WO2013027299A1 - 結晶材料の真空保管方法および装置 - Google Patents
結晶材料の真空保管方法および装置 Download PDFInfo
- Publication number
- WO2013027299A1 WO2013027299A1 PCT/JP2011/069233 JP2011069233W WO2013027299A1 WO 2013027299 A1 WO2013027299 A1 WO 2013027299A1 JP 2011069233 W JP2011069233 W JP 2011069233W WO 2013027299 A1 WO2013027299 A1 WO 2013027299A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- crucible
- mold
- raw material
- vacuum
- cap
- Prior art date
Links
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F1/00—Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
- C30B11/002—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/42—Gallium arsenide
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
- C30B35/007—Apparatus for preparing, pre-treating the source material to be used for crystal growth
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F26—DRYING
- F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
- F26B3/00—Drying solid materials or objects by processes involving the application of heat
- F26B3/18—Drying solid materials or objects by processes involving the application of heat by conduction, i.e. the heat is conveyed from the heat source, e.g. gas flame, to the materials or objects to be dried by direct contact
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B22—CASTING; POWDER METALLURGY
- B22F—WORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
- B22F3/00—Manufacture of workpieces or articles from metallic powder characterised by the manner of compacting or sintering; Apparatus specially adapted therefor ; Presses and furnaces
Definitions
- the present invention relates to a storage method and transfer of a metal melting material and a sintered metal material.
- raw materials used for the growth of sintered metal materials, gallium arsenide crystals for semiconductors, silicon single crystals or silicon polycrystals, and subsequent crystal growth methods are stored and used in plastic film packaging. At times, a method of opening the container and putting it in a process container has been taken. In particular, in the crystal manufacturing process, raw materials are charged into a quartz crucible at room temperature and stored or incorporated into a furnace.
- Patent Document 1 discloses that a flocculant is added to an aqueous dispersion of metal fine particles adsorbed with a surfactant and lipid. A method is described in which the metal fine particles are added and agglomerated and settled, and the aggregates of the precipitated metal fine particles are vacuum-dried to obtain a dried product in which the metal fine particles can be redispersed in water.
- Patent Document 1 describes a method for obtaining a dry product redispersible in water.
- a polycrystalline raw material used for growing a sintered metal material or a semiconductor crystal high purity is obtained.
- a minute amount of moisture adsorbed on the surface causes a problem of deterioration of the in-furnace parts in the subsequent crystal growth process, and there is a problem that carbon reacted with moisture is mixed into the grown crystal.
- the present invention prevents deterioration of carbon parts in a furnace called a hot zone in the course of silicon single crystal growth using a sintered metal material or CZ method, which is a single crystal growth method for semiconductors, and reduces the carbon concentration in the grown crystal.
- the purpose is to improve the ratio of polycrystallizing single crystals.
- An object of the present invention is to solve problems such as mixing of silicon, reaction of molten silicon and carbon, and generation of SiC, which is taken into a growing crystal and transformed.
- the present invention dries moisture adsorbed on a sintered metal material capable of maintaining a high vacuum and its formwork, a crucible for performing single crystal growth for semiconductors, and a raw crystal filled in the crucible. Enhance the quality of sintered metal products or prevent the transition of growing silicon single crystals by removing, or chemically reacting with residual adsorbates, detoxifying and evacuating
- the present invention provides a single crystal growth step and a single crystal growth method capable of obtaining a high quality crystal having a low carbon concentration with a high yield.
- a mold filled with a sintered metal material, or an opening of a crucible filled with a raw material for crystal growth for semiconductors of gallium arsenide crystals and silicon single crystals or silicon polycrystals Is closed with a cap provided with a supply pipe and a vacuum exhaust pipe, and the inside of the mold or the crucible is evacuated through the vacuum exhaust pipe to obtain a high vacuum state of 10 minus 4 torr or less. And a heating and drying step of filling the inside of the mold or the crucible through the supply pipe with a high-temperature inert gas of 50 ° C. or more and 200 ° C.
- Sintered metal materials are made by mixing various metal powders and baking them at a high temperature to form parts. In this case, moisture, air, and other gas components contained in the air are mixed, which reduces the quality. May be connected.
- a high quality sintered alloy product can be obtained by drying and degassing.
- VGF method unidirectional solidification crystal growth method for growing silicon and gallium arsenic crystals
- drying, degassing, and moisture removal are important for further quality improvement in the raw material charging process. In this growth, not only the crystal quality is improved, but also the effect of extending the life of the in-furnace parts is obtained.
- the initial vacuum reach inside the mold or the crucible is set to 10 minus 4 Torr or less
- the high-temperature inert gas is set to 50 ° C. or more and 200 ° C. or less
- the raw material crystal or sintering is performed using the inert gas. If the metal material is heated, re-adsorption can be prevented, and high-quality product crystals and sintered products can be obtained.
- vacuuming is performed to a high vacuum degree of 10 minus 4 Torr or less using a cryopump, a diffusion pump, or a molecular pump. May be performed.
- vacuuming is performed in a short time using a cryopump, a diffusion pump, or a molecular pump to a high vacuum level of 10 minus 4 torr or less. Therefore, it is effective for removing residual gas and moisture.
- the high-temperature inert gas After raising the temperature of the raw material with the high-temperature inert gas, the high-temperature inert gas is exhausted, and the interior of the mold or the crucible is again brought into a high vacuum state of 10 minus 4 Torr or less, and then the high-temperature inert gas is discharged.
- the active gas may be refilled. That is, by repeating gas replacement and evacuation, the atmosphere can be further improved, the temperature of the raw material can be raised, and the adsorbed gas and moisture can be reduced.
- the mold with the cap enclosing the raw material is transferred to a place where sintering is performed, or crystal growth of the crucible with the cap enclosing the raw material is performed. May include transport to a location. Moreover, you may heat from the outer side of the said mold or the said crucible of the state which covered the said cap, and you may heat-retain. That is, not only the temperature of the raw material in the mold and the crucible is raised by the temperature raising gas, but also the temperature of the raw material can be raised in a short time by raising the temperature from the outside of the mold and the crucible.
- Monosilane gas may be mixed into the high temperature inert gas.
- Monosilane gas diluted with a heated inert gas is effective in exhausting residual moisture and adsorbed gas, and removes moisture contained in the porous furnace material inside the furnace during subsequent heating in the furnace. Are better.
- the storage device has a mold filled with a sintered metal material, or an opening of a crucible filled with a raw material for crystal growth for semiconductors of gallium arsenide crystals and silicon single crystals or silicon polycrystals, Closed with a cap provided with a supply pipe and a vacuum exhaust pipe, the inside of the mold or the crucible is evacuated through the vacuum exhaust pipe, and the mold or the crucible is placed at 50 ° C. or more through the supply pipe. Filling with a high-temperature inert gas of 200 ° C. or less, raising the temperature of the raw material, drying, and storing the mold or the crucible in a state of covering the cap.
- Crystal growth of the crucible with the cap covering the raw material, or the transporter to the place where sintering is performed, or the crucible with the cap covering the raw material is performed. You may have a conveyance machine to the place where it is done. Transfer to the sintering furnace and transfer to the crystal growth furnace are performed under reduced pressure or in a vacuum state by fitting into the transfer arm attachment / detachment part of the cap adsorbed to the mold or crucible, and the transfer arm is directly used in the next process (sintering process or crystal growth process ) To carry it.
- the sintered metal material filled in the mold or crucible or the semiconductor crystal material can be surely vacuum-dried, and the material can be transferred to a sintering furnace or a crystal growth furnace.
- the sintered metal material or the semiconductor crystal material is surely vacuum-dried, and since the temperature rises even after being exposed to air after the temperature rises, moisture in the air is adsorbed to the raw material.
- the vacuum level can be improved and a high degree of vacuum can be reached in a short time during subsequent sintering and crystal growth processes.
- a high-quality sintered alloy can be obtained, and it is also possible to reliably prevent transition during single crystal growth and prevent polycrystallization.
- the crystal yield can be improved and the life of the in-furnace parts can be extended. In crystal growth, the impurity level and defect nuclei can be reduced.
- the temperature rise in this invention, vacuum drying, and the schematic diagram of a conveyance system are shown.
- the schematic diagram which added the supply of monosilane gas and the external heating apparatus to the temperature rising, vacuum drying, and conveyance system in this invention is shown.
- movement flowchart of the apparatus transferred to the following process after storage of the raw material in this invention is shown.
- FIG. 1 the schematic diagram of the temperature rising in this invention, vacuum drying, and a conveyance system is shown.
- a storage system 1 covers a mold and a crucible 3 with a cap 2, opens a valve 4, passes through a vacuum distributor 5, a vacuum exhaust valve 10, and an exhaust valve 12, and the cap 2 is attached by a vacuum pump 11.
- the covered mold and the inside of the crucible 3 are evacuated.
- the argon gas valve 15 on the supply side of the inert gas is closed, the gas flow rate regulator 7, the gas filter 8, the temperature raising heat exchanger 9, and the valve 4 connected thereto are opened, and the argon gas valve 15 is opened.
- the piping of the gas supply system up to just before the gas valve 15 is also in a vacuum state.
- the internal pressure of the mold and crucible 3 can be measured by a vacuum gauge 6.
- the vacuum gauge 6 uses a Pirani vacuum gauge or an ionization vacuum gauge according to the vacuum level.
- the vacuum valve 12 When the vacuum level enters the region of the cryopump 14, the vacuum valve 12 is closed and the vacuum valve 13 is opened to perform evacuation. After a high vacuum is obtained by the cryopump 14, the vacuum valve 13 is closed, the temperature raising heat exchanger 9 is operated, the argon gas valve 15 is opened, and the inside of the mold and the crucible 3 is filled with the heated argon gas. .
- the vacuum exhaust valve 10 and the exhaust valve 12 are adjusted, and a part of the temperature rising gas whose temperature has dropped is extracted, a new temperature rising gas is flowed, and the raw material inside the mold and the crucible 3 is raised. Warm up.
- the series of operations may be automatically controlled by a PLC (programmable logic controller) or a microcomputer system.
- PLC programmable logic controller
- microcomputer system a microcomputer system.
- the above-described automatic control is more effective.
- the temperature of the mold and the crucible 3 can be automatically monitored simultaneously by the temperature sensor, which is convenient.
- the gas heating heat exchanger 9 can also be used for gas filling in a sintering furnace or a crystal growth furnace.
- the raw material in which the raw material is filled in the mold and the crucible 3 is thus stored in a good dry state by the high vacuum and the inert temperature rising gas.
- the transfer to the furnace is performed by connecting the transfer arm attaching / detaching portion 20 attached to the upper part of the mold and crucible 3 covered with the cap 2 to the transfer mechanism by a handling robot or a simple heavy load transfer device. be able to. If the gas supply line and the vacuum exhaust pipe in FIG. 1 are pipes that can be moved freely, the pipes can be transported in a connected state. Further, since the raw material filled in the mold and crucible 3 is heated, moisture is not adsorbed on the raw material surface even if it is once exposed to the air thereafter.
- FIG. 2 is a schematic diagram in which a monosilane gas supply and an external heating device are added to the temperature raising, vacuum drying and conveying system in the present invention.
- Heating from the outside of the mold and crucible 3 by the external heater 19 makes it possible to heat the mold having a large heat capacity, the crucible 3 and the raw material filled in the mold and the crucible 3 in a short time.
- the upstream side of the argon gas valve 15 is branched, and a small amount of monosilane gas (SiH 4 ) is adjusted to pure argon gas via the monosilane gas valve 17 by the gas flow rate regulator 7, so that the above-described argon gas valve 15. From the valve 4, the temperature rising gas can be supplied to the mold and the crucible 3 through the gas filter 8, the gas flow rate regulator 7, and the temperature rising heat exchanger 9.
- the mold and the crucible 3 are attached.
- the internal vacuum state closed by the cap 2 or the gas filling state can be independently separated.
- the pipe attaching / detaching unit 18 has a stop valve and has a structure capable of maintaining a reduced pressure or a vacuum state. Since the transfer arm detachable portion 20 can be attached to and removed from the cap 2 with a handling robot or a simple heavy-duty conveyor, the mold and crucible 3 are closed by the cap 2 as described above in an internal vacuum state or a reduced pressure state. It can be moved by connecting to a transport mechanism.
- a gas abatement device 21 is attached to the exhaust port of the vacuum pump 11 for evacuation, and although it is a small amount, safety measures for handling monosilane gas (SiH 4 ) can be taken.
- argon gas is used as the inert gas, but helium gas may be used as the inert gas. (Not shown)
- the inert gas supply system including the temperature rising heat exchanger 9 and the mixed supply mechanism of monosilane gas (SiH 4 ) can be shared with the subsequent sintering process and crystal growth process.
- the vacuum drying and storage system, the sintering process, the inert gas supply system including the temperature raising heat exchanger 9 in the crystal growth process, and the monosilane gas (SiH 4 ) mixed supply mechanism are independently provided. It is not necessary to have it, it is economical, and the apparatus can be simplified.
- FIG. 3 shows an operation flow diagram of an apparatus for transferring to the next process after storing raw materials in the present invention.
- a step of filling raw materials into the mold and crucible 3 in the raw material and crucible preparation in the sintered metal manufacturing process and semiconductor crystal manufacturing process (STEP-1).
- This process is performed in an air atmosphere with a high degree of cleanliness in the production of semiconductor crystals that do not want to be mixed with impurities.
- a clean filter is provided in the upper part of a cover for realizing a clean region simply called a clean room or a clean booth, and the work is performed in a mechanism in which air with high cleanliness is sent into the cover by a blower. This prevents dust from adhering to the raw material being filled.
- the raw material assembling step is to fill the mold and crucible 3 with raw materials (STEP-2).
- raw materials In the case of sintered metal, it is a raw material in powder form, and a powder mixed with various metal powders is transferred from the container to the formwork and filled into the formwork. Wear clean gloves on your hands and perform filling without contaminating the bulk material.
- the mold 2 and the crucible 3 filled with the raw materials are covered with the cap 2 and sealed, and the inside of the mold and the crucible 3 is vacuum-evacuated (STEP-3).
- the rough vacuuming is performed by operating a rotary type vacuum pump or a booster pump for further accelerating the vacuum in series with the rotary type vacuum pump.
- High vacuuming is performed by using a cryopump or a diffusion pump to bring the degree of vacuum inside the mold and the crucible 3 to a high vacuum level in a short time with the cap 2 covered and sealed.
- the temperature rising gas is supplied into the mold and crucible 3 with the cap 2 covered and sealed (STEP-6).
- the primary side gate valve of a vacuum pump such as a cryopump or a diffusion pump is closed.
- a small amount of monosilane gas (SiH 4 ) may be mixed and supplied to the argon gas, and the ratio of the monosilane gas in the argon gas may be about 0.01% to 3%.
- a vacuum gauge is used to check whether the pressure inside the mold and the crucible 3 is normal (STEP-7).
- the transport arm attaching / detaching portion 20 of FIG. 2 is attached to the arm of the handling robot or the arm of the simple heavy-duty transport device. (STEP-9).
- the process proceeds to the next process, a sintering process and a semiconductor crystal growth process.
- the temperature of the raw material, the mold, and the inside of the crucible 3 is raised and then opened in the air, moisture in the air is less likely to be adsorbed to the raw material. Therefore, a high-quality sintered metal or semiconductor crystal can be obtained in the subsequent sintering process or semiconductor crystal growth.
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Inorganic Chemistry (AREA)
- Mechanical Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Microbiology (AREA)
- Life Sciences & Earth Sciences (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Silicon Compounds (AREA)
Abstract
Description
特に、結晶の製造工程においては、石英ルツボに原材料を常温でチャージし、保管あるいは炉への組込を行ってきた。
焼結金属材料は、多種の金属粉を混ぜ合わせ高温下で焼き固め、部品形状とするが、この場合、空気中の湿度として含まれる水分や空気、その他のガス成分が混入し、品質低下に繋がる場合がある。しかしながら、乾燥、脱ガスによって高品質焼結合金製品が得られる。また、シリコンや、ガリュームヒ素の結晶を成長させるVGF法(一方向凝固結晶成長法)においても、原料のチャージ工程で乾燥、脱ガス、水分除去が更に品質向上に重要であり、また、単結晶の成長においては、結晶品質の改善のみならず、炉内部品の寿命を延ばす効果が得られる。
また、前記キャップを被せた状態の前記型枠または前記坩堝の外側から加熱し、保温してもよい。つまり、昇温ガスによって型枠や坩堝の中の原材料を昇温するばかりではなく、型枠や坩堝の外側からも昇温し、短時間で原材料を昇温することができる。
昇温した不活性ガスで希釈したモノシランガスは、残留水分や吸着ガスの排気の効果的であり、炉の内部の多孔質の炉材に含まれる水分などをその後の炉内加熱時に除去するのに優れている。
焼結炉への移送、結晶成長炉への移送は、減圧または真空状態で型枠や坩堝の吸着したキャップの搬送腕脱着部に嵌め込み、そのまま搬送腕木を次工程(焼結工程又は結晶成長工程)に動かして搬送を行うことができる。
SiH4 + 2H2O = SiO2 + 4H2 -1
SiClH3 + 2H2O = SiO2 + HCl + 3H2 -2
また、成長中の結晶中に炭素が取込まれる量を低減できるため、その後のウエーハプロセスの熱処理時に生じる炭素起因の酸素析出の低減が可能になると同時に炭素起因の結晶欠陥が低減出来るようになった。
更に、本発明によって、更に炉内部品が劣化しないため、従来プロセス条件の経時的変化を抑止することが出来たため、品質の安定化が実現できる効果が得られた。
図1に、本発明における昇温、真空乾燥と搬送システムの模式図を示す。
図において、保管システム1は、型枠、坩堝3に、キャップ2を被せ、バルブ4を開いて、真空分配器5、真空排気弁10、排気弁12を経由し、真空ポンプ11によってキャップ2を被せた型枠、坩堝3の内部を真空引きする。
この時、不活性ガスを供給する側のアルゴンガス弁15は閉じており、ガス流量調節器7、ガスフィルタ8、昇温熱交換器9、およびこれに接続されたバルブ4は開いており、アルゴンガス弁15直前までのガス供給系の配管も真空状態にある。また、型枠、坩堝3の内部圧力は、真空ゲージ6によって計測することが出来る。真空ゲージ6は、真空レベルに応じ、ピラニ―真空計や電離真空計を用いる。真空レベルがクライオポンプ14の領域に入ったら、真空弁12を閉じ、真空弁13を開いて真空排気を行う。
クライオポンプ14により、高真空が得られた後、真空弁13を閉じ、昇温熱交換器9を動作させアルゴンガス弁15を開き、昇温したアルゴンガスで型枠、坩堝3の内部を充填する。真空ポンプ11を動作させながら真空排気弁10、排気弁12を調節し、温度が下がった昇温ガスを一部抜き取りながら、新しい昇温ガスを流し、型枠、坩堝3の内部の原材料を昇温する。
この場合、温度センサにより、型枠、坩堝3内部の温度を同時に自動監視でき、便利である。(図示せず)
また、このガス昇温熱交換器9は、焼結炉や結晶成長炉のガスの充填にも供用出来る。
図1のガス供給ラインおよび真空排気配管を自在に動かせる配管とすれば、配管を接続した状態で搬送ができる。また、型枠、坩堝3内部に充填された原材料は、昇温されているため、その後一旦空気中に曝されても原材料表面に水分が吸着されない。
また、アルゴンガス弁15の上流側を分岐し、純粋なアルゴンガスに微量のモノシランガス(SiH4)を、モノシランガス弁17を介して、ガス流量調節器7で流量調節し、前述のアルゴンガス弁15 からガスフィルタ8とガス流量調節器7、さらに昇温熱交換器9を介してバルブ4から型枠、坩堝3に昇温ガスを供給することができる。
キャップ2には、搬送腕脱着部20がハンドリングロボットや、簡易重量物搬送機と脱着できるため、前述のように型枠、坩堝3がキャップ2によって閉ざされた内部の真空状態または、減圧状態で搬送機構と接続して移動を行うことができる。
また、図では不活性ガスとしてアルゴンガスを用いているが、同じく不活性ガスとしてヘリュームガスを用いても良い。(図示せず)
焼結金属の製造工程や、半導体結晶製造工程の原料・坩堝準備において、型枠、坩堝3に原材料を充填する工程がある(STEP-1)。この工程は、不純物の混入を嫌う半導体結晶製造においては、清浄度の高い空気中雰囲気で作業が行われる。例えば、クリーンルームであるとか、クリーンブースと呼ばれる簡易的にクリーン領域を実現するための覆いの上部にクリーンフィルタを設け、送風機によって覆いの内部に清浄度の高い空気を送り込む仕組みの中で作業を行う。これによって、充填中の原材料に塵埃が付着することが無いようにしている。
真空粗引きは、ロータリー型の真空ポンプや、さらに真空を加速するブースターポンプをロータリー型の真空ポンプに直列作動させて真空引きを行う。
高真空引きは、クライオポンプや拡散ポンプを用い、キャップ2を被せ密封したまま、短時間で、型枠、坩堝3内部の真空度を高い真空レベルに到達させる。
到達真空度が10のマイナス4乗トール以下にならない場合は、高真空引き(STEP-4)を行う。
この場合、図2の如く、アルゴンガスに微量のモノシランガス(SiH4)を混合し供給してもよく、アルゴンガス中のモノシランガスの比率は0.01%から3%程度で良い。
移送が完了すると、次工程である焼結工程や、半導体結晶成長工程に移る。
2 キャップ
3 型枠、坩堝
4 ガス供給バルブ
5 真空分配器
6 真空ゲージ
7 ガス流量調節器
8 ガスフィルタ
9 昇温熱交換器
10 真空排気弁
11 真空ポンプ
12 排気弁
13 真空弁
14 クライオポンプ
15、16 アルゴンガス弁
17 モノシランガス弁
18 配管着脱ユニット
19 外部加熱ヒータ
20 搬送腕脱着部
21 ガス除害装置
Claims (8)
- 焼結金属の原材料を充填した型枠、または、ガリュームヒ素結晶および、シリコン単結晶またはシリコン多結晶の半導体用結晶成長を行うための原材料を充填した坩堝の開口を、供給管及び真空排気管を備えたキャップで閉鎖し、前記真空排気管を介し前記型枠または前記坩堝の内部を真空引きし10のマイナス四乗トール以下の高真空状態とする真空引き工程と、前記供給管を介し前記型枠または前記坩堝の内部に50℃以上200℃以下の高温不活性ガスを充填し、前記原材料を昇温し、乾燥させる昇温乾燥工程を有し、前記キャップを被せた状態の前記型枠または前記坩堝の内部で前記原材料を保管することを特徴とする原材料の保管方法。
- 前記真空引き工程において、前記高真空状態に保持する真空排気装置として真空粗引きの後、クライオポンプまたは拡散ポンプまたは、分子ポンプを用いて、10のマイナス四乗トール以下の高真空度に真空引きを行なう請求項1に記載の原材料の保管方法。
- 前記高温不活性ガスによって前記原材料を昇温した後、前記高温不活性ガスを排気し、前記型枠または前記坩堝の内部を再び10のマイナス四乗トール以下の高真空状態としてから、前記高温不活性ガスを再充填する請求項1又は2に記載の原材料の保管方法。
- 前記原材料を内包する前記キャップを被せた状態の前記型枠の、焼結が実施される場所への移送、または、前記原材料を内包する前記キャップを被せた状態の前記坩堝の結晶成長が実施される場所への移送を含む請求項1から3のいずれか1項に記載の原材料の保管方法。
- 前記キャップを被せた状態の前記型枠または前記坩堝の外側から加熱し、保温する請求項1から4のいずれか1項に記載の原材料の保管方法。
- 前記高温不活性ガスに、モノシランガスを混入させる請求項1から5のいずれか1項に記載の原材料の保管方法。
- 焼結金属材料を充填した型枠、または、ガリュームヒ素結晶および、シリコン単結晶またはシリコン多結晶の半導体用結晶成長を行うための原材料を充填した坩堝の開口を、供給管及び真空排気管を備えたキャップで閉鎖し、前記真空排気管を介し前記型枠または前記坩堝の内部を真空引きし、前記供給管を介し前記型枠または前記坩堝の内部に50℃以上200℃以下の高温不活性ガスを充填し、前記原材料を昇温し、乾燥させ、前記キャップを被せた状態の前記型枠または前記坩堝を保管することを特徴とする保管装置。
- 前記原材料を内包する前記キャップを被せた状態の前記型枠の、焼結が実施される場所への搬送機、または、前記原材料を内包する前記キャップを被せた状態の前記坩堝の結晶成長が実施される場所への搬送機を有する請求項7に記載の保管装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14/240,844 US9250014B2 (en) | 2011-08-25 | 2011-08-25 | Vacuum storage method and device for crystalline material |
PCT/JP2011/069233 WO2013027299A1 (ja) | 2011-08-25 | 2011-08-25 | 結晶材料の真空保管方法および装置 |
KR1020147001849A KR101641438B1 (ko) | 2011-08-25 | 2011-08-25 | 결정재료의 진공보관 방법 및 장치 |
EP11871102.7A EP2749676A4 (en) | 2011-08-25 | 2011-08-25 | VACUUM STORAGE PROCESS AND DEVICE FOR CRYSTALLINE MATERIAL |
CN201180072961.8A CN103781950A (zh) | 2011-08-25 | 2011-08-25 | 结晶材料的真空储存方法及装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2011/069233 WO2013027299A1 (ja) | 2011-08-25 | 2011-08-25 | 結晶材料の真空保管方法および装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2013027299A1 true WO2013027299A1 (ja) | 2013-02-28 |
Family
ID=47746079
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2011/069233 WO2013027299A1 (ja) | 2011-08-25 | 2011-08-25 | 結晶材料の真空保管方法および装置 |
Country Status (5)
Country | Link |
---|---|
US (1) | US9250014B2 (ja) |
EP (1) | EP2749676A4 (ja) |
KR (1) | KR101641438B1 (ja) |
CN (1) | CN103781950A (ja) |
WO (1) | WO2013027299A1 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2013027299A1 (ja) * | 2011-08-25 | 2013-02-28 | 三菱マテリアルテクノ株式会社 | 結晶材料の真空保管方法および装置 |
CN113263163A (zh) * | 2021-04-28 | 2021-08-17 | 深圳大学 | 一种高效消除固体表面吸附气体的方法及其应用 |
CN113427000A (zh) * | 2021-05-12 | 2021-09-24 | 滁州华海中谊工业炉有限公司 | 一种真空高温烧结炉用真空系统 |
CN115814565B (zh) * | 2022-11-30 | 2024-05-31 | 攀钢集团攀枝花钢铁研究院有限公司 | 一种推板窑煅烧制备钒氮合金的钾钠吸收方法及吸收剂 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04218601A (ja) * | 1990-04-13 | 1992-08-10 | Nkk Corp | チタン混合粉末の保管方法 |
JPH04236701A (ja) * | 1991-01-17 | 1992-08-25 | Mitsubishi Heavy Ind Ltd | 金属粉末の脱ガス方法 |
JP2009167073A (ja) * | 2008-01-11 | 2009-07-30 | Union Material Kk | 単結晶成長装置及び単結晶成長方法 |
JP2011178646A (ja) * | 2010-02-26 | 2011-09-15 | Yukichi Horioka | 結晶材料の真空保管方法および装置 |
Family Cites Families (31)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3605483B2 (ja) | 1996-10-04 | 2004-12-22 | 神鋼電機株式会社 | 高純度金属・合金の精製方法および高周波真空溶解装置 |
JPS5933266B2 (ja) * | 1978-12-07 | 1984-08-14 | 日本電子金属株式会社 | 半導体のp型,n型判別方法及びその装置 |
DE3333406A1 (de) * | 1982-09-17 | 1984-03-22 | Tokuyama Soda K.K., Tokuyama, Yamaguchi | Feines aluminiumnitridpulver, verfahren zu seiner herstellung und es enthaltendes mittel |
JPS63285183A (ja) | 1987-05-18 | 1988-11-22 | Furukawa Electric Co Ltd:The | 化合物半導体単結晶の製造方法 |
JP2764669B2 (ja) | 1992-07-27 | 1998-06-11 | エヌデーシー株式会社 | アルミニウム焼結多孔質材の製造法 |
DE4408304A1 (de) | 1994-03-11 | 1995-09-14 | Basf Ag | Sinterteile aus sauerstoffempfindlichen, nicht reduzierbaren Pulvern und ihre Herstellung über Spritzgießen |
WO1996004409A1 (en) * | 1994-08-01 | 1996-02-15 | Franz Hehmann | Selected processing for non-equilibrium light alloys and products |
KR100246697B1 (ko) | 1998-04-17 | 2000-03-15 | 이창세 | 다결정 실리콘 건조방법 및 건조장치 |
US6466365B1 (en) * | 2000-04-07 | 2002-10-15 | Corning Incorporated | Film coated optical lithography elements and method of making |
JP2003089825A (ja) | 2001-09-14 | 2003-03-28 | Nisshin Steel Co Ltd | 高純度金属および合金の製造方法 |
US20040173948A1 (en) * | 2002-09-19 | 2004-09-09 | Pandelisev Kiril A. | Process and apparatus for silicon boat, silicon tubing and other silicon based member fabrication |
ATE366717T1 (de) * | 2003-01-08 | 2007-08-15 | 3M Innovative Properties Co | Keramik-faser-verbundwerkstoff und herstellungsverfahren dafür |
US7291271B2 (en) * | 2003-12-09 | 2007-11-06 | Separation Design Group, Llc | Meso-frequency traveling wave electro-kinetic continuous adsorption system |
CN1546745A (zh) * | 2003-12-17 | 2004-11-17 | 中国科学院上海硅酸盐研究所 | 以单质粉末为脱氧剂的掺铊碘化铯晶体生长技术 |
US6944970B2 (en) * | 2004-01-21 | 2005-09-20 | Silverbrook Research Pty Ltd | In-line dryer for a printer |
US6920704B1 (en) * | 2004-01-21 | 2005-07-26 | Silverbrook Research Pty Ltd | Drying method for a printer |
JP4435610B2 (ja) * | 2004-03-23 | 2010-03-24 | パナソニック株式会社 | ダミー基板 |
US7344594B2 (en) | 2004-06-18 | 2008-03-18 | Memc Electronic Materials, Inc. | Melter assembly and method for charging a crystal forming apparatus with molten source material |
US7654010B2 (en) * | 2006-02-23 | 2010-02-02 | Tokyo Electron Limited | Substrate processing system, substrate processing method, and storage medium |
CN100368601C (zh) * | 2006-08-31 | 2008-02-13 | 山东大学 | 多元金属无机硫族化合物的高压釜合成方法 |
JP4805862B2 (ja) * | 2007-02-21 | 2011-11-02 | 富士通セミコンダクター株式会社 | 基板処理装置、基板処理方法、及び半導体装置の製造方法 |
JP2008207984A (ja) * | 2007-02-26 | 2008-09-11 | Kyocera Corp | 結晶シリコン粒子の製造方法及び結晶シリコン粒子の製造装置 |
DE102008026784A1 (de) | 2008-06-04 | 2009-12-10 | Siltronic Ag | Epitaxierte Siliciumscheibe mit <110>-Kristallorientierung und Verfahren zu ihrer Herstellung |
CN101498047B (zh) * | 2009-01-23 | 2013-05-29 | 中国电子科技集团公司第四十六研究所 | 一种砷化镓多晶无液封合成方法和装置 |
JP5719507B2 (ja) * | 2009-11-18 | 2015-05-20 | 三菱マテリアルテクノ株式会社 | 単結晶半導体の製造方法及び製造装置 |
DE102010055729A1 (de) * | 2010-12-22 | 2012-06-28 | Süd-Chemie AG | Trocknungsvorrichtung enthaltend ein Titano-Alumo-Phosphat |
WO2013027299A1 (ja) * | 2011-08-25 | 2013-02-28 | 三菱マテリアルテクノ株式会社 | 結晶材料の真空保管方法および装置 |
CN104080884B (zh) * | 2011-11-07 | 2017-05-24 | 国立研究开发法人物质·材料研究机构 | 荧光体及其制备方法、发光装置及图像显示装置 |
US20140109386A1 (en) * | 2012-10-20 | 2014-04-24 | Robert Richard Matthews | Non ionic/electrolyte, liquid/gaseous, mechanically refined/nanoparticle dispersion Building Materials/High Wear-Heat Resistant Part Brushes, Windings, Battery Cells, Brake Pads, Die Cast Molding, Refrigeration, Polarized/Integrated Optical, Spectrometric Processors, Central Processor Unit Processors, Electronic Storage Media, Analogous Series/Parallel Circuit Generators/Transceivers, Particulate Matter PM Carbonaceous-Polyamide, Crystalline Silica, and Cellulosic Filament Extraction/Miners Suit |
US20140178513A1 (en) * | 2012-12-23 | 2014-06-26 | Robert Richard Matthews | Non ionic/electrolyte, liquid/gaseous, mechanically refined/nanoparticle dispersion Building Materials/High Wear-Heat Resistant Part Brushes, Windings, Battery Cells, Brake Pads, Die Cast Molding, Refrigeration, Polarized/Integrated Optical, Spectrometric Processors, Central Processor Unit Processors, Electronic Storage Media, Analogous Series/Parallel Circuit Generators/Transceivers, Particulate Matter PM Carbonaceous-Polyamide, Crystalline Silica, and Cellulosic Filament Extraction/Miners Suit |
CN103650238A (zh) * | 2013-03-22 | 2014-03-19 | 深圳首创光伏有限公司 | 太阳能电池正面电极导电浆料及其制备方法 |
-
2011
- 2011-08-25 WO PCT/JP2011/069233 patent/WO2013027299A1/ja active Application Filing
- 2011-08-25 KR KR1020147001849A patent/KR101641438B1/ko active IP Right Grant
- 2011-08-25 CN CN201180072961.8A patent/CN103781950A/zh active Pending
- 2011-08-25 US US14/240,844 patent/US9250014B2/en active Active
- 2011-08-25 EP EP11871102.7A patent/EP2749676A4/en not_active Withdrawn
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04218601A (ja) * | 1990-04-13 | 1992-08-10 | Nkk Corp | チタン混合粉末の保管方法 |
JPH04236701A (ja) * | 1991-01-17 | 1992-08-25 | Mitsubishi Heavy Ind Ltd | 金属粉末の脱ガス方法 |
JP2009167073A (ja) * | 2008-01-11 | 2009-07-30 | Union Material Kk | 単結晶成長装置及び単結晶成長方法 |
JP2011178646A (ja) * | 2010-02-26 | 2011-09-15 | Yukichi Horioka | 結晶材料の真空保管方法および装置 |
Non-Patent Citations (1)
Title |
---|
See also references of EP2749676A4 * |
Also Published As
Publication number | Publication date |
---|---|
US9250014B2 (en) | 2016-02-02 |
CN103781950A (zh) | 2014-05-07 |
US20140223763A1 (en) | 2014-08-14 |
EP2749676A4 (en) | 2015-03-11 |
EP2749676A1 (en) | 2014-07-02 |
KR101641438B1 (ko) | 2016-07-20 |
KR20140027509A (ko) | 2014-03-06 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP5476637B2 (ja) | ゲッターによる多結晶グループiiiの金属窒化物および作製方法 | |
TWI485774B (zh) | 半導體元件之製造方法、基板處理裝置及半導體元件 | |
JP4907735B2 (ja) | シリカ容器及びその製造方法 | |
WO2013027299A1 (ja) | 結晶材料の真空保管方法および装置 | |
KR101313647B1 (ko) | 실리카 용기 및 그 제조방법 | |
TWI460317B (zh) | Silicone container for single crystal silicon pulling and its manufacturing method | |
US20100215563A1 (en) | Method for producing silicon | |
WO2010137221A1 (ja) | シリカ容器及びその製造方法 | |
EP2650405A2 (en) | Methods for preparing a melt of silicon powder for silicon crystal growth | |
JP4815003B2 (ja) | シリコン結晶成長用ルツボ、シリコン結晶成長用ルツボ製造方法、及びシリコン結晶成長方法 | |
JP4393555B2 (ja) | 単結晶成長方法 | |
TWI422716B (zh) | 長晶方法 | |
JP6046269B2 (ja) | 多結晶シリコンを堆積させる方法 | |
JP4808280B2 (ja) | 結晶材料の真空保管方法および装置 | |
CN101240449A (zh) | 一种纯化硅的方法 | |
CN211497744U (zh) | 一种高纯砷晶体的制备装置 | |
CN115418719B (zh) | 一种低氧致密超高纯砷棒的制备方法 | |
CN115259108B (zh) | 一种超高纯碲化镓的制备方法 | |
JP7165304B2 (ja) | 高純度多結晶シリコンの製造方法 | |
JP2005200279A (ja) | シリコンインゴットの製造方法、太陽電池 | |
CN114411259B (zh) | 一种高纯砷化镓多晶及其制备装置和方法 | |
TWI793167B (zh) | 砷化鎵系化合物半導體結晶及晶圓群 | |
JP2010285331A (ja) | 結晶成長方法 | |
JPH05294789A (ja) | シリコン結晶の引上げ方法 | |
JPH06102587B2 (ja) | シリコン単結晶の引上げ方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 11871102 Country of ref document: EP Kind code of ref document: A1 |
|
WWE | Wipo information: entry into national phase |
Ref document number: 2011871102 Country of ref document: EP |
|
ENP | Entry into the national phase |
Ref document number: 20147001849 Country of ref document: KR Kind code of ref document: A |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
WWE | Wipo information: entry into national phase |
Ref document number: 14240844 Country of ref document: US |
|
NENP | Non-entry into the national phase |
Ref country code: JP |