WO2014010273A1 - 積層セラミックコンデンサおよびその製造方法 - Google Patents
積層セラミックコンデンサおよびその製造方法 Download PDFInfo
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- WO2014010273A1 WO2014010273A1 PCT/JP2013/058523 JP2013058523W WO2014010273A1 WO 2014010273 A1 WO2014010273 A1 WO 2014010273A1 JP 2013058523 W JP2013058523 W JP 2013058523W WO 2014010273 A1 WO2014010273 A1 WO 2014010273A1
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Definitions
- the present invention relates to a multilayer ceramic capacitor and a method for manufacturing the same, and more specifically, a multilayer body including a plurality of stacked dielectric layers and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric layers;
- the present invention relates to a multilayer ceramic capacitor including an external electrode formed on an outer surface of a multilayer body and electrically connected to an internal electrode, and a manufacturing method thereof.
- the multilayer ceramic capacitor includes a plurality of laminated dielectric layers (dielectric ceramic layers) 11 and a plurality of layers disposed at a plurality of interfaces between the dielectric layers 11.
- a laminated body 10 having internal electrodes 12 and a pair of external electrodes 13a and 13b disposed on both end faces of the laminated body 10 so as to be electrically connected to the internal electrodes 12 exposed on the opposite end faces alternately.
- a dielectric ceramic material having a high relative dielectric constant and containing a perovskite type compound containing Ba and Ti as a main component is widely used as a material constituting the dielectric layer.
- a dielectric ceramic material 95.0 to 98.0 mol of BaTiO 3 having an unreacted BaO content of 0.7 wt% or less and a Ba / Ti ratio of 1.005 to 1.025. %, And 100 parts by weight of the main component containing 2.0 to 5.0 mol% of at least one rare earth oxide selected from La, Nd, Sm, Dy, and Er, 0% MnO as a subcomponent Proposed nonreducing dielectric ceramic composition containing 3 to 1.5 parts by weight and 0.5 to 2.5 parts by weight of oxide glass mainly composed of BaO—SrO—Li 2 O—SiO 2 (See Patent Document 1).
- This non-reducing dielectric ceramic composition has good capacitance-temperature characteristics, and it is said that the dielectric layer can be made thin by using it as a dielectric layer (dielectric ceramic layer) of a multilayer ceramic capacitor. Yes.
- An object of the present invention is to solve the above-mentioned problems, and to provide a highly reliable multilayer ceramic capacitor having a small change in insulation resistance with time in a high-temperature load test and having excellent insulation deterioration resistance and a method for manufacturing the same. To do.
- the multilayer ceramic capacitor of the present invention is A laminate having a dielectric ceramic comprising a plurality of crystal particles, and having a plurality of laminated dielectric layers, and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric layers; An external electrode formed on the outer surface of the laminate and electrically connected to the internal electrode;
- a multilayer ceramic capacitor comprising:
- the laminate is A perovskite-type compound containing Ba and Ti, La, Mg, Mn, and Al;
- the ratio of the content of La, Mg, Mn, and Al with respect to the content of Ti is 100 mol parts of Ti, La: 0.2 to 1.2 mol parts Mg: 0.1 mol parts or less Mn: 1.0 to 3.0 mol parts Al: in the range of 0.5 to 2.5 mol parts, and
- the average number of the crystal grains included in the dielectric layer in the stacking direction per one dielectric layer is 1 or more and 3 or less.
- the multilayer ceramic capacitor of the present invention is A laminate having a dielectric ceramic comprising a plurality of crystal particles, and having a plurality of laminated dielectric layers, and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric layers; An external electrode formed on the outer surface of the laminate and electrically connected to the internal electrode;
- a multilayer ceramic capacitor comprising:
- the laminate is A perovskite-type compound containing Ba and Ti, La, Mg, Mn, and Al; When the laminate is dissolved to form a solution, when the laminate is dissolved to form a solution, when the ratio of the content of La, Mg, Mn, and Al to the content of Ti in the solution is 100 mol parts of Ti, La: 0.2 to 1.2 mol parts Mg: 0.1 mol parts or less Mn: 1.0 to 3.0 mol parts Al: in the range of 0.5 to 2.5 mol parts, and The average number of the crystal grains included in the dielectric layer in the stacking direction per one dielectric layer is
- “when the laminate is dissolved to form a solution” refers to the case where the laminate is dissolved with an acid to form a solution, or after the laminate is alkali-melted and then dissolved in an acid or the like. It is a concept that means the case of the above, and there is no particular restriction on the method of dissolving the solution into a solution.
- the multilayer ceramic capacitor of the present invention is A laminate having a dielectric ceramic comprising a plurality of crystal particles, and having a plurality of laminated dielectric layers, and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric layers; An external electrode formed on the outer surface of the laminate and electrically connected to the internal electrode;
- a multilayer ceramic capacitor comprising:
- the dielectric layer is A perovskite-type compound containing Ba and Ti, La, Mg, Mn, and Al; When the ratio of the content of La, Mg, Mn, and Al with respect to the content of Ti is 100 mol parts of Ti, La: 0.2 to 1.2 mol parts Mg: 0.1 mol parts or less Mn: 1.0 to 3.0 mol parts Al: in the range of 0.5 to 2.5 mol parts, and
- the average number of the crystal grains included in the dielectric layer in the stacking direction per one dielectric layer is 1 or more and 3 or less.
- the method for manufacturing the multilayer ceramic capacitor of the present invention includes: A laminate having a dielectric ceramic comprising a plurality of crystal particles, and having a plurality of laminated dielectric layers, and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric layers;
- a method for producing a multilayer ceramic capacitor comprising: (A) By mixing and slurrying a powder containing a perovskite type compound containing Ba and Ti, a La compound powder, a Mg compound powder, a Mn compound powder, and an Al compound powder, When the ratio of the content of La, Mg, Mn, and Al with respect to the content of Ti is such that the content of Ti is 100 mole parts, La: 0.2 to 1.2 mol parts Mg: 0.1 mol parts or less Mn: 1.0 to 3.0 mol parts Al: 0.5 to 2.5 mol parts A ceramic slurry in the range of is prepared.
- Process (B) forming the ceramic slurry into a sheet to obtain a ceramic green sheet; (C) forming an unfired laminate in which the ceramic green sheet and a conductor pattern that becomes an internal electrode after firing are stacked; (D) The unsintered laminate is fired to have a structure in which internal electrodes are disposed between dielectric layers, and the crystal particles included in the dielectric layer per layer of the dielectric layer Obtaining a laminate having an average number in the stacking direction of 1 or more and 3 or less; It is characterized by having.
- the multilayer ceramic capacitor of the present invention includes a plurality of dielectric layers (dielectric ceramic layers) having a dielectric ceramic including a plurality of crystal grains, and a plurality of internal electrodes disposed at a plurality of interfaces between the dielectric layers.
- the dielectric constant of the dielectric layer is high and small It is possible to realize a large capacity, yet, MTTF in high-temperature load test of a product is high, it is possible to obtain a highly reliable multilayer ceramic capacitor.
- the ratio of La, Mg, Mn, and Al to Ti is within the range as in the present invention.
- the ratio of La, Mg, Mn, and Al to Ti is within the range as in the present invention.
- the average number of crystal grains contained in the dielectric layer in the stacking direction per dielectric layer is 3 or less (reducing the number of grain boundaries)
- a high relative dielectric constant is ensured.
- the “solution” The ratio of La, Mg, Mn, and Al content to the Ti content is La: 0.2 to 1.2 mol parts, Mg: 0.1 mol, when Ti is 100 mol parts.
- the dielectric layer has a high relative dielectric constant, can realize a small size and a large capacity, and can be manufactured at a high temperature.
- a multilayer ceramic capacitor having high MTTF in the load test and high reliability can be obtained.
- the “dielectric layer” constituting the laminate includes a perovskite type compound including Ba and Ti, and La, Mg, Mn, and Al, and the contents of La, Mg, Mn, and Al with respect to the Ti content.
- Ti is 100 mol parts
- La 0.2 to 1.2 mol parts
- Mg 0.1 mol parts or less
- Mn 1.0 to 3.0 mol parts
- Al 0
- the condition is that the average number of crystal particles in the stacking direction per dielectric layer is in the range of 1 to 3 and in the range of 0.5 to 2.5 mole parts.
- the method for producing a multilayer ceramic capacitor of the present invention comprises mixing a powder containing a perovskite type compound containing Ba and Ti with a La compound powder, a Mg compound powder, a Mn compound powder, and an Al compound powder. And the ratio of the contents of La, Mg, Mn, and Al with respect to the Ti content is such that when the Ti content is 100 mole parts, La: 0.2 to 1.2 mole parts, Mg: 0.3%.
- Ceramic green sheet obtained by preparing a ceramic slurry in the range of 1 mol part or less, Mn: 1.0-3.0 mol part, Al: 0.5-2.5 mol part, and molding this ceramic slurry And a non-fired laminated body in which conductive patterns that become internal electrodes after firing are stacked, and then the unfired laminated body is fired to have internal electrodes disposed between dielectric layers.
- the average number of crystal grains contained in the electrical conductor layer in the stacking direction per dielectric layer is 1 or more and 3 or less, the above-described requirements of the present invention are provided.
- a multilayer ceramic capacitor can be manufactured efficiently.
- 1 is a perspective view of a multilayer ceramic capacitor according to an embodiment of the present invention.
- 1 is a front sectional view of a multilayer ceramic capacitor according to an embodiment of the present invention. It is a figure for demonstrating the method to measure the average number of crystal grains per dielectric layer of the multilayer ceramic capacitor concerning embodiment of this invention.
- each powder was weighed so that the content ratio of Ba to Ti was 102.5 mol parts with respect to 100 mol parts of Ti.
- each weighed powder was mixed by a ball mill using water as a medium, calcined at 1050 ° C., and then pulverized to obtain a perovskite type compound powder (ceramic powder) containing Ba and Ti.
- the Ba site may contain Ca and Sr, and the Ti site may contain Zr and Hf.
- calcination was performed at 1050 ° C., but the calcination temperature is not limited to this, and a temperature suitable for obtaining desired characteristics can be selected as appropriate.
- the ratio of the content of each additive component to Ti in the powder is the ratio shown in Tables 1A and 1B with respect to 100 mol parts of Ti.
- Al 2 O 3 , MgCO 3 , MnCO 3 are added
- SiO 2 is added at a ratio of 1.5 parts by mole.
- a dielectric material was obtained by mixing in water with a ball mill.
- a polyvinyl butyral binder and an organic solvent such as ethanol were added and wet mixed by a ball mill to prepare a ceramic slurry.
- this ceramic slurry was formed into a sheet by a doctor blade method so that the thickness of the dielectric layer (dielectric ceramic layer) after firing was 2.0 ⁇ m, and a rectangular ceramic green sheet was obtained.
- a conductive paste containing Ni as a conductive component was screen-printed on the ceramic green sheet to form a conductor pattern (internal electrode pattern) that became an internal electrode after firing.
- a plurality of ceramic green sheets on which conductor patterns (internal electrode patterns) were formed were laminated so that the conductor pattern drawn-out sides were alternately opposite to each other to obtain an unfired laminate. And the binder was removed by heating this unbaked laminated body in air at 270 degreeC.
- the laminated body from which the binder has been removed is sintered by being held in a reducing atmosphere composed of H 2 —N 2 —H 2 O gas at 1160 to 1260 ° C. for 2 hours and sintered.
- a laminate was obtained.
- the temperature at the time of holding for 2 hours is appropriately adjusted within the above-mentioned range of 1160 to 1260 ° C., so that the dielectric layer of crystal particles contained in the dielectric layer (dielectric ceramic layer) is obtained.
- the average number (average particle number) in the stacking direction per layer was controlled.
- the multilayer ceramic capacitor includes a plurality of laminated dielectric layers (dielectric ceramic layers) 11 and a plurality of layers disposed at a plurality of interfaces between the dielectric layers 11.
- a pair of external electrodes (Cu electrodes) 13a and 13b are formed on both end surfaces of a laminated body (multilayer ceramic element) 10 having a plurality of internal electrodes 12 so as to be electrically connected to internal electrodes 12 exposed on opposite end surfaces. It has an arranged structure.
- the dimensions of the multilayer ceramic capacitor fabricated as described above are 1.0 mm in width (W), 2.0 mm in length (L), and 0.4 mm in thickness (T), and are interposed between internal electrodes.
- the thickness of the dielectric layer 11 was 2.0 ⁇ m
- the thickness of the internal electrode 12 was 1.0 ⁇ m.
- the total number of effective dielectric ceramic layers excluding the outer layer portion was 100, and the counter electrode area per layer was 1.6 mm 2 .
- the average number of crystal grains contained in the dielectric layer per dielectric layer was determined by the intercept method.
- a specific method for measuring the average number of crystal grains per dielectric layer is as follows.
- the multilayer body (multilayer ceramic element) 10 was broken along the width (W) direction and the thickness (T) direction at approximately the center in the length (L) direction of the multilayer ceramic capacitor. Then, in order to clarify the boundary (grain boundary) between grains in the dielectric layer 11, the fractured laminate (sample) was heat-treated.
- the temperature of the heat treatment was set to a temperature at which no grain growth occurred and a grain boundary became clear. In this embodiment, the temperature was set to 1000 ° C.
- region F (FIG. 3).
- 200 crystal grains are randomly extracted from the measurement region, and 200 grains are measured using a diameter method in which the maximum length of each crystal grain in a direction parallel to the main surface of the internal electrode is a grain size.
- the crystal grain size was measured and the average value was obtained as the average grain size.
- Table 1A and Table 1B show the measurement results of the average number of crystal grains (average number of grains) per layer of the samples (multilayer ceramic capacitors) of sample numbers 1 to 30 produced in this embodiment.
- the high temperature load test is performed on 100 samples of each sample number, a sample having an insulation resistance value of 100 k ⁇ or less is determined as a failure, and an average failure time (MTTF) of 50% is obtained from a Weibull analysis of the failure time. It was. MTTF of 650h or less was out of standard.
- the relative dielectric constant of the dielectric layer was calculated from the capacitance of the multilayer ceramic capacitor.
- the capacitance of the multilayer ceramic capacitor was measured with a digital LCR meter (HP 4284A) under conditions of a frequency of 1 kHz and a measurement voltage of 1 Vrms / ⁇ m.
- the relative dielectric constant ⁇ r is set to 3000 or more.
- Tables 1A and 1B show relative dielectric constants ⁇ r of the dielectric layers of the samples Nos. 1 to 30 manufactured in this embodiment.
- the sample number marked with * is a sample that does not satisfy the requirements of the present invention, and the other samples are samples that indicate the requirements of the present invention.
- the amount of La added is as small as 0.1 mole part, such as the samples of sample numbers 1 and 2, the average number of crystal particles per one dielectric layer (average particle number) Regardless of this, it was confirmed that the deterioration of the insulation resistance in the high-temperature load test was significant. Moreover, it was confirmed that the deterioration of the insulation resistance in the high-temperature load test was remarkable even in the case where the amount of La added was 1.5 mol part and exceeded the range of the present invention as in the sample of sample number 14. It was done.
- sample having a composition containing La within the scope of the present invention, such as samples of sample numbers 3, 5, 10, 12, 20, 21, 25, 26, crystals per dielectric layer
- Samples with a large average number of particles (average number of particles) are subjected to a high temperature load test as compared with samples having an average number of crystal particles per dielectric layer within the range of the present invention. It was confirmed that the resistance in the case was inferior.
- samples such as Sample Nos. 8 and 9 have a Mg addition amount that exceeds the range of the present invention, and the Mg addition amount is the present invention regardless of the average number of crystal grains per dielectric layer. It was confirmed that the resistance in the high temperature load test was inferior compared with the samples in the range of.
- the samples with the Al addition amount outside the range of the present invention such as the samples of Sample Nos. 15 and 16, are inferior in resistance to the high temperature load test as compared with the sample with the Al addition amount within the range of the present invention. Was confirmed.
- the samples with the Mn addition amount outside the range of the present invention such as the samples of Sample Nos. 23 and 24, are inferior in resistance to the high temperature load test as compared with the sample with the Mn addition amount within the range of the present invention. Was confirmed.
- the ratio of La, Mg, Mn, and Al content with respect to the Ti content in the case of performing the ICP emission spectroscopic analysis on the laminate was, when the Ti content was 100 mol parts La: 0.2 to 1.2 mol parts, Mg: 0.1 mol parts or less, Mn: 1.0 to 3.0 mol parts, Al: 0.5 to 2.5 mol parts,
- the dielectric layer exhibits a high relative dielectric constant and has a high resistance to insulation deterioration in a high-temperature load test. It was confirmed that a multilayer ceramic capacitor having high reliability can be obtained.
- the ratio of La, Mg, Mn, and Al content to the Ti content is examined for the laminate, but the dielectric layer constituting the laminate is measured with respect to the Ti content. It is also possible to examine the ratio of the contents of La, Mg, Mn, and Al.
- this invention is not limited to the said embodiment, La, Mg, Mn, and Al with respect to content of Ti in the dielectric material layer and internal electrode which comprise a laminated body, and the Ti content in a laminated body or a dielectric material Various applications and modifications can be made within the scope of the invention with respect to the ratio of the content of.
Abstract
Description
複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
前記積層体の外表面に形成され、前記内部電極と電気的に接続されている外部電極と、
を備える積層セラミックコンデンサであって、
前記積層体が、
BaおよびTiを含むペロブスカイト型化合物と、Laと、Mgと、Mnと、Alとを含み、
Tiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiを100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあり、かつ、
前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下であること
を特徴としている。
複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
前記積層体の外表面に形成され、前記内部電極と電気的に接続されている外部電極と、
を備える積層セラミックコンデンサであって、
前記積層体が、
BaおよびTiを含むペロブスカイト型化合物と、Laと、Mgと、Mnと、Alとを含み、
前記積層体を溶解処理して溶液とした場合において、前記溶液中のTiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiを100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあり、かつ、
前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下であること
を特徴としている。
複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
前記積層体の外表面に形成され、前記内部電極と電気的に接続されている外部電極と、
を備える積層セラミックコンデンサであって、
前記誘電体層が、
BaおよびTiを含むペロブスカイト型化合物と、Laと、Mgと、Mnと、Alとを含み、
Tiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiを100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあり、かつ、
前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下であること
を特徴としている。
複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
を備えた積層セラミックコンデンサを製造するための方法であって、
(a)Baと、Tiとを含むペロブスカイト型化合物を含有する粉末と、La化合物粉末と、Mg化合物粉末と、Mn化合物粉末と、Al化合物粉末とを混合してスラリー化することにより、
Tiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiの含有量を100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあるセラミックスラリーを調製する工程と、
(b)前記セラミックスラリーをシート状に成形して、セラミックグリーンシートを得る工程と、
(c)前記セラミックグリーンシートと、焼成後に内部電極となる導体パターンとが積み重ねられた未焼成の積層体を形成する工程と、
(d)前記未焼成の積層体を焼成して、誘電体層間に内部電極が配設された構造を有し、前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下である積層体を得る工程と、
を備えることを特徴としている。
積層セラミックコンデンサを作製するために、まず、BaおよびTiを含むペロブスカイト型化合物(チタン酸バリウム系複合酸化物)の出発原料として、BaCO3およびTiO2の各粉末を用意した。
また、誘電体層に含まれる結晶粒子の誘電体1層あたりの平均個数(平均粒子数)を、インターセプト法により求めた。この結晶粒子の誘電体1層あたりの平均個数の具体的な測定方法は以下の通りである。
また、上述のようにして得られた積層セラミックコンデンサについて、高温負荷試験を行った。この高温負荷試験においては、温度150℃にて、30Vの電圧を印加して、絶縁抵抗の経時変化を観察した。
また、誘電体層の比誘電率は、積層セラミックコンデンサの静電容量から算出した。積層セラミックコンデンサの静電容量は、デジタルLCRメータ(HP製4284A)にて、周波数1kHz、測定電圧1Vrms/μmの条件下で測定した。なお、この実施形態では、比誘電率εr:3000以上を基準とした。
この実施形態において作製した試料番号1~30の試料の誘電体層の比誘電率εrを表1A、表1Bに併せて示す。
表1A、表1Bより、本発明の要件を備えた試料(試料番号に*を付していない試料)は、高温負荷試験におけるMTTFの値が650h以上で、絶縁性劣化耐性が大きく、高い信頼性を備えていることが確認された。
また、本発明の要件を備えた試料(試料番号に*を付していない試料)においては、誘電体層が高い比誘電率を示すことが確認された。
11 誘電体層(誘電体セラミック層)
12 内部電極
13a,13b 外部電極
F 測定領域
L 長さ
T 厚さ
W 幅
Claims (4)
- 複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
前記積層体の外表面に形成され、前記内部電極と電気的に接続されている外部電極と、
を備える積層セラミックコンデンサであって、
前記積層体が、
BaおよびTiを含むペロブスカイト型化合物と、Laと、Mgと、Mnと、Alとを含み、
Tiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiを100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあり、かつ、
前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下であること
を特徴とする積層セラミックコンデンサ。 - 複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
前記積層体の外表面に形成され、前記内部電極と電気的に接続されている外部電極と、
を備える積層セラミックコンデンサであって、
前記積層体が、
BaおよびTiを含むペロブスカイト型化合物と、Laと、Mgと、Mnと、Alとを含み、
前記積層体を溶解処理して溶液とした場合において、前記溶液中のTiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiを100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあり、かつ、
前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下であること
を特徴とする積層セラミックコンデンサ。 - 複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
前記積層体の外表面に形成され、前記内部電極と電気的に接続されている外部電極と、
を備える積層セラミックコンデンサであって、
前記誘電体層が、
BaおよびTiを含むペロブスカイト型化合物と、Laと、Mgと、Mnと、Alとを含み、
Tiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiを100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあり、かつ、
前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下であること
を特徴とする積層セラミックコンデンサ。 - 複数の結晶粒子を備える誘電体セラミックを有し、積層されている複数の誘電体層と、前記誘電体層間の複数の界面に配設されている複数の内部電極とを有する積層体と、
を備えた積層セラミックコンデンサを製造するための方法であって、
(a)Baと、Tiとを含むペロブスカイト型化合物を含有する粉末と、La化合物粉末と、Mg化合物粉末と、Mn化合物粉末と、Al化合物粉末とを混合してスラリー化することにより、
Tiの含有量に対するLa、Mg、Mn、およびAlの含有量の割合が、Tiの含有量を100モル部としたときに、
La:0.2~1.2モル部
Mg:0.1モル部以下
Mn:1.0~3.0モル部
Al:0.5~2.5モル部
の範囲にあるセラミックスラリーを調製する工程と、
(b)前記セラミックスラリーをシート状に成形して、セラミックグリーンシートを得る工程と、
(c)前記セラミックグリーンシートと、焼成後に内部電極となる導体パターンとが積み重ねられた未焼成の積層体を形成する工程と、
(d)前記未焼成の積層体を焼成して、誘電体層間に内部電極が配設された構造を有し、前記誘電体層に含まれる前記結晶粒子の、前記誘電体層1層あたりの積層方向の平均個数が1個以上3個以下である積層体を得る工程と、
を備えることを特徴とする積層セラミックコンデンサの製造方法。
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KR101650745B1 (ko) | 2016-08-24 |
JP5994853B2 (ja) | 2016-09-21 |
KR20150027165A (ko) | 2015-03-11 |
US9373445B2 (en) | 2016-06-21 |
CN104395977A (zh) | 2015-03-04 |
JPWO2014010273A1 (ja) | 2016-06-20 |
CN104395977B (zh) | 2017-09-15 |
US20150103467A1 (en) | 2015-04-16 |
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