WO2012039384A1 - 太陽電池内の絶縁膜形成用ポリイミド樹脂組成物及びそれを用いた太陽電池内の絶縁膜形成方法 - Google Patents
太陽電池内の絶縁膜形成用ポリイミド樹脂組成物及びそれを用いた太陽電池内の絶縁膜形成方法 Download PDFInfo
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- WO2012039384A1 WO2012039384A1 PCT/JP2011/071350 JP2011071350W WO2012039384A1 WO 2012039384 A1 WO2012039384 A1 WO 2012039384A1 JP 2011071350 W JP2011071350 W JP 2011071350W WO 2012039384 A1 WO2012039384 A1 WO 2012039384A1
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- Prior art keywords
- polyimide
- group
- solvent
- polyimide resin
- organic solvent
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- 229920001721 polyimide Polymers 0.000 title claims abstract description 117
- 238000000034 method Methods 0.000 title claims abstract description 74
- 239000000203 mixture Substances 0.000 title claims abstract description 68
- 239000009719 polyimide resin Substances 0.000 title claims abstract description 45
- 238000009413 insulation Methods 0.000 title abstract description 8
- 239000004642 Polyimide Substances 0.000 claims abstract description 65
- 239000000758 substrate Substances 0.000 claims abstract description 36
- 239000003960 organic solvent Substances 0.000 claims abstract description 35
- 239000002904 solvent Substances 0.000 claims abstract description 35
- 238000007639 printing Methods 0.000 claims abstract description 34
- 238000007650 screen-printing Methods 0.000 claims abstract description 28
- 125000000217 alkyl group Chemical group 0.000 claims abstract description 23
- 238000001035 drying Methods 0.000 claims abstract description 15
- 125000005010 perfluoroalkyl group Chemical group 0.000 claims abstract description 13
- 239000012046 mixed solvent Substances 0.000 claims abstract description 9
- 230000009974 thixotropic effect Effects 0.000 claims abstract description 6
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- 125000004432 carbon atom Chemical group C* 0.000 claims description 15
- 238000001704 evaporation Methods 0.000 claims description 10
- 230000008020 evaporation Effects 0.000 claims description 10
- 125000001997 phenyl group Chemical group [H]C1=C([H])C([H])=C(*)C([H])=C1[H] 0.000 claims description 9
- 239000004020 conductor Substances 0.000 claims description 7
- 239000001257 hydrogen Substances 0.000 claims description 6
- 229910052739 hydrogen Inorganic materials 0.000 claims description 6
- 125000004435 hydrogen atom Chemical class [H]* 0.000 claims description 6
- 125000002887 hydroxy group Chemical group [H]O* 0.000 claims description 6
- 125000000962 organic group Chemical group 0.000 claims description 6
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- 229910052799 carbon Inorganic materials 0.000 claims description 3
- 230000009477 glass transition Effects 0.000 claims description 3
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- 238000000576 coating method Methods 0.000 abstract description 25
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- GTDPSWPPOUPBNX-UHFFFAOYSA-N ac1mqpva Chemical compound CC12C(=O)OC(=O)C1(C)C1(C)C2(C)C(=O)OC1=O GTDPSWPPOUPBNX-UHFFFAOYSA-N 0.000 description 22
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- 239000011256 inorganic filler Substances 0.000 description 12
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- ZUHZGEOKBKGPSW-UHFFFAOYSA-N tetraglyme Chemical compound COCCOCCOCCOCCOC ZUHZGEOKBKGPSW-UHFFFAOYSA-N 0.000 description 7
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- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Natural products COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 4
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- NVKGJHAQGWCWDI-UHFFFAOYSA-N 4-[4-amino-2-(trifluoromethyl)phenyl]-3-(trifluoromethyl)aniline Chemical group FC(F)(F)C1=CC(N)=CC=C1C1=CC=C(N)C=C1C(F)(F)F NVKGJHAQGWCWDI-UHFFFAOYSA-N 0.000 description 3
- WFDIJRYMOXRFFG-UHFFFAOYSA-N Acetic anhydride Chemical compound CC(=O)OC(C)=O WFDIJRYMOXRFFG-UHFFFAOYSA-N 0.000 description 3
- UHOVQNZJYSORNB-UHFFFAOYSA-N Benzene Chemical compound C1=CC=CC=C1 UHOVQNZJYSORNB-UHFFFAOYSA-N 0.000 description 3
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910004298 SiO 2 Inorganic materials 0.000 description 3
- ZMANZCXQSJIPKH-UHFFFAOYSA-N Triethylamine Chemical compound CCN(CC)CC ZMANZCXQSJIPKH-UHFFFAOYSA-N 0.000 description 3
- 239000003377 acid catalyst Substances 0.000 description 3
- 239000002518 antifoaming agent Substances 0.000 description 3
- 230000000740 bleeding effect Effects 0.000 description 3
- 230000007774 longterm Effects 0.000 description 3
- 229940095102 methyl benzoate Drugs 0.000 description 3
- FOGSDLLFGSNQCW-UHFFFAOYSA-N n-[(prop-2-enoylamino)methoxymethyl]prop-2-enamide Chemical compound C=CC(=O)NCOCNC(=O)C=C FOGSDLLFGSNQCW-UHFFFAOYSA-N 0.000 description 3
- 229920005575 poly(amic acid) Polymers 0.000 description 3
- 229920001296 polysiloxane Polymers 0.000 description 3
- 238000001556 precipitation Methods 0.000 description 3
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- 238000000926 separation method Methods 0.000 description 3
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- OGIDPMRJRNCKJF-UHFFFAOYSA-N titanium oxide Inorganic materials [Ti]=O OGIDPMRJRNCKJF-UHFFFAOYSA-N 0.000 description 3
- CMQCNTNASCDNGR-UHFFFAOYSA-N toluene;hydrate Chemical compound O.CC1=CC=CC=C1 CMQCNTNASCDNGR-UHFFFAOYSA-N 0.000 description 3
- 239000002966 varnish Substances 0.000 description 3
- KWOIWTRRPFHBSI-UHFFFAOYSA-N 4-[2-[3-[2-(4-aminophenyl)propan-2-yl]phenyl]propan-2-yl]aniline Chemical compound C=1C=CC(C(C)(C)C=2C=CC(N)=CC=2)=CC=1C(C)(C)C1=CC=C(N)C=C1 KWOIWTRRPFHBSI-UHFFFAOYSA-N 0.000 description 2
- KMKWGXGSGPYISJ-UHFFFAOYSA-N 4-[4-[2-[4-(4-aminophenoxy)phenyl]propan-2-yl]phenoxy]aniline Chemical compound C=1C=C(OC=2C=CC(N)=CC=2)C=CC=1C(C)(C)C(C=C1)=CC=C1OC1=CC=C(N)C=C1 KMKWGXGSGPYISJ-UHFFFAOYSA-N 0.000 description 2
- ZHBXLZQQVCDGPA-UHFFFAOYSA-N 5-[(1,3-dioxo-2-benzofuran-5-yl)sulfonyl]-2-benzofuran-1,3-dione Chemical compound C1=C2C(=O)OC(=O)C2=CC(S(=O)(=O)C=2C=C3C(=O)OC(C3=CC=2)=O)=C1 ZHBXLZQQVCDGPA-UHFFFAOYSA-N 0.000 description 2
- OZJPLYNZGCXSJM-UHFFFAOYSA-N 5-valerolactone Chemical compound O=C1CCCCO1 OZJPLYNZGCXSJM-UHFFFAOYSA-N 0.000 description 2
- RTZKZFJDLAIYFH-UHFFFAOYSA-N Diethyl ether Chemical compound CCOCC RTZKZFJDLAIYFH-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 2
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- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
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- 239000002253 acid Substances 0.000 description 2
- 150000008065 acid anhydrides Chemical class 0.000 description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 2
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- 125000002723 alicyclic group Chemical group 0.000 description 2
- 125000001931 aliphatic group Chemical group 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 2
- 150000001412 amines Chemical class 0.000 description 2
- 125000002029 aromatic hydrocarbon group Chemical group 0.000 description 2
- 125000003118 aryl group Chemical group 0.000 description 2
- 238000001505 atmospheric-pressure chemical vapour deposition Methods 0.000 description 2
- QUKGYYKBILRGFE-UHFFFAOYSA-N benzyl acetate Chemical compound CC(=O)OCC1=CC=CC=C1 QUKGYYKBILRGFE-UHFFFAOYSA-N 0.000 description 2
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- 125000000753 cycloalkyl group Chemical group 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
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- 150000002170 ethers Chemical class 0.000 description 2
- MTZQAGJQAFMTAQ-UHFFFAOYSA-N ethyl benzoate Chemical compound CCOC(=O)C1=CC=CC=C1 MTZQAGJQAFMTAQ-UHFFFAOYSA-N 0.000 description 2
- 125000001495 ethyl group Chemical group [H]C([H])([H])C([H])([H])* 0.000 description 2
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- AMXOYNBUYSYVKV-UHFFFAOYSA-M lithium bromide Chemical compound [Li+].[Br-] AMXOYNBUYSYVKV-UHFFFAOYSA-M 0.000 description 2
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- NSGXIBWMJZWTPY-UHFFFAOYSA-N 1,1,1,3,3,3-hexafluoropropane Chemical compound FC(F)(F)CC(F)(F)F NSGXIBWMJZWTPY-UHFFFAOYSA-N 0.000 description 1
- SOZFIIXUNAKEJP-UHFFFAOYSA-N 1,2,3,4-tetrafluorobenzene Chemical compound FC1=CC=C(F)C(F)=C1F SOZFIIXUNAKEJP-UHFFFAOYSA-N 0.000 description 1
- OKIRBHVFJGXOIS-UHFFFAOYSA-N 1,2-di(propan-2-yl)benzene Chemical compound CC(C)C1=CC=CC=C1C(C)C OKIRBHVFJGXOIS-UHFFFAOYSA-N 0.000 description 1
- SFVSTECQIQQHHL-UHFFFAOYSA-N 1,2-dimethyl-5,5-dioxodibenzothiophene-3,7-diamine Chemical compound C1=C(N)C=C2S(=O)(=O)C3=CC(N)=C(C)C(C)=C3C2=C1 SFVSTECQIQQHHL-UHFFFAOYSA-N 0.000 description 1
- WZCQRUWWHSTZEM-UHFFFAOYSA-N 1,3-phenylenediamine Chemical compound NC1=CC=CC(N)=C1 WZCQRUWWHSTZEM-UHFFFAOYSA-N 0.000 description 1
- CBCKQZAAMUWICA-UHFFFAOYSA-N 1,4-phenylenediamine Chemical compound NC1=CC=C(N)C=C1 CBCKQZAAMUWICA-UHFFFAOYSA-N 0.000 description 1
- VLDPXPPHXDGHEW-UHFFFAOYSA-N 1-chloro-2-dichlorophosphoryloxybenzene Chemical compound ClC1=CC=CC=C1OP(Cl)(Cl)=O VLDPXPPHXDGHEW-UHFFFAOYSA-N 0.000 description 1
- RRQYJINTUHWNHW-UHFFFAOYSA-N 1-ethoxy-2-(2-ethoxyethoxy)ethane Chemical compound CCOCCOCCOCC RRQYJINTUHWNHW-UHFFFAOYSA-N 0.000 description 1
- RERATEUBWLKDFE-UHFFFAOYSA-N 1-methoxy-2-[2-(2-methoxypropoxy)propoxy]propane Chemical compound COCC(C)OCC(C)OCC(C)OC RERATEUBWLKDFE-UHFFFAOYSA-N 0.000 description 1
- VOZKAJLKRJDJLL-UHFFFAOYSA-N 2,4-diaminotoluene Chemical compound CC1=CC=C(N)C=C1N VOZKAJLKRJDJLL-UHFFFAOYSA-N 0.000 description 1
- VXQBJTKSVGFQOL-UHFFFAOYSA-N 2-(2-butoxyethoxy)ethyl acetate Chemical compound CCCCOCCOCCOC(C)=O VXQBJTKSVGFQOL-UHFFFAOYSA-N 0.000 description 1
- FPZWZCWUIYYYBU-UHFFFAOYSA-N 2-(2-ethoxyethoxy)ethyl acetate Chemical compound CCOCCOCCOC(C)=O FPZWZCWUIYYYBU-UHFFFAOYSA-N 0.000 description 1
- MSTZGVRUOMBULC-UHFFFAOYSA-N 2-amino-4-[2-(3-amino-4-hydroxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phenol Chemical compound C1=C(O)C(N)=CC(C(C=2C=C(N)C(O)=CC=2)(C(F)(F)F)C(F)(F)F)=C1 MSTZGVRUOMBULC-UHFFFAOYSA-N 0.000 description 1
- ZGDMDBHLKNQPSD-UHFFFAOYSA-N 2-amino-5-(4-amino-3-hydroxyphenyl)phenol Chemical group C1=C(O)C(N)=CC=C1C1=CC=C(N)C(O)=C1 ZGDMDBHLKNQPSD-UHFFFAOYSA-N 0.000 description 1
- CRWNQZTZTZWPOF-UHFFFAOYSA-N 2-methyl-4-phenylpyridine Chemical compound C1=NC(C)=CC(C=2C=CC=CC=2)=C1 CRWNQZTZTZWPOF-UHFFFAOYSA-N 0.000 description 1
- 125000003903 2-propenyl group Chemical group [H]C([*])([H])C([H])=C([H])[H] 0.000 description 1
- NUIURNJTPRWVAP-UHFFFAOYSA-N 3,3'-Dimethylbenzidine Chemical group C1=C(N)C(C)=CC(C=2C=C(C)C(N)=CC=2)=C1 NUIURNJTPRWVAP-UHFFFAOYSA-N 0.000 description 1
- UENRXLSRMCSUSN-UHFFFAOYSA-N 3,5-diaminobenzoic acid Chemical compound NC1=CC(N)=CC(C(O)=O)=C1 UENRXLSRMCSUSN-UHFFFAOYSA-N 0.000 description 1
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- DKKYOQYISDAQER-UHFFFAOYSA-N 3-[3-(3-aminophenoxy)phenoxy]aniline Chemical compound NC1=CC=CC(OC=2C=C(OC=3C=C(N)C=CC=3)C=CC=2)=C1 DKKYOQYISDAQER-UHFFFAOYSA-N 0.000 description 1
- NNKQLUVBPJEUOR-UHFFFAOYSA-N 3-ethynylaniline Chemical compound NC1=CC=CC(C#C)=C1 NNKQLUVBPJEUOR-UHFFFAOYSA-N 0.000 description 1
- ICNFHJVPAJKPHW-UHFFFAOYSA-N 4,4'-Thiodianiline Chemical compound C1=CC(N)=CC=C1SC1=CC=C(N)C=C1 ICNFHJVPAJKPHW-UHFFFAOYSA-N 0.000 description 1
- AXMANIZPMQZKTG-UHFFFAOYSA-N 4-(2-phenylethynyl)-2-benzofuran-1,3-dione Chemical compound O=C1OC(=O)C2=C1C=CC=C2C#CC1=CC=CC=C1 AXMANIZPMQZKTG-UHFFFAOYSA-N 0.000 description 1
- QYIMZXITLDTULQ-UHFFFAOYSA-N 4-(4-amino-2-methylphenyl)-3-methylaniline Chemical group CC1=CC(N)=CC=C1C1=CC=C(N)C=C1C QYIMZXITLDTULQ-UHFFFAOYSA-N 0.000 description 1
- LCCYEGJIEFWDSA-UHFFFAOYSA-N 4-(9h-fluoren-1-yl)-2-methylaniline Chemical compound C1=C(N)C(C)=CC(C=2C3=C(C4=CC=CC=C4C3)C=CC=2)=C1 LCCYEGJIEFWDSA-UHFFFAOYSA-N 0.000 description 1
- HLBLWEWZXPIGSM-UHFFFAOYSA-N 4-Aminophenyl ether Chemical compound C1=CC(N)=CC=C1OC1=CC=C(N)C=C1 HLBLWEWZXPIGSM-UHFFFAOYSA-N 0.000 description 1
- APXJLYIVOFARRM-UHFFFAOYSA-N 4-[2-(3,4-dicarboxyphenyl)-1,1,1,3,3,3-hexafluoropropan-2-yl]phthalic acid Chemical compound C1=C(C(O)=O)C(C(=O)O)=CC=C1C(C(F)(F)F)(C(F)(F)F)C1=CC=C(C(O)=O)C(C(O)=O)=C1 APXJLYIVOFARRM-UHFFFAOYSA-N 0.000 description 1
- GEYAGBVEAJGCFB-UHFFFAOYSA-N 4-[2-(3,4-dicarboxyphenyl)propan-2-yl]phthalic acid Chemical compound C=1C=C(C(O)=O)C(C(O)=O)=CC=1C(C)(C)C1=CC=C(C(O)=O)C(C(O)=O)=C1 GEYAGBVEAJGCFB-UHFFFAOYSA-N 0.000 description 1
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- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0224—Electrodes
- H01L31/022408—Electrodes for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/022425—Electrodes for devices characterised by at least one potential jump barrier or surface barrier for solar cells
- H01L31/022441—Electrode arrangements specially adapted for back-contact solar cells
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/04—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
- H01L31/06—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier
- H01L31/068—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells
- H01L31/0682—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices characterised by at least one potential-jump barrier or surface barrier the potential barriers being only of the PN homojunction type, e.g. bulk silicon PN homojunction solar cells or thin film polycrystalline silicon PN homojunction solar cells back-junction, i.e. rearside emitter, solar cells, e.g. interdigitated base-emitter regions back-junction cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/546—Polycrystalline silicon PV cells
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
- Y02E10/547—Monocrystalline silicon PV cells
Definitions
- the present invention relates to a polyimide resin composition for forming an insulating film in a solar cell, a method for forming an insulating film in a solar cell using the same, and a solar cell formed by the method.
- Solar cells are well-known devices for converting solar radiation into electrical energy.
- a solar cell forms a pn junction by diffusing an impurity having a conductivity type opposite to that of a silicon substrate, for example, on a light receiving surface of a monocrystalline or polycrystalline silicon substrate, Products manufactured by forming electrodes on the back side on the opposite side are mainly used.
- silicon substrates are being made thinner.
- solar cells hereinafter also simply referred to as “cells” become thinner, cell cracks during wiring work during the production of solar cell modules (hereinafter also simply referred to as “modules”) have become a problem.
- a method of wiring using a wiring substrate of a back electrode type solar battery cell has been proposed.
- a solar cell can be manufactured by forming a p-type region and an n-type region in one silicon substrate. Each neighboring p-type region and n-type region forms a pn junction. Solar radiation impinging on the solar cell produces electrons and holes that move into the p-type and n-type regions, thereby creating a potential difference between the pn junctions.
- a p-type region and an n-type region are coupled to metal contacts on the back surface of the solar cell, thereby allowing external electronic circuits or devices to be coupled to the solar cell.
- power can be supplied by the solar cell.
- the polyimide resin used for the polyimide layer is often polyamic acid, and in order to process it into a polyimide, a process of heating and ring closure (imidization) (350 to 500 ° C.) is required. It was. Therefore, there is a problem of workability such as a large shrinkage of the resin during the imidization reaction, and it has been difficult to form the resin protective layer as a dense pattern on a thin wafer or the like.
- a supply method by applying a conductive material by a predetermined printing method is applied to the formation of the electrode and the insulating layer. This facilitates the application to mass production and can also reduce the production cost.
- the predetermined printing method in the step of forming the insulating layer is any one of screen printing, offset printing, and inkjet printing.
- the step of forming the insulating layer includes a heating step of heating the applied insulating material after applying the insulating material, or irradiating with ultraviolet rays. It is desirable to include a step of curing by.
- the heating temperature in the heating step is 150 ° C. or higher and 600 ° C. or lower. This is because if the heating temperature is lower than 150 ° C., the solvent contained in the applied insulating material cannot be removed. On the other hand, if the heating temperature exceeds 600 ° C., the insulating layer cracks and becomes insulative. This is because it is no longer secured.
- the insulating material contains at least one of polyimide, polyimide precursor, and polyamideimide.
- screen printing and dispensing methods have attracted attention as image forming methods for polyimide resin films such as those for surface protective films, interlayer insulating films, and stress relieving materials. These methods do not require complicated steps such as exposure, development, and etching, and can form a film only on a necessary portion on the wafer. As a result, the cost can be greatly reduced.
- Patent Documents 1 to 3 describe the structure of a solar battery cell using polyimide and a polyimide precursor as an insulating layer, but there is no specific requirement for polyimide and polyimide precursor.
- Patent Documents 4 to 5 disclose a method of applying a printing paste to a wafer surface by a screen printing method as a method for forming a protective film on the surface of a semiconductor wafer.
- the paste component is composed of an inorganic filler such as polyimide or silica as a base resin, and a solvent.
- the inorganic filler is added to impart thixotropy, that is, to prevent sagging and bleeding during printing.
- the addition of a large amount tends to cause problems such as a decrease in film strength and a decrease in adhesion to the substrate.
- NMP N-methyl-2-pyrrolidone
- Patent Documents 6 to 9 disclose special organic fillers (soluble fillers) in which the filler dissolves during heating and drying and is compatible with the base resin to form a film in order to solve the problems caused by the addition of the inorganic filler.
- a heat-resistant resin paste that can form a polyimide pattern having excellent characteristics by using a composition comprising a base resin and a solvent has been proposed.
- the viscosity at 25 ° C. is relatively high at 100 to 10000 Pa ⁇ s, there is a problem that the screen mesh is difficult to separate from the wafer, and continuous printing is difficult.
- An object of the present invention is to study the use of polyimide as an insulating layer as a method for solving the problem related to reliability during long-term use of solar cells.
- Polyimide is suitable because it does not undergo hydrolysis or thermal decomposition due to water absorption, and has excellent adhesion to SiO 2 and conductive materials. It has the best rheological properties for screen printing, dispensing, and coating, improves wettability with each coated substrate (SiO 2 , SiN, Si, Al, Au, etc.), and allows continuous printing over 500 times.
- Polyimide resin composition for forming an insulating film of a solar cell that can cover a predetermined portion without occurrence of pits, repellency, and pinholes after printing / coating or drying / curing, and an insulating film forming method in a solar cell using the same It is providing the photovoltaic cell which has the insulating film formed by this method.
- the composition containing the polyimide resin in the mixed solvent has excellent rheological properties, excellent pattern formation, and poor patterning even after each process such as drying.
- the polyimide resin used in the insulating layer of the solar cell is disclosed to improve the efficiency of the back electrode solar cell structure that enables higher efficiency compared with conventional solar cells, The invention has been completed.
- the present invention has the following configuration.
- a polyimide resin composition for forming an insulating film in a solar cell which contains a thixotropic polyimide resin in the mixed solvent.
- the polyimide has the following general formula [I]:
- Ar 1 is an arbitrary tetravalent organic group
- Ar 2 is an arbitrary divalent organic group
- at least one of Ar 1 and Ar 2 is the alkyl group and / or perfluoroalkyl.
- Ar 1 is represented by the following general formula [II]:
- T represents -C (CH 3 ) 2 -or -C (CF 3 ) 2-
- the Ar 2 is represented by the following general formula [III]:
- R 1 , R 2 , R 3 and R 4 are independently selected from hydrogen, hydroxyl group, alkyl group having 1 to 4 carbon atoms, phenyl group, F, Cl and Br; Provided that at least one of R 1 , R 2 , R 3 and R 4 is an alkyl group having 1 to 4 carbon atoms), and n and m each independently represent an integer of 1 to 10) Formula [IV]:
- X and Y are independently of each other —C ( ⁇ O) —, —SO 2 —, —O—, —S—, — (CH 2 ) a — (a represents an integer of 1 to 5 ), —NHCO—, —C (CH 3 ) 2 —, —C (CF 3 ) 2 —, —C ( ⁇ O) O— and a single bond
- R 5 , R 6 and R 7 Are independently selected from hydrogen, hydroxyl group, alkyl group having 1 to 4 carbon atoms, phenyl group, F, Cl and Br (provided that at least one of R 5 , R 6 and R 7 has 1 carbon atom)
- p1, p2 and p3 each independently represents an integer of 1 to 4)
- the composition according to (3) or (4), which is a group represented by: (6) 1,3-bis (3-aminopropyl) tetramethyldisiloxane is contained in an amount of 0 to 20 mole percent based
- the composition in any one of. (7) There is a difference in evaporation rate between the organic solvent (A) and the organic solvent (B), and the solubility of the polyimide is low in a solvent with a low evaporation rate.
- the organic solvent (A) is a hydrophobic solvent and has a vapor pressure of 1 mmHg or less at room temperature
- the organic solvent (B) is a hydrophilic solvent and has a vapor pressure of 1 mmHg or less at room temperature.
- (11) In the solar cell, comprising coating the composition according to any one of (1) to (10) on a base layer in the solar cell and drying to form an insulating film made of a polyimide film. A method for forming an insulating film.
- the composition for forming an insulating film of a solar cell of the present invention can be applied by a screen printing method, an ink jet method or a dispensing method, has excellent rheological properties, wettability to Si substrate, pattern shape and It is a polyimide resin composition with excellent continuous printability, and the coating film obtained from the resin composition has excellent adhesion to Si substrates and conductive materials used for electrodes, long-term electrical properties, heat resistance, chemical resistance It becomes an insulating film in a solar cell with excellent properties.
- the polyimide contained in the polyimide resin composition of the present invention is obtained by dissolving tetracarboxylic dianhydride and diamine in an organic solvent and imidizing directly in the presence of an acid catalyst (that is, not via a polyamic acid). Can be manufactured. Furthermore, it can also be produced by dissolving and reacting tetracarboxylic dianhydride and diamine in an organic solvent, and subsequently imidizing by adding at least one of tetracarboxylic dianhydride and diamine (production method). Will be described later).
- the polyimide has the following general formula [I]:
- Ar 1 is an arbitrary tetravalent organic group
- Ar 2 is an arbitrary divalent organic group
- at least one of Ar 1 and Ar 2 is the alkyl group and / or perfluoroalkyl. Group
- the thing containing the repeating unit represented by these is preferable.
- T represents -C (CH 3 ) 2 -or -C (CF 3 ) 2- )
- the thing represented by these is preferable.
- Ar 2 is represented by the following general formula [III]:
- R 1 , R 2 , R 3 and R 4 are independently selected from hydrogen, hydroxyl group, alkyl group having 1 to 4 carbon atoms, phenyl group, F, Cl and Br; Provided that at least one of R 1 , R 2 , R 3 and R 4 is an alkyl group having 1 to 4 carbon atoms), and n and m each independently represent an integer of 1 to 10) Formula [IV]:
- X and Y are independently of each other —C ( ⁇ O) —, —SO 2 —, —O—, —S—, — (CH 2 ) a — (a represents an integer of 1 to 5 ), —NHCO—, —C (CH 3 ) 2 —, —C (CF 3 ) 2 —, —C ( ⁇ O) O— and a single bond
- R 5 , R 6 and R 7 Are independently selected from hydrogen, hydroxyl group, alkyl group having 1 to 4 carbon atoms, phenyl group, F, Cl and Br (provided that at least one of R 5 , R 6 and R 7 has 1 carbon atom)
- p1, p2 and p3 each independently represents an integer of 1 to 4)
- a group represented by the formula is preferred.
- tetracarboxylic dianhydrides containing the structure represented by the above formula [II] include 2,2-bis (3,4-dicarboxyphenyl) propane dianhydride and 4,4 ′. -(4,4'-isopropylidenediphenoxy) bisphthalic dianhydride, 2,2-bis (3,4-dicarboxyphenyl) hexafluoropropane dianhydride, 1,4-bis (3,4-di Mention may be made of carboxytrifluorophenoxy) tetrafluorobenzene dianhydride.
- R 1 to R 4 in the above formula [III] are substituted or unsubstituted monovalent hydrocarbon groups having 1 to 10 carbon atoms, preferably 1 to 4 carbon atoms, including aliphatic hydrocarbon groups and alicyclic groups. Either a hydrocarbon group or an aromatic hydrocarbon group may be used. These may be the same or different. Specific examples of R 1 to R 4 include aliphatic hydrocarbon groups such as methyl, ethyl, propyl, isopropyl, butyl, isobutyl, tert-butyl, pentyl, hexyl, heptyl, and octyl.
- Alkyl groups such as groups; alkenyl groups such as vinyl groups, allyl groups, propenyl groups, isopropenyl groups, butenyl groups, isobutenyl groups, hexenyl groups, and the like.
- alicyclic hydrocarbon group examples include a cycloalkyl group such as a cyclohexyl group and a cyclopentyl group; a cycloalkenyl group such as a cyclohexenyl group, and the like.
- Aromatic hydrocarbon groups include aryl groups such as phenyl, tolyl and xylyl groups; aralkyl groups such as benzyl, ethylphenyl and propylphenyl groups.
- R 1 to R 4 may be an alkoxy group having 1 to 4 carbon atoms, an alkenoxy group, or a cycloalkyl group. Specifically, a methoxy group, an ethoxy group, a propoxy group, an isopropoxy group, a butoxy group, Examples thereof include an isobutoxy group, a tert-butoxy group, a hexyloxy group, a cyclohexyloxy group, an octoxy group, a vinyloxy group, an allyloxy group, a propenoxy group, and an isopropenoxy group. Of these, more preferred R 1 to R 4 are a methyl group and a phenyl group.
- Preferred examples of the diamine having the structure represented by the above formula [IV] include 2,2-bis [4- (4-aminophenoxy) phenyl] propane and 2,2-bis [4- (4-aminophenoxy) phenyl. ] Hexafluoropropane, ⁇ , ⁇ -bis [4- (4-aminophenoxy) phenyl] -1,3-diisopropylbenzene, ⁇ , ⁇ -bis [4- (4-aminophenoxy) phenyl] -1,4- Mention may be made of diisopropylbenzene.
- Preferred examples of the diamine having the structure represented by the above formula [V] include ⁇ , ⁇ -bis (4-aminophenyl) -1,3-diisopropylbenzene, ⁇ , ⁇ -bis (4-aminophenyl) -1, 3-dihexafluoroisopropylidenebenzene, ⁇ , ⁇ -bis (4-aminophenyl) -1,4-diisopropylbenzene, ⁇ , ⁇ -bis (4-aminophenyl) -1,4-dihexafluoroisopropylidenebenzene Can be mentioned.
- the tetracarboxylic dianhydride and diamine constituting the polyimide used in the present invention are usually heat resistant, together with the tetracarboxylic dianhydride and / or diamine having the above alkyl group and / or perfluoroalkyl group.
- Other tetracarboxylic dianhydrides and / or diamines are used in combination in order to impart various functions such as electrical characteristics, film properties, and adhesion.
- tetracarboxylic dianhydrides examples include pyromellitic dianhydride, 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride, bis (3,4-dicarboxyphenyl) ether dianhydride.
- These tetracarboxylic dianhydrides may be used alone or in combination of two or more.
- diamine examples include 2,4-diaminotoluene, 4,4′-diamino-2,2′-dimethyl-1,1′-biphenyl, 4,4′-diamino-2,2′-ditrifluoromethyl-1, 1'-biphenyl, 4,4'-diamino-3,3'-ditrifluoromethyl-1,1'-biphenyl, m-phenylenediamine, p-phenylenediamine, 4,4'-diamino-3,3'- Dihydroxy-1,1′-biphenyl, 4,4′-diamino-3,3′-dimethyl-1,1′-biphenyl, 9,9′-bis (3-methyl-4-aminophenyl) fluorene, 3, 7-Diamino-dimethyldibenzothiophene 5,5-dioxide, bis (3-carboxy-4-aminophenyl) methylene, 2,2-
- the polyimide used in the present invention includes the above-described tetracarboxylic dianhydride and / or diamine having an alkyl group and / or a perfluoroalkyl group, and usually the above-described tetracarboxylic dianhydride and / or other than these. It is obtained by combining diamines.
- the proportion of the component having an alkyl group and / or perfluoroalkyl group is usually 10 to 80 mol%, preferably 20 to 60 mol%. is there. When the proportion of the component having an alkyl group and / or a perfluoroalkyl group is within this range, excellent fine pattern formability and adhesion are exhibited.
- 1,3-bis (3-aminopropyl) tetramethyldidimethyl is one of the diamine components. It is preferred to use siloxane. This diamine is most preferred because it is commercially available under the product name PAM-E of Shin-Etsu Chemical Co., Ltd. and the product name BY16-871 of Toray Dow Corning Co., Ltd.
- the addition amount is preferably 1 to 20 mol%, more preferably 3 to 15 mol%, based on the total amine amount. If it is 20 mol% or more, the glass transition temperature of the polyimide resin tends to be too low, and a problem may occur in continuous operation of the semiconductor substrate at a high temperature.
- a reactive group can be introduced into the end portion of the polyimide to improve chemical resistance.
- a slightly larger amount of tetracarboxylic acid is added and synthesized so that the end of the polyimide becomes an acid anhydride, and then an amine compound typified by 3-ethynylaniline or 4-ethynylaniline is added to the end of the polymer.
- An acetyl group can be introduced into It is also possible to add a slight amount of a diamine compound so as to be an amine terminal, and then add an acid anhydride typified by maleic anhydride, ethynyl phthalic anhydride or phenyl ethynyl phthalic anhydride.
- Reactive groups can be introduced. These end groups react with each other by heating at 150 ° C. or higher, and the polymer main chain is crosslinked.
- the polyimide contained in the polyimide resin composition of the present invention can be produced by a known synthesis method in which tetracarboxylic dianhydride and diamine are dissolved in an organic solvent and directly imidized in the presence of an acid catalyst. Further, it can also be produced by dissolving and reacting tetracarboxylic dianhydride and diamine in an organic solvent, followed by imidization by adding at least one of tetracarboxylic dianhydride and diamine.
- the mixing ratio of tetracarboxylic dianhydride and diamine is preferably 0.9 to 1.1 mol% of the total amount of diamine with respect to 1 mol% of the total amount of acid dianhydride.
- the acid catalyst chemical imidation using a catalyst such as acetic anhydride / triethylamine or valerolactone / pyridine can be suitably used.
- the reaction temperature is preferably 80 to 250 ° C., and the reaction time can be appropriately selected depending on the scale of the batch, the reaction conditions employed, and the like.
- the block copolymerization polyimide obtained by performing imidation reaction in 2 steps or more and reacting different tetracarboxylic dianhydride and / or diamine in each step can be preferably used.
- polyimide used suitably for this invention is the above-mentioned tetracarboxylic dianhydride and / or. It can be synthesized by a known method using diamine.
- the number average molecular weight of the polyimide resin thus obtained is preferably 6000 to 60000, and more preferably 7000 to 40000. If the number average molecular weight is less than 6000, film properties such as breaking strength tend to decrease. If the number average molecular weight exceeds 60000, the viscosity increases, causing stringing problems, and a varnish suitable for printing and coating can be obtained. I want to.
- the number average molecular weight is a polystyrene equivalent value based on a calibration curve prepared using standard polystyrene by a gel permeation chromatography (GPC) apparatus.
- the solvent contained in the composition of the present invention is a mixed solvent composed of the first organic solvent (A) and the second organic solvent (B). It is most preferable that the solubility of the polyimide is lower in a solvent having a difference in evaporation rate between the two solvents and a slower evaporation rate. By doing so, there is no pattern sagging at the time of drying, and the pattern immediately after coating can be held. In addition, since solubility with various solvents differs with a composition of a polyimide, it is not limited about which vapor pressure of an organic solvent (A) and an organic solvent (B) is low. The evaporation rate of the solvent can be measured by observing the reduced weight using a commercially available differential thermal / thermogravimetric simultaneous measurement device.
- TG-DTA 2000S manufactured by MAC. Science Co., Ltd. was used, and measurement was performed under the condition that an N 2 flow rate of 150 ml / min, a temperature of 40 degrees, and a sample amount of 20 ⁇ l were dropped onto a cup having an opening of 5 mm ⁇ . Is doing.
- the first organic solvent (A) is preferably a hydrophobic solvent (that is, a solvent that is hardly soluble in water), and is preferably a solvent having a vapor pressure of 1 mmHg or less at room temperature.
- a hydrophobic solvent that is, a solvent that is hardly soluble in water
- Specific examples include benzoic acid esters such as methyl benzoate and ethyl benzoate, acetic acid esters such as benzyl acetate and butyl carbitol acetate, and ethers such as diethylene glycol dibutyl ether.
- the second organic solvent (B) is preferably a hydrophilic solvent (that is, a solvent miscible with water), and is preferably a solvent having a vapor pressure of 1 mmHg or less at room temperature.
- a hydrophilic solvent that is, a solvent miscible with water
- Specific examples include acetic esters such as diethylene glycol monoethyl ether acetate, glymes such as triglyme and tetraglyme, ethers such as tripropylene glycol dimethyl ether and diethylene glycol diethyl ether ether, and sulfolane.
- acetic esters such as diethylene glycol monoethyl ether acetate
- glymes such as triglyme and tetraglyme
- ethers such as tripropylene glycol dimethyl ether and diethylene glycol diethyl ether ether
- sulfolane sulfolane
- the good solvents differ from each other, so combining with the organic solvent (A), which is hardly soluble in water, is possible because the choice of solvents that are miscible with water increases. preferable.
- the reason why the vapor pressure at room temperature is 1 mmHg or less is the same reason as in the case of the first organic solvent (A).
- the mixing ratio of the first organic solvent (A) and the second organic solvent (B) is preferably 30% by weight to 80% by weight of the first organic solvent (A) with respect to the whole mixed solvent. If the ratio of the organic solvent (A) is less than 30% by weight, the hydrophobicity of the solvent is not sufficiently exhibited, and this tends to cause whitening or a change in viscosity during screen printing.
- a lactone solvent such as ⁇ -butyrolactone
- a ketone solvent such as cyclohexanone, ethylene carbonate, propylene carbonate and the like
- a carbonate solvent can also be used.
- ⁇ -butyrolactone which can also be used during polyimide synthesis.
- the proportion of the solid content of the polyimide resin in the composition of the present invention is preferably 15 to 60% by weight, and more preferably 25 to 50% by weight. If it is less than 15% by weight, the film thickness that can be generated by one printing and coating tends to be thin, and multiple printings and coatings tend to be required. If it exceeds 60% by weight, the viscosity of the resin composition is too high. There is a tendency to end up.
- the resin composition of the present invention has thixotropic properties as described later. Since the thixotropic property can be imparted by adding an inorganic filler, it is also an effective means to contain the inorganic filler in the resin composition of the present invention.
- the inorganic filler for imparting thixotropy include inorganic fillers composed of at least one of silica, alumina, and titania. Specific examples include amorphous silica of 0.01 to 0.03 ⁇ m and / or spherical silica, alumina or titania having a particle size of 0.1 to 0.3 ⁇ m.
- an inorganic filler surface-treated with a trimethylsilylating agent or the like for the purpose of enhancing storage stability.
- the content of the inorganic filler in the composition is usually 0 to 50% by weight, preferably 2 to 30% by weight. When the content of the inorganic filler is within this range, appropriate thixotropy is imparted.
- additives such as a colorant, an antifoaming agent, a leveling agent, and an adhesion-imparting agent can be added to the polyimide resin composition of the present invention as needed as long as the product is not affected.
- the colorant include phthalocyanine blue, phthalocyanine green, iodine green, disazo yellow, crystal violet, titanium oxide, carbon black, naphthalene black and the like.
- the antifoaming agent is used to eliminate bubbles generated during printing, coating, and curing, and an acrylic or silicone surfactant is appropriately used.
- BYK-A501 from BYK Chemi, DC-1400 from Dow Corning, SAG-30, FZ-328, FZ-2191, FZ-5609 from Nihon Unicar are listed as silicone-based defoamers. It is done.
- the leveling agent is used to lose unevenness on the surface of the film that occurs during printing and coating.
- it is non-ionic without ionic impurities.
- Suitable surfactants include, for example, FC-430 from 3M, BYK-051 from BYK-Chemi, Y-5187, A-1310, SS-2801 to 2805 from Nippon Unicar.
- the adhesion-imparting agent include imidazole compounds, thiazole compounds, triazole compounds, organoaluminum compounds, organotitanium compounds, and silane coupling agents.
- These additives are preferably blended in an amount of 10 parts by weight or less with respect to 100 parts by weight of the polyimide resin component. When the compounding amount of the additive exceeds 10 parts by weight, the physical properties of the obtained coating film tend to be lowered and the problem of contamination by volatile components also occurs. For this reason, it is most preferable not to add said additive.
- the viscosity at 25 ° C. of the polyimide resin composition of the present invention is preferably 3500 to 30000 mPa ⁇ s, more preferably 4000 mPa ⁇ s to 20000 mPa ⁇ s, and particularly preferably 6000 to 18000 mPa ⁇ s. If it is less than 3500 mPa ⁇ s, sagging or the like is likely to occur, and a sufficient film thickness and resolution cannot be obtained, and if it exceeds 40000 mPa ⁇ s, transferability and printing workability tend to be inferior.
- the numerical value of the viscosity of the present invention is expressed as an apparent viscosity obtained using a rheometer under the condition of a rotational speed of 333 rad / s.
- This viscosity value is an important factor not only for the shape retention immediately after coating, but also for the fluidity that easily deforms and flows with a squeegee during screen printing. In screen printing, when the viscosity is high, rolling of the resin composition is deteriorated, so that coating with a scraper becomes insufficient, and coating unevenness or scratches tend to occur.
- the ink does not have shape retention ability to maintain the printed shape immediately after being applied to the desired pattern shape by screen printing or the like, bleeding and sagging occur in the outer periphery of the pattern, so a thick film with high resolution can be obtained. Can't get. If the viscosity is simply increased, sagging and the like can be suppressed, but a problem of plate separation and a problem of flatness of the coating film occur in screen printing. Accordingly, the thixotropy coefficient is important in order to prevent bleeding and sagging.
- rheometer measurement can be quantified and evaluated from the area obtained by hysteresis curve (measurement of viscosity rotation speed dependence), but it is a method of evaluating with a TI value using a more general viscometer. Is the simplest.
- the thixotropy coefficient is expressed as the apparent viscosity of the resin composition at shear rates of 33 (rad / s) and 333 (rad / s), and the ratio ⁇ 33 / ⁇ 333 between ⁇ 33 and ⁇ 333.
- the complex viscosity of the resin varnish measured at a frequency of 33 rad / s is preferably 14000 to 120,000 mPa ⁇ s. If it exceeds 120,000 mPa ⁇ s, the paste remains in the mesh portion of the plate when screen printing is performed, and the separation of the plate tends to deteriorate.
- the polyimide resin composition of the present invention preferably has a thixotropy coefficient ( ⁇ 33 / ⁇ 333) at 25 ° C. in the range of 1.5 to 4.0, more preferably 1.8 to 3.5. 2.5 to 3.2 is particularly preferable. If the thixotropy coefficient is 1.5 or more, sufficient resolution can be easily obtained by screen printing. On the other hand, if the thixotropy coefficient is 4.0 or less, workability during printing is improved.
- the polyimide resin composition of the present invention preferably has high wettability with silicon substrates, ceramic substrates, glass substrates, glass epoxy substrates, metal substrates typified by Ni, Cu, and Al substrates, and PI coating substrates. That is, the contact angle at room temperature is preferably 20 to 90 ° on any of silicon, SiO 2 film, polyimide resin, ceramic, and metal surface. If it is 90 ° or less, a uniform coating film can be obtained without flares, repellencies and pinholes. If it exceeds 90 °, the resin paste will bounce on the substrate, and pinholes, patterning defects, etc. will occur.
- the contact angle is such that when a droplet of the heat-resistant resin paste is dropped on various substrates, a tangent is drawn from the contact point between the droplet and the substrate, and the angle between the tangent and the substrate is defined as the contact angle.
- the “room temperature” mainly refers to a temperature around 25 ° C.
- the contact angle of a composition can be adjusted with a polyimide resin composition, a solvent, surfactant, an antifoamer, and a leveling agent.
- the insulating film in the solar cell can be formed by applying and drying the polyimide composition of the present invention on the base layer in the solar cell.
- a method for applying the polyimide resin composition of the present invention a screen printing method, a dispensing method, and an ink jet method are preferable.
- the screen printing method is optimal in that a large area can be applied in a short time. With a single application, it is possible to stably form a film having a thickness after drying of 1 ⁇ m or more, preferably 2 ⁇ m or more. Considering the insulation reliability, it is desirable to obtain a thickness of at least 5 ⁇ m by one application.
- a mesh plate having a wire diameter of 50 ⁇ m or less and 420 mesh or more and a resin having a rubber hardness of 70 to 90 degrees are used. It is desirable to screen print using a squeegee.
- the specifications of the screen plate such as the mesh diameter and the number of meshes can be appropriately selected depending on the desired film thickness and pattern size.
- fine lines can be drawn by the dispensing method, and it is possible to achieve that the line width of the wet coating film is within + 20% even when left at room temperature for one day as compared with the line width immediately after application. .
- fine lines by the ink jet method it is possible to achieve that the line width of the wet coating film is within + 100% even when left at room temperature for one day as compared with the line width immediately after coating. .
- the polyimide resin composition can be obtained by performing leveling, vacuum drying, and final curing process after printing to obtain an insulating film and a protective film having excellent electrical characteristics, heat resistance, and chemical resistance.
- the leveling is preferably performed for 10 minutes or more.
- the vacuum drying is preferably performed because the finish of the coating film is improved, but may not always be necessary when a leveling agent or an antifoaming agent is added.
- the final curing temperature and time can be appropriately selected depending on the solvent of the polyimide resin composition and the applied film thickness.
- Synthesis Example 2 The same apparatus as in Synthesis Example 1 was used. ODPA 148.91 g (480 mmol), PAM-E 29.82 g (120 mmol), Bisanline-M 74.41 g (216 mmol), BAPP 59.11 g (144 mmol), ⁇ -valerolactone 4.8 g, pyridine 7.6 g, benzoate 303 g of ethyl acid (BAEE), 455 g of tetraglyme, and 100 g of toluene were charged. After stirring for 30 minutes at 180 rpm in a nitrogen atmosphere at room temperature, the mixture was heated to 180 ° C. and stirred for 5 hours. During the reaction, toluene-water azeotrope was removed. By removing the reflux from the system, a 28% concentration polyimide solution was obtained.
- BAEE ethyl acid
- Synthesis Example 3 The same apparatus as in Synthesis Example 1 was used. 3,3 ′, 4,4′-biphenylsulfonetetracarboxylic dianhydride (DSDA) 71.66 g (200 mmol), PAM-E 24.85 g (100 mmol), BAME 65 g, tetraglyme 98 g, ⁇ -valerolactone 4 0.0 g, 6.3 g of pyridine, and 50 g of toluene were charged. After stirring at 180 rpm for 30 minutes at room temperature in a nitrogen atmosphere, the mixture was heated to 180 ° C. and stirred for 1 hour. During the reaction, toluene-water azeotrope was removed.
- DSDA 4,4′-biphenylsulfonetetracarboxylic dianhydride
- polyimide ink composition A composition containing each polyimide obtained as described above was prepared. 50 g of a copolymer polyimide synthesized by the above method (solutions of Synthesis Examples 1 to 3 (28% by weight) were taken (in this case, the copolymer polyimide resin component was 14 g), titanium oxide (Taika Co., Ltd.) SJR-600M) (15% by weight based on the polyimide resin) was added, methyl (ethyl) benzoate was added as the organic solvent (A), and tetraglyme was added as the organic solvent (B).
- a copolymer polyimide synthesized by the above method solutions of Synthesis Examples 1 to 3 (28% by weight) were taken (in this case, the copolymer polyimide resin component was 14 g), titanium oxide (Taika Co., Ltd.) SJR-600M) (15% by weight based on the polyimide resin) was added, methyl (ethyl) benzoate was added as the organic
- the solubility of the polyimide in the present invention is an organic solvent (a)> (B). Accordingly, poly relative slow solvent evaporation rate As the kneading method, TK Hivis Disper Mix 3D-5 manufactured by Tokushu Kika Kogyo Co., Ltd. was used as the kneading method. The amount of titanium oxide added was 100 parts of the polyimide resin part. For this, 40 parts, 19.3 parts of methyl benzoate, and 23.6 parts of tetraglyme were used, and the specific composition of the prepared composition is shown below.
- a film was formed on the substrate using the above composition.
- the substrate was a silicon wafer, and each composition was applied by screen printing. Specific application conditions were polyester mesh # 420, and printing was performed at a squeegee hardness of 80 degrees, an attack angle of 70 degrees, a clearance of 2.5 mm, an actual printing pressure of 0.15 MPa, and a printing speed of 260 mm / sec.
- the coating film was dried to form a polyimide film. Drying conditions were leveled for 10 minutes, heated at 140 ° C. for 10 minutes, and then heated at 250 ° C. for 30 minutes in a nitrogen atmosphere. The film thickness after drying was 5 ⁇ m.
- Viscosity and thixotropy coefficient were measured using a rheometer RS300 manufactured by Thermo Haake. Specifically, it was performed as follows. After adjusting the plate (fixed part) to 25 ⁇ 0.1 ° C., place a sample amount of 1.0 to 2.0 g. The cone (movable part) is moved to a predetermined position, and the resin solution is held between the plate and the cone until the temperature reaches 25 ⁇ 0.1 ° C. The rotation of the cone is started, the rotation speed is gradually increased so that the shear rate becomes 33 rad / s in 10 seconds, the speed is maintained, and the viscosity after 1 minute is read.
- the rotational speed is increased so that the shear rate reaches 333 rad / s in 10 seconds, and the viscosity at 333 rad / s is read.
- the numerical value at 33 rad / s thus obtained was the viscosity, and the ratio of the numerical values at 323 rad / s was taken as the thixotropic coefficient.
- Example 4 (solar cell) First, as a solar cell, a solar cell was prepared in which a P + layer 3 and an N + layer 4 were formed on the back surface of a silicon substrate, the back surface was covered with a passivation film 5, and an antireflection film 7 was formed on a light receiving surface.
- the silicon substrate 2 has a side length of 125 mm.
- P + layers 3 and N + layers 4 were alternately formed in a line on the back surface of the silicon substrate 2, and a silicon oxide film formed by thermal oxidation was formed as the passivation film 5.
- a silicon nitride film was formed as the antireflection film 7 by plasma CVD.
- contact holes 6 having a diameter of 0.1 mm were formed at a pitch of 0.3 mm in the portion of the passivation film 5 located immediately above the P + layer 3 and the N + layer 4.
- the contact hole 6 was formed by screen printing a paste containing phosphoric acid as a main component and heating.
- an N electrode 10 and a P electrode contact 8 were formed.
- the P electrode contact 8 is formed in the contact hole 6 and the N electrode 10 is formed in a shape having a distance of about 0.1 mm from the P electrode contact 8 by pattern printing of silver paste by screen printing and firing this. did.
- As the silver paste a silver paste containing silver as a main component, glass frit of several percent, an organic solvent for adjusting viscosity, and a thickener was used. The glass frit functions to obtain good contact with the silicon substrate 2.
- the heating conditions for firing the silver paste were such that the peak temperature was 600 ° C. and the temperature was 500 ° C. or more and the time was 35 seconds. By this firing, the organic components in the silver paste were completely decomposed.
- the polyimide composition of the above example was applied to the surface of the N electrode 10 by screen printing so that only a part of the N electrode 10 and the P electrode contact 8 were exposed. Thereafter, the insulating layer 11 was formed by heating at a temperature of 140 ° C., 10 minutes, and 250 ° C. for about 30 minutes.
- a paste mainly composed of silver was printed by screen printing so as not to contact the exposed portion of the N electrode 10, and the P electrode 8 was formed by firing the paste.
- the firing conditions were such that the peak temperature was 450 ° C. and the temperature was 400 ° C. or more and the time was 30 seconds so as not to destroy the insulating layer 11.
- the glass frit is not included and only organic components other than silver are included.
- a silver paste containing was used. By using such a silver paste, a low electrical resistivity is possible even at low temperature firing.
- Example 2 a solar cell module was produced using the solar cells produced as described above, and the change in electrical conversion efficiency after deterioration was examined under each condition.
- Example 2 was confirmed that the use of a polyimide composition was effective in improving long-term reliability and electrical conversion efficiency.
- the solar battery cell 1 has a substrate in the form of silicon and a plurality of diffusion regions 3 and 4. Diffusion regions 3 and 4 are formed in silicon 2 or a layer overlaid thereon. Diffusion region 3 includes a P-type diffusion region, and diffusion region 4 includes an N-type diffusion region.
- the solar cell silicon of the present invention is a back junction solar cell in which the diffusion regions 3 and 4 are on the back surface opposite to the passivation layer 5.
- the front passivation layer 5 is formed on the diffusion region.
- the passivation layer 5 contains silicon dioxide to a thickness of about 100 to 600 nm by atmospheric pressure chemical vapor deposition (APCVD). The passivation layer is used as an electrical insulation between the diffusion region and the metal contact fingers of the conductive layer superimposed thereon.
- APCVD atmospheric pressure chemical vapor deposition
- the polyimide insulating layer 11 described in the first to third embodiments is formed on the passivation layer 5 so that one polarity metal contact finger is electrically short-circuited to another polarity diffusion region. It is prevented.
- the polyimide composition described in Examples 1 to 3 is used for the polyimide insulating layer 5, and the metal contact fingers electrically connected to the N-type diffusion region 2 are electrically short-circuited to the P-type diffusion region 3.
- the polyimide insulating layer 5 is formed by forming the polyimide composition described in Examples 1 to 3 to a thickness of 5 microns by screen printing and heating at a temperature of 140 ° C., 10 minutes, and 250 ° C. for about 30 minutes to obtain polyimide insulation. Layer 5 was formed.
- the opening between the polyimide insulating layers 5 is 300 ⁇ 100 ⁇ m.
- the contact region 6 is formed by etching the passivation layer 5 with an etchant that does not significantly etch the polyimide insulating layer 11.
- an etchant that does not significantly etch the polyimide insulating layer 11.
- the contact region 6 is formed by exposing the exposed portion of the passivation layer 5 by a buffer oxide etching (BOE) process using hydrofluoric acid as an etchant. It was formed by wet etching. A plurality of contact hole regions 6 were obtained in the openings between the polyimide insulating layers 11.
- BOE buffer oxide etching
- Metal contact fingers (P electrodes) 9 are formed through the P electrode contact region 8.
- the metal contact finger (P electrode) 9 and the metal contact finger (N electrode) 10 include a laminate of materials.
- the material includes an aluminum layer having a thickness of 100 nm, the aluminum layer being formed on a 50 nm titanium-tungsten layer, the titanium-tungsten layer being formed on a copper layer having a thickness of 300 microns. The layer is formed on a 6 micron thick tin layer.
- several metal contact fingers (P electrodes) 9 and metal contact fingers (N electrodes) 10 are provided.
- the metal contact finger (P electrode) 9 is electrically connected to the P-type diffusion region 3 through the P-electrode contact region 8 and is a P-type metal contact finger.
- the metal contact finger (N electrode) 10 is electrically connected to the N-type diffusion region through the contact region, and is an N-type metal contact finger.
- a solar cell manufacturing method in which an external electrical circuit 12 is connected to metal contact fingers, thereby receiving power from the solar cell.
- the polyimide described is the polyimide composition described in Examples 1 to 3.
- ACL336 Autoclave336Hr: 85 °C * 85% * 336H
- HF10 Humidity Freeze 10Days
- TC50 Thermal Cycle50 H
Abstract
Description
(2) 前記アルキル基及び/又はパーフルオロアルキル基中の炭素原子数が1~4である(1)の組成物。
(3) 前記ポリイミドが、下記一般式[I]:
で表される繰返し単位を含む(1)又は(2)記載の組成物。
(4) 前記Ar1が下記一般式[II]:
で表される(3)記載の組成物。
(5) 前記Ar2が下記一般式[III]:
一般式[IV]:
又は
下記一般式[V]:
で示される基である(3)又は(4)記載の組成物。
(6) 1,3-ビス(3-アミノプロピル)テトラメチルジシロキサンを全ジアミン成分量に対して0~20モルパーセント含有し、ガラス転移温度が150℃以上である(1)~(5)のいずれかに記載の組成物。
(7) 前記有機溶媒(A)と有機溶媒(B)に蒸発速度の差があり、蒸発速度が遅い溶剤に対してポリイミドの溶解性が低い(1)~(6)のいずれか1項に記載の組成物。
(8) 前記有機溶媒(A)は、疎水性溶媒であり、室温における蒸気圧が1mmHg以下の溶剤であり、前記有機溶媒(B)は親水性溶媒であり、室温における蒸気圧が1mmHg以下の溶剤である(1)~(7)のいずれかに記載の組成物。
(9) せん断速度1~100s-1の範囲における粘度が20000~200000mPa・sである(1)~(8)のいずれかに記載の組成物。
(10) チクソトロピー係数が、1.5~10.0である(1)~(9)のいずれかに記載の組成物。
(11) (1)~(10)のいずれか1項に記載の組成物を太陽電池中の基層上に塗布、乾燥してポリイミド膜から成る絶縁膜を形成することを含む、太陽電池内の絶縁膜の形成方法。
(12) 前記ポリイミド膜を、スクリーン印刷法、インクジェット法又はディスペンス法により形成する、(11)記載の方法。
(13) 1回の塗布で、乾燥後の厚みが1μm以上のポリイミド膜を形成する(11)又は(12)記載の方法。
(14) 単結晶シリコンまたは多結晶シリコンからなる結晶シリコン基板の主表面上に、導電性材料を用いることで第一電極を形成する工程と、
該第一電極の表面上に絶縁膜を印刷法によって塗布する工程と、を備え、
該絶縁膜の表面上に導電性材料を用いることで、該第一電極と電気的に絶縁される形態で第二電極を形成することを含む、(11)~(13)のいずれかに記載の方法。
(15) (11)~(14)のいずれか1項に記載の方法により形成された絶縁膜を含む太陽電池。
2 シリコン基板
3 P+層
4 N+層
5 パッシベーション膜
6 コンタクトホール
7 反射防止膜
8 P電極コンタクト
9 P電極
10 N電極
11 絶縁層
12 外部電気回路
13 絶縁層
すなわち、前記ポリイミドが、下記一般式[I]:
で表される繰返し単位を含むものが好ましい。
で表されるものが好ましい。
一般式[IV]:
又は
下記一般式[V]:
で示される基であるものが好ましい。
合成実施例1
ステンレス製の碇型攪拌器を取り付けた2リットルのセパラブル3つ口フラスコに、水分分離トラップを備えた玉付冷却管を取り付けた。ビス-(3,4-ジカルボキシフェニル)エーテル二無水物(ODPA)148.91g(480ミリモル)、1,3-ビス(3-アミノプロピル)テトラメチルジシロキサン(PAM-E)23.86g(96ミリモル)、4,4'-(1,3-フェニレンジイソプロピリデン)ビスアニリン(Bisaniline-M)70.28g(204ミリモル)、2,2-ビス[4-(4-アミノフェノキシ)フェニル]プロパン(BAPP)73.89g(180ミリモル)、γ-バレロラクトン4.8g、ピリジン7.6g、安息香酸メチル(BAME)385g、テトラグライム385g、トルエン100gを仕込んだ。室温、窒素雰囲気下、180rpmで30分攪拌した後、180℃に昇温して5時間攪拌した。反応中、トルエン-水の共沸分を除いた。還流物を系外に除くことにより28%濃度のポリイミド溶液を得た。
合成実施例1と同様の装置を用いた。ODPA148.91g(480ミリモル)、PAM-E29.82g(120ミリモル)、Bisaniline-M74.41g(216ミリモル)、BAPP59.11g(144ミリモル)、γ-バレロラクトン4.8g、ピリジン7.6g、安息香酸エチル(BAEE)303g、テトラグライム455gトルエン100gを仕込んだ。室温、窒素雰囲気下、180rpmで30分攪拌した後、180℃に昇温して5時間攪拌した。反応中、トルエン-水の共沸分を除いた。還流物を系外に除くことにより28%濃度のポリイミド溶液を得た。
合成実施例1と同様の装置を用いた。3,3’,4,4’-ビフェニルスルホンテトラカルボン酸二無水物(DSDA)71.66g(200ミリモル)、PAM-E24.85g(100ミリモル)、BAME65g、テトラグライム98g、γ-バレロラクトン4.0g、ピリジン6.3g、トルエン50gを仕込んだ。室温、窒素雰囲気下、180rpmで30分攪拌した後、180℃に昇温して1時間攪拌した。反応中、トルエン-水の共沸分を除いた。ついで、室温に冷却しDSDA71.66g(200ミリモル)、4,4’-ジアミノ-2,2’-ジトリフルオロメチル-1,1’-ビフェニル(TFMB)48.04g(150ミリモル)、BAPP:61.58g(150ミリモル)、BAME130g、テトラグライム196g、トルエン50gを加え、180℃、180rpmで攪拌しながら4時間反応させた。還流物を系外に除くことにより35%濃度のポリイミド溶液を得た。
上記のとおり得られた各ポリイミドをそれぞれ含む組成物を調製した。上記の方法で合成した共重合体ポリイミド(合成例1~3の溶液(28重量%)の溶液を50g取り(この場合の共重合体ポリイミド樹脂成分は14gである)、酸化チタン(テイカ株式会社SJR-600M)を(ポリイミド樹脂に対して15重量%)添加し、これに有機溶媒(A)としてはメチル(エチル)ベンゾエート、有機溶媒(B)としてはテトラグライムを添加した。有機溶媒(A)及び(B)の室温での蒸気圧はそれぞれ0.38mmHg(25℃)、0.01mmHg以下(20℃)である。蒸発速度は、それぞれ2256.3mg/(min・m2)及び71.6mg/(min・m2)である。また、本発明におけるポリイミドの溶解度は、有機溶媒(A)>(B)である。従って、蒸発速度の遅い溶剤に対してポリイミドの溶解性が低いため好適である。混練方法としては、特殊機化工業社製TK Hivis Disper Mix 3D-5型を使用し混練を行った。酸化チタンの添加量はポリイミド樹脂部100部に対して40部、安息香酸メチル19.3部、テトラグライム23.6部を使用した。調製した組成物の具体的な組成を以下に示す。
上記組成物を用いて、基板上に成膜した。基板はシリコンウェハであり、スクリーン印刷法により各組成物を塗布した。具体的な塗布条件は、ポリエステルメッシュ#420を用い、スキージ硬度80度、アタック角70度、クリアランス2.5mm、実印圧0.15MPa、印刷速度260mm/secで印刷を行った。次に、塗布膜を乾燥させて、ポリイミド膜を形成した。乾燥条件は、10分レベリングを行い、140℃で10分、そのまま昇温して250℃で30分を窒素雰囲気下で行った。乾燥後の膜厚は、5μmであった。
上記したポリイミド、組成物又は形成した膜の性質を評価した。評価は次の通り行った。
ここでは、実施例としての太陽電池セルおよび太陽電池モジュールの製造方法について図1に基づき具体的に説明する。なお、太陽電池の製造の各工程は周知の通常の太陽電池製造工程である。
まず、太陽電池セルとして、シリコン基板の裏面にP+層3およびN+層4を形成して、その裏面をパッシベーション膜5で覆い、受光面に反射防止膜7を形成した太陽電池セルを用意した。シリコン基板2を、1辺の長さが125mmのとした。P+層3およびN+層4をシリコン基板2の裏面にライン状に交互に形成し、パッシベーション膜5として熱酸化による酸化シリコン膜を形成した。また、反射防止膜7としてプラズマCVD法により窒化シリコン膜を形成した。
ACL336:Autoclave336Hr:85℃*85%*336H,HF10:Humidity Freeze 10Days,TC50:Thermal Cycle50 H
Claims (15)
- 第一の有機溶媒(A)及び第二の有機溶媒(B)の混合溶媒に可溶な耐熱性ポリイミド樹脂であって、ポリイミドの繰り返し単位中にアルキル基及び/又はパーフルオロアルキル基を含み、チクソトロピー性を有するポリイミド樹脂を、前記混合溶媒中に含む、太陽電池内の絶縁膜形成用ポリイミド樹脂組成物。
- 前記アルキル基及び/又はパーフルオロアルキル基中の炭素原子数が1~4である請求項1記載の組成物。
- 前記Ar2が下記一般式[III]:
(式中、R1、R2、R3及びR4は互いに独立して、水素、水酸基、炭素数1~4のアルキル基、フェニル基、F、Cl及びBrから選択されるものを表し(ただし、R1、R2、R3及びR4の少なくとも1個は炭素数1~4のアルキル基)、n及びmは互いに独立して1~10の整数を表す)
一般式[IV]:
(式中、Wは、-C(CH3)2-又は-C(CF3)2-を表す)、
又は
下記一般式[V]:
(式中、X及びYは互いに独立して-C(=O)-、-SO2-、-O-、-S-、-(CH2)a-(aは1~5の整数を表す)、-NHCO-、-C(CH3)2-、-C(CF3)2-、-C(=O)O-及び単結合から成る群より選ばれ、R5、R6及びR7は互いに独立して水素、水酸基、炭素数1~4のアルキル基、フェニル基、F、Cl及びBrから選択されるもの(ただし、R5、R6及びR7の少なくとも1つは炭素数1~4のアルキル基)を表し、p1、p2及びp3は互いに独立して1~4の整数を表す)
で示される基である請求項3又は4記載の組成物。 - 1,3-ビス(3-アミノプロピル)テトラメチルジシロキサンを全ジアミン成分量に対して0~20モルパーセント含有し、ガラス転移温度が150℃以上である請求項1~5のいずれか1項に記載の組成物。
- 前記有機溶媒(A)と有機溶媒(B)に蒸発速度の差があり、蒸発速度が遅い溶剤に対してポリイミドの溶解性が低い請求項1~6のいずれか1項に記載の組成物。
- 前記有機溶媒(A)は、疎水性溶媒であり、室温における蒸気圧が1mmHg以下の溶剤であり、前記有機溶媒(B)は親水性溶媒であり、室温における蒸気圧が1mmHg以下の溶剤である請求項1~7のいずれか1項に記載の組成物。
- せん断速度1~100s-1の範囲における粘度が20000~200000mPa・sである請求項1~8のいずれか1項に記載の組成物。
- チクソトロピー係数が、1.5~10.0である請求項1~9のいずれか1項に記載の組成物。
- 請求項1~10のいずれか1項に記載の組成物を太陽電池中の基層上に塗布、乾燥してポリイミド膜から成る絶縁膜を形成することを含む、太陽電池内の絶縁膜の形成方法。
- 前記ポリイミド膜を、スクリーン印刷法、インクジェット法又はディスペンス法により形成する、請求項11記載の方法。
- 1回の塗布で、乾燥後の厚みが1μm以上のポリイミド膜を形成する請求項11又は12記載の方法。
- 単結晶シリコンまたは多結晶シリコンからなる結晶シリコン基板の主表面上に、導電性材料を用いることで第一電極を形成する工程と、
該第一電極の表面上に絶縁膜を印刷法によって塗布する工程と、を備え、
該絶縁膜の表面上に導電性材料を用いることで、該第一電極と電気的に絶縁される形態で第二電極を形成することを含む、請求項11~13のいずれか1項に記載の方法。 - 請求項11~14のいずれか1項に記載の方法により形成された絶縁膜を含む太陽電池。
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CN2011800454367A CN103250259A (zh) | 2010-09-21 | 2011-09-20 | 太阳能电池内的绝缘膜形成用聚酰亚胺树脂组合物以及使用其的太阳能电池内的绝缘膜形成方法 |
KR1020137006661A KR20130121090A (ko) | 2010-09-21 | 2011-09-20 | 태양전지 내의 절연막 형성용 폴리이미드 수지 조성물 및 그것을 사용한 태양전지 내의 절연막 형성 방법 |
EP11826829.1A EP2620985A1 (en) | 2010-09-21 | 2011-09-20 | Polyimide resin composition for use in forming insulation film in photovoltaic cell and method of forming insulation film in photovoltaic cell used therewith |
US13/822,941 US20130233381A1 (en) | 2010-09-21 | 2011-09-20 | Polyimide resin composition for use in forming insulation film in photovoltaic cell and method of forming insulation film in photovoltaic cell used therewith |
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KR101508208B1 (ko) | 2012-12-04 | 2015-04-07 | 한국화학연구원 | 신규한 폴리이미드 중합체, 이의 제조방법 및 이를 이용한 유기절연막 |
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CN103250259A (zh) | 2013-08-14 |
US20130233381A1 (en) | 2013-09-12 |
EP2620985A1 (en) | 2013-07-31 |
KR20130121090A (ko) | 2013-11-05 |
TW201224004A (en) | 2012-06-16 |
JP2012069594A (ja) | 2012-04-05 |
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