WO2014192700A1 - ガスバリア性フィルムおよびその製造方法 - Google Patents
ガスバリア性フィルムおよびその製造方法 Download PDFInfo
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- WO2014192700A1 WO2014192700A1 PCT/JP2014/063871 JP2014063871W WO2014192700A1 WO 2014192700 A1 WO2014192700 A1 WO 2014192700A1 JP 2014063871 W JP2014063871 W JP 2014063871W WO 2014192700 A1 WO2014192700 A1 WO 2014192700A1
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- barrier layer
- film
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- 238000000034 method Methods 0.000 title description 102
- 230000008569 process Effects 0.000 title description 12
- 230000004888 barrier function Effects 0.000 claims abstract description 445
- 239000007789 gas Substances 0.000 claims abstract description 142
- 239000000463 material Substances 0.000 claims abstract description 95
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical group [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 59
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 32
- 229910052799 carbon Inorganic materials 0.000 claims abstract description 23
- 229910010272 inorganic material Inorganic materials 0.000 claims abstract description 23
- 239000010703 silicon Substances 0.000 claims abstract description 23
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims abstract description 22
- 150000002484 inorganic compounds Chemical class 0.000 claims abstract description 18
- 125000004430 oxygen atom Chemical group O* 0.000 claims abstract description 17
- 125000004433 nitrogen atom Chemical group N* 0.000 claims abstract description 10
- 230000000737 periodic effect Effects 0.000 claims abstract description 10
- 238000000576 coating method Methods 0.000 claims description 231
- 239000011248 coating agent Substances 0.000 claims description 185
- -1 polysiloxane Polymers 0.000 claims description 120
- 229920001709 polysilazane Polymers 0.000 claims description 69
- 239000000758 substrate Substances 0.000 claims description 66
- 238000011282 treatment Methods 0.000 claims description 65
- 239000000654 additive Substances 0.000 claims description 44
- 229910052782 aluminium Inorganic materials 0.000 claims description 43
- 150000001875 compounds Chemical class 0.000 claims description 42
- 238000012986 modification Methods 0.000 claims description 41
- 230000004048 modification Effects 0.000 claims description 41
- 230000000996 additive effect Effects 0.000 claims description 37
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 37
- 150000003377 silicon compounds Chemical class 0.000 claims description 29
- 229920001296 polysiloxane Polymers 0.000 claims description 23
- 239000010936 titanium Substances 0.000 claims description 23
- 239000007788 liquid Substances 0.000 claims description 21
- 229910052738 indium Inorganic materials 0.000 claims description 19
- GYHNNYVSQQEPJS-UHFFFAOYSA-N Gallium Chemical compound [Ga] GYHNNYVSQQEPJS-UHFFFAOYSA-N 0.000 claims description 17
- 229910052733 gallium Inorganic materials 0.000 claims description 17
- APFVFJFRJDLVQX-UHFFFAOYSA-N indium atom Chemical compound [In] APFVFJFRJDLVQX-UHFFFAOYSA-N 0.000 claims description 17
- 239000011575 calcium Substances 0.000 claims description 16
- 239000011777 magnesium Substances 0.000 claims description 16
- 229910052719 titanium Inorganic materials 0.000 claims description 16
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 15
- 229910052796 boron Inorganic materials 0.000 claims description 15
- 238000004519 manufacturing process Methods 0.000 claims description 15
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 claims description 13
- 238000003980 solgel method Methods 0.000 claims description 12
- 239000002243 precursor Substances 0.000 claims description 10
- 229910052791 calcium Inorganic materials 0.000 claims description 9
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 claims description 8
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 8
- 229910052749 magnesium Inorganic materials 0.000 claims description 8
- 229910052732 germanium Inorganic materials 0.000 claims description 6
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 claims description 6
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 claims description 6
- JBQYATWDVHIOAR-UHFFFAOYSA-N tellanylidenegermanium Chemical compound [Te]=[Ge] JBQYATWDVHIOAR-UHFFFAOYSA-N 0.000 claims description 6
- 125000004432 carbon atom Chemical group C* 0.000 abstract description 9
- 239000010410 layer Substances 0.000 description 427
- 239000010408 film Substances 0.000 description 257
- 239000000243 solution Substances 0.000 description 103
- 239000000203 mixture Substances 0.000 description 74
- NIXOWILDQLNWCW-UHFFFAOYSA-M Acrylate Chemical compound [O-]C(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-M 0.000 description 54
- 229920005989 resin Polymers 0.000 description 42
- 239000011347 resin Substances 0.000 description 42
- 238000006243 chemical reaction Methods 0.000 description 32
- 125000000217 alkyl group Chemical group 0.000 description 31
- 238000001035 drying Methods 0.000 description 31
- 238000010438 heat treatment Methods 0.000 description 30
- MYMOFIZGZYHOMD-UHFFFAOYSA-N Dioxygen Chemical compound O=O MYMOFIZGZYHOMD-UHFFFAOYSA-N 0.000 description 29
- 230000015572 biosynthetic process Effects 0.000 description 29
- 238000000560 X-ray reflectometry Methods 0.000 description 28
- 210000004027 cell Anatomy 0.000 description 27
- 239000001301 oxygen Substances 0.000 description 26
- 229910052760 oxygen Inorganic materials 0.000 description 26
- 239000003054 catalyst Substances 0.000 description 25
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 25
- 239000002904 solvent Substances 0.000 description 25
- POILWHVDKZOXJZ-ARJAWSKDSA-M (z)-4-oxopent-2-en-2-olate Chemical compound C\C([O-])=C\C(C)=O POILWHVDKZOXJZ-ARJAWSKDSA-M 0.000 description 21
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 21
- 229910052757 nitrogen Inorganic materials 0.000 description 21
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Chemical compound O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 20
- 238000005401 electroluminescence Methods 0.000 description 19
- 239000011241 protective layer Substances 0.000 description 18
- 238000009472 formulation Methods 0.000 description 17
- 229910052751 metal Inorganic materials 0.000 description 17
- 239000002184 metal Substances 0.000 description 17
- DURPTKYDGMDSBL-UHFFFAOYSA-N 1-butoxybutane Chemical compound CCCCOCCCC DURPTKYDGMDSBL-UHFFFAOYSA-N 0.000 description 16
- 239000003960 organic solvent Substances 0.000 description 16
- 239000012298 atmosphere Substances 0.000 description 15
- 229920001577 copolymer Polymers 0.000 description 15
- 238000011156 evaluation Methods 0.000 description 15
- 229920000642 polymer Polymers 0.000 description 15
- 238000002360 preparation method Methods 0.000 description 15
- 238000002407 reforming Methods 0.000 description 14
- VGGSQFUCUMXWEO-UHFFFAOYSA-N Ethene Chemical compound C=C VGGSQFUCUMXWEO-UHFFFAOYSA-N 0.000 description 13
- 239000005977 Ethylene Substances 0.000 description 13
- 239000010949 copper Substances 0.000 description 13
- LYCAIKOWRPUZTN-UHFFFAOYSA-N ethylene glycol Natural products OCCO LYCAIKOWRPUZTN-UHFFFAOYSA-N 0.000 description 13
- 230000005525 hole transport Effects 0.000 description 13
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 13
- 239000000126 substance Substances 0.000 description 13
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 12
- YXFVVABEGXRONW-UHFFFAOYSA-N Toluene Chemical compound CC1=CC=CC=C1 YXFVVABEGXRONW-UHFFFAOYSA-N 0.000 description 12
- 229920002451 polyvinyl alcohol Polymers 0.000 description 12
- 238000012545 processing Methods 0.000 description 12
- KFZMGEQAYNKOFK-UHFFFAOYSA-N Isopropanol Chemical compound CC(C)O KFZMGEQAYNKOFK-UHFFFAOYSA-N 0.000 description 11
- 230000007547 defect Effects 0.000 description 11
- 238000001125 extrusion Methods 0.000 description 11
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 11
- 230000001678 irradiating effect Effects 0.000 description 11
- 238000005259 measurement Methods 0.000 description 11
- 229910052753 mercury Inorganic materials 0.000 description 11
- 238000007254 oxidation reaction Methods 0.000 description 11
- 229910001868 water Inorganic materials 0.000 description 11
- 239000004372 Polyvinyl alcohol Substances 0.000 description 10
- 229910052802 copper Inorganic materials 0.000 description 10
- 230000003647 oxidation Effects 0.000 description 10
- KDLHZDBZIXYQEI-UHFFFAOYSA-N palladium Substances [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 10
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical class [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 10
- 238000007789 sealing Methods 0.000 description 10
- 238000012360 testing method Methods 0.000 description 10
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 9
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 9
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 9
- XEKOWRVHYACXOJ-UHFFFAOYSA-N Ethyl acetate Chemical compound CCOC(C)=O XEKOWRVHYACXOJ-UHFFFAOYSA-N 0.000 description 9
- PEDCQBHIVMGVHV-UHFFFAOYSA-N Glycerine Chemical compound OCC(O)CO PEDCQBHIVMGVHV-UHFFFAOYSA-N 0.000 description 9
- OKKJLVBELUTLKV-UHFFFAOYSA-N Methanol Chemical compound OC OKKJLVBELUTLKV-UHFFFAOYSA-N 0.000 description 9
- 238000004833 X-ray photoelectron spectroscopy Methods 0.000 description 9
- 239000004973 liquid crystal related substance Substances 0.000 description 9
- 125000002496 methyl group Chemical group [H]C([H])([H])* 0.000 description 9
- 229910052814 silicon oxide Inorganic materials 0.000 description 9
- 238000002834 transmittance Methods 0.000 description 9
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 9
- WYURNTSHIVDZCO-UHFFFAOYSA-N Tetrahydrofuran Chemical compound C1CCOC1 WYURNTSHIVDZCO-UHFFFAOYSA-N 0.000 description 8
- 150000004703 alkoxides Chemical class 0.000 description 8
- 239000000919 ceramic Substances 0.000 description 8
- 238000010894 electron beam technology Methods 0.000 description 8
- 239000010419 fine particle Substances 0.000 description 8
- 229920000139 polyethylene terephthalate Polymers 0.000 description 8
- 239000005020 polyethylene terephthalate Substances 0.000 description 8
- 239000010948 rhodium Substances 0.000 description 8
- 239000004065 semiconductor Substances 0.000 description 8
- 239000010409 thin film Substances 0.000 description 8
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 description 7
- 125000003118 aryl group Chemical group 0.000 description 7
- RYDRWIKKHPRTLV-UHFFFAOYSA-N butoxyaluminum(2+);propan-2-olate Chemical group CC(C)[O-].CC(C)[O-].CCCCO[Al+2] RYDRWIKKHPRTLV-UHFFFAOYSA-N 0.000 description 7
- 239000011651 chromium Substances 0.000 description 7
- 230000000694 effects Effects 0.000 description 7
- 125000002887 hydroxy group Chemical group [H]O* 0.000 description 7
- 239000011572 manganese Substances 0.000 description 7
- 239000000178 monomer Substances 0.000 description 7
- 239000012299 nitrogen atmosphere Substances 0.000 description 7
- 150000002894 organic compounds Chemical class 0.000 description 7
- 238000009832 plasma treatment Methods 0.000 description 7
- 239000002985 plastic film Substances 0.000 description 7
- 230000002265 prevention Effects 0.000 description 7
- LFQCEHFDDXELDD-UHFFFAOYSA-N tetramethyl orthosilicate Chemical compound CO[Si](OC)(OC)OC LFQCEHFDDXELDD-UHFFFAOYSA-N 0.000 description 7
- 239000011135 tin Substances 0.000 description 7
- 239000004925 Acrylic resin Substances 0.000 description 6
- YMWUJEATGCHHMB-UHFFFAOYSA-N Dichloromethane Chemical compound ClCCl YMWUJEATGCHHMB-UHFFFAOYSA-N 0.000 description 6
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 6
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 6
- BUGBHKTXTAQXES-UHFFFAOYSA-N Selenium Chemical compound [Se] BUGBHKTXTAQXES-UHFFFAOYSA-N 0.000 description 6
- 229910007991 Si-N Inorganic materials 0.000 description 6
- 229910004298 SiO 2 Inorganic materials 0.000 description 6
- 229910006294 Si—N Inorganic materials 0.000 description 6
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 6
- 239000002253 acid Substances 0.000 description 6
- 150000001412 amines Chemical class 0.000 description 6
- 229920002678 cellulose Polymers 0.000 description 6
- MTHSVFCYNBDYFN-UHFFFAOYSA-N diethylene glycol Chemical compound OCCOCCO MTHSVFCYNBDYFN-UHFFFAOYSA-N 0.000 description 6
- 239000002019 doping agent Substances 0.000 description 6
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 6
- VLKZOEOYAKHREP-UHFFFAOYSA-N n-Hexane Chemical compound CCCCCC VLKZOEOYAKHREP-UHFFFAOYSA-N 0.000 description 6
- POPVULPQMGGUMJ-UHFFFAOYSA-N octasilsesquioxane cage Chemical compound O1[SiH](O[SiH](O2)O[SiH](O3)O4)O[SiH]4O[SiH]4O[SiH]1O[SiH]2O[SiH]3O4 POPVULPQMGGUMJ-UHFFFAOYSA-N 0.000 description 6
- 229920006255 plastic film Polymers 0.000 description 6
- 239000004417 polycarbonate Substances 0.000 description 6
- 229910052711 selenium Inorganic materials 0.000 description 6
- 239000011669 selenium Substances 0.000 description 6
- 239000000377 silicon dioxide Substances 0.000 description 6
- 125000005369 trialkoxysilyl group Chemical group 0.000 description 6
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical group CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 5
- 229920000178 Acrylic resin Polymers 0.000 description 5
- XEEYBQQBJWHFJM-UHFFFAOYSA-N Iron Chemical compound [Fe] XEEYBQQBJWHFJM-UHFFFAOYSA-N 0.000 description 5
- LRHPLDYGYMQRHN-UHFFFAOYSA-N N-Butanol Chemical compound CCCCO LRHPLDYGYMQRHN-UHFFFAOYSA-N 0.000 description 5
- LGCMKPRGGJRYGM-UHFFFAOYSA-N Osalmid Chemical compound C1=CC(O)=CC=C1NC(=O)C1=CC=CC=C1O LGCMKPRGGJRYGM-UHFFFAOYSA-N 0.000 description 5
- 229910002808 Si–O–Si Inorganic materials 0.000 description 5
- 238000010521 absorption reaction Methods 0.000 description 5
- 239000000853 adhesive Substances 0.000 description 5
- 125000002723 alicyclic group Chemical group 0.000 description 5
- 229910052739 hydrogen Inorganic materials 0.000 description 5
- 230000007062 hydrolysis Effects 0.000 description 5
- 238000006460 hydrolysis reaction Methods 0.000 description 5
- WGCNASOHLSPBMP-UHFFFAOYSA-N hydroxyacetaldehyde Natural products OCC=O WGCNASOHLSPBMP-UHFFFAOYSA-N 0.000 description 5
- 239000011147 inorganic material Substances 0.000 description 5
- 125000000962 organic group Chemical group 0.000 description 5
- 229920000728 polyester Polymers 0.000 description 5
- 229910052611 pyroxene Inorganic materials 0.000 description 5
- 230000002829 reductive effect Effects 0.000 description 5
- 238000004544 sputter deposition Methods 0.000 description 5
- 229920001187 thermosetting polymer Polymers 0.000 description 5
- 229910052718 tin Inorganic materials 0.000 description 5
- VXUYXOFXAQZZMF-UHFFFAOYSA-N titanium(IV) isopropoxide Chemical compound CC(C)O[Ti](OC(C)C)(OC(C)C)OC(C)C VXUYXOFXAQZZMF-UHFFFAOYSA-N 0.000 description 5
- BPSIOYPQMFLKFR-UHFFFAOYSA-N trimethoxy-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CO[Si](OC)(OC)CCCOCC1CO1 BPSIOYPQMFLKFR-UHFFFAOYSA-N 0.000 description 5
- 238000007740 vapor deposition Methods 0.000 description 5
- WYTZZXDRDKSJID-UHFFFAOYSA-N (3-aminopropyl)triethoxysilane Chemical compound CCO[Si](OCC)(OCC)CCCN WYTZZXDRDKSJID-UHFFFAOYSA-N 0.000 description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- VYZAMTAEIAYCRO-UHFFFAOYSA-N Chromium Chemical compound [Cr] VYZAMTAEIAYCRO-UHFFFAOYSA-N 0.000 description 4
- OFBQJSOFQDEBGM-UHFFFAOYSA-N Pentane Chemical compound CCCCC OFBQJSOFQDEBGM-UHFFFAOYSA-N 0.000 description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 4
- 230000001070 adhesive effect Effects 0.000 description 4
- 239000012790 adhesive layer Substances 0.000 description 4
- 125000003545 alkoxy group Chemical group 0.000 description 4
- 229910002091 carbon monoxide Inorganic materials 0.000 description 4
- 230000003197 catalytic effect Effects 0.000 description 4
- 239000001913 cellulose Substances 0.000 description 4
- 229910001919 chlorite Inorganic materials 0.000 description 4
- 229910052619 chlorite group Inorganic materials 0.000 description 4
- QBWCMBCROVPCKQ-UHFFFAOYSA-N chlorous acid Chemical compound OCl=O QBWCMBCROVPCKQ-UHFFFAOYSA-N 0.000 description 4
- 229910052804 chromium Inorganic materials 0.000 description 4
- 239000002274 desiccant Substances 0.000 description 4
- 230000006866 deterioration Effects 0.000 description 4
- 229910001873 dinitrogen Inorganic materials 0.000 description 4
- 208000028659 discharge Diseases 0.000 description 4
- 239000003822 epoxy resin Substances 0.000 description 4
- 235000019441 ethanol Nutrition 0.000 description 4
- 235000019439 ethyl acetate Nutrition 0.000 description 4
- NIHNNTQXNPWCJQ-UHFFFAOYSA-N fluorene Chemical compound C1=CC=C2CC3=CC=CC=C3C2=C1 NIHNNTQXNPWCJQ-UHFFFAOYSA-N 0.000 description 4
- 239000010931 gold Substances 0.000 description 4
- 229930195733 hydrocarbon Natural products 0.000 description 4
- 238000002347 injection Methods 0.000 description 4
- 239000007924 injection Substances 0.000 description 4
- 150000002500 ions Chemical class 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 229910044991 metal oxide Inorganic materials 0.000 description 4
- 150000004706 metal oxides Chemical class 0.000 description 4
- 239000010955 niobium Substances 0.000 description 4
- 150000004767 nitrides Chemical class 0.000 description 4
- 230000003287 optical effect Effects 0.000 description 4
- 229910052763 palladium Inorganic materials 0.000 description 4
- 239000002245 particle Substances 0.000 description 4
- 229920005668 polycarbonate resin Polymers 0.000 description 4
- 239000004431 polycarbonate resin Substances 0.000 description 4
- 229920000647 polyepoxide Polymers 0.000 description 4
- 229920001225 polyester resin Polymers 0.000 description 4
- 239000004645 polyester resin Substances 0.000 description 4
- 229920001721 polyimide Polymers 0.000 description 4
- 229920001228 polyisocyanate Polymers 0.000 description 4
- 239000005056 polyisocyanate Substances 0.000 description 4
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 4
- 125000001436 propyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])[H] 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 229910052703 rhodium Inorganic materials 0.000 description 4
- 229910052709 silver Inorganic materials 0.000 description 4
- 239000004332 silver Substances 0.000 description 4
- 239000007787 solid Substances 0.000 description 4
- 238000004528 spin coating Methods 0.000 description 4
- 238000005507 spraying Methods 0.000 description 4
- 229910052715 tantalum Inorganic materials 0.000 description 4
- YLQBMQCUIZJEEH-UHFFFAOYSA-N tetrahydrofuran Natural products C=1C=COC=1 YLQBMQCUIZJEEH-UHFFFAOYSA-N 0.000 description 4
- 229920005992 thermoplastic resin Polymers 0.000 description 4
- 125000003396 thiol group Chemical group [H]S* 0.000 description 4
- WRECIMRULFAWHA-UHFFFAOYSA-N trimethyl borate Chemical compound COB(OC)OC WRECIMRULFAWHA-UHFFFAOYSA-N 0.000 description 4
- 239000011701 zinc Substances 0.000 description 4
- SVONRAPFKPVNKG-UHFFFAOYSA-N 2-ethoxyethyl acetate Chemical compound CCOCCOC(C)=O SVONRAPFKPVNKG-UHFFFAOYSA-N 0.000 description 3
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 3
- 229910052684 Cerium Inorganic materials 0.000 description 3
- IMROMDMJAWUWLK-UHFFFAOYSA-N Ethenol Chemical compound OC=C IMROMDMJAWUWLK-UHFFFAOYSA-N 0.000 description 3
- ZZSNKZQZMQGXPY-UHFFFAOYSA-N Ethyl cellulose Chemical compound CCOCC1OC(OC)C(OCC)C(OCC)C1OC1C(O)C(O)C(OC)C(CO)O1 ZZSNKZQZMQGXPY-UHFFFAOYSA-N 0.000 description 3
- 239000001856 Ethyl cellulose Substances 0.000 description 3
- 229910052689 Holmium Inorganic materials 0.000 description 3
- 229910052765 Lutetium Inorganic materials 0.000 description 3
- PWHULOQIROXLJO-UHFFFAOYSA-N Manganese Chemical compound [Mn] PWHULOQIROXLJO-UHFFFAOYSA-N 0.000 description 3
- 229920000877 Melamine resin Polymers 0.000 description 3
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 3
- 229910052779 Neodymium Inorganic materials 0.000 description 3
- MWUXSHHQAYIFBG-UHFFFAOYSA-N Nitric oxide Chemical compound O=[N] MWUXSHHQAYIFBG-UHFFFAOYSA-N 0.000 description 3
- 239000000020 Nitrocellulose Substances 0.000 description 3
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 3
- 239000002202 Polyethylene glycol Substances 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 3
- 239000004793 Polystyrene Substances 0.000 description 3
- 229910052772 Samarium Inorganic materials 0.000 description 3
- 229910008051 Si-OH Inorganic materials 0.000 description 3
- 229910006358 Si—OH Inorganic materials 0.000 description 3
- 229910052771 Terbium Inorganic materials 0.000 description 3
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- GSEJCLTVZPLZKY-UHFFFAOYSA-N Triethanolamine Chemical compound OCCN(CCO)CCO GSEJCLTVZPLZKY-UHFFFAOYSA-N 0.000 description 3
- 229910052769 Ytterbium Inorganic materials 0.000 description 3
- 238000002835 absorbance Methods 0.000 description 3
- 230000001133 acceleration Effects 0.000 description 3
- 125000000218 acetic acid group Chemical group C(C)(=O)* 0.000 description 3
- 125000005595 acetylacetonate group Chemical group 0.000 description 3
- 229940081735 acetylcellulose Drugs 0.000 description 3
- 150000001252 acrylic acid derivatives Chemical class 0.000 description 3
- YNCDEEFMDXHURQ-UHFFFAOYSA-N aluminum;ethyl 3-oxobutanoate Chemical compound [Al].CCOC(=O)CC(C)=O YNCDEEFMDXHURQ-UHFFFAOYSA-N 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 239000000010 aprotic solvent Substances 0.000 description 3
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- 229910052793 cadmium Inorganic materials 0.000 description 3
- BDOSMKKIYDKNTQ-UHFFFAOYSA-N cadmium atom Chemical compound [Cd] BDOSMKKIYDKNTQ-UHFFFAOYSA-N 0.000 description 3
- 229920002301 cellulose acetate Polymers 0.000 description 3
- 239000013522 chelant Substances 0.000 description 3
- 239000003795 chemical substances by application Substances 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 238000003776 cleavage reaction Methods 0.000 description 3
- 229910017052 cobalt Inorganic materials 0.000 description 3
- 239000010941 cobalt Substances 0.000 description 3
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 3
- 239000000805 composite resin Substances 0.000 description 3
- 238000009833 condensation Methods 0.000 description 3
- 230000005494 condensation Effects 0.000 description 3
- 125000000113 cyclohexyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C([H])([H])C1([H])[H] 0.000 description 3
- 238000003618 dip coating Methods 0.000 description 3
- KPUWHANPEXNPJT-UHFFFAOYSA-N disiloxane Chemical class [SiH3]O[SiH3] KPUWHANPEXNPJT-UHFFFAOYSA-N 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 229920001249 ethyl cellulose Polymers 0.000 description 3
- 235000019325 ethyl cellulose Nutrition 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 125000000524 functional group Chemical group 0.000 description 3
- 150000002291 germanium compounds Chemical class 0.000 description 3
- 238000007646 gravure printing Methods 0.000 description 3
- FUZZWVXGSFPDMH-UHFFFAOYSA-M hexanoate Chemical compound CCCCCC([O-])=O FUZZWVXGSFPDMH-UHFFFAOYSA-M 0.000 description 3
- KJZYNXUDTRRSPN-UHFFFAOYSA-N holmium atom Chemical compound [Ho] KJZYNXUDTRRSPN-UHFFFAOYSA-N 0.000 description 3
- 230000006872 improvement Effects 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 239000003999 initiator Substances 0.000 description 3
- 229910052741 iridium Inorganic materials 0.000 description 3
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 description 3
- 239000012948 isocyanate Substances 0.000 description 3
- 150000002513 isocyanates Chemical class 0.000 description 3
- 125000001449 isopropyl group Chemical group [H]C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 3
- 150000002576 ketones Chemical class 0.000 description 3
- 229910052746 lanthanum Inorganic materials 0.000 description 3
- FZLIPJUXYLNCLC-UHFFFAOYSA-N lanthanum atom Chemical compound [La] FZLIPJUXYLNCLC-UHFFFAOYSA-N 0.000 description 3
- 239000002346 layers by function Substances 0.000 description 3
- OHSVLFRHMCKCQY-UHFFFAOYSA-N lutetium atom Chemical compound [Lu] OHSVLFRHMCKCQY-UHFFFAOYSA-N 0.000 description 3
- 229910052748 manganese Inorganic materials 0.000 description 3
- 229910001507 metal halide Inorganic materials 0.000 description 3
- 150000005309 metal halides Chemical class 0.000 description 3
- 238000002156 mixing Methods 0.000 description 3
- 229910052750 molybdenum Inorganic materials 0.000 description 3
- 239000011733 molybdenum Substances 0.000 description 3
- QEFYFXOXNSNQGX-UHFFFAOYSA-N neodymium atom Chemical compound [Nd] QEFYFXOXNSNQGX-UHFFFAOYSA-N 0.000 description 3
- 229920001220 nitrocellulos Polymers 0.000 description 3
- 150000002923 oximes Chemical class 0.000 description 3
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 3
- VSIIXMUUUJUKCM-UHFFFAOYSA-D pentacalcium;fluoride;triphosphate Chemical compound [F-].[Ca+2].[Ca+2].[Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O VSIIXMUUUJUKCM-UHFFFAOYSA-D 0.000 description 3
- 230000035699 permeability Effects 0.000 description 3
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 description 3
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 3
- 229920001467 poly(styrenesulfonates) Polymers 0.000 description 3
- 229920000515 polycarbonate Polymers 0.000 description 3
- 229920001223 polyethylene glycol Polymers 0.000 description 3
- 229920002223 polystyrene Polymers 0.000 description 3
- OGHBATFHNDZKSO-UHFFFAOYSA-N propan-2-olate Chemical compound CC(C)[O-] OGHBATFHNDZKSO-UHFFFAOYSA-N 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- KZUNJOHGWZRPMI-UHFFFAOYSA-N samarium atom Chemical compound [Sm] KZUNJOHGWZRPMI-UHFFFAOYSA-N 0.000 description 3
- 238000007127 saponification reaction Methods 0.000 description 3
- 229910052706 scandium Inorganic materials 0.000 description 3
- SIXSYDAISGFNSX-UHFFFAOYSA-N scandium atom Chemical compound [Sc] SIXSYDAISGFNSX-UHFFFAOYSA-N 0.000 description 3
- 230000007017 scission Effects 0.000 description 3
- SCPYDCQAZCOKTP-UHFFFAOYSA-N silanol Chemical compound [SiH3]O SCPYDCQAZCOKTP-UHFFFAOYSA-N 0.000 description 3
- 230000003746 surface roughness Effects 0.000 description 3
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 description 3
- GZCRRIHWUXGPOV-UHFFFAOYSA-N terbium atom Chemical compound [Tb] GZCRRIHWUXGPOV-UHFFFAOYSA-N 0.000 description 3
- 229910052716 thallium Inorganic materials 0.000 description 3
- BKVIYDNLLOSFOA-UHFFFAOYSA-N thallium Chemical compound [Tl] BKVIYDNLLOSFOA-UHFFFAOYSA-N 0.000 description 3
- 238000009281 ultraviolet germicidal irradiation Methods 0.000 description 3
- 238000001771 vacuum deposition Methods 0.000 description 3
- 239000008096 xylene Substances 0.000 description 3
- NAWDYIZEMPQZHO-UHFFFAOYSA-N ytterbium Chemical compound [Yb] NAWDYIZEMPQZHO-UHFFFAOYSA-N 0.000 description 3
- 229910052727 yttrium Inorganic materials 0.000 description 3
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 3
- 229910052725 zinc Inorganic materials 0.000 description 3
- UOCLXMDMGBRAIB-UHFFFAOYSA-N 1,1,1-trichloroethane Chemical compound CC(Cl)(Cl)Cl UOCLXMDMGBRAIB-UHFFFAOYSA-N 0.000 description 2
- RFFLAFLAYFXFSW-UHFFFAOYSA-N 1,2-dichlorobenzene Chemical compound ClC1=CC=CC=C1Cl RFFLAFLAYFXFSW-UHFFFAOYSA-N 0.000 description 2
- RYHBNJHYFVUHQT-UHFFFAOYSA-N 1,4-Dioxane Chemical compound C1COCCO1 RYHBNJHYFVUHQT-UHFFFAOYSA-N 0.000 description 2
- LEJBBGNFPAFPKQ-UHFFFAOYSA-N 2-(2-prop-2-enoyloxyethoxy)ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOC(=O)C=C LEJBBGNFPAFPKQ-UHFFFAOYSA-N 0.000 description 2
- GOXQRTZXKQZDDN-UHFFFAOYSA-N 2-Ethylhexyl acrylate Chemical compound CCCCC(CC)COC(=O)C=C GOXQRTZXKQZDDN-UHFFFAOYSA-N 0.000 description 2
- INQDDHNZXOAFFD-UHFFFAOYSA-N 2-[2-(2-prop-2-enoyloxyethoxy)ethoxy]ethyl prop-2-enoate Chemical compound C=CC(=O)OCCOCCOCCOC(=O)C=C INQDDHNZXOAFFD-UHFFFAOYSA-N 0.000 description 2
- TXBCBTDQIULDIA-UHFFFAOYSA-N 2-[[3-hydroxy-2,2-bis(hydroxymethyl)propoxy]methyl]-2-(hydroxymethyl)propane-1,3-diol Chemical compound OCC(CO)(CO)COCC(CO)(CO)CO TXBCBTDQIULDIA-UHFFFAOYSA-N 0.000 description 2
- BFSVOASYOCHEOV-UHFFFAOYSA-N 2-diethylaminoethanol Chemical compound CCN(CC)CCO BFSVOASYOCHEOV-UHFFFAOYSA-N 0.000 description 2
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 2
- OMIGHNLMNHATMP-UHFFFAOYSA-N 2-hydroxyethyl prop-2-enoate Chemical compound OCCOC(=O)C=C OMIGHNLMNHATMP-UHFFFAOYSA-N 0.000 description 2
- XLLIQLLCWZCATF-UHFFFAOYSA-N 2-methoxyethyl acetate Chemical compound COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- KUDUQBURMYMBIJ-UHFFFAOYSA-N 2-prop-2-enoyloxyethyl prop-2-enoate Chemical compound C=CC(=O)OCCOC(=O)C=C KUDUQBURMYMBIJ-UHFFFAOYSA-N 0.000 description 2
- QZPSOSOOLFHYRR-UHFFFAOYSA-N 3-hydroxypropyl prop-2-enoate Chemical compound OCCCOC(=O)C=C QZPSOSOOLFHYRR-UHFFFAOYSA-N 0.000 description 2
- UIKUBYKUYUSRSM-UHFFFAOYSA-N 3-morpholinopropylamine Chemical compound NCCCN1CCOCC1 UIKUBYKUYUSRSM-UHFFFAOYSA-N 0.000 description 2
- XDLMVUHYZWKMMD-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2-methylprop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(C)=C XDLMVUHYZWKMMD-UHFFFAOYSA-N 0.000 description 2
- VVBLNCFGVYUYGU-UHFFFAOYSA-N 4,4'-Bis(dimethylamino)benzophenone Chemical compound C1=CC(N(C)C)=CC=C1C(=O)C1=CC=C(N(C)C)C=C1 VVBLNCFGVYUYGU-UHFFFAOYSA-N 0.000 description 2
- HCFAJYNVAYBARA-UHFFFAOYSA-N 4-heptanone Chemical compound CCCC(=O)CCC HCFAJYNVAYBARA-UHFFFAOYSA-N 0.000 description 2
- JHWGFJBTMHEZME-UHFFFAOYSA-N 4-prop-2-enoyloxybutyl prop-2-enoate Chemical compound C=CC(=O)OCCCCOC(=O)C=C JHWGFJBTMHEZME-UHFFFAOYSA-N 0.000 description 2
- RSWGJHLUYNHPMX-UHFFFAOYSA-N Abietic-Saeure Natural products C12CCC(C(C)C)=CC2=CCC2C1(C)CCCC2(C)C(O)=O RSWGJHLUYNHPMX-UHFFFAOYSA-N 0.000 description 2
- JBRZTFJDHDCESZ-UHFFFAOYSA-N AsGa Chemical compound [As]#[Ga] JBRZTFJDHDCESZ-UHFFFAOYSA-N 0.000 description 2
- FIPWRIJSWJWJAI-UHFFFAOYSA-N Butyl carbitol 6-propylpiperonyl ether Chemical compound C1=C(CCC)C(COCCOCCOCCCC)=CC2=C1OCO2 FIPWRIJSWJWJAI-UHFFFAOYSA-N 0.000 description 2
- YJOZQKPCYREOME-UHFFFAOYSA-N COC([O-])C.[Nd+3].COC([O-])C.COC([O-])C Chemical compound COC([O-])C.[Nd+3].COC([O-])C.COC([O-])C YJOZQKPCYREOME-UHFFFAOYSA-N 0.000 description 2
- 239000004215 Carbon black (E152) Substances 0.000 description 2
- XDTMQSROBMDMFD-UHFFFAOYSA-N Cyclohexane Chemical compound C1CCCCC1 XDTMQSROBMDMFD-UHFFFAOYSA-N 0.000 description 2
- GUUVPOWQJOLRAS-UHFFFAOYSA-N Diphenyl disulfide Chemical compound C=1C=CC=CC=1SSC1=CC=CC=C1 GUUVPOWQJOLRAS-UHFFFAOYSA-N 0.000 description 2
- 229910052691 Erbium Inorganic materials 0.000 description 2
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 2
- 229910052693 Europium Inorganic materials 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
- 229910052688 Gadolinium Inorganic materials 0.000 description 2
- VEXZGXHMUGYJMC-UHFFFAOYSA-N Hydrochloric acid Chemical compound Cl VEXZGXHMUGYJMC-UHFFFAOYSA-N 0.000 description 2
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 2
- CSNNHWWHGAXBCP-UHFFFAOYSA-L Magnesium sulfate Chemical compound [Mg+2].[O-][S+2]([O-])([O-])[O-] CSNNHWWHGAXBCP-UHFFFAOYSA-L 0.000 description 2
- BAPJBEWLBFYGME-UHFFFAOYSA-N Methyl acrylate Chemical compound COC(=O)C=C BAPJBEWLBFYGME-UHFFFAOYSA-N 0.000 description 2
- SECXISVLQFMRJM-UHFFFAOYSA-N N-Methylpyrrolidone Chemical compound CN1CCCC1=O SECXISVLQFMRJM-UHFFFAOYSA-N 0.000 description 2
- WHNWPMSKXPGLAX-UHFFFAOYSA-N N-Vinyl-2-pyrrolidone Chemical compound C=CN1CCCC1=O WHNWPMSKXPGLAX-UHFFFAOYSA-N 0.000 description 2
- UEEJHVSXFDXPFK-UHFFFAOYSA-N N-dimethylaminoethanol Chemical compound CN(C)CCO UEEJHVSXFDXPFK-UHFFFAOYSA-N 0.000 description 2
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 2
- 229920001609 Poly(3,4-ethylenedioxythiophene) Polymers 0.000 description 2
- 229910052777 Praseodymium Inorganic materials 0.000 description 2
- 229910052773 Promethium Inorganic materials 0.000 description 2
- KHPCPRHQVVSZAH-HUOMCSJISA-N Rosin Natural products O(C/C=C/c1ccccc1)[C@H]1[C@H](O)[C@@H](O)[C@@H](O)[C@@H](CO)O1 KHPCPRHQVVSZAH-HUOMCSJISA-N 0.000 description 2
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 2
- 239000006087 Silane Coupling Agent Substances 0.000 description 2
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 description 2
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 2
- 229910052775 Thulium Inorganic materials 0.000 description 2
- GWEVSGVZZGPLCZ-UHFFFAOYSA-N Titan oxide Chemical compound O=[Ti]=O GWEVSGVZZGPLCZ-UHFFFAOYSA-N 0.000 description 2
- 239000007983 Tris buffer Substances 0.000 description 2
- 229920001807 Urea-formaldehyde Polymers 0.000 description 2
- XTXRWKRVRITETP-UHFFFAOYSA-N Vinyl acetate Chemical compound CC(=O)OC=C XTXRWKRVRITETP-UHFFFAOYSA-N 0.000 description 2
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 2
- WDJHALXBUFZDSR-UHFFFAOYSA-M acetoacetate Chemical compound CC(=O)CC([O-])=O WDJHALXBUFZDSR-UHFFFAOYSA-M 0.000 description 2
- 239000005456 alcohol based solvent Substances 0.000 description 2
- 150000001338 aliphatic hydrocarbons Chemical class 0.000 description 2
- 229920000180 alkyd Polymers 0.000 description 2
- 125000003277 amino group Chemical group 0.000 description 2
- 229920003180 amino resin Polymers 0.000 description 2
- 229910052586 apatite Inorganic materials 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000007611 bar coating method Methods 0.000 description 2
- 229910052788 barium Inorganic materials 0.000 description 2
- DSAJWYNOEDNPEQ-UHFFFAOYSA-N barium atom Chemical compound [Ba] DSAJWYNOEDNPEQ-UHFFFAOYSA-N 0.000 description 2
- 238000005452 bending Methods 0.000 description 2
- ISAOCJYIOMOJEB-UHFFFAOYSA-N benzoin Chemical compound C=1C=CC=CC=1C(O)C(=O)C1=CC=CC=C1 ISAOCJYIOMOJEB-UHFFFAOYSA-N 0.000 description 2
- 229910052790 beryllium Inorganic materials 0.000 description 2
- ATBAMAFKBVZNFJ-UHFFFAOYSA-N beryllium atom Chemical compound [Be] ATBAMAFKBVZNFJ-UHFFFAOYSA-N 0.000 description 2
- 239000011230 binding agent Substances 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- ILAHWRKJUDSMFH-UHFFFAOYSA-N boron tribromide Chemical compound BrB(Br)Br ILAHWRKJUDSMFH-UHFFFAOYSA-N 0.000 description 2
- WTEOIRVLGSZEPR-UHFFFAOYSA-N boron trifluoride Chemical compound FB(F)F WTEOIRVLGSZEPR-UHFFFAOYSA-N 0.000 description 2
- WERYXYBDKMZEQL-UHFFFAOYSA-N butane-1,4-diol Chemical compound OCCCCO WERYXYBDKMZEQL-UHFFFAOYSA-N 0.000 description 2
- FGVNCNTVSHHPTI-UHFFFAOYSA-N butoxyaluminum Chemical group CCCCO[Al] FGVNCNTVSHHPTI-UHFFFAOYSA-N 0.000 description 2
- 125000000484 butyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 2
- QHIWVLPBUQWDMQ-UHFFFAOYSA-N butyl prop-2-enoate;methyl 2-methylprop-2-enoate;prop-2-enoic acid Chemical compound OC(=O)C=C.COC(=O)C(C)=C.CCCCOC(=O)C=C QHIWVLPBUQWDMQ-UHFFFAOYSA-N 0.000 description 2
- RPPBZEBXAAZZJH-UHFFFAOYSA-N cadmium telluride Chemical compound [Te]=[Cd] RPPBZEBXAAZZJH-UHFFFAOYSA-N 0.000 description 2
- XJHCXCQVJFPJIK-UHFFFAOYSA-M caesium fluoride Chemical compound [F-].[Cs+] XJHCXCQVJFPJIK-UHFFFAOYSA-M 0.000 description 2
- ZCCIPPOKBCJFDN-UHFFFAOYSA-N calcium nitrate Chemical compound [Ca+2].[O-][N+]([O-])=O.[O-][N+]([O-])=O ZCCIPPOKBCJFDN-UHFFFAOYSA-N 0.000 description 2
- BRPQOXSCLDDYGP-UHFFFAOYSA-N calcium oxide Chemical compound [O-2].[Ca+2] BRPQOXSCLDDYGP-UHFFFAOYSA-N 0.000 description 2
- 239000000292 calcium oxide Substances 0.000 description 2
- ODINCKMPIJJUCX-UHFFFAOYSA-N calcium oxide Inorganic materials [Ca]=O ODINCKMPIJJUCX-UHFFFAOYSA-N 0.000 description 2
- OSGAYBCDTDRGGQ-UHFFFAOYSA-L calcium sulfate Chemical compound [Ca+2].[O-]S([O-])(=O)=O OSGAYBCDTDRGGQ-UHFFFAOYSA-L 0.000 description 2
- MMLSWLZTJDJYJH-UHFFFAOYSA-N calcium;propan-2-olate Chemical compound [Ca+2].CC(C)[O-].CC(C)[O-] MMLSWLZTJDJYJH-UHFFFAOYSA-N 0.000 description 2
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 2
- 150000007942 carboxylates Chemical class 0.000 description 2
- 238000005266 casting Methods 0.000 description 2
- 229920003086 cellulose ether Polymers 0.000 description 2
- GWXLDORMOJMVQZ-UHFFFAOYSA-N cerium Chemical compound [Ce] GWXLDORMOJMVQZ-UHFFFAOYSA-N 0.000 description 2
- 238000006757 chemical reactions by type Methods 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 125000004093 cyano group Chemical group *C#N 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- 125000001511 cyclopentyl group Chemical group [H]C1([H])C([H])([H])C([H])([H])C([H])(*)C1([H])[H] 0.000 description 2
- 238000006297 dehydration reaction Methods 0.000 description 2
- 125000004386 diacrylate group Chemical group 0.000 description 2
- 150000001983 dialkylethers Chemical class 0.000 description 2
- XXJWXESWEXIICW-UHFFFAOYSA-N diethylene glycol monoethyl ether Chemical compound CCOCCOCCO XXJWXESWEXIICW-UHFFFAOYSA-N 0.000 description 2
- HQWPLXHWEZZGKY-UHFFFAOYSA-N diethylzinc Chemical compound CC[Zn]CC HQWPLXHWEZZGKY-UHFFFAOYSA-N 0.000 description 2
- IJKVHSBPTUYDLN-UHFFFAOYSA-N dihydroxy(oxo)silane Chemical compound O[Si](O)=O IJKVHSBPTUYDLN-UHFFFAOYSA-N 0.000 description 2
- 238000007865 diluting Methods 0.000 description 2
- HNPSIPDUKPIQMN-UHFFFAOYSA-N dioxosilane;oxo(oxoalumanyloxy)alumane Chemical compound O=[Si]=O.O=[Al]O[Al]=O HNPSIPDUKPIQMN-UHFFFAOYSA-N 0.000 description 2
- 238000007598 dipping method Methods 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000009820 dry lamination Methods 0.000 description 2
- 239000000428 dust Substances 0.000 description 2
- 239000000975 dye Substances 0.000 description 2
- 229920001971 elastomer Polymers 0.000 description 2
- 150000002118 epoxides Chemical class 0.000 description 2
- UYAHIZSMUZPPFV-UHFFFAOYSA-N erbium Chemical compound [Er] UYAHIZSMUZPPFV-UHFFFAOYSA-N 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 150000002170 ethers Chemical class 0.000 description 2
- WEIQRLLXVVSKIL-UHFFFAOYSA-N ethyl 2,2-diethyl-3-oxobutanoate Chemical compound CCOC(=O)C(CC)(CC)C(C)=O WEIQRLLXVVSKIL-UHFFFAOYSA-N 0.000 description 2
- XYIBRDXRRQCHLP-UHFFFAOYSA-N ethyl acetoacetate Chemical compound CCOC(=O)CC(C)=O XYIBRDXRRQCHLP-UHFFFAOYSA-N 0.000 description 2
- OGPBJKLSAFTDLK-UHFFFAOYSA-N europium atom Chemical compound [Eu] OGPBJKLSAFTDLK-UHFFFAOYSA-N 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 125000003983 fluorenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3CC12)* 0.000 description 2
- 239000011888 foil Substances 0.000 description 2
- UIWYJDYFSGRHKR-UHFFFAOYSA-N gadolinium atom Chemical compound [Gd] UIWYJDYFSGRHKR-UHFFFAOYSA-N 0.000 description 2
- 230000009477 glass transition Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 229910052735 hafnium Inorganic materials 0.000 description 2
- VBJZVLUMGGDVMO-UHFFFAOYSA-N hafnium atom Chemical compound [Hf] VBJZVLUMGGDVMO-UHFFFAOYSA-N 0.000 description 2
- 229910052736 halogen Inorganic materials 0.000 description 2
- 125000005843 halogen group Chemical group 0.000 description 2
- 229910052734 helium Inorganic materials 0.000 description 2
- 239000001307 helium Substances 0.000 description 2
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 2
- CATSNJVOTSVZJV-UHFFFAOYSA-N heptan-2-one Chemical compound CCCCCC(C)=O CATSNJVOTSVZJV-UHFFFAOYSA-N 0.000 description 2
- FFUAGWLWBBFQJT-UHFFFAOYSA-N hexamethyldisilazane Chemical compound C[Si](C)(C)N[Si](C)(C)C FFUAGWLWBBFQJT-UHFFFAOYSA-N 0.000 description 2
- 229910052892 hornblende Inorganic materials 0.000 description 2
- 150000002430 hydrocarbons Chemical group 0.000 description 2
- 239000001257 hydrogen Substances 0.000 description 2
- AMGQUBHHOARCQH-UHFFFAOYSA-N indium;oxotin Chemical compound [In].[Sn]=O AMGQUBHHOARCQH-UHFFFAOYSA-N 0.000 description 2
- 230000005865 ionizing radiation Effects 0.000 description 2
- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 2
- 230000000670 limiting effect Effects 0.000 description 2
- 239000006224 matting agent Substances 0.000 description 2
- 150000001247 metal acetylides Chemical class 0.000 description 2
- 150000002736 metal compounds Chemical class 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 125000000956 methoxy group Chemical group [H]C([H])([H])O* 0.000 description 2
- QPJVMBTYPHYUOC-UHFFFAOYSA-N methyl benzoate Chemical compound COC(=O)C1=CC=CC=C1 QPJVMBTYPHYUOC-UHFFFAOYSA-N 0.000 description 2
- DNIAPMSPPWPWGF-UHFFFAOYSA-N monopropylene glycol Natural products CC(O)CO DNIAPMSPPWPWGF-UHFFFAOYSA-N 0.000 description 2
- TXXWBTOATXBWDR-UHFFFAOYSA-N n,n,n',n'-tetramethylhexane-1,6-diamine Chemical class CN(C)CCCCCCN(C)C TXXWBTOATXBWDR-UHFFFAOYSA-N 0.000 description 2
- 125000000740 n-pentyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 125000004123 n-propyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])* 0.000 description 2
- 239000000025 natural resin Substances 0.000 description 2
- 229910052759 nickel Inorganic materials 0.000 description 2
- 229910052758 niobium Inorganic materials 0.000 description 2
- GUCVJGMIXFAOAE-UHFFFAOYSA-N niobium atom Chemical compound [Nb] GUCVJGMIXFAOAE-UHFFFAOYSA-N 0.000 description 2
- 229910017604 nitric acid Inorganic materials 0.000 description 2
- 229910052762 osmium Inorganic materials 0.000 description 2
- SYQBFIAQOQZEGI-UHFFFAOYSA-N osmium atom Chemical compound [Os] SYQBFIAQOQZEGI-UHFFFAOYSA-N 0.000 description 2
- 230000001590 oxidative effect Effects 0.000 description 2
- WXZMFSXDPGVJKK-UHFFFAOYSA-N pentaerythritol Chemical compound OCC(CO)(CO)CO WXZMFSXDPGVJKK-UHFFFAOYSA-N 0.000 description 2
- FDPIMTJIUBPUKL-UHFFFAOYSA-N pentan-3-one Chemical compound CCC(=O)CC FDPIMTJIUBPUKL-UHFFFAOYSA-N 0.000 description 2
- 238000000206 photolithography Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229960005235 piperonyl butoxide Drugs 0.000 description 2
- 229920003023 plastic Polymers 0.000 description 2
- 239000004033 plastic Substances 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 229920003207 poly(ethylene-2,6-naphthalate) Polymers 0.000 description 2
- 229920002492 poly(sulfone) Polymers 0.000 description 2
- 229920001515 polyalkylene glycol Polymers 0.000 description 2
- 229920006122 polyamide resin Polymers 0.000 description 2
- 229920001230 polyarylate Polymers 0.000 description 2
- 238000006068 polycondensation reaction Methods 0.000 description 2
- 239000011112 polyethylene naphthalate Substances 0.000 description 2
- 229920001451 polypropylene glycol Polymers 0.000 description 2
- 229920005990 polystyrene resin Polymers 0.000 description 2
- PUDIUYLPXJFUGB-UHFFFAOYSA-N praseodymium atom Chemical compound [Pr] PUDIUYLPXJFUGB-UHFFFAOYSA-N 0.000 description 2
- UOHMMEJUHBCKEE-UHFFFAOYSA-N prehnitene Chemical compound CC1=CC=C(C)C(C)=C1C UOHMMEJUHBCKEE-UHFFFAOYSA-N 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 230000002250 progressing effect Effects 0.000 description 2
- VQMWBBYLQSCNPO-UHFFFAOYSA-N promethium atom Chemical compound [Pm] VQMWBBYLQSCNPO-UHFFFAOYSA-N 0.000 description 2
- XPGAWFIWCWKDDL-UHFFFAOYSA-N propan-1-olate;zirconium(4+) Chemical compound [Zr+4].CCC[O-].CCC[O-].CCC[O-].CCC[O-] XPGAWFIWCWKDDL-UHFFFAOYSA-N 0.000 description 2
- 229910052705 radium Inorganic materials 0.000 description 2
- HCWPIIXVSYCSAN-UHFFFAOYSA-N radium atom Chemical compound [Ra] HCWPIIXVSYCSAN-UHFFFAOYSA-N 0.000 description 2
- 230000006798 recombination Effects 0.000 description 2
- 238000005215 recombination Methods 0.000 description 2
- 229910052702 rhenium Inorganic materials 0.000 description 2
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 description 2
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 description 2
- 239000005060 rubber Substances 0.000 description 2
- 229910052707 ruthenium Inorganic materials 0.000 description 2
- 239000000565 sealant Substances 0.000 description 2
- 239000002356 single layer Substances 0.000 description 2
- 241000894007 species Species 0.000 description 2
- 229910052596 spinel Inorganic materials 0.000 description 2
- 239000011029 spinel Substances 0.000 description 2
- 229910052712 strontium Inorganic materials 0.000 description 2
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 2
- 125000001424 substituent group Chemical group 0.000 description 2
- 239000011593 sulfur Substances 0.000 description 2
- 229910052717 sulfur Inorganic materials 0.000 description 2
- 229920003002 synthetic resin Polymers 0.000 description 2
- 239000000057 synthetic resin Substances 0.000 description 2
- 229910052713 technetium Inorganic materials 0.000 description 2
- GKLVYJBZJHMRIY-UHFFFAOYSA-N technetium atom Chemical compound [Tc] GKLVYJBZJHMRIY-UHFFFAOYSA-N 0.000 description 2
- 125000000999 tert-butyl group Chemical group [H]C([H])([H])C(*)(C([H])([H])[H])C([H])([H])[H] 0.000 description 2
- PKLMYPSYVKAPOX-UHFFFAOYSA-N tetra(propan-2-yloxy)germane Chemical compound CC(C)O[Ge](OC(C)C)(OC(C)C)OC(C)C PKLMYPSYVKAPOX-UHFFFAOYSA-N 0.000 description 2
- HJUGFYREWKUQJT-UHFFFAOYSA-N tetrabromomethane Chemical compound BrC(Br)(Br)Br HJUGFYREWKUQJT-UHFFFAOYSA-N 0.000 description 2
- QEMXHQIAXOOASZ-UHFFFAOYSA-N tetramethylammonium Chemical compound C[N+](C)(C)C QEMXHQIAXOOASZ-UHFFFAOYSA-N 0.000 description 2
- 229920002803 thermoplastic polyurethane Polymers 0.000 description 2
- FRNOGLGSGLTDKL-UHFFFAOYSA-N thulium atom Chemical compound [Tm] FRNOGLGSGLTDKL-UHFFFAOYSA-N 0.000 description 2
- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 2
- KHPCPRHQVVSZAH-UHFFFAOYSA-N trans-cinnamyl beta-D-glucopyranoside Natural products OC1C(O)C(O)C(CO)OC1OCC=CC1=CC=CC=C1 KHPCPRHQVVSZAH-UHFFFAOYSA-N 0.000 description 2
- WOZZOSDBXABUFO-UHFFFAOYSA-N tri(butan-2-yloxy)alumane Chemical compound [Al+3].CCC(C)[O-].CCC(C)[O-].CCC(C)[O-] WOZZOSDBXABUFO-UHFFFAOYSA-N 0.000 description 2
- OVZUSPADPSOQQN-UHFFFAOYSA-N tri(propan-2-yloxy)indigane Chemical compound [In+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] OVZUSPADPSOQQN-UHFFFAOYSA-N 0.000 description 2
- JLGLQAWTXXGVEM-UHFFFAOYSA-N triethylene glycol monomethyl ether Chemical compound COCCOCCOCCO JLGLQAWTXXGVEM-UHFFFAOYSA-N 0.000 description 2
- 239000013638 trimer Substances 0.000 description 2
- AXJAWMUPFHKOHY-UHFFFAOYSA-N trimethyl(octadecyl)silane Chemical compound CCCCCCCCCCCCCCCCCC[Si](C)(C)C AXJAWMUPFHKOHY-UHFFFAOYSA-N 0.000 description 2
- RIOQSEWOXXDEQQ-UHFFFAOYSA-N triphenylphosphine Chemical compound C1=CC=CC=C1P(C=1C=CC=CC=1)C1=CC=CC=C1 RIOQSEWOXXDEQQ-UHFFFAOYSA-N 0.000 description 2
- NHDIQVFFNDKAQU-UHFFFAOYSA-N tripropan-2-yl borate Chemical compound CC(C)OB(OC(C)C)OC(C)C NHDIQVFFNDKAQU-UHFFFAOYSA-N 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 239000010937 tungsten Substances 0.000 description 2
- 229910021642 ultra pure water Inorganic materials 0.000 description 2
- 239000012498 ultrapure water Substances 0.000 description 2
- 238000004506 ultrasonic cleaning Methods 0.000 description 2
- 239000006097 ultraviolet radiation absorber Substances 0.000 description 2
- LEONUFNNVUYDNQ-UHFFFAOYSA-N vanadium atom Chemical compound [V] LEONUFNNVUYDNQ-UHFFFAOYSA-N 0.000 description 2
- 229920002554 vinyl polymer Polymers 0.000 description 2
- 229910052724 xenon Inorganic materials 0.000 description 2
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 2
- JIAARYAFYJHUJI-UHFFFAOYSA-L zinc dichloride Chemical compound [Cl-].[Cl-].[Zn+2] JIAARYAFYJHUJI-UHFFFAOYSA-L 0.000 description 2
- CNGTXGHYZBQUQS-UHFFFAOYSA-N ((1-(2-methoxyethoxy)ethoxy)methyl)benzene Chemical compound COCCOC(C)OCC1=CC=CC=C1 CNGTXGHYZBQUQS-UHFFFAOYSA-N 0.000 description 1
- DTGKSKDOIYIVQL-WEDXCCLWSA-N (+)-borneol Chemical group C1C[C@@]2(C)[C@@H](O)C[C@@H]1C2(C)C DTGKSKDOIYIVQL-WEDXCCLWSA-N 0.000 description 1
- MLIWQXBKMZNZNF-PWDIZTEBSA-N (2e,6e)-2,6-bis[(4-azidophenyl)methylidene]-4-methylcyclohexan-1-one Chemical compound O=C1\C(=C\C=2C=CC(=CC=2)N=[N+]=[N-])CC(C)C\C1=C/C1=CC=C(N=[N+]=[N-])C=C1 MLIWQXBKMZNZNF-PWDIZTEBSA-N 0.000 description 1
- LNAZSHAWQACDHT-XIYTZBAFSA-N (2r,3r,4s,5r,6s)-4,5-dimethoxy-2-(methoxymethyl)-3-[(2s,3r,4s,5r,6r)-3,4,5-trimethoxy-6-(methoxymethyl)oxan-2-yl]oxy-6-[(2r,3r,4s,5r,6r)-4,5,6-trimethoxy-2-(methoxymethyl)oxan-3-yl]oxyoxane Chemical compound CO[C@@H]1[C@@H](OC)[C@H](OC)[C@@H](COC)O[C@H]1O[C@H]1[C@H](OC)[C@@H](OC)[C@H](O[C@H]2[C@@H]([C@@H](OC)[C@H](OC)O[C@@H]2COC)OC)O[C@@H]1COC LNAZSHAWQACDHT-XIYTZBAFSA-N 0.000 description 1
- LGPAKRMZNPYPMG-UHFFFAOYSA-N (3-hydroxy-2-prop-2-enoyloxypropyl) prop-2-enoate Chemical compound C=CC(=O)OC(CO)COC(=O)C=C LGPAKRMZNPYPMG-UHFFFAOYSA-N 0.000 description 1
- BNGXYYYYKUGPPF-UHFFFAOYSA-M (3-methylphenyl)methyl-triphenylphosphanium;chloride Chemical compound [Cl-].CC1=CC=CC(C[P+](C=2C=CC=CC=2)(C=2C=CC=CC=2)C=2C=CC=CC=2)=C1 BNGXYYYYKUGPPF-UHFFFAOYSA-M 0.000 description 1
- PSGCQDPCAWOCSH-UHFFFAOYSA-N (4,7,7-trimethyl-3-bicyclo[2.2.1]heptanyl) prop-2-enoate Chemical compound C1CC2(C)C(OC(=O)C=C)CC1C2(C)C PSGCQDPCAWOCSH-UHFFFAOYSA-N 0.000 description 1
- LTQBNYCMVZQRSD-UHFFFAOYSA-N (4-ethenylphenyl)-trimethoxysilane Chemical compound CO[Si](OC)(OC)C1=CC=C(C=C)C=C1 LTQBNYCMVZQRSD-UHFFFAOYSA-N 0.000 description 1
- OAKFFVBGTSPYEG-UHFFFAOYSA-N (4-prop-2-enoyloxycyclohexyl) prop-2-enoate Chemical compound C=CC(=O)OC1CCC(OC(=O)C=C)CC1 OAKFFVBGTSPYEG-UHFFFAOYSA-N 0.000 description 1
- WUOACPNHFRMFPN-SECBINFHSA-N (S)-(-)-alpha-terpineol Chemical compound CC1=CC[C@@H](C(C)(C)O)CC1 WUOACPNHFRMFPN-SECBINFHSA-N 0.000 description 1
- RUJPNZNXGCHGID-UHFFFAOYSA-N (Z)-beta-Terpineol Natural products CC(=C)C1CCC(C)(O)CC1 RUJPNZNXGCHGID-UHFFFAOYSA-N 0.000 description 1
- IDXCKOANSQIPGX-UHFFFAOYSA-N (acetyloxy-ethenyl-methylsilyl) acetate Chemical compound CC(=O)O[Si](C)(C=C)OC(C)=O IDXCKOANSQIPGX-UHFFFAOYSA-N 0.000 description 1
- ODIGIKRIUKFKHP-UHFFFAOYSA-N (n-propan-2-yloxycarbonylanilino) acetate Chemical compound CC(C)OC(=O)N(OC(C)=O)C1=CC=CC=C1 ODIGIKRIUKFKHP-UHFFFAOYSA-N 0.000 description 1
- ZVYYAYJIGYODSD-LNTINUHCSA-K (z)-4-bis[[(z)-4-oxopent-2-en-2-yl]oxy]gallanyloxypent-3-en-2-one Chemical compound [Ga+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O ZVYYAYJIGYODSD-LNTINUHCSA-K 0.000 description 1
- RDMHXWZYVFGYSF-LNTINUHCSA-N (z)-4-hydroxypent-3-en-2-one;manganese Chemical compound [Mn].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O RDMHXWZYVFGYSF-LNTINUHCSA-N 0.000 description 1
- YOBOXHGSEJBUPB-MTOQALJVSA-N (z)-4-hydroxypent-3-en-2-one;zirconium Chemical compound [Zr].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O YOBOXHGSEJBUPB-MTOQALJVSA-N 0.000 description 1
- NOXQKISUYACYGB-LNTINUHCSA-K (z)-4-oxopent-2-en-2-olate;praseodymium(3+) Chemical compound [Pr+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O NOXQKISUYACYGB-LNTINUHCSA-K 0.000 description 1
- BYEAHWXPCBROCE-UHFFFAOYSA-N 1,1,1,3,3,3-hexafluoropropan-2-ol Chemical compound FC(F)(F)C(O)C(F)(F)F BYEAHWXPCBROCE-UHFFFAOYSA-N 0.000 description 1
- KKYDYRWEUFJLER-UHFFFAOYSA-N 1,1,2,2,3,3,4,4,5,5,6,6,7,7,10,10,10-heptadecafluorodecyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)C(F)(F)CCC(F)(F)F KKYDYRWEUFJLER-UHFFFAOYSA-N 0.000 description 1
- YQQFFTNDQFUNHB-UHFFFAOYSA-N 1,1-dimethylsiletane Chemical compound C[Si]1(C)CCC1 YQQFFTNDQFUNHB-UHFFFAOYSA-N 0.000 description 1
- WCLKSQYCWXZMGX-UHFFFAOYSA-N 1,2,3,4-tetrabromo-5,6-dimethoxybenzene Chemical compound COC1=C(Br)C(Br)=C(Br)C(Br)=C1OC WCLKSQYCWXZMGX-UHFFFAOYSA-N 0.000 description 1
- SCEFCWXRXJZWHE-UHFFFAOYSA-N 1,2,3-tribromo-4-(2,3,4-tribromophenyl)sulfonylbenzene Chemical compound BrC1=C(Br)C(Br)=CC=C1S(=O)(=O)C1=CC=C(Br)C(Br)=C1Br SCEFCWXRXJZWHE-UHFFFAOYSA-N 0.000 description 1
- MYWOJODOMFBVCB-UHFFFAOYSA-N 1,2,6-trimethylphenanthrene Chemical compound CC1=CC=C2C3=CC(C)=CC=C3C=CC2=C1C MYWOJODOMFBVCB-UHFFFAOYSA-N 0.000 description 1
- GJZFGDYLJLCGHT-UHFFFAOYSA-N 1,2-diethylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=C(CC)C(CC)=CC=C3SC2=C1 GJZFGDYLJLCGHT-UHFFFAOYSA-N 0.000 description 1
- JZLWSRCQCPAUDP-UHFFFAOYSA-N 1,3,5-triazine-2,4,6-triamine;urea Chemical compound NC(N)=O.NC1=NC(N)=NC(N)=N1 JZLWSRCQCPAUDP-UHFFFAOYSA-N 0.000 description 1
- YFKBXYGUSOXJGS-UHFFFAOYSA-N 1,3-Diphenyl-2-propanone Chemical compound C=1C=CC=CC=1CC(=O)CC1=CC=CC=C1 YFKBXYGUSOXJGS-UHFFFAOYSA-N 0.000 description 1
- YJTKZCDBKVTVBY-UHFFFAOYSA-N 1,3-Diphenylbenzene Chemical group C1=CC=CC=C1C1=CC=CC(C=2C=CC=CC=2)=C1 YJTKZCDBKVTVBY-UHFFFAOYSA-N 0.000 description 1
- VNQXSTWCDUXYEZ-UHFFFAOYSA-N 1,7,7-trimethylbicyclo[2.2.1]heptane-2,3-dione Chemical compound C1CC2(C)C(=O)C(=O)C1C2(C)C VNQXSTWCDUXYEZ-UHFFFAOYSA-N 0.000 description 1
- WGYZMNBUZFHYRX-UHFFFAOYSA-N 1-(1-methoxypropan-2-yloxy)propan-2-ol Chemical compound COCC(C)OCC(C)O WGYZMNBUZFHYRX-UHFFFAOYSA-N 0.000 description 1
- QWOZZTWBWQMEPD-UHFFFAOYSA-N 1-(2-ethoxypropoxy)propan-2-ol Chemical compound CCOC(C)COCC(C)O QWOZZTWBWQMEPD-UHFFFAOYSA-N 0.000 description 1
- IHGSAQHSAGRWNI-UHFFFAOYSA-N 1-(4-bromophenyl)-2,2,2-trifluoroethanone Chemical compound FC(F)(F)C(=O)C1=CC=C(Br)C=C1 IHGSAQHSAGRWNI-UHFFFAOYSA-N 0.000 description 1
- VMCRQYHCDSXNLW-UHFFFAOYSA-N 1-(4-tert-butylphenyl)-2,2-dichloroethanone Chemical compound CC(C)(C)C1=CC=C(C(=O)C(Cl)Cl)C=C1 VMCRQYHCDSXNLW-UHFFFAOYSA-N 0.000 description 1
- XUIXZBXRQFZHIT-UHFFFAOYSA-N 1-[1-(1-hydroxypropan-2-yloxy)propan-2-yloxy]-3-methoxypropan-2-ol Chemical compound COCC(O)COC(C)COC(C)CO XUIXZBXRQFZHIT-UHFFFAOYSA-N 0.000 description 1
- MVPFPGOWZLIWRV-UHFFFAOYSA-N 1-azido-4-[[3-[(4-azidophenyl)methylidene]cyclohexylidene]methyl]benzene Chemical compound C1=CC(N=[N+]=[N-])=CC=C1C=C(CCC1)CC1=CC1=CC=C(N=[N+]=[N-])C=C1 MVPFPGOWZLIWRV-UHFFFAOYSA-N 0.000 description 1
- KFBUECDOROPEBI-UHFFFAOYSA-N 1-butoxyethane-1,2-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.CCCCOC(O)CO KFBUECDOROPEBI-UHFFFAOYSA-N 0.000 description 1
- JOLQKTGDSGKSKJ-UHFFFAOYSA-N 1-ethoxypropan-2-ol Chemical compound CCOCC(C)O JOLQKTGDSGKSKJ-UHFFFAOYSA-N 0.000 description 1
- LIPRQQHINVWJCH-UHFFFAOYSA-N 1-ethoxypropan-2-yl acetate Chemical compound CCOCC(C)OC(C)=O LIPRQQHINVWJCH-UHFFFAOYSA-N 0.000 description 1
- GKMWWXGSJSEDLF-UHFFFAOYSA-N 1-methoxyethane-1,2-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.COC(O)CO GKMWWXGSJSEDLF-UHFFFAOYSA-N 0.000 description 1
- ARXJGSRGQADJSQ-UHFFFAOYSA-N 1-methoxypropan-2-ol Chemical compound COCC(C)O ARXJGSRGQADJSQ-UHFFFAOYSA-N 0.000 description 1
- SFSLTRCPISPSKB-UHFFFAOYSA-N 10-methylideneanthracen-9-one Chemical compound C1=CC=C2C(=C)C3=CC=CC=C3C(=O)C2=C1 SFSLTRCPISPSKB-UHFFFAOYSA-N 0.000 description 1
- OZAIFHULBGXAKX-UHFFFAOYSA-N 2,2'-azo-bis-isobutyronitrile Substances N#CC(C)(C)N=NC(C)(C)C#N OZAIFHULBGXAKX-UHFFFAOYSA-N 0.000 description 1
- IRPGOXJVTQTAAN-UHFFFAOYSA-N 2,2,3,3,3-pentafluoropropanal Chemical compound FC(F)(F)C(F)(F)C=O IRPGOXJVTQTAAN-UHFFFAOYSA-N 0.000 description 1
- NBUKAOOFKZFCGD-UHFFFAOYSA-N 2,2,3,3-tetrafluoropropan-1-ol Chemical compound OCC(F)(F)C(F)F NBUKAOOFKZFCGD-UHFFFAOYSA-N 0.000 description 1
- GKZPEYIPJQHPNC-UHFFFAOYSA-N 2,2-bis(hydroxymethyl)propane-1,3-diol prop-2-enoic acid Chemical compound OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OC(=O)C=C.OCC(CO)(CO)CO GKZPEYIPJQHPNC-UHFFFAOYSA-N 0.000 description 1
- PIZHFBODNLEQBL-UHFFFAOYSA-N 2,2-diethoxy-1-phenylethanone Chemical compound CCOC(OCC)C(=O)C1=CC=CC=C1 PIZHFBODNLEQBL-UHFFFAOYSA-N 0.000 description 1
- KWVGIHKZDCUPEU-UHFFFAOYSA-N 2,2-dimethoxy-2-phenylacetophenone Chemical compound C=1C=CC=CC=1C(OC)(OC)C(=O)C1=CC=CC=C1 KWVGIHKZDCUPEU-UHFFFAOYSA-N 0.000 description 1
- MIGVPIXONIAZHK-UHFFFAOYSA-N 2,2-dimethylpropane-1,3-diol;prop-2-enoic acid Chemical compound OC(=O)C=C.OC(=O)C=C.OCC(C)(C)CO MIGVPIXONIAZHK-UHFFFAOYSA-N 0.000 description 1
- PUGOMSLRUSTQGV-UHFFFAOYSA-N 2,3-di(prop-2-enoyloxy)propyl prop-2-enoate Chemical compound C=CC(=O)OCC(OC(=O)C=C)COC(=O)C=C PUGOMSLRUSTQGV-UHFFFAOYSA-N 0.000 description 1
- NGCRLFIYVFOUMZ-UHFFFAOYSA-N 2,3-dichloroquinoxaline-6-carbonyl chloride Chemical compound N1=C(Cl)C(Cl)=NC2=CC(C(=O)Cl)=CC=C21 NGCRLFIYVFOUMZ-UHFFFAOYSA-N 0.000 description 1
- QRIMLDXJAPZHJE-UHFFFAOYSA-N 2,3-dihydroxypropyl 2-methylprop-2-enoate Chemical class CC(=C)C(=O)OCC(O)CO QRIMLDXJAPZHJE-UHFFFAOYSA-N 0.000 description 1
- OWPUOLBODXJOKH-UHFFFAOYSA-N 2,3-dihydroxypropyl prop-2-enoate Chemical compound OCC(O)COC(=O)C=C OWPUOLBODXJOKH-UHFFFAOYSA-N 0.000 description 1
- URZHQOCYXDNFGN-UHFFFAOYSA-N 2,4,6-trimethyl-2,4,6-tris(3,3,3-trifluoropropyl)-1,3,5,2,4,6-trioxatrisilinane Chemical compound FC(F)(F)CC[Si]1(C)O[Si](C)(CCC(F)(F)F)O[Si](C)(CCC(F)(F)F)O1 URZHQOCYXDNFGN-UHFFFAOYSA-N 0.000 description 1
- BVTLTBONLZSBJC-UHFFFAOYSA-N 2,4,6-tris(ethenyl)-2,4,6-trimethyl-1,3,5,2,4,6-trioxatrisilinane Chemical compound C=C[Si]1(C)O[Si](C)(C=C)O[Si](C)(C=C)O1 BVTLTBONLZSBJC-UHFFFAOYSA-N 0.000 description 1
- OAYXUHPQHDHDDZ-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethanol Chemical compound CCCCOCCOCCO OAYXUHPQHDHDDZ-UHFFFAOYSA-N 0.000 description 1
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- YHYCMHWTYHPIQS-UHFFFAOYSA-N 2-(2-hydroxyethoxy)-1-methoxyethanol Chemical compound COC(O)COCCO YHYCMHWTYHPIQS-UHFFFAOYSA-N 0.000 description 1
- SBASXUCJHJRPEV-UHFFFAOYSA-N 2-(2-methoxyethoxy)ethanol Chemical compound COCCOCCO SBASXUCJHJRPEV-UHFFFAOYSA-N 0.000 description 1
- OEPOKWHJYJXUGD-UHFFFAOYSA-N 2-(3-phenylmethoxyphenyl)-1,3-thiazole-4-carbaldehyde Chemical compound O=CC1=CSC(C=2C=C(OCC=3C=CC=CC=3)C=CC=2)=N1 OEPOKWHJYJXUGD-UHFFFAOYSA-N 0.000 description 1
- XNWFRZJHXBZDAG-UHFFFAOYSA-N 2-METHOXYETHANOL Chemical compound COCCO XNWFRZJHXBZDAG-UHFFFAOYSA-N 0.000 description 1
- WFSMVVDJSNMRAR-UHFFFAOYSA-N 2-[2-(2-ethoxyethoxy)ethoxy]ethanol Chemical compound CCOCCOCCOCCO WFSMVVDJSNMRAR-UHFFFAOYSA-N 0.000 description 1
- LCZVSXRMYJUNFX-UHFFFAOYSA-N 2-[2-(2-hydroxypropoxy)propoxy]propan-1-ol Chemical compound CC(O)COC(C)COC(C)CO LCZVSXRMYJUNFX-UHFFFAOYSA-N 0.000 description 1
- HEQOJEGTZCTHCF-UHFFFAOYSA-N 2-amino-1-phenylethanone Chemical compound NCC(=O)C1=CC=CC=C1 HEQOJEGTZCTHCF-UHFFFAOYSA-N 0.000 description 1
- DZZAHLOABNWIFA-UHFFFAOYSA-N 2-butoxy-1,2-diphenylethanone Chemical compound C=1C=CC=CC=1C(OCCCC)C(=O)C1=CC=CC=C1 DZZAHLOABNWIFA-UHFFFAOYSA-N 0.000 description 1
- NQBXSWAWVZHKBZ-UHFFFAOYSA-N 2-butoxyethyl acetate Chemical compound CCCCOCCOC(C)=O NQBXSWAWVZHKBZ-UHFFFAOYSA-N 0.000 description 1
- PTJDGKYFJYEAOK-UHFFFAOYSA-N 2-butoxyethyl prop-2-enoate Chemical compound CCCCOCCOC(=O)C=C PTJDGKYFJYEAOK-UHFFFAOYSA-N 0.000 description 1
- FPKCTSIVDAWGFA-UHFFFAOYSA-N 2-chloroanthracene-9,10-dione Chemical compound C1=CC=C2C(=O)C3=CC(Cl)=CC=C3C(=O)C2=C1 FPKCTSIVDAWGFA-UHFFFAOYSA-N 0.000 description 1
- ZCDADJXRUCOCJE-UHFFFAOYSA-N 2-chlorothioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(Cl)=CC=C3SC2=C1 ZCDADJXRUCOCJE-UHFFFAOYSA-N 0.000 description 1
- KYFDXXXNUGBKLT-UHFFFAOYSA-N 2-ethoxyethynyl(dimethyl)silane Chemical compound CCOC#C[SiH](C)C KYFDXXXNUGBKLT-UHFFFAOYSA-N 0.000 description 1
- XMLYCEVDHLAQEL-UHFFFAOYSA-N 2-hydroxy-2-methyl-1-phenylpropan-1-one Chemical compound CC(C)(O)C(=O)C1=CC=CC=C1 XMLYCEVDHLAQEL-UHFFFAOYSA-N 0.000 description 1
- 125000000954 2-hydroxyethyl group Chemical group [H]C([*])([H])C([H])([H])O[H] 0.000 description 1
- GWZMWHWAWHPNHN-UHFFFAOYSA-N 2-hydroxypropyl prop-2-enoate Chemical compound CC(O)COC(=O)C=C GWZMWHWAWHPNHN-UHFFFAOYSA-N 0.000 description 1
- 125000004200 2-methoxyethyl group Chemical group [H]C([H])([H])OC([H])([H])C([H])([H])* 0.000 description 1
- HFCUBKYHMMPGBY-UHFFFAOYSA-N 2-methoxyethyl prop-2-enoate Chemical compound COCCOC(=O)C=C HFCUBKYHMMPGBY-UHFFFAOYSA-N 0.000 description 1
- CZMNFHBVFGQLCG-UHFFFAOYSA-N 2-methylpropan-1-ol;oxovanadium Chemical compound [V]=O.CC(C)CO.CC(C)CO.CC(C)CO CZMNFHBVFGQLCG-UHFFFAOYSA-N 0.000 description 1
- SNOJPWLNAMAYSX-UHFFFAOYSA-N 2-methylpropan-1-ol;titanium Chemical compound [Ti].CC(C)CO.CC(C)CO.CC(C)CO.CC(C)CO SNOJPWLNAMAYSX-UHFFFAOYSA-N 0.000 description 1
- ZBBMXDFMKDTJPZ-UHFFFAOYSA-N 2-methylpropan-2-olate niobium(5+) Chemical compound [Nb+5].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-] ZBBMXDFMKDTJPZ-UHFFFAOYSA-N 0.000 description 1
- GRWPYGBKJYICOO-UHFFFAOYSA-N 2-methylpropan-2-olate;titanium(4+) Chemical compound [Ti+4].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-] GRWPYGBKJYICOO-UHFFFAOYSA-N 0.000 description 1
- BGGIUGXMWNKMCP-UHFFFAOYSA-N 2-methylpropan-2-olate;zirconium(4+) Chemical compound CC(C)(C)O[Zr](OC(C)(C)C)(OC(C)(C)C)OC(C)(C)C BGGIUGXMWNKMCP-UHFFFAOYSA-N 0.000 description 1
- CFVWNXQPGQOHRJ-UHFFFAOYSA-N 2-methylpropyl prop-2-enoate Chemical compound CC(C)COC(=O)C=C CFVWNXQPGQOHRJ-UHFFFAOYSA-N 0.000 description 1
- MYISVPVWAQRUTL-UHFFFAOYSA-N 2-methylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C)=CC=C3SC2=C1 MYISVPVWAQRUTL-UHFFFAOYSA-N 0.000 description 1
- UMWZLYTVXQBTTE-UHFFFAOYSA-N 2-pentylanthracene-9,10-dione Chemical compound C1=CC=C2C(=O)C3=CC(CCCCC)=CC=C3C(=O)C2=C1 UMWZLYTVXQBTTE-UHFFFAOYSA-N 0.000 description 1
- RZVINYQDSSQUKO-UHFFFAOYSA-N 2-phenoxyethyl prop-2-enoate Chemical compound C=CC(=O)OCCOC1=CC=CC=C1 RZVINYQDSSQUKO-UHFFFAOYSA-N 0.000 description 1
- KTALPKYXQZGAEG-UHFFFAOYSA-N 2-propan-2-ylthioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC(C(C)C)=CC=C3SC2=C1 KTALPKYXQZGAEG-UHFFFAOYSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- YTPSFXZMJKMUJE-UHFFFAOYSA-N 2-tert-butylanthracene-9,10-dione Chemical compound C1=CC=C2C(=O)C3=CC(C(C)(C)C)=CC=C3C(=O)C2=C1 YTPSFXZMJKMUJE-UHFFFAOYSA-N 0.000 description 1
- QCAHUFWKIQLBNB-UHFFFAOYSA-N 3-(3-methoxypropoxy)propan-1-ol Chemical compound COCCCOCCCO QCAHUFWKIQLBNB-UHFFFAOYSA-N 0.000 description 1
- WWZPKECNXMOJPN-UHFFFAOYSA-N 3-(4-azidophenyl)-1-phenylpropan-1-one Chemical compound C1=CC(N=[N+]=[N-])=CC=C1CCC(=O)C1=CC=CC=C1 WWZPKECNXMOJPN-UHFFFAOYSA-N 0.000 description 1
- GBCNIMMWOPWZEG-UHFFFAOYSA-N 3-(diethoxymethylsilyl)-n,n-dimethylpropan-1-amine Chemical compound CCOC(OCC)[SiH2]CCCN(C)C GBCNIMMWOPWZEG-UHFFFAOYSA-N 0.000 description 1
- VLZDYNDUVLBNLD-UHFFFAOYSA-N 3-(dimethoxymethylsilyl)propyl 2-methylprop-2-enoate Chemical compound COC(OC)[SiH2]CCCOC(=O)C(C)=C VLZDYNDUVLBNLD-UHFFFAOYSA-N 0.000 description 1
- HHHPYRGQUSPESB-UHFFFAOYSA-N 3-(dimethoxymethylsilyl)propyl prop-2-enoate Chemical compound COC(OC)[SiH2]CCCOC(=O)C=C HHHPYRGQUSPESB-UHFFFAOYSA-N 0.000 description 1
- XBIUWALDKXACEA-UHFFFAOYSA-N 3-[bis(2,4-dioxopentan-3-yl)alumanyl]pentane-2,4-dione Chemical compound CC(=O)C(C(C)=O)[Al](C(C(C)=O)C(C)=O)C(C(C)=O)C(C)=O XBIUWALDKXACEA-UHFFFAOYSA-N 0.000 description 1
- GLISOBUNKGBQCL-UHFFFAOYSA-N 3-[ethoxy(dimethyl)silyl]propan-1-amine Chemical compound CCO[Si](C)(C)CCCN GLISOBUNKGBQCL-UHFFFAOYSA-N 0.000 description 1
- VXOAPUIMMKQAFU-UHFFFAOYSA-N 3-ethenylsulfanylpropyl(trimethyl)silane Chemical compound C[Si](C)(C)CCCSC=C VXOAPUIMMKQAFU-UHFFFAOYSA-N 0.000 description 1
- SJECZPVISLOESU-UHFFFAOYSA-N 3-trimethoxysilylpropan-1-amine Chemical compound CO[Si](OC)(OC)CCCN SJECZPVISLOESU-UHFFFAOYSA-N 0.000 description 1
- CCOQPNDCFRSIOZ-UHFFFAOYSA-N 3-trimethoxysilylpropyl 2,2,2-trifluoroacetate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C(F)(F)F CCOQPNDCFRSIOZ-UHFFFAOYSA-N 0.000 description 1
- KBQVDAIIQCXKPI-UHFFFAOYSA-N 3-trimethoxysilylpropyl prop-2-enoate Chemical compound CO[Si](OC)(OC)CCCOC(=O)C=C KBQVDAIIQCXKPI-UHFFFAOYSA-N 0.000 description 1
- OKISUZLXOYGIFP-UHFFFAOYSA-N 4,4'-dichlorobenzophenone Chemical compound C1=CC(Cl)=CC=C1C(=O)C1=CC=C(Cl)C=C1 OKISUZLXOYGIFP-UHFFFAOYSA-N 0.000 description 1
- MVXMNHYVCLMLDD-UHFFFAOYSA-N 4-methoxynaphthalene-1-carbaldehyde Chemical compound C1=CC=C2C(OC)=CC=C(C=O)C2=C1 MVXMNHYVCLMLDD-UHFFFAOYSA-N 0.000 description 1
- BMVWCPGVLSILMU-UHFFFAOYSA-N 5,6-dihydrodibenzo[2,1-b:2',1'-f][7]annulen-11-one Chemical compound C1CC2=CC=CC=C2C(=O)C2=CC=CC=C21 BMVWCPGVLSILMU-UHFFFAOYSA-N 0.000 description 1
- FVCSARBUZVPSQF-UHFFFAOYSA-N 5-(2,4-dioxooxolan-3-yl)-7-methyl-3a,4,5,7a-tetrahydro-2-benzofuran-1,3-dione Chemical compound C1C(C(OC2=O)=O)C2C(C)=CC1C1C(=O)COC1=O FVCSARBUZVPSQF-UHFFFAOYSA-N 0.000 description 1
- HRJSLUPAMXKPPM-UHFFFAOYSA-N 5-methyl-2-(3-methylphenyl)pyrazol-3-amine Chemical compound N1=C(C)C=C(N)N1C1=CC=CC(C)=C1 HRJSLUPAMXKPPM-UHFFFAOYSA-N 0.000 description 1
- XAMCLRBWHRRBCN-UHFFFAOYSA-N 5-prop-2-enoyloxypentyl prop-2-enoate Chemical compound C=CC(=O)OCCCCCOC(=O)C=C XAMCLRBWHRRBCN-UHFFFAOYSA-N 0.000 description 1
- RVDLHGSZWAELAU-UHFFFAOYSA-N 5-tert-butylthiophene-2-carbonyl chloride Chemical compound CC(C)(C)C1=CC=C(C(Cl)=O)S1 RVDLHGSZWAELAU-UHFFFAOYSA-N 0.000 description 1
- JTHZUSWLNCPZLX-UHFFFAOYSA-N 6-fluoro-3-methyl-2h-indazole Chemical compound FC1=CC=C2C(C)=NNC2=C1 JTHZUSWLNCPZLX-UHFFFAOYSA-N 0.000 description 1
- DXPPIEDUBFUSEZ-UHFFFAOYSA-N 6-methylheptyl prop-2-enoate Chemical compound CC(C)CCCCCOC(=O)C=C DXPPIEDUBFUSEZ-UHFFFAOYSA-N 0.000 description 1
- HUKPVYBUJRAUAG-UHFFFAOYSA-N 7-benzo[a]phenalenone Chemical compound C1=CC(C(=O)C=2C3=CC=CC=2)=C2C3=CC=CC2=C1 HUKPVYBUJRAUAG-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-M Acetate Chemical compound CC([O-])=O QTBSBXVTEAMEQO-UHFFFAOYSA-M 0.000 description 1
- KLZUFWVZNOTSEM-UHFFFAOYSA-K Aluminum fluoride Inorganic materials F[Al](F)F KLZUFWVZNOTSEM-UHFFFAOYSA-K 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- CIWBSHSKHKDKBQ-JLAZNSOCSA-N Ascorbic acid Natural products OC[C@H](O)[C@H]1OC(=O)C(O)=C1O CIWBSHSKHKDKBQ-JLAZNSOCSA-N 0.000 description 1
- 229910015900 BF3 Inorganic materials 0.000 description 1
- 229910000873 Beta-alumina solid electrolyte Inorganic materials 0.000 description 1
- 229920002799 BoPET Polymers 0.000 description 1
- FERIUCNNQQJTOY-UHFFFAOYSA-M Butyrate Chemical group CCCC([O-])=O FERIUCNNQQJTOY-UHFFFAOYSA-M 0.000 description 1
- FERIUCNNQQJTOY-UHFFFAOYSA-N Butyric acid Natural products CCCC(O)=O FERIUCNNQQJTOY-UHFFFAOYSA-N 0.000 description 1
- YJIFTYXRIKMETG-UHFFFAOYSA-N C(C)OC([O-])C.[Zn+2].C(C)OC([O-])C Chemical compound C(C)OC([O-])C.[Zn+2].C(C)OC([O-])C YJIFTYXRIKMETG-UHFFFAOYSA-N 0.000 description 1
- FBXFASOKARHVAQ-UHFFFAOYSA-N CC(C)(C)[O-].[Ge+2].CC(C)(C)[O-] Chemical compound CC(C)(C)[O-].[Ge+2].CC(C)(C)[O-] FBXFASOKARHVAQ-UHFFFAOYSA-N 0.000 description 1
- CLHTUQUNSSUVEJ-UHFFFAOYSA-N CC(C)(C)[O-].[Sn+4].[O-]CCCC.[Sn+4] Chemical compound CC(C)(C)[O-].[Sn+4].[O-]CCCC.[Sn+4] CLHTUQUNSSUVEJ-UHFFFAOYSA-N 0.000 description 1
- GWYDZVYZTDJZQB-UHFFFAOYSA-N CCCO[Zr] Chemical compound CCCO[Zr] GWYDZVYZTDJZQB-UHFFFAOYSA-N 0.000 description 1
- QOGFQIGEQMWCJB-UHFFFAOYSA-N COC(OC)[Si]CCC(F)(F)F Chemical compound COC(OC)[Si]CCC(F)(F)F QOGFQIGEQMWCJB-UHFFFAOYSA-N 0.000 description 1
- CIYFDOMKPRAGBR-UHFFFAOYSA-N COC([O-])C.[Pr+3].COC([O-])C.COC([O-])C Chemical compound COC([O-])C.[Pr+3].COC([O-])C.COC([O-])C CIYFDOMKPRAGBR-UHFFFAOYSA-N 0.000 description 1
- UXVHAZNVHWLABN-UHFFFAOYSA-N C[O-].[Ta+4].C[O-].C[O-].C[O-] Chemical compound C[O-].[Ta+4].C[O-].C[O-].C[O-] UXVHAZNVHWLABN-UHFFFAOYSA-N 0.000 description 1
- 239000004154 Calcium bromate Substances 0.000 description 1
- UXVMQQNJUSDDNG-UHFFFAOYSA-L Calcium chloride Chemical compound [Cl-].[Cl-].[Ca+2] UXVMQQNJUSDDNG-UHFFFAOYSA-L 0.000 description 1
- ZKQDCIXGCQPQNV-UHFFFAOYSA-N Calcium hypochlorite Chemical compound [Ca+2].Cl[O-].Cl[O-] ZKQDCIXGCQPQNV-UHFFFAOYSA-N 0.000 description 1
- 239000004151 Calcium iodate Substances 0.000 description 1
- UNMYWSMUMWPJLR-UHFFFAOYSA-L Calcium iodide Chemical compound [Ca+2].[I-].[I-] UNMYWSMUMWPJLR-UHFFFAOYSA-L 0.000 description 1
- 239000004343 Calcium peroxide Substances 0.000 description 1
- 241000218645 Cedrus Species 0.000 description 1
- 235000013162 Cocos nucifera Nutrition 0.000 description 1
- 244000060011 Cocos nucifera Species 0.000 description 1
- 229940126062 Compound A Drugs 0.000 description 1
- YYLLIJHXUHJATK-UHFFFAOYSA-N Cyclohexyl acetate Chemical compound CC(=O)OC1CCCCC1 YYLLIJHXUHJATK-UHFFFAOYSA-N 0.000 description 1
- XMSXQFUHVRWGNA-UHFFFAOYSA-N Decamethylcyclopentasiloxane Chemical compound C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O1 XMSXQFUHVRWGNA-UHFFFAOYSA-N 0.000 description 1
- FEWJPZIEWOKRBE-JCYAYHJZSA-N Dextrotartaric acid Chemical compound OC(=O)[C@H](O)[C@@H](O)C(O)=O FEWJPZIEWOKRBE-JCYAYHJZSA-N 0.000 description 1
- 239000004593 Epoxy Chemical group 0.000 description 1
- JIGUQPWFLRLWPJ-UHFFFAOYSA-N Ethyl acrylate Chemical compound CCOC(=O)C=C JIGUQPWFLRLWPJ-UHFFFAOYSA-N 0.000 description 1
- 229920000219 Ethylene vinyl alcohol Polymers 0.000 description 1
- 229910002601 GaN Inorganic materials 0.000 description 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 1
- JMASRVWKEDWRBT-UHFFFAOYSA-N Gallium nitride Chemical compound [Ga]#N JMASRVWKEDWRBT-UHFFFAOYSA-N 0.000 description 1
- CTKINSOISVBQLD-UHFFFAOYSA-N Glycidol Chemical compound OCC1CO1 CTKINSOISVBQLD-UHFFFAOYSA-N 0.000 description 1
- NLDMNSXOCDLTTB-UHFFFAOYSA-N Heterophylliin A Natural products O1C2COC(=O)C3=CC(O)=C(O)C(O)=C3C3=C(O)C(O)=C(O)C=C3C(=O)OC2C(OC(=O)C=2C=C(O)C(O)=C(O)C=2)C(O)C1OC(=O)C1=CC(O)=C(O)C(O)=C1 NLDMNSXOCDLTTB-UHFFFAOYSA-N 0.000 description 1
- 241000692870 Inachis io Species 0.000 description 1
- GPXJNWSHGFTCBW-UHFFFAOYSA-N Indium phosphide Chemical compound [In]#P GPXJNWSHGFTCBW-UHFFFAOYSA-N 0.000 description 1
- MPCRDALPQLDDFX-UHFFFAOYSA-L Magnesium perchlorate Chemical compound [Mg+2].[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O MPCRDALPQLDDFX-UHFFFAOYSA-L 0.000 description 1
- SPAGIJMPHSUYSE-UHFFFAOYSA-N Magnesium peroxide Chemical compound [Mg+2].[O-][O-] SPAGIJMPHSUYSE-UHFFFAOYSA-N 0.000 description 1
- 239000004640 Melamine resin Substances 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-N Methacrylic acid Chemical compound CC(=C)C(O)=O CERQOIWHTDAKMF-UHFFFAOYSA-N 0.000 description 1
- NQSMEZJWJJVYOI-UHFFFAOYSA-N Methyl 2-benzoylbenzoate Chemical compound COC(=O)C1=CC=CC=C1C(=O)C1=CC=CC=C1 NQSMEZJWJJVYOI-UHFFFAOYSA-N 0.000 description 1
- FXHOOIRPVKKKFG-UHFFFAOYSA-N N,N-Dimethylacetamide Chemical compound CN(C)C(C)=O FXHOOIRPVKKKFG-UHFFFAOYSA-N 0.000 description 1
- ZMXDDKWLCZADIW-UHFFFAOYSA-N N,N-Dimethylformamide Chemical compound CN(C)C=O ZMXDDKWLCZADIW-UHFFFAOYSA-N 0.000 description 1
- 239000004696 Poly ether ether ketone Substances 0.000 description 1
- 229920012266 Poly(ether sulfone) PES Polymers 0.000 description 1
- 239000004962 Polyamide-imide Substances 0.000 description 1
- 239000004695 Polyether sulfone Substances 0.000 description 1
- 239000004697 Polyetherimide Substances 0.000 description 1
- 239000004721 Polyphenylene oxide Substances 0.000 description 1
- 241000245165 Rhododendron ponticum Species 0.000 description 1
- 229910018557 Si O Inorganic materials 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910000577 Silicon-germanium Inorganic materials 0.000 description 1
- 229910006360 Si—O—N Inorganic materials 0.000 description 1
- 244000028419 Styrax benzoin Species 0.000 description 1
- 235000000126 Styrax benzoin Nutrition 0.000 description 1
- 235000008411 Sumatra benzointree Nutrition 0.000 description 1
- FEWJPZIEWOKRBE-UHFFFAOYSA-N Tartaric acid Natural products [H+].[H+].[O-]C(=O)C(O)C(O)C([O-])=O FEWJPZIEWOKRBE-UHFFFAOYSA-N 0.000 description 1
- BOTDANWDWHJENH-UHFFFAOYSA-N Tetraethyl orthosilicate Chemical compound CCO[Si](OCC)(OCC)OCC BOTDANWDWHJENH-UHFFFAOYSA-N 0.000 description 1
- ZJCCRDAZUWHFQH-UHFFFAOYSA-N Trimethylolpropane Chemical compound CCC(CO)(CO)CO ZJCCRDAZUWHFQH-UHFFFAOYSA-N 0.000 description 1
- DAKWPKUUDNSNPN-UHFFFAOYSA-N Trimethylolpropane triacrylate Chemical compound C=CC(=O)OCC(CC)(COC(=O)C=C)COC(=O)C=C DAKWPKUUDNSNPN-UHFFFAOYSA-N 0.000 description 1
- BZHJMEDXRYGGRV-UHFFFAOYSA-N Vinyl chloride Chemical compound ClC=C BZHJMEDXRYGGRV-UHFFFAOYSA-N 0.000 description 1
- 235000018936 Vitellaria paradoxa Nutrition 0.000 description 1
- 229910021536 Zeolite Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- SMEGJBVQLJJKKX-HOTMZDKISA-N [(2R,3S,4S,5R,6R)-5-acetyloxy-3,4,6-trihydroxyoxan-2-yl]methyl acetate Chemical compound CC(=O)OC[C@@H]1[C@H]([C@@H]([C@H]([C@@H](O1)O)OC(=O)C)O)O SMEGJBVQLJJKKX-HOTMZDKISA-N 0.000 description 1
- HVVWZTWDBSEWIH-UHFFFAOYSA-N [2-(hydroxymethyl)-3-prop-2-enoyloxy-2-(prop-2-enoyloxymethyl)propyl] prop-2-enoate Chemical compound C=CC(=O)OCC(CO)(COC(=O)C=C)COC(=O)C=C HVVWZTWDBSEWIH-UHFFFAOYSA-N 0.000 description 1
- XQAXGZLFSSPBMK-UHFFFAOYSA-M [7-(dimethylamino)phenothiazin-3-ylidene]-dimethylazanium;chloride;trihydrate Chemical compound O.O.O.[Cl-].C1=CC(=[N+](C)C)C=C2SC3=CC(N(C)C)=CC=C3N=C21 XQAXGZLFSSPBMK-UHFFFAOYSA-M 0.000 description 1
- QEZHSXDSWBLPKD-UHFFFAOYSA-M [Br-].CC[Mg+].C1CCOC1 Chemical compound [Br-].CC[Mg+].C1CCOC1 QEZHSXDSWBLPKD-UHFFFAOYSA-M 0.000 description 1
- GTIVDIGFCBZLEE-UHFFFAOYSA-M [Cl-].CC[Zn+] Chemical compound [Cl-].CC[Zn+] GTIVDIGFCBZLEE-UHFFFAOYSA-M 0.000 description 1
- CNNYQGIUGXJEJJ-UHFFFAOYSA-N [Ge+2].C[O-].C[O-] Chemical compound [Ge+2].C[O-].C[O-] CNNYQGIUGXJEJJ-UHFFFAOYSA-N 0.000 description 1
- YKTSYUJCYHOUJP-UHFFFAOYSA-N [O--].[Al+3].[Al+3].[O-][Si]([O-])([O-])[O-] Chemical compound [O--].[Al+3].[Al+3].[O-][Si]([O-])([O-])[O-] YKTSYUJCYHOUJP-UHFFFAOYSA-N 0.000 description 1
- XFKSEEQMCYEBNY-UHFFFAOYSA-N [O-]CC.[Mo+4].[O-]CC.[O-]CC.[O-]CC Chemical compound [O-]CC.[Mo+4].[O-]CC.[O-]CC.[O-]CC XFKSEEQMCYEBNY-UHFFFAOYSA-N 0.000 description 1
- OIIGPGKGVNSPBV-UHFFFAOYSA-N [W+4].CC[O-].CC[O-].CC[O-].CC[O-] Chemical compound [W+4].CC[O-].CC[O-].CC[O-].CC[O-] OIIGPGKGVNSPBV-UHFFFAOYSA-N 0.000 description 1
- WYUIWUCVZCRTRH-UHFFFAOYSA-N [[[ethenyl(dimethyl)silyl]amino]-dimethylsilyl]ethene Chemical compound C=C[Si](C)(C)N[Si](C)(C)C=C WYUIWUCVZCRTRH-UHFFFAOYSA-N 0.000 description 1
- RQVFGTYFBUVGOP-UHFFFAOYSA-N [acetyloxy(dimethyl)silyl] acetate Chemical compound CC(=O)O[Si](C)(C)OC(C)=O RQVFGTYFBUVGOP-UHFFFAOYSA-N 0.000 description 1
- CNOSLBKTVBFPBB-UHFFFAOYSA-N [acetyloxy(diphenyl)silyl] acetate Chemical compound C=1C=CC=CC=1[Si](OC(C)=O)(OC(=O)C)C1=CC=CC=C1 CNOSLBKTVBFPBB-UHFFFAOYSA-N 0.000 description 1
- CWVZGJORVTZXFW-UHFFFAOYSA-N [benzyl(dimethyl)silyl]methyl carbamate Chemical compound NC(=O)OC[Si](C)(C)CC1=CC=CC=C1 CWVZGJORVTZXFW-UHFFFAOYSA-N 0.000 description 1
- NOZAQBYNLKNDRT-UHFFFAOYSA-N [diacetyloxy(ethenyl)silyl] acetate Chemical compound CC(=O)O[Si](OC(C)=O)(OC(C)=O)C=C NOZAQBYNLKNDRT-UHFFFAOYSA-N 0.000 description 1
- TVJPBVNWVPUZBM-UHFFFAOYSA-N [diacetyloxy(methyl)silyl] acetate Chemical compound CC(=O)O[Si](C)(OC(C)=O)OC(C)=O TVJPBVNWVPUZBM-UHFFFAOYSA-N 0.000 description 1
- 125000004062 acenaphthenyl group Chemical group C1(CC2=CC=CC3=CC=CC1=C23)* 0.000 description 1
- 125000004054 acenaphthylenyl group Chemical group C1(=CC2=CC=CC3=CC=CC1=C23)* 0.000 description 1
- 239000011354 acetal resin Substances 0.000 description 1
- 125000002777 acetyl group Chemical group [H]C([H])([H])C(*)=O 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 229920006243 acrylic copolymer Polymers 0.000 description 1
- 125000003647 acryloyl group Chemical group O=C([*])C([H])=C([H])[H] 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- 125000002252 acyl group Chemical group 0.000 description 1
- 238000012644 addition polymerization Methods 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- OVKDFILSBMEKLT-UHFFFAOYSA-N alpha-Terpineol Natural products CC(=C)C1(O)CCC(C)=CC1 OVKDFILSBMEKLT-UHFFFAOYSA-N 0.000 description 1
- WYTGDNHDOZPMIW-RCBQFDQVSA-N alstonine Natural products C1=CC2=C3C=CC=CC3=NC2=C2N1C[C@H]1[C@H](C)OC=C(C(=O)OC)[C@H]1C2 WYTGDNHDOZPMIW-RCBQFDQVSA-N 0.000 description 1
- 150000004645 aluminates Chemical class 0.000 description 1
- WNROFYMDJYEPJX-UHFFFAOYSA-K aluminium hydroxide Chemical compound [OH-].[OH-].[OH-].[Al+3] WNROFYMDJYEPJX-UHFFFAOYSA-K 0.000 description 1
- SMZOGRDCAXLAAR-UHFFFAOYSA-N aluminium isopropoxide Chemical compound [Al+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] SMZOGRDCAXLAAR-UHFFFAOYSA-N 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- ILRRQNADMUWWFW-UHFFFAOYSA-K aluminium phosphate Chemical compound O1[Al]2OP1(=O)O2 ILRRQNADMUWWFW-UHFFFAOYSA-K 0.000 description 1
- 229910000323 aluminium silicate Inorganic materials 0.000 description 1
- DIZPMCHEQGEION-UHFFFAOYSA-H aluminium sulfate (anhydrous) Chemical compound [Al+3].[Al+3].[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O.[O-]S([O-])(=O)=O DIZPMCHEQGEION-UHFFFAOYSA-H 0.000 description 1
- JPUHCPXFQIXLMW-UHFFFAOYSA-N aluminium triethoxide Chemical compound CCO[Al](OCC)OCC JPUHCPXFQIXLMW-UHFFFAOYSA-N 0.000 description 1
- MQQXUGFEQSCYIA-OAWHIZORSA-M aluminum;(z)-4-ethoxy-4-oxobut-2-en-2-olate;propan-2-olate Chemical compound [Al+3].CC(C)[O-].CC(C)[O-].CCOC(=O)\C=C(\C)[O-] MQQXUGFEQSCYIA-OAWHIZORSA-M 0.000 description 1
- IKHOZNOYZQPPCK-UHFFFAOYSA-K aluminum;4,4-diethyl-3-oxohexanoate Chemical compound [Al+3].CCC(CC)(CC)C(=O)CC([O-])=O.CCC(CC)(CC)C(=O)CC([O-])=O.CCC(CC)(CC)C(=O)CC([O-])=O IKHOZNOYZQPPCK-UHFFFAOYSA-K 0.000 description 1
- KEBBHXFLBGHGMA-UHFFFAOYSA-K aluminum;4-ethyl-3-oxohexanoate Chemical compound [Al+3].CCC(CC)C(=O)CC([O-])=O.CCC(CC)C(=O)CC([O-])=O.CCC(CC)C(=O)CC([O-])=O KEBBHXFLBGHGMA-UHFFFAOYSA-K 0.000 description 1
- VXAUWWUXCIMFIM-UHFFFAOYSA-M aluminum;oxygen(2-);hydroxide Chemical compound [OH-].[O-2].[Al+3] VXAUWWUXCIMFIM-UHFFFAOYSA-M 0.000 description 1
- GMARCGBNZNYETI-UHFFFAOYSA-N aluminum;oxygen(2-);propan-2-olate Chemical compound [O-2].[Al+3].CC(C)[O-] GMARCGBNZNYETI-UHFFFAOYSA-N 0.000 description 1
- JNDMLEXHDPKVFC-UHFFFAOYSA-N aluminum;oxygen(2-);yttrium(3+) Chemical compound [O-2].[O-2].[O-2].[Al+3].[Y+3] JNDMLEXHDPKVFC-UHFFFAOYSA-N 0.000 description 1
- ANBBXQWFNXMHLD-UHFFFAOYSA-N aluminum;sodium;oxygen(2-) Chemical compound [O-2].[O-2].[Na+].[Al+3] ANBBXQWFNXMHLD-UHFFFAOYSA-N 0.000 description 1
- 125000003368 amide group Chemical group 0.000 description 1
- 150000001408 amides Chemical class 0.000 description 1
- 125000004103 aminoalkyl group Chemical group 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 229910052612 amphibole Inorganic materials 0.000 description 1
- 239000010405 anode material Substances 0.000 description 1
- 229940077744 antacid containing magnesium compound Drugs 0.000 description 1
- PYKYMHQGRFAEBM-UHFFFAOYSA-N anthraquinone Natural products CCC(=O)c1c(O)c2C(=O)C3C(C=CC=C3O)C(=O)c2cc1CC(=O)OC PYKYMHQGRFAEBM-UHFFFAOYSA-N 0.000 description 1
- 150000004056 anthraquinones Chemical class 0.000 description 1
- RJGDLRCDCYRQOQ-UHFFFAOYSA-N anthrone Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3CC2=C1 RJGDLRCDCYRQOQ-UHFFFAOYSA-N 0.000 description 1
- 125000005428 anthryl group Chemical group [H]C1=C([H])C([H])=C2C([H])=C3C(*)=C([H])C([H])=C([H])C3=C([H])C2=C1[H] 0.000 description 1
- 239000003963 antioxidant agent Substances 0.000 description 1
- 230000003078 antioxidant effect Effects 0.000 description 1
- 235000006708 antioxidants Nutrition 0.000 description 1
- 239000007864 aqueous solution Substances 0.000 description 1
- 239000012300 argon atmosphere Substances 0.000 description 1
- 235000010323 ascorbic acid Nutrition 0.000 description 1
- 229960005070 ascorbic acid Drugs 0.000 description 1
- 239000011668 ascorbic acid Substances 0.000 description 1
- 125000003828 azulenyl group Chemical group 0.000 description 1
- DJHZYHWLGNJISM-FDGPNNRMSA-L barium(2+);(z)-4-oxopent-2-en-2-olate Chemical compound [Ba+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O DJHZYHWLGNJISM-FDGPNNRMSA-L 0.000 description 1
- SLPLCLDJTNLWPW-UHFFFAOYSA-N barium(2+);2-methylpropan-2-olate Chemical compound [Ba+2].CC(C)(C)[O-].CC(C)(C)[O-] SLPLCLDJTNLWPW-UHFFFAOYSA-N 0.000 description 1
- CPUJSIVIXCTVEI-UHFFFAOYSA-N barium(2+);propan-2-olate Chemical compound [Ba+2].CC(C)[O-].CC(C)[O-] CPUJSIVIXCTVEI-UHFFFAOYSA-N 0.000 description 1
- 230000008901 benefit Effects 0.000 description 1
- XRJBMOBWWDKSDQ-UHFFFAOYSA-N benzhydryl(ethenyl)silane Chemical compound C=1C=CC=CC=1C([SiH2]C=C)C1=CC=CC=C1 XRJBMOBWWDKSDQ-UHFFFAOYSA-N 0.000 description 1
- 229960002130 benzoin Drugs 0.000 description 1
- RWCCWEUUXYIKHB-UHFFFAOYSA-N benzophenone Chemical compound C=1C=CC=CC=1C(=O)C1=CC=CC=C1 RWCCWEUUXYIKHB-UHFFFAOYSA-N 0.000 description 1
- 239000012965 benzophenone Substances 0.000 description 1
- UCRXQUVKDMVBBM-UHFFFAOYSA-N benzyl 2-amino-3-(4-phenylmethoxyphenyl)propanoate Chemical compound C=1C=CC=CC=1COC(=O)C(N)CC(C=C1)=CC=C1OCC1=CC=CC=C1 UCRXQUVKDMVBBM-UHFFFAOYSA-N 0.000 description 1
- 125000001797 benzyl group Chemical group [H]C1=C([H])C([H])=C(C([H])=C1[H])C([H])([H])* 0.000 description 1
- GCTPMLUUWLLESL-UHFFFAOYSA-N benzyl prop-2-enoate Chemical compound C=CC(=O)OCC1=CC=CC=C1 GCTPMLUUWLLESL-UHFFFAOYSA-N 0.000 description 1
- RFXODRCAZTVEOH-UHFFFAOYSA-N benzyl-ethoxy-dimethylsilane Chemical compound CCO[Si](C)(C)CC1=CC=CC=C1 RFXODRCAZTVEOH-UHFFFAOYSA-N 0.000 description 1
- 229910052614 beryl Inorganic materials 0.000 description 1
- BBKXDHBLPBKCFR-FDGPNNRMSA-L beryllium;(z)-4-oxopent-2-en-2-olate Chemical compound [Be+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O BBKXDHBLPBKCFR-FDGPNNRMSA-L 0.000 description 1
- 125000006267 biphenyl group Chemical group 0.000 description 1
- 125000002529 biphenylenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3C12)* 0.000 description 1
- SIPUZPBQZHNSDW-UHFFFAOYSA-N bis(2-methylpropyl)aluminum Chemical compound CC(C)C[Al]CC(C)C SIPUZPBQZHNSDW-UHFFFAOYSA-N 0.000 description 1
- QRHCILLLMDEFSD-UHFFFAOYSA-N bis(ethenyl)-dimethylsilane Chemical compound C=C[Si](C)(C)C=C QRHCILLLMDEFSD-UHFFFAOYSA-N 0.000 description 1
- ZPOLOEWJWXZUSP-AATRIKPKSA-N bis(prop-2-enyl) (e)-but-2-enedioate Chemical compound C=CCOC(=O)\C=C\C(=O)OCC=C ZPOLOEWJWXZUSP-AATRIKPKSA-N 0.000 description 1
- 238000007664 blowing Methods 0.000 description 1
- 238000010504 bond cleavage reaction Methods 0.000 description 1
- 238000006664 bond formation reaction Methods 0.000 description 1
- UORVGPXVDQYIDP-BJUDXGSMSA-N borane Chemical compound [10BH3] UORVGPXVDQYIDP-BJUDXGSMSA-N 0.000 description 1
- 229910000085 borane Inorganic materials 0.000 description 1
- 229910021538 borax Inorganic materials 0.000 description 1
- BGECDVWSWDRFSP-UHFFFAOYSA-N borazine Chemical compound B1NBNBN1 BGECDVWSWDRFSP-UHFFFAOYSA-N 0.000 description 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 1
- 239000004327 boric acid Substances 0.000 description 1
- 229930006711 bornane-2,3-dione Natural products 0.000 description 1
- 150000001639 boron compounds Chemical class 0.000 description 1
- 229910052795 boron group element Inorganic materials 0.000 description 1
- 229910052810 boron oxide Inorganic materials 0.000 description 1
- YMEKEHSRPZAOGO-UHFFFAOYSA-N boron triiodide Chemical compound IB(I)I YMEKEHSRPZAOGO-UHFFFAOYSA-N 0.000 description 1
- ZADPBFCGQRWHPN-UHFFFAOYSA-N boronic acid Chemical compound OBO ZADPBFCGQRWHPN-UHFFFAOYSA-N 0.000 description 1
- DQXBYHZEEUGOBF-UHFFFAOYSA-N but-3-enoic acid;ethene Chemical compound C=C.OC(=O)CC=C DQXBYHZEEUGOBF-UHFFFAOYSA-N 0.000 description 1
- CKEGKURXFKLBDX-UHFFFAOYSA-N butan-1-ol;hafnium Chemical compound [Hf].CCCCO.CCCCO.CCCCO.CCCCO CKEGKURXFKLBDX-UHFFFAOYSA-N 0.000 description 1
- PVZMSIQWTGPSHJ-UHFFFAOYSA-N butan-1-ol;tantalum Chemical compound [Ta].CCCCO.CCCCO.CCCCO.CCCCO.CCCCO PVZMSIQWTGPSHJ-UHFFFAOYSA-N 0.000 description 1
- QFUWHTBCUVMAMS-UHFFFAOYSA-N butan-1-olate cerium(3+) Chemical compound [Ce+3].CCCC[O-].CCCC[O-].CCCC[O-] QFUWHTBCUVMAMS-UHFFFAOYSA-N 0.000 description 1
- DINQVNXOZUORJS-UHFFFAOYSA-N butan-1-olate;niobium(5+) Chemical compound [Nb+5].CCCC[O-].CCCC[O-].CCCC[O-].CCCC[O-].CCCC[O-] DINQVNXOZUORJS-UHFFFAOYSA-N 0.000 description 1
- QORWLRPWMJEJKP-UHFFFAOYSA-N butan-1-olate;tantalum(5+) Chemical compound [Ta+5].CCCC[O-].CCCC[O-].CCCC[O-].CCCC[O-].CCCC[O-] QORWLRPWMJEJKP-UHFFFAOYSA-N 0.000 description 1
- BSDOQSMQCZQLDV-UHFFFAOYSA-N butan-1-olate;zirconium(4+) Chemical compound [Zr+4].CCCC[O-].CCCC[O-].CCCC[O-].CCCC[O-] BSDOQSMQCZQLDV-UHFFFAOYSA-N 0.000 description 1
- BTANRVKWQNVYAZ-UHFFFAOYSA-N butan-2-ol Chemical compound CCC(C)O BTANRVKWQNVYAZ-UHFFFAOYSA-N 0.000 description 1
- 125000004106 butoxy group Chemical group [*]OC([H])([H])C([H])([H])C(C([H])([H])[H])([H])[H] 0.000 description 1
- SOKKGFZWZZLHEK-UHFFFAOYSA-N butoxy(dimethyl)silane Chemical compound CCCCO[SiH](C)C SOKKGFZWZZLHEK-UHFFFAOYSA-N 0.000 description 1
- 125000006226 butoxyethyl group Chemical group 0.000 description 1
- 235000014121 butter Nutrition 0.000 description 1
- CQEYYJKEWSMYFG-UHFFFAOYSA-N butyl acrylate Chemical compound CCCCOC(=O)C=C CQEYYJKEWSMYFG-UHFFFAOYSA-N 0.000 description 1
- SXPLZNMUBFBFIA-UHFFFAOYSA-N butyl(trimethoxy)silane Chemical compound CCCC[Si](OC)(OC)OC SXPLZNMUBFBFIA-UHFFFAOYSA-N 0.000 description 1
- MHEVIADVQSYOSQ-UHFFFAOYSA-N butyl-ethenyl-dimethoxysilane Chemical compound CCCC[Si](OC)(OC)C=C MHEVIADVQSYOSQ-UHFFFAOYSA-N 0.000 description 1
- 125000004063 butyryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000004301 calcium benzoate Substances 0.000 description 1
- 235000010237 calcium benzoate Nutrition 0.000 description 1
- 235000019397 calcium bromate Nutrition 0.000 description 1
- 229910001622 calcium bromide Inorganic materials 0.000 description 1
- YALMXYPQBUJUME-UHFFFAOYSA-L calcium chlorate Chemical compound [Ca+2].[O-]Cl(=O)=O.[O-]Cl(=O)=O YALMXYPQBUJUME-UHFFFAOYSA-L 0.000 description 1
- 239000001110 calcium chloride Substances 0.000 description 1
- 229910001628 calcium chloride Inorganic materials 0.000 description 1
- 229940043430 calcium compound Drugs 0.000 description 1
- 150000001674 calcium compounds Chemical class 0.000 description 1
- WGEFECGEFUFIQW-UHFFFAOYSA-L calcium dibromide Chemical compound [Ca+2].[Br-].[Br-] WGEFECGEFUFIQW-UHFFFAOYSA-L 0.000 description 1
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 1
- AXCZMVOFGPJBDE-UHFFFAOYSA-L calcium dihydroxide Chemical compound [OH-].[OH-].[Ca+2] AXCZMVOFGPJBDE-UHFFFAOYSA-L 0.000 description 1
- 229910001634 calcium fluoride Inorganic materials 0.000 description 1
- 229940095626 calcium fluoride Drugs 0.000 description 1
- 239000000920 calcium hydroxide Substances 0.000 description 1
- 229910001861 calcium hydroxide Inorganic materials 0.000 description 1
- UHWJJLGTKIWIJO-UHFFFAOYSA-L calcium iodate Chemical compound [Ca+2].[O-]I(=O)=O.[O-]I(=O)=O UHWJJLGTKIWIJO-UHFFFAOYSA-L 0.000 description 1
- 235000019390 calcium iodate Nutrition 0.000 description 1
- 229910001640 calcium iodide Inorganic materials 0.000 description 1
- 229940046413 calcium iodide Drugs 0.000 description 1
- QXDMQSPYEZFLGF-UHFFFAOYSA-L calcium oxalate Chemical compound [Ca+2].[O-]C(=O)C([O-])=O QXDMQSPYEZFLGF-UHFFFAOYSA-L 0.000 description 1
- LHJQIRIGXXHNLA-UHFFFAOYSA-N calcium peroxide Chemical compound [Ca+2].[O-][O-] LHJQIRIGXXHNLA-UHFFFAOYSA-N 0.000 description 1
- 235000019402 calcium peroxide Nutrition 0.000 description 1
- 239000001506 calcium phosphate Substances 0.000 description 1
- 229910000389 calcium phosphate Inorganic materials 0.000 description 1
- 235000011010 calcium phosphates Nutrition 0.000 description 1
- JGIATAMCQXIDNZ-UHFFFAOYSA-N calcium sulfide Chemical compound [Ca]=S JGIATAMCQXIDNZ-UHFFFAOYSA-N 0.000 description 1
- GBAOBIBJACZTNA-UHFFFAOYSA-L calcium sulfite Chemical compound [Ca+2].[O-]S([O-])=O GBAOBIBJACZTNA-UHFFFAOYSA-L 0.000 description 1
- 235000010261 calcium sulphite Nutrition 0.000 description 1
- QAZYYQMPRQKMAC-FDGPNNRMSA-L calcium;(z)-4-oxopent-2-en-2-olate Chemical compound [Ca+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O QAZYYQMPRQKMAC-FDGPNNRMSA-L 0.000 description 1
- CTUDRLGCNRAIEA-UHFFFAOYSA-L calcium;chloride;hydroxide Chemical compound [OH-].[Cl-].[Ca+2] CTUDRLGCNRAIEA-UHFFFAOYSA-L 0.000 description 1
- HZQXCUSDXIKLGS-UHFFFAOYSA-L calcium;dibenzoate;trihydrate Chemical compound O.O.O.[Ca+2].[O-]C(=O)C1=CC=CC=C1.[O-]C(=O)C1=CC=CC=C1 HZQXCUSDXIKLGS-UHFFFAOYSA-L 0.000 description 1
- JHLCADGWXYCDQA-UHFFFAOYSA-N calcium;ethanolate Chemical compound [Ca+2].CC[O-].CC[O-] JHLCADGWXYCDQA-UHFFFAOYSA-N 0.000 description 1
- AMJQWGIYCROUQF-UHFFFAOYSA-N calcium;methanolate Chemical compound [Ca+2].[O-]C.[O-]C AMJQWGIYCROUQF-UHFFFAOYSA-N 0.000 description 1
- 125000002915 carbonyl group Chemical group [*:2]C([*:1])=O 0.000 description 1
- PYPNFSVOZBISQN-LNTINUHCSA-K cerium acetylacetonate Chemical compound [Ce+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O PYPNFSVOZBISQN-LNTINUHCSA-K 0.000 description 1
- BXCIHNFUIYCGKS-UHFFFAOYSA-N cerium(3+);2-methylpropan-2-olate Chemical compound [Ce+3].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-] BXCIHNFUIYCGKS-UHFFFAOYSA-N 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 239000003638 chemical reducing agent Substances 0.000 description 1
- JTMDFVKZKWRFNY-UHFFFAOYSA-N chromium(3+) propan-1-olate Chemical compound [Cr+3].CCC[O-].CCC[O-].CCC[O-] JTMDFVKZKWRFNY-UHFFFAOYSA-N 0.000 description 1
- BAGFIDQDYVAODN-UHFFFAOYSA-N chromium(3+);propan-2-olate Chemical compound [Cr+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] BAGFIDQDYVAODN-UHFFFAOYSA-N 0.000 description 1
- XEHUIDSUOAGHBW-UHFFFAOYSA-N chromium;pentane-2,4-dione Chemical compound [Cr].CC(=O)CC(C)=O.CC(=O)CC(C)=O.CC(=O)CC(C)=O XEHUIDSUOAGHBW-UHFFFAOYSA-N 0.000 description 1
- 125000002676 chrysenyl group Chemical group C1(=CC=CC=2C3=CC=C4C=CC=CC4=C3C=CC12)* 0.000 description 1
- 230000003749 cleanliness Effects 0.000 description 1
- VBXHMSMVQZJJLD-UHFFFAOYSA-N cobalt(2+);propan-2-olate Chemical compound [Co+2].CC(C)[O-].CC(C)[O-] VBXHMSMVQZJJLD-UHFFFAOYSA-N 0.000 description 1
- JUPWRUDTZGBNEX-UHFFFAOYSA-N cobalt;pentane-2,4-dione Chemical compound [Co].CC(=O)CC(C)=O.CC(=O)CC(C)=O.CC(=O)CC(C)=O JUPWRUDTZGBNEX-UHFFFAOYSA-N 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000006482 condensation reaction Methods 0.000 description 1
- 229920001940 conductive polymer Polymers 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- ZKXWKVVCCTZOLD-UHFFFAOYSA-N copper;4-hydroxypent-3-en-2-one Chemical compound [Cu].CC(O)=CC(C)=O.CC(O)=CC(C)=O ZKXWKVVCCTZOLD-UHFFFAOYSA-N 0.000 description 1
- CRCKGIUJMFFISH-UHFFFAOYSA-N copper;ethanolate Chemical compound [Cu+2].CC[O-].CC[O-] CRCKGIUJMFFISH-UHFFFAOYSA-N 0.000 description 1
- AYNQPTYHFBBKFC-UHFFFAOYSA-N copper;methanolate Chemical compound [Cu+2].[O-]C.[O-]C AYNQPTYHFBBKFC-UHFFFAOYSA-N 0.000 description 1
- VNGORJHUDAPOQZ-UHFFFAOYSA-N copper;propan-2-olate Chemical compound [Cu+2].CC(C)[O-].CC(C)[O-] VNGORJHUDAPOQZ-UHFFFAOYSA-N 0.000 description 1
- 238000003851 corona treatment Methods 0.000 description 1
- 238000005336 cracking Methods 0.000 description 1
- 238000004132 cross linking Methods 0.000 description 1
- 239000003431 cross linking reagent Substances 0.000 description 1
- 229910001610 cryolite Inorganic materials 0.000 description 1
- 210000002858 crystal cell Anatomy 0.000 description 1
- 125000006165 cyclic alkyl group Chemical group 0.000 description 1
- 150000004292 cyclic ethers Chemical group 0.000 description 1
- KBLWLMPSVYBVDK-UHFFFAOYSA-N cyclohexyl prop-2-enoate Chemical compound C=CC(=O)OC1CCCCC1 KBLWLMPSVYBVDK-UHFFFAOYSA-N 0.000 description 1
- 125000001559 cyclopropyl group Chemical group [H]C1([H])C([H])([H])C1([H])* 0.000 description 1
- FOTKYAAJKYLFFN-UHFFFAOYSA-N decane-1,10-diol Chemical compound OCCCCCCCCCCO FOTKYAAJKYLFFN-UHFFFAOYSA-N 0.000 description 1
- 230000006837 decompression Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- FWLDHHJLVGRRHD-UHFFFAOYSA-N decyl prop-2-enoate Chemical compound CCCCCCCCCCOC(=O)C=C FWLDHHJLVGRRHD-UHFFFAOYSA-N 0.000 description 1
- GWUJPMKBSYJFCK-UHFFFAOYSA-N decyl-dimethoxy-methylsilane Chemical compound CCCCCCCCCC[Si](C)(OC)OC GWUJPMKBSYJFCK-UHFFFAOYSA-N 0.000 description 1
- 238000007791 dehumidification Methods 0.000 description 1
- 230000018044 dehydration Effects 0.000 description 1
- 238000006356 dehydrogenation reaction Methods 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- WJDRVNDIOZBGRT-UHFFFAOYSA-N di(butan-2-yloxy)-propan-2-yloxyalumane Chemical compound CC(C)[O-].CCC(C)O[Al+]OC(C)CC WJDRVNDIOZBGRT-UHFFFAOYSA-N 0.000 description 1
- DYHSMQWCZLNWGO-UHFFFAOYSA-N di(propan-2-yloxy)alumane Chemical compound CC(C)O[AlH]OC(C)C DYHSMQWCZLNWGO-UHFFFAOYSA-N 0.000 description 1
- IUMKBGOLDBCDFK-UHFFFAOYSA-N dialuminum;dicalcium;iron(2+);trisilicate;hydrate Chemical compound O.[Al+3].[Al+3].[Ca+2].[Ca+2].[Fe+2].[O-][Si]([O-])([O-])[O-].[O-][Si]([O-])([O-])[O-].[O-][Si]([O-])([O-])[O-] IUMKBGOLDBCDFK-UHFFFAOYSA-N 0.000 description 1
- 229910001648 diaspore Inorganic materials 0.000 description 1
- AFZSMODLJJCVPP-UHFFFAOYSA-N dibenzothiazol-2-yl disulfide Chemical compound C1=CC=C2SC(SSC=3SC4=CC=CC=C4N=3)=NC2=C1 AFZSMODLJJCVPP-UHFFFAOYSA-N 0.000 description 1
- PHSNFACJRATEMO-UHFFFAOYSA-N dibenzyl(dimethyl)silane Chemical compound C=1C=CC=CC=1C[Si](C)(C)CC1=CC=CC=C1 PHSNFACJRATEMO-UHFFFAOYSA-N 0.000 description 1
- JKWMSGQKBLHBQQ-UHFFFAOYSA-N diboron trioxide Chemical compound O=BOB=O JKWMSGQKBLHBQQ-UHFFFAOYSA-N 0.000 description 1
- OTARVPUIYXHRRB-UHFFFAOYSA-N diethoxy-methyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](C)(OCC)CCCOCC1CO1 OTARVPUIYXHRRB-UHFFFAOYSA-N 0.000 description 1
- MNFGEHQPOWJJBH-UHFFFAOYSA-N diethoxy-methyl-phenylsilane Chemical compound CCO[Si](C)(OCC)C1=CC=CC=C1 MNFGEHQPOWJJBH-UHFFFAOYSA-N 0.000 description 1
- QIGCTKTXDFYSPE-UHFFFAOYSA-N diethyl-methyl-phenylsilane Chemical compound CC[Si](C)(CC)C1=CC=CC=C1 QIGCTKTXDFYSPE-UHFFFAOYSA-N 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- AJNVQOSZGJRYEI-UHFFFAOYSA-N digallium;oxygen(2-) Chemical compound [O-2].[O-2].[O-2].[Ga+3].[Ga+3] AJNVQOSZGJRYEI-UHFFFAOYSA-N 0.000 description 1
- 239000003085 diluting agent Substances 0.000 description 1
- JJQZDUKDJDQPMQ-UHFFFAOYSA-N dimethoxy(dimethyl)silane Chemical compound CO[Si](C)(C)OC JJQZDUKDJDQPMQ-UHFFFAOYSA-N 0.000 description 1
- CVQVSVBUMVSJES-UHFFFAOYSA-N dimethoxy-methyl-phenylsilane Chemical compound CO[Si](C)(OC)C1=CC=CC=C1 CVQVSVBUMVSJES-UHFFFAOYSA-N 0.000 description 1
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 description 1
- HQXKAHJBFCGGGP-UHFFFAOYSA-N dimethyl-[2-(3-methylbutoxy)ethenyl]silane Chemical compound CC(C)CCOC=C[SiH](C)C HQXKAHJBFCGGGP-UHFFFAOYSA-N 0.000 description 1
- HGSPSFLCJIQBDT-UHFFFAOYSA-N dimethyl-[2-(4-methylphenyl)ethenyl]silane Chemical compound C[SiH](C=CC1=CC=C(C=C1)C)C HGSPSFLCJIQBDT-UHFFFAOYSA-N 0.000 description 1
- XXBDWLFCJWSEKW-UHFFFAOYSA-N dimethylbenzylamine Chemical compound CN(C)CC1=CC=CC=C1 XXBDWLFCJWSEKW-UHFFFAOYSA-N 0.000 description 1
- YYLGKUPAFFKGRQ-UHFFFAOYSA-N dimethyldiethoxysilane Chemical compound CCO[Si](C)(C)OCC YYLGKUPAFFKGRQ-UHFFFAOYSA-N 0.000 description 1
- 229910001882 dioxygen Inorganic materials 0.000 description 1
- UKXCWLFBHULELL-UHFFFAOYSA-N diphenylmethanone;n-ethylethanamine Chemical compound CCNCC.C=1C=CC=CC=1C(=O)C1=CC=CC=C1 UKXCWLFBHULELL-UHFFFAOYSA-N 0.000 description 1
- PVQHOAILLPEZSC-UHFFFAOYSA-N diphenylmethanone;n-methylmethanamine Chemical compound CNC.C=1C=CC=CC=1C(=O)C1=CC=CC=C1 PVQHOAILLPEZSC-UHFFFAOYSA-N 0.000 description 1
- YGANSGVIUGARFR-UHFFFAOYSA-N dipotassium dioxosilane oxo(oxoalumanyloxy)alumane oxygen(2-) Chemical compound [O--].[K+].[K+].O=[Si]=O.O=[Al]O[Al]=O YGANSGVIUGARFR-UHFFFAOYSA-N 0.000 description 1
- TXKMVPPZCYKFAC-UHFFFAOYSA-N disulfur monoxide Inorganic materials O=S=S TXKMVPPZCYKFAC-UHFFFAOYSA-N 0.000 description 1
- 125000003438 dodecyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- ZHKRBCQSLSTSAO-UHFFFAOYSA-N dodecyl(trimethyl)silane Chemical compound CCCCCCCCCCCC[Si](C)(C)C ZHKRBCQSLSTSAO-UHFFFAOYSA-N 0.000 description 1
- 239000010459 dolomite Substances 0.000 description 1
- 229910000514 dolomite Inorganic materials 0.000 description 1
- 239000003814 drug Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- YQGOJNYOYNNSMM-UHFFFAOYSA-N eosin Chemical compound [Na+].OC(=O)C1=CC=CC=C1C1=C2C=C(Br)C(=O)C(Br)=C2OC2=C(Br)C(O)=C(Br)C=C21 YQGOJNYOYNNSMM-UHFFFAOYSA-N 0.000 description 1
- 229910052869 epidote Inorganic materials 0.000 description 1
- 125000003700 epoxy group Chemical group 0.000 description 1
- 239000003759 ester based solvent Substances 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- VZLNSPSVSKXECI-UHFFFAOYSA-N ethanol;iron Chemical compound [Fe].CCO.CCO VZLNSPSVSKXECI-UHFFFAOYSA-N 0.000 description 1
- RWZKAROCZDFJEI-UHFFFAOYSA-N ethanol;zinc Chemical compound [Zn].CCO.CCO RWZKAROCZDFJEI-UHFFFAOYSA-N 0.000 description 1
- UARGAUQGVANXCB-UHFFFAOYSA-N ethanol;zirconium Chemical compound [Zr].CCO.CCO.CCO.CCO UARGAUQGVANXCB-UHFFFAOYSA-N 0.000 description 1
- DOGXYPDTORJOGJ-UHFFFAOYSA-N ethenyl(diethyl)silicon Chemical compound CC[Si](CC)C=C DOGXYPDTORJOGJ-UHFFFAOYSA-N 0.000 description 1
- NKSJNEHGWDZZQF-UHFFFAOYSA-N ethenyl(trimethoxy)silane Chemical compound CO[Si](OC)(OC)C=C NKSJNEHGWDZZQF-UHFFFAOYSA-N 0.000 description 1
- GCSJLQSCSDMKTP-UHFFFAOYSA-N ethenyl(trimethyl)silane Chemical compound C[Si](C)(C)C=C GCSJLQSCSDMKTP-UHFFFAOYSA-N 0.000 description 1
- VLNRSEGRGSDKLS-UHFFFAOYSA-N ethenyl-[4-[ethenyl(dimethyl)silyl]phenyl]-dimethylsilane Chemical compound C=C[Si](C)(C)C1=CC=C([Si](C)(C)C=C)C=C1 VLNRSEGRGSDKLS-UHFFFAOYSA-N 0.000 description 1
- BITPLIXHRASDQB-UHFFFAOYSA-N ethenyl-[ethenyl(dimethyl)silyl]oxy-dimethylsilane Chemical compound C=C[Si](C)(C)O[Si](C)(C)C=C BITPLIXHRASDQB-UHFFFAOYSA-N 0.000 description 1
- JEWCZPTVOYXPGG-UHFFFAOYSA-N ethenyl-ethoxy-dimethylsilane Chemical compound CCO[Si](C)(C)C=C JEWCZPTVOYXPGG-UHFFFAOYSA-N 0.000 description 1
- NUFVQEIPPHHQCK-UHFFFAOYSA-N ethenyl-methoxy-dimethylsilane Chemical compound CO[Si](C)(C)C=C NUFVQEIPPHHQCK-UHFFFAOYSA-N 0.000 description 1
- 125000001301 ethoxy group Chemical group [H]C([H])([H])C([H])([H])O* 0.000 description 1
- RSIHJDGMBDPTIM-UHFFFAOYSA-N ethoxy(trimethyl)silane Chemical compound CCO[Si](C)(C)C RSIHJDGMBDPTIM-UHFFFAOYSA-N 0.000 description 1
- HHBOIIOOTUCYQD-UHFFFAOYSA-N ethoxy-dimethyl-[3-(oxiran-2-ylmethoxy)propyl]silane Chemical compound CCO[Si](C)(C)CCCOCC1CO1 HHBOIIOOTUCYQD-UHFFFAOYSA-N 0.000 description 1
- FIHCECZPYHVEJO-UHFFFAOYSA-N ethoxy-dimethyl-phenylsilane Chemical compound CCO[Si](C)(C)C1=CC=CC=C1 FIHCECZPYHVEJO-UHFFFAOYSA-N 0.000 description 1
- ADLWTVQIBZEAGJ-UHFFFAOYSA-N ethoxy-methyl-diphenylsilane Chemical compound C=1C=CC=CC=1[Si](C)(OCC)C1=CC=CC=C1 ADLWTVQIBZEAGJ-UHFFFAOYSA-N 0.000 description 1
- DZFYOYRNBGNPJW-UHFFFAOYSA-N ethoxythallium Chemical compound [Tl+].CC[O-] DZFYOYRNBGNPJW-UHFFFAOYSA-N 0.000 description 1
- BHXIWUJLHYHGSJ-UHFFFAOYSA-N ethyl 3-ethoxypropanoate Chemical compound CCOCCC(=O)OCC BHXIWUJLHYHGSJ-UHFFFAOYSA-N 0.000 description 1
- UHESRSKEBRADOO-UHFFFAOYSA-N ethyl carbamate;prop-2-enoic acid Chemical compound OC(=O)C=C.CCOC(N)=O UHESRSKEBRADOO-UHFFFAOYSA-N 0.000 description 1
- SBRXLTRZCJVAPH-UHFFFAOYSA-N ethyl(trimethoxy)silane Chemical compound CC[Si](OC)(OC)OC SBRXLTRZCJVAPH-UHFFFAOYSA-N 0.000 description 1
- 239000005038 ethylene vinyl acetate Substances 0.000 description 1
- AKYVEELUVDHHLT-UHFFFAOYSA-K europium acetylacetonate Chemical compound [Eu+3].CC([O-])=CC(C)=O.CC([O-])=CC(C)=O.CC([O-])=CC(C)=O AKYVEELUVDHHLT-UHFFFAOYSA-K 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 239000010433 feldspar Substances 0.000 description 1
- 239000000945 filler Substances 0.000 description 1
- 125000003914 fluoranthenyl group Chemical group C1(=CC=C2C=CC=C3C4=CC=CC=C4C1=C23)* 0.000 description 1
- 229910052587 fluorapatite Inorganic materials 0.000 description 1
- 229940077441 fluorapatite Drugs 0.000 description 1
- YLQWCDOCJODRMT-UHFFFAOYSA-N fluoren-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3C2=C1 YLQWCDOCJODRMT-UHFFFAOYSA-N 0.000 description 1
- 235000013305 food Nutrition 0.000 description 1
- IQGAADOKZGEEQE-LNTINUHCSA-K gadolinium acetylacetonate Chemical compound [Gd+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O IQGAADOKZGEEQE-LNTINUHCSA-K 0.000 description 1
- 150000002259 gallium compounds Chemical class 0.000 description 1
- 229910021513 gallium hydroxide Inorganic materials 0.000 description 1
- 229910001195 gallium oxide Inorganic materials 0.000 description 1
- 229910000154 gallium phosphate Inorganic materials 0.000 description 1
- DNUARHPNFXVKEI-UHFFFAOYSA-K gallium(iii) hydroxide Chemical compound [OH-].[OH-].[OH-].[Ga+3] DNUARHPNFXVKEI-UHFFFAOYSA-K 0.000 description 1
- DWRNSCDYNYYYHT-UHFFFAOYSA-K gallium(iii) iodide Chemical compound I[Ga](I)I DWRNSCDYNYYYHT-UHFFFAOYSA-K 0.000 description 1
- LWFNJDOYCSNXDO-UHFFFAOYSA-K gallium;phosphate Chemical compound [Ga+3].[O-]P([O-])([O-])=O LWFNJDOYCSNXDO-UHFFFAOYSA-K 0.000 description 1
- YBMRDBCBODYGJE-UHFFFAOYSA-N germanium oxide Inorganic materials O=[Ge]=O YBMRDBCBODYGJE-UHFFFAOYSA-N 0.000 description 1
- 229910001679 gibbsite Inorganic materials 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 125000003055 glycidyl group Chemical group C(C1CO1)* 0.000 description 1
- 238000007756 gravure coating Methods 0.000 description 1
- 239000004519 grease Substances 0.000 description 1
- 238000009499 grossing Methods 0.000 description 1
- 235000019382 gum benzoic Nutrition 0.000 description 1
- 229940093915 gynecological organic acid Drugs 0.000 description 1
- 239000003779 heat-resistant material Substances 0.000 description 1
- 125000005842 heteroatom Chemical group 0.000 description 1
- UQEAIHBTYFGYIE-UHFFFAOYSA-N hexamethyldisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)C UQEAIHBTYFGYIE-UHFFFAOYSA-N 0.000 description 1
- XXMIOPMDWAUFGU-UHFFFAOYSA-N hexane-1,6-diol Chemical compound OCCCCCCO XXMIOPMDWAUFGU-UHFFFAOYSA-N 0.000 description 1
- LNMQRPPRQDGUDR-UHFFFAOYSA-N hexyl prop-2-enoate Chemical compound CCCCCCOC(=O)C=C LNMQRPPRQDGUDR-UHFFFAOYSA-N 0.000 description 1
- CZWLNMOIEMTDJY-UHFFFAOYSA-N hexyl(trimethoxy)silane Chemical compound CCCCCC[Si](OC)(OC)OC CZWLNMOIEMTDJY-UHFFFAOYSA-N 0.000 description 1
- 230000003301 hydrolyzing effect Effects 0.000 description 1
- 125000005462 imide group Chemical group 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 125000003454 indenyl group Chemical group C1(C=CC2=CC=CC=C12)* 0.000 description 1
- 150000002472 indium compounds Chemical class 0.000 description 1
- 229910003437 indium oxide Inorganic materials 0.000 description 1
- JXZRZVJOBWBSLG-UHFFFAOYSA-N indium(3+);2-methoxyethanolate Chemical compound [In+3].COCC[O-].COCC[O-].COCC[O-] JXZRZVJOBWBSLG-UHFFFAOYSA-N 0.000 description 1
- PSCMQHVBLHHWTO-UHFFFAOYSA-K indium(iii) chloride Chemical compound Cl[In](Cl)Cl PSCMQHVBLHHWTO-UHFFFAOYSA-K 0.000 description 1
- PJXISJQVUVHSOJ-UHFFFAOYSA-N indium(iii) oxide Chemical compound [O-2].[O-2].[O-2].[In+3].[In+3] PJXISJQVUVHSOJ-UHFFFAOYSA-N 0.000 description 1
- 229910052500 inorganic mineral Inorganic materials 0.000 description 1
- 239000010954 inorganic particle Substances 0.000 description 1
- 229920000592 inorganic polymer Polymers 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- HLYTZTFNIRBLNA-LNTINUHCSA-K iridium(3+);(z)-4-oxopent-2-en-2-olate Chemical compound [Ir+3].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O HLYTZTFNIRBLNA-LNTINUHCSA-K 0.000 description 1
- XOEFHXMHZDTYQO-UHFFFAOYSA-N iron(2+);propan-1-olate Chemical compound [Fe+2].CCC[O-].CCC[O-] XOEFHXMHZDTYQO-UHFFFAOYSA-N 0.000 description 1
- QCQJPUZAVFHPMN-UHFFFAOYSA-N iron(2+);propan-2-olate Chemical compound [Fe+2].CC(C)[O-].CC(C)[O-] QCQJPUZAVFHPMN-UHFFFAOYSA-N 0.000 description 1
- LZKLAOYSENRNKR-LNTINUHCSA-N iron;(z)-4-oxoniumylidenepent-2-en-2-olate Chemical compound [Fe].C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O.C\C(O)=C\C(C)=O LZKLAOYSENRNKR-LNTINUHCSA-N 0.000 description 1
- YPWKOAYHFZTKBJ-UHFFFAOYSA-N iron;methanol Chemical compound [Fe].OC.OC YPWKOAYHFZTKBJ-UHFFFAOYSA-N 0.000 description 1
- 125000001972 isopentyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000003253 isopropoxy group Chemical group [H]C([H])([H])C([H])(O*)C([H])([H])[H] 0.000 description 1
- 229910052640 jadeite Inorganic materials 0.000 description 1
- 239000005453 ketone based solvent Substances 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- TYQCGQRIZGCHNB-JLAZNSOCSA-N l-ascorbic acid Chemical compound OC[C@H](O)[C@H]1OC(O)=C(O)C1=O TYQCGQRIZGCHNB-JLAZNSOCSA-N 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
- UHDUMRBTZQQTHV-UHFFFAOYSA-N lanthanum(3+);1-methoxyethanolate Chemical compound [La+3].COC(C)[O-].COC(C)[O-].COC(C)[O-] UHDUMRBTZQQTHV-UHFFFAOYSA-N 0.000 description 1
- SORGMJIXNUWMMR-UHFFFAOYSA-N lanthanum(3+);propan-2-olate Chemical compound [La+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] SORGMJIXNUWMMR-UHFFFAOYSA-N 0.000 description 1
- PBOSTUDLECTMNL-UHFFFAOYSA-N lauryl acrylate Chemical compound CCCCCCCCCCCCOC(=O)C=C PBOSTUDLECTMNL-UHFFFAOYSA-N 0.000 description 1
- 229910052629 lepidolite Inorganic materials 0.000 description 1
- 229910052907 leucite Inorganic materials 0.000 description 1
- 239000012280 lithium aluminium hydride Substances 0.000 description 1
- 238000004020 luminiscence type Methods 0.000 description 1
- UEGPKNKPLBYCNK-UHFFFAOYSA-L magnesium acetate Chemical compound [Mg+2].CC([O-])=O.CC([O-])=O UEGPKNKPLBYCNK-UHFFFAOYSA-L 0.000 description 1
- 239000011654 magnesium acetate Substances 0.000 description 1
- 235000011285 magnesium acetate Nutrition 0.000 description 1
- 229940069446 magnesium acetate Drugs 0.000 description 1
- PJJZFXPJNUVBMR-UHFFFAOYSA-L magnesium benzoate Chemical compound [Mg+2].[O-]C(=O)C1=CC=CC=C1.[O-]C(=O)C1=CC=CC=C1 PJJZFXPJNUVBMR-UHFFFAOYSA-L 0.000 description 1
- OTCKOJUMXQWKQG-UHFFFAOYSA-L magnesium bromide Chemical compound [Mg+2].[Br-].[Br-] OTCKOJUMXQWKQG-UHFFFAOYSA-L 0.000 description 1
- 229910001623 magnesium bromide Inorganic materials 0.000 description 1
- 150000002681 magnesium compounds Chemical class 0.000 description 1
- VTHJTEIRLNZDEV-UHFFFAOYSA-L magnesium dihydroxide Chemical compound [OH-].[OH-].[Mg+2] VTHJTEIRLNZDEV-UHFFFAOYSA-L 0.000 description 1
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 1
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 1
- 239000000347 magnesium hydroxide Substances 0.000 description 1
- 229910001862 magnesium hydroxide Inorganic materials 0.000 description 1
- 239000000395 magnesium oxide Substances 0.000 description 1
- CPLXHLVBOLITMK-UHFFFAOYSA-N magnesium oxide Inorganic materials [Mg]=O CPLXHLVBOLITMK-UHFFFAOYSA-N 0.000 description 1
- 229960004995 magnesium peroxide Drugs 0.000 description 1
- 229910052943 magnesium sulfate Inorganic materials 0.000 description 1
- QENHCSSJTJWZAL-UHFFFAOYSA-N magnesium sulfide Chemical compound [Mg+2].[S-2] QENHCSSJTJWZAL-UHFFFAOYSA-N 0.000 description 1
- 235000019341 magnesium sulphate Nutrition 0.000 description 1
- AKTIAGQCYPCKFX-FDGPNNRMSA-L magnesium;(z)-4-oxopent-2-en-2-olate Chemical compound [Mg+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O AKTIAGQCYPCKFX-FDGPNNRMSA-L 0.000 description 1
- PGBDMBUYZOQDOH-UHFFFAOYSA-N magnesium;1-ethoxyethanolate Chemical compound [Mg+2].CCOC(C)[O-].CCOC(C)[O-] PGBDMBUYZOQDOH-UHFFFAOYSA-N 0.000 description 1
- YXOSSQSXCRVLJY-UHFFFAOYSA-N magnesium;2-methoxyethanolate Chemical compound COCCO[Mg]OCCOC YXOSSQSXCRVLJY-UHFFFAOYSA-N 0.000 description 1
- FRIJBUGBVQZNTB-UHFFFAOYSA-M magnesium;ethane;bromide Chemical compound [Mg+2].[Br-].[CH2-]C FRIJBUGBVQZNTB-UHFFFAOYSA-M 0.000 description 1
- AXZKOIWUVFPNLO-UHFFFAOYSA-N magnesium;oxygen(2-) Chemical compound [O-2].[Mg+2] AXZKOIWUVFPNLO-UHFFFAOYSA-N 0.000 description 1
- JESHZQPNPCJVNG-UHFFFAOYSA-L magnesium;sulfite Chemical compound [Mg+2].[O-]S([O-])=O JESHZQPNPCJVNG-UHFFFAOYSA-L 0.000 description 1
- UQIRCVPINUNHQY-UHFFFAOYSA-N manganese(2+);methanolate Chemical compound [Mn+2].[O-]C.[O-]C UQIRCVPINUNHQY-UHFFFAOYSA-N 0.000 description 1
- 239000012528 membrane Substances 0.000 description 1
- 239000012702 metal oxide precursor Substances 0.000 description 1
- CERQOIWHTDAKMF-UHFFFAOYSA-M methacrylate group Chemical group C(C(=C)C)(=O)[O-] CERQOIWHTDAKMF-UHFFFAOYSA-M 0.000 description 1
- 125000005395 methacrylic acid group Chemical group 0.000 description 1
- 239000000113 methacrylic resin Substances 0.000 description 1
- LVNAMAOHFNPWJB-UHFFFAOYSA-N methanol;tantalum Chemical compound [Ta].OC.OC.OC.OC.OC LVNAMAOHFNPWJB-UHFFFAOYSA-N 0.000 description 1
- POPACFLNWGUDSR-UHFFFAOYSA-N methoxy(trimethyl)silane Chemical compound CO[Si](C)(C)C POPACFLNWGUDSR-UHFFFAOYSA-N 0.000 description 1
- JGBBEDHDVABGGX-UHFFFAOYSA-N methoxygallium Chemical compound CO[Ga] JGBBEDHDVABGGX-UHFFFAOYSA-N 0.000 description 1
- 229940095102 methyl benzoate Drugs 0.000 description 1
- 229920000609 methyl cellulose Polymers 0.000 description 1
- 239000001923 methylcellulose Substances 0.000 description 1
- 229960000907 methylthioninium chloride Drugs 0.000 description 1
- BFXIKLCIZHOAAZ-UHFFFAOYSA-N methyltrimethoxysilane Chemical compound CO[Si](C)(OC)OC BFXIKLCIZHOAAZ-UHFFFAOYSA-N 0.000 description 1
- 239000010445 mica Substances 0.000 description 1
- 229910052618 mica group Inorganic materials 0.000 description 1
- 239000011707 mineral Substances 0.000 description 1
- 235000010755 mineral Nutrition 0.000 description 1
- 239000012046 mixed solvent Substances 0.000 description 1
- 239000003607 modifier Substances 0.000 description 1
- 229910021421 monocrystalline silicon Inorganic materials 0.000 description 1
- 229910052627 muscovite Inorganic materials 0.000 description 1
- OOHAUGDGCWURIT-UHFFFAOYSA-N n,n-dipentylpentan-1-amine Chemical compound CCCCCN(CCCCC)CCCCC OOHAUGDGCWURIT-UHFFFAOYSA-N 0.000 description 1
- NLSXOLJPOYUIKX-UHFFFAOYSA-N n-(3-trimethylsilylpropyl)butan-1-amine Chemical compound CCCCNCCC[Si](C)(C)C NLSXOLJPOYUIKX-UHFFFAOYSA-N 0.000 description 1
- BOYBHDHQCOROOJ-UHFFFAOYSA-N n-[butylamino(dimethyl)silyl]butan-1-amine Chemical compound CCCCN[Si](C)(C)NCCCC BOYBHDHQCOROOJ-UHFFFAOYSA-N 0.000 description 1
- 125000004108 n-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000003136 n-heptyl group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])* 0.000 description 1
- 125000001280 n-hexyl group Chemical group C(CCCCC)* 0.000 description 1
- QHUOBLDKFGCVCG-UHFFFAOYSA-N n-methyl-n-trimethylsilylacetamide Chemical compound CC(=O)N(C)[Si](C)(C)C QHUOBLDKFGCVCG-UHFFFAOYSA-N 0.000 description 1
- 125000003506 n-propoxy group Chemical group [H]C([H])([H])C([H])([H])C([H])([H])O* 0.000 description 1
- 239000002114 nanocomposite Substances 0.000 description 1
- DASJFYAPNPUBGG-UHFFFAOYSA-N naphthalene-1-sulfonyl chloride Chemical compound C1=CC=C2C(S(=O)(=O)Cl)=CC=CC2=C1 DASJFYAPNPUBGG-UHFFFAOYSA-N 0.000 description 1
- 125000001624 naphthyl group Chemical group 0.000 description 1
- 229910052754 neon Inorganic materials 0.000 description 1
- GKAOGPIIYCISHV-UHFFFAOYSA-N neon atom Chemical compound [Ne] GKAOGPIIYCISHV-UHFFFAOYSA-N 0.000 description 1
- SLCVBVWXLSEKPL-UHFFFAOYSA-N neopentyl glycol Chemical compound OCC(C)(C)CO SLCVBVWXLSEKPL-UHFFFAOYSA-N 0.000 description 1
- 125000001971 neopentyl group Chemical group [H]C([*])([H])C(C([H])([H])[H])(C([H])([H])[H])C([H])([H])[H] 0.000 description 1
- BMGNSKKZFQMGDH-FDGPNNRMSA-L nickel(2+);(z)-4-oxopent-2-en-2-olate Chemical compound [Ni+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O BMGNSKKZFQMGDH-FDGPNNRMSA-L 0.000 description 1
- ZTILUDNICMILKJ-UHFFFAOYSA-N niobium(v) ethoxide Chemical compound CCO[Nb](OCC)(OCC)(OCC)OCC ZTILUDNICMILKJ-UHFFFAOYSA-N 0.000 description 1
- 125000000449 nitro group Chemical group [O-][N+](*)=O 0.000 description 1
- HMMGMWAXVFQUOA-UHFFFAOYSA-N octamethylcyclotetrasiloxane Chemical compound C[Si]1(C)O[Si](C)(C)O[Si](C)(C)O[Si](C)(C)O1 HMMGMWAXVFQUOA-UHFFFAOYSA-N 0.000 description 1
- WWZKQHOCKIZLMA-UHFFFAOYSA-M octanoate Chemical compound CCCCCCCC([O-])=O WWZKQHOCKIZLMA-UHFFFAOYSA-M 0.000 description 1
- ANISOHQJBAQUQP-UHFFFAOYSA-N octyl prop-2-enoate Chemical compound CCCCCCCCOC(=O)C=C ANISOHQJBAQUQP-UHFFFAOYSA-N 0.000 description 1
- 239000010450 olivine Substances 0.000 description 1
- 229910052609 olivine Inorganic materials 0.000 description 1
- 229910001731 omphacite Inorganic materials 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 235000005985 organic acids Nutrition 0.000 description 1
- 239000005416 organic matter Substances 0.000 description 1
- 125000002524 organometallic group Chemical group 0.000 description 1
- 125000003566 oxetanyl group Chemical group 0.000 description 1
- PVADDRMAFCOOPC-UHFFFAOYSA-N oxogermanium Chemical compound [Ge]=O PVADDRMAFCOOPC-UHFFFAOYSA-N 0.000 description 1
- 125000001820 oxy group Chemical group [*:1]O[*:2] 0.000 description 1
- RVTZCBVAJQQJTK-UHFFFAOYSA-N oxygen(2-);zirconium(4+) Chemical compound [O-2].[O-2].[Zr+4] RVTZCBVAJQQJTK-UHFFFAOYSA-N 0.000 description 1
- 239000005022 packaging material Substances 0.000 description 1
- 238000012856 packing Methods 0.000 description 1
- 239000003973 paint Substances 0.000 description 1
- JKDRQYIYVJVOPF-FDGPNNRMSA-L palladium(ii) acetylacetonate Chemical compound [Pd+2].C\C([O-])=C\C(C)=O.C\C([O-])=C\C(C)=O JKDRQYIYVJVOPF-FDGPNNRMSA-L 0.000 description 1
- 230000036961 partial effect Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- DSQPRECRRGZSCV-UHFFFAOYSA-N penta-1,4-dien-3-yl(phenyl)silane Chemical compound C=CC([SiH2]c1ccccc1)C=C DSQPRECRRGZSCV-UHFFFAOYSA-N 0.000 description 1
- ULDDEWDFUNBUCM-UHFFFAOYSA-N pentyl prop-2-enoate Chemical compound CCCCCOC(=O)C=C ULDDEWDFUNBUCM-UHFFFAOYSA-N 0.000 description 1
- PNJWIWWMYCMZRO-UHFFFAOYSA-N pent‐4‐en‐2‐one Natural products CC(=O)CC=C PNJWIWWMYCMZRO-UHFFFAOYSA-N 0.000 description 1
- 150000002978 peroxides Chemical class 0.000 description 1
- 125000001828 phenalenyl group Chemical group C1(C=CC2=CC=CC3=CC=CC1=C23)* 0.000 description 1
- 125000005561 phenanthryl group Chemical group 0.000 description 1
- 239000005011 phenolic resin Substances 0.000 description 1
- XVCSANIKJQVZCJ-UHFFFAOYSA-N phenylsilylmethyl acetate Chemical compound C(C)(=O)OC[SiH2]C1=CC=CC=C1 XVCSANIKJQVZCJ-UHFFFAOYSA-N 0.000 description 1
- 238000005240 physical vapour deposition Methods 0.000 description 1
- 229910052655 plagioclase feldspar Inorganic materials 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 230000010287 polarization Effects 0.000 description 1
- 229920001200 poly(ethylene-vinyl acetate) Polymers 0.000 description 1
- 229920002037 poly(vinyl butyral) polymer Polymers 0.000 description 1
- 229920002312 polyamide-imide Polymers 0.000 description 1
- 229920000447 polyanionic polymer Polymers 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 125000003367 polycyclic group Chemical group 0.000 description 1
- 229920000570 polyether Polymers 0.000 description 1
- 229920006393 polyether sulfone Polymers 0.000 description 1
- 229920002530 polyetherether ketone Polymers 0.000 description 1
- 229920001601 polyetherimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 229920006254 polymer film Polymers 0.000 description 1
- 239000003505 polymerization initiator Substances 0.000 description 1
- 229920005862 polyol Polymers 0.000 description 1
- 229920000098 polyolefin Polymers 0.000 description 1
- 229920005672 polyolefin resin Polymers 0.000 description 1
- 229920006324 polyoxymethylene Polymers 0.000 description 1
- 239000011970 polystyrene sulfonate Substances 0.000 description 1
- 229960002796 polystyrene sulfonate Drugs 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 239000011118 polyvinyl acetate Substances 0.000 description 1
- 229920002689 polyvinyl acetate Polymers 0.000 description 1
- 238000010248 power generation Methods 0.000 description 1
- 230000001737 promoting effect Effects 0.000 description 1
- KCTAWXVAICEBSD-UHFFFAOYSA-N prop-2-enoyloxy prop-2-eneperoxoate Chemical compound C=CC(=O)OOOC(=O)C=C KCTAWXVAICEBSD-UHFFFAOYSA-N 0.000 description 1
- QTECDUFMBMSHKR-UHFFFAOYSA-N prop-2-enyl prop-2-enoate Chemical compound C=CCOC(=O)C=C QTECDUFMBMSHKR-UHFFFAOYSA-N 0.000 description 1
- IKNCGYCHMGNBCP-UHFFFAOYSA-N propan-1-olate Chemical compound CCC[O-] IKNCGYCHMGNBCP-UHFFFAOYSA-N 0.000 description 1
- WUBJXWWQGDPUCE-UHFFFAOYSA-N propan-1-olate yttrium(3+) Chemical compound [Y+3].CCC[O-].CCC[O-].CCC[O-] WUBJXWWQGDPUCE-UHFFFAOYSA-N 0.000 description 1
- NREVZTYRXVBFAQ-UHFFFAOYSA-N propan-2-ol;yttrium Chemical compound [Y].CC(C)O.CC(C)O.CC(C)O NREVZTYRXVBFAQ-UHFFFAOYSA-N 0.000 description 1
- BCWYYHBWCZYDNB-UHFFFAOYSA-N propan-2-ol;zirconium Chemical compound [Zr].CC(C)O.CC(C)O.CC(C)O.CC(C)O BCWYYHBWCZYDNB-UHFFFAOYSA-N 0.000 description 1
- HJCRVWSKQNDSPZ-UHFFFAOYSA-N propan-2-olate;samarium(3+) Chemical compound [Sm+3].CC(C)[O-].CC(C)[O-].CC(C)[O-] HJCRVWSKQNDSPZ-UHFFFAOYSA-N 0.000 description 1
- LYBIZMNPXTXVMV-UHFFFAOYSA-N propan-2-yl prop-2-enoate Chemical compound CC(C)OC(=O)C=C LYBIZMNPXTXVMV-UHFFFAOYSA-N 0.000 description 1
- 239000001294 propane Substances 0.000 description 1
- 125000001501 propionyl group Chemical group O=C([*])C([H])([H])C([H])([H])[H] 0.000 description 1
- PNXMTCDJUBJHQJ-UHFFFAOYSA-N propyl prop-2-enoate Chemical compound CCCOC(=O)C=C PNXMTCDJUBJHQJ-UHFFFAOYSA-N 0.000 description 1
- LLHKCFNBLRBOGN-UHFFFAOYSA-N propylene glycol methyl ether acetate Chemical compound COCC(C)OC(C)=O LLHKCFNBLRBOGN-UHFFFAOYSA-N 0.000 description 1
- 125000001725 pyrenyl group Chemical group 0.000 description 1
- 238000011002 quantification Methods 0.000 description 1
- VHXJRLYFEJAIAM-UHFFFAOYSA-N quinoline-2-sulfonyl chloride Chemical compound C1=CC=CC2=NC(S(=O)(=O)Cl)=CC=C21 VHXJRLYFEJAIAM-UHFFFAOYSA-N 0.000 description 1
- 150000003254 radicals Chemical class 0.000 description 1
- 229910052704 radon Inorganic materials 0.000 description 1
- SYUHGPGVQRZVTB-UHFFFAOYSA-N radon atom Chemical compound [Rn] SYUHGPGVQRZVTB-UHFFFAOYSA-N 0.000 description 1
- 229920005604 random copolymer Polymers 0.000 description 1
- 230000009257 reactivity Effects 0.000 description 1
- 230000009467 reduction Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 239000011342 resin composition Substances 0.000 description 1
- 150000003839 salts Chemical group 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 229910052654 sanidine Inorganic materials 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000003566 sealing material Substances 0.000 description 1
- 125000002914 sec-butyl group Chemical group [H]C([H])([H])C([H])([H])C([H])(*)C([H])([H])[H] 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
- 150000004756 silanes Chemical class 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 1
- 229910010271 silicon carbide Inorganic materials 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- 229920002050 silicone resin Polymers 0.000 description 1
- CHACQUSVOVNARW-LNKPDPKZSA-M silver;(z)-4-oxopent-2-en-2-olate Chemical compound [Ag+].C\C([O-])=C\C(C)=O CHACQUSVOVNARW-LNKPDPKZSA-M 0.000 description 1
- 125000003808 silyl group Chemical group [H][Si]([H])([H])[*] 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 229910052665 sodalite Inorganic materials 0.000 description 1
- 229910001388 sodium aluminate Inorganic materials 0.000 description 1
- BEOOHQFXGBMRKU-UHFFFAOYSA-N sodium cyanoborohydride Chemical compound [Na+].[B-]C#N BEOOHQFXGBMRKU-UHFFFAOYSA-N 0.000 description 1
- 239000004328 sodium tetraborate Substances 0.000 description 1
- 235000010339 sodium tetraborate Nutrition 0.000 description 1
- 239000006104 solid solution Substances 0.000 description 1
- 238000001179 sorption measurement Methods 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 125000004079 stearyl group Chemical group [H]C([*])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 238000003756 stirring Methods 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- OHULXNKDWPTSBI-UHFFFAOYSA-N strontium;propan-2-olate Chemical compound [Sr+2].CC(C)[O-].CC(C)[O-] OHULXNKDWPTSBI-UHFFFAOYSA-N 0.000 description 1
- 150000003440 styrenes Chemical class 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 125000000020 sulfo group Chemical group O=S(=O)([*])O[H] 0.000 description 1
- XTQHKBHJIVJGKJ-UHFFFAOYSA-N sulfur monoxide Chemical compound S=O XTQHKBHJIVJGKJ-UHFFFAOYSA-N 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 230000002195 synergetic effect Effects 0.000 description 1
- QJVXKWHHAMZTBY-GCPOEHJPSA-N syringin Chemical compound COC1=CC(\C=C\CO)=CC(OC)=C1O[C@H]1[C@H](O)[C@@H](O)[C@H](O)[C@@H](CO)O1 QJVXKWHHAMZTBY-GCPOEHJPSA-N 0.000 description 1
- 239000000454 talc Substances 0.000 description 1
- 229910052623 talc Inorganic materials 0.000 description 1
- 238000010345 tape casting Methods 0.000 description 1
- 239000011975 tartaric acid Substances 0.000 description 1
- 235000002906 tartaric acid Nutrition 0.000 description 1
- 235000007586 terpenes Nutrition 0.000 description 1
- PUGUQINMNYINPK-UHFFFAOYSA-N tert-butyl 4-(2-chloroacetyl)piperazine-1-carboxylate Chemical compound CC(C)(C)OC(=O)N1CCN(C(=O)CCl)CC1 PUGUQINMNYINPK-UHFFFAOYSA-N 0.000 description 1
- ISXSCDLOGDJUNJ-UHFFFAOYSA-N tert-butyl prop-2-enoate Chemical compound CC(C)(C)OC(=O)C=C ISXSCDLOGDJUNJ-UHFFFAOYSA-N 0.000 description 1
- 150000003512 tertiary amines Chemical class 0.000 description 1
- WXYNMTGBLWPTNQ-UHFFFAOYSA-N tetrabutoxygermane Chemical compound CCCCO[Ge](OCCCC)(OCCCC)OCCCC WXYNMTGBLWPTNQ-UHFFFAOYSA-N 0.000 description 1
- UQMOLLPKNHFRAC-UHFFFAOYSA-N tetrabutyl silicate Chemical compound CCCCO[Si](OCCCC)(OCCCC)OCCCC UQMOLLPKNHFRAC-UHFFFAOYSA-N 0.000 description 1
- 125000001935 tetracenyl group Chemical group C1(=CC=CC2=CC3=CC4=CC=CC=C4C=C3C=C12)* 0.000 description 1
- GXMNGLIMQIPFEB-UHFFFAOYSA-N tetraethoxygermane Chemical compound CCO[Ge](OCC)(OCC)OCC GXMNGLIMQIPFEB-UHFFFAOYSA-N 0.000 description 1
- UFHILTCGAOPTOV-UHFFFAOYSA-N tetrakis(ethenyl)silane Chemical compound C=C[Si](C=C)(C=C)C=C UFHILTCGAOPTOV-UHFFFAOYSA-N 0.000 description 1
- CZDYPVPMEAXLPK-UHFFFAOYSA-N tetramethylsilane Chemical compound C[Si](C)(C)C CZDYPVPMEAXLPK-UHFFFAOYSA-N 0.000 description 1
- ZQZCOBSUOFHDEE-UHFFFAOYSA-N tetrapropyl silicate Chemical compound CCCO[Si](OCCC)(OCCC)OCCC ZQZCOBSUOFHDEE-UHFFFAOYSA-N 0.000 description 1
- YRHRIQCWCFGUEQ-UHFFFAOYSA-N thioxanthen-9-one Chemical compound C1=CC=C2C(=O)C3=CC=CC=C3SC2=C1 YRHRIQCWCFGUEQ-UHFFFAOYSA-N 0.000 description 1
- 150000003609 titanium compounds Chemical class 0.000 description 1
- JMXKSZRRTHPKDL-UHFFFAOYSA-N titanium ethoxide Chemical compound [Ti+4].CC[O-].CC[O-].CC[O-].CC[O-] JMXKSZRRTHPKDL-UHFFFAOYSA-N 0.000 description 1
- XJDNKRIXUMDJCW-UHFFFAOYSA-J titanium tetrachloride Chemical compound Cl[Ti](Cl)(Cl)Cl XJDNKRIXUMDJCW-UHFFFAOYSA-J 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- YZVRVDPMGYFCGL-UHFFFAOYSA-N triacetyloxysilyl acetate Chemical compound CC(=O)O[Si](OC(C)=O)(OC(C)=O)OC(C)=O YZVRVDPMGYFCGL-UHFFFAOYSA-N 0.000 description 1
- VLCQZHSMCYCDJL-UHFFFAOYSA-N tribenuron methyl Chemical compound COC(=O)C1=CC=CC=C1S(=O)(=O)NC(=O)N(C)C1=NC(C)=NC(OC)=N1 VLCQZHSMCYCDJL-UHFFFAOYSA-N 0.000 description 1
- MYWQGROTKMBNKN-UHFFFAOYSA-N tributoxyalumane Chemical compound [Al+3].CCCC[O-].CCCC[O-].CCCC[O-] MYWQGROTKMBNKN-UHFFFAOYSA-N 0.000 description 1
- JWRQFDQQDBJDHD-UHFFFAOYSA-N tributoxyindigane Chemical compound CCCCO[In](OCCCC)OCCCC JWRQFDQQDBJDHD-UHFFFAOYSA-N 0.000 description 1
- LGQXXHMEBUOXRP-UHFFFAOYSA-N tributyl borate Chemical compound CCCCOB(OCCCC)OCCCC LGQXXHMEBUOXRP-UHFFFAOYSA-N 0.000 description 1
- IMFACGCPASFAPR-UHFFFAOYSA-N tributylamine Chemical compound CCCCN(CCCC)CCCC IMFACGCPASFAPR-UHFFFAOYSA-N 0.000 description 1
- QORWJWZARLRLPR-UHFFFAOYSA-H tricalcium bis(phosphate) Chemical compound [Ca+2].[Ca+2].[Ca+2].[O-]P([O-])([O-])=O.[O-]P([O-])([O-])=O QORWJWZARLRLPR-UHFFFAOYSA-H 0.000 description 1
- FRGPKMWIYVTFIQ-UHFFFAOYSA-N triethoxy(3-isocyanatopropyl)silane Chemical compound CCO[Si](OCC)(OCC)CCCN=C=O FRGPKMWIYVTFIQ-UHFFFAOYSA-N 0.000 description 1
- ZDYQCRCRHOQEED-UHFFFAOYSA-N triethoxy(ethyl)germane Chemical compound CCO[Ge](CC)(OCC)OCC ZDYQCRCRHOQEED-UHFFFAOYSA-N 0.000 description 1
- CPUDPFPXCZDNGI-UHFFFAOYSA-N triethoxy(methyl)silane Chemical compound CCO[Si](C)(OCC)OCC CPUDPFPXCZDNGI-UHFFFAOYSA-N 0.000 description 1
- AJSTXXYNEIHPMD-UHFFFAOYSA-N triethyl borate Chemical compound CCOB(OCC)OCC AJSTXXYNEIHPMD-UHFFFAOYSA-N 0.000 description 1
- VOITXYVAKOUIBA-UHFFFAOYSA-N triethylaluminium Chemical compound CC[Al](CC)CC VOITXYVAKOUIBA-UHFFFAOYSA-N 0.000 description 1
- UORVGPXVDQYIDP-UHFFFAOYSA-N trihydridoboron Substances B UORVGPXVDQYIDP-UHFFFAOYSA-N 0.000 description 1
- ZNOCGWVLWPVKAO-UHFFFAOYSA-N trimethoxy(phenyl)silane Chemical compound CO[Si](OC)(OC)C1=CC=CC=C1 ZNOCGWVLWPVKAO-UHFFFAOYSA-N 0.000 description 1
- UAEJRRZPRZCUBE-UHFFFAOYSA-N trimethoxyalumane Chemical compound [Al+3].[O-]C.[O-]C.[O-]C UAEJRRZPRZCUBE-UHFFFAOYSA-N 0.000 description 1
- CDGIKLPUDRGJQN-UHFFFAOYSA-N trimethyl(octoxy)silane Chemical compound CCCCCCCCO[Si](C)(C)C CDGIKLPUDRGJQN-UHFFFAOYSA-N 0.000 description 1
- JLTRXTDYQLMHGR-UHFFFAOYSA-N trimethylaluminium Chemical compound C[Al](C)C JLTRXTDYQLMHGR-UHFFFAOYSA-N 0.000 description 1
- VFFKJOXNCSJSAQ-UHFFFAOYSA-N trimethylsilyl benzoate Chemical compound C[Si](C)(C)OC(=O)C1=CC=CC=C1 VFFKJOXNCSJSAQ-UHFFFAOYSA-N 0.000 description 1
- 125000003960 triphenylenyl group Chemical group C1(=CC=CC=2C3=CC=CC=C3C3=CC=CC=C3C12)* 0.000 description 1
- OBROYCQXICMORW-UHFFFAOYSA-N tripropoxyalumane Chemical compound [Al+3].CCC[O-].CCC[O-].CCC[O-] OBROYCQXICMORW-UHFFFAOYSA-N 0.000 description 1
- LTEHWCSSIHAVOQ-UHFFFAOYSA-N tripropyl borate Chemical compound CCCOB(OCCC)OCCC LTEHWCSSIHAVOQ-UHFFFAOYSA-N 0.000 description 1
- YFTHZRPMJXBUME-UHFFFAOYSA-N tripropylamine Chemical compound CCCN(CCC)CCC YFTHZRPMJXBUME-UHFFFAOYSA-N 0.000 description 1
- PKRKCDBTXBGLKV-UHFFFAOYSA-N tris(ethenyl)-methylsilane Chemical compound C=C[Si](C)(C=C)C=C PKRKCDBTXBGLKV-UHFFFAOYSA-N 0.000 description 1
- FUJPAQRDHMJPBB-UHFFFAOYSA-N tris(ethenyl)-phenylsilane Chemical compound C=C[Si](C=C)(C=C)C1=CC=CC=C1 FUJPAQRDHMJPBB-UHFFFAOYSA-N 0.000 description 1
- MDDPTCUZZASZIQ-UHFFFAOYSA-N tris[(2-methylpropan-2-yl)oxy]alumane Chemical compound [Al+3].CC(C)(C)[O-].CC(C)(C)[O-].CC(C)(C)[O-] MDDPTCUZZASZIQ-UHFFFAOYSA-N 0.000 description 1
- 229920006337 unsaturated polyester resin Polymers 0.000 description 1
- 125000003774 valeryl group Chemical group O=C([*])C([H])([H])C([H])([H])C([H])([H])C([H])([H])[H] 0.000 description 1
- 239000012808 vapor phase Substances 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
- 239000010456 wollastonite Substances 0.000 description 1
- 229910052882 wollastonite Inorganic materials 0.000 description 1
- 229910019901 yttrium aluminum garnet Inorganic materials 0.000 description 1
- 239000010457 zeolite Substances 0.000 description 1
- 239000011592 zinc chloride Substances 0.000 description 1
- 235000005074 zinc chloride Nutrition 0.000 description 1
- 150000003752 zinc compounds Chemical class 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
- WSDTWCKXZSLBGW-UHFFFAOYSA-N zinc;2-methoxyethanolate Chemical compound [Zn+2].COCC[O-].COCC[O-] WSDTWCKXZSLBGW-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
- 150000003755 zirconium compounds Chemical class 0.000 description 1
- 229910001928 zirconium oxide Inorganic materials 0.000 description 1
- DUNKXUFBGCUVQW-UHFFFAOYSA-J zirconium tetrachloride Chemical compound Cl[Zr](Cl)(Cl)Cl DUNKXUFBGCUVQW-UHFFFAOYSA-J 0.000 description 1
- 239000002043 β-alumina solid electrolyte Substances 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/048—Forming gas barrier coatings
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B32—LAYERED PRODUCTS
- B32B—LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM
- B32B15/00—Layered products comprising a layer of metal
- B32B15/04—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material
- B32B15/08—Layered products comprising a layer of metal comprising metal as the main or only constituent of a layer, which is next to another layer of the same or of a different material of synthetic resin
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/042—Coating with two or more layers, where at least one layer of a composition contains a polymer binder
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08J—WORKING-UP; GENERAL PROCESSES OF COMPOUNDING; AFTER-TREATMENT NOT COVERED BY SUBCLASSES C08B, C08C, C08F, C08G or C08H
- C08J7/00—Chemical treatment or coating of shaped articles made of macromolecular substances
- C08J7/04—Coating
- C08J7/043—Improving the adhesiveness of the coatings per se, e.g. forming primers
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
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- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
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- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/14—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers in which at least two but not all the silicon atoms are connected by linkages other than oxygen atoms
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- C09D183/00—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers
- C09D183/16—Coating compositions based on macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon, with or without sulfur, nitrogen, oxygen, or carbon only; Coating compositions based on derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
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- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/48—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating by irradiation, e.g. photolysis, radiolysis, particle radiation
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- C08J2483/04—Polysiloxanes
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- C08J2483/16—Characterised by the use of macromolecular compounds obtained by reactions forming in the main chain of the macromolecule a linkage containing silicon with or without sulfur, nitrogen, oxygen, or carbon only; Derivatives of such polymers in which all the silicon atoms are connected by linkages other than oxygen atoms
Definitions
- the present invention relates to a gas barrier film and a method for producing the same, and more particularly to a gas barrier film used for an electronic device such as an organic electroluminescence (EL) element, a solar cell element, and a liquid crystal display.
- EL organic electroluminescence
- Measures for obtaining a gas barrier film applicable to electronic devices can be broadly divided into vacuum coating methods such as vapor deposition, sputtering, and CVD, and a dry coating method that deposits a gas barrier layer on a substrate and coating under normal pressure.
- vacuum coating methods such as vapor deposition, sputtering, and CVD
- dry coating method that deposits a gas barrier layer on a substrate and coating under normal pressure.
- wet coating method in which a liquid is applied on a substrate and a gas barrier layer is formed on the substrate by drying and modification treatment (both dry coating method and wet coating method are IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, Vol10 45-57 (2004)).
- a method by a sol-gel method using a metal alkoxide or the like as described in US Pat. No. 6,503,634 is known.
- a metal oxide precursor as described in L. Prager et al., Chem. Eur. J. 2007, 13, 8522. How to quality is known.
- WVTR 1 ⁇ 10 ⁇ 3 g / m 2 ⁇ day (40 ° C. 90% RH) or less.
- the thin film formed by such a method has defects originating from the boundary between the island and the island because the influence of impurities existing on the surface and the growth of the thin film are formed through an island-like structure. The defect becomes a passage of moisture and the barrier property is lowered.
- the wet coating method a production form such as roll-to-roll is possible, and it is expected that a high barrier film can be produced with high productivity. Also, according to the wet coating method, it was expected that there are few defects due to thin film growth.
- the wet coating method after applying a barrier layer precursor that can be applied, heat, light are applied to the obtained coating film.
- the barrier layer is formed by performing a modification treatment with oxygen, moisture, or the like. For this reason, there is a problem that defects and distortions are likely to occur due to the diffusion of unnecessary substances and the modification of the coating film during the modification treatment. In particular, the barrier layer is not sufficiently densified, and the film density is low as compared with a barrier layer produced by a dry coating method.
- the barrier layer produced by the wet coating method is expected to have high productivity, but the barrier property is insufficient, or the barrier property tends to be lowered due to bending or elongation of the base material. There are problems such as these, and the present situation is that the solution is desired.
- the present invention has been made in view of the above circumstances, and an object of the present invention is to provide a means capable of further improving the gas barrier performance and the durability of the gas barrier performance in the gas barrier film.
- first barrier layer having a predetermined film density (specifically, 1.5 to 2.1 g / cm 3 ) and containing an inorganic compound, a predetermined additive element containing silicon atoms and A barrier layer (second barrier layer) that is contained together with oxygen atoms and in which the abundance ratio of oxygen atoms and nitrogen atoms to silicon atoms is controlled to a value within a predetermined range is disposed on the same side surface of the substrate
- the first material disposed on at least one surface of the substrate and having a film density of 1.5 to 2.1 g / cm 3 and containing an inorganic compound is provided.
- At least one additive element (excluding silicon and carbon), silicon atoms and oxygen atoms, and the abundance ratio of oxygen atoms to silicon atoms (O / Si) is 1.4 to 2.2
- a second barrier layer having an abundance ratio of nitrogen atoms to silicon atoms (N / Si) of 0 to 0.4.
- the gas-barrier film which concerns on the said form, Comprising: The 1st coating liquid containing the said inorganic compound or its precursor is provided in the at least one surface of a base material.
- a method for producing a gas barrier film which includes a step of applying to form a first coating film and modifying the first coating film to form a first barrier layer.
- One embodiment of the present invention is a base material, and a first barrier layer disposed on at least one surface of the base material and having a film density of 1.5 to 2.1 g / cm 3 and containing an inorganic compound, At least one selected from the group consisting of elements of groups 2 to 14 of the long-period periodic table formed on the same side of the substrate as the first barrier layer is formed.
- a first barrier layer disposed on at least one surface of the base material and having a film density of 1.5 to 2.1 g / cm 3 and containing an inorganic compound, At least one selected from the group consisting of elements of groups 2 to 14 of the long-period periodic table formed on the same side of the substrate as the first barrier layer is formed.
- silicon atoms and oxygen atoms are contained, and the abundance ratio of oxygen atoms to silicon atoms (O / Si) is 1.4 to 2.2.
- a second barrier layer having a nitrogen atom abundance ratio (N / Si) of 0 to 0.4.
- Such a configuration provides a means for further improving the gas barrier performance and the durability of the gas barrier performance in the gas barrier film.
- gas barrier film according to this embodiment is excellent in the gas barrier performance and the durability of the gas barrier performance is unknown, but is considered to be as follows.
- a gas barrier layer (barrier layer) using a wet coating method is usually performed by applying a barrier layer precursor that can be applied, followed by evaporation of the solvent, condensation reaction / crosslinking reaction of the barrier layer precursor, This is performed by densifying the coating film by a modification treatment or the like.
- the barrier layer formed by such a method retains the structure of the initial coating film at the time of releasing the solvent, and since the modification treatment is not complete, the film density is lower than the original value of the substance. Is also low.
- the coating film when the coating film is densified and converted into a barrier layer, it is accompanied by a large physical and chemical structural change, but the densification of the barrier layer does not progress uniformly, thereby forming a barrier layer. There is also a feature that distortion occurs.
- the second barrier layer having a predetermined composition coexists even when the film density of the first barrier layer is relatively small. It is considered that the strain in the barrier layer is relaxed, and as a result, the generation of cracks is suppressed, and the gas barrier performance and the durability thereof are improved.
- the density of the first barrier layer is extremely low, the effect of the present invention is not exhibited, and therefore it is estimated that the density of the first barrier layer needs to be a value within a specific range. .
- X to Y indicating a range means “X or more and Y or less”. Unless otherwise specified, measurement of operation and physical properties is performed under conditions of room temperature (20 to 25 ° C.) / Relative humidity 40 to 50%.
- the gas barrier film according to one embodiment of the present invention includes a base material, a first barrier layer, and a second barrier layer.
- the order thereof is not limited. That is, the base material / first barrier layer / second barrier layer may be disposed, or the base material / second barrier layer / first barrier layer may be disposed. From the viewpoint that the effects of the present invention are more remarkably exhibited, the arrangement of the base material / the first barrier layer / the second barrier layer (the base material, the first barrier layer, and the second barrier layer) Are preferably included in this order).
- first barrier layer and the second barrier layer may be arranged independently.
- the barrier layer closest to the substrate is the first barrier layer, and is the most from the substrate.
- a configuration in which the far barrier layer is the second barrier layer is preferable.
- the gas barrier film of the present invention may further contain other members.
- the gas barrier film of the present invention is, for example, between the base material and the first barrier layer, between the first barrier layer and the second barrier layer, on the second barrier layer, or on the first barrier. You may have another member in the other surface of the base material in which the layer and the 2nd barrier layer are not formed.
- the other members are not particularly limited, and members used for conventional gas barrier films can be used similarly or appropriately modified. Specifically, a barrier layer, an intermediate layer, a protective layer, a smooth layer, an anchor coat layer, a bleed-out prevention layer, and a moisture-desiccant desiccant that do not satisfy the above-described first barrier layer and second barrier layer. And a functional layer of an antistatic layer or an antistatic layer.
- the gas barrier unit having the first barrier layer and the second barrier layer may be formed on one surface of the base material, or may be formed on both surfaces of the base material. Further, the gas barrier unit may include a layer having no gas barrier property.
- the “barrier layer” means a layer having a water vapor transmission rate (WVTR) of less than 1 ⁇ 10 ⁇ 2 g / (m 2 ⁇ day) at 40 ° C. and 90%. Layers exceeding are not included in the concept of “barrier layer”.
- the gas barrier property of the gas barrier film of the present invention is such that the water vapor permeability (WVTR) at 40 ° C. and 90% is preferably 1 ⁇ 10 ⁇ 3 g / (m 2 ⁇ day) or less, preferably 1 ⁇ 10 ⁇ 4 g / preferably (m 2 ⁇ day) or less, particularly preferably 1 ⁇ 10 -5 g / (m 2 ⁇ day) or less.
- WVTR water vapor permeability
- a plastic film or a plastic sheet is preferably used as the substrate, and a film or sheet made of a colorless and transparent resin is more preferably used.
- the plastic film used is not particularly limited in material, thickness and the like as long as it can hold the first barrier layer, the second barrier layer, and the like, and can be appropriately selected according to the purpose of use.
- Specific examples of the plastic film include polyester resin, methacrylic resin, methacrylic acid-maleic acid copolymer, polystyrene resin, transparent fluororesin, polyimide, fluorinated polyimide resin, polyamide resin, polyamideimide resin, and polyetherimide.
- Resin cellulose acylate resin, polyurethane resin, polyether ether ketone resin, polycarbonate resin, alicyclic polyolefin resin, polyarylate resin, polyether sulfone resin, polysulfone resin, cycloolefin copolymer, fluorene ring modified polycarbonate resin, alicyclic
- thermoplastic resins such as modified polycarbonate resins, fluorene ring-modified polyester resins, and acryloyl compounds.
- the base material is preferably made of a heat resistant material. Specifically, a base material having a linear expansion coefficient of 1 ppm / K or more and 100 ppm / K or less and a glass transition temperature (Tg) of 100 ° C. or more and 500 ° C. or less is used.
- Tg glass transition temperature
- PET polyethylene terephthalate
- PEN polyethylene naphthalate
- PC polycarbonate
- alicyclic polyolefin (for example, ZEONOR (registered trademark) 1600: 160 ° C, manufactured by Nippon Zeon Co., Ltd.), polyarylate (PAr: 210 ° C), polyethersulfone (PES: 220 ° C), polysulfone (PSF: 190 ° C), cycloolefin copolymer (COC: Compound described in JP-A No.
- the gas barrier film according to the present invention is used in combination with, for example, a polarizing plate
- the retardation value of the gas barrier film is important.
- the usage form of the gas barrier film in such an embodiment includes a gas barrier film using a base film having a retardation value of 10 nm or less and a circularly polarizing plate (1 ⁇ 4 wavelength plate + (1 ⁇ 2 wavelength plate) + straight line.
- a polarizing plate is used in combination with a gas polarizing film using a base film having a retardation value of 100 nm to 180 nm, which can be used as a quarter wavelength plate. preferable.
- the substrate is preferably transparent. That is, the light transmittance is usually 80% or more, preferably 85% or more, and more preferably 90% or more.
- the light transmittance is calculated by measuring the total light transmittance and the amount of scattered light using the method described in JIS K7105: 1981, that is, using an integrating sphere light transmittance measuring device, and subtracting the diffuse transmittance from the total light transmittance. can do.
- the thickness of the base material used for the gas barrier film according to the present invention is not particularly limited because it is appropriately selected depending on the application, but is typically 1 to 800 ⁇ m, preferably 10 to 200 ⁇ m.
- These plastic films may have functional layers such as a transparent conductive layer, a primer layer, and a clear hard coat layer.
- As the functional layer in addition to those described above, those described in paragraph numbers “0036” to “0038” of JP-A-2006-289627 can be preferably used.
- the substrate preferably has a high surface smoothness.
- the surface smoothness those having an average surface roughness (Ra) of 2 nm or less are preferable. Although there is no particular lower limit, it is practically 0.01 nm or more. If necessary, both surfaces of the substrate, at least the side on which the barrier layer is provided, may be polished to improve smoothness.
- the above-mentioned base material may be an unstretched film or a stretched film.
- various known treatments for improving adhesion such as corona discharge treatment, flame treatment, oxidation treatment, plasma treatment, and smoothing described later. Layer stacking or the like may be performed, and it is preferable to combine the above treatments as necessary.
- the first barrier layer has a film density of 1.5 to 2.1 g / cm 3 and includes an inorganic compound.
- the method for measuring the film density in the present invention is not particularly limited as long as the film density can be measured. Specifically, a method of calculating from a weight difference before and after the formation of the barrier layer and a film thickness obtained by a method such as an electron microscope; a method of obtaining a film thickness etched with a hydrofluoric acid aqueous solution and a weight difference before and after the etching; Using XRR (X-ray reflectivity method), X-rays are incident on the sample surface at a very shallow angle, the X-ray intensity profile reflected in the incident angle versus the specular direction is measured, and the profile obtained by this measurement is simulated A method for optimizing simulation parameters by comparing with results is known.
- XRR X-ray reflectivity method
- the film density of the first barrier layer is essential to be 1.5 to 2.1 g / cm 3 as a value that causes various problems due to the relatively low film density. It is preferably 1.7 to 2.1 g / cm 3 , more preferably 1.9 to 2.1 g / cm 3 .
- the inorganic compound contained in the first barrier layer is not particularly limited, and examples thereof include metal oxides, metal nitrides, metal carbides, metal oxynitrides, and metal oxycarbides.
- oxides, nitrides, carbides, oxynitrides or oxycarbides containing one or more metals selected from Si, Al, In, Sn, Zn, Ti, Cu, Ce and Ta in terms of gas barrier performance are preferably used, and an oxide, nitride or oxynitride of a metal selected from Si, Al, In, Sn, Zn and Ti is more preferable, and in particular, an oxide of at least one of Si and Al, Nitride or oxynitride is preferred.
- suitable inorganic compounds include composites such as silicon oxide, silicon nitride, silicon oxynitride, silicon carbide, silicon oxycarbide, aluminum oxide, titanium oxide, or aluminum silicate. You may contain another element as a secondary component.
- the content of the inorganic compound contained in the first barrier layer is not particularly limited, but is preferably 50% by weight or more, more preferably 80% by weight or more, and 95% by weight in the first barrier layer. More preferably, it is more preferably 98% by weight or more, and most preferably 100% by weight (that is, the first barrier layer is made of an inorganic compound).
- the first barrier layer contains an inorganic compound and thus has a gas barrier property.
- the gas barrier property of the first barrier layer is calculated using a laminate in which the first barrier layer is formed on the substrate, the water vapor permeability (WVTR) at 40 ° C. and 90% is 5 g / (m 2). ⁇ Day) or less, preferably 0.1 g / (m 2 ⁇ day) or less, more preferably 0.01 g / (m 2 ⁇ day) or less.
- a typical method for forming the first barrier layer according to the present invention is a wet coating method (coating method).
- the first barrier layer may be formed by a dry process as long as the above-described barrier layer having a relatively small film density is obtained.
- a barrier layer formed by a wet coating method is a liquid containing an inorganic compound or a precursor thereof (referred to as “first coating liquid” in this specification) on at least one surface of the substrate.
- the film is formed by modifying a coating film (also referred to as “first coating film” in this specification) formed by applying a coating process.
- the method of forming a coating film by applying a liquid may be referred to as “wet coating method” or “coating method”, but these are all synonymous.
- the film density of the barrier layer (gas barrier layer) formed by modifying the coating film obtained by the wet coating method (coating method) does not exceed 2.1. Is known.
- a coating method for forming the 1st barrier layer based on this invention when using the compound containing silicon as an inorganic compound contained in a 1st barrier layer (It is preferable embodiment in this invention.
- a coating method a case where a coating solution containing a silicon compound as a precursor of an inorganic compound is used as an example will be described below.
- a preferable form for forming the first barrier layer is a sol-gel method using a silicon compound, which will be described later, or a method of forming by modifying polysilazane or polysiloxane (as a precursor of an inorganic compound).
- a method of forming by modifying polysilazane or polysiloxane is more preferable, and a method of forming by modifying polysilazane is most preferable from the viewpoint of excellent barrier performance.
- the silicon compound as the precursor of the inorganic compound contained in the first barrier layer is not particularly limited as long as a coating liquid containing the silicon compound can be prepared.
- perhydropolysilazane organopolysilazane, silsesquioxane, tetramethylsilane, trimethylmethoxysilane, dimethyldimethoxysilane, methyltrimethoxysilane, trimethylethoxysilane, dimethyldiethoxysilane, methyltriethoxysilane, Tetramethoxysilane, tetramethoxysilane, hexamethyldisiloxane, hexamethyldisilazane, 1,1-dimethyl-1-silacyclobutane, trimethylvinylsilane, methoxydimethylvinylsilane, trimethoxyvinylsilane, ethyltrimethoxysilane, dimethyldivinylsilane, dimethyl Ethoxyethynylsilane, diacetoxydimethylsilane, dimethoxymethyl-3,3,3-
- a material made of an inorganic-organic hybrid polymer based on a Si—O—Si— network as disclosed in US Pat. No. 6,503,634 is also preferably used.
- ORMOCER® It was developed for silicate research at the Fraunhofer Institute. These are defined as hydrolytic condensates of organopolysiloxanes or (semi-) metal compounds, especially silicon compounds, which are organic groups bonded to (semi-) metal atoms (organically polymerizable / polymerized) Or those that cannot be polymerized).
- silicon compound other hydrolyzable / hydrolyzed metal compounds (eg, aluminum, boron, germanium, etc.) can be present.
- organically modified polysiloxanes or (hetero-) silicate polycondensates are described in many publications.
- Hybrid Organic-Inorganic Materials MRS Bulletin 26 (5), 364ff (2001) is referred to.
- such materials are usually produced using the so-called sol-gel process, in which hydrolysis-sensitive monomers, or pre-condensed silanes, are optionally further cocondensable materials, for example Hydrolysis and in the presence of boron, germanium, zirconium, or titanium alkoxides, and optionally additional compounds or other additives such as dyes and fillers that can act as modifiers or network promoters.
- the semi-metal- or metal-cation (M) of the copolymerizable material is incorporated into the Si—O—Si— skeleton as a heteroatom, so that Si—O—M— and M—O—M— Binding can occur.
- polysilazane such as perhydropolysilazane and organopolysilazane; polysiloxane such as silsesquioxane, etc. are preferable in terms of film formation, fewer defects such as cracks, and less residual organic matter, and high gas barrier performance.
- Polysilazane is more preferable, and perhydropolysilazane is particularly preferable because the barrier performance is maintained even when bent and under high temperature and high humidity conditions.
- Polysilazane is a polymer having a silicon-nitrogen bond, such as SiO 2 , Si 3 N 4 having a bond such as Si—N, Si—H, or N—H, and ceramics such as both intermediate solid solutions SiO x N y. It is a precursor inorganic polymer.
- the polysilazane preferably has the following structure.
- R 1 , R 2 and R 3 are each independently a hydrogen atom, a substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group. .
- R 1 , R 2 and R 3 may be the same or different.
- examples of the alkyl group include linear, branched or cyclic alkyl groups having 1 to 8 carbon atoms.
- the aryl group include aryl groups having 6 to 30 carbon atoms.
- non-condensed hydrocarbon group such as phenyl group, biphenyl group, terphenyl group; pentarenyl group, indenyl group, naphthyl group, azulenyl group, heptaenyl group, biphenylenyl group, fluorenyl group, acenaphthylenyl group, preadenenyl group , Condensed polycyclic hydrocarbon groups such as acenaphthenyl group, phenalenyl group, phenanthryl group, anthryl group, fluoranthenyl group, acephenanthrenyl group, aceantrirenyl group, triphenylenyl group, pyrenyl group, chrysenyl group, naphthacenyl group, etc.
- non-condensed hydrocarbon group such as phenyl group, biphenyl group, terphenyl group; pentarenyl group, indenyl group, nap
- the (trialkoxysilyl) alkyl group includes an alkyl group having 1 to 8 carbon atoms having a silyl group substituted with an alkoxy group having 1 to 8 carbon atoms. More specific examples include 3- (triethoxysilyl) propyl group and 3- (trimethoxysilyl) propyl group.
- the substituent optionally present in R 1 to R 3 is not particularly limited, and examples thereof include an alkyl group, a halogen atom, a hydroxyl group (—OH), a mercapto group (—SH), a cyano group (—CN), There are a sulfo group (—SO 3 H), a carboxyl group (—COOH), a nitro group (—NO 2 ) and the like. Note that the optionally present substituent is not the same as R 1 to R 3 to be substituted. For example, when R 1 to R 3 are alkyl groups, they are not further substituted with an alkyl group.
- R 1 , R 2 and R 3 are preferably a hydrogen atom, a methyl group, an ethyl group, a propyl group, an isopropyl group, a butyl group, an isobutyl group, a tert-butyl group, a phenyl group, a vinyl group, 3 -(Triethoxysilyl) propyl group or 3- (trimethoxysilylpropyl) group.
- n is an integer
- the polysilazane having the structure represented by the general formula (I) is determined to have a number average molecular weight of 150 to 150,000 g / mol. preferable.
- one of preferred embodiments is perhydropolysilazane in which all of R 1 , R 2 and R 3 are hydrogen atoms.
- polysilazane has a structure represented by the following general formula (II).
- R 1 ′ , R 2 ′ , R 3 ′ , R 4 ′ , R 5 ′ and R 6 ′ are each independently a hydrogen atom, a substituted or unsubstituted alkyl group, An aryl group, a vinyl group or a (trialkoxysilyl) alkyl group.
- R 1 ′ , R 2 ′ , R 3 ′ , R 4 ′ , R 5 ′ and R 6 ′ may be the same or different.
- the substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group in the above is the same as the definition of the general formula (I), and thus the description is omitted.
- n ′ and p are integers, and the polysilazane having the structure represented by the general formula (II) is determined to have a number average molecular weight of 150 to 150,000 g / mol. It is preferred that Note that n ′ and p may be the same or different.
- R 1 ′ , R 3 ′ and R 6 ′ each represent a hydrogen atom, and R 2 ′ , R 4 ′ and R 5 ′ each represent a methyl group;
- R 1 ' , R 3' and R 6 ' each represents a hydrogen atom, R 2' , R 4 ' each represents a methyl group, and R 5' represents a vinyl group;
- R 1 ' , R 3' , R 4 A compound in which ' and R 6' each represent a hydrogen atom and R 2 ' and R 5' each represents a methyl group is preferred.
- polysilazane has a structure represented by the following general formula (III).
- R 1 ′′ , R 2 ′′ , R 3 ′′ , R 4 ′′ , R 5 ′′ , R 6 ′′ , R 7 ′′ , R 8 ′′ and R 9 ′′ are each independently A hydrogen atom, a substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group, wherein R 1 ′′ , R 2 ′′ , R 3 ′′ , R 4 ′′ , R 5 ′′ , R 6 ′′ , R 7 ′′ , R 8 ′′ and R 9 ′′ may be the same or different.
- the substituted or unsubstituted alkyl group, aryl group, vinyl group or (trialkoxysilyl) alkyl group in the above is the same as the definition of the general formula (I), and thus the description is omitted.
- n ′′, p ′′ and q are integers, and the polysilazane having the structure represented by the general formula (III) has a number average molecular weight of 150 to 150,000 g / mol. It is preferable to be determined as follows. Note that n ′′ , p ′′ and q may be the same or different.
- R 1 ′′ , R 3 ′′ and R 6 ′′ each represent a hydrogen atom
- R 2 ′′ , R 4 ′′ , R 5 ′′ and R 8 ′′ each represent a methyl group.
- R 9 ′′ represents a (triethoxysilyl) propyl group
- R 7 ′′ represents an alkyl group or a hydrogen atom.
- the organopolysilazane in which a part of the hydrogen atom part bonded to Si is substituted with an alkyl group or the like has an improved adhesion to the base material as a base by having an alkyl group such as a methyl group and is hard.
- the ceramic film made of brittle polysilazane can be toughened, and there is an advantage that the occurrence of cracks can be suppressed even when the (average) film thickness is increased. For this reason, perhydropolysilazane and organopolysilazane may be selected as appropriate according to the application, and may be used in combination.
- Perhydropolysilazane is presumed to have a linear structure and a ring structure centered on 6- and 8-membered rings.
- the number average molecular weight (Mn) is about 600 to 2000 (polystyrene conversion), and there are liquid or solid substances, and the state varies depending on the molecular weight.
- Polysilazane is commercially available in a solution state dissolved in an organic solvent, and the commercially available product can be used as it is as the first barrier layer forming coating solution.
- Examples of commercially available polysilazane solutions include Aquamica (registered trademark) NN120-10, NN120-20, NAX120-20, NN110, NN310, NN320, NL110A, NL120A, NL120-20, NL150A, and NP110 manufactured by AZ Electronic Materials Co., Ltd. NP140, SP140 and the like.
- polysilazane examples include, but are not limited to, for example, a silicon alkoxide-added polysilazane obtained by reacting the polysilazane with a silicon alkoxide (Japanese Patent Laid-Open No. 5-23827), and a glycidol reaction.
- a silicon alkoxide-added polysilazane obtained by reacting the polysilazane with a silicon alkoxide
- glycidol-added polysilazane Japanese Patent Laid-Open No. 6-122852
- alcohol-added polysilazane obtained by reacting alcohol
- metal carboxylate obtained by reacting metal carboxylate Addition polysilazane (JP-A-6-299118), acetylacetonate complex-added polysilazane obtained by reacting a metal-containing acetylacetonate complex (JP-A-6-306329), metal obtained by adding metal fine particles Fine particle added policy Zhang such (JP-A-7-196986), and a polysilazane ceramic at low temperatures.
- the content of polysilazane in the first barrier layer before the modification treatment may be 100% by weight when the total weight of the first barrier layer is 100% by weight.
- the content of polysilazane in the layer is preferably 10% by weight or more and 99% by weight or less, and 40% by weight or more and 95% by weight or less. More preferably, it is 70 wt% or more and 95 wt% or less.
- the method for forming the first barrier layer by the application method as described above is not particularly limited, and a known method can be applied. However, the first barrier layer formation containing a silicon compound and, if necessary, a catalyst in an organic solvent is possible. It is preferable to apply the coating liquid for coating by a known wet coating method, evaporate and remove the solvent, and then perform a modification treatment.
- the solvent for preparing the first barrier layer-forming coating solution is not particularly limited as long as it can dissolve the silicon compound, but water and reactive groups that easily react with the silicon compound (for example, An organic solvent that does not contain a hydroxyl group or an amine group and is inert to the silicon compound is preferred, and an aprotic organic solvent is more preferred.
- the solvent includes an aprotic solvent; for example, carbon such as aliphatic hydrocarbons, alicyclic hydrocarbons, aromatic hydrocarbons such as pentane, hexane, cyclohexane, toluene, xylene, solvesso, and turben.
- Hydrogen solvents Halogen hydrocarbon solvents such as methylene chloride and trichloroethane; Esters such as ethyl acetate and butyl acetate; Ketones such as acetone and methyl ethyl ketone; Aliphatic ethers such as dibutyl ether, dioxane and tetrahydrofuran; Alicyclic ethers and the like Ethers: Examples include tetrahydrofuran, dibutyl ether, mono- and polyalkylene glycol dialkyl ethers (diglymes), and the like.
- the solvent is selected according to purposes such as the solubility of the silicon compound and the evaporation rate of the solvent, and may be used alone or in the form of a mixture of two or more.
- the concentration of the silicon compound in the first barrier layer-forming coating solution is not particularly limited and varies depending on the film thickness of the layer and the pot life of the coating solution, but is preferably 1 to 80% by weight, more preferably 5 to 50. % By weight, particularly preferably 10 to 40% by weight.
- the first barrier layer forming coating solution preferably contains a catalyst in order to promote reforming.
- a basic catalyst is preferable, and in particular, N, N-diethylethanolamine, N, N-dimethylethanolamine, triethanolamine, triethylamine, 3-morpholinopropylamine, N, N, Amine catalysts such as N ′, N′-tetramethyl-1,3-diaminopropane, N, N, N ′, N′-tetramethyl-1,6-diaminohexane, Pt compounds such as Pt acetylacetonate, propion Examples thereof include metal catalysts such as Pd compounds such as acid Pd, Rh compounds such as Rh acetylacetonate, and N-heterocyclic compounds.
- the concentration of the catalyst added at this time is preferably in the range of 0.1 to 10% by weight, more preferably 0.5 to 7% by weight, based on the silicon compound (Example: 1% by weight). .
- concentration of the catalyst added at this time is preferably in the range of 0.1 to 10% by weight, more preferably 0.5 to 7% by weight, based on the silicon compound (Example: 1% by weight).
- the following additives can be used in the first barrier layer forming coating solution as necessary.
- cellulose ethers, cellulose esters for example, ethyl cellulose, nitrocellulose, cellulose acetate, cellulose acetobutyrate, etc.
- natural resins for example, rubber, rosin resin, etc., synthetic resins
- Aminoplasts especially urea resins, melamine formaldehyde resins, alkyd resins, acrylic resins, polyesters or modified polyesters, epoxides, polyisocyanates or blocked polyisocyanates, polysiloxanes, and the like.
- a sol-gel method can be used for forming the first barrier layer.
- the coating liquid used when forming the modified layer by the sol-gel method preferably contains a silicon compound and at least one of a polyvinyl alcohol-based resin and an ethylene / vinyl alcohol copolymer. Further, the coating liquid preferably contains a sol-gel method catalyst, an acid, water, and an organic solvent. In the sol-gel method, a modified layer is obtained by polycondensation using such a coating solution.
- a silicon compound it is preferable to use an alkoxide (alkoxysilane) represented by the general formula R A O Si (OR B ) p .
- R A and R B each independently represents an alkyl group having 1 to 20 carbon atoms
- O represents an integer of 0 or more
- p represents an integer of 1 or more.
- Specific examples of the alkoxysilane include, for example, tetramethoxysilane (Si (OCH 3 ) 4 ), tetraethoxysilane (Si (OC 2 H 5 ) 4 ), and tetrapropoxysilane (Si (OC 3 H 7 ) 4. ), Tetrabutoxysilane (Si (OC 4 H 9 ) 4 ) and the like can be used.
- the blending ratio of each is, as a weight ratio, polyvinyl alcohol resin: ethylene / vinyl alcohol copolymer.
- the polymer is preferably 10: 0.05 to 10: 6.
- the content of the polyvinyl alcohol-based resin and / or the ethylene / vinyl alcohol copolymer in the coating solution is in the range of 5 to 500 parts by weight with respect to 100 parts by weight of the total amount of the above silicon compounds. It is preferable to prepare at a blending ratio of about 20 to 200 parts by weight.
- the polyvinyl alcohol resin those obtained by saponifying polyvinyl acetate can be generally used.
- polyvinyl alcohol resin examples include partially saponified polyvinyl alcohol resin in which several tens of percent of acetate groups remain, completely saponified polyvinyl alcohol in which acetate groups do not remain, or modified polyvinyl alcohol in which OH groups have been modified. Any of these resins may be used.
- Specific examples of the polyvinyl alcohol-based resin include Kuraray Poval (registered trademark) manufactured by Kuraray Co., Ltd., and Gohsenol (registered trademark) manufactured by Nippon Synthetic Chemical Industry Co., Ltd.
- a saponified product of a copolymer of ethylene and vinyl acetate that is, a product obtained by saponifying an ethylene-vinyl acetate random copolymer should be used.
- Specific examples include partial saponification products in which several tens mol% of acetic acid groups remain to complete saponification products in which acetic acid groups remain only a few mol% or no acetic acid groups remain.
- a saponification degree that is preferably 80 mol% or more, more preferably 90 mol% or more, and still more preferably 95 mol% or more from the viewpoint of gas barrier properties.
- the content of repeating units derived from ethylene in the ethylene / vinyl alcohol copolymer is usually 0 to 50 mol%, preferably 20 to 45 mol%. It is preferable to use one.
- ethylene-vinyl alcohol copolymer include Kuraray Co., Ltd., EVAL (registered trademark) EP-F101 (ethylene content: 32 mol%), Nippon Synthetic Chemical Industry Co., Ltd., Soarnol (registered trademark). D2908 (ethylene content; 29 mol%) and the like can be used.
- the sol-gel catalyst mainly a polycondensation catalyst, a tertiary amine that is substantially insoluble in water and soluble in an organic solvent is used.
- a tertiary amine that is substantially insoluble in water and soluble in an organic solvent is used.
- N, N-dimethylbenzylamine, tripropylamine, tributylamine, tripentylamine, and the like can be used.
- the acid is used as a catalyst for the sol-gel method, mainly as a catalyst for hydrolysis of an alkoxide or a silane coupling agent.
- the acid include mineral acids such as sulfuric acid, hydrochloric acid, and nitric acid, organic acids such as acetic acid and tartaric acid, and the like.
- the coating solution preferably contains water in a proportion of 0.1 to 100 mol, preferably 0.8 to 2 mol, relative to 1 mol of the total molar amount of the alkoxide.
- organic solvent used in the coating solution by the sol-gel method for example, methyl alcohol, ethyl alcohol, n-propyl alcohol, isopropyl alcohol, n-butanol, and the like can be used.
- methyl alcohol, ethyl alcohol, n-propyl alcohol, isopropyl alcohol, n-butanol, and the like can be used.
- ethylene / vinyl alcohol copolymer solubilized in a solvent for example, a commercially available product as Soarnol (registered trademark) can be used.
- Soarnol registered trademark
- a silane coupling agent or the like can be added to the coating solution by the sol-gel method.
- Method for applying first barrier layer forming coating solution As a method for applying the first barrier layer forming coating solution, a conventionally known appropriate wet coating method may be employed. Specific examples include a spin coating method, a roll coating method, a flow coating method, an ink jet method, a spray coating method, a printing method, a dip coating method, a casting film forming method, a bar coating method, and a gravure printing method.
- the coating thickness can be appropriately set according to the purpose.
- the coating thickness per first barrier layer is preferably about 10 nm to 10 ⁇ m after drying, more preferably 15 nm to 1 ⁇ m, and further preferably 20 to 500 nm. Preferred (Example: 150 nm). If the film thickness is 10 nm or more, sufficient barrier properties can be obtained, and if it is 10 ⁇ m or less, stable coating properties can be obtained during layer formation, and high light transmittance can be realized.
- the coating film After applying the coating solution, it is preferable to dry the coating film.
- the organic solvent contained in the coating film can be removed. At this time, all of the organic solvent contained in the coating film may be dried or may be partially left. Even when a part of the organic solvent is left, a suitable first barrier layer can be obtained. The remaining solvent can be removed later.
- the drying temperature of the coating film varies depending on the substrate to be applied, but is preferably 50 to 200 ° C.
- the drying temperature is preferably set to 150 ° C. or lower in consideration of deformation of the base material due to heat.
- the temperature can be set by using a hot plate, oven, furnace or the like.
- the drying time is preferably set to a short time. For example, when the drying temperature is 150 ° C., the drying time is preferably set within 30 minutes.
- the drying atmosphere may be any condition such as an air atmosphere, a nitrogen atmosphere, an argon atmosphere, a vacuum atmosphere, or a reduced pressure atmosphere with a controlled oxygen concentration.
- the coating film obtained by applying the first barrier layer forming coating solution may include a step of removing moisture before or during the modification treatment.
- a method for removing moisture a form of dehumidification while maintaining a low humidity environment is preferable. Since humidity in a low-humidity environment varies depending on temperature, a preferable form is shown for the relationship between temperature and humidity by defining the dew point temperature.
- a preferable dew point temperature is 4 ° C. or lower (temperature 25 ° C./humidity 25%), a more preferable dew point temperature is ⁇ 5 ° C.
- the time for maintaining the dew point temperature of the first barrier layer is It is preferable to set appropriately depending on the film thickness. Under the condition that the film thickness of the first barrier layer is 1.0 ⁇ m or less, it is preferable that the dew point temperature is ⁇ 5 ° C. or less and the maintaining time is 1 minute or more.
- the lower limit of the dew point temperature is not particularly limited, but is usually ⁇ 50 ° C. or higher, and preferably ⁇ 40 ° C. or higher. This is a preferred form from the viewpoint of promoting the dehydration reaction of the first barrier layer converted to silanol by removing water before or during the modification treatment.
- the modification treatment of the first barrier layer formed by the coating method in the present invention refers to a conversion reaction of a silicon compound to silicon oxide, silicon oxynitride, or the like. Specifically, the gas barrier film of the present invention is entirely formed. The process which forms the inorganic thin film of the level which can contribute to expressing gas barrier property as.
- the conversion reaction of the silicon compound to silicon oxide or silicon oxynitride can be applied by appropriately selecting a known method.
- Specific examples of the modification treatment include plasma treatment, ultraviolet irradiation treatment, and heat treatment.
- modification by heat treatment formation of a silicon oxide film or a silicon oxynitride layer by a substitution reaction of a silicon compound requires a high temperature of 450 ° C. or higher, so that it is difficult to adapt to a flexible substrate such as plastic. . For this reason, it is preferable to perform the heat treatment in combination with other reforming treatments.
- a plasma treatment capable of a conversion reaction at a lower temperature or a conversion reaction by ultraviolet irradiation treatment is preferable.
- a known method can be used for the plasma treatment that can be used as the reforming treatment, and an atmospheric pressure plasma treatment or the like can be preferably used.
- the atmospheric pressure plasma CVD method which performs plasma CVD processing near atmospheric pressure, does not need to be reduced in pressure and is more productive than the plasma CVD method under vacuum.
- the film speed is high, and further, under a high pressure condition under atmospheric pressure as compared with the conditions of a normal CVD method, the gas mean free process is very short, so that a very homogeneous film can be obtained.
- nitrogen gas or a gas containing Group 18 atoms of the long-period periodic table specifically helium, neon, argon, krypton, xenon, radon, or the like is used.
- nitrogen, helium, and argon are preferably used, and nitrogen is particularly preferable because of low cost.
- the modification treatment can be efficiently performed by heat-treating the coating film containing the silicon compound in combination with another modification treatment, preferably an excimer irradiation treatment described later.
- a layer is formed using a sol-gel method
- the heating conditions are preferably 50 to 300 ° C., more preferably 70 to 200 ° C., preferably 0.005 to 60 minutes, more preferably 0.01 to 10 minutes. Condensation can be performed to form a first barrier layer.
- the heat treatment for example, a method of heating a coating film by contacting a substrate with a heating element such as a heat block, a method of heating an atmosphere by an external heater such as a resistance wire, an infrared region such as an IR heater
- a heating element such as a heat block
- an external heater such as a resistance wire
- an infrared region such as an IR heater
- the temperature of the coating film during the heat treatment is preferably adjusted appropriately in the range of 50 to 250 ° C, and more preferably in the range of 50 to 120 ° C.
- the heating time is preferably in the range of 1 second to 10 hours, more preferably in the range of 10 seconds to 1 hour.
- UV irradiation treatment As one of the modification treatment methods, treatment by ultraviolet irradiation is preferable. Ozone and active oxygen atoms generated by ultraviolet rays (synonymous with ultraviolet light) have high oxidation ability, and can form silicon oxide films or silicon oxynitride films with high density and insulation at low temperatures It is.
- the base material is heated, and O 2 and H 2 O contributing to ceramicization (silica conversion), an ultraviolet absorber, and polysilazane itself are excited and activated.
- the ceramicization is promoted, and the obtained first barrier layer becomes denser. Irradiation with ultraviolet rays is effective at any time after the formation of the coating film.
- any commonly used ultraviolet ray generator can be used.
- the ultraviolet ray referred to in the present invention generally refers to an electromagnetic wave having a wavelength of 10 to 400 nm, but in the case of an ultraviolet irradiation treatment other than the vacuum ultraviolet ray (10 to 200 nm) treatment described later, it is preferably 210 to 375 nm. Use ultraviolet light.
- the irradiation intensity and the irradiation time are set within a range in which the substrate carrying the first barrier layer to be irradiated is not damaged.
- a 2 kW (80 W / cm ⁇ 25 cm) lamp is used, and the strength of the base material surface is 20 to 300 mW / cm 2 , preferably 50 to 200 mW / cm.
- the distance between the base material and the ultraviolet irradiation lamp is set so as to be 2, and irradiation can be performed for 0.1 seconds to 10 minutes.
- the substrate temperature during ultraviolet irradiation treatment is 150 ° C. or more
- the properties of the substrate are impaired, such as deformation of the substrate or deterioration of its strength.
- a modification treatment at a higher temperature is possible.
- the substrate temperature at the time of ultraviolet irradiation there is no general upper limit for the substrate temperature at the time of ultraviolet irradiation, and it can be appropriately set by those skilled in the art depending on the type of substrate.
- ultraviolet ray generating means examples include metal halide lamps, high pressure mercury lamps, low pressure mercury lamps, xenon arc lamps, carbon arc lamps, and excimer lamps (single wavelengths of 172 nm, 222 nm, and 308 nm, for example, USHIO INC. Manufactured by M.D. Com Co., Ltd.), UV light laser, and the like, but are not particularly limited.
- the ultraviolet rays from the generation source are reflected by the reflector and then applied to the first barrier layer. It is preferable to apply.
- UV irradiation can be applied to both batch processing and continuous processing, and can be appropriately selected depending on the shape of the substrate used.
- the laminated body having the first barrier layer on the surface can be processed in an ultraviolet baking furnace equipped with the above-described ultraviolet ray generation source.
- the ultraviolet baking furnace itself is generally known.
- an ultraviolet baking furnace manufactured by I-Graphics Co., Ltd. can be used.
- the laminated body which has a 1st barrier layer on the surface is a elongate film form, it irradiates an ultraviolet-ray continuously in the drying zone equipped with the above ultraviolet-ray generation sources, conveying this. Can be made into ceramics.
- the time required for the ultraviolet irradiation is generally from 0.1 second to 10 minutes, preferably from 0.5 second to 3 minutes, depending on the base material used and the composition and concentration of the first barrier layer.
- the most preferable modification treatment method is treatment by vacuum ultraviolet irradiation (excimer irradiation treatment).
- the treatment by the vacuum ultraviolet irradiation uses light energy of 100 to 200 nm, preferably light energy of a wavelength of 100 to 180 nm, which is larger than the interatomic bonding force in the polysilazane compound, and bonds atoms with only photons called photon processes.
- This is a method of forming a silicon oxide film at a relatively low temperature (about 200 ° C. or lower) by causing an oxidation reaction with active oxygen or ozone to proceed while cutting directly by action.
- the radiation source in the present invention may be any radiation source that emits light having a wavelength of 100 to 180 nm, but is preferably an excimer radiator having a maximum emission at about 172 nm (eg, Xe excimer lamp), and has an emission line at about 185 nm.
- Excimer radiator having a maximum emission at about 172 nm (eg, Xe excimer lamp)
- the Xe excimer lamp emits ultraviolet light having a short wavelength of 172 nm at a single wavelength, and thus has excellent luminous efficiency. Since this light has a large oxygen absorption coefficient, it can generate radical oxygen atom species and ozone at a high concentration with a very small amount of oxygen.
- the energy of light having a short wavelength of 172 nm has a high ability to dissociate organic bonds. Due to the high energy possessed by the active oxygen, ozone and ultraviolet radiation, the polysilazane coating can be modified in a short time.
- ⁇ Excimer lamps have high light generation efficiency and can be lit with low power.
- light having a long wavelength that causes a temperature increase due to light is not emitted, and energy is irradiated in the ultraviolet region, that is, in a short wavelength, so that the increase in the surface temperature of the target object is suppressed.
- it is suitable for flexible film materials such as PET that are easily affected by heat.
- Oxygen is preferably present in the reaction during UV irradiation.
- vacuum ultraviolet rays are absorbed by oxygen and the efficiency in the ultraviolet irradiation process is likely to be lowered
- the water vapor concentration during the conversion process is preferably in the range of 1000 to 4000 ppm by volume.
- the gas satisfying the irradiation atmosphere used at the time of irradiation with vacuum ultraviolet rays is preferably a dry inert gas, and particularly preferably dry nitrogen gas from the viewpoint of cost.
- the oxygen concentration can be adjusted by measuring the flow rate of oxygen gas and inert gas introduced into the irradiation chamber and changing the flow rate ratio.
- the illuminance of the vacuum ultraviolet light on the coating surface received by the polysilazane coating is preferably 1 mW / cm 2 to 10 W / cm 2 , more preferably 30 mW / cm 2 to 200 mW / cm 2. preferably, further preferably at 50mW / cm 2 ⁇ 160mW / cm 2. If it is less than 1 mW / cm 2, there is a concern that the reforming efficiency is greatly reduced. If it exceeds 10 W / cm 2 , there is a concern that the coating film may be ablated or the substrate may be damaged.
- It irradiation energy amount of the VUV in the coated surface is preferably 10 ⁇ 10000mJ / cm 2, more preferably 100 ⁇ 8000mJ / cm 2, a 200 ⁇ 6000mJ / cm 2 Is more preferable (Example: 6000 mJ / cm 2 ). Is less than 10 mJ / cm 2, there is a fear that the reforming becomes insufficient, 10000 mJ / cm 2 than the cracking or due to excessive modification concerns the thermal deformation of the substrate emerges.
- the vacuum ultraviolet ray used for the modification may be generated by plasma formed of a gas containing at least one of CO, CO 2 and CH 4 .
- the gas containing at least one of CO, CO 2 and CH 4 hereinafter also referred to as carbon-containing gas
- the carbon-containing gas may be used alone, but carbon containing rare gas or H 2 as the main gas. It is preferable to add a small amount of the contained gas. Examples of plasma generation methods include capacitively coupled plasma.
- Si—H bonds and N—H bonds in perhydropolysilazane are cleaved relatively easily by excitation with vacuum ultraviolet irradiation and the like. It is considered that they are recombined as N (a dangling bond of Si may be formed). That is, the cured as SiN y composition without oxidizing. In this case, the polymer main chain is not broken. The breaking of Si—H bonds and N—H bonds is promoted by the presence of a catalyst and heating. The cut H is released out of the membrane as H 2 .
- Adjustment of the composition of the silicon oxynitride of the layer obtained by subjecting the polysilazane-containing layer to vacuum ultraviolet irradiation can be performed by controlling the oxidation state by appropriately combining the oxidation mechanisms (I) to (IV) described above. .
- the SiO absorbance is calculated from the absorption (absorbance) at about 1160 cm ⁇ 1 and the SiN absorbance is about 840 cm ⁇ 1 . It shows that conversion to the ceramic close
- the SiO / SiN ratio which is an index of the degree of conversion to ceramics, is 0.3 or more, preferably 0.5 or more. If it is less than 0.3, the expected gas barrier property may not be obtained.
- a measuring method of silica conversion rate ( x in SiOx) it can measure using XPS method, for example.
- the film composition of the first barrier layer can be measured by measuring the atomic composition ratio using an XPS surface analyzer. It can also be measured by cutting the first barrier layer and measuring the cut surface of the cut surface with an XPS surface analyzer.
- the first barrier layer described above may be a single layer or a laminated structure of two or more layers. At this time, when the first barrier layer has a laminated structure of two or more layers, the first barrier layers may have the same composition or different compositions. Further, when the first barrier layer has a laminated structure of two or more layers, the first barrier layer may be composed only of a layer formed by a vacuum film forming method, or only from a layer formed by a coating method. It may be a combination of a layer formed by a vacuum film forming method and a layer formed by a coating method.
- the first barrier layer preferably contains a nitrogen element or a carbon element from the viewpoint of stress relaxation and absorption of ultraviolet rays used for forming the second barrier layer described later.
- a nitrogen element or a carbon element from the viewpoint of stress relaxation and absorption of ultraviolet rays used for forming the second barrier layer described later.
- the chemical composition of the first barrier layer can be controlled by the type and amount of the silicon compound and the like when forming the first barrier layer, and the conditions when modifying the layer containing the silicon compound.
- the second barrier layer is a layer provided on the top of the first barrier layer or between the base material and the first barrier layer, and is composed of elements of Groups 2 to 14 of the long-period periodic table. At least one element selected from the group (excluding silicon and carbon), a silicon atom and an oxygen atom, and an abundance ratio of oxygen atom to silicon atom (O / Si) of 1.4 to 2 2 and the abundance ratio of nitrogen atoms to silicon atoms (N / Si) is 0 to 0.4.
- the second barrier layer according to the present invention includes at least one element (except silicon and carbon) selected from the group consisting of elements of Groups 2 to 14 of the long-period periodic table (excluding silicon and carbon). It is also characterized in that it is also referred to as “element”.
- additive elements include, for example, beryllium (Be), boron (B), magnesium (Mg), aluminum (Al), calcium (Ca), scandium (Sc), titanium (Ti), vanadium (V), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), zinc (Zn), gallium (Ga), germanium (Ge), strontium (Sr), yttrium (Y), zirconium (Zr), niobium (Nb), molybdenum (Mo), technetium (Tc), ruthenium (Ru), rhodium (Rh), palladium (Pd), silver (Ag), cadmium (Cd), indium (In), tin (Sn), barium (Ba), lanthanum (La), cerium (Ce), praseodymium (Pr), neodymium Nd), promethium (Pm), samarium (S
- boron (B), magnesium (Mg), aluminum (Al), calcium (Ca), titanium (Ti), chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), Copper (Cu), zinc (Zn), gallium (Ga), zirconium (Zr), silver (Ag), and indium (In) are preferable, and boron (B), magnesium (Mg), aluminum (Al), and calcium (Ca ), Titanium (Ti), zinc (Zn), gallium (Ga), germanium (Ge), zirconium (Zr), and indium (In), more preferably boron (B), magnesium (Mg), aluminum (Al), Calcium (Ca), titanium (Ti), zinc (Zn), and zirconium (Zr) are more preferable, and boron (B), magnesium ( g), aluminum (Al), calcium (Ca), iron (Fe), gallium (Ga), and indium (In) are more preferable.
- Boron (B), aluminum (Al), gallium (Ga), and indium (In) Is more preferable, boron (B) and aluminum (Al) are particularly preferable, and aluminum (Al) is most preferable.
- Group 13 elements such as boron (B), aluminum (Al), gallium (Ga), and indium (In) have a trivalent valence, and the valence is insufficient compared to the tetravalent valence of silicon. Therefore, the flexibility of the film is increased. Due to this improvement in flexibility, defects are repaired and the second barrier layer becomes a dense film, and the gas barrier properties are improved.
- the additive element may be present alone or in the form of a mixture of two or more.
- the second barrier layer essentially contains silicon atoms and oxygen atoms in addition to the above-described additive elements, and the abundance ratio of oxygen atoms to silicon atoms (O / Si) is 1.4 to 2.2. Another characteristic is that the abundance ratio of nitrogen atoms to silicon atoms (N / Si) is 0 to 0.4.
- the abundance ratio of oxygen atoms to silicon atoms (O / Si) is 1.4 to 2.2” means that O / Si is 1.4 to 2 as an average of the entire second barrier layer. .2 means.
- the abundance ratio of nitrogen atoms to silicon atoms (N / Si) is 0 to 0.4” means that the average of the entire second barrier layer is N / Si 0 to 0.4. Means.
- the value of O / Si is preferably 1.6 to 2.1.
- a method of controlling the value of O / Si it can be controlled by a modification process described later. For example, when the oxygen concentration during reforming is low, the value of O / Si tends to decrease, and when the oxygen concentration during reforming is high, the value of O / Si tends to increase.
- coating on the resin base material since the water
- the value of N / Si is preferably 0 to 0.3, more preferably 0 to 0.2.
- the value of N / Si tends to be small.
- the value of N / Si tends to increase.
- the O / Si and the N / Si can be measured by the following method. That is, the composition profile of the second barrier layer can be obtained by combining an Ar sputter etching apparatus and X-ray photoelectron spectroscopy (XPS).
- XPS X-ray photoelectron spectroscopy
- the profile distribution in the depth direction can be calculated by film processing by a FIB (focused ion beam) processing apparatus and by obtaining the actual film thickness by TEM (transmission electron microscope) and making it correspond to the XPS result.
- FIB focused ion beam
- the film density of the second barrier layer is preferably 1.5 to 2.5 g / cm 3 .
- the method for forming the second barrier layer is not particularly limited, and any of the dry coating method and the wet coating method described in Non-Patent Document 1 can be used. However, from the viewpoint of improving productivity, the wet coating method is preferably used.
- the second barrier layer is preferably formed by quality treatment.
- the case where the second barrier layer is formed by such a method will be described as an example.
- Polysilazane A specific example of polysilazane is the same as the content described in the section of “First Barrier Layer” above, and thus description thereof is omitted here.
- perhydropolysilazane is particularly preferable from the viewpoints of film forming properties, few defects such as cracks, few residual organic substances, and that barrier performance is maintained even when bent and under high temperature and high humidity conditions. .
- additive compound The kind of additive compound is not particularly limited, and any compound can be used as the additive compound as long as it is a compound containing the above-described additive element.
- gibbsite, sanidine sapphire, aluminum oxide, aluminum hydroxide oxide, aluminum bromide, aluminum twelve boride, aluminum nitrate, muscovite, aluminum hydroxide, lithium aluminum hydride, cedar, spinel, diaspore, HI
- Magnesium compounds include: zinc green coconut, magnesium sulfite, magnesium benzoate, carnalite, magnesium perchlorate, magnesium peroxide, talc, dolomite, olivine, magnesium acetate, magnesium oxide, serpentine, magnesium bromide, nitric acid
- Examples include magnesium, magnesium hydroxide, spinel, ordinary amphibole, ordinary pyroxene, magnesium fluoride, magnesium sulfide, magnesium sulfate, and rhododendron.
- Calcium compounds include: Araleite, Calcium Sulfite, Calcium Benzoate, Egyptian Blue, Calcium Chloride, Calcium Chloride Hydroxide, Calcium Chlorate, Ash Chromium Meteorite, Scheelite, Pumiceite, Wollastonite, Calcium Peroxide, Calcium perphosphate, calcium cyanamide, calcium hypochlorite, calcium cyanide, calcium bromide, calcium biperphosphate, calcium oxalate, calcium bromate, calcium nitrate, calcium hydroxide, hornblende, ordinary pyroxene, Calcium fluoride, fluorapatite, calcium iodide, calcium iodate, johansen pyroxene, calcium sulfide, calcium sulfate, chlorite, chlorite, chlorite, apatite, apatite, calcium phosphate and the like.
- gallium compound examples include gallium oxide (III), gallium hydroxide (III), gallium nitride, gallium arsenide, gallium iodide (III), gallium phosphate, and the like.
- boron compounds include boron oxide, boron tribromide, boron trifluoride, boron triiodide, sodium cyanoborohydride, diborane, boric acid, trimethyl borate, borax, borazine, borane, and boronic acid. It is done.
- germanium compounds include various organic germanium compounds, inorganic germanium compounds, germanium oxide, and the like.
- Examples of the indium compound include indium oxide and indium chloride.
- titanium compounds examples include titanium oxide and titanium chloride.
- zirconium compound examples include zirconium oxide and zirconium chloride.
- Zinc compounds include zinc oxide and zinc chloride.
- an additive element alkyl compound or alkoxide compound is used as the additive compound. It is preferable. Further, an amide compound as an additive element, an imide compound as an additive element, or a hydroxide compound as an additive element may be used.
- the “additive element alkyl compound”, “additive element alkoxide compound”, “additive element amide compound”, “additive element imide compound”, and “additive element hydroxide compound” are respectively added to the additive element. It refers to a compound having at least one alkyl group, alkoxy group, amide group, imide group, or hydroxy group bonded to it. In addition, you may use an additive compound individually or in mixture of 2 or more types. In addition, as the additive compound, a commercially available product or a synthetic product may be used.
- alkyl compounds used as additive compounds alkyl-substituted products of various metals are used.
- trimethylaluminum, triethylaluminum, diisobutylaluminum hydride, diethylzinc, ethylzinc chloride, ethylmagnesium bromide are commercially available. Etc. are preferably used.
- alkoxide compound examples include beryllium (Be), boron (B), magnesium (Mg), aluminum (Al), silicon (Si), calcium (Ca), scandium (Sc), titanium (Ti), vanadium (V), Chromium (Cr), manganese (Mn), iron (Fe), cobalt (Co), nickel (Ni), copper (Cu), zinc (Zn), gallium (Ga), germanium (Ge), strontium (Sr), Yttrium (Y), Zirconium (Zr), Niobium (Nb), Molybdenum (Mo), Technetium (Tc), Ruthenium (Ru), Rhodium (Rh), Palladium (Pd), Silver (Ag), Cadmium (Cd), Indium (In), tin (Sn), barium (Ba), lanthanum (La), cerium (Ce), praseodymium (Pr) , Neodymium (Nd), promethium (Pm), samarium (Sm
- alkoxide compound examples include, for example, beryllium acetylacetonate, trimethyl borate, triethyl borate, tri-n-propyl borate, triisopropyl borate, tri-n-butyl borate, tri-tert-borate Butyl, magnesium ethoxide, magnesium ethoxyethoxide, magnesium methoxyethoxide, magnesium acetylacetonate, aluminum trimethoxide, aluminum triethoxide, aluminum tri n-propoxide, aluminum triisopropoxide, aluminum tri n-butoxide, Aluminum tri-sec-butoxide, aluminum tri-tert-butoxide, aluminum acetylacetonate, acetoalkoxyaluminum diisopropylate, aluminum Ethyl acetoacetate diisopropylate, aluminum ethyl acetoacetate di n-butyrate, aluminum diethyl acetoacetate mono n-buty
- An alkoxide compound having an acetylacetonate group is also preferable.
- the acetylacetonate group is preferable because it has an interaction with the central element of the alkoxide compound due to the carbonyl structure, so that handling is easy. More preferably, a compound having a plurality of alkoxide groups or acetylacetonate groups is more preferable from the viewpoint of reactivity and film composition.
- a central element of alkoxide an element that easily forms a coordinate bond with a nitrogen atom in polysilazane is preferable, and aluminum (Al), iron (Fe), or boron (B) having high Lewis acidity is more preferable.
- More preferred alkoxide compounds are, specifically, triisopropyl borate, aluminum trisec-butoxide, aluminum ethyl acetoacetate diisopropylate, calcium isopropoxide, titanium tetraisopropoxide, gallium isopropoxide, aluminum diisopropoxide. Rate mono sec-butyrate, aluminum ethyl acetoacetate di n-butyrate, or aluminum diethyl acetoacetate mono n-butyrate.
- alkoxide compound a commercially available product or a synthetic product may be used.
- commercially available products include, for example, AMD (aluminum diisopropylate monosec-butyrate), ASBD (aluminum secondary butyrate), ALCH (aluminum ethyl acetoacetate diisopropylate), ALCH-TR (aluminum tris).
- Ethyl acetoacetate Ethyl acetoacetate
- aluminum chelate M aluminum alkyl acetoacetate / diisopropylate
- aluminum chelate D aluminum chelate
- aluminum chelate A W
- AL-M acetoalkoxy aluminum diisopropylate, Ajinomoto Fine Chemical Co., Ltd.
- Moth Chicks series manufactured by Matsumoto Fine Chemical Co., Ltd.
- an alkoxide compound when using an alkoxide compound, it is preferable to mix the said compound with the solution containing polysilazane in inert gas atmosphere. This is to prevent the alkoxide compound from reacting with moisture and oxygen in the air and causing intense oxidation.
- the solvent for preparing the second barrier layer-forming coating solution is not particularly limited as long as it can dissolve the polysilazane and the additive compound, but water and reactive groups that easily react with polysilazane (for example, , A hydroxyl group, an amine group, etc.) and an inert organic solvent with respect to polysilazane is preferred, and an aprotic organic solvent is more preferred.
- the solvent includes an aprotic solvent; for example, carbon such as aliphatic hydrocarbons, alicyclic hydrocarbons, aromatic hydrocarbons such as pentane, hexane, cyclohexane, toluene, xylene, solvesso, and turben.
- an aprotic solvent for example, carbon such as aliphatic hydrocarbons, alicyclic hydrocarbons, aromatic hydrocarbons such as pentane, hexane, cyclohexane, toluene, xylene, solvesso, and turben.
- Hydrogen solvents Halogen hydrocarbon solvents such as methylene chloride and trichloroethane; Esters such as ethyl acetate and butyl acetate; Ketones such as acetone and methyl ethyl ketone; Aliphatic ethers such as dibutyl ether, dioxane and tetrahydrofuran; Alicyclic ethers and the like Ethers: Examples include tetrahydrofuran, dibutyl ether, mono- and polyalkylene glycol dialkyl ethers (diglymes), and the like.
- the said solvent may be used independently or may be used with the form of a 2 or more types of mixture.
- the concentration of polysilazane in the second barrier layer-forming coating solution is not particularly limited and varies depending on the layer thickness and the pot life of the coating solution, but is preferably 1 to 80% by weight, more preferably 5 to 50% by weight. %, Particularly preferably 10 to 40% by weight.
- the amount of the additive compound used in the second barrier layer forming coating solution is preferably 0.01 to 10 times, more preferably 0.06 to 6 times the solid weight of polysilazane.
- the additive element is preferably 1 mol% to 30 mol%, more preferably 5 mol% to 20 mol% with respect to 1 mol of the silicon atom. It is preferable to use an additive compound so as to be in the range. If it is this range, the 2nd barrier layer based on this invention can be obtained efficiently.
- the second barrier layer forming coating solution preferably contains a catalyst in order to promote reforming.
- a basic catalyst is preferable, and in particular, N, N-diethylethanolamine, N, N-dimethylethanolamine, triethanolamine, triethylamine, 3-morpholinopropylamine, N, N, Amine catalysts such as N ′, N′-tetramethyl-1,3-diaminopropane, N, N, N ′, N′-tetramethyl-1,6-diaminohexane, Pt compounds such as Pt acetylacetonate, propion Examples thereof include metal catalysts such as Pd compounds such as acid Pd, Rh compounds such as Rh acetylacetonate, and N-heterocyclic compounds.
- the concentration of the catalyst added at this time is preferably in the range of 0.1 to 10% by weight, more preferably 0.5 to 7% by weight, based on the silicon compound. By setting the amount of the catalyst to be in this range, it is possible to avoid excessive silanol formation due to rapid progress of the reaction, reduction in film density, increase in film defects, and the like.
- the following additives may be used as necessary.
- cellulose ethers, cellulose esters for example, ethyl cellulose, nitrocellulose, cellulose acetate, cellulose acetobutyrate, etc.
- natural resins for example, rubber, rosin resin, etc., synthetic resins
- Aminoplasts especially urea resins, melamine formaldehyde resins, alkyd resins, acrylic resins, polyesters or modified polyesters, epoxides, polyisocyanates or blocked polyisocyanates, polysiloxanes, and the like.
- Method for applying second barrier layer forming coating solution As a method of applying the second barrier layer forming coating solution, a conventionally known appropriate wet coating method may be employed. Specific examples include a spin coating method, a roll coating method, a flow coating method, an ink jet method, a spray coating method, a printing method, a dip coating method, a casting film forming method, a bar coating method, and a gravure printing method.
- the coating thickness can be appropriately set according to the purpose.
- the coating thickness per second barrier layer is preferably about 1 nm to 10 ⁇ m after drying, more preferably 10 nm to 1 ⁇ m, and further preferably 20 to 500 nm. preferable. If the film thickness is 1 nm or more, sufficient barrier properties can be obtained, and if it is 10 ⁇ m or less, stable coating properties can be obtained at the time of layer formation, and high light transmittance can be realized.
- the method for removing moisture from the coating film obtained by applying the second barrier layer forming coating solution is the same as that described in the section of “First Barrier Layer”. Description is omitted.
- the solvent contained in the coating film is removed by evaporation, and then ultraviolet rays, electron beams, X-rays, ⁇ rays, ⁇
- a method of carrying out the modification treatment by irradiating active energy rays such as rays, ⁇ rays and neutron rays is preferable.
- active energy rays such as rays, ⁇ rays and neutron rays
- irradiation treatment with ultraviolet rays particularly vacuum ultraviolet rays
- the illuminance of the vacuum ultraviolet light on the surface of the coating film formed from the second barrier layer forming coating solution is preferably 1 mW / cm 2 to 10 W / cm 2 , and preferably 30 mW / cm 2. more preferably from ⁇ 200mW / cm 2, further preferably at 50mW / cm 2 ⁇ 160mW / cm 2. If it is less than 1 mW / cm 2, there is a concern that the reforming efficiency is greatly reduced. If it exceeds 10 W / cm 2 , there is a concern that the coating film may be ablated or the substrate may be damaged.
- the irradiation energy amount (irradiation amount) of vacuum ultraviolet rays on the coating film surface formed from the second barrier layer forming coating solution is preferably 10 to 10000 mJ / cm 2 , and preferably 100 to 8000 mJ / cm 2 . More preferably, it is 200 to 6000 mJ / cm 2 . If 10 mJ / cm 2 or more sufficient modification is made, possibility of thermal deformation of the cracks and the substrate due to excessive modification is reduced if 10000 mJ / cm 2 or less.
- the method for modifying the coating film for forming the second barrier layer is not limited to the ultraviolet irradiation treatment described above.
- a heat treatment at 40 ° C. or higher, an infrared heat treatment, A reforming treatment such as a wet heat treatment of 80% or more, an oxidation treatment with oxygen, or an electron beam treatment can be used as well.
- the second barrier layer described above may be a single layer or a laminated structure of two or more layers. At this time, when the second barrier layer has a laminated structure of two or more layers, each second barrier layer may have the same composition or a different composition as long as the above conditions are satisfied.
- the gas barrier film of the present invention may have an intermediate layer between the first barrier layer and the second barrier layer for the purpose of stress relaxation and the like.
- a method of forming the intermediate layer a method of forming a polysiloxane modified layer can be applied.
- a coating liquid containing polysiloxane is applied on the first barrier layer by a wet coating method and dried, and then the coating film obtained by drying is irradiated with vacuum ultraviolet rays to obtain an intermediate.
- a method of forming a layer is a method of forming a layer.
- the coating solution used for forming the intermediate layer preferably contains polysiloxane and an organic solvent.
- the polysiloxane applicable to the formation of the intermediate layer is not particularly limited, but an organopolysiloxane represented by the following general formula (6) is particularly preferable.
- organopolysiloxane represented by the following general formula (IV) will be described as an example of polysiloxane.
- R 8 to R 13 each independently represents an organic group having 1 to 8 carbon atoms. At this time, at least one of R 8 to R 13 is an alkoxy group or a hydroxyl group. M is an integer of 1 or more.
- Examples of the organic group having 1 to 8 carbon atoms represented by R 8 to R 13 include halogenated alkyl groups such as ⁇ -chloropropyl group and 3,3,3-trifluoropropyl group, vinyl groups, and phenyl groups.
- (Meth) acrylic acid ester groups such as ⁇ -methacryloxypropyl group, epoxy-containing alkyl groups such as ⁇ -glycidoxypropyl group, mercapto-containing alkyl groups such as ⁇ -mercaptopropyl group, ⁇ -aminopropyl group, etc.
- Isocyanate-containing alkyl groups such as aminoalkyl groups and ⁇ -isocyanatopropyl groups, linear or branched alkyl groups such as methyl groups, ethyl groups, n-propyl groups and isopropyl groups, alicyclic groups such as cyclohexyl groups and cyclopentyl groups Linear or branched alkyl such as alkyl group, methoxy group, ethoxy group, n-propoxy group, isopropoxy group Alkoxy group, an acetyl group, a propionyl group, a butyryl group, valeryl group, an acyl group such as caproyl group, and a hydroxyl group.
- an organopolysiloxane having m of 1 or more and a polystyrene equivalent weight average molecular weight of 1,000 to 20,000 is particularly preferred. If the weight average molecular weight in terms of polystyrene of the organopolysiloxane is 1,000 or more, the protective layer to be formed is hardly cracked, and water vapor barrier properties can be maintained. The intermediate layer is sufficiently cured, so that a sufficient hardness can be obtained as a protective layer.
- examples of the organic solvent applicable to the formation of the intermediate layer include alcohol solvents, ketone solvents, amide solvents, ester solvents, aprotic solvents, and the like.
- alcohol solvents are preferable among the above organic solvents.
- Examples of the coating method for the coating liquid for forming the intermediate layer include spin coating, dipping, roller blade, and spraying.
- the thickness of the intermediate layer formed by the coating liquid for forming the intermediate layer is preferably in the range of 100 nm to 10 ⁇ m. If the thickness of the intermediate layer is 100 nm or more, gas barrier properties under high temperature and high humidity can be ensured. Moreover, if the thickness of the intermediate layer is 10 ⁇ m or less, stable coating properties can be obtained when forming the intermediate layer, and high light transmittance can be realized.
- the intermediate layer generally has a film density of 0.35 to 1.2 g / cm 3 , preferably 0.4 to 1.1 g / cm 3 , more preferably 0.5 to 1.0 g / cm 3. It is. If the film density is 0.35 g / cm 3 or more, sufficient mechanical strength of the coating film can be obtained.
- the intermediate layer in the present invention is obtained by applying a coating solution containing polysiloxane onto the first barrier layer by a wet coating method and drying it, and then irradiating the dried coating film (polysiloxane coating film) with vacuum ultraviolet rays. By forming.
- the vacuum ultraviolet ray used for forming the intermediate layer As the vacuum ultraviolet ray used for forming the intermediate layer, the vacuum ultraviolet ray by the vacuum ultraviolet ray irradiation treatment similar to that described in the formation of the barrier layer can be applied.
- a protective layer containing an organic compound may be provided on the uppermost barrier layer.
- an organic resin such as an organic monomer, oligomer or polymer, or an organic-inorganic composite resin layer using a siloxane or silsesquioxane monomer, oligomer or polymer having an organic group is preferably used.
- These organic resins or organic-inorganic composite resins preferably have a polymerizable group or a crosslinkable group, contain these organic resins or organic-inorganic composite resins, and contain a polymerization initiator, a crosslinking agent, etc. as necessary.
- the “crosslinkable group” is a group that can crosslink the binder polymer by a chemical reaction that occurs during light irradiation treatment or heat treatment.
- the chemical structure is not particularly limited as long as it is a group having such a function.
- the functional group capable of addition polymerization include cyclic ether groups such as an ethylenically unsaturated group and an epoxy group / oxetanyl group.
- the functional group which can become a radical by light irradiation may be sufficient, and as such a crosslinkable group, a thiol group, a halogen atom, an onium salt structure etc. are mentioned, for example.
- ethylenically unsaturated groups are preferable, and include functional groups described in paragraphs “0130” to “0139” of JP-A No. 2007-17948.
- the protective layer can contain an inorganic material. Inclusion of an inorganic material generally leads to an increase in the elastic modulus of the protective layer.
- the elastic modulus of the protective layer can be adjusted to a desired value by appropriately adjusting the content ratio of the inorganic material.
- inorganic fine particles having a number average particle diameter of 1 to 200 nm are preferable, and inorganic fine particles having a number average particle diameter of 3 to 100 nm are more preferable.
- inorganic fine particles metal oxides are preferable from the viewpoint of transparency.
- inorganic fine particle dispersions In order to obtain a dispersion of inorganic fine particles, it may be prepared according to known techniques, but commercially available inorganic fine particle dispersions can also be preferably used.
- the protective layer can be cured by irradiation with the above excimer lamp.
- the protective layer is preferably cured by irradiation with an excimer lamp.
- an alkoxy-modified polysiloxane coating film was formed on the coating film obtained from the outermost barrier layer forming coating solution, and vacuum ultraviolet rays were irradiated thereon.
- the alkoxy-modified polysiloxane coating film serves as a protective layer, and further, the lower coating film can be modified, and a second barrier layer that is superior in gas barrier performance and durability can be obtained.
- a method for forming the protective layer a method of forming using the polysiloxane of the intermediate layer can be applied.
- the gas barrier film of the present invention may have a desiccant layer (moisture adsorption layer).
- the material used for the desiccant layer include calcium oxide and organometallic oxide.
- calcium oxide what was disperse
- the organic metal oxide OleDry (registered trademark) series manufactured by Futaba Electronics Co., Ltd. or the like can be used.
- the gas barrier film of the present invention may have a smooth layer (underlying layer, primer layer) between the surface of the base material having the barrier layer, preferably between the base material and the barrier layer adjacent to the base material.
- the smooth layer is provided in order to flatten the rough surface of the substrate on which the protrusions and the like exist, or to fill the unevenness and pinholes generated in the barrier layer with the protrusions on the substrate and to flatten the surface.
- Such a smooth layer may be formed of any material, but preferably includes a carbon-containing polymer, and more preferably includes a carbon-containing polymer. That is, it is preferable that the gas barrier film of the present invention further has a smooth layer containing a carbon-containing polymer between the substrate and the first barrier layer.
- the smooth layer also contains a carbon-containing polymer, preferably a curable resin.
- the curable resin is not particularly limited, and the active energy ray curable resin or the thermosetting material obtained by irradiating the active energy ray curable material or the like with an active energy ray such as an ultraviolet ray to be cured is heated. And thermosetting resins obtained by curing. These curable resins may be used alone or in combination of two or more.
- Examples of the active energy ray-curable material used for forming the smooth layer include a composition containing an acrylate compound, a composition containing an acrylate compound and a mercapto compound containing a thiol group, epoxy acrylate, urethane acrylate, and polyester.
- Examples include compositions containing polyfunctional acrylate monomers such as acrylates, polyether acrylates, polyethylene glycol acrylates, and glycerol methacrylates.
- an organic / inorganic hybrid hard coat material OPSTAR (registered trademark) series compound formed by bonding an organic compound having a polymerizable unsaturated group to silica fine particles
- JSR Corporation ultraviolet curable material manufactured by JSR Corporation.
- Examples of reactive monomers having at least one photopolymerizable unsaturated bond in the molecule include methyl acrylate, ethyl acrylate, n-propyl acrylate, isopropyl acrylate, n-butyl acrylate, isobutyl acrylate, tert-butyl acrylate, and n-pentyl.
- composition containing the active energy ray-curable material contains a photopolymerization initiator.
- photopolymerization initiator examples include benzophenone, methyl o-benzoylbenzoate, 4,4-bis (dimethylamine) benzophenone, 4,4-bis (diethylamine) benzophenone, ⁇ -amino acetophenone, 4,4-dichloro Benzophenone, 4-benzoyl-4-methyldiphenyl ketone, dibenzyl ketone, fluorenone, 2,2-diethoxyacetophenone, 2,2-dimethoxy-2-phenylacetophenone, 2-hydroxy-2-methylpropiophenone, p- tert-Butyldichloroacetophenone, thioxanthone, 2-methylthioxanthone, 2-chlorothioxanthone, 2-isopropylthioxanthone, diethylthioxanthone, benzyldimethyl ketal, benzylmethoxyethyl acetal, benzo Methyl ether
- thermosetting materials include TutProm Series (Organic Polysilazane) manufactured by Clariant, SP COAT heat-resistant clear paint manufactured by Ceramic Coat, Nanohybrid Silicone manufactured by Adeka, Unicom manufactured by DIC, Inc. Dick (registered trademark) V-8000 series, EPICLON (registered trademark) EXA-4710 (ultra-high heat resistant epoxy resin), silicon resin X-12-2400 (trade name) manufactured by Shin-Etsu Chemical Co., Ltd., Nittobo Co., Ltd.
- thermosetting urethane resin consisting of acrylic polyol and isocyanate prepolymer, phenol resin, urea melamine resin, epoxy resin, unsaturated polyester resin, silicone resin, polyamidoamine-epichlorohydrin Butter, and the like can be mentioned.
- the method for forming the smooth layer is not particularly limited, but a coating solution containing a curable material is applied to a spin coating method, a spray method, a blade coating method, a dipping method, a gravure printing method, or a dry coating method such as a vapor deposition method.
- a coating solution containing a curable material is applied to a spin coating method, a spray method, a blade coating method, a dipping method, a gravure printing method, or a dry coating method such as a vapor deposition method.
- active energy rays such as visible light, infrared rays, ultraviolet rays, X-rays, ⁇ rays, ⁇ rays, ⁇ rays, electron beams, and / or heating.
- a method of forming by curing is preferred.
- an ultra-high pressure mercury lamp, a high-pressure mercury lamp, a low-pressure mercury lamp, a carbon arc, a metal halide lamp or the like is preferably used to irradiate ultraviolet rays in a wavelength region of 100 to 400 nm, more preferably 200 to 400 nm.
- a method of irradiating an electron beam having a wavelength region of 100 nm or less emitted from a scanning or curtain type electron beam accelerator can be used.
- Solvents used when forming a smooth layer using a coating solution in which a curable material is dissolved or dispersed in a solvent include alcohols such as methanol, ethanol, n-propyl alcohol, isopropyl alcohol, ethylene glycol, and propylene glycol Terpenes such as ⁇ - or ⁇ -terpineol, etc., ketones such as acetone, methyl ethyl ketone, cyclohexanone, N-methyl-2-pyrrolidone, diethyl ketone, 2-heptanone, 4-heptanone, toluene, xylene, tetramethylbenzene, etc.
- alcohols such as methanol, ethanol, n-propyl alcohol, isopropyl alcohol, ethylene glycol, and propylene glycol Terpenes such as ⁇ - or ⁇ -terpineol, etc.
- ketones such as acetone, methyl ethyl ketone
- the smooth layer can contain additives such as a thermoplastic resin, an antioxidant, an ultraviolet absorber, and a plasticizer, if necessary, in addition to the above-described materials.
- an appropriate resin or additive may be used for improving the film formability and preventing the occurrence of pinholes in the film.
- the thermoplastic resin include cellulose derivatives such as acetylcellulose, nitrocellulose, acetylbutylcellulose, ethylcellulose and methylcellulose, vinyl acetate and copolymers thereof, vinyl chloride and copolymers thereof, vinylidene chloride and copolymers thereof and the like.
- Examples include resins, acetal resins such as polyvinyl formal and polyvinyl butyral, acrylic resins and copolymers thereof, acrylic resins such as methacrylic resins and copolymers thereof, polystyrene resins, polyamide resins, linear polyester resins, and polycarbonate resins.
- the smoothness of the smooth layer is a value expressed by the surface roughness specified in JIS B 0601: 2001, and the maximum cross-sectional height Rt (p) is preferably 10 nm or more and 30 nm or less.
- the surface roughness is calculated from an uneven cross-sectional curve continuously measured by an AFM (atomic force microscope) with a detector having a stylus having a minimum tip radius, and the measurement direction is several tens of times with a stylus having a minimum tip radius. It is the roughness related to the amplitude of fine irregularities measured in a section of ⁇ m many times.
- AFM atomic force microscope
- the thickness of the smooth layer is not particularly limited, but is preferably in the range of 0.1 to 10 ⁇ m.
- an anchor coat layer may be formed as an easy-adhesion layer for the purpose of improving adhesion (adhesion).
- the anchor coat agent used in this anchor coat layer include polyester resin, isocyanate resin, urethane resin, acrylic resin, ethylene / vinyl alcohol resin, vinyl-modified resin, epoxy resin, modified styrene resin, modified silicon resin, and alkyl titanate. Can be used alone or in combination of two or more.
- a commercially available product may be used as the anchor coating agent. Specifically, a siloxane-based UV curable polymer solution (manufactured by Shin-Etsu Chemical Co., Ltd., “X-12-2400” in 3% isopropyl alcohol) can be used.
- the above-mentioned anchor coating agent is coated on a substrate by a known method such as roll coating, gravure coating, knife coating, dip coating, spray coating, and the like, and is coated by drying and removing the solvent, diluent, etc. Can do.
- the application amount of the anchor coating agent is preferably about 0.1 to 5 g / m 2 (dry state).
- a commercially available base material with an easy-adhesion layer may be used.
- the anchor coat layer can be formed by a vapor phase method such as physical vapor deposition or chemical vapor deposition.
- a vapor phase method such as physical vapor deposition or chemical vapor deposition.
- an inorganic film mainly composed of silicon oxide can be formed for the purpose of improving adhesion and the like.
- the thickness of the anchor coat layer is not particularly limited, but is preferably about 0.5 to 10.0 ⁇ m.
- the gas barrier film of the present invention can further have a bleed-out preventing layer.
- the bleed-out prevention layer has a smooth layer for the purpose of suppressing a phenomenon in which unreacted oligomers and the like migrate from the base material to the surface when the film having the smooth layer is heated to contaminate the contact surface.
- the bleed-out prevention layer may basically have the same configuration as the smooth layer as long as it has this function.
- Compounds that can be included in the bleed-out prevention layer include polyunsaturated organic compounds having two or more polymerizable unsaturated groups in the molecule, or one polymerizable unsaturated group in the molecule.
- Hard coat agents such as unitary unsaturated organic compounds can be mentioned.
- the polyunsaturated organic compound for example, ethylene glycol di (meth) acrylate, diethylene glycol di (meth) acrylate, glycerol di (meth) acrylate, glycerol tri (meth) acrylate, 1,4-butanediol di (Meth) acrylate, 1,6-hexanediol di (meth) acrylate, neopentyl glycol di (meth) acrylate, trimethylolpropane tri (meth) acrylate, dicyclopentanyl di (meth) acrylate, pentaerythritol tri (meth) ) Acrylate, pentaerythritol tetra (meth) acrylate, dipentaerythritol hexa (meth) acrylate, dipentaerythritol monohydroxypenta (meth) acrylate, ditrimethylolprop Tetra (meth) acrylate, di
- Examples of monounsaturated organic compounds include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, 2-ethylhexyl (meth) acrylate, isodecyl (meth) acrylate, and lauryl.
- Matting agents may be added as other additives.
- the matting agent inorganic particles having an average particle diameter of about 0.1 to 5 ⁇ m are preferable.
- the bleed-out prevention layer as described above is prepared as a coating solution by blending a hard coat agent and other components as necessary, and appropriately using a diluting solvent as necessary.
- After coating by a conventionally known coating method it can be formed by irradiating with ionizing radiation and curing.
- ionizing radiation ultraviolet rays having a wavelength range of 100 to 400 nm, preferably 200 to 400 nm, emitted from an ultrahigh pressure mercury lamp, a high pressure mercury lamp, a low pressure mercury lamp, a carbon arc, a metal halide lamp, or the like are irradiated or scanned.
- the irradiation can be performed by irradiating an electron beam having a wavelength region of 100 nm or less emitted from a type or curtain type electron beam accelerator.
- the thickness of the bleed-out prevention layer is preferably 1 to 10 ⁇ m, and more preferably 2 to 7 ⁇ m. By making it 1 ⁇ m or more, it becomes easy to make the heat resistance as a film sufficient, and by making it 10 ⁇ m or less, it becomes easy to adjust the balance of the optical properties of the smooth film, and the smooth layer is one of the transparent polymer films. When it is provided on this surface, curling of the barrier film can be easily suppressed.
- the gas barrier film of the present invention can be continuously produced and wound into a roll form (so-called roll-to-roll production). In that case, it is preferable to stick and wind up a protective sheet on the surface in which the barrier layer was formed.
- a protective sheet is applied in a place with a high degree of cleanliness. It is very effective to prevent the adhesion of dust. In addition, it is effective for preventing scratches on the surface of the barrier layer that enters during winding.
- the protective sheet is not particularly limited, and general “protective sheet” and “release sheet” having a configuration in which a weakly adhesive layer is provided on a resin substrate having a thickness of about 100 ⁇ m can be used.
- the gas barrier film of the present invention can be preferably used for a device whose performance is deteriorated by chemical components (oxygen, water, nitrogen oxide, sulfur oxide, ozone, etc.) in the air.
- the device include electronic devices such as an organic EL element, a liquid crystal display element (LCD), a thin film transistor, a touch panel, electronic paper, and a solar cell (PV). From the viewpoint that the effect of the present invention can be obtained more efficiently, it is preferably used for an organic EL device or a solar cell, and particularly preferably used for an organic EL device.
- the gas barrier film of the present invention can also be used for device film sealing. That is, it is a method of providing the gas barrier film of the present invention on the surface of the device itself as a support (base material).
- the device may be covered with a protective layer before providing the gas barrier film.
- the gas barrier film of the present invention can also be used as a device substrate or a film for sealing by a solid sealing method.
- the solid sealing method is a method in which after a protective layer is formed on a device, an adhesive layer and a gas barrier film are stacked and cured.
- an adhesive agent A thermosetting epoxy resin, a photocurable acrylate resin, etc. are illustrated.
- Organic EL device Examples of organic EL elements using a gas barrier film are described in detail in JP-A-2007-30387.
- the reflective liquid crystal display device has a configuration including a lower substrate, a reflective electrode, a lower alignment film, a liquid crystal layer, an upper alignment film, a transparent electrode, an upper substrate, a ⁇ / 4 plate, and a polarizing film in order from the bottom.
- the gas barrier film in the present invention can be used as the transparent electrode substrate and the upper substrate. In the case of color display, it is preferable to further provide a color filter layer between the reflective electrode and the lower alignment film, or between the upper alignment film and the transparent electrode.
- the transmissive liquid crystal display device includes, in order from the bottom, a backlight, a polarizing plate, a ⁇ / 4 plate, a lower transparent electrode, a lower alignment film, a liquid crystal layer, an upper alignment film, an upper transparent electrode, an upper substrate, a ⁇ / 4 plate, and a polarization It has a structure consisting of a film. In the case of color display, it is preferable to further provide a color filter layer between the lower transparent electrode and the lower alignment film, or between the upper alignment film and the transparent electrode.
- the type of the liquid crystal cell is not particularly limited, but more preferably, a TN type (Twisted Nematic), an STN type (Super Twisted Nematic), a HAN type (Hybrid Aligned Nematic), a VA type (Vertical Alignment Electric), an EC type, a Bt type OCB type (Optically Compensated Bend), IPS type (In-Plane Switching), and CPA type (Continuous Pinwheel Alignment) are preferable.
- a TN type Transmission Nematic
- STN type Super Twisted Nematic
- HAN type Hybrid Aligned Nematic
- VA type Very Alignment Electric
- an EC type a Bt type OCB type (Optically Compensated Bend)
- IPS type In-Plane Switching
- CPA type Continuous Pinwheel Alignment
- the gas barrier film of the present invention can also be used as a sealing film for organic photoelectric conversion elements such as solar cells.
- the gas barrier film of the present invention is preferably sealed so that the barrier layer is closer to the organic photoelectric conversion element such as a solar cell.
- the solar cell (organic photoelectric conversion element) in which the gas barrier film of the present invention is preferably used is not particularly limited.
- a single crystal silicon solar cell element a polycrystalline silicon solar cell element, a single junction type, or Amorphous silicon solar cell elements composed of tandem structure type, III-V compound semiconductor solar cell elements such as gallium arsenide (GaAs) and indium phosphorus (InP), II-VI group compounds such as cadmium tellurium (CdTe)
- III-V compound semiconductor solar cell elements such as gallium arsenide (GaAs) and indium phosphorus (InP), II-VI group compounds such as cadmium tellurium (CdTe)
- Semiconductor solar cell element copper / indium / selenium system (so-called CIS system), copper / indium / gallium / selenium system (so-called CIGS system), copper / indium / gallium / selenium / sulfur system (so-called CIGSS system), etc.
- the solar cell element is a copper / indium / selenium system (so-called CIS system), a copper / indium / gallium / selenium system (so-called CIGS system), copper / indium / gallium / selenium / sulfur.
- CIS system copper / indium / selenium system
- CIGS system copper / indium / gallium / selenium system
- CIGSS system group I-III-VI compound semiconductor solar cell element such as a system
- the gas barrier film of the present invention can also be used as an optical member.
- the optical member include a circularly polarizing plate.
- a circularly polarizing plate can be produced by laminating a ⁇ / 4 plate and a polarizing plate using the gas barrier film in the present invention as a substrate. In this case, the lamination is performed so that the angle formed by the slow axis of the ⁇ / 4 plate and the absorption axis of the polarizing plate is 45 °.
- a polarizing plate one that is stretched in a direction of 45 ° with respect to the longitudinal direction (MD) is preferably used.
- MD longitudinal direction
- those described in JP-A-2002-865554 can be suitably used. .
- Example 1 (gas barrier film) ⁇ Production of gas barrier film >> In the following procedure, a barrier layer (1), a barrier layer (2), and, if necessary, a barrier layer (3) are formed on a substrate. 101 to 146 were produced. Details of each sample are shown in Table 1 below.
- PET film Lumirror registered trademark
- U34 thickness 100 ⁇ m
- barrier layer (1) any one of the following formulations 1-1 to 1-8 was employed.
- Formula 1-1 (Solgel-Si 100 ° C.) A coating solution comprising 50 mol% tetramethoxysilane, 45 mol% 3-glycidoxypropyltrimethoxysilane and 5 mol% 3-aminopropyltriethoxysilane was modified on one surface of the substrate. as the film thickness after quality processing is 1 [mu] m, was applied at a coating speed of 2m / min using an extrusion coater, and then dried and reforming treatment 30min at 1min, 100 ° C. at 80 °C, SiO 2 C 0 A barrier layer (1) having a composition of .1 was formed. The film density measured using XRR (M03XHF MXP3, manufactured by Mac Science) was 1.43 [g / cm 3 ].
- Formula 1-2 (Sol-Gel-Si 130 ° C.)
- the final drying was changed to 130 ° C. for 30 min to form a barrier layer (1) having a composition of SiO 2 C 0.1 .
- the film density measured using XRR was 1.53 [g / cm 3 ].
- Formula 1-3 (Solgel-Si 150 ° C.)
- the final drying was changed to 150 ° C. for 30 min to form a barrier layer (1) having a composition of SiO 2 C 0.1 .
- the film density measured using XRR was 1.72 [g / cm 3 ].
- Formula 1-4 (Solgel-Al 130 ° C.) On one surface of the substrate, 40 mol% tetramethoxysilane, 12.5 mol% trisecondary butoxyaluminum, 32.5 mol% 3-glycidoxypropyltrimethoxysilane, 10 mol% tetra A coating solution consisting of propoxyzirconium and 5 mol% 3-aminopropyltriethoxysilane was applied at a coating speed of 2 m / min using an extrusion coater so that the film thickness after the modification treatment was 1 ⁇ m, and the coating solution was 80 ° C.
- the barrier layer (1) having a composition of SiAl 0.1 O 2 C 0.1 was formed by performing drying and reforming treatment for 1 min at 130 ° C. for 30 min at 130 ° C.
- the film density measured using XRR was 1.55 [g / cm 3 ].
- NAX120-20 NAX120-20
- 5 parts by weight of dibutyl ether are mixed using an extrusion coater so that the film thickness after modification is 250 nm. / Min, and after drying at 80 ° C. for 1 min, oxygen
- the 172nm vacuum ultraviolet rays under a nitrogen atmosphere was adjusted to degrees of 0.1% to 0.01% as irradiated so that the amount of 3J / cm 2, a barrier layer having a composition of SiAl 0.1 O 2.1 (1) was formed.
- the film density measured using XRR was 1.95 [g / cm 3 ].
- a dibutyl ether solution (NN120-20 manufactured by AZ Electronic Materials Co., Ltd.) containing 20% by mass of non-catalytic perhydropolysilazane, N, N, N ′, 1 part by weight of a dibutyl ether solution (NAX120-20 manufactured by AZ Electronic Materials Co., Ltd.) containing 1% by mass of N′-tetramethyl-1,6-diaminohexane and 19% by mass of perhydropolysilazane, and 5% by weight of dibutyl ether
- the polysilazane-containing coating solution in which the parts were mixed was applied at a coating speed of 2 m / min using an extrusion coater so that the film thickness after modification was 250 nm, dried at 80 ° C. for 1 min, and then 120 ° C. for 30 min in the atmosphere. heating to form a barrier layer
- a polysilazane-containing coating solution was applied, dried at 80 ° C. for 1 min, and then subjected to 172 nm vacuum ultraviolet light at 3 J / cm 2 in a nitrogen atmosphere adjusted to an oxygen concentration of 0.1% to 0.01%
- the barrier layer (1) having a composition of SiO 1.1 N 0.4 was formed by irradiating with a light amount.
- the film density measured using XRR was 1.91 [g / cm 3 ].
- the amount of irradiation with vacuum ultraviolet rays was changed to 6 J, and a barrier layer (1) having a composition of SiO 1.1 N 0.4 was formed.
- the film density measured using XRR was 2.02 [g / cm 3 ].
- ⁇ Barrier layer (2)> As the barrier layer (2), any one of the following formulations 2-1 to 2-16 was employed.
- Formulation 2-1 (Solgel-Si 130 ° C.) Coating comprising 50 mol% tetramethoxysilane, 45 mol% 3-glycidoxypropyltrimethoxysilane and 5 mol% 3-aminopropyltriethoxysilane on the surface of the barrier layer (1) produced above.
- the liquid was applied at a coating speed of 2 m / min using an extrusion coater so that the film thickness after the reforming treatment was 1 ⁇ m, and dried and reformed at 80 ° C. for 1 min and 130 ° C. for 30 min.
- a barrier layer (2) having a composition of SiO 2 C 0.1 was formed.
- the film density measured using XRR was 1.53 [g / cm 3 ].
- Formula 2-2 (Sol-Gel-Al 130 ° C) On the surface of the barrier layer (1) prepared above, 40 mol% tetramethoxysilane, 12.5 mol% trisecondary butoxyaluminum, 32.5 mol% 3-glycidoxypropyltrimethoxysilane, 10 Application of a coating solution consisting of 5 mol% tetrapropoxyzirconium and 5 mol% 3-aminopropyltriethoxysilane at a coating speed of 2 m / min using an extrusion coater so that the film thickness after modification is 1 ⁇ m. Then, a barrier layer (2) having a composition of SiAl 0.1 O 2 C 0.1 was formed by drying and modifying treatment at 80 ° C. for 1 min and 130 ° C. for 30 min. The film density measured using XRR was 1.55 [g / cm 3 ].
- Formula 2-3 On the surface of the barrier layer (1) prepared above, 4 parts by weight of a dibutyl ether solution (NN120-20 manufactured by AZ Electronic Materials Co., Ltd.) containing 20% by mass of non-catalytic perhydropolysilazane, N, N as an amine catalyst , N ′, N′-tetramethyl-1,6-diaminohexane 1 part by weight and 1 part by weight of a dibutyl ether solution (NAX120-20 manufactured by AZ Electronic Materials Co., Ltd.) containing 19% by weight of perhydropolysilazane, A polysilazane-containing coating solution mixed with 5 parts by weight of butyl ether was applied at a coating speed of 2 m / min using an extrusion coater so that the film thickness after modification was 250 nm, dried at 80 ° C.
- a dibutyl ether solution N120-20 manufactured by AZ Electronic Materials Co., Ltd.
- Formula 2-4 (PHPS-Al)
- secondary butoxydiisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of Formula 2-3 so as to be 10 mol% with respect to silicon atoms.
- a second barrier layer having a composition of SiAl 0.1 O 2 was formed in the same manner as in Formula 2-3 except that the coating solution for forming the barrier layer (2) was used.
- the film density measured using XRR was 1.95 [g / cm 3 ].
- Formula 2-5 (PHPS-B)
- the polysilazane-containing coating solution used in the preparation of Formulation 2-3 was added with trimethoxyboron so as to be 10 mol% with respect to silicon atoms.
- a barrier layer (2) having a composition of SiB 0.1 O 1.5 N 0.3 was formed in the same manner as in Formula 2-3, except that the coating liquid for forming the barrier layer (2) was used.
- the film density measured using XRR was 1.90 [g / cm 3 ].
- Formula 2-6 (PHPS-Ti)
- tetraisopropoxytitanium added to the polysilazane-containing coating solution used in the preparation of formulation 2-3 so as to be 10 mol% with respect to silicon atoms was used as a coating solution for forming the barrier layer (2), and a barrier layer (2) having a composition of SiTi 0.1 O 1.9 N 0.1 was formed in the same manner as in Formula 2-3.
- the film density measured using XRR was 1.89 [g / cm 3 ].
- Formula 2-7 (PHPS-Zr)
- tetraisopropoxyzirconium was added to the polysilazane-containing coating solution used in the preparation of Formulation 2-3 so as to be 10 mol% with respect to silicon atoms.
- a coating solution for forming the barrier layer (2) was used as a coating solution for forming the barrier layer (2), and a barrier layer (2) having a composition of SiZr 0.1 O 1.8 N 0.2 was formed in the same manner as in Formula 2-3.
- the film density measured using XRR was 1.93 [g / cm 3 ].
- Formula 2-8 (PHPS-Zn) A barrier obtained by adding diethylzinc to the polysilazane-containing coating solution used in the preparation of Formula 2-3 on the surface of the barrier layer (1) prepared above so as to be 10 mol% with respect to silicon atoms. except for using as layer (2) forming coating solution, in the same manner as formulation 2-3, the formation of the barrier layer (2) having a composition of SiZn 0.1 O 1.8 N 0.2.
- the film density measured using XRR was 1.94 [g / cm 3 ].
- Formula 2-9 (PHPS-Ge)
- tetraisopropoxygermanium added to the polysilazane-containing coating solution used in the preparation of Formula 2-3 so as to be 10 mol% with respect to silicon atoms was used as a coating liquid for forming the barrier layer (2), and a barrier layer (2) having a composition of SiGe 0.1 O 1.5 N 0.2 was formed in the same manner as in Formula 2-3.
- the film density measured using XRR was 1.89 [g / cm 3 ].
- Formula 2-10 (PHPS-Mg)
- 5% ethylmagnesium bromide tetrahydrofuran was added to the polysilazane-containing coating solution used in the preparation of Formulation 2-3 so as to be 10 mol% with respect to silicon atoms.
- a barrier layer having a composition of SiMg 0.1 O 1.5 N 0.3 ( 2) was formed.
- the film density measured using XRR was 1.91 [g / cm 3 ].
- Formula 2-11 (1 less PHPS-Al)
- secondary butoxydiisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of Formulation 2-3 so as to be 1 mol% with respect to silicon atoms.
- the barrier layer (2) having a composition of SiAl 0.01 O 1.5 N 0.5 was prepared in the same manner as in Formula 2-3, except that the coating solution for forming the barrier layer (2) was used. Formed.
- the film density measured using XRR was 1.91 [g / cm 3 ].
- Formula 2-12 (2 less PHPS-Al)
- secondary butoxydiisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of Formula 2-3 so that the amount was 5 mol% with respect to silicon atoms.
- the barrier layer (2) having a composition of SiAl 0.05 O 1.6 N 0.3 was prepared in the same manner as in Formula 2-3 except that the coating liquid for forming the barrier layer (2) was used. Formed.
- the film density measured using XRR was 1.93 [g / cm 3 ].
- Formula 2-13 (1 with a lot of PHPS-Al)
- secondary butoxydiisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of Formula 2-3 so as to be 20 mol% with respect to silicon atoms.
- a barrier layer (2) having a composition of SiAl 0.2 O 2.1 was formed in the same manner as in Formula 2-3, except that the coating solution for forming the barrier layer (2) was used.
- the film density measured using XRR was 1.96 [g / cm 3 ].
- Formula 2-14 (2 PHPS-Al)
- secondary butoxydiisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of formulation 2-3 so as to be 30 mol% with respect to silicon atoms.
- a barrier layer (2) having a composition of SiAl 0.3 O 2.2 was formed in the same manner as in Formula 2-3 except that the coating solution for forming the barrier layer (2) was used.
- the film density measured using XRR was 1.97 [g / cm 3 ].
- Formula 2-15 (PHPS-Al / B)
- disecondary butoxyisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of Formula 2-3 so that the amount was 10 mol% with respect to silicon atoms.
- SiB 0 in the same manner as in Formula 2-3, except that a coating solution for forming the barrier layer (2) was used in which trimethoxyboron was added so as to be 5 mol% with respect to silicon atoms.
- a barrier layer (2) having a composition of 0.05 Al 0.1 O 1.8 N 0.1 was formed.
- the film density measured using XRR was 1.92 [g / cm 3 ].
- Formula 2-16 (HMePS-Al) SiAl 0.1 O 2 was prepared in the same manner as in Formula 2-3, except that monohydromonomethylpolysilazane was used instead of the perhydropolysilazane in Formula 2-3 on the surface of the barrier layer (1) prepared above.
- a barrier layer (2) having a composition of C 0.2 was formed.
- the film density measured using XRR was 1.87 [g / cm 3 ].
- Formula 3-1 On the surface of the barrier layer (2) produced above, 4 parts by weight of a dibutyl ether solution (NN120-20 manufactured by AZ Electronic Materials Co., Ltd.) containing 20% by mass of non-catalytic perhydropolysilazane and N, N as an amine catalyst , N ′, N′-tetramethyl-1,6-diaminohexane 1 part by weight and 1 part by weight of a dibutyl ether solution (NAX120-20 manufactured by AZ Electronic Materials Co., Ltd.) containing 19% by weight of perhydropolysilazane, A polysilazane-containing coating solution mixed with 5 parts by weight of butyl ether was applied at a coating speed of 2 m / min using an extrusion coater so that the film thickness after modification was 250 nm, dried at 80 ° C.
- a dibutyl ether solution N120-20 manufactured by AZ Electronic Materials Co., Ltd.
- Formula 3-2 (PHPS-Al)
- secondary butoxydiisopropoxyaluminum was added to the polysilazane-containing coating solution used in the preparation of formulation 3-1 so that the amount was 10 mol% with respect to silicon atoms.
- a barrier layer (3) having a composition of SiAl 0.1 O 2 was formed in the same manner as in Formulation 3-1, except that the coating solution for forming the barrier layer (3) was used.
- the film density measured using XRR was 1.95 [g / cm 3 ].
- Invention A Configuration including arrangement of substrate / first barrier layer / second barrier layer
- Invention B Configuration including arrangement of substrate / second barrier layer / first barrier layer
- Invention C Containing three or more barrier layers
- the gas barrier performance in the immediate evaluation is excellent, and the deterioration of the gas barrier performance is prevented even after the durability test (that is, the durability is excellent). I understand).
- the second barrier layer is made of at least one selected from the group consisting of boron (B), aluminum (Al), gallium (Ga) and indium (In) as an additive element.
- B boron
- Al aluminum
- Ga gallium
- In indium
- the configuration of the present invention A (configuration including the arrangement of the base material / first barrier layer / second barrier layer) is more It can be seen that the gas barrier property is more excellent than the configuration (the configuration including the arrangement of the base material / the second barrier layer / the first barrier layer) both after the immediate evaluation and the durability test.
- the barrier layer closest to the substrate is the first barrier layer, and the barrier layer farthest from the substrate is It can be seen that the second barrier layer exhibits better gas barrier properties both after the immediate evaluation and the durability test.
- Example 2 (OLED element) ⁇ Production of electronic devices >> Using the gas barrier film described in Table 3 below as a base material, an organic EL (OLED) element, which is an organic thin film electronic device, was prepared by the following procedure.
- ITO indium tin oxide
- the hole transport layer forming coating solution shown below was applied by an extrusion coater so that the thickness after drying was 50 nm, and then dried to form a hole transport layer. Formed.
- the gas barrier film was subjected to cleaning surface modification using a low-pressure mercury lamp with a wavelength of 184.9 nm at an irradiation intensity of 15 mW / cm 2 and a distance of 10 mm.
- the charge removal treatment was performed using a static eliminator with weak X-rays.
- ⁇ Application conditions> The coating process was performed in an atmosphere of 25 ° C. and a relative humidity of 50% RH.
- ⁇ Drying and heat treatment conditions> After applying the hole transport layer forming coating solution, the solvent was removed by applying hot air at a height of 100 mm toward the film formation surface, a discharge air speed of 1 m / s, a width of 5% of the wide air speed, and a temperature of 100 ° C. Subsequently, a back surface heat transfer type heat treatment was performed at a temperature of 150 ° C. using a heat treatment apparatus to form a hole transport layer.
- ⁇ White luminescent layer forming coating solution 1.0 g of host material HA, 100 mg of dopant material DA, 0.2 mg of dopant material DB, and 0.2 mg of dopant material DC are dissolved in 100 g of toluene as a coating solution for forming a white light emitting layer. Got ready.
- the chemical structures of the host material HA, the dopant material DA, the dopant material DB, and the dopant material DC are as shown in the following chemical formula.
- the coating process was performed in an atmosphere having a nitrogen gas concentration of 99% or more, a coating temperature of 25 ° C., and a coating speed of 1 m / min.
- the coating process was performed in an atmosphere having a nitrogen gas concentration of 99% or more, the coating temperature of the electron transport layer forming coating solution was 25 ° C., and the coating speed was 1 m / min.
- an electron injection layer was formed on the electron transport layer formed above.
- the substrate was put into a decompression chamber and decompressed to 5 ⁇ 10 ⁇ 4 Pa.
- cesium fluoride prepared in a tantalum vapor deposition boat was heated in a vacuum chamber to form an electron injection layer having a thickness of 3 nm.
- a mask pattern was formed by vapor deposition using aluminum as the second electrode forming material under a vacuum of 5 ⁇ 10 ⁇ 4 Pa and having a takeout electrode.
- a second electrode having a thickness of 100 nm was stacked.
- SiO 2 was laminated with a thickness of 200 nm by a CVD method, and a protective layer was formed on the second electrode layer.
- a sealing member As a sealing member, a polyethylene terephthalate (PET) film (12 ⁇ m thickness) is used on a 30 ⁇ m-thick aluminum foil (manufactured by Toyo Aluminum Co., Ltd.), and an adhesive for dry lamination (two-component reaction type urethane adhesive) is used. Using a dry laminate (adhesive layer thickness of 1.5 ⁇ m), sealing was performed using a sheet-like sealant TB1655 manufactured by ThreeBond Co., Ltd., and samples 201 to 207 were prepared.
- PET polyethylene terephthalate
- the organic EL device using the gas barrier film according to the present invention as a base material not only improved in durability due to excellent gas barrier performance in the immediate evaluation, but also after the durability test. It can be seen that when the gas barrier film is used as a substrate, a more remarkable durability improvement effect is exhibited.
- Example 3 photoelectric conversion element (solar cell)
- Production of photoelectric conversion element (solar cell) >>
- an indium tin oxide (ITO) transparent conductive film deposited at a thickness of 150 nm as the first electrode (anode) (sheet resistance 12 ⁇ / square)
- the first electrode was formed by patterning to a width of 10 mm using a normal photolithography method and wet etching.
- the patterned first electrode was cleaned in the order of ultrasonic cleaning with a surfactant and ultrapure water, followed by ultrasonic cleaning with ultrapure water, dried by nitrogen blowing, and finally subjected to ultraviolet ozone cleaning.
- PEDOT-PSS (CLEVIOS (registered trademark) PVP AI 4083, manufactured by Helios Co., Ltd., conductivity: 1 ⁇ 10 ⁇ 3 S / cm) made of a conductive polymer and a polyanion is used as a hole transport layer.
- An isopropanol solution containing 0% by mass was prepared, and the substrate was applied and dried using a blade coater adjusted to 65 ° C. so that the dry film thickness was about 30 nm. Then, it heat-processed with the warm air of 120 degreeC for 20 second, and formed the positive hole transport layer on said 1st electrode. From then on, it was brought into the glove box and worked under a nitrogen atmosphere.
- the element formed up to the hole transport layer was heated at 120 ° C. for 3 minutes in a nitrogen atmosphere.
- This solution was applied and dried using a blade coater whose temperature was adjusted to 65 ° C. so that the dry film thickness was about 5 nm. Thereafter, heat treatment was performed for 2 minutes with warm air at 100 ° C. to form an electron transport layer on the photoelectric conversion layer.
- the element on which the electron transport layer was formed was placed in a vacuum deposition apparatus. Then, the element was set so that the shadow mask with a width of 10 mm was orthogonal to the transparent electrode, and the inside of the vacuum deposition apparatus was depressurized to 10 ⁇ 3 Pa or less, and then 100 nm of silver was deposited at a deposition rate of 2 nm / second, A second electrode (cathode) was formed on the electron transport layer.
- a sealing member As a sealing member, a polyethylene terephthalate (PET) film (12 ⁇ m thickness) is used on a 30 ⁇ m thick aluminum foil (manufactured by Toyo Aluminum Co., Ltd.), and an adhesive for dry lamination (a two-component reaction type urethane adhesive) is used. Samples 301 to 305 were prepared by using a dry laminate (adhesive layer thickness 1.5 ⁇ m) and sealing using a sheet-like sealant TB1655 manufactured by ThreeBond Co., Ltd.
- the produced organic photoelectric conversion element is irradiated with light having an intensity of 100 mW / cm 2 using a solar simulator (AM1.5G filter), and a mask having an effective area of 1 cm 2 is overlaid on the light receiving portion to evaluate IV characteristics.
- A1.5G filter a solar simulator
- the photoelectric conversion element (solar cell) using the gas barrier film according to the present invention as a base material has not only improved durability due to excellent gas barrier performance in immediate evaluation but also durability.
- the gas barrier film after the property test is used as the base material, it can be seen that the effect of improving the durability is more remarkable.
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Abstract
Description
本発明の一形態に係るガスバリア性フィルムは、基材、第1のバリア層、および第2のバリア層を有する。第1のバリア層および第2のバリア層は、基材に対して同一の側に配置されていれば、これらの順序は問わない。つまり、基材/第1のバリア層/第2のバリア層の配置であってもよいし、基材/第2のバリア層/第1のバリア層の配置であってもよい。本発明の効果がより顕著に奏されるという観点からは、基材/第1のバリア層/第2のバリア層の配置(基材と、第1のバリア層と、第2のバリア層と、をこの順に含む構成を有すること)が好ましい。このため、以下では、基材/第1のバリア層/第2のバリア層の配置を前提に説明を加える。なお、第1のバリア層および第2のバリア層は、それぞれ独立して、1層または2層以上が配置されうる。ここで、第1のバリア層および第2のバリア層が合計で3層以上存在するような場合には、基材に最も近い側のバリア層が第1のバリア層であり、基材から最も遠い側のバリア層が第2のバリア層であるという構成が好ましい。かような構成とすることで、初期のガスバリア性のみならず、耐久性にも特に優れたガスバリア性フィルムが提供されうる。
本発明に係るガスバリア性フィルムでは、基材として、プラスチックフィルムまたはプラスチックシートが好ましく用いられ、無色透明な樹脂からなるフィルムまたはシートがより好ましく用いられる。用いられるプラスチックフィルムは、第1のバリア層および第2のバリア層等を保持できるフィルムであれば材質、厚み等に特に制限はなく、使用目的等に応じて適宜選択することができる。前記プラスチックフィルムとしては、具体的には、ポリエステル樹脂、メタクリル樹脂、メタクリル酸-マレイン酸共重合体、ポリスチレン樹脂、透明フッ素樹脂、ポリイミド、フッ素化ポリイミド樹脂、ポリアミド樹脂、ポリアミドイミド樹脂、ポリエーテルイミド樹脂、セルロースアシレート樹脂、ポリウレタン樹脂、ポリエーテルエーテルケトン樹脂、ポリカーボネート樹脂、脂環式ポリオレフィン樹脂、ポリアリレート樹脂、ポリエーテルスルホン樹脂、ポリスルホン樹脂、シクロオレフィルンコポリマー、フルオレン環変性ポリカーボネート樹脂、脂環変性ポリカーボネート樹脂、フルオレン環変性ポリエステル樹脂、アクリロイル化合物などの熱可塑性樹脂が挙げられる。
第1のバリア層は、膜密度が1.5~2.1g/cm3であり、無機化合物を含む層である。
本発明に係る第1のバリア層を形成するための典型的な手法は、ウェットコーティング法(塗布法)である。ただし、上述した比較的小さい膜密度を有するバリア層が得られるような条件であれば、ドライプロセスにより第1のバリア層を形成してもよい。具体的には、例えば、ウェットコーティング法によるバリア層は、上述した基材の少なくとも一方の面に、無機化合物またはその前駆体を含有する液(本明細書では、「第1の塗布液」とも称する)を塗布して形成される塗膜(本明細書では、「第1の塗膜」とも称する)を改質処理することによって形成されてなるものである。本明細書では、液(塗布液)を塗布して塗膜を形成する方法を、「ウェットコーティング法」や「塗布法」と称することがあるが、これらはすべて同義である。なお、本発明者の検討によれば、ウェットコーティング法(塗布法)により得られる塗膜を改質処理することにより形成されるバリア層(ガスバリア層)の膜密度は2.1を超えないことが判明している。
第1のバリア層に含まれる無機化合物の前駆体としての前記ケイ素化合物としては、ケイ素化合物を含有する塗布液の調製が可能であれば特に限定はされない。
第1のバリア層形成用塗布液を調製するための溶剤としては、上記ケイ素化合物を溶解できるものであれば特に制限されないが、ケイ素化合物と容易に反応してしまう水および反応性基(例えば、ヒドロキシル基、あるいはアミン基等)を含まず、ケイ素化合物に対して不活性の有機溶剤が好ましく、非プロトン性の有機溶剤がより好ましい。具体的には、溶剤としては、非プロトン性溶剤;例えば、ペンタン、ヘキサン、シクロヘキサン、トルエン、キシレン、ソルベッソ、ターベン等の、脂肪族炭化水素、脂環式炭化水素、芳香族炭化水素等の炭化水素溶媒;塩化メチレン、トリクロロエタン等のハロゲン炭化水素溶媒;酢酸エチル、酢酸ブチル等のエステル類;アセトン、メチルエチルケトン等のケトン類;ジブチルエーテル、ジオキサン、テトラヒドロフラン等の脂肪族エーテル、脂環式エーテル等のエーテル類:例えば、テトラヒドロフラン、ジブチルエーテル、モノ-およびポリアルキレングリコールジアルキルエーテル(ジグライム類)などを挙げることができる。上記溶剤は、ケイ素化合物の溶解度や溶剤の蒸発速度等の目的にあわせて選択され、単独で使用されてもまたは2種以上の混合物の形態で使用されてもよい。
第1のバリア層形成用塗布液を塗布する方法としては、従来公知の適切な湿式塗布方法が採用され得る。具体例としては、スピンコート法、ロールコート法、フローコート法、インクジェット法、スプレーコート法、プリント法、ディップコート法、流延成膜法、バーコート法、グラビア印刷法等が挙げられる。
本発明における塗布法により形成された第1のバリア層の改質処理とは、ケイ素化合物の酸化ケイ素または酸窒化ケイ素等への転化反応を指し、具体的には本発明のガスバリア性フィルムが全体としてガスバリア性を発現するのに貢献できるレベルの無機薄膜を形成する処理をいう。
本発明において、改質処理として用いることのできるプラズマ処理は、公知の方法を用いることができるが、好ましくは大気圧プラズマ処理等をあげることが出来る。大気圧近傍でのプラズマCVD処理を行う大気圧プラズマCVD法は、真空下のプラズマCVD法に比べ、減圧にする必要がなく生産性が高いだけでなく、プラズマ密度が高密度であるために成膜速度が速く、さらには通常のCVD法の条件に比較して、大気圧下という高圧力条件では、ガスの平均自由工程が非常に短いため、極めて均質の膜が得られる。
ケイ素化合物を含有する塗膜を他の改質処理、好適には後述のエキシマ照射処理等と組み合わせて、加熱処理することで、改質処理を効率よく行うことが出来る。
改質処理の方法の1つとして、紫外線照射による処理が好ましい。紫外線(紫外光と同義)によって生成されるオゾンや活性酸素原子は高い酸化能力を有しており、低温で高い緻密性と絶縁性を有する酸化ケイ素膜または酸窒化ケイ素膜を形成することが可能である。
本発明において、最も好ましい改質処理方法は、真空紫外線照射による処理(エキシマ照射処理)である。真空紫外線照射による処理は、ポリシラザン化合物内の原子間結合力より大きい100~200nmの光エネルギーを用い、好ましくは100~180nmの波長の光エネルギーを用い、原子の結合を光量子プロセスと呼ばれる光子のみの作用により、直接切断しながら活性酸素やオゾンによる酸化反応を進行させることで、比較的低温(約200℃以下)で、酸化ケイ素膜の形成を行う方法である。なお、エキシマ照射処理を行う際は、上述したように熱処理を併用することが好ましく、その際の熱処理条件の詳細は上述したとおりである。
パーヒドロポリシラザン中のSi-H結合やN-H結合は真空紫外線照射による励起等で比較的容易に切断され、不活性雰囲気下ではSi-Nとして再結合すると考えられる(Siの未結合手が形成される場合もある)。すなわち、酸化することなくSiNy組成として硬化する。この場合はポリマー主鎖の切断は生じない。Si-H結合やN-H結合の切断は触媒の存在や、加熱によって促進される。切断されたHはH2として膜外に放出される。
パーヒドロポリシラザン中のSi-N結合は水により加水分解され、ポリマー主鎖が切断されてSi-OHを形成する。二つのSi-OHが脱水縮合してSi-O-Si結合を形成して硬化する。これは大気中でも生じる反応であるが、不活性雰囲気下での真空紫外線照射中では、照射の熱によって基材からアウトガスとして生じる水蒸気が主な水分源となると考えられる。水分が過剰となると脱水縮合しきれないSi-OHが残存し、SiO2.1~SiO2.3の組成で示されるガスバリア性の低い硬化膜となる。
真空紫外線照射中、雰囲気下に適当量の酸素が存在すると、酸化力の非常に強い一重項酸素が形成される。パーヒドロポリシラザン中のHやNはOと置き換わってSi-O-Si結合を形成して硬化する。ポリマー主鎖の切断により結合の組み換えを生じる場合もあると考えられる。
真空紫外線のエネルギーはパーヒドロポリシラザン中のSi-Nの結合エネルギーよりも高いため、Si-N結合は切断され、周囲に酸素、オゾン、水等の酸素源が存在すると酸化されてSi-O-Si結合やSi-O-N結合が生じると考えられる。ポリマー主鎖の切断により結合の組み換えを生じる場合もあると考えられる。
第2のバリア層は、第1のバリア層の上部、または基材と第1のバリア層との間に設けられる層であって、長周期型周期表の第2~14族の元素からなる群より選択される少なくとも1種(ただし、ケイ素および炭素を除く)の添加元素、ケイ素原子および酸素原子を含有し、かつケイ素原子に対する酸素原子の存在比(O/Si)が1.4~2.2であり、ケイ素原子に対する窒素原子の存在比(N/Si)が0~0.4である点に特徴がある。
イオン種:Arイオン
加速電圧:1kV
(X線光電子分光測定条件)
装置:VGサイエンティフィックス社製ESCALAB-200R
X線アノード材:Mg
出力:600W(加速電圧15kV、エミッション電流40mA)
尚、測定の分解能は0.5nmでありこれに応じた各サンプリング点において、各元素比をプロットすることで得られる。
装置:SII製SMI2050
加工イオン:(Ga 30kV)
(TEM観察)
装置:日本電子製JEM2000FX(加速電圧:200kV)
電子線照射時間:5秒から60秒
なお、本発明において、第2のバリア層の膜密度は1.5~2.5g/cm3であることが好ましい。この膜密度が高いほど1層目と2層目との相乗効果が高くなることから、好ましくは1.7~2.5g/cm3であり、より好ましくは1.9~2.5g/cm3である。
第2のバリア層の形成方法には、特に限定はなく、非特許文献1に記載されているドライコーティング法、ウェットコーティング法のいずれも用いることができる。ただし、生産性を向上させるという観点からは、ウェットコーテイング法が好ましく用いられる。特に、ポリシラザンと、長周期型周期表の第2~14族の元素からなる群より選択される少なくとも1種(ただし、ケイ素および炭素を除く)の添加元素を含む添加化合物とを含有する塗布液(本明細書中、「第2の塗布液」とも称する)を塗布して塗膜(本明細書中、「第2の塗膜」とも称する)を形成し、前記第2の塗膜を改質処理して、第2のバリア層を形成することが好ましい。以下では、かような手法によって第2のバリア層を形成する場合を例に挙げて、説明する。
ポリシラザンの具体的な例は、上記「第1のバリア層」の項で説明した内容と同様であるので、ここでは説明を省略する。中でも、成膜性、クラック等の欠陥が少ないこと、残留有機物の少なさ、屈曲時および高温高湿条件下であってもバリア性能が維持されることなどの観点から、パーヒドロポリシラザンが特に好ましい。
添加化合物の種類は、特に制限されず、上述した添加元素を含む化合物であれば任意の化合物が添加化合物として用いられうる。
第2のバリア層形成用塗布液を調製するための溶剤としては、上記ポリシラザンおよび添加化合物を溶解できるものであれば特に制限されないが、ポリシラザンと容易に反応してしまう水および反応性基(例えば、ヒドロキシル基、あるいはアミン基等)を含まず、ポリシラザンに対して不活性の有機溶剤が好ましく、非プロトン性の有機溶剤がより好ましい。具体的には、溶剤としては、非プロトン性溶剤;例えば、ペンタン、ヘキサン、シクロヘキサン、トルエン、キシレン、ソルベッソ、ターベン等の、脂肪族炭化水素、脂環式炭化水素、芳香族炭化水素等の炭化水素溶媒;塩化メチレン、トリクロロエタン等のハロゲン炭化水素溶媒;酢酸エチル、酢酸ブチル等のエステル類;アセトン、メチルエチルケトン等のケトン類;ジブチルエーテル、ジオキサン、テトラヒドロフラン等の脂肪族エーテル、脂環式エーテル等のエーテル類:例えば、テトラヒドロフラン、ジブチルエーテル、モノ-およびポリアルキレングリコールジアルキルエーテル(ジグライム類)などを挙げることができる。上記溶剤は、単独で使用されてもまたは2種以上の混合物の形態で使用されてもよい。
第2のバリア層形成用塗布液を塗布する方法としては、従来公知の適切な湿式塗布方法が採用され得る。具体例としては、スピンコート法、ロールコート法、フローコート法、インクジェット法、スプレーコート法、プリント法、ディップコート法、流延成膜法、バーコート法、グラビア印刷法等が挙げられる。
本発明のガスバリア性フィルムは、応力緩和などを目的として、第1のバリア層と第2のバリア層との間に中間層を有していてもよい。該中間層を形成する方法としては、ポリシロキサン改質層を形成する方法を適用することができる。この方法は、ポリシロキサンを含有した塗布液を、湿式塗布法により第1のバリア層上に塗布して乾燥した後、その乾燥して得られた塗膜に真空紫外線を照射することによって、中間層を形成する方法である。
本発明に係るガスバリア性フィルムは、最表層のバリア層の上部に、有機化合物を含む保護層を設けてもよい。保護層に用いられる有機化合物としては、有機モノマー、オリゴマー、ポリマー等の有機樹脂、有機基を有するシロキサンやシルセスキオキサンのモノマー、オリゴマー、ポリマー等を用いた有機無機複合樹脂層を好ましく用いることができる。これらの有機樹脂もしくは有機無機複合樹脂は重合性基や架橋性基を有することが好ましく、これらの有機樹脂もしくは有機無機複合樹脂を含有し、必要に応じて重合開始剤や架橋剤等を含有する有機樹脂組成物塗布液から塗布形成した層に、光照射処理や熱処理を加えて硬化させることが好ましい。ここで「架橋性基」とは、光照射処理や熱処理で起こる化学反応によりバインダーポリマーを架橋することができる基のことである。このような機能を有する基であれば特にその化学構造は限定されないが、例えば、付加重合し得る官能基としてエチレン性不飽和基、エポキシ基/オキセタニル基等の環状エーテル基が挙げられる。また光照射によりラジカルになり得る官能基であってもよく、そのような架橋性基としては、例えば、チオール基、ハロゲン原子、オニウム塩構造等が挙げられる。中でも、エチレン性不飽和基が好ましく、特開2007-17948号公報の段落「0130」~「0139」に記載された官能基が含まれる。
本発明のガスバリア性フィルムは、デシカント性層(水分吸着層)を有してもよい。デシカント性層として用いられる材料としては、例えば、酸化カルシウムや有機金属酸化物などが挙げられる。酸化カルシウムとしては、バインダー樹脂などに分散されたものが好ましく、市販品としては、例えば、サエスゲッター社のAqvaDryシリーズなどを好ましく用いることができる。また、有機金属酸化物としては、双葉電子工業株式会社製のOleDry(登録商標)シリーズなどを用いることができる。
本発明のガスバリア性フィルムは、基材のバリア層を有する面、好ましくは基材と基材に隣接したバリア層との間に平滑層(下地層、プライマー層)を有していてもよい。平滑層は突起等が存在する基材の粗面を平坦化するために、あるいは、基材に存在する突起により、バリア層に生じた凹凸やピンホールを埋めて平坦化するために設けられる。このような平滑層は、いずれの材料で形成されてもよいが、炭素含有ポリマーを含むことが好ましく、炭素含有ポリマーから構成されることがより好ましい。すなわち、本発明のガスバリア性フィルムは、基材と第1のバリア層との間に、炭素含有ポリマーを含む平滑層をさらに有することが好ましい。
本発明に係る基材の表面には、接着性(密着性)の向上を目的として、アンカーコート層を易接着層として形成してもよい。このアンカーコート層に用いられるアンカーコート剤としては、ポリエステル樹脂、イソシアネート樹脂、ウレタン樹脂、アクリル樹脂、エチレン・ビニルアルコール樹脂、ビニル変性樹脂、エポキシ樹脂、変性スチレン樹脂、変性シリコン樹脂、およびアルキルチタネート等を、1種または2種以上併せて使用することができる。上記アンカーコート剤は、市販品を使用してもよい。具体的には、シロキサン系UV硬化性ポリマー溶液(信越化学工業株式会社製、「X-12-2400」の3%イソプロピルアルコール溶液)を用いることができる。
本発明のガスバリア性フィルムは、ブリードアウト防止層をさらに有することができる。ブリードアウト防止層は、平滑層を有するフィルムを加熱した際に、基材中から未反応のオリゴマー等が表面へ移行して、接触する面を汚染する現象を抑制する目的で、平滑層を有する基材の反対面に設けられる。ブリードアウト防止層は、この機能を有していれば、基本的に平滑層と同じ構成をとっても構わない。
本発明のガスバリア性フィルムは、連続生産しロール形態に巻き取ることができる(いわゆるロール・トゥ・ロール生産)。その際、バリア層を形成した面に保護シートを貼合して巻き取ることが好ましい。特に、本発明のガスバリア性フィルムを有機薄膜デバイスの封止材として用いる場合、表面に付着したゴミ(例えば、パーティクル)が原因で欠陥となる場合が多く、クリーン度の高い場所で保護シートを貼合してゴミの付着を防止することは非常に有効である。併せて、巻取り時に入るバリア層表面への傷の防止に有効である。
本発明のガスバリア性フィルムは、空気中の化学成分(酸素、水、窒素酸化物、硫黄酸化物、オゾン等)によって性能が劣化するデバイスに好ましく用いることができる。前記デバイスの例としては、例えば、有機EL素子、液晶表示素子(LCD)、薄膜トランジスタ、タッチパネル、電子ペーパー、太陽電池(PV)等の電子デバイスを挙げることができる。本発明の効果がより効率的に得られるという観点から、有機EL素子または太陽電池に好ましく用いられ、有機EL素子に特に好ましく用いられる。
ガスバリア性フィルムを用いた有機EL素子の例は、特開2007-30387号公報に詳しく記載されている。
反射型液晶表示装置は、下から順に、下基板、反射電極、下配向膜、液晶層、上配向膜、透明電極、上基板、λ/4板、そして偏光膜からなる構成を有する。本発明におけるガスバリア性フィルムは、前記透明電極基板および上基板として使用することができる。カラー表示の場合には、さらにカラーフィルター層を反射電極と下配向膜との間、または上配向膜と透明電極との間に設けることが好ましい。透過型液晶表示装置は、下から順に、バックライト、偏光板、λ/4板、下透明電極、下配向膜、液晶層、上配向膜、上透明電極、上基板、λ/4板および偏光膜からなる構成を有する。カラー表示の場合には、さらにカラーフィルター層を下透明電極と下配向膜との間、または上配向膜と透明電極との間に設けることが好ましい。液晶セルの種類は特に限定されないが、より好ましくはTN型(Twisted Nematic)、STN型(Super Twisted Nematic)またはHAN型(Hybrid Aligned Nematic)、VA型(Vertically Alignment)、ECB型(Electrically Controlled Birefringence)、OCB型(Optically Compensated Bend)、IPS型(In-Plane Switching)、CPA型(Continuous Pinwheel Alignment)であることが好ましい。
本発明のガスバリア性フィルムは、太陽電池等の有機光電変換素子の封止フィルムとしても用いることができる。ここで、本発明のガスバリア性フィルムは、バリア層が太陽電池等の有機光電変換素子に近い側となるように封止することが好ましい。本発明のガスバリア性フィルムが好ましく用いられる太陽電池(有機光電変換素子)としては、特に制限はないが、例えば、単結晶シリコン系太陽電池素子、多結晶シリコン系太陽電池素子、シングル接合型、またはタンデム構造型等で構成されるアモルファスシリコン系太陽電池素子、ガリウムヒ素(GaAs)やインジウム燐(InP)等のIII-V族化合物半導体太陽電池素子、カドミウムテルル(CdTe)等のII-VI族化合物半導体太陽電池素子、銅/インジウム/セレン系(いわゆる、CIS系)、銅/インジウム/ガリウム/セレン系(いわゆる、CIGS系)、銅/インジウム/ガリウム/セレン/硫黄系(いわゆる、CIGSS系)等のI-III-VI族化合物半導体太陽電池素子、色素増感型太陽電池素子、有機太陽電池素子等が挙げられる。中でも、本発明においては、上記太陽電池素子が、銅/インジウム/セレン系(いわゆる、CIS系)、銅/インジウム/ガリウム/セレン系(いわゆる、CIGS系)、銅/インジウム/ガリウム/セレン/硫黄系(いわゆる、CIGSS系)等のI-III-VI族化合物半導体太陽電池素子であることが好ましい。
その他の適用例としては、特表平10-512104号公報に記載の薄膜トランジスタ、特開平5-127822号公報、特開2002-48913号公報等に記載のタッチパネル、特開2000-98326号公報に記載の電子ペーパー等が挙げられる。
本発明のガスバリア性フィルムは、光学部材としても用いることができる。光学部材の例としては円偏光板等が挙げられる。
本発明におけるガスバリア性フィルムを基板としλ/4板と偏光板とを積層し、円偏光板を作製することができる。この場合、λ/4板の遅相軸と偏光板の吸収軸とのなす角が45°になるように積層する。このような偏光板は、長手方向(MD)に対し45°の方向に延伸されているものを用いることが好ましく、例えば、特開2002-865554号公報に記載のものを好適に用いることができる。
《ガスバリア性フィルムの作製》
以下の手順で、基材上にバリア層(1)、バリア層(2)、および必要に応じてバリア層(3)を形成し、ガスバリア性フィルムNo.101~146を作製した。各サンプルについての詳細を下記の表1に示す。
基材としては、東レ株式会社製PETフィルム ルミラー(登録商標)U34(厚さ100μm)を使用した。
バリア層(1)としては、以下の処方1-1~処方1-8のいずれかを採用した。
基材の一方の表面上に、50モル%のテトラメトキシシラン、45モル%の3-グリシドキシプロピルトリメトキシシシラン、5モル%の3-アミノプロピルトリエトキシシランからなる塗布液を、改質処理後の膜厚が1μmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min、100℃で30minの乾燥および改質処理を行って、SiO2C0.1の組成を有するバリア層(1)を形成した。XRR(マックサイエンス社製 M03XHF MXP3)を用いて測定した膜密度は、1.43[g/cm3]であった。
処方1-1に対して最後の乾燥を130℃30minに変更して、SiO2C0.1の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、1.53[g/cm3]であった。
処方1-1に対して最後の乾燥を150℃30minに変更して、SiO2C0.1の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、1.72[g/cm3]であった。
基材の一方の表面上に、40モル%のテトラメトキシシラン、12.5モル%のトリセカンダリーブトキシアルミニウム、32.5モル%の3-グリシドキシプロピルトリメトキシシシラン、10モル%のテトラプロポキシジルコニウム、5モル%の3-アミノプロピルトリエトキシシランからなる塗布液を、改質処理後の膜厚が1μmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min、130℃で30minの乾燥および改質処理を行って、SiAl0.1O2C0.1の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、1.55[g/cm3]であった。
基材の一方の表面上に、無触媒のパーヒドロポリシラザンを20質量%含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NN120-20)4重量部、アミン触媒としてN,N,N’,N’-テトラメチル-1,6-ジアミノヘキサン1質量%、パーヒドロポリシラザン19質量%、およびケイ素原子に対して10モル%になる量のセカンダリーブトキシジイソプロポキシアルミニウムを含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NAX120-20)1重量部、並びにジブチルエーテル5重量部を混合したポリシラザン含有塗布液を、改質後の膜厚が250nmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布を行い、80℃で1min乾燥後、酸素濃度0.1%~0.01%に調整した窒素雰囲気下で172nmの真空紫外線を3J/cm2の光量になるように照射して、SiAl0.1O2.1の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、1.95[g/cm3]であった。
基材の一方の表面上に、無触媒のパーヒドロポリシラザンを20質量%含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NN120-20)4重量部、アミン触媒としてN,N,N’,N’-テトラメチル-1,6-ジアミノヘキサン1質量%、およびパーヒドロポリシラザン19質量%を含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NAX120-20)1重量部、並びにジブチルエーテル5重量部を混合したポリシラザン含有塗布液を、改質後の膜厚が250nmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min乾燥後、大気下で120℃30min加熱して、SiO1.1N0.4の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、1.44[g/cm3]であった。
処方1-6と同様にポリシラザン含有塗布液を塗布し、80℃で1min乾燥後、酸素濃度0.1%~0.01%に調整した窒素雰囲気下で172nmの真空紫外線を3J/cm2の光量になるように照射して、SiO1.1N0.4の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、1.91[g/cm3]であった。
処方1-6に対し、真空紫外線の照射光量を6Jに変更して、SiO1.1N0.4の組成を有するバリア層(1)を形成した。XRRを用いて測定した膜密度は、2.02[g/cm3]であった。
バリア層(2)としては、以下の処方2-1~処方2-16のいずれかを採用した。
上記作製したバリア層(1)の表面上に、50モル%のテトラメトキシシラン、45モル%の3-グリシドキシプロピルトリメトキシシシラン、5モル%の3-アミノプロピルトリエトキシシランからなる塗布液を、改質処理後の膜厚が1μmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min、130℃で30minの乾燥および改質処理を行って、SiO2C0.1の組成を有するバリア層(2)を形成した。XRRを用いて測定したは膜密度は、1.53[g/cm3]であった。
上記作製したバリア層(1)の表面上に、40モル%のテトラメトキシシラン、12.5モル%のトリセカンダリーブトキシアルミニウム、32.5モル%の3-グリシドキシプロピルトリメトキシシシラン、10モル%のテトラプロポキシジルコニウム、5モル%の3-アミノプロピルトリエトキシシランからなる塗布液を、改質処理後の膜厚が1μmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min、130℃で30minの乾燥および改質処理を行って、SiAl0.1O2C0.1の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.55[g/cm3]であった。
上記作製したバリア層(1)の表面上に、無触媒のパーヒドロポリシラザンを20質量%含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NN120-20)4重量部、アミン触媒としてN,N,N’,N’-テトラメチル-1,6-ジアミノヘキサン1質量%およびパーヒドロポリシラザン19質量%を含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NAX120-20)1重量部、並びにジブチルエーテル5重量部を混合したポリシラザン含有塗布液を、改質後の膜厚が250nmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min乾燥後、酸素濃度0.1%~0.01%に調整した窒素雰囲気下で172nmの真空紫外線を3J/cm2の光量になるように照射して、SiO0.6N0.6の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.91[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにセカンダリーブトキシジイソプロポキシアルミニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiAl0.1O2の組成を有する第2のバリア層を形成した。XRRを用いて測定した膜密度は、1.95[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにトリメトキシホウ素を加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiB0.1O1.5N0.3の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.90[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにテトライソプロポキシチタンを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiTi0.1O1.9N0.1の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.89[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにテトライソプロポキシジルコニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiZr0.1O1.8N0.2の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.93[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにジエチル亜鉛を加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiZn0.1O1.8N0.2の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.94[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにテトライソプロポキシゲルマニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiGe0.1O1.5N0.2の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.89[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるように5%のエチル臭化マグネシウム テトラヒドロフラン溶液を加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiMg0.1O1.5N0.3の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.91[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して1モル%になるようにセカンダリーブトキシジイソプロポキシアルミニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiAl0.01O1.5N0.5の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.91[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して5モル%になるようにセカンダリーブトキシジイソプロポキシアルミニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiAl0.05O1.6N0.3の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.93[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して20モル%になるようにセカンダリーブトキシジイソプロポキシアルミニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiAl0.2O2.1の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.96[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して30モル%になるようにセカンダリーブトキシジイソプロポキシアルミニウムを加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiAl0.3O2.2の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.97[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにジセカンダリーブトキシイソプロポキシアルミニウムを加え、かつ、ケイ素原子に対して5モル%になるようにトリメトキシホウ素を加えたものをバリア層(2)形成用塗布液として使用したこと以外は、処方2-3と同様にして、SiB0.05Al0.1O1.8N0.1の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.92[g/cm3]であった。
上記作製したバリア層(1)の表面上に、処方2-3のパーヒドロポリシラザンに代えてモノヒドロモノメチルポリシラザンを使用したこと以外は、処方2-3と同様にして、SiAl0.1O2C0.2の組成を有するバリア層(2)を形成した。XRRを用いて測定した膜密度は、1.87[g/cm3]であった。
バリア層(3)としては、以下の処方3-1~処方3-2のいずれかを採用した。
上記作製したバリア層(2)の表面上に、無触媒のパーヒドロポリシラザンを20質量%含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NN120-20)4重量部、アミン触媒としてN,N,N’,N’-テトラメチル-1,6-ジアミノヘキサン1質量%およびパーヒドロポリシラザン19質量%を含むジブチルエーテル溶液(AZエレクトロニックマテリアルズ(株)製NAX120-20)1重量部、並びにジブチルエーテル5重量部を混合したポリシラザン含有塗布液を、改質後の膜厚が250nmになるように、押し出しコーターを用いてコーティングスピード2m/minで塗布し、80℃で1min乾燥後、酸素濃度0.1%~0.01%に調整した窒素雰囲気下で172nmの真空紫外線を3J/cm2の光量になるように照射して、SiO0.6N0.6の組成を有するバリア層(3)を形成した。XRRを用いて測定した膜密度は、1.91[g/cm3]であった。
上記作製したバリア層(2)の表面上に、処方3-1の作製の際に使用したポリシラザン含有塗布液に、ケイ素原子に対して10モル%になるようにセカンダリーブトキシジイソプロポキシアルミニウムを加えたものをバリア層(3)形成用塗布液として使用したこと以外は、処方3-1と同様にして、SiAl0.1O2の組成を有するバリア層(3)を形成した。XRRを用いて測定した膜密度は、1.95[g/cm3]であった。
上記作製したガスバリア性フィルムNo.101~146について、組成分布を、下記分析条件によるXPS分析を用いた方法により測定した。なお、厚さ方向で濃度が変化している場合は、バリア層(1)、バリア層(2)、バリア層(3)それぞれの厚さ方向の平均値をそれぞれの層の組成とした。結果を下記の表1に示す。
・装置:アルバックファイ製QUANTERASXM
・X線源:単色化Al-Kα
・測定領域:Si2p、C1s、N1s、O1s
・スパッタイオン:Ar(2keV)
・デプスプロファイル:1分間スパッタ後、測定を繰り返す
・定量:バックグラウンドをShirley法で求め、得られたピーク面積から相対感度係数法を用いて定量した。データ処理は、アルバックファイ社製のMultiPakを用いた。
上記作製したガスバリア性フィルムNo.101~146について、株式会社日本エイピーアイ製フィルム透過性評価装置 API-BA90を用いて、40℃90%RHにおけるWVTRを測定した。結果を下記の表2に示す。
上記作製したガスバリア性フィルムNo.101~146のそれぞれを10cm角に切りだし、バリア層の側が内側になるように、50mmΦ円柱に30秒かけて巻き取り、1時間放置後、30秒かけて平面上に広げ、1時間放置するといったサイクルを繰り返しながら、25℃から10℃/hrの降温速度で0℃まで冷却し、0℃到達後、10℃/hrの昇温速度で70℃まで昇温し、10℃/hrで25℃まで冷却するサイクルを100回実施してバリアフィルムの耐久性試験を実施し、その後WVTRの測定を実施した。結果を下記の表2に示す。
本発明B:基材/第2のバリア層/第1のバリア層の配置を含む構成
本発明C:バリア層を3層以上含む構成
《電子デバイスの作製》
下記の表3に記載のガスバリア性フィルムを基材として用いて、以下の手順で、有機薄膜電子デバイスである有機EL(OLED)素子を作製した。
(第1電極層の形成)
ガスバリア性フィルムのバリア層上に、厚さ150nmのITO(酸化インジウムスズ)をスパッタ法により成膜し、フォトリソグラフィー法によりパターニングを行い、第1電極層を形成した。
上記で形成した第1電極層の上に、以下に示す正孔輸送層形成用塗布液を、乾燥後の厚みが50nmとなるように押出し塗布機で塗布した後乾燥し、正孔輸送層を形成した。
塗布工程は大気中、25℃、相対湿度50%RHの環境で行った。
ポリエチレンジオキシチオフェン・ポリスチレンスルホネート(PEDOT/PSS、Bayer社製 Baytron(登録商標)P AI 4083)を純水で65%、およびメタノール5%で希釈した溶液を正孔輸送層形成用塗布液として準備した。
正孔輸送層形成用塗布液を塗布した後、成膜面に向け高さ100mm、吐出風速1m/s、幅手の風速分布5%、温度100℃で温風を当て溶媒を除去した後、引き続き、加熱処理装置を用い、温度150℃で裏面伝熱方式の熱処理を行い、正孔輸送層を形成した。
引き続き、上記で形成した正孔輸送層の上に、以下に示す白色発光層形成用塗布液を乾燥後の厚みが40nmになるように押出し塗布機で塗布した後乾燥し、発光層を形成した。
ホスト材H-A 1.0g、ドーパント材D-A 100mg、ドーパント材D-B 0.2mg、およびドーパント材D-C 0.2mgを、100gのトルエンに溶解し白色発光層形成用塗布液として準備した。ホスト材H-A、ドーパント材D-A、ドーパント材D-B、およびドーパント材D-Cの化学構造は、下記化学式に示す通りである。
塗布工程を、窒素ガス濃度99%以上の雰囲気で、塗布温度を25℃とし、塗布速度1m/minで行った。
白色発光層形成用塗布液を塗布した後、成膜面に向け高さ100mm、吐出風速1m/s、幅手の風速分布5%、温度60℃で温風を当て溶媒を除去した後、引き続き、温度130℃で加熱処理を行い、発光層を形成した。
引き続き、上記で形成した発光層の上に、以下に示す電子輸送層形成用塗布液を、乾燥後の厚みが30nmになるように押出し塗布機で塗布した後、乾燥し電子輸送層を形成した。
塗布工程は窒素ガス濃度99%以上の雰囲気で、電子輸送層形成用塗布液の塗布温度を25℃とし、塗布速度1m/minで行った。
電子輸送層は、E-A(下記化学式参照)を2,2,3,3-テトラフルオロ-1-プロパノール中に溶解し0.5質量%溶液とし、電子輸送層形成用塗布液とした。
電子輸送層形成用塗布液を塗布した後、成膜面に向け高さ100mm、吐出風速1m/s、幅手の風速分布5%、温度60℃で温風を当て、溶媒を除去した後、引き続き加熱処理部で、温度200℃で加熱処理を行い、電子輸送層を形成した。
引き続き、上記で形成した電子輸送層の上に電子注入層を形成した。まず、基板を減圧チャンバに投入し、5×10-4Paまで減圧した。あらかじめ、真空チャンバにタンタル製蒸着ボートに用意しておいたフッ化セシウムを加熱し、厚さ3nmの電子注入層を形成した。
引き続き、上記で形成した電子注入層の上に5×10-4Paの真空下にて第2電極形成材料としてアルミニウムを使用し、取り出し電極を有するように蒸着法にて、マスクパターン成膜し、厚さ100nmの第2電極を積層した。
続いて、第1電極および第2電極の取り出し部になる部分を除き、CVD法にてSiO2を200nmの厚さで積層し、第2電極層上に保護層を形成した。
封止部材として、30μm厚のアルミニウム箔(東洋アルミニウム株式会社製)に、ポリエチレンテレフタレート(PET)フィルム(12μm厚)を、ドライラミネーション用の接着剤(2液反応型のウレタン系接着剤)を用いドライラミネートしたもの(接着剤層の厚み1.5μm)を使用し、スリーボンド株式会社製シート状封止剤TB1655を使用して封止を行い、サンプル201~207を作成した。
上記作製した有機EL素子について、下記の方法に従って、耐久性の評価を行った。なお、有機EL素子の基材として用いたガスバリア性フィルムとしては、上記の即評価のものおよび耐久性試験後のものの双方を用いた。
上記作製した各有機EL素子を、85℃、85%RHの環境下で加速劣化処理を施し、ダークスポットの面積が全体の1%に到達した時点を寿命と判断した。なお、ダークスポットの面積は、有機EL素子に対し、それぞれ1mA/cm2の電流を印加し、発光像を写真撮影した際の面積比率として算出した。評価結果を、下記の表3に示す。
《光電変換素子(太陽電池)の作製》
下記の表4に示すガスバリア性フィルムのバリア層上に、第一の電極(陽極)としてインジウムスズ酸化物(ITO)透明導電膜を厚さ150nmで堆積したもの(シート抵抗12Ω/square)を、通常のフォトリソグラフィー法と湿式エッチングとを用いて10mm幅にパターニングし、第一の電極を形成した。パターン形成した第一の電極を、界面活性剤と超純水とによる超音波洗浄、超純水による超音波洗浄の順で洗浄後、窒素ブローで乾燥させ、最後に紫外線オゾン洗浄を行った。次いで、正孔輸送層として、導電性高分子およびポリアニオンからなるPEDOT-PSS(CLEVIOS(登録商標) P VP AI 4083、ヘレオス株式会社製、導電率:1×10-3S/cm)を2.0質量%で含むイソプロパノール溶液を調製し、乾燥膜厚が約30nmになるように、基板を65℃に調温したブレードコーターを用いて塗布乾燥した。その後、120℃の温風で20秒間加熱処理して、正孔輸送層を上記第一の電極上に製膜した。これ以降は、グローブボックス中に持ち込み、窒素雰囲気下で作業した。
上記作製した光電変換素子(太陽電池)について、下記の方法に従って、耐久性の評価を行った。なお、光電変換素子(太陽電池)の基材として用いたガスバリア性フィルムとしては、上記の即評価のものおよび耐久性試験後のものの双方を用いた。
作製した有機光電変換素子を、ソーラーシミュレーター(AM1.5Gフィルタ)を用いて100mW/cm2の強度の光を照射し、有効面積を1cm2にしたマスクを受光部に重ね、IV特性を評価することで、初期光電変換効率を求めた。
Claims (12)
- 基材と、
前記基材の少なくとも一方の面に配置された、膜密度が1.5~2.1g/cm3であり無機化合物を含む第1のバリア層と、
前記基材の、前記第1のバリア層が形成されているのと同じ側の面に形成された、長周期型周期表の第2~14族の元素からなる群より選択される少なくとも1種(ただし、ケイ素および炭素を除く)の添加元素、ケイ素原子および酸素原子を含有し、かつケイ素原子に対する酸素原子の存在比(O/Si)が1.4~2.2であり、ケイ素原子に対する窒素原子の存在比(N/Si)が0~0.4である第2のバリア層と、
を有する、ガスバリア性フィルム。 - 前記添加元素が、ホウ素(B)、マグネシウム(Mg)、アルミニウム(Al)、カルシウム(Ca)、チタン(Ti)、亜鉛(Zn)、ガリウム(Ga)、ゲルマニウム(Ge)、ジルコニウム(Zr)およびインジウム(In)からなる群から選択される少なくとも1種である、請求項1に記載のガスバリア性フィルム。
- 前記添加元素が、ホウ素(B)、アルミニウム(Al)、ガリウム(Ga)およびインジウム(In)からなる群から選択される少なくとも1種である、請求項2に記載のガスバリア性フィルム。
- 前記添加元素がアルミニウム(Al)である、請求項3に記載のガスバリア性フィルム。
- 前記基材と、前記第1のバリア層と、前記第2のバリア層と、をこの順に含む構成を有する、請求項1~4のいずれか1項に記載のガスバリア性フィルム。
- 前記第1のバリア層および前記第2のバリア層を合計で3層以上有し、前記基材に最も近い側のバリア層が前記第1のバリア層であり、前記基材から最も遠い側のバリア層が前記第2のバリア層である、請求項1~5のいずれか1項に記載のガスバリア性フィルム。
- 請求項1~6のいずれか1項に記載のガスバリア性フィルムの製造方法であって、
前記基材の少なくとも一方の面に前記無機化合物またはその前駆体を含有する第1の塗布液を塗布して第1の塗膜を形成し、前記第1の塗膜を改質処理して、第1のバリア層を形成する工程を含む、ガスバリア性フィルムの製造方法。 - 前記第1のバリア層を形成する工程が、ケイ素化合物を用いたゾルゲル法、または、ポリシラザンもしくはポリシロキサンの改質により前記第1のバリア層を形成することを含む、請求項7に記載のガスバリア性フィルムの製造方法。
- 前記第1のバリア層を形成する工程が、ポリシラザンの改質により前記第1のバリア層を形成することを含む、請求項8に記載のガスバリア性フィルムの製造方法。
- 前記基材の、前記第1のバリア層を形成するのと同じ側の面に、ポリシラザンと、長周期型周期表の第2~14族の元素からなる群より選択される少なくとも1種(ただし、ケイ素および炭素を除く)の添加元素を含む添加化合物とを含有する塗布液を塗布して第2の塗膜を形成し、前記第2の塗膜を改質処理して、第2のバリア層を形成する工程をさらに含む、請求項7~9のいずれか1項に記載のガスバリア性フィルムの製造方法。
- 前記第2の塗膜に対する改質処理が、真空紫外線照射処理である、請求項10に記載のガスバリア性フィルムの製造方法。
- 請求項1~6のいずれか1項に記載のガスバリア性フィルム、または請求項7~11のいずれか1項に記載の製造方法により製造されたガスバリア性フィルムを有する、電子デバイス。
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JPWO2014192700A1 (ja) | 2017-02-23 |
US20160108282A1 (en) | 2016-04-21 |
CN105246683A (zh) | 2016-01-13 |
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