の関係を満たすように設定される、
基板処理方法。 - 前記パルス光源装置は、クロック発生部からの周波数Fzのクロックパルスに応答して 前記ビームをパルス発振する構成を備え、
前記光走査器は、前記ビームを振る速度を変えて前記走査時間Tsを調整可能な構成を備え、
前記寸法Xsと前記間隔CXsとの比率CXs/Xsが所定範囲に設定されるように、 前記走査時間Tsと前記クロックパルスの周波数Fzの少なくとも一方を調整する、
請求項17に記載の基板処理方法。 - 前記周波数Fzで決まる前記クロックパルスの周期をΔwpとしたとき、前記クロック発生部は、前記走査時間Tsの間の1ヶ所又は離散的な複数ヶ所における前記クロックパルスの周期Δwpを、±ΔTd(但し、ΔTd<Δwp)だけ増減させた周期Δwp’に補正する構成を備え、
前記描画ラインに沿った描画パターンの全体の寸法を、前記描画データで規定される設計上の寸法に対して拡大又は縮小させる、
請求項18に記載の基板処理方法。 - 前記クロック発生部は、前記走査時間Tsの間に発生する前記クロックパルスの数が所定値Nckになるたびに、前記クロックパルスの周期Δwpを補正された周期Δwp’に変更する、
請求項19に記載の基板処理方法。 - 前記所定値Nckは、前記描画ラインの長さLBLを走査方向に均等に分割した1つの長さを前記スポット光が走査する時間内に出力される前記クロックパルスの数である、
請求項20に記載の基板処理方法。 - 前記パルス光源装置は、基本波の光を発生する光源と、ファイバーアンプと、前記基本波の光を前記紫外波長域のビームに変換する波長変換素子とを備える、
請求項17~21のいずれか一項に記載の基板処理方法。 - 長尺のシート基板に電子デバイスのパターンを描画する基板処理方法であって、
前記シート基板を長尺の方向に所定速度で送る工程と、
パルス光源装置から周波数Fzでパルス発振される紫外波長域のビームを、前記シート基板の表面でスポット光に集光させると共に、前記スポット光を前記シート基板の長尺の方向と交差した幅方向に延びる描画ラインに沿って走査する工程と、
前記スポット光の走査の間、前記パターンを画素単位に分割した描画データに基づいて、前記ビームの強度を光スイッチング素子によって変調する工程と、含み、
前記光スイッチング素子の変調時の応答周波数Fssと、前記ビームのパルス発振の周波数Fzとを、Fz>Fssの関係に設定する、
基板処理方法。 - 前記ビームのパルス発振の周波数Fzと、前記光スイッチング素子の変調時の応答周波数Fssとは、hを2以上の整数としたとき、Fz=h・Fssの関係に設定される、
請求項23に記載の基板処理方法。
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020167027089A KR102377752B1 (ko) | 2014-04-01 | 2015-03-31 | 기판 처리 장치, 디바이스 제조 방법 및 기판 처리 방법 |
JP2016511920A JP6597602B2 (ja) | 2014-04-01 | 2015-03-31 | 基板処理装置及びデバイス製造方法 |
KR1020227009101A KR102430139B1 (ko) | 2014-04-01 | 2015-03-31 | 패턴 묘화 장치 및 패턴 묘화 방법 |
CN201580017855.8A CN106133610B (zh) | 2014-04-01 | 2015-03-31 | 基板处理装置、器件制造方法及基板处理方法 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2014-075841 | 2014-04-01 | ||
JP2014075841 | 2014-04-01 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2015152218A1 true WO2015152218A1 (ja) | 2015-10-08 |
Family
ID=54240539
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2015/060079 WO2015152218A1 (ja) | 2014-04-01 | 2015-03-31 | 基板処理装置、デバイス製造方法及び基板処理方法 |
Country Status (6)
Country | Link |
---|---|
JP (3) | JP6597602B2 (ja) |
KR (2) | KR102377752B1 (ja) |
CN (4) | CN107957660B (ja) |
HK (3) | HK1247996A1 (ja) |
TW (6) | TWI661280B (ja) |
WO (1) | WO2015152218A1 (ja) |
Cited By (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2017102151A (ja) * | 2015-11-30 | 2017-06-08 | 株式会社ニコン | パターン描画装置およびパターン描画方法 |
CN108351607A (zh) * | 2015-10-30 | 2018-07-31 | 株式会社尼康 | 基板处理装置、基板处理装置的调整方法、元件制造系统及元件制造方法 |
WO2018164087A1 (ja) * | 2017-03-10 | 2018-09-13 | 株式会社ニコン | パターン描画装置、及びパターン露光装置 |
WO2019065224A1 (ja) * | 2017-09-26 | 2019-04-04 | 株式会社ニコン | パターン描画装置 |
CN109791371A (zh) * | 2016-10-04 | 2019-05-21 | 株式会社尼康 | 图案描绘装置及图案描绘方法 |
CN109804314A (zh) * | 2016-09-29 | 2019-05-24 | 株式会社尼康 | 光束扫描装置及图案描绘装置 |
CN110221527A (zh) * | 2015-12-17 | 2019-09-10 | 株式会社尼康 | 图案描绘装置 |
JP2020021079A (ja) * | 2019-09-04 | 2020-02-06 | 株式会社ニコン | パターン描画装置 |
JP2020024443A (ja) * | 2019-10-17 | 2020-02-13 | 株式会社ニコン | パターン描画装置 |
JP2020177254A (ja) * | 2016-03-30 | 2020-10-29 | 株式会社ニコン | パターン描画装置、パターン描画方法、および、デバイス製造方法 |
WO2021206044A1 (ja) * | 2020-04-06 | 2021-10-14 | 株式会社ニコン | パターン形成装置、並びにパターン形成方法 |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN107748486B (zh) * | 2014-04-01 | 2020-03-24 | 株式会社尼康 | 基板处理装置及其调整方法、器件制造方法及直接描绘曝光装置 |
JP7136601B2 (ja) * | 2018-06-25 | 2022-09-13 | 川崎重工業株式会社 | 導光装置及びレーザ加工装置 |
JP2022052111A (ja) * | 2020-09-23 | 2022-04-04 | 株式会社Screenホールディングス | 基板位置検出方法、描画方法、基板位置検出装置および描画装置 |
JP7334708B2 (ja) | 2020-10-20 | 2023-08-29 | 株式会社豊田自動織機 | 自律移動体 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007298603A (ja) * | 2006-04-28 | 2007-11-15 | Shinko Electric Ind Co Ltd | 描画装置および描画方法 |
JP2010091990A (ja) * | 2008-10-10 | 2010-04-22 | Nikon Corp | 表示素子の製造方法、及び表示素子の製造装置 |
WO2011099563A1 (ja) * | 2010-02-12 | 2011-08-18 | 株式会社ニコン | 基板処理装置 |
JP2014035412A (ja) * | 2012-08-08 | 2014-02-24 | Nikon Corp | 露光装置、およびデバイス製造方法 |
Family Cites Families (35)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2653782B2 (ja) * | 1986-05-20 | 1997-09-17 | 東芝機械株式会社 | レーザ描画装置 |
JP3140185B2 (ja) * | 1992-07-13 | 2001-03-05 | 富士通株式会社 | 画像形成装置 |
JPH08110488A (ja) * | 1994-10-11 | 1996-04-30 | Canon Inc | 光走査装置 |
JPH10142538A (ja) * | 1996-11-12 | 1998-05-29 | Asahi Optical Co Ltd | マルチヘッド走査光学系を持つレーザ描画装置 |
US6037967A (en) * | 1996-12-18 | 2000-03-14 | Etec Systems, Inc. | Short wavelength pulsed laser scanner |
JP4232130B2 (ja) * | 1998-03-11 | 2009-03-04 | 株式会社ニコン | レーザ装置並びにこのレーザ装置を用いた光照射装置および露光方法 |
JP3945951B2 (ja) * | 1999-01-14 | 2007-07-18 | 日立ビアメカニクス株式会社 | レーザ加工方法およびレーザ加工機 |
JP4375846B2 (ja) * | 1999-09-10 | 2009-12-02 | 古河電気工業株式会社 | レーザ装置 |
JP2001133710A (ja) * | 1999-11-05 | 2001-05-18 | Asahi Optical Co Ltd | マルチヘッド走査光学系を持つレーザ描画装置 |
JP3749083B2 (ja) * | 2000-04-25 | 2006-02-22 | 株式会社ルネサステクノロジ | 電子装置の製造方法 |
JP3945966B2 (ja) * | 2000-07-27 | 2007-07-18 | 株式会社リコー | 画像形成装置 |
JP2002029094A (ja) * | 2000-07-18 | 2002-01-29 | Konica Corp | 画像形成装置 |
JP3656959B2 (ja) * | 2001-05-11 | 2005-06-08 | 大日本スクリーン製造株式会社 | 円筒外面走査装置及び刷版サイズチェック方法 |
CN102547405B (zh) * | 2002-01-08 | 2016-08-24 | 提维股份有限公司 | 电子内容分发与交换系统 |
JP2004086193A (ja) * | 2002-07-05 | 2004-03-18 | Nikon Corp | 光源装置及び光照射装置 |
JP2004146681A (ja) * | 2002-10-25 | 2004-05-20 | Sumitomo Electric Ind Ltd | 光増幅用ファイバ、光増幅装置、光源装置、光治療装置および露光装置 |
JP4351509B2 (ja) * | 2003-09-19 | 2009-10-28 | 株式会社リコー | 回転体の位置制御方法・回転体の位置制御装置・画像形成装置・画像読み取り装置・記録媒体 |
WO2005029178A2 (en) * | 2003-09-22 | 2005-03-31 | Orbotech Ltd. | A system and method for the direct imaging of color filters |
US20050200929A1 (en) * | 2004-03-15 | 2005-09-15 | Michael Plotkin | Out of plane start of scan |
KR101440746B1 (ko) * | 2004-06-09 | 2014-09-17 | 가부시키가이샤 니콘 | 노광 장치 및 디바이스 제조 방법 |
JP2006098719A (ja) * | 2004-09-29 | 2006-04-13 | Fuji Photo Film Co Ltd | 露光装置 |
JP4853388B2 (ja) * | 2007-06-05 | 2012-01-11 | コニカミノルタビジネステクノロジーズ株式会社 | マルチビーム走査装置及び当該装置を備えた画像形成装置 |
FR2922330A1 (fr) * | 2007-10-15 | 2009-04-17 | Commissariat Energie Atomique | Procede de fabrication d'un masque pour la lithographie haute resolution |
JP5094678B2 (ja) * | 2008-10-20 | 2012-12-12 | キヤノン株式会社 | 走査光学ユニット及びそれを用いたカラー画像形成装置 |
US8541163B2 (en) * | 2009-06-05 | 2013-09-24 | Nikon Corporation | Transporting method, transporting apparatus, exposure method, and exposure apparatus |
CN102081307B (zh) * | 2009-11-26 | 2013-06-19 | 上海微电子装备有限公司 | 光刻机曝光剂量控制方法 |
KR101496883B1 (ko) * | 2010-02-23 | 2015-03-02 | 에이에스엠엘 네델란즈 비.브이. | 리소그래피 장치 및 디바이스 제조 방법 |
CN201820072U (zh) * | 2010-08-12 | 2011-05-04 | 志圣科技(广州)有限公司 | 双面曝光装置 |
KR102022424B1 (ko) * | 2012-03-26 | 2019-09-18 | 가부시키가이샤 니콘 | 기판 처리 장치, 처리 장치 및 디바이스 제조 방법 |
JP6074898B2 (ja) | 2012-03-26 | 2017-02-08 | 株式会社ニコン | 基板処理装置 |
JPWO2013191255A1 (ja) * | 2012-06-21 | 2016-05-26 | 株式会社ニコン | 照明装置、処理装置、及びデバイス製造方法 |
JP6091792B2 (ja) * | 2012-07-26 | 2017-03-08 | 株式会社ミクニ | 電動ポンプ |
KR101907365B1 (ko) | 2012-08-28 | 2018-10-11 | 가부시키가이샤 니콘 | 기판 처리 장치 |
JP2014048575A (ja) * | 2012-09-03 | 2014-03-17 | Opcell Co Ltd | 薄膜に多数の微少孔を高速に作成する方法とそれを用いた装置 |
JP6256338B2 (ja) * | 2012-09-14 | 2018-01-10 | 株式会社ニコン | 基板処理装置及びデバイス製造方法 |
-
2015
- 2015-03-27 TW TW107127840A patent/TWI661280B/zh active
- 2015-03-27 TW TW109101148A patent/TWI709006B/zh active
- 2015-03-27 TW TW104109884A patent/TWI639064B/zh active
- 2015-03-27 TW TW107127841A patent/TWI674484B/zh active
- 2015-03-27 TW TW108114726A patent/TWI684836B/zh active
- 2015-03-27 TW TW108135217A patent/TWI695235B/zh active
- 2015-03-31 JP JP2016511920A patent/JP6597602B2/ja active Active
- 2015-03-31 CN CN201711205151.0A patent/CN107957660B/zh active Active
- 2015-03-31 WO PCT/JP2015/060079 patent/WO2015152218A1/ja active Application Filing
- 2015-03-31 CN CN201710536857.9A patent/CN107272353B/zh active Active
- 2015-03-31 KR KR1020167027089A patent/KR102377752B1/ko active IP Right Grant
- 2015-03-31 KR KR1020227009101A patent/KR102430139B1/ko active IP Right Grant
- 2015-03-31 CN CN201580017855.8A patent/CN106133610B/zh active Active
- 2015-03-31 CN CN201710536605.6A patent/CN107255913B/zh active Active
-
2017
- 2017-04-06 HK HK18107244.9A patent/HK1247996A1/zh unknown
- 2017-04-06 HK HK18104840.4A patent/HK1245417B/zh not_active IP Right Cessation
- 2017-04-06 HK HK18104876.1A patent/HK1245420A1/zh unknown
-
2018
- 2018-11-21 JP JP2018218661A patent/JP2019023764A/ja active Pending
-
2019
- 2019-10-01 JP JP2019181541A patent/JP2019215588A/ja active Pending
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007298603A (ja) * | 2006-04-28 | 2007-11-15 | Shinko Electric Ind Co Ltd | 描画装置および描画方法 |
JP2010091990A (ja) * | 2008-10-10 | 2010-04-22 | Nikon Corp | 表示素子の製造方法、及び表示素子の製造装置 |
WO2011099563A1 (ja) * | 2010-02-12 | 2011-08-18 | 株式会社ニコン | 基板処理装置 |
JP2014035412A (ja) * | 2012-08-08 | 2014-02-24 | Nikon Corp | 露光装置、およびデバイス製造方法 |
Cited By (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108351607A (zh) * | 2015-10-30 | 2018-07-31 | 株式会社尼康 | 基板处理装置、基板处理装置的调整方法、元件制造系统及元件制造方法 |
CN111781807B (zh) * | 2015-10-30 | 2024-01-12 | 株式会社尼康 | 基板处理装置及元件制造方法 |
JP2020177239A (ja) * | 2015-10-30 | 2020-10-29 | 株式会社ニコン | パターン形成装置 |
CN111781807A (zh) * | 2015-10-30 | 2020-10-16 | 株式会社尼康 | 基板处理装置及元件制造方法 |
JP2017102151A (ja) * | 2015-11-30 | 2017-06-08 | 株式会社ニコン | パターン描画装置およびパターン描画方法 |
CN110221527A (zh) * | 2015-12-17 | 2019-09-10 | 株式会社尼康 | 图案描绘装置 |
US11143862B2 (en) | 2016-03-30 | 2021-10-12 | Nikon Corporation | Pattern drawing device, pattern drawing method, and method for manufacturing device |
JP7021689B2 (ja) | 2016-03-30 | 2022-02-17 | 株式会社ニコン | パターン描画装置、パターン描画方法、および、デバイス製造方法 |
JP2020177254A (ja) * | 2016-03-30 | 2020-10-29 | 株式会社ニコン | パターン描画装置、パターン描画方法、および、デバイス製造方法 |
CN109804314B (zh) * | 2016-09-29 | 2022-04-01 | 株式会社尼康 | 光束扫描装置 |
CN109804314A (zh) * | 2016-09-29 | 2019-05-24 | 株式会社尼康 | 光束扫描装置及图案描绘装置 |
CN109791371B (zh) * | 2016-10-04 | 2021-08-06 | 株式会社尼康 | 图案描绘装置及图案描绘方法 |
CN109791371A (zh) * | 2016-10-04 | 2019-05-21 | 株式会社尼康 | 图案描绘装置及图案描绘方法 |
JP7070542B2 (ja) | 2017-03-10 | 2022-05-18 | 株式会社ニコン | パターン描画装置、及びパターン露光装置 |
JPWO2018164087A1 (ja) * | 2017-03-10 | 2020-01-09 | 株式会社ニコン | パターン描画装置、及びパターン露光装置 |
WO2018164087A1 (ja) * | 2017-03-10 | 2018-09-13 | 株式会社ニコン | パターン描画装置、及びパターン露光装置 |
JPWO2019065224A1 (ja) * | 2017-09-26 | 2020-11-05 | 株式会社ニコン | パターン描画装置 |
WO2019065224A1 (ja) * | 2017-09-26 | 2019-04-04 | 株式会社ニコン | パターン描画装置 |
JP7070581B2 (ja) | 2017-09-26 | 2022-05-18 | 株式会社ニコン | パターン描画装置 |
JP2020021079A (ja) * | 2019-09-04 | 2020-02-06 | 株式会社ニコン | パターン描画装置 |
JP2020024443A (ja) * | 2019-10-17 | 2020-02-13 | 株式会社ニコン | パターン描画装置 |
WO2021206044A1 (ja) * | 2020-04-06 | 2021-10-14 | 株式会社ニコン | パターン形成装置、並びにパターン形成方法 |
JP7435748B2 (ja) | 2020-04-06 | 2024-02-21 | 株式会社ニコン | パターン形成装置、並びにパターン形成方法 |
Also Published As
Publication number | Publication date |
---|---|
TWI695235B (zh) | 2020-06-01 |
CN106133610A (zh) | 2016-11-16 |
TWI639064B (zh) | 2018-10-21 |
TWI684836B (zh) | 2020-02-11 |
CN107272353B (zh) | 2019-06-14 |
CN107957660B (zh) | 2020-10-23 |
TWI661280B (zh) | 2019-06-01 |
TWI674484B (zh) | 2019-10-11 |
JPWO2015152218A1 (ja) | 2017-04-13 |
JP6597602B2 (ja) | 2019-10-30 |
TW201842420A (zh) | 2018-12-01 |
HK1247996A1 (zh) | 2018-10-05 |
KR102430139B1 (ko) | 2022-08-08 |
JP2019023764A (ja) | 2019-02-14 |
HK1245420A1 (zh) | 2018-08-24 |
TW201932996A (zh) | 2019-08-16 |
CN107957660A (zh) | 2018-04-24 |
CN107272353A (zh) | 2017-10-20 |
CN107255913A (zh) | 2017-10-17 |
TW201600941A (zh) | 2016-01-01 |
TW201842419A (zh) | 2018-12-01 |
TW202018436A (zh) | 2020-05-16 |
TWI709006B (zh) | 2020-11-01 |
TW202004368A (zh) | 2020-01-16 |
KR102377752B1 (ko) | 2022-03-24 |
KR20170002375A (ko) | 2017-01-06 |
CN106133610B (zh) | 2017-12-29 |
HK1245417B (zh) | 2020-03-27 |
JP2019215588A (ja) | 2019-12-19 |
KR20220038545A (ko) | 2022-03-28 |
CN107255913B (zh) | 2019-10-11 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP6677287B2 (ja) | 基板処理装置の調整方法 | |
JP6597602B2 (ja) | 基板処理装置及びデバイス製造方法 | |
JP6648798B2 (ja) | パターン描画装置 | |
TWI820043B (zh) | 圖案描繪裝置 | |
JP2020024443A (ja) | パターン描画装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 15774080 Country of ref document: EP Kind code of ref document: A1 |
|
ENP | Entry into the national phase |
Ref document number: 2016511920 Country of ref document: JP Kind code of ref document: A Ref document number: 20167027089 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase | ||
122 | Ep: pct application non-entry in european phase |
Ref document number: 15774080 Country of ref document: EP Kind code of ref document: A1 |